LTP75N08P
02
Symbol
Parameter
Limit
Min Typ Max Unit
STATIC
BV
DSS
Drain-Source Breakdown Voltage V
GS
=0V, I
D
=250μA 80 V
V
GS(th)
Gate Threshold Voltage V
DS
=V
GS
, I
D
=250μA 2 4 V
I
GSS
Gate-Body Leakage V
GS
=±25V ±100 nA
I
DSS
Zero Gate Voltage Drain Current V
DS
=Max Rating, V
GS
=0V 1 μA
R
DS(ON)
Drain-Source On-Resistance* V
GS
=10V, I
D
=40A 8.5 9.5 mΩ
DYNAMIC
Qg Total Gate Charge
70 98
Qgs Gate-Source Charge
19
Qgd Gate-Drain Charge
V
DD
=30V, V
GS
=10V, I
D
=40A
22
nC
Rg Gate Resistance f=1MHz
1.5 Ω
C
iss
Input Capacitance
3450
C
oss
Output Capacitance
470
C
rss
Reverse Transfer Capacitance
V
DS
=30V, V
GS
=0V,
f=1MHz
190
pF
t
d(on)
Turn-On Delay Time
23
t
r Turn-On Rise Time
12
t
d(off)
Turn-Off Delay Time
77
t
f
Turn-Off Fall Time
V
GS
=10V, R
L
=30Ω
V
DD
=30V, R
G
=6Ω, I
DS
=1A
69
ns
Symbol
Characteristic Min.
Typ.
Max.
Units
Test Condition
I
S
Continuous Source current ------
------
80
I
SM
Pulsed Source Current --- 300
Integral reverse PN diode in The
MOSFET
V
SD
Diode Forward voltage------------- 0.8 1.1 V I
S
=20A , V
GS
= 0V
Trr Reverse Recover Time 55 nS
Qrr Reverse Recover Charge 117
nC I
DS
=40A, dl
SD
/dt=100A/µs
Electrical Characteristics (TA =25℃ Unless Otherwise Specified)
Source-Drain Diode Ratings and Characteristics
Note: Pulse test: pulse width <= 300us, duty cycle<= 2%
A