Dual-Axis ±5 g Accelerometer
with SPI Interface
Data Sheet
ADIS16006
Rev. C Document Feedback
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FEATURES
Dual-axis accelerometer
SPI digital output interface
Internal temperature sensor
Highly integrated; minimal external components
Bandwidth externally selectable
1.9 mg resolution at 60 Hz
Externally controlled electrostatic self-test
3.0 V to 5.25 V single-supply operation
Low power: <2 mA
3500 g shock survival
7.2 mm × 7.2 mm × 3.7 mm package
APPLICATIONS
Industrial vibration/motion sensing
Platform stabilization
Dual-axis tilt sensing
Tracking, recording, analysis devices
Alarms and security devices
GENERAL DESCRIPTION
The ADIS16006 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI). An integrated temperature sensor is also available on the
SPI interface. The ADIS16006 measures acceleration with a full-
scale range of ±5 g (minimum). The ADIS16006 can measure both
dynamic acceleration (vibration) and static acceleration (gravity).
The typical noise floor is 200 µg/√Hz, allowing signals below
1.9 mg (60 Hz bandwidth) to be resolved.
The bandwidth of the accelerometer is set with optional
capacitors, CX and CY, at the XFILT pin and the YFILT pin.
Digital output data for both axes is available via the serial interface.
An externally driven self-test pin (ST) allows the user to verify
the accelerometer functionality.
The ADIS16006 is available in a 7.2 mm × 7.2 mm × 3.7 mm,
12-terminal LGA package.
FUNCTIONAL BLOCK DIAGRAM
SCLK
DIN
DOUT
CS
TCS
TEMP
SENSOR
SERIAL
INTERFACE
DUAL-AXIS
±5g
ACCELEROMETER
V
CC
C
DC
COM ST
C
Y
C
X
YFILT XFILT
ADIS16006
05975-001
Figure 1.
ADIS16006 Data Sheet
Rev. C | Page 2 of 16
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications ....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications ..................................................................................... 3
Timing Specifications .................................................................. 4
Circuit and Timing Diagrams ..................................................... 5
Absolute Maximum Ratings ............................................................ 6
ESD Caution .................................................................................. 6
Pin Configuration and Function Descriptions ............................. 7
Typical Performance Characteristics ............................................. 8
Theory of Operation ...................................................................... 11
Accelerometer Data Format ...................................................... 11
Self-Test ....................................................................................... 11
Serial Interface ............................................................................ 11
Accelerometer Serial Interface.................................................. 11
Temperature Sensor Serial Interface ........................................ 12
Power Supply Decoupling ......................................................... 12
Setting the Bandwidth ............................................................... 13
Selecting Filter Characteristics: The Noise/Bandwidth Trade-
Off ................................................................................................. 13
Applications ..................................................................................... 15
Second Level Assembly.............................................................. 15
Outline Dimensions ....................................................................... 16
Ordering Guide .......................................................................... 16
REVISION HISTORY
2/13—Rev. B to Rev. C
Changes to Figure 23 ...................................................................... 14
3/12—Rev. A to Rev. B
Added Accelerometer Data Format Section ............................... 11
Added Table 6; Renumbered Sequentially .................................. 11
10/07—Rev. 0 to Rev. A
Changes to Features and General Description ............................. 1
Added Note 6 to Table 2 .................................................................. 4
Changes to Figure 5 .......................................................................... 6
Changes to Accelerometer Control Register Section ................. 11
Changes to Layout .......................................................................... 13
Changes to Layout .......................................................................... 14
Deleted Figure 24 and Table 11..................................................... 14
Edited Second-Level Assembly Section ....................................... 15
Updated Outline Dimensions ....................................................... 16
Changes to Ordering Guide .......................................................... 16
3/06—Revision 0: Initial Version
Data Sheet ADIS16006
Rev. C | Page 3 of 16
SPECIFICATIONS
TA = −40°C to +125°C, VCC = 5 V, C X = CY = 0 µF, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications
are guaranteed. Typical specifications are not guaranteed.
