© Semiconductor Components Industries, LLC, 2016
October, 2016 − Rev. 3 1Publication Order Number:
NCV7518/D
NCV7518, NCV7518A
FLEXMOS] Hex Low‐side
MOSFET Pre‐driver
The NCV7518 / NCV7518A programmable six channel low-side
MOSFET pre-driver is one of a family of FLEXMOS automotive
grade products for driving logic-level MOSFETs. The product is
controllable by a combination of serial SPI and parallel inputs. The
device of fers 3.3 V/ 5 V compatible inputs and the serial output driver
can be powered from either 3.3 V or 5 V. An internal power-on reset
provides controlled power up. A reset input allows external
re-initialization and an enable input allows all outputs and diagnostics
to be simultaneously disabled.
Each channel independently monitors its external MOSFET’s drain
voltage for fault conditions. Shorted load fault detection thresholds are
fully programmable using an externally programmed reference
voltage and a combination of discrete internal ratio values. The ratio
values are SPI selectable and allow different detection thresholds for
each channel.
Fault recovery operation for each channel is programmable and may
be selected for latch-off or automatic retry. Status information for each
channel is 3-bit encoded by fault type and is available through SPI
communication.
The FLEXMOS family of products offers application scalability
through choice of external MOSFETs.
Features
16-bit SPI with Parity and Frame Error Detection
3.3 V/5 V Compatible Parallel and Serial Control Inputs
3.3 V/5 V Compatible Serial Output Driver
Reset and Enable Inputs
Open-drain Fault Flag
Priority Encoded Diagnostics with Latched Unique Fault Type Data
Shorted Load, Short to GND
Open Load with Fast Charge Option
On and Off State Pulsed Mode Diagnostics
Ratiometric Diagnostic References and Currents
Programmable
Shorted Load Fault Detection Thresholds
Fault Recovery Mode
Blanking Timers
Wettable Flanks Pb-Free Packaging
NCV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC-Q100 Qualified
and PPAP Capable
This is a Pb-Free Device
Benefits
Scalable to Load by Choice of External MOSFET
Device Package Shipping
ORDERING INFORMATION
NCV7518MWTXG QFN32
(Pb-Free) 5,000 / Tape &
Reel
QFN32
MW SUFFIX
CASE 485CZ
MARKING DIAGRAM
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NCV7518
AWLYYWWG
G
1
A = Assembly Location
WL = Wafer Lot
YY = Year
WW = Work Week
G= Pb-Free Package
For information on tape and reel specifications,
including part orientation and tape sizes, please
refer t o our Tape and Reel Packaging Specification
s
Brochure, BRD8011/D.
(Note: Microdot may be in either location)
NCV7518MWATXG QFN32
(Pb-Free) 5,000 / Tape &
Reel
NCV7518A
AWLYYWWG
G
1
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DRIVER
VCC2
VSS
CHANNEL0
POWER ON RESET
&
BIAS
CONTROL
REGISTERS
FAULT DATA
SPI
16 BIT
CLOCK
VSS
VSS
FAULT REFERENCE
GENERATOR
RST
CSB
SCLK
SI
SODRIVER
VSS
IREF
IREF
NCV7518
Hex MOSFET Pre-Driver
DRN0
IN0IN1IN2IN3IN4IN5 VCC2
GAT0
DRN1
GAT1
CHANNEL1
DRN
REF
DISABLE
PARALLEL
SERIAL
VCC2RST ENB
VSS
VLOAD
FLTREF
GND
FLTB
SI
SCLK
CSB
VCC1
ENB
SO
VDD
FAULT
DETECT
RSTB
OFF−STATE
DIAGNOSTICS
GENERATOR
POR REF
DRN
DISABLE
VREG 3V
INTERNAL
RAIL
RAIL
FAULT LOGIC
&
REFRESH TIMER
RAIL
+OA
VCC1 REF
REF
DISABLE
DRN2
GAT2
CHANNEL2
DRN
REF
DISABLE
PARALLEL
SERIAL
VCC2RST ENB
DRN3
GAT3
CHANNEL3
DRN
REF
DISABLE
PARALLEL
SERIAL
VCC2RST ENB
DRN4
GAT4
CHANNEL4
DRN
REF
DISABLE
PARALLEL
SERIAL
VCC2RST ENB
DRN5
GAT5
CHANNEL5
DRN
REF
DISABLE
PARALLEL
SERIAL
VCC2RST ENB
DRN
VSS
RST ENB
RST
RST
RST
CSB
RST
RST ENB
Figure 1. Block Diagram
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DRN0
VCC2
GAT0
DRN1
GAT1
VLOAD
GAT2
DRN3
GAT3
DRN4
GAT4
DRN5
GAT5
VSS
DRN2
SO
GND
FLTREF
VCC1
IN0
IN1
IN2
IN3
IN4
IN5
CSB
SCLK
SI
FLTB
VDD
RSTB
CB2
CB1
UNCLAMP ED LOAD
VLOAD
M
+5V
ENB
POWER-ON
RESET
+5V OR
+3.3V
PA RA LLELSPI
IRQ
HOST CONTROLLER
RST
RFPU
CB3
RX1RX2
REVERSE
BATTERY
&
TRANSIENT
PROTECTION
VBAT
RD0*
RD1*
RD2*
RD3*
RD4*
RD5*
RFILT
* Optional R DX - See Application Guidelines
Figure 2. Application Diagram
NCV7518
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PACKAGE PIN DESCRIPTION 32 PIN QFN EXPOSED PAD PACKAGE
Label Description
FLTREF Analog Fault Detect Threshold: 5 V Compliant
DRN0 − DRN5 Analog Drain Feedback
GAT0 − GAT5 Analog Gate Drive: 5 V Compliant
RSTB Digital Master Reset Input: 3.3 V/5 V (TTL) Compatible
ENB Digital Master Enable Input: 3.3 V/5 V (TTL) Compatible
IN0 − IN5 Digital Parallel Input: 3.3 V/5 V (TTL) Compatible
CSB Digital Chip Select Input: 3.3 V/5 V (TTL) Compatible
SCLK Digital Shift Clock Input: 3.3 V/5 V (TTL) Compatible
SI Digital Serial Data Input: 3.3 V/5 V (TTL) Compatible
SO Digital Serial Data Output: 3.3 V/5 V Compliant
FLTB Digital Open-Drain Output: 3.3 V/5 V Compliant
VLOAD Power Supply − Diagnostic References and Currents
VCC1 Power Supply − Low Power Path
GND Power Return − Low Power Path − Device Substrate
VCC2 Power Supply − Gate Drivers
VDD Power Supply − Serial Output Driver
VSS Power Return − VLOAD, VCC2, VDD
EP Exposed Pad − Connected to GND − Device Substrate
Figure 3. 32 Pin QFN Exposed Pad Pinout (Top View)
NCV7518
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MAXIMUM RATINGS (Voltages are with respect to device substrate.)
Rating Value Unit
DC Supply − VLOAD −0.3 to 40 V
DC Supply − VCC1, VCC2, VDD −0.3 to 5.8 V
Difference Between VCC1 and VCC2 ±0.3 V
Difference Between GND (Substrate) and VSS ±0.3 V
Drain Input Clamp Forward Voltage T ransient (2 ms, 1% duty) 78 V
Drain Input Clamp Forward Current Transient (2 ms, 1% duty) 10 mA
Drain Input Clamp Energy Repetitive (2 ms, 1% duty) 1.56 mJ
Drain Input Clamp Reverse Current VDRNX −1.0 V −50 mA
Input Voltage (Any Input Other Than Drain) −0.3 to 5.8 V
Output Voltage (Any Output) −0.3 to 5.8 V
Junction Temperature, TJ−40 to 150 °C
Storage Temperature, TSTG −65 to 150 °C
Peak Reflow Soldering Temperature: Lead-free 60 to 150 seconds at 217°C (Note 1) 260 peak °C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be af fected.
1. See or download ON Semiconductor’s Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
ATTRIBUTES
Characteristic Value
ESD Capability
Human Body Model per AEC−Q100−002 Drain Feedback Pins (Note 3)
VLOAD Pin
All Other Pins
±4.0 kV
±1.5 kV
±2.0 kV
Moisture Sensitivity (Note 2) MSL3
Package Thermal Resistance − Still-air
Junction-to-Ambient, RqJA
Junction-to-Exposed Pad, RYJPAD
(Note 4)
(Note 5) 95°C/W
46°C/W
3.2°C/W
2. See or download ON Semiconductor’s Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
3. With GND & VSS pins tied together − path between drain feedback pins and GND, or between drain feedback pins.
4. Based on JESD51−3, 1.2 mm thick FR4, 2S0P PCB, 2 oz. signal, 20 thermal vias to 400 mm2 spreader on bottom layer.
5. Based on JESD51−7, 1.2 mm thick FR4, 1S2P PCB, 2 oz. signal, 20 thermal vias to 80 x 80 mm 1 oz. internal spreader planes.
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter MIN MAX Unit
VLOAD Diagnostic References and Currents Power Supply Voltage 7.5 18.0 V
VDRNX Drain Input Feedback Voltage −0.3 60 V
VCC1 Main Power Supply Voltage 4.75 5.25 V
VCC2 Gate Drivers Power Supply Voltage VCC1 − 0.3 VCC1 + 0.3 V
VDD Serial Output Driver Power Supply Voltage 3.0 VCC1 V
VFLTREF Fault Detect Threshold Reference Voltage 0.35 2.75 V
VIN High Logic High Input Voltage 2.0 VCC1 V
VIN Low Logic Low Input Voltage 0 0.8 V
TAAmbient Still-air Operating Temperature −40 125 °C
tRESET Startup Delay at Power-on Reset (POR) (Note 6) 500 ms
6. Minimum wait time until device is ready to accept serial input data.
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PARAMETRIC TABLES
ELECTRICAL CHARACTERISTICS
(4.75 V VCCX 5.25 V, VDD = VCCX, 4.5 V VLOAD 18 V, RSTB = VCCX, ENB = 0, −40°C TJ 150°C, unless otherwise specified.)
