Dual-Axis 5 g Accelerometer with SPI Interface ADIS16006 Data Sheet FEATURES GENERAL DESCRIPTION Dual-axis accelerometer SPI digital output interface Internal temperature sensor Highly integrated; minimal external components Bandwidth externally selectable 1.9 mg resolution at 60 Hz Externally controlled electrostatic self-test 3.0 V to 5.25 V single-supply operation Low power: <2 mA 3500 g shock survival 7.2 mm x 7.2 mm x 3.7 mm package The ADIS16006 is a low cost, low power, complete dual-axis accelerometer with an integrated serial peripheral interface (SPI). An integrated temperature sensor is also available on the SPI interface. The ADIS16006 measures acceleration with a fullscale range of 5 g (minimum). The ADIS16006 can measure both dynamic acceleration (vibration) and static acceleration (gravity). APPLICATIONS An externally driven self-test pin (ST) allows the user to verify the accelerometer functionality. The typical noise floor is 200 g/Hz, allowing signals below 1.9 mg (60 Hz bandwidth) to be resolved. The bandwidth of the accelerometer is set with optional capacitors, CX and CY, at the XFILT pin and the YFILT pin. Digital output data for both axes is available via the serial interface. Industrial vibration/motion sensing Platform stabilization Dual-axis tilt sensing Tracking, recording, analysis devices Alarms and security devices The ADIS16006 is available in a 7.2 mm x 7.2 mm x 3.7 mm, 12-terminal LGA package. FUNCTIONAL BLOCK DIAGRAM VCC ADIS16006 SCLK DUAL-AXIS 5g ACCELEROMETER SERIAL INTERFACE DIN DOUT CS CDC TCS COM ST YFILT XFILT CY CX 05975-001 TEMP SENSOR Figure 1. Rev. C Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 (c)2006-2013 Analog Devices, Inc. All rights reserved. Technical Support www.analog.com ADIS16006 Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 Accelerometer Data Format ...................................................... 11 Applications ....................................................................................... 1 Self-Test ....................................................................................... 11 General Description ......................................................................... 1 Serial Interface ............................................................................ 11 Functional Block Diagram .............................................................. 1 Accelerometer Serial Interface.................................................. 11 Revision History ............................................................................... 2 Temperature Sensor Serial Interface ........................................ 12 Specifications..................................................................................... 3 Power Supply Decoupling ......................................................... 12 Timing Specifications .................................................................. 4 Setting the Bandwidth ............................................................... 13 Circuit and Timing Diagrams..................................................... 5 Absolute Maximum Ratings ............................................................ 6 Selecting Filter Characteristics: The Noise/Bandwidth TradeOff................................................................................................. 13 ESD Caution .................................................................................. 6 Applications..................................................................................... 