Table 1.
Parameter Conditions Min Typ Max Unit
ACCELEROMETER SENSOR INPUT
Each axis
Measurement Range1 ±5 g
Nonlinearity % of full scale ±0.5 ±2.5 %
Package Alignment Error ±1.5 Degrees
Alignment Error X sensor to Y sensor ±0.1 Degrees
Cross-Axis Sensitivity
±1.5
±3
%
ACCELEROMETER SENSITIVITY Each axis
Sensitivity at XFILT, YFILT 242 256 272 LSB/g
Sensitivity Change due to Temperature2 Delta from 25°C ±0.3 %
ZERO g BIAS LEVEL Each axis
0 g Voltage at XFILT, YFILT 1905 2048 2190 LSB
0
g
Offset vs. Temperature
±0.1
LSB/°C
ACCELEROMETER NOISE PERFORMANCE
Noise Density At 25°C 200 µg/√Hz rms
ACCELEROMETER FREQUENCY RESPONSE3, 4
CX, CY Range 0 10 µF
RFILT Tolerance 24 32 40 kΩ
Sensor Bandwidth CX = 0 µF, CY = 0 µF 2.26 kHz
Sensor Resonant Frequency 5.5 kHz
ACCELEROMETER SELF-TEST
Logic Input Low 0.2 × VCC V
Logic Input High 0.8 × VCC V
ST Input Resistance to COM 30 50 kΩ
Output Change at XOUT, YOUT5 Self-Test 0 to Self-Test 1 102 205 307 LSB
TEMPERATURE SENSOR
Accuracy VCC = 3 V to 5.25 V ±2 °C
Resolution 10 Bits
Update Rate 400 µs
Temperature Conversion Time 25 µs
DIGITAL INPUT
Input High Voltage (VINH) VCC = 4.75 V to 5.25 V 2.4 V
VCC = 3.0 V to 3.6 V 2.1 V
Input Low Voltage (VINL) VCC = 3.0 V to 5.25 V 0.8 V
Input Current VIN = 0 V or VCC −10 +1 +10 µA
Input Capacitance 10 pF
DIGITAL OUTPUT
Output High Voltage (VOH) ISOURCE = 200 µA, VCC = 3.0 V to 5.25 V VCC − 0.5 V
Output Low Voltage (VOL) ISINK = 200 µA 0.4 V
ADIS16006 Data Sheet
Rev. C | Page 4 of 16
Parameter Conditions Min Typ Max Unit
POWER SUPPLY
Operating Voltage Range 3.0 5.25 V
Quiescent Supply Current fSCLK = 50 kSPS 1.5 1.9 mA
Power-Down Current 1.0 mA
Turn-On Time
6
C
X
, C
Y
= 0.1 µF
20
ms
1 Guaranteed by measurement of initial offset and sensitivity.
2 Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature.
3 Actual bandwidth response controlled by user-supplied external capacitor (CX, CY).
4 See the Setting the Bandwidth section for more information on how to reduce the bandwidth.
5 Self-test response changes as the square of VCC.
6 Larger values of CX and CY increase turn-on time. Turn-on time is approximately (160 × (0.0022 + CX or CY) + 4) in milliseconds, where CX and CY are in µF.
TIMING SPECIFICATIONS
TA = −40°C to +125°C, acceleration = 0 g, unless otherwise noted.
Table 2.