(Note 7)
Characteristic Symbol Conditions Min Typ Max Unit
VCC1 SUPPLY
Operating Current −
VCC1 = 5.25 V, VFLTREF = 2.75 V ICC1A RSTB = 0 2.80 5.0 mA
ICC1B ENB = 0, RSTB = VCC1, VDRNX=0 V, GATX
Drivers Off 3.10 5.0 mA
ICC1C ENB = 0, RSTB = VCC1, GATX Drivers On 2.80 5.0 mA
Power-On Reset Threshold POR VCC1 Rising 3.65 4.125 4.60 V
Power-On Reset Hysteresis PORH 0.150 0.385 V
VCC2 SUPPLY
Operating Current ICC2 VCC2 = 5.25 V, ENB = 0, RSTB = VCC1 = 5.25 V
VDRNX = 0 V, GATX Drivers Off 2.80 5.0 mA
VDD SUPPLY
Standby Current IDD1 VDD = 5.25V, ENB = 0, RSTB = VCC1 = 5.25 V
SO = Z 25.0 34.0 mA
Operating Current IDD2 VDD = 5.25V, ENB = 0, RSTB = VCC1 = 5.25 V
SO = H or L 625 850 mA
VLOAD SUPPLY
Standby Current VLDSBY VLOAD = 13.2 V, 0 VCC1 5.25,
ENB = RSTB = VCC1, TA 85°C 5.0 mA
Operating Current VLDOP VLOAD = 18 V, ENB = 0, RSTB = VCC1,
VDRNX = 0 V 11 15 mA
DIGITAL I/O
VIN High VIHX RSTB, ENB, INX, SI, SCLK, CSB 2.0 V
VIN Low VILX RSTB, ENB, INX, SI, SCLK, CSB 0.8 V
VIN Hysteresis INHY RSTB, ENB, INX, SI, SCLK, CSB 100 330 500 mV
Input Pullup Resistance RPUX ENB, CSB, VIN = 0 V 50 125 200 kW
Input Pulldown Resistance RPDX RSTB, INX, SI, SCLK, VIN = VCC1 50 125 200 kW
SO Low Voltage VSOL VDD = 3.0 V, ISINK = 2 mA 0.4 V
SO High Voltage VSOH VDD = 3.0 V , ISOURCE = 2 mA VDD
0.6 V
SO Output Resistance RSO Output High or Low 25 W
SO Tri-State Leakage Current SOLKG CSB = 3.0 V −5.0 5.0 mA
FLTB Low V oltage VFLTB FLTB Active, IFLTB = 1.25 mA 0.4 V
FLTB Leakage Current IFLTLKG VFLTB = VCC1 10 mA
FAULT DETECTION − GATX ON
FLTREF Input Current IFLTREF 0 V VFLTREF 2.75 V −1.0 1.0 mA
FLTREF Input Linear Range VREFLIN (Note 8) 0.35 2.75 V
FLTREF Op-amp VCC1 PSRR PSRR (Note 8) 30 dB
7. Min/Max values are valid for the temperature range −40°CTJ150°C unless noted otherwise. Min/Max values are guaranteed by test,
design or statistical correlation.
8. Guaranteed by design.
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ELECTRICAL CHARACTERISTICS (continued)
(4.75 V VCCX 5.25 V, VDD = VCCX, 4.5 V VLOAD 18 V, RSTB = VCCX, ENB = 0, −40°C TJ 150°C, unless otherwise specified.)
(Note 7)
Characteristic UnitMaxTypMinConditionsSymbol
FAULT DETECTION − GATX ON
DRNX Shorted Load Threshold
VFLTREF = 0.35V
V25 Register R2.C[11:9] = 000 (DEFAULT) 20 25 30 %
VFLTREF
V40 Register R2.C[11:9] = 001 35 40 45
V50 Register R2.C[11:9] = 010 45 50 55
V60 Register R2.C[11:9] = 011 55 60 65
V70 Register R2.C[11:9] = 100 65 70 75
V80 Register R2.C[11:9] = 101 75 80 85
V90 Register R2.C[11:9] = 110 85 90 95
V100 Register R2.C[11:9] = 111 95 100 105
DRNX Input Leakage Current IDLKG 0 V VCC1 = VCC2 = VDD 5.25 V,
RSTB = 0 V, VDRNX = 32 V
TA 25°C−5.0
−1.0
5.0
1.0
mA
DRNX Clamp Voltage VCL IDRNX= ICL(MAX) =10 mA; Transient
(2 ms, 1% Duty) 60 78 V
Fault Detection − GATX OFF (7.5 V VLOAD 18 V, Register R3.D[11:0] = 1)
DRNX Diagnostic Current
− Proportional to VLOAD ISG Short to GND Detection, VDRNX = 43%VLOAD − 81 −60 − 39 mA / V
IOL Open Load Detection, VDRNX = 61%VLOAD 2.73 4.20 5.67 mA / V
ICHG Transient Fast Charge Current,
0 < VDRNX < VCTR, t < tBL(OFF) −270 −200 −130 mA / V
Diagnostic Current Limit Point VLIM Current Clamped and No Longer Proportional to
VLOAD 20 V
DRNX Fault Threshold Voltage VSG Short to GND Detection 39.56 43 46.44 %VLOAD
VOL Open Load Detection 56.12 61 65.88 %VLOAD
DRNX Off State Bias Voltage VCTR 46.92 51 55.08 %VLOAD
VLOAD Undervoltage Threshold VLDUV VLOAD Decreasing 4.1 6.3 7.5 V
FAULT TIMERS
Channel Fault Blanking Timers
(Figure 6) tBL(ON) VDRNX = VLOAD; INX rising to FLTB Falling
Register R2.C[6:5] = 00 4.8 6 7.2 ms
Register R2.C[6:5] = 01 9.6 12 14.4
Register R2.C[6:5] = 10 (DEFAULT) 19.2 24 28.8
Register R2.C[6:5] = 11 28.8 48 57.6
tBL(OFF) VDRNX = 0V; INX falling to FLTB Falling
Register R2.C[8:7] = 00 44 55 66 ms
Register R2.C[8:7] = 01 65 81 97
Register R2.C[8:7] = 10 (DEFAULT) 130 162 195
Register R2.C[8:7] = 11 260 325 390
Channel Fault Filter Timer
(Figure 7) tFF(ON)
tFF(OFF) 2.0
44 3.0
55 4.0
66 ms
Global Fault Retry Timer
(Figure 8) tFR Register R0.M[5:0] = 1 6 8 10 ms
Timer Clock fCLK RSTB = VCC1 4.0 MHz
7. Min/Max values are valid for the temperature range −40°CTJ150°C unless noted otherwise. Min/Max values are guaranteed by test,
design or statistical correlation.
8. Guaranteed by design.
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ELECTRICAL CHARACTERISTICS (continued)
(4.75 V VCCX 5.25 V, VDD = VCCX, 4.5 V VLOAD 18 V, RSTB = VCCX, ENB = 0, −40°C TJ 150°C, unless otherwise specified.)
(Note 7)
Characteristic UnitMaxTypMinConditionsSymbol
GATE DRIVER OUTPUTS
GATX Output Resistance RGATX Output High or Low 200 350 500 W
GATX High Output Current IGSRC VGATX = 0 V −26.25 −9.5 mA
GATX Low Output Current IGSNK VGATX = VCC2 9.5 26.25 mA
Turn-On Propagation Delay tP(ON) INX to GATx (Figure 4) 1.0 ms
CSB to GATX (Figure 5)
Turn-Off Propagation Delay tP(OFF) INX to GATX (Figure 4) 1.0 ms
CSB to GATX (Figure 5)
Output Rise Time tR20% to 80% of VCC2, CLOAD = 400 pF (Figure 4,
Note 8) 277 ns
Output Fall Time tF80% to 20% of VCC2, CLOAD = 400 pF (Figure 4,
Note 8) 277 ns
SERIAL PERIPHERAL INTERFACE (Figure 9) VCCX = 5.0 V, VDD = 3.3 V, FSCLK = 4.0 MHz, CLOAD = 200 pF
SO Supply Voltage VDD 3.3 V Interface 3.0 3.3 3.6 V
5 V Interface 4.5 5.0 5.5 V
SCLK Clock Period tSCLK 250 ns
Maximum Input Capacitance CINX Sl, SCLK (Note 8) 12 pF
SCLK High Time tCLKH SCLK = 2.0 V to 2.0 V 125 ns
SCLK Low Time tCLKL SCLK = 0.8 V to 0.8 V 125 ns
Sl Setup Time tSISU Sl = 0.8 V/2.0 V to SCLK = 2.0 V (Note 8) 25 ns
Sl Hold Time tSIHD SCLK = 2.0 V to Sl = 0.8 V/2.0 V (Note 8) 25 ns
SO Rise Time tSOR (20% VSO to 80% VDD) CLOAD = 200 pF (Note 8) 25 50 ns
SO Fall Time tSOF (80% VSO to 20% VDD) CLOAD = 200 pF (Note 8) 50 ns
CSB Setup Time tCSBSU CSB = 0.8 V to SCLK = 2.0 V (Note 8) 60 ns
CSB Hold Time tCSBHD SCLK = 0.8 V to CSB = 2.0 V (Note 8) 75 ns
CSB to SO Time tCS−SO CSB = 0.8 V to SO Data Valid (Note 8) 65 125 ns
SO Delay Time SODLY SCLK = 0.8 V to SO Data Valid (Note 8) 65 125 ns
Transfer Delay Time CSDLY CSB Rising Edge to Next Falling Edge (Note 8) 1.6 ms
7. Min/Max values are valid for the temperature range −40°CTJ150°C unless noted otherwise. Min/Max values are guaranteed by test,
design or statistical correlation.
8. Guaranteed by design.
INX
GATX
tP(OFF)
80%
20%
tR
50%
50%
tF
tP(ON)
Figure 4. Gate Driver Timing Diagram − Parallel Input
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GATX
tP(OFF)
50%
CSB 50%
GX
tP(ON)
Figure 5. Gate Driver Timing Diagram − Serial Input
INX50%
DRNX
50%
FLTB 50%
tBL(ON) tBL(OFF)
Figure 6. Blanking Timing Diagram
INX
SHORTED
LOAD
THRESHOLD
DRNX
50%
FLTB 50%
tFF(ON) tFF(OFF)
OPEN LOAD
THRESHOLD
Figure 7. Filter Timing Diagram
INX
SHORTED LOAD THRESHOLD(FLTREF)
DRNX
tBL(ON) tFF
(ON)
GATXtFR tFR tBL(ON) tFR
Figure 8. Fault Retry Timing Diagram
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Note: Not defined but usually MSB of data just received.