15 Pin Configuration and Function Descriptions ............................. 7 Second Level Assembly.............................................................. 15 Typical Performance Characteristics ............................................. 8 Outline Dimensions ....................................................................... 16 Theory of Operation ...................................................................... 11 Ordering Guide .......................................................................... 16 REVISION HISTORY 2/13--Rev. B to Rev. C Changes to Figure 23 ...................................................................... 14 3/12--Rev. A to Rev. B Added Accelerometer Data Format Section ............................... 11 Added Table 6; Renumbered Sequentially .................................. 11 10/07--Rev. 0 to Rev. A Changes to Features and General Description ............................. 1 Added Note 6 to Table 2 .................................................................. 4 Changes to Figure 5 .......................................................................... 6 Changes to Accelerometer Control Register Section ................. 11 Changes to Layout .......................................................................... 13 Changes to Layout .......................................................................... 14 Deleted Figure 24 and Table 11..................................................... 14 Edited Second-Level Assembly Section ....................................... 15 Updated Outline Dimensions ....................................................... 16 Changes to Ordering Guide .......................................................... 16 3/06--Revision 0: Initial Version Rev. C | Page 2 of 16 Data Sheet ADIS16006 SPECIFICATIONS TA = -40C to +125C, VCC = 5 V, CX = CY = 0 F, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed. Table 1. Parameter ACCELEROMETER SENSOR INPUT Measurement Range 1 Nonlinearity Package Alignment Error Alignment Error Cross-Axis Sensitivity ACCELEROMETER SENSITIVITY Sensitivity at XFILT, YFILT Sensitivity Change due to Temperature 2 ZERO g BIAS LEVEL 0 g Voltage at XFILT, YFILT 0 g Offset vs. Temperature ACCELEROMETER NOISE PERFORMANCE Noise Density ACCELEROMETER FREQUENCY RESPONSE 3, 4 CX, CY Range RFILT Tolerance Sensor Bandwidth Sensor Resonant Frequency ACCELEROMETER SELF-TEST Logic Input Low Logic Input High ST Input Resistance to COM Output Change at XOUT, YOUT 5 TEMPERATURE SENSOR Accuracy Resolution Update Rate Temperature Conversion Time DIGITAL INPUT Input High Voltage (VINH) Input Low Voltage (VINL) Input Current Input Capacitance DIGITAL OUTPUT Output High Voltage (VOH) Output Low Voltage (VOL) Conditions Each axis Min Typ Max 0.5 1.5 0.1 1.5 2.5 242 256 0.3 272 LSB/g % 1905 2048 0.1 2190 LSB LSB/C 5 % of full scale X sensor to Y sensor 3 Unit g % Degrees Degrees % Each axis Delta from 25C Each axis At 25C 200 0 24 CX = 0 F, CY = 0 F Self-Test 0 to Self-Test 1 0.8 x VCC 30 102 VCC = 3 V to 5.25 V VCC = 4.75 V to 5.25 V VCC = 3.0 V to 3.6 V VCC = 3.0 V to 5.25 V VIN = 0 V or VCC 2.4 2.1 ISOURCE = 200 A, VCC = 3.0 V to 5.25 V ISINK = 200 A VCC - 0.5 Rev. C | Page 3 of 16 -10 32 2.26 5.5 50 205 g/Hz rms 10 40 F k kHz kHz 0.2 x VCC V V k LSB 307 2 10 400 25 C Bits s s +1 10 V V V A pF 0.8 +10 0.4 V V ADIS16006 Data Sheet Parameter POWER SUPPLY Operating Voltage Range Quiescent Supply Current Power-Down Current Turn-On Time 6 Conditions Min Typ 3.0 fSCLK = 50 kSPS 1.5 1.0 20 CX, CY = 0.1 F Max Unit 5.25 1.9 V mA mA ms Guaranteed by measurement of initial offset and sensitivity. Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature. 3 Actual bandwidth response controlled by user-supplied external capacitor (CX, CY). 4 See the Setting the Bandwidth section for more information on how to reduce the bandwidth. 5 Self-test response changes as the square of VCC. 6 Larger values of CX and CY increase turn-on time. Turn-on time is approximately (160 x (0.0022 + CX or CY) + 4) in milliseconds, where CX and CY are in F. 1 2 TIMING SPECIFICATIONS TA = -40C to +125C, acceleration = 0 g, unless otherwise noted. Table 2. Parameter 1, 2 fSCLK 3 tCONVERT tACQ t1 t2 4 t3 4 t4 t5 t6 t7 t8 5 t9 6 VCC = 3.3 V 10 2 14.5 x tSCLK 1.5 x tSCLK 10 60 100 20 20 0.4 x tSCLK 0.4 x tSCLK 80 5 VCC = 5 V 10 2 14.5 x tSCLK 1.5 x tSCLK 10 30 75 20 20 0.4 x tSCLK 0.4 x tSCLK 80 5 Unit kHz min MHz max ns min ns max ns max ns min ns min ns min ns min ns max s typ Description Throughput time = tCONVERT + tACQ = 16 x tSCLK TCS/CS to SCLK setup time Delay from TCS/CS until DOUT three-state disabled Data access time after SCLK falling edge Data setup time prior to SCLK rising edge Data hold time after SCLK rising edge SCLK high pulse width SCLK low pulse width TCS/CS rising edge to DOUT high impedance Power-up time from shutdown Guaranteed by design. All input signals are specified with tR and tF = 5 ns (10% to 90% of VCC) and timed from a voltage level of 1.6 V. The 3.3 V operating range spans from 3.0 V to 3.6 V. The 5 V operating range spans from 4.75 V to 5.25 V. 2 See Figure 3 and Figure 4. 3 Mark/space ratio for the SCLK input is 40/60 to 60/40. 4 Measured with the load circuit in Figure 2 and defined as the time required for the output to cross 0.4 V or 2.0 V with VCC = 3.3 V and time for an output to cross 0.8 V or 2.4 V with VCC = 5.0 V. 5 t8 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit in Figure 2. The measured number is then extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that the time, t8, quoted in the Timing Specifications is the true bus relinquish time of the part and is independent of the bus loading. 6 Shutdown recovery time denotes the time it takes to start producing samples and does not account for the recovery time of the sensor, which is dependent on the overall bandwidth. 1 Rev. C | Page 4 of 16 Data Sheet ADIS16006 CIRCUIT AND TIMING DIAGRAMS 200A 1.6V CL 50pF 200A 05975-002 TO OUTPUT PIN IOL IOH Figure 2. Load Circuit for Digital Output Timing Specifications tACQ tCONVERT CS t6 t1 1 SCLK 2 3 t2 DOUT 4 t7 THREE-STATE 5 6 15 16 t8 t3 THREE-STATE 4 LEADING ZEROS DB9 DB10 DB11 DB0 t4 ZERO ZERO ZERO ADD0 ONE ZERO 05975-003 t5 DON'T CARE DIN PM0 Figure 3. Accelerometer Serial Interface Timing Diagram TCS t6 1 DOUT THREESTATE 2 3 t3 LEADING ZERO 4 11 15 t7 16 t8 THREE-STATE DB9 DB8 DB0 05975-004 t1 SCLK DIN Figure 4. Temperature Serial Interface Timing Diagram Rev. C | Page 5 of 16 ADIS16006 Data Sheet ABSOLUTE MAXIMUM RATINGS Table 4. Package Characteristics Table 3. Rating 3500 g 3500 g -0.3 V to +7.0 V (COM - 0.3 V) to (VCC + 0.3 V) Indefinite Package Type 12-Terminal LGA JA 200C/W JC 25C/W Device Weight 0.3 grams 3.1865 8x 1.797 8x 0.670 8x -40C to +125C -65C to +150C 6.373 2x Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. 