Parameter1, 2 VCC = 3.3 V VCC = 5 V Unit Description
fSCLK3 10 10 kHz min
2 2 MHz max
tCONVERT 14.5 × tSCLK 14.5 × tSCLK
tACQ 1.5 × tSCLK 1.5 × tSCLK Throughput time = tCONVERT + tACQ = 16 × tSCLK
t1 10 10 ns min TCS/CS to SCLK setup time
t24 60 30 ns max Delay from TCS/CS until DOUT three-state disabled
t34 100 75 ns max Data access time after SCLK falling edge
t4 20 20 ns min Data setup time prior to SCLK rising edge
t5 20 20 ns min Data hold time after SCLK rising edge
t
6
0.4 × t
SCLK
0.4 × t
SCLK
ns min
SCLK high pulse width
t7 0.4 × tSCLK 0.4 × tSCLK ns min SCLK low pulse width
t85 80 80 ns max TCS/CS rising edge to DOUT high impedance
t96 5 5 µs typ Power-up time from shutdown
1 Guaranteed by design. All input signals are specified with tR and tF = 5 ns (10% to 90% of VCC) and timed from a voltage level of 1.6 V. The 3.3 V operating range spans
from 3.0 V to 3.6 V. The 5 V operating range spans from 4.75 V to 5.25 V.
2 See Figure 3 and Figure 4.
3 Mark/space ratio for the SCLK input is 40/60 to 60/40.
4 Measured with the load circuit in Figure 2 and defined as the time required for the output to cross 0.4 V or 2.0 V with VCC = 3.3 V and time for an output to cross 0.8 V or
2.4 V with VCC = 5.0 V.
5 t8 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit in Figure 2. The measured number is then extrapolated
back to remove the effects of charging or discharging the 50 pF capacitor. This means that the time, t8, quoted in the Timing Specifications is the true bus relinquish
time of the part and is independent of the bus loading.
6 Shutdown recovery time denotes the time it takes to start producing samples and does not account for the recovery time of the sensor, which is dependent on the
overall bandwidth.
Data Sheet ADIS16006
Rev. C | Page 5 of 16
CIRCUIT AND TIMING DIAGRAMS
200µA I
OL
200µA I
OH
1.6V
TO OUTPUT
PIN C
L
50pF
05975-002
Figure 2. Load Circuit for Digital Output Timing Specifications
SCLK
DOUT
DIN DON’T
CARE ZERO ZERO ZERO ADD0 ONE ZERO PM0
4 LE ADI NG ZE ROS
123456 15
16
tACQ tCONVERT
THREE-STATE THREE-STATE
t1
t2
t5
t4
t6
t7t3t8
DB11 DB10 DB9 DB0
CS
0
5975-003
Figure 3. Accelerometer Serial Interface Timing Diagram
TCS
SCLK
DOUT
DIN
1234 11 15 16
THREE-
STATE THREE-STATE
t
1
t
6
t
7
t
3
t
8
DB0
DB9 DB8
LEADING
ZERO
0
5975-004
Figure 4. Temperature Serial Interface Timing Diagram
ADIS16006 Data Sheet
Rev. C | Page 6 of 16
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter Rating
Acceleration (Any Axis, Unpowered) 3500 g
Acceleration (Any Axis, Powered) 3500 g
VCC −0.3 V to +7.0 V
All Other Pins (COM − 0.3 V) to (VCC + 0.3 V)
Output Short-Circuit Duration
(Any Pin to Common)
Indefinite
Operating Temperature Range
−40°C to +125°C
Storage Temperature Range −65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 4. Package Characteristics
Package Type θJA θJC Device Weight
12-Terminal LGA 200°C/W 25°C/W 0.3 grams
05975-005
1.127
12×
3.594
4×
6.373
2×
3.1865
8×
0.500
12×
0.670
8×
1.797
8×
7.2mm × 7.2mm STACKED LGA. ALL DIM E NS IO NS IN mm.
Figure 5. Second-Level Assembly Pad Layout
ESD CAUTION
Data Sheet ADIS16006
Rev. C | Page 7 of 16
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
ADIS16006
TOP VI EW
(No t t o Scal e)
NC
COM
ST
VCC
SCLK
CS
NC = NO CONNECT
XFILT
YFILT
NC
9
82
7
1
3
65
4
1012 11
TCS
DOUT
DIN
05975-006
Figure 6. Pin Configuration
Table 5. Pin Function Descriptions
Pin No. Mnemonic Description
1 TCS Temperature Chip Select. Active low logic input. This input frames the serial data transfer for the temperature
sensor output.