CSB
SETUP
CSB
SCLK
SI
SO
MSB IN LSB IN
MSB OUT LSB OUT SEE
NOTE
TRANSFER
DELAY
1
BITS 14...1
BITS 14...1
16
SO
DELAY
SI
SETUP
SI
HOLD
CSB
HOLD
SO
RISE,FALL 80% VDD
20% VDD
CSB to
SO VALID
Figure 9. SPI Timing Diagram
DETAILED OPERATING DESCRIPTION
General
The NCV7518 is a six channel general-purpose low-side
pre-driver for controlling and protecting N-type logic level
MOSFETs. Programmable fault detection and protection
modes allow the device to accommodate a wide range of
external MOSFETs and loads, providing flexible
application solutions. Separate power supply pins are
provided for low and high current paths to improve analog
accuracy and digital signal integrity.
Power Up/Down Control
An internal Power-On Reset (POR) monitors VCC1 and
causes all GATX outputs to be held low until sufficient
voltage i s available to allow proper control of the device. All
internal registers are initialized to their defaults, status data
is cleared, and the open-drain fault flag (FLTB) is disabled.
When VCC1 exceeds the POR threshold, the device is
initialized and ready to accept input data. When VCC1 falls
below the POR threshold during power down, FLTB is
disabled and all GATX outputs are driven and held low until
VCC1 falls below about 1.5 V.
RSTB and ENB Inputs
The active-low RSTB input with a resistive pull-down
allows device reset by an external signal. When RSTB is
brought lo w, all GATX outputs, the timer clock, the SPI, and
the FLTB flag are disabled. All internal registers are
initialized to their default states, status data is cleared, and
the SPI and FLTB are enabled when RSTB goes high.
The active-low ENB input with resistive pull-up provides
a global enable. ENB disables all GATX outputs and
diagnostics, and resets the auto-retry timer when brought
high. The SPI is enabled, fault data is not cleared and
registers remain as programmed. Faulted outputs are
re-enabled when ENB goes low.
SPI Communication
The NCV7518 is a 16-bit slave device. Communication
between the host and the device may either be parallel via
individual CSB addressing or daisy-chained through other
devices using a compatible SPI protocol.
The active-low CSB chip select input has a pull-up
resistor. The SI and SCLK inputs have pull-down resistors.
The recommended idle state for SCLK is low. The tri-state
SO line driver is powered via the VDD and the VSS pins, an d
can be supplied with either 3.3 V or 5 V.
The device employs odd parity, and frame error detection
that requires integer multiples of 16 SCLK cycles during
each CSB high-low-high cycle (valid communication
frame.) A parity or frame error does not affect the FLTB flag.
The host initiates communication when a selected
device’s CSB pin goes low. Output data is simultaneously
sent MSB first from the SO pin while input data is received
MSB first at the SI pin under synchronous control of the
master s SCLK signal while CSB is held low (Figure 10).
Output data changes on the falling edge of SCLK and is
guaranteed valid before the next rising edge of SCLK. Input
data received must be valid before the rising edge of SCLK.
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When CSB goes low, frame error detection is initialized,
output data is transferred to the SPI, and the FLTB flag is
disabled and reset if previously set.
If a valid frame has been received when CSB goes high,
the last multiple of 16 bits received is decoded into
command data, and FLTB is re-enabled. The FLTB flag will
be set if a fault is detected.
If a frame or parity error is detected when CSB goes high,
new command data is ignored, and previous fault data
remains latched and available for retrieval during the next
valid frame. The FLTB flag will be set if a fault (not a frame
or parity error) is detected.
The interaction between CSB and FLTB facilitates fault
polling. When multiple NCV7518 devices are configured
for parallel SPI access with individual CSB addressing, the
device reporting a fault can be identified by pulsing each
CSB in turn.
Z
Z
X X
CSB
SCLK
SI
SO
1 2 3 14 15 16
MSB LSB
B15 B14 B13 B12 − B3 B2 B1 B0
UKN
B15 B14 B13 B2 B1 B0
Note: X=Don’t Care, Z=Tri−State, UKN=Unknown Data
4 − 13
B12 − B3
Figure 10. SPI Communication Frame Format
Serial Data and Register Structure
The 16-bit data received by the NCV7518 is decoded into
a 3-bit address, a 12-bit data word, and an odd parity bit
(Figure 11). The upper three bits, beginning with the
received MSB, are fully decoded to address one of eight
registers. The valid register addresses are shown in Table 1.
The input command structure is shown in Table 3. Each
register is later described in detail.
B3 B2 B1 B0
MSB LSB
B7 B6 B5 B4B11 B10 B9 B8B15 B14 B13 B12
B3 B2 B1 B0
MSB LSB
B7 B6 B5 B4B11 B10 B9 B8B15 B14 B13 B12
D3 D2 D1 D0D7 D6 D5 D4D11 D10 D9 D8A2 A1 A0 P
D3 D2 D1 D0D7 D6 D5 D4D11 D10 D9 D8A2 A1 A0 P
ADDRESS INPUT DATA + PARITY
ADDRESS ECHO OUTPUT DATA + PARITY
Figure 11. SPI Data Format
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Table 1. VALID REGISTER ADDRESSES
Function Type Alias A2 A1 A0
GATE & MODE SELECT W R0 0 0 0
DIAGNOSTIC PULSE W R1 0 0 1
DIAGNOSTIC CONFIG 1 W R2 0 1 0
DIAGNOSTIC CONFIG 2 W R3 0 1 1
STATUS CH2:0 R R4 1 0 0
STATUS CH5:3 R R5 1 0 1
REVISION INFO R R6 1 1 0
RESERVED TEST R7 1 1 1
The 16-bit data sent by the NCV7518 is an echo of the
previously received 3-bit address with the remainder of the
12-bit data and parity bit formatted into one of four response
types − an echo of the previously received input data, the
diagnostic status information, the device revision
information, or a transmission error (Table 2). The first
response frame sent after reset (via POR or RSTB) is the
device revision information.
Table 2. OUTPUT RESPONSE TYPES
ECHO RESPONSE
A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
ADDRESS
ECHO INPUT DATA ECHO ?
DIAGNOSTIC STATUS RESPONSE
1 0 0 0 0 ENB CH2 CH1 CH0 CH2 CH1 CH0 CH2 CH1 CH0 ?
1 0 1 0 0 ENB CH5 CH4 CH3 CH5 CH4 CH3 CH5 CH4 CH3 ?
ST2 ST1 ST0
DEVICE REVISION RESPONSE
1 1 0 0 0 0 0 0 0 D5 D4 D3 D2 D1 D0 ?
DIE REVISION MASK REVISION
TRANSMISSION ERROR RESPONSE
1 1 1 0 1 0 1 0 1 0 1 0 1 0 D0 P
PARITY ERROR 1 0
1 1 1 0 1 0 1 0 1 0 1 0 1 0 D0 P
FRAME ERROR 0 1
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Table 3. INPUT COMMAND STRUCTURE OVERVIEW
ALIAS 3-BIT ADDR 12-BIT COMMAND INPUT DATA ODD PARITY
R0 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
0 0 0 M5 M4 M3 M2 M1 M0 G5 G4 G3 G2 G1 G0 ?
GATE & MODE
SELECT 1 = AUTO RETRY
DEFAULT = LATCH OFF 1 = GATx ON
DEFAULT = ALL OFF
R1 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
0 0 1 F5 F4 F3 F2 F1 F0 N5 N4 N3 N2 N1 N0?
DIAGNOSTIC
PULSE 1 = DIAGNOSTIC OFF PULSE
DEFAULT = 0 1 = DIAGNOSTIC ON PULSE
DEFAULT = 0
R2 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
0 1 0 C11 C10 C9 C8 C7 C6 C5 C4 C3 C2 C1 C0 ?
DIAGNOSTIC
CONFIG 1 %VFLTREF
SELECT TBLANK
OFF TBLANK
ON NOT
USED CHANNEL
SELECT
R3
A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
0 1 1 CH5 CH4 CH3 CH2 CH
1CH0CH5 CH
4CH
3CH
2CH
1CH
0?
DIAGNOSTIC
CONFIG 2
1 = ENABLE FAST CHARGE
DEFAULT = DISABLE 1 = ENABLE DIAGNOSTIC
DEFAULT = ENABLE
OPEN LOAD DIAGNOSTIC ENABLE/DISABLE
R4 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
1 0 0 X X X X X X X X X X X X ?
DIAGNOSTIC
STATUS CH2:CH0 RETURN ENB STATUS; D[9] = 0 = ENABLED
RETURN CH2:CH0 STATUS; DEFAULT D[8:0] = 1
R5 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
1 0 1 X X X X X X X X X X X X ?
DIAGNOSTIC
STATUS CH5:CH3 RETURN ENB STATUS; D[9] = 0 = ENABLED
RETURN CH5:CH3 STATUS; DEFAULT D[8:0] = 1
R6 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
1 1 0 X X X X X X X X X X X X ?
REVISION
INFORMATION RETURN REVISION INFORMATION
R7 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
1 1 1 T11 T10 T9 T8 T7 T6 T5 T4 T3 T2 T1 T0 ?
RESERVED RESERVED FOR TEST MODE
Gate & Mode Select − Register R0
Each GATX output is turned on/off serially by
programming its respective GX bit (Table 4). When parallel
inputs I N X = 0, setting R0.GX = 1 causes the selected GATX
output to drive its external MOSFET’s gate to VCC2 (ON).
Setting R0.GX = 0 causes the selected GATX output to drive
its external MOSFET’s gate to VSS (OFF.) Note that the
actual state of the output depends on POR, RSTB, ENB and
shorted load fault states (SHRTX) as later defined by
Equation 1. Default after reset is R0.D[11:0] = 0 (all
channels latch-off mode, all outputs OFF.) R 0 i s an echo type
response register.