3.594 4x 1.127 12x 0.500 12x 7.2mm x 7.2mm STACKED LGA. ALL DIMENSIONS IN mm. Figure 5. Second-Level Assembly Pad Layout ESD CAUTION Rev. C | Page 6 of 16 05975-005 Parameter Acceleration (Any Axis, Unpowered) Acceleration (Any Axis, Powered) VCC All Other Pins Output Short-Circuit Duration (Any Pin to Common) Operating Temperature Range Storage Temperature Range Data Sheet ADIS16006 TCS CS 12 VCC SCLK PIN CONFIGURATION AND FUNCTION DESCRIPTIONS 11 10 1 9 XFILT 8 YFILT 7 NC DIN 3 TOP VIEW (Not to Scale) 5 6 ST 2 NC DOUT COM 4 NC = NO CONNECT 05975-006 ADIS16006 Figure 6. Pin Configuration Table 5. Pin Function Descriptions Pin No. Mnemonic 1 TCS 2 DOUT 3 DIN 4 5, 7 6 8 COM NC ST YFILT 9 XFILT 10 CS 11 12 VCC SCLK Description Temperature Chip Select. Active low logic input. This input frames the serial data transfer for the temperature sensor output. Data Out, Logic Output. The conversion of the ADIS16006 is provided on this output as a serial data stream. The bits are clocked out on the falling edge of the SCLK input. Data In, Logic Input. Data to be written into the control register of the ADIS16006 is provided on this input and is clocked into the register on the rising edge of SCLK. Common. Reference point for all circuitry on the ADIS16006. No Connect. Self-Test Input. Active high logic input. Simulates a nominal 0.75 g test input for diagnostic purpose. Y-Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise contribution from the accelerometer. X-Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise contribution from the accelerometer. Chip Select. Active low logic input. This input provides the dual function of initiating the accelerometer conversions on the ADIS16006 and framing the serial data transfer for the accelerometer output. Power Supply Input. The VCC range for the ADIS16006 is 3.0 V to 5.25 V. Serial Clock, Logic Input. SCLK provides the serial clock for accessing data from the part and writing serial data to the control register. This clock input is also used as the clock source for the conversion process of the ADIS16006. Rev. C | Page 7 of 16 ADIS16006 Data Sheet TYPICAL PERFORMANCE CHARACTERISTICS 25 262 261 SENSITIVITY (LSB/g) PERCENT OF POPULATION (%) B3-Y B3-X 260 B1-Y B5-X 259 B2-X B1-X 258 257 B5-Y B4-X 256 B2-Y B4-Y AVERAGE = 2040.66 STANDARD DEVIATION = 23.19 20 15 10 5 2075 2080 2085 2090 2080 2085 2090 OUTPUT (LSB) Figure 7. Sensitivity vs. Temperature (1 g Stimulus) 05975-010 2070 2075 2065 2060 2055 2050 2045 2040 2070 TEMPERATURE (C) 2035 150 2030 125 2025 100 2020 75 2015 50 2010 25 2005 0 2000 -25 05975-007 0 254 -50 1995 255 Figure 10. X-Axis 0 g Bias at 25C 40 2048 AVERAGE = 2055.875 STANDARD DEVIATION = 6.464 35 AVG AT 5.25V AVG AT 4.75V 2044 AVG AT 3.60V 2042 AVG AT 3.30V AVG AT 3.00V 2040 30 25 20 15 10 2065 2060 2055 2050 2045 OUTPUT (LSB) Figure 8. X-Axis 0 g Bias vs. Temperature 05975-011 TEMPERATURE (C) 2040 120 2035 100 2030 80 2025 60 2020 40 2015 20 2010 0 2005 -20 05975-008 0 2038 -40 2000 5 1995 BIAS LEVEL (LSB) 2046 PERCENT OF POPULATION (%) 5.25V Figure 11. Y-Axis 0 g Bias at 25C 2048 60 2047 PERCENT OF POPULATION (%) +125C 2045 2044 +25C 2043 2042 -40C 2041 2040 50 40 30 20 10 2038 3.0 3.5 4.0 4.5 5.0 VCC (V) 5.5 0 80 85 90 95 100 105 110 115 120 125 130 135 140 NOISE (g/ Hz) Figure 12. Noise (X-Axis) at VCC = 5 V, 25C Figure 9. X-Axis 0 g Bias vs. Supply Voltage Rev. C | Page 8 of 16 05975-012 2039 05975-009 BIAS LEVEL (LSB) 2046 Data Sheet ADIS16006 45 250 AVG AT 5.25V AVG AT 5.00V 200 35 30 SELF TEST (LSB) PERCENT OF POPULATION (%) 40 25 20 15 10 AVG AT 4.75V 150 AVG AT 3.60V 100 AVG AT 3.30V AVG AT 3.00V 50 80 85 90 95 100 105 110 115 120 125 130 135 140 NOISE (g/ Hz) 0 -50 05975-013 0 150 250 AVERAGE = 202.2137 STANDARD DEVIATION = 12.09035 230 +125C 210 30 190 SELF TEST (LSB) 25 20 15 +25C 170 -40C 150 130 110 10 90 5 110 130 150 170 190 210 230 250 270 290 OUTPUT (LSB) 50 3.0 05975-014 0 4.0 4.5 5.0 5.5 5.5 