ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor FEATURES AND BENEFITS * * * * * * * * * * * * * * AEC-Q100 Grade 1 qualified Typical of 2.5 s output response time 5V supply operation Ultra-low power loss: 100 internal conductor resistance Reinforced galvanic isolation allows use in economical, high-side current sensing in high-voltage systems 4800 Vrms dielectric strength certified under UL60950-1 Industry-leading noise performance with greatly improved bandwidth through proprietary amplifier and filter design techniques Integrated shield greatly reduces capacitive coupling from current conductor to die due to high dV/dt signals, and prevents offset drift in high-side, high-voltage applications Greatly improved total output error through digitally programmed and compensated gain and offset over the full operating temperature range Small package size, with easy mounting capability Monolithic Hall IC for high reliability Output voltage proportional to AC or DC currents Factory-trimmed for accuracy Extremely stable output offset voltage CB Certificate Number: US-29755-UL PACKAGE: 5-pin package (suffix CB) PFF Leadform PSF Leadform PSS Leadform Not to scale DESCRIPTION The AllegroTM ACS772 family of current sensor ICs provide economical and precise solutions for AC or DC current sensing, ideal for motor control, load detection and management, power supply and DC-to-DC converter control, and inverter control. The 2.5s response time enables overcurrent fault detection in safety-critical applications. The device consists of a precision, low-offset linear Hall circuit with a copper conduction path located near the die. Applied current flowing through this copper conduction path generates a magnetic field which the Hall IC converts into a proportional voltage. Device accuracy is optimized through the close proximity of the magnetic signal to the Hall transducer. A precise, proportional output voltage is provided by the low-offset, chopper-stabilized BiCMOS Hall IC, which is programmed for accuracy at the factory. Proprietary digital temperature compensation technology greatly improves the IC accuracy and temperature stability. High-level immunity to current conductor dV/dt and stray electric fields is offered by Allegro proprietary integrated shield technology for low output voltage ripple and low offset drift in high-side, high-voltage applications. The output of the device increases when an increasing current flows through the primary copper conduction path (from terminal 4 to terminal 5), which is the path used for current sampling. The internal resistance of this conductive path is 100 typical, providing low power loss. The thickness of the copper conductor allows survival of the device at high overcurrent conditions. The terminals of the conductive path are electrically isolated from the signal leads (pins 1 through 3). This allows the ACS772 family of sensor ICs to be used in applications requiring electrical isolation without the use of opto-isolators or other costly isolation techniques. Continued on the next page... 5V 1 CBYP 0.1 F Application 1: the ACS772 outputs an analog signal, VOUT, that varies linearly with the bidirectional AC or DC primary sensed current, IP, within the range specified. RF and CF are for optimal noise management, with values that depend on the application. 2 VCC IP- ACS772 IP GND CF VOUT 3 RF 5 VIOUT IP+ 4 Typical Application ACS772-DS, Rev. 8 MCO-0000363 March 14, 2019 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 DESCRIPTION (continued) The device is fully calibrated prior to shipment from the factory. The ACS772 family is lead (Pb) free. All leads are plated with 100% matte tin, and there is no Pb inside the package. The heavy gauge leadframe is made of oxygen-free copper. SELECTION GUIDE Part Number [1] ACS772LCB-050U-PFF-T Package Sensitivity Sens (Typ.) (mV/A) [2] Terminals Signal Pins Primary Sampled Current , IP (A) Formed Formed 50 80 50 40 40 ACS772LCB-050B-PFF-T Formed Formed ACS772LCB-050B-PSS-T Straight Straight ACS772LCB-100U-PFF-T Formed Formed 100 ACS772LCB-100B-PFF-T Formed Formed 100 20 ACS772KCB-150U-PFF-T Formed Formed 150 26.66 ACS772KCB-150B-PFF-T Formed Formed 150 13.33 ACS772ECB-200U-PFF-T Formed Formed 200 20 200 10 250 16 ACS772ECB-200B-PFF-T Formed Formed ACS772ECB-250U-PFF-T Formed Formed ACS772ECB-250U-PSF-T Straight Formed ACS772ECB-250B-PFF-T Formed Formed ACS772ECB-250B-PSF-T Straight Formed Nominal TA [3] (C) Packing [4] -40 to 150 -40 to 125 34 pieces per tube -40 to 85 250 8 ACS772ECB-300B-PFF-T Formed Formed 300 6.66 ACS772ECB-400B-PFF-T Formed Formed 400 5 [1] Additional leadform and Sensitivity options available for qualified volumes. Measured at VCC = 5V. [3] All ACS772 devices are production tested and guaranteed to T = 150C, provided the Maximum Junction Temperature, T A J(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [4] Contact Allegro for additional packing options. [2] ACS 772 L CB - 050 B - PFF - T Lead (Pb) Free Lead Form Output Directionality: B - Bidirectional (positive and negative current) U - Unidirectional (only positive current) Current Sensing Range (A) Package Designator Operating Temperature Range 3 Digit Part Number Allegro Current Sensor Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 2 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ABSOLUTE MAXIMUM RATINGS Characteristic Symbol Notes Rating Unit Supply Voltage VCC 6.5 V Reverse Supply Voltage VRCC -0.5 V Output Voltage VIOUT 6.5 V Reverse Output Voltage VRIOUT -0.5 V Output Source Current IOUT(Source) VIOUT to GND 3 mA Minimum pull-up resistor of 500 from VCC to VIOUT 10 mA -40 to 150 C Output Sink Current Operating Ambient Temperature [1] Maximum Junction Temperature Storage Temperature IOUT(Sink) TA Range E, K, and L TJ(max) 165 C Tstg -65 to 165 C [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Thermal Application section of this datasheet for more information. ISOLATION CHARACTERISTICS Characteristic Symbol Notes Rating Unit VSURGE Tested 5 pulses at 2/minute in compliance to IEC 61000-4-5 1.2s (rise) / 50 s (width) 8000 V Dielectric Strength Test Voltage [2] VISO Agency type-tested for 60 seconds per UL standard 60950-1, 2nd Edition. Tested at 3000 VRMS for 1 second in production. 