The disable mode for shorted load (on-state) faults is
controlled by each channel’s respective MX bit. Setting
R0.MX = 0 causes the selected GATX output to latch-off
when a fault is detected. Setting R0.MX = 1 causes the
selected G ATX output to auto-retry when a fault is detected.
Recovery from latch-of f is performed for all channels by
disabling then re-enabling the device via the ENB input.
Recovery for selected channels is performed by reading the
status registers (R4, R5) for the faulted channels then
executing a diagnostic ON or OFF pulse for the desired
channels.
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When auto-retry is selected, input changes for turn-on
time are ignored while the retry timer is active. Once active,
the timer will run to completion of the programmed time.
The output will follow the input at the end of the retry
interval. The timer is reset when ENB = 1 or when the mode
is changed to latch-off.
Table 4. GATE & MODE SELECT REGISTER
R0 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
0 0 0 M5 M4 M3 M2 M1 M0 G5 G4 G3 G2 G1 G0 ?
1 = AUTO RETRY
DEFAULT = LATCH OFF 1 = GATx ON
DEFAULT = ALL OFF
Diagnostic Pulse Select − Register R1
The NCV7518 has functionality to perform either on-state
or off-state diagnostic pulses (Table 5) The function is
provided for applications having loads normally in a
continuous on or off state. The diagnostic pulse function is
available for both latch-of f and auto-retry modes. The pulse
executes for the selected channel(s) on low-high transition
on CSB. Default after reset is R1.D[1 1:0] = 0. R1 is an echo
type response register.
Diagnostic pulses have priority and are not dependant on
the input (INX, GX) or the output (GATX) states. The pulse
does not execute if: ENB =1 (device is disabled); both an ON
and OFF pulse is simultaneously requested for the same
channel; an ON or OFF pulse is requested and a SCB
(shorted load) diagnostic code is present for the selected
channels; an ON or OFF pulse is requested while a pulse is
currently executing in the selected channels (i.e. a blanking
timer is active); the selected channels are currently under
auto-retry control (i.e. refresh timer is active).
When R1.FX = 1, the diagnostic OFF pulse command is
executed. The open load diagnostic is turned on if disabled
(see Diagnostic Config 2 − R3), the output changes state for
the programmed tBL(OFF) blanking period, and the
diagnostic status is latched if of higher priority than the
previous status. ICHG current is turned on if enabled via R3.
The output assumes the currently commanded state at the
end of the pulse.
When R1.NX = 1, the diagnostic ON pulse command is
executed. The output changes state for the programmed
tBL(ON) blanking period, and the diagnostic status is latched
if of higher priority than the previous status. The output
assumes the currently commanded state at the end of the
pulse. A flowchart for the diagnostic pulse is given in
Figure 16.
Table 5. DIAGNOSTIC PULSE SELECT REGISTER
R1 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
0 0 1 F5 F4 F3 F2 F1 F0 N5 N4 N3 N2 N1 N0?
1 = DIAGNOSTIC OFF PULSE
DEFAULT = 0 1 = DIAGNOSTIC ON PULSE
DEFAULT = 0
Diagnostic Config 1 − Register R2
The diagnostic Config 1 register programs the turn-on/off
blanking time and shorted load fault detection references f or
each channel (Table 6) Bits R2.C[2:0] select which channels
receive the configuration data (Table 7). Bits R2.C[8:5]
select turn-on/off blanking time (Table 8). Bits R2.C[11:9]
select the fault reference (Table 9). Default after reset is
indicated by “(DEF)” in the tables. R2 is an echo type
response register.
If a blanking timer is currently running when the register
is changed, the new value is accepted but will not take ef fect
until the next activation of the timer.
Table 6. DIAGNOSTIC CONFIG 1 REGISTER
R2 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
0 1 0 C11 C10 C9 C8 C7 C6 C5 C4 C3 C2 C1 C0 ?
%VFLTREF
SELECT TBLANK
OFF TBLANK
ON NOT
USED CHANNEL
SELECT
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Table 7. CHANNEL SELECT
C2 C1 C0 CHANNEL
SELECT
0 0 0 NONE
0 0 1 CHANNEL 0
0 1 0 CHANNEL 1
0 1 1 CHANNEL 2
1 0 0 CHANNEL 3
1 0 1 CHANNEL 4
1 1 0 CHANNEL 5
1 1 1 ALL (DEF)
Table 8. BLANKING TIME SELECT
C8 C7 C6 C5 C4 C3 TBLANK
OFF TBLANK
ON
X X
0 0 6 ms
0 1 12 ms
1 0 24 ms (DEF)
1 1 48 ms
0 0 55 ms
0 1 81 ms
1 0 162 ms (DEF)
1 1 325 ms
Table 9. FAULT REFERENCE SELECT
C11 C10C9 %VFLTREF
SELECT
0 0 0 25 (DEF)
0 0 1 40
0 1 0 50
0 1 1 60
1 0 0 70
1 0 1 80
1 1 0 90
1 1 1 100
Diagnostic Config 2 − Register R3
Off-state open load diagnostic currents for each channel
can be enabled or disabled for LED loads. Short to GND
diagnostic i s unaf fected. Fast charge current (ICHG) can be
enabled or disabled for capacitive loads. Channels are
selected b y bit positions in the register (Table 10 . ) Open load
status (OLF) information is suppressed when the diagnostic
is turned off via R3. Open load diagnostic and OLF status is
temporarily enabled when a diagnostic of f pulse is executed
via R1. Default after reset is R3.D[11:6] = 0 and R3.D[5:0]
= 1. R3 is an echo type response register.
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Table 10. DIAGNOSTIC CONFIG 2 REGISTER
R3 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
0 1 1 CH5 CH4 CH3 CH2 CH1 CH0CH5 CH4 CH3 CH2 CH1 CH0?
1 = ENABLE FAST CHARGE
DEFAULT = DISABLE 1 = ENABLE DIAGNOSTIC
DEFAULT = ENABLE
OPEN LOAD DIAGNOSTIC ENABLE/DISABLE
Diagnostic Status Registers − Register R4 & R5
Diagnostic status and ENB status information is returned
when R4 or R5 is selected (Table 11) Diagnostic status
information for each channel is 3-bit (ST2:0) priority
encoded (Table 12). Bit D[9] returns the state of the ENB
input e.g. D[9] = 0 when ENB = 0 (enabled). Default
response after reset or SPI read is D[8:0] = 1 (“Diagnostic
Not Complete”).
Table 11. DIAGNOSTIC STATUS REGISTERS
A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
R4 1 0 0 X X X X X X X X X X X X ? SI
1 0 0 0 0 ENB CH2 CH1 CH0 CH2 CH1 CH0 CH2 CH1 CH0 ? SO
R5 1 0 1 X X X X X X X X X X X X ? SI
1 0 1 0 0 ENB CH5 CH4 CH3 CH5 CH4 CH3 CH5 CH4 CH3 ? SO
ST2 ST1 ST0
Table 12. DIAGNOSTIC STATUS ENCODING
ST2 ST1 ST0 STATUS PRIORITY
0 0 0 INVALID
0 0 1 SCB − SHORT TO BATTERY 1 HIGHEST
0 1 0 SCG − SHORT TO GROUND 2
0 1 1 OLF − OPEN LOAD 3 (Note)
1 0 0 Diagnostic Complete − No Fault 4
1 0 1 No SCB Fault − ON State 5
1 1 0 No SCG/OLF Fault − OFF State 6
1 1 1 Diagnostic Not Complete (DEFAULT) 7 LOWEST
NOTE: OLF status report is suppressed when open load diagnostic is turned off via
Diagnostic Config 2 − register R3
Status is latched for the currently higher priority fault and
is not demoted if a fault of lower priority occurs. The status
registers are reset to “Diagnostic Not Complete” after
reading the registers, or by asserting a reset via RSTB. Status
registers are not af fected by ENB.
Revision Information − Register R6
Device revision information is returned when R6 is
selected ( Table 13). Output bits D[11:6] are hard coded to 0,
bits D[ 5: 3 ] are hard coded with the die (silicon) revision, and
bits D[2:0] are hard coded with the mask (interconnect)
revision. The first response frame sent after reset is the
device revision information. The revision encoding scheme
is shown in Table 14.
Mask revision may be incremented when an interconnect
revision is made. Die revision is incremented when a silicon
revision is made. Mask revision is reset to “000” when a die
revision is made.
Table 13. DEVICE REVISION INFORMATION
R6
A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
1 1 0 X X X X X X X X X X X X ? SI
1 1 0 0 0 0 0 0 0 D5 D4 D3 D2 D1 D0 ? SO
DIE REV MASK REV
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Table 14. DEVICE REVISION ENCODING
D5 D4 D3 D2 D1 D0
DIE REV MASK REV
0 0 0 A 0 0 0 0
0 0 1 B 0 0 1 1
0 1 0 C 0 1 0 2
0 1 1 D 0 1 1 3
1 0 0 E 1 0 0 4
1 0 1 F 1 0 1 5
1 1 0 G 1 1 0 6
1 1 1 H 1 1 1 7
Reserved − Register R7
Register R 7 i s reserved for factory test use. Data sent to R7
is ignored. In normal operation, R7 is an echo type response register. In the event of a transmission error, R7 responds
with either a parity or frame error on the next valid frame.
Table 15. TEST MODE REGISTER
R7
A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 P
1 1 1 X X X X X X X X X X X X ? SI
ECHO INPUT DATA ECHO ? SO
PARITY ERR 0 1 0 1 0 1 0 1 0 1 0 1 0 SO
FRAME ERR 0 1 0 1 0 1 0 1 0 1 0 0 1 SO
Gate Driver Control and Enable
Each GATX output may be turned on by either its
respective parallel INX input or the Gate & Mode Select
register bits R0.G[5:0] via SPI communication. The
device’s RSTB reset and ENB enable inputs can be used to
implement global control functions, such as system reset,
over-voltage or input override by a watchdog controller.
The RSTB input has an internal pull-down resistor and the
ENB input has an internal pull-up resistor. Each parallel
input has an internal pull-down resistor. Parallel input is
recommended when low frequency (10 kHz) PWM
operation of the outputs is desired. Unused parallel inputs
should be connected to GND.
When RSTB is brought low, all GATX outputs, the timer
clock, the SPI, and the FLTB flag are disabled. All internal
registers are initialized to their default states, status data is
cleared, and the SPI and FLTB are enabled when RSTB goes
high.