VCC (V) Figure 14. X-Axis Self-Test at VCC = 5 V, 25C 40 3.5 05975-017 70 05975-018 PERCENT OF POPULATION (%) 100 Figure 16. Self-Test X-Axis vs. Temperature 35 Figure 17. Self-Test X-Axis vs. Supply Voltage 1.8 AVERAGE = 82.89281 STANDARD DEVIATION = 4.908012 +125C 1.7 30 1.6 SUPPLY CURRENT (mA) 35 25 20 15 10 5 +25C 1.5 1.4 -40C 1.3 1.2 1.1 0 40 45 50 55 60 65 70 75 80 85 90 95 100 105 110 OUTPUT (LSB) 1.0 3.0 05975-015 PERCENT OF POPULATION (%) 50 TEMPERATURE (C) Figure 13. Noise (Y-Axis) at VCC = 5 V, 25C 40 0 05975-016 5 3.5 4.0 4.5 5.0 VCC (V) Figure 18. Supply Current vs. Supply Voltage Figure 15. X-Axis Self-Test at VCC = 3.3 V, 25C Rev. C | Page 9 of 16 ADIS16006 Data Sheet 45 1.3 25 15 5 -5 1.15 1.19 1.23 1.27 1.31 1.35 1.39 1.43 1.47 1.51 1.55 1.59 CURRENT (mA) 1.2 1.1 +125C 1.0 +25C 0.9 -40C 0.8 0.7 0.6 3.0 05975-023 PERCENT OF POPULATION (%) VCC = 3.3V 35 3.5 4.0 4.5 5.0 5.5 VCC (V) 05975-020 POWER-DOWN SUPPLY CURRENT (mA) VCC = 5.0V Figure 21. Power-Down Supply Current vs. Supply Voltage Figure 19. Supply Current at 25C 0.6 60 0.4 VCC = 3.3V SAMPLING ERROR (dB) 40 30 20 10 0.2 0 -0.2 -0.4 -0.6 -0.8 -1.0 0 0.70 0.74 0.78 0.82 0.86 0.90 0.94 0.98 1.02 1.06 1.10 CURRENT (mA) 1 10 SAMPLE RATE (kSPS) Figure 22. Sampling Error vs. Sampling Frequency Figure 20. Power-Down Supply Current Rev. C | Page 10 of 16 100 05975-024 50 05975-019 PERCENT OF POPULATION (%) VCC = 5.0V Data Sheet ADIS16006 THEORY OF OPERATION The ADIS16006 is a low cost, low power, complete dual-axis accelerometer with an integrated serial peripheral interface (SPI) and an integrated temperature sensor whose output is also available on the SPI interface. The ADIS16006 is capable of measuring acceleration with a full-scale range of 5 g (minimum). The ADIS16006 can measure both dynamic acceleration (vibration) and static acceleration (gravity). ACCELEROMETER DATA FORMAT The accelerometer data is in a 12-bit, offset binary format. See Table 6 for examples of this data format. low, the next digital conversion is initiated. The details for the control register bit functions are shown in Table 7. Accelerometer Control Register MSB DONTC ZERO Decimal 3328 2050 2049 2048 2047 2046 768 Hex 0xD00 0x802 0x801 0x800 0x7FF 0x7FE 0x300 Binary 1101 0000 0000 1000 0000 0010 1000 0000 0001 1000 0000 0000 0111 1111 1111 0111 1111 1110 0011 0000 0000 SELF-TEST The ST pin controls the self-test feature. When this pin is set to VCC, an electrostatic force is exerted on the beam of the accelerometer. The resulting movement of the beam allows the user to test if the accelerometer is functional. The typical change in output is 801 mg (corresponding to 205 LSB) for VCC = 5.0 V. This pin can be left open-circuit or connected to common in normal use. The ST pin should never be exposed to voltage greater than VCC + 0.3 V. If the system design is such that this condition cannot be guaranteed (for example, multiple supply voltages are present), a low VF clamping diode between ST and VCC is recommended. ZERO ADD0 Bit 7 6, 5, 4 3 Mnemonic DONTC ZERO ADD0 2 1 0 ONE ZERO PM0 Power-Down By setting PM0 to 1 when updating the accelerometer control register, the ADIS16006 goes into shutdown mode. The information stored in the control register is maintained during shutdown. The ADIS16006 changes modes as soon as the control register is updated. If the part is in shutdown mode and PM0 is changed to 0, the part powers up on the 16th SCLK rising edge. ADD0 By setting ADD0 to 0 when updating the accelerometer control register, the x-axis output is selected. By setting ADD0 to 1, the y-axis