IRLML6401PbF
2www.irf.com
Parameter Min. Typ. Max. Units Conditions
ISContinuous Source Current MOSFET symbol
(Body Diode) ––– ––– showing the
ISM Pulsed Source Current integral reverse
(Body Diode) ––– ––– p-n junction diode.
VSD Diode Forward Voltage ––– ––– -1.2 V TJ = 25°C, IS = -1.3A, VGS = 0V
trr Reverse Recovery Time ––– 22 33 ns TJ = 25°C, IF = -1.3A
Qrr Reverse RecoveryCharge ––– 8.0 12 nC di/dt = -100A/µs
Repetitive rating; pulse width limited by
max. junction temperature.
Notes:
Pulse width ≤ 300µs; duty cycle ≤ 2%.
Source-Drain Ratings and Characteristics
-1.3
-34
A
S
D
G
Surface mounted on 1" square single layer 1oz. copper FR4 board,
steady state.
Starting TJ = 25°C, L = 3.5mH
RG = 25Ω, IAS = -4.3A.
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage -12 ––– ––– V VGS = 0V, ID = -250µA
∆V(BR)DSS/∆TJBreakdown Voltage Temp. Coefficient ––– -0.007 ––– V/°C Reference to 25°C, ID = -1mA
––– ––– 0.050 VGS = -4.5V, ID = -4.3A
RDS(on) Static Drain-to-Source On-Resistance ––– 0.085 VGS = -2.5V, ID = -2.5A
––– 0.125 VGS = -1.8V, ID = -2.0A
VGS(th) Gate Threshold Voltage -0.40 -0.55 -0.95 V VDS = VGS, ID = -250µA
gfs Forward Transconductance 8.6 ––– ––– S VDS = -10V, ID = -4.3A
––– ––– -1.0 VDS = -12V, VGS = 0V
––– ––– -25 VDS = -9.6V, VGS = 0V, TJ = 55°C
Gate-to-Source Forward Leakage ––– ––– -100 VGS = -8.0V
Gate-to-Source Reverse Leakage ––– ––– 100 VGS = 8.0V
QgTotal Gate Charge ––– 10 15 ID = -4.3A
Qgs Gate-to-Source Charge ––– 1.4 2.1 nC VDS = -10V
Qgd Gate-to-Drain ("Miller") Charge ––– 2.6 3.9 VGS = -5.0V
td(on) Turn-On Delay Time ––– 11 ––– VDD = -6.0V
trRise Time ––– 32 ––– ID = -1.0A
td(off) Turn-Off Delay Time ––– 250 ––– RD = 6.0Ω
tfFall Time ––– 210 ––– RG = 89Ω
Ciss Input Capacitance ––– 830 ––– VGS = 0V
Coss Output Capacitance ––– 180 ––– pF VDS = -10V
Crss Reverse Transfer Capacitance ––– 125 ––– ƒ = 1.0MHz
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
IGSS
µA
Ω
IDSS Drain-to-Source Leakage Current
nA
ns