ENB disables all GATX outputs and diagnostics, and
resets the auto-retry timer when brought high. The SPI is
enabled, fault data is not cleared and registers remain as
programmed. Faulted outputs are re-enabled when ENB
goes low.
The INX input state and the GX register bit data are
logically combined with the internal (active low) power -on
reset signal (POR), the RSTB and ENB input states, and the
shorted load state (internal SHRTX) to control the
corresponding GATX output such that:
GATX+POR @RSTB @ENB @SHRTX@ǒINx)GXǓ
(eq. 1)
The GATX state truth table is given in Table 16.
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Table 16. GATE DRIVER TRUTH TABLE
POR RSTB ENB SHRTXINXGXGATX
0 X X X X X L
1 0 X X X X L
1 1 1 X X X L
1 1 0 1 0 0 L
1 1 0 1 1 X H
1 1 0 1 X 1 H
1 1 0 0 X X L
1 1 01 X X GXL
1 1 101 0 GXGX
1 10 X X X 0L
Gate Drivers
The non-inverting GATX drivers are symmetrical
resistive switches (350 W typ.) to the VCC2 and VSS
voltages. While the outputs are designed to provide
symmetrical gate drive to an external MOSFET, load current
switching symmetry is dependent on the characteristics of
the external MOSFET and its load. Figure 12 shows the gate
driver block diagram.
DRIVER
VCC2
VSS
FILTER
TIMER
LATCH OFF /
AUTO RETRY
DRNX
GATX
FAULT
DETECTION
STX[2:0]
R2.C[4:3]
BLANKING
TIMER
ENCODING
LOGIC
EN SHRTX
350
R0.M[ X]
RSTB
ENB
POR
DIAGNOSTIC
PULSE EN
GX
INX
R1.F|N[X]
R2.C[8:5]
R2.C[11:9]
VSS
R3.D[X,X+6]
Figure 12. Gate Driver Channel
Blanking and Filter Timers
Blanking timers are used to allow drain feedback to
stabilize after a channel is commanded to change states.
Filter timers are used to suppress glitches while a channel is
in a stable state.
A turn-on blanking timer is started when a channel is
commanded on. Drain feedback is sampled after tBL(ON). A
turn-off blanking timer is started when a channel is
commanded off. Drain feedback is sampled after tBL(OFF).
A filter timer is started when a channel is in a stable state
and a fault detection threshold associated with that state has
been crossed. Drain feedback is sampled after tFF(ON|OFF).
A filter timer may also be started while a blanking timer is
active, so the blanking interval could be extended by the
filter time.
Each channel has independent blanking and filter timers.
The parameters for the tFF(ON|OFF) filter timer are the same
for all channels. The turn-on/off blanking time for each
channel can be selected via the Diagnostic Config 1 register
bits R2.C[8:5] (Tables 6 and 8).
If a blanking timer is currently running when the register
is changed, the new value is accepted but will not take ef fect
until the next activation of the timer.
Blanking timers for all channels are started when both
RSTB goes high and ENB goes low, when RSTB goes high
while ENB is low, when ENB goes low while RSTB is high,
or by POR.
Fault Diagnostics and Behavior
Each channel has independent fault diagnostics and
employs blanking and filter timers to suppress false faults.
An external MOSFET is monitored for fault conditions by
connecting its drain to a channel’s DRNX feedback input
through an optional external series resistor.
Shorted load (or short to VLOAD) faults can be detected
when a driver is on. Open load or short to GND faults can be
detected when a driver is off.
On-state faults will initiate MOSFET protection behavior,
set the FLTB flag and the respective channel’s status bits in
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the device’s status registers. Off-state faults will simply set
the FLTB flag and the channel’s status bits.
Status information is retrieved by SPI read of registers R4
and R5 (Table 11). Status information for each channel is
3-bit priority encoded (Table 12). Shorted load fault has
priority over open load and short to GND. Short to GND has
priority over open load. Priority ensures that the most severe
fault data is available at the next SPI read.
Status is latched for the currently higher priority fault and
is not demoted if a fault of lower priority occurs. The status
registers are reset to “Diagnostic Not Complete” after
reading the registers, or by asserting a reset via RSTB. Status
registers are not af fected by ENB.
When either RSTB is low or ENB is high, diagnostics are
disabled. When RSTB is high and ENB is low, open load
diagnostics are enabled according to the state of the
Diagnostic Config 2 register bits R3.D[5:0] (Table 10).
Diagnostic Pulse Mode
The NCV7518 has functionality to perform either on-state
or off-state diagnostic pulses (Table 5). The function is
provided for applications having loads normally in a
continuous on or off state. The diagnostic pulse function is
available for both latch-of f and auto-retry modes. The pulse
executes for the selected channel(s) on low-high transition
on CSB.
Diagnostic pulses have priority and are not dependant on
the input (INX, GX) or the output (GATX) states. The pulse
does not execute if: ENB =1 (device is disabled); both an ON
and OFF pulse is simultaneously requested for the same
channel; an ON or OFF pulse is requested and a SCB
(shorted load) diagnostic code is present for the selected
channels; an ON or OFF pulse is requested while a pulse is
currently executing in the selected channels (i.e. a blanking
timer is active); the selected channels are currently under
auto-retry control (i.e. refresh timer is active).
When R1.FX = 1, the diagnostic OFF pulse command is
executed. The open load diagnostic is turned on if disabled
(see Diagnostic Config 2 − R3), the output changes state for
the programmed tBL(OFF) blanking period, and the
diagnostic status is latched if of higher priority than the
previous status. ICHG current is turned on if enabled via R3.
The output assumes the currently commanded state at the
end of the pulse.
When R1.NX = 1, the diagnostic ON pulse command is
executed. The output changes state for the programmed
tBL(ON) blanking period, and the diagnostic status is latched
if of higher priority than the previous status. The output
assumes the currently commanded state at the end of the
pulse. A flowchart for the diagnostic pulse is given in
Figure 16.
Shorted Load Detection
An external reference voltage applied to the FLTREF
input serves as a common reference for all channels
(Figures 1 and 2). The FLTREF voltage should be within the
range of 0.35 to 2.75 V and can be derived via a voltage
divider between VCC1 and GND.
Shorted load detection thresholds can be programmed vi a
SPI in eight increments that are ratiometric to the applied
FLTREF voltage. Separate thresholds can be selected for
each channel via the Diagnostic Config 1 register bits
R2.C[11:9] (Tables 6 and 9).
A shorted load fault is detected when a channel’s DRNX
feedback is greater than its selected fault reference after
either the turn-on blanking or the filter has timed out.
Shorted Load Fault Disable and Recovery
Shorted load fault disable mode for each channel is
individually SPI programmable via the device’s Gate &
Mode select register bits R0.M[5:0] (Table 4).
When latch-off mode (default) is selected, the
corresponding G ATX output is latched of f upon detection of
a fault. Recovery from latch-off is performed for all
channels by disabling then re-enabling the device via the
ENB input. Recovery for selected channels is performed by
reading the status registers (R4, R5) for the faulted channels
then executing a diagnostic ON or OFF pulse for the desired
channels.
When auto-retry mode is selected the corresponding
GATX output is turned off upon detection of a fault for the
duration of the fault retry time (tFR). When auto-retry is
selected, input changes for turn-on blanking time are
ignored while the retry timer is active. Once active, the timer
will run to completion of the programmed time. The output
will follow the input at the end of the retry interval. The timer
is reset when ENB = 1 or when the mode is changed to
latch-off.
The output is automatically turned back on (if still
commanded on) when the retry time ends. The channel’s
DRNX feedback is re-sampled after the turn-on blanking
time. The output will automatically be turned off if a fault is
again detected. This behavior will continue for as long as the
channel is commanded on and the fault persists.
In either mode, a fault may exist at turn-on or may occur
some time afterward. To be detected, the fault must exist
longer than either tBL(ON) at turn-on or longer than tFF(ON)
some time after turn-on. The length of time that a MOSFET
stays on during a shorted load fault is thus limited to either
tBL(ON) or tFF(ON).
Recovery Retry Time
A global retry timer is used for auto-retry timing. The first
faulted channel triggers the timer and the full retry time is
guaranteed for that channel. An additional faulted channel
may initially retry immediately after its turn-on blanking
time, but subsequent retries will have the full retry time.
If all channels become faulted, they will become
synchronized to the global retry timer.
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Open Load and Short to GND Detection
A window comparator with references and bias currents
proportional to VLOAD is used to detect open load or short
to GND faults when a channel is off. Each channel’s DRNX
feedback is compared to the references after either the
turn-off blanking or the filter has timed out. Figure 13 shows
the DRNX bias and fault detection zones.
VCTR
VSG VOL
-ISG
IOL
0
VDRNX
IDRNX
Open
Load
Short to
GND
No
Fault
Figure 13. DRNX Bias and Fault Detection Zones
No fault is detected if the feedback voltage at DRNX is
greater than the VOL open load reference. If the feedback is
less than the VSG short to GND reference, a short to GND
fault is detected. If the feedback is less than VOL and greater
than VSG, an open load fault is detected.
When either RSTB is low or ENB is high, diagnostics are
disabled. When RSTB is high and ENB is low, off-state
diagnostics are enabled according to the content of the
Diagnostic Config 2 register bits R3.D[11:0] (Tables 10
and 17.)
Table 17. OPEN LOAD DIAGNOSTIC CONTROL
(CH0 shown)
D6 D0 ICHG
CURRENT OPEN LOAD
DIAGNOSTIC
X 0 OFF
X 1 ON (DEF)
0 X OFF (DEF)
1 X ON
Figure 14 shows the simplified detection circuitry. Bias
currents ISG and IOL are applied to a bridge along with bias
voltage V CTR. T ransient fast charge current ICHG is supplied
to help charge any capacitance present at the DRNx node to
suppress a false short to GND fault.