output is selected. ZERO ZERO is defined as the Logic low level. ONE The serial interface on the ADIS16006 consists of five wires: CS, TCS, SCLK, DIN, and DOUT. Both accelerometer axes and the temperature sensor data are available on the serial interface. The CS and TCS are used to select the accelerometer or temperature sensor outputs, respectively. CS and TCS cannot be active at the same time. ONE is defined as the Logic high level. ACCELEROMETER SERIAL INTERFACE Figure 3 shows the detailed timing diagram for serial interfacing to the accelerometer in the ADIS16006. The serial clock provides the conversion clock. CS initiates the conversion process and data transfer and frames the serial data transfer for the accelerometer output. The accelerometer output is sampled on the second rising edge of the SCLK input after the falling edge of CS. The conversion requires 16 SCLK cycles to complete. The rising edge of CS puts the bus back into three-state. If CS remains ZERO Comments Don't care. Can be 1 or 0. These bits should be held low. This address bit selects the x-axis or y-axis outputs. A 0 selects the x-axis; a 1 selects the y-axis. This bit should be held high. This bit should be held low. This bit selects the operation mode for the accelerometer; set to 0 for normal operation and 1 for power-down mode. SERIAL INTERFACE The SCLK input accesses data from the internal data registers. ONE Table 7. Accelerometer Control Register Bit Functions Table 6. Acceleration Data Format Examples Acceleration (g) +5 +2/256 +1/256 0 -1/256 -2/256 -5 ZERO LSB PM0 DONTC DONTC is defined as don't care and can be a low or high logic level. Accelerometer Conversion Details Every time the accelerometer is sampled, the sampling function discharges the internal CX or CY filtering capacitors by up to 2% of their initial values (assuming no additional external filtering capacitors are added). The recovery time for the filter capacitor to recharge is approximately 10 s. Therefore, sampling the accelerometer at a rate of 10 kSPS or less does not induce a sampling error. However, as sampling frequencies increase above 10 kSPS, one can expect sampling errors to attenuate the actual acceleration levels. Rev. C | Page 11 of 16 ADIS16006 Data Sheet TEMPERATURE SENSOR SERIAL INTERFACE Temperature Sensor Conversion Details Read Operation The ADIS16006 features a 10-bit digital temperature sensor that allows an accurate measurement of the ambient device temperature to be made. Figure 4 shows the timing diagram for a serial read from the temperature sensor. The TCS line enables the SCLK input. Ten bits of data and a leading zero are transferred during a read operation. Read operations occur during streams of 16 clock pulses. The serial data can be received into two bytes to accommodate the entire 10-bit data stream. If only eight bits of resolution are required, the data can be received into a single byte. At the end of the read operation, the DOUT line remains in the state of the last bit of data clocked out until TCS goes high, at which time the DOUT line from the temperature sensor goes three-state. Write Operation Figure 4 also shows the timing diagram for the serial write to the temperature sensor. The write operation takes place at the same time as the read operation. Data is clocked into the control register on the rising edge of SCLK. DIN should remain low for the entire cycle. Temperature Sensor Control Register MSB ZERO ZERO ZERO ZERO ZERO ZERO ZERO LSB ZERO Table 8. Temperature Sensor Control Register Bit Functions Bit 7 to 0 Mnemonic ZERO Comments All