2 DOUT Data Out, Logic Output. The conversion of the ADIS16006 is provided on this output as a serial data stream.
The bits are clocked out on the falling edge of the SCLK input.
3 DIN Data In, Logic Input. Data to be written into the control register of the ADIS16006 is provided on this input and
is clocked into the register on the rising edge of SCLK.
4 COM Common. Reference point for all circuitry on the ADIS16006.
5, 7 NC No Connect.
6 ST Self-Test Input. Active high logic input. Simulates a nominal 0.75 g test input for diagnostic purpose.
8 YFILT Y-Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise
contribution from the accelerometer.
9
XFILT
X-Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise
contribution from the accelerometer.
10 CS Chip Select. Active low logic input. This input provides the dual function of initiating the accelerometer
conversions on the ADIS16006 and framing the serial data transfer for the accelerometer output.
11 VCC Power Supply Input. The VCC range for the ADIS16006 is 3.0 V to 5.25 V.
12
SCLK
Serial Clock, Logic Input. SCLK provides the serial clock for accessing data from the part and writing serial data to
the control register. This clock input is also used as the clock source for the conversion process of the ADIS16006.
ADIS16006 Data Sheet
Rev. C | Page 8 of 16
TYPICAL PERFORMANCE CHARACTERISTICS
262
254
255
256
257
258
259
260
261
–50 –25 0 25 50 75 100 125 150
SENSITIVITY (LSB/g)
TEM PE RAT URE ( ° C)
B1-X
B1-Y
B2-X
B2-Y
B3-X
B3-Y
B4-X
B4-Y
B5-X
B5-Y
05975-007
Figure 7. Sensitivity vs. Temperature (±1 g Stimulus)
2048
2046
2044
2042
2040
2038
–40 –20 0 20 40 60 80 100 120
BIAS L E VEL ( L SB)
TEMPERATURE (°C)
AVG AT 3. 00 V
AVG AT 3. 30V
AVG AT 3. 60V
AVG AT 4. 75V
AVG AT 5.25V
5.25V
05975-008
Figure 8. X-Axis 0 g Bias vs. Temperature
2048
2046
2044
2042
2040
2038
2047
2045
2043
2041
2039
3.0 5.55.04.54.03.5
BIAS L E VEL (LS B)
V
CC
(V)
–40°C
+25°C
+125°C
05975-009
Figure 9. X-Axis 0 g Bias vs. Supply Voltage
25
20
15
10
5
0
1995
2000
2005
2010
2015
2020
2025
2030
2035
2040
2045
2050
2055
2060
2065
2070
2075
2080
2085
2090
PERCENT OF POPULATION (%)
OUTPUT (LSB)
AVERAG E = 2040 .66
STANDARD DEV IATIO N = 23.19
05975-010
Figure 10. X-Axis 0 g Bias at 25°C
40
35
30
25
20
15
10
5
0
1995
2000
2005
2010
2015
2020
2025
2030
2035
2040
2045
2050
2055
2060
2065
2070
2075
2080
2085
2090
PERCENT OF POPULATION (%)
OUTPUT (LSB)
AVERAG E = 2055 .875
STANDARD DEV IATIO N = 6.464
05975-011
Figure 11. Y-Axis 0 g Bias at 25°C
60
50
40
30
20
10
0
PERCENT OF POPULATION (%)
NOI S E ( µg/ Hz)
80 85 90 95 100 105 110 115 120 125 130 135 140
05975-012
Figure 12. Noise (X-Axis) at VCC = 5 V, 25°C
Data Sheet ADIS16006
Rev. C | Page 9 of 16
45
40
35
30
25
20
15
10
5
0
PERCENT OF POPULATION (%)
NOI S E ( µg/ Hz)
80 85 90 95 100 105 110 115 120 125 130 135 140
05975-013
Figure 13. Noise (Y-Axis) at VCC = 5 V, 25°C
40