B
+
CMP2
IOL
+
CMP1
VCTR
VOL
VLOAD
A
VLD
(VCL)
DRNX
RDX
RLD
RSG
VX
ISG
D1
D2
D3
D4 DZ1
VSG
±VOS
R4
R3
R2
R1
+OA
ICHG
D5
RSTB
VBAT
DX1
S4S2S1
S5
S3
CONTROL
LOGIC
ENB
tBL(OFF)
R3.D[6,0]
CESD
R1.D[6,0]
Figure 14. Short to GND/Open-Load Detection
The transient current is started when a channel’s turn-off
blanking time is started and terminated either when the
DRNx voltage reaches VCTR or when the turn-off blanking
time t BL(OFF) expires. V DRNX will remain at VCTR if an open
load truly exists, otherwise the capacitance can continue to
charge via RLD.
When a channel is off and VLD and RLD are present, RSG
is absent, and VDRNX >> VCTR, bias current IOL is supplied
from VLD to ground through resistors RLD and optional
RDX, and bridge diode D2. Bias current ISG is supplied from
VLOAD to VCTR through D3. No fault is detected if the
feedback voltage (VLD minus the total voltage drop caused
by IOL and the resistance in the path) is greater than VOL.
When RSG and either VLD or RLD are absent, the bridge
will self-bias so that VDRNX will settle to about VCTR. An
open load fault can be detected since the feedback is between
VSG and VOL.
Short to GND detection can tolerate up to a ±1.0 V offset
(VOS) between the NCV7518’s GND and the short. When
RSG is present and VDRNX << VCTR, bias current ISG is
supplied from VLOAD to VOS through D1, and the RSG and
optional RDX resistances. Bias current IOL is supplied from
VCTR to ground through D4.
When V LD and RLD are p res ent , a voltage divider between
VLD and VOS is formed by RLD and RSG. A “soft” short to
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GND may be detected in this case depending on the ratio of
RLD and RSG and the values of RDX, VLD, and VOS.
Optional RDX resistor is used when voltages greater than
the 60 V minimum clamp voltage or down to −1 V are
expected at the DRNx inputs. Note that the comparators see
a voltage drop or rise due to the RDX resistance and the bias
currents. This produces an error in the comparison of
feedback voltage at the comparator inputs to the actual node
voltage VX.
Several equations for choosing RDX and for predicting
open load or short to GND resistances, and a discussion of
the dynamic behavior of the short to GND/ open load
diagnostic are provided in the “Application Guidelines”
section of this data sheet.
Fault Flag (FLTB)
The open-drain active-low fault flag output can be used t o
provide immediate fault notification to a host controller.
Fault detection from all channels is logically ORed to the
flag (Figure 15) The FLTB outputs from several devices can
be wire-ORed to a common pull-up resistor connected to the
controllers 3.3 or 5 V VDD supply.
When RSTB and CSB are high, and ENB is low, the flag
is set (low) when any channel detects any fault. The flag is
reset (hi-Z) and disabled during POR, when either RSTB or
CSB is low, or when ENB is high. See Table 18 for details.
OTHER
CHANNELS FLTB
FAULTX
POR
ENB
CSB
RSTB
Figure 15. FLTB Flag Logic
The interaction between CSB and FLTB facilitates fault
polling. When multiple NCV7518 devices are configured
for parallel SPI access with individual CSB addressing, the
device reporting a fault can be identified by pulsing each
CSB in turn.
Fault Detection and Capture
Each channel of the NCV7518 is capable of detecting
shorted load faults when the channel is on, and short to
ground or open load faults when the channel is off. Each
fault ty p e i s p r iority encoded into 3-bit per channel fault data
(Table 12.) Shorted load fault data has priority over open
load and short to GND data. Short to GND data has priority
over open load data. Priority ensures that the most severe
fault data is available at the next SPI read.
A drain feedback input for each channel compares the
voltage at the drain of the channel’s external MOSFET to
several internal reference voltages. Separate detection
references are used to distinguish the three fault types.
Blanking and filter timers are used respectively to allow for
output state transition settling and for glitch suppression.
When enabled and configured, each channel’s drain
feedback input is continuously compared to references
appropriate to the channel’s input state to detect faults, but
the comparison result is only latched at the end of either a
blanking or filter timer event.
Blanking timers for all channels are started when both
RSTB goes high and ENB goes low, when RSTB goes high
while ENB is low, when ENB goes low while RSTB is high,
or by POR. A single channel’s blanking timer is triggered
when its input state changes. If the comparison of the
feedback to a reference indicates an abnormal condition
when the blanking time ends, a fault has been detected and
the fault data is latched into the channel’s status register.
A channel’s filter timer is triggered when its drain
feedback comparison state changes. If the change indicates
an abnormal condition when the filter time ends, a fault has
been detected and the fault data is latched into the channel’s
status register.
Thus, a state change of the inputs (POR, RSTB, ENB, INX
or G X) o r a state change of an individual channel’s feedback
(DRNX) comparison must occur for a timer to be triggered
and a detected fault to be captured.
Fault Capture, SPI Communication, and SPI Frame
Error Detection
The NCV7518 latches a fault when it is detected, and
parity and frame error detection will not allow any register
to accept data if an invalid frame occurred.
The fault capture, parity, and frame error detection
strategies combine to ensure that intermittent faults can be
captured and identified, and that the device cannot be
inadvertently re-programmed by a communication error.
When a fault has been detected, status information is
latched into a channel’s status register if of higher priority
than current status, and the FLTB flag is set. The register
holds the status data and ignores subsequent lower priority
status data for that channel.
Current status information is transferred from the selected
status register into the SPI shift register at the start of the SPI
frame following the read status request. This ensures that
status updates continue during inter-frame latency between
the status request and delivery. The FLTB flag is reset when
CSB goes low.
The selected status register is cleared when CSB goes high
at the end of the SPI frame only if a valid frame has occurred;
otherwise the register retains status information until a valid
read frame occurs. The FLTB flag will be set if a fault is still
present.
Status registers and the FLTB flag can also be cleared by
toggling RSTB HLH. A full I/O truth table is given in
Table 18.
Status Priority Encoding
Shorted load (SCB) faults can be detected when a driver
is ON. Open load (OLF) or short to GND (SCG) faults can
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be detected when a driver is OFF. Status memory is priority
encoded in a 3-bit per driver format (Table 12).
Status memory will be encoded “Diagnostic Not
Complete” during a blanking period unless a fault of higher
priority has previously been encoded. Status memory will be
encoded “Diagnostic Not Complete” (cleared) for the
selected status register at the end of a valid SPI frame.
“Diagnostic Complete − N o Fault” will be encoded when
BOTH on-state AND off-state diagnostics have been
completed unless a fault of higher priority has previously
been encoded. A diagnostic cycle may start from either an
off-state or an on-state.
When a diagnostic cycle starts from an off-state and no
fault is detected, “No SCG/OLF Fault” will be encoded
unless a fault of higher priority has previously been encoded.
Otherwise, “OLF” or “SCG” will be encoded unless a fault
of higher priority has previously been encoded. If the cycle
continues t o a n on-state and no fault is detected, “Diagnostic
Complete − No Fault” will be encoded. Otherwise, “SCB”
will be encoded.
When a diagnostic cycle starts from an on-state and no
fault is detected, “No SCB Fault” will be encoded unless a
fault of higher priority has previously been encoded.
Otherwise, “SCB” will be encoded. If the cycle continues to
an off-state and no fault is detected, “Diagnostic Complete
No Fault” will be encoded unless a fault of higher priority
has previously been encoded. Otherwise, “OLF” or “SCG”
will be encoded unless a fault of higher priority has
previously been encoded.
Status is latched for the currently higher priority fault and
is not demoted if a fault of lower priority occurs. The status
registers are reset to “Diagnostic Not Complete” after
reading the registers, or by asserting a reset via RSTB. Status
registers are not af fected by ENB.
A Statechart diagram of the diagnostic status encoding is
given in Figure 17 and additional clarification is given in
“Appendix A − Diagnostic and Protection Behavior
Tutorial”.
VLOAD Undervoltage Detection
Undervoltage detection is used to suppress off-state
diagnostics when VLOAD falls below the specified
VLDUV operating voltage. This ensures that potentially
incorrect diagnostic status is not captured. On-state
diagnostics continue to operate normally and status
information is updated appropriately for an off-to-on input
transition during undervoltage.
Previous status information and FLTB are unchanged
when entering or leaving undervoltage. Upon a read of the
status registers during undervoltage, the status is changed to
“Diagnostic Not Complete” and will remain as such for
channels in an off-state during the entire undervoltage
interval. Status information and FLTB are updated
appropriately if a channel changes from off to on during the
interval.
When VLOAD returns to its normal operating range, a
channel’s tBL(OFF) blanking timer is started if the channel
was in an off state. Status information is updated
appropriately after the tBL(OFF) blanking interval, or after
the tFF(OFF) filter interval if the filter has been activated.
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ON or OFF Pulse
Request
Device
Enabled
?
Both ON&
OFF Request
?
SCB Code
Present
?
Currently
Executing*
?
ON Pulse
Request
?
*A blanking or
refresh timer is
currently running
for the selected
channel
Enable
Open Load
Execute
ON
Pulse
Open Load
Enabled
?
Execute
OFF
Pulse
Disable
Open Load*
Execute
OFF
Pulse
END
END
YES
YES
YES
NO
YES
YES
*Don’t disable if a SPI
access to R3.D[5:0]
occurred during the
pulse to enable the
channel’s diagnostic.