bits should be held low. ZERO ZERO is defined as the Logic low level. Output Data Format The output data format for the temperature sensor is twos complement. Table 9 shows the relationship between the temperature and the digital output. Table 9. Temperature Sensor Data Format Temperature -40C -25C -0.25C 0C +0.25C +10C +25C +50C +75C +100C +125C Digital Output (DB9 ... DB0) 11 0110 0000 11 1001 1100 11 1111 1111 00 0000 0000 00 0000 0001 00 0010 1000 00 0110 0100 00 1100 1000 01 0010 1100 01 1001 0000 01 1111 0100 The conversion clock for the temperature sensor is internally generated; therefore, no external clock is required except when reading from and writing to the serial port. In normal mode, an internal clock oscillator runs the automatic conversion sequence. A conversion is initiated approximately every 350 s. At this time, the temperature sensor wakes up and performs a temperature conversion. This temperature conversion typically takes 25 s, at which time the temperature sensor automatically shuts down. The result of the most recent temperature conversion is available in the serial output register at any time. Once the conversion is finished, an internal oscillator starts counting and is designed to time out every 350 s. The temperature sensor then powers up and does a conversion. If the TCS is brought low every 350 s (30%) or less, the same temperature value is output onto the DOUT line every time without changing. It is recommended that the TCS line not be brought low every 350 s (30%) or less. The 30% covers process variation. The TCS should become active (high to low) outside this range. The device is designed to autoconvert every 350 s. If the temperature sensor is accessed during the conversion process, an internal signal is generated to prevent any update of the temperature value register during the conversion. This prevents the user from reading back spurious data. The design of this feature results in this internal lockout signal being reset only at the start of the next autoconversion. Therefore, if the TCS line goes active before the internal lockout signal is reset to its inactive mode, the internal lockout signal is not reset. To ensure that no lockout signal is set, bring TCS low at a greater time than 350 s (30%). As a result, the temperature sensor is not interrupted during a conversion process. In the automatic conversion mode, every time a read or write operation takes place, the internal clock oscillator is restarted at the end of the read or write operation. The result of the conversion is typically available 25 s later. Reading from the device before conversion is complete provides the same set of data. POWER SUPPLY DECOUPLING The ADIS16006 integrates two decoupling capacitors that are 0.047 F in value. For local operation of the ADIS16006, no additional power supply decoupling capacitance is required. However, if the system power supply presents a substantial amount of noise, additional filtering can be required. If additional capacitors are required, connect the ground terminal of each of these capacitors directly to the underlying ground plane. Finally, note that all analog and digital grounds should be referenced to the same system ground reference point. Rev. C | Page 12 of 16 Data Sheet ADIS16006 SETTING THE BANDWIDTH The ADIS16006 has provisions for band limiting the accelerometer. Capacitors can be added at the XFILT pin and the YFILT pin to implement further low-pass filtering for antialiasing and noise reduction. The equation for the 3 dB bandwidth is f-3dB = 1/(2(32 k) x (C(XFILT, YFILT) + 