35
30
25
20
15
10
5
0
PERCENT OF POPULATION (%)
OUTPUT (LSB)
110 130 150 170 190 210 230 250 270 290
AVERAG E = 202. 21 37
STANDARD DEVIATION = 12.09035
05975-014
Figure 14. X-Axis Self-Test at VCC = 5 V, 25°C
40
35
30
25
20
15
10
5
0
PERCENT OF POPULATION (%)
OUTPUT (LSB)
110105100959085807570656055504540
AVERAG E = 82. 892 81
STANDARD DE V IATION = 4.908012
05975-015
Figure 15. X-Axis Self-Test at VCC = 3.3 V, 25°C
250
200
150
100
50
0
SELF TE ST (L SB)
TEM PE RAT URE ( ° C)
15050 1000–50
AVG AT 3. 00V
AVG AT 3. 30V
AVG AT 3. 60V
AVG AT 4. 75V
AVG AT 5. 00V
AVG AT 5. 25V
05975-016
Figure 16. Self-Test X-Axis vs. Temperature
250
230
210
190
170
150
130
110
90
70
50
SELF TEST (LSB)
V
CC
(V)
5.5
+125°C
+25°C
–40°C
4.0 4.5 5.03.53.0
05975-017
Figure 17. Self-Test X-Axis vs. Supply Voltage
+125°C
+25°C
–40°C
1.8
1.7
1.6
1.5
1.4
1.3
1.2
1.1
1.0
SUPPLY CURRENT ( mA)
V
CC
(V)
5.54.0 4.5 5.03.53.0
05975-018
Figure 18. Supply Current vs. Supply Voltage
ADIS16006 Data Sheet
Rev. C | Page 10 of 16
45
35
25
15
5
–5
PERCENT OF POPULATION (%)
CURRENT (mA)
05975-023
V
CC
= 5.0V
V
CC
= 3.3V
1.591.15 1.19 1.23 1.27 1.31 1.35 1.39 1.43 1.47 1.51 1.55
Figure 19. Supply Current at 25°C
60
50
40
30
20
10
0
PERCENT OF POPULATION (%)
CURRENT ( mA)
1.100.70 0.74 0.78 0.82 0.86 0.90 0.94 0.98 1.02 1.06
05975-019
VCC = 5.0V
VCC = 3.3V
Figure 20. Power-Down Supply Current
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
POWER-DOWN S UPPLY CURRE NT ( mA)
V
CC
(V)
5.55.04.54.03.53.0
05975-020
+125°C
+25°C
–40°C
Figure 21. Power-Down Supply Current vs. Supply Voltage
SAMPLING ERRO R ( dB)
SAMPLE RATE (kSPS)
05975-024
100110
0.6
–1.0
–0.8
–0.6
–0.4
–0.2
0
0.2
0.4
Figure 22. Sampling Error vs. Sampling Frequency
Data Sheet ADIS16006
Rev. C | Page 11 of 16
THEORY OF OPERATION
The ADIS16006 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI) and an integrated temperature sensor whose output is
also available on the SPI interface. The ADIS16006 is capable of
measuring acceleration with a full-scale range of ±5 g (minimum).
The ADIS16006 can measure both dynamic acceleration
(vibration) and static acceleration (gravity).
ACCELEROMETER DATA FORMAT
The accelerometer data is in a 12-bit, offset binary format. See
Table 6 for examples of this data format.
Table 6. Acceleration Data Format Examples
Acceleration (g) Decimal Hex Binary
+5 3328 0xD00 1101 0000 0000
+2/256 2050 0x802 1000 0000 0010
+1/256 2049 0x801 1000 0000 0001
0 2048 0x800 1000 0000 0000
−1/256 2047 0x7FF 0111 1111 1111
−2/256 2046 0x7FE 0111 1111 1110
−5 768 0x300 0011 0000 0000
SELF-TEST
The ST pin controls the self-test feature. When this pin is set to
VCC, an electrostatic force is exerted on the beam of the acceler-
ometer. The resulting movement of the beam allows the user to
test if the accelerometer is functional. The typical change in
output is 801 mg (corresponding to 205 LSB) for VCC = 5.0 V.