3/11/2010
Figure 16. Pulse Mode Diagnostic Flowchart
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{ If no SCB AND no SCG/OLF}
DIAG NOT COMPLETE
111
NO SCG/OLF
110
NO SCB
101
DIAG COMPLETE
NO FAULTS
100
OPEN LOAD (OLF)
011
SHOR T T O GND (SCG)
010
SHORTED LOAD (SCB)
001
RESET
ENB = 1
OR
VLOAD UV
AND
(INx AND Gx=0)
READ STATUS
OR
RESET
Figure 17. Diagnostic Status Encoding Statechart
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Table 18. I/O TRUTH TABLE
Inputs Outputs*
POR RSTB ENB CSB INXGXDRNXGATXFLTB ST[2:0] COMMENT
0 X X X X 0 X LZ111 POR RESET
1 0 X X X X X L Z 111 RSTB
1 1 1 X X GXX L Z ST[2:0] ENB
1 10 0 X X 0 X LZ111 RSTB RESET
1 1 01 X X GXXLZ ST[2:0] ENB DISABLE
1 1 0 X 0 0 > VOL L Z ST[2:0] FLTB RESET
1 1 0 1 0 0 VSG < V < VOL L L 011 FLTB SET − OLF
1 1 0 10 0 0 VSG < V < VOL L LZ 011 FLTB RESET
1 1 0 01 0 0VSG < V < VOL L ZL 011 FLTB SET
1 1 0 1 0 0 < VSG L L 010 FLTB SET − SCG
1 1 0 10 0 0 < VSG L LZ 010 FLTB RESET
1 1 0 01 0 0< VSG L ZL 010 FLTB SET
1 1 0 X 1 X < VFLTREF H Z ST[2:0] FLTB RESET
1 1 0 1 1 X > VFLTREF L L 001 FLTB SET − SCB
1 1 0 10 1 X> VFLTREF L LZ001 FLTB RESET
1 1 0 01 1 X> VFLTREF L ZL001 FLTB SET
1 1 0 1 X 1< VFLTREF H Z ST[2:0] FLTB RESET
1 1 0 1 X 1 > VFLTREF L L 001 FLTB SET − SCB
1 1 0 10 X 1 > VFLTREF L LZ 001 FLTB RESET
1 1 0 01 X 1 > VFLTREF L ZL 001 FLTB SET
*Output states after blanking and filter timers end and when channel is set to latch-off mode.
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APPLICATION GUIDELINES
General
Unused DRNX inputs should be connected to VLOAD to
prevent false open load faults. Unused parallel inputs should
be connected to GND and unused reset or enable inputs
should be connected to VCC1 or GND respectively. The
users software should be designed to ignore fault
information for unused channels. For best shorted-load
detection accuracy, the external MOSFET source terminals
should be star-connected and the NCV7518’s GND pin, and
the lower resistor in the fault reference voltage divider
should be Kelvin connected to the star (see Figure 2).
Consideration of auto-retry fault recovery behavior is
necessary from a power dissipation viewpoint (for both the
NCV7518 and the MOSFETs) and also from an EMI
viewpoint.
Driver slew rate and turn-on/of f symmetry can be adjusted
externally to the NCV7518 in each channel’s gate circuit by
the use of series resistors for slew control, or resistors and
diodes for symmetry. Any benefit of EMI reduction by this
method comes at the expense of increased switching losses
in the MOSFETs.
The channel fault blanking timers must be considered
when choosing external components (MOSFETs, slew
control resistors, etc.) to avoid false faults. Component
choices must ensure that gate circuit charge/discharge times
stay within the turn-on/turn-off blanking times.
The NCV7518 does not have integral drain-gate flyback
clamps. Self-clamped MOSFET products, such as
ON Semiconductors NIF9N05CL or NCV8440A devices,
are recommended when driving unclamped inductive loads.
This flexibility allows choice of MOSFET clamp voltages
suitable to each application.
Latch−off Recovery and PWM Operation
When a channel is latched off and the recovery method
chosen is the diagnostic pulse, the recovery attempt can be
blocked by a PWM or other signal transition at the channel’s
parallel INx input. The transition starts an ON or OFF
blanking timer which will prevent execution of a pulse
request if the request via SPI is received while the timer is
running.
This can be overcome by first sending Gx = 1 via SPI (i.e.
serial control) to override the channel’s INx input, reading
the diagnostic registers, then sending a pulse request. The
channel can then be released back to parallel control by
sending Gx = 0. Delays are added as necessary for the
appropriate blanking times between each step. Global
recovery may also be performed disabling then re−enabling
the device via the ENB input.
Auto−retry and OFF Pulse Interaction
A single hardware implementation serves as the global
auto−retry (tFR) timer function for all channels and within
each channel the turn−on (tBL(ON)) and turn−off (tBL(OFF))
blanking timers are shared (single hardware
implementation) with tBL(ON) time dominant. These same
blanking timers also generate the ON or OFF diagnostic
pulses.
If a channel configured for auto−retry is continuously
commanded O N and becomes faulted (SCB), it remains ON
and a turn−on blanking time is initiated every 8 ms for the
faulted channel and also for each non−faulted ON channel
configured for auto−retry. If a channel configured for
auto−retry is commanded OFF, it remains OFF and no
blanking timers are started.
When a diagnostic OFF pulse request is received just prior
to an auto−retry cycle, the channel’s tBL(OFF) timer can be
interrupted by the auto−retry timer (tBL(ON) blanking time
initiation). For example, a channel’s tBL(OFF) timer is
programmed for 162 ms and an OFF pulse is requested and
begins execution, but before it can complete its timeout, the
auto−retry initiates a tBL(ON) blanking time. Due to the
blanking timer sharing, the tBL(OFF) timer does not complete
its timeout and the pulse request becomes locked out.
The number of locked−out channels depends on which
ones were programmed for auto−retry and which ones were
requesting an OFF−pulse within the described zone of
vulnerability. Further OFF pulse requests will fail to execute
for each locked−out channel.
This interaction can be avoided for channels operated in
a constant−on state by selecting the latch−off recovery mode
and emulating the auto−retry mode. This can be done by
sending a series of read status and diagnostic pulse execution
requests with appropriate delays on a scheduled (e.g. every
10 ms) basis. Global recovery may also be performed
disabling then re−enabling the device via the ENB input.
Parity Error Handling
The SPI input (SI) shift register is reset (forced to 0x00)
in case of an invalid frame resulting from either an incorrect
frame length or incorrect parity. The ‘live’ parity check
hardware implementation of the SI register content is
blocked during a frame by CSB. When CSB goes high and
the frame length is correct but parity is incorrect, parity
check inputs may change as the SI register is forced to 0x00
and register data may be affected. In the event a parity error
occurs it is recommended to refresh all of the device’s
configuration (write) registers. Register data is not affected
if the frame length is incorrect.
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Appendix A − Diagnostic and Protection Behavior
Tutorial
The following tutorial can be used together with Table 19
and the Statechart of Figure 17 to further understand how
diagnostic status information is updated.
Initial Conditions:
VCC1 > V(POR) AND RSTB = 1
Digital core is disabled if these conditions are not valid
VCC2 present and in specified range
VLOAD present and in specified range
ON-State Diagnostic:
SCB − Short Circuit to Battery
Qualifiers:
VFLTREF present and in specified range
INx OR Gx = 1 AND ENB 1 0
ENB = 0 AND INx OR Gx 0 1
ENB = 0 AND ON-State Diagnostic Pulse Request
Blanking and/or Filter timer ran till end
“Diagnostic Complete” OFF-State Diagnostic:
OLF/SCG − Open Load Fault / Short Circuit to GND
Qualifiers:
VLOAD present and in specified range
INx AND Gx = 0 AND ENB 1 0
ENB = 0 AND INx 1 0 AND Gx = 0
ENB = 0 AND INx = 0 AND Gx 1 0
ENB = 0 AND OFF-State Diagnostic Pulse Request
Blanking and/or Filter timer ran till end
“Diagnostic Complete”
Transition Trigger Events:
Diagnostic status can transition from one state to
another by several trigger events:
ON and/or OFF state diagnostic completed
SPI Read of the status register(s)
Recovery from VLOAD undervoltage detected
Reset via POR or RSTB
Table 19. DIAGNOSTIC STATE TRANSITIONS
Entering
State Description Entering Criteria Exiting Criteria Exiting
State
001 [SCB] − Short Circuit to
Battery SCB Detected READ 111
010 [SCG] − Short Circuit to
Ground SCG Detected SCB Detected
READ 001
111
011 [OLF] − Open Load Failure OLF Detected SCB Detected
SCG Detected
READ
001
010
111
100 Diagnostic Complete − No
Fault OFF State No Fault
AND
ON State No Fault
SCB Detected
SCG Detected
OLF Detected
READ
001
010
011
111
101 No SCB Detected ON State No Fault SCB Detected
SCG Detected
OLF Detected
OFF State No Fault
READ
001
010
011
100
111
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Table 19. DIAGNOSTIC STATE TRANSITIONS
Entering
State Exiting
State
Exiting CriteriaEntering CriteriaDescription
110 No SCG/OLF Detected OFF State No Fault SCB Detected
SCG Detected
OLF Detected
ON State No Fault
READ
001
010
011
100
111
111 Diagnostic Not Complete READ SCB Detected & ENB = 0
SCG Detected & ENB = 0, VLOAD > VLDUV
OLF Detected & ENB = 0, VLOAD > VLDUV
ON State No Fault & ENB = 0
OFF State No Fault & ENB = 0, VLOAD > VLDUV
001
010
011
101
110
Diagnostic Status and Protection Interactions
The following figures are graphical representations of
some interactions between diagnostics and protections.