2200 pF)) or more simply, f-3dB = 5 F/(C(XFILT, YFILT) + 2200 pF) The tolerance of the internal resistor (RFILT) can vary typically as much as 25% of its nominal value (32 k); thus, the bandwidth varies accordingly. A minimum capacitance of 0 pF for CXFILT and CYFILT is allowable. Table 10. Filter Capacitor Selection, CXFILT and CYFILT Bandwidth (Hz) 1 10 50 100 200 400 2250 Capacitor (F) 4.7 0.47 0.10 0.047 0.022 0.01 0 SELECTING FILTER CHARACTERISTICS: THE NOISE/BANDWIDTH TRADE-OFF The accelerometer bandwidth selected ultimately determines the measurement resolution (smallest detectable acceleration). Filtering can be used to lower the noise floor, which improves the resolution of the accelerometer. Resolution is dependent on the analog filter bandwidth at XFILT and YFILT. The ADIS16006 has a typical bandwidth of 2.25 kHz with no external filtering. The analog bandwidth can be further decreased to reduce noise and improve resolution. The ADIS16006 noise has the characteristics of white Gaussian noise, which contributes equally at all frequencies and is described in terms of g/Hz (that is, the noise is proportional to the square root of the bandwidth of the accelerometer). The user should limit bandwidth to the lowest frequency needed by the application to maximize the resolution and dynamic range of the accelerometer. With the single-pole, roll-off characteristic, the typical noise of the ADIS16006 is determined by rmsNoise = (200 g/Hz) x ((BW x 1.57)) At 100 Hz, the noise is rmsNoise = (200 g/Hz) x ((100 x 1.57)) = 2.5 mg Often, the peak value of the noise is desired. Peak-to-peak noise can only be estimated by statistical methods. Table 11 is useful for estimating the probabilities of exceeding various peak values, given the rms value. Table 11. Estimation of Peak-to-Peak Noise Peak-to-Peak Value 2 x rms 4 x rms 6 x rms 8 x rms Rev. C | Page 13 of 16 Percentage of Time Noise Exceeds Nominal Peak-to-Peak Value (%) 32 4.6 0.27 0.006 ADIS16006 Data Sheet 12 11 10 9 1 ay 6 7 3 2 1 ax 4 6 10 8 5 12 4 9 8 7 DIGITAL OUTPUT (IN LSBs) X-AXIS: 1792 Y-AXIS: 2048 3 2 ax 7 3 9 4 DIGITAL OUTPUT (IN LSBs) X-AXIS: 2304 Y-AXIS: 2048 2 8 8 3 5 7 6 11 10 5 4 DIGITAL OUTPUT (IN LSBs) X-AXIS: 2048 Y-AXIS: 2048 1 ax 9 ay 10 11 12 05975-021 2 DIGITAL OUTPUT (IN LSBs) X-AXIS: 2048 Y-AXIS: 1792 6 12 ax 1 Top View Not to Scale 5 11 ay DIGITAL OUTPUT (IN LSBs) X-AXIS: 2048 Y-AXIS: 2304 ay Figure 23. Output Response vs. Orientation Rev. C | Page 14 of 16 Data Sheet ADIS16006 APPLICATIONS SECOND LEVEL ASSEMBLY The ADIS16006 can be attached to the second level assembly board using SN63 (or equivalent) or lead-free solder. IPC/ JEDEC J-STD-020 and J-STD-033 provide standard handling procedures for these types of packages. Rev. C | Page 15 of 16 ADIS16006 Data Sheet OUTLINE DIMENSIONS 3.594 BSC (4x) 1.797 BSC (8x) 7.35 MAX 10 PIN 1 INDICATOR 1 9 7.20 TYP 6 .373 BSC (2x) 7 3 6 TOP VIEW 1.00 BSC (12x) 12 0.200 MIN (ALL SIDES) 4 BOTTOM VIEW 0.797 BSC (8x) 0.373 BSC (12x) 5.00 TYP 092407-C 3.70 MAX SIDE VIEW Figure 24. 12-Terminal Land Grid Array [LGA] (CC-12-1) Dimensions shown in millimeters ORDERING GUIDE Model1 ADIS16006CCCZ ADIS16006/PCBZ 1 Temperature Range -40C to +125C Package Description 12-Terminal Land Grid Array (LGA) Evaluation Board Z = RoHS Compliant Part. (c)2006-2013 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D05975-0-2/13(C) Rev. C | Page 16 of 16 Package Option CC-12-1 Mouser Electronics Authorized Distributor Click to View Pricing, Inventory, Delivery & Lifecycle Information: Analog Devices Inc.: ADIS16006/PCBZ ADIS16006CCCZ