This pin can be left open-circuit or connected to common in
normal use. The ST pin should never be exposed to voltage
greater than VCC + 0.3 V. If the system design is such that this
condition cannot be guaranteed (for example, multiple supply
voltages are present), a low VF clamping diode between ST and
VCC is recommended.
SERIAL INTERFACE
The serial interface on the ADIS16006 consists of five wires: CS,
TCS, SCLK, DIN, and DOUT. Both accelerometer axes and the
temperature sensor data are available on the serial interface.
The CS and TCS are used to select the accelerometer or tem-
perature sensor outputs, respectively. CS and TCS cannot be
active at the same time.
The SCLK input accesses data from the internal data registers.
ACCELEROMETER SERIAL INTERFACE
Figure 3 shows the detailed timing diagram for serial interfacing to
the accelerometer in the ADIS16006. The serial clock provides
the conversion clock. CS initiates the conversion process and
data transfer and frames the serial data transfer for the
accelerometer output. The accelerometer output is sampled on
the second rising edge of the SCLK input after the falling edge
of CS. The conversion requires 16 SCLK cycles to complete. The
rising edge of CS puts the bus back into three-state. If CS remains
low, the next digital conversion is initiated. The details for the
control register bit functions are shown in Table 7.
Accelerometer Control Register
MSB LSB
DONTC ZERO ZERO ZERO ADD0 ONE ZERO PM0
Table 7. Accelerometer Control Register Bit Functions
Bit Mnemonic Comments
7
DONTC
Don’t care. Can be 1 or 0.
6, 5, 4 ZERO These bits should be held low.
3 ADD0 This address bit selects the x-axis or y-axis
outputs. A 0 selects the x-axis; a 1 selects
the y-axis.
2 ONE This bit should be held high.
1
ZERO
This bit should be held low.
0 PM0 This bit selects the operation mode for
the accelerometer; set to 0 for normal
operation and 1 for power-down mode.
Power-Down
By setting PM0 to 1 when updating the accelerometer
control register, the ADIS16006 goes into shutdown mode.
The information stored in the control register is maintained
during shutdown. The ADIS16006 changes modes as soon as the
control register is updated. If the part is in shutdown mode and
PM0 is changed to 0, the part powers up on the 16th SCLK
rising edge.
ADD0
By setting ADD0 to 0 when updating the accelerometer control
register, the x-axis output is selected. By setting ADD0 to 1, the
y-axis output is selected.
ZERO
ZERO is defined as the Logic low level.
ONE
ONE is defined as the Logic high level.
DONTC
DONTC is defined as don’t care and can be a low or high
logic level.
Accelerometer Conversion Details
Every time the accelerometer is sampled, the sampling function
discharges the internal CX or CY filtering capacitors by up to 2%
of their initial values (assuming no additional external filtering
capacitors are added). The recovery time for the filter capacitor
to recharge is approximately 10 µs. Therefore, sampling the
accelerometer at a rate of 10 kSPS or less does not induce a
sampling error. However, as sampling frequencies increase
above 10 kSPS, one can expect sampling errors to attenuate
the actual acceleration levels.
ADIS16006 Data Sheet
Rev. C | Page 12 of 16
TEMPERATURE SENSOR SERIAL INTERFACE
Read Operation
Figure 4 shows the timing diagram for a serial read from the
temperature sensor. The TCS line enables the SCLK input.
Ten bits of data and a leading zero are transferred during a read
operation. Read operations occur during streams of 16 clock
pulses. The serial data can be received into two bytes to
accommodate the entire 10-bit data stream. If only eight bits
of resolution are required, the data can be received into a single
byte. At the end of the read operation, the DOUT line remains
in the state of the last bit of data clocked out until TCS goes
high, at which time the DOUT line from the temperature
sensor goes three-state.