The following assumptions apply:
ENB = 0
SPI Response is shown in-frame
Actual NCV7518 response is one frame behind
SPI Frames are always valid
Integer multiples of 16 SCLK cycles
No parity errors
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SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
FLTREF
0
VBAT
VOL
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
111
RSTB 0
1
INTERNAL SIGNALS
101
VOL
VSG
tBL(OFF)
tBL(ON)
110 100
100
110
DIAG NOT COMPLETE NO SCB FAULT NO FAULT NO SCG/OLF FAULT
Start ON Normal Cycle1
111 111 110
110
Figure 18. Normal Start-up out of Reset with Input High − Diagnostics Complete, No Fault
SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
FLTREF
0
VBAT
VOL
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
111
RSTB 0
1
INTERNAL SIGNALS
VOL
VSG
tBL(OFF)
110
110
110
DIAG NOT COMPLETE NO SCG/OLF FAULT NO SCG/OLF FAULT
Start ON Normal Cycle 2
111 111 110
110
tBL(ON)
TRUNCATED
Figure 19. Normal Start-up Out of Reset with Input High, tBL(ON) Truncated − SCB Not Checked
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SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
VSG
0
VBAT
VOL
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
111
RSTB 0
1
INTERNAL SIGNALS
110
VOL
101 100
100
101111
tBL(ON)
tBL(OFF)
FLTREF
DIAG NOT COMPLETE NO SCB FAULTNO FAULTNO SCG/OLF FAULT
Start OFF Normal Cycle 1
111 101
101
Figure 20. Normal Start-up Out of Reset with Input Low − Diagnostics Complete, No Fault
SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
VSG
0
VBAT
VOL
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
111
RSTB 0
1
INTERNAL SIGNALS
101
VOL
101
101111
tBL(ON)
tBL(OFF)
FLTREF
DIAG NOT COMPLETE NO SCB FAULTNO SCB FAULT
Start OFF Normal Cycle 2
111 101
101
TRUNCATED
Figure 21. Normal Start-up Out of Reset with Input Low, tBL(OFF) Truncated − SCG/OLF Not Checked
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SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
FLTREF
0
VBAT
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
100
RSTB 0
1
INTERNAL SIGNALS
001 101
001
100
DIAG NOT COMPLETESCB FAULT NO FAULT
tFF(ON)
NO FAULT 111
VOL
NO SCB FAULT
ON Pulse Req
110
SCB Latch & Clear 1
ECHO
TRUNCATED
tBL(OFF)
Don’t Care
tBL(ON) tBL(ON)
VOL
VSG
tBL(OFF)
Figure 22. SCB Latch-off & Recovery − Read Status & Request ON Pulse
SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
FLTREF
0
VBAT
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
100
RSTB 0
1
INTERNAL SIGNALS
001 110
001
100
DIAG NOT COMPLETESCB FAULT NO FAULT
tFF(ON)
NO FAULT 111
VOL
NO SCG/OLF FAULT
tBL(OFF) tBL(ON)
OFF Pulse Req
Don’t Care
SCB Latch & Clear 2
VOL
VSG FLTREF
ECHO
101
Figure 23. SCB Latch-off & Recovery − Read Status & Request OFF Pulse
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SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
FLTREF
0
VBAT
DIAG
STATUS
BLANK/
REFRESH
TIMER
FILTER
TIMER
100
RSTB 0
1
INTERNAL SIGNALS
001 001
001
DIAG NOT COMPLETESCB FAULT
tFF(ON)
NO FAULT 111
VOL
SCB FAULT
ON/OFF Pulse Req
Ignored During Retry
Don’t Care
Retry 1
tBL(ON)
tFR
ECHO
tFR
VOL
VSG
tFF(ON)
Figure 24. Auto-retry Timer Started, INx Went Low During Second Retry − Retry Timer Runs to Completion
SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
FLTREF
0
VBAT
DIAG
STATUS
BLANK/
REFRESH
TIMER
FILTER
TIMER
100
RSTB 0
1
INTERNAL SIGNALS
001 001
001
DIAG NOT COMPLETESCB FAULT
tFF(ON)
NO FAULT 111
VOL
SCB FAULT
ON/OFF Pulse Req
Ignored During Retry
Don’t Care
Retry 2
tBL(ON)
tFR
ECHO
tFR
VOL
VSG
001
NOT COMPLETE
111 110
NO SCG/OLF
Figure 25. Auto-retry Timer Started, INx Went Low During Second Retry − Retry Timer Runs to Completion
Status Read Clears SCB, Allows OFF-state Status Update
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SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
VSG 0
VBAT
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
RSTB 0
1
INTERNAL SIGNALS
111 100
ECHO
NO SCB FAULT
101
VOL
NO FAULT
tBL(OFF)
VOL
VSG
tBL(ON)
ON or OFF Pulse Req Ignored
During tBL(ON|OFF)
Don’t Care
ON Pulse Req
ECHO
FLTREF
DIAG NOT COMPLETE 110
OFF BLANK STARTED TO ALLOW
DRAIN TO SETTLE
Pulse 1
Figure 26. Normal ON Pulse Request & Second Request Ignored − INx Remains in Low State at End of Pulse
SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
VSG 0
VBAT
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
RSTB 0
1
INTERNAL SIGNALS
111 101
ECHO
NO SCB FAULT
VOL
tBL(ON)
ON Pulse Req
ECHO
FLTREF
DIAG NOT COMPLETE
ECHO
ON Pulse Req
tBL(ON) tBL(OFF)
OFF Pulse Req
ECHO
tBL(ON)
110 100
NO FAULT
111
Status Req
100
101
NO SCB FAULT
BLANKING NOT RESTARTED
ON BLANK STARTED TO
ALLOW DRAIN TO SETTLE
Pulse 2
ON or OFF
Pulse Req
IGNORED
Figure 27. Normal ON Pulse Request & Second Request Ignored − INx State Change During First Pulse
Execution, Normal OFF Pulse Request
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SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
VSG 0
VBAT
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
RSTB 0
1
INTERNAL SIGNALS
111 101
ECHO
NO SCB FAULT
VOL
tBL(ON)
ON Pulse Req
ECHO
FLTREF
DIAG NOT COMPLETE
ECHO
ON Pulse Req
tBL(ON) tBL(OFF)
ON or OFF
Pulse Req
IGNORED
ECHO
tBL(ON)
110 100
NO FAULT
111
Status Req
100
101
NO SCB FAULT
BLANKING NOT RE−STARTED
Pulse 2a
ON or OFF
Pulse Req
IGNORED
OFF BLANK STARTED TO
ALLOW DRAIN TO SETTLE
Figure 28. Normal ON Pulse Request & Second Request Ignored, Normal ON Pulse Request,
INx State Change During Normal Pulse Executions
SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
VSG 0
VBAT
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
RSTB 0
1
INTERNAL SIGNALS
111 101
ECHO
NO SCB FAULT
VOL
tBL(ON)
Don’t Care
ON Pulse Req
ECHO
FLTREF
DIAG NOT COMPLETE
ECHO
ON Pulse Req
tBL(ON) tBL(OFF)
OFF Pulse Req
ECHO
110 100
NO FAULT
111
Status Req
100
110
NO SCG/OLF FAULT
Pulse 3
ON or OFF
Pulse Req
IGNORED
ON BLANK NOT STARTED
(OFF STATE)
OFF BLANK NOT STARTED
(ON STATE)
Figure 29. Normal ON Pulse Request & Second Request Ignored, Normal OFF Pulse Request,
INx State Change During Normal Pulse Executions and Goes Low During OFF Pulse
NCV7518, NCV7518A
www.onsemi.com
35
SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
VSG
0
VBAT
VOL
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
RSTB 0
1
INTERNAL SIGNALS
SCB
DIAG NOT COMPLETE
FLTREF
PREVIOUS DATA
tBL(ON)
tFF(ON)
tFF(ON)
t<t
FF(ON)
SCB
tBL(OFF)
VSG FLTREF
ON BLANK & FILTER & SCB
tBL(OFF)
VSG
111
111 NO SCG/OLF FAULT
Figure 30. Filter Timer Started During Blank Timer Because of Intermittent SCB, Re-started Just Before End of
Blank Timer − SCB Latch-off Time Extended
SO
GATx
FLTB
INx 0
1
0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
DRNx
FLTREF
0
VBAT
VOL
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
RSTB 0
1
INTERNAL SIGNALS
OLF
NO SCB FAULT
PREVIOUS DATA
tBL(OFF)
OLF
tBL(ON)
OFF BLANK & FILTER & FLT
VSG
tFF(OFF) tFF(OFF)
tFF(OFF)
SCG
OLF OLF
FLTREF
111
Figure 31. Filter Timer Started When Falling Through OLF Threshold During Blank Timer, Re-started When Falling
Through SCG Threshold, Re-started When Falling Through OLF Threshold − OFF-State Diagnostic Status
Acquisition Time Extended by Filter Timer
NCV7518, NCV7518A
www.onsemi.com
36
SO
FLTB
INx 0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
VLOAD
0
VBAT
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
VLDUV 0
1
INTERNAL SIGNALS
PREVIOUS DATA VALID ON
STATE DATA
STATUS
VLD
UV
tBL(ON)
Read Status
tBL(OFF)
DRNx
0
VBAT
DIAGNOSTIC NOT COMPLETE
VLDUV 1
111 VALID ON
STATE DATA
STATUS
Read Status
Figure 32. OFF-State Diagnostic Status is Suppressed While in VLOAD Undervoltage −
ON-State Diagnostics Remain Functional
SO
FLTB
INx 0
1
0
1
0
1
0
1
CSB 0
1
0
1
0
1
VLOAD
0
VBAT
DIAG
STATUS
BLANK
TIMER
FILTER
TIMER
VLDUV 0
1
INTERNAL SIGNALS
PREVIOUS DATA
STATUS
VLD
UV
Read Status
tBL(OFF)
DRNx
0
VBAT
DIAGNOSTIC NOT COMPLETE
tBL(OFF)
VALID OFF STATE DIAGNOSTIC
VLDUV 2
Figure 33. OFF-State Diagnostic Starts When Recovery From Undervoltage Occurs
NCV7518, NCV7518A
www.onsemi.com
37
PACKAGE DIMENSIONS
QFN32 5x5, 0.5P (PUNCHED)
CASE 485CZ
ISSUE A
SOLDERING FOOTPRINT
DIMENSIONS: MILLIMETERS
5.30
3.60
3.60
0.50
0.62
0.30
32X
32X
PITCH
5.30
PKG
OUTLINE
RECOMMENDED
ÉÉ
ÉÉ
SEATING
0.15 C
(A3) A
A1
b
1
32 32X
L
32X
BOTTOM VIEW
TOP VIEW
SIDE VIEW
DA B
E
0.15 C
PIN ONE
REFERENCE
0.10 C
0.08 C
C
eA0.10 B
C
0.05 C
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSIONS: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.15 AND 0.30 mm FROM THE TERMINAL TIP.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
DIM MIN MAX
MILLIMETERS
A0.80 0.90
A1 −− 0.05
A3 0.20 REF
b0.20 0.30
D5.00 BSC
D2 3.20 3.40
E5.00 BSC
3.40E2 3.20
e0.50 BSC
L0.30 0.50
PLANE
NOTE 4
E2
D2
NOTE 3
DET AIL A
8
e/2
9
24 A
M
0.10 BC
M
M
A
M
0.10 BC
DETAIL A
ALTERNATE TERMINAL
CONSTRUCTIONS
L
DETAIL B
(0.15)
(0.10)
ALTERNATE
CONSTRUCTION
L
DETAIL B
P
UBLICATION ORDERING INFORMATION
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Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
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Phone: 81−3−5817−1050
NCV7518/D
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