Write Operation
Figure 4 also shows the timing diagram for the serial write
to the temperature sensor. The write operation takes place at
the same time as the read operation. Data is clocked into the
control register on the rising edge of SCLK. DIN should remain
low for the entire cycle.
Temperature Sensor Control Register
MSB LSB
ZERO ZERO ZERO ZERO ZERO ZERO ZERO ZERO
Table 8. Temperature Sensor Control Register Bit Functions
Bit
Mnemonic
Comments
7 to 0 ZERO All bits should be held low.
ZERO
ZERO is defined as the Logic low level.
Output Data Format
The output data format for the temperature sensor is twos
complement. Table 9 shows the relationship between the
temperature and the digital output.
Table 9. Temperature Sensor Data Format
Temperature Digital Output (DB9 … DB0)
−40°C 11 0110 0000
−25°C 11 1001 1100
−0.25°C 11 1111 1111
0°C 00 0000 0000
+0.25°C 00 0000 0001
+10°C
00 0010 1000
+25°C 00 0110 0100
+50°C 00 1100 1000
+75°C 01 0010 1100
+100°C 01 1001 0000
+125°C
01 1111 0100
Temperature Sensor Conversion Details
The ADIS16006 features a 10-bit digital temperature sensor that
allows an accurate measurement of the ambient device temperature
to be made.
The conversion clock for the temperature sensor is internally
generated; therefore, no external clock is required except when
reading from and writing to the serial port. In normal mode, an
internal clock oscillator runs the automatic conversion sequence. A
conversion is initiated approximately every 350 µs. At this time,
the temperature sensor wakes up and performs a temperature
conversion. This temperature conversion typically takes 25 µs,
at which time the temperature sensor automatically shuts down.
The result of the most recent temperature conversion is avail-
able in the serial output register at any time. Once the conversion is
finished, an internal oscillator starts counting and is designed to
time out every 350 µs. The temperature sensor then powers up
and does a conversion.
If the TCS is brought low every 350 µs (±30%) or less, the same
temperature value is output onto the DOUT line every time
without changing. It is recommended that the TCS line not
be brought low every 350 µs (±30%) or less. The ±30% covers
process variation. The TCS should become active (high to low)
outside this range.
The device is designed to autoconvert every 350 µs. If the
temperature sensor is accessed during the conversion process,
an internal signal is generated to prevent any update of the
temperature value register during the conversion. This prevents
the user from reading back spurious data. The design of this
feature results in this internal lockout signal being reset only at
the start of the next autoconversion. Therefore, if the TCS line
goes active before the internal lockout signal is reset to its inactive
mode, the internal lockout signal is not reset. To ensure that no
lockout signal is set, bring TCS low at a greater time than 350 µs
(±30%). As a result, the temperature sensor is not interrupted
during a conversion process.
In the automatic conversion mode, every time a read or write
operation takes place, the internal clock oscillator is restarted at
the end of the read or write operation. The result of the conversion
is typically available 25 µs later. Reading from the device before
conversion is complete provides the same set of data.
POWER SUPPLY DECOUPLING
The ADIS16006 integrates two decoupling capacitors that are
0.047 µF in value. For local operation of the ADIS16006, no
additional power supply decoupling capacitance is required.
However, if the system power supply presents a substantial
amount of noise, additional filtering can be required. If additional
capacitors are required, connect the ground terminal of each
of these capacitors directly to the underlying ground plane.
Finally, note that all analog and digital grounds should be
referenced to the same system ground reference point.
Data Sheet ADIS16006
Rev. C | Page 13 of 16
SETTING THE BANDWIDTH
The ADIS16006 has provisions for band limiting the acceler-
ometer. Capacitors can be added at the XFILT pin and the
YFILT pin to implement further low-pass filtering for
antialiasing and noise reduction. The equation for the 3 dB
bandwidth is
f−3dB = 1/(2π(32 kΩ) × (C(XFILT, YFILT) + 2200 pF))
or more simply,
f−3dB = 5 µF/(C(XFILT, YFILT) + 2200 pF)
The tolerance of the internal resistor (RFILT) can vary typically as
much as ±25% of its nominal value (32 kΩ); thus, the bandwidth
varies accordingly.
A minimum capacitance of 0 pF for CXFILT and CYFILT is allowable.
Table 10. Filter Capacitor Selection, CXFILT and CYFILT
Bandwidth (Hz) Capacitor (µF)
1 4.7
10 0.47
50 0.10
100 0.047
200 0.022
400 0.01
2250 0
SELECTING FILTER CHARACTERISTICS:
THE NOISE/BANDWIDTH TRADE-OFF
The accelerometer bandwidth selected ultimately determines
the measurement resolution (smallest detectable acceleration).
Filtering can be used to lower the noise floor, which improves
the resolution of the accelerometer. Resolution is dependent on
the analog filter bandwidth at XFILT and YFILT.
The ADIS16006 has a typical bandwidth of 2.25 kHz with no
external filtering. The analog bandwidth can be further
decreased to reduce noise and improve resolution.
The ADIS16006 noise has the characteristics of white Gaussian
noise, which contributes equally at all frequencies and is described
in terms of µg/√Hz (that is, the noise is proportional to the
square root of the bandwidth of the accelerometer). The user
should limit bandwidth to the lowest frequency needed by the
application to maximize the resolution and dynamic range of
the accelerometer.
With the single-pole, roll-off characteristic, the typical noise of
the ADIS16006 is determined by
rmsNoise = (200 µg/√Hz) × (√(BW × 1.57))
At 100 Hz, the noise is
rmsNoise = (200 µg/√Hz) × (√(100 × 1.57)) = 2.5 mg
Often, the peak value of the noise is desired. Peak-to-peak noise
can only be estimated by statistical methods. Table 11 is useful
for estimating the probabilities of exceeding various peak
values, given the rms value.
Table 11. Estimation of Peak-to-Peak Noise
Peak-to-Peak Value
Percentage of Time Noise Exceeds
Nominal Peak-to-Peak Value (%)
2 × rms 32
4 × rms 4.6
6 × rms 0.27
8 × rms 0.006
ADIS16006 Data Sheet
Rev. C | Page 14 of 16
12
4
1011
a
y
a
x
65
8 97
3 2 1
12
4
10 11
65
8 97
3 2 1
12
4
1011
65
89 7
321
12
4
10 11
6 5
89 7
321
Top View
Not t o Scal e
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 1792
Y-AXIS: 2048
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2304
Y-AXIS: 2048
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2048
Y-AXIS: 2304
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2048
Y-AXIS: 1792
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2048
Y-AXIS: 2048
05975-021
a
y
a
x
a
y
a
x
a
y
a
x
Figure 23. Output Response vs. Orientation
ADIS16006 Data Sheet
Rev. C | Page 16 of 16
OUTLINE DIMENSIONS
092407-C
SIDE VIEW
TOP VIEW BOTTOM VIEW
PIN 1
INDICATOR
3.70
MAX
7.20
TYP
1
3
46
7
9
10 12
7.35
MAX
3.594
BSC
(4×)
1.797
BSC
(8×)
5.00
TYP
6 .373
BSC
(2×)
0.200
MIN
(ALL SIDES)
0.373 BS C
(12×)
1.00 BS C
(12×)
0.797 BS C
(8×)
Figure 24. 12-Terminal Land Grid Array [LGA]
(CC-12-1)
Dimensions shown in millimeters
ORDERING GUIDE
Model1 Temperature Range Package Description Package Option
ADIS16006CCCZ −40°C to +125°C 12-Terminal Land Grid Array (LGA) CC-12-1
ADIS16006/PCBZ Evaluation Board
1 Z = RoHS Compliant Part.
©2006–2013 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D05975-0-2/13(C)