4800 VRMS Working Voltage for Basic Isolation VWVBI For basic (single) isolation per UL standard 60950-1, 2nd Edition 990 VPK or VDC VWFRI For reinforced (double) isolation per UL standard 60950-1, 2nd Edition Dielectric Surge Strength Test Voltage Working Voltage for Reinforced Isolation [2] Allegro 700 VRMS 636 VPK or VDC 450 VRMS does not conduct 60-second testing. It is done only during the UL certification process. THERMAL CHARACTERISTICS: May require derating at maximum conditions Characteristic Package Thermal Resistance [3] Additional Symbol Test Conditions [3] Value Unit RJA Mounted on the Allegro evaluation board with 2800mm2 (1400mm2 on component side and 1400mm2 on opposite side) of 4 oz. copper connected to the primary leadframe and with thermal vias connecting the copper layers. Performance is based on current flowing through the primary leadframe and includes the power consumed by the PCB. 7 C/W Rating Unit TA = 25C; current is on for 1 second and off for 99seconds, 100 pulses applied 1200 A TA = 85C; current is on for 1 second and off for 99seconds, 100 pulses applied 900 A TA = 150C; current is on for 1 second and off for 99seconds, 100 pulses applied 600 A thermal information available on the Allegro website. TYPICAL OVERCURRENT CAPABILITIES [4][5] Characteristic Overcurrent Symbol IPOC Notes [4] Test [5] For was done with Allegro evaluation board. The maximum allowed current is limited by TJ(max) only. more overcurrent profiles, please see FAQ on the Allegro website, www.allegromicro.com. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 3 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 IP+ VCC To all subcircuits Programming Control Charge Pump Pulse Generator Temperature Sensor EEPROM and Control Logic Sensitivity Control Active Temperature Compensation Dynamic Offset Cancellation C BYPASS Undervoltage Detection Offset Control Output Clamps VIOUT Signal Recovery CL GND IP- Functional Block Diagram VCC 1 GND 2 VIOUT 3 5 IP- 4 IP+ Pinout Diagram Terminal List Table Number Name 1 VCC Description Device power supply terminal 2 GND 3 VIOUT Signal ground terminal 4 IP+ Terminal for current being sampled 5 IP- Terminal for current being sampled Analog output signal Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 4 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor COMMON OPERATING CHARACTERISTICS: Valid at TA = -40C to 150C, CBYP = 0.1F, and VCC = 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. Max. Unit ELECTRICAL CHARACTERISTICS Supply Voltage VCC 4.5 5 5.5 V Supply Current ICC VCC = 5V, no load on output - 10 15 mA Power-On Delay tPOD TA = 25C - 64 - s VUVLOH VCC rising at 1V/ms and device functions enabled - 4 - V VUVLOL VCC falling at 1V/ms and device functions enabled - 3.5 - V 250 - - mV Undervoltage Lockout (UVLO) Threshold[1] UVLO Hysteresis UVLO Enable/Disable Delay Time [1] Power-On Reset Voltage POR Hysteresis Internal Bandwidth Rise Time Propagation Delay Time Response Time DC Output Impedance VHYS(UVLO) tUVLOE Time measured from falling VCC < VUVLOH to UVLO enabled - 64 - s tUVLOD Time measured from rising VCC > VUVLOH to UVLO disabled - 7 - s VPORH VCC rising at 1V/ms - 2.9 - V VPORL VCC falling at 1V/ms - 2.5 - V 250 - - mV Small signal -3 dB, CL = 0.47 nF - 200 - kHz IP step = 50% of IP+, 10% to 90% rise time, TA = 25C, COUT = 470 pF - 2.4 - s tPROP TA = 25C, CL = 470 pF, IP step = 50% of IP+ - 1.2 - s tRESPONSE TA = 25C, CL = 470 pF, IP step = 50% of IP+, 90% input to 90% output - 2.5 - s - 3.3 - 4.7 - - k VHYS(POR) BWi tr ROUT TA = 25C Output Load Resistance RLOAD(MIN) VIOUT to GND, VIOUT to VCC Output Load Capacitance CLOAD(MAX) VIOUT to GND - 1 10 nF RPRIMARY TA = 25C - 100 - VSAT(HIGH) TA = 25C, RL(PULLDWN) = 10 k to GND VCC - 0.2 - - V VSAT(LOW) TA = 25C, RL(PULLUP) = 10 k to VCC - - 200 mV QVO Ratiometry Error [2] RatERRQVO VCC = 4.75 to 5.25 V - 0.15 - % Sens Ratiometry Error [2] RatERRSens VCC = 4.75 to 5.25 V - 0.3 - % Input referenced noise density; TA = 25C, CL = 1 nF - 0.15 - mA/(Hz) Input referenced noise at 200 kHz; TA = 25C, CL = 1 nF - 85 - mARMS Primary Conductor Resistance Output Saturation Voltage ERROR COMPONENTS Noise IN Nonlinearity [2] ELIN Up to full scale of IP -0.9 0.5 0.9 % Symmetry [2] ESYM Over half-scale IP -0.8 0.4 0.8 % [1] UVLO [2] feature is only available on part numbers programmed to work at VCC = 5V. See Characteristic Definitions section of this datasheet. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 5 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor X050U PERFORMANCE CHARACTERISTICS: TA = -40C to 150C [1], VCC= 5 V, unless otherwise specified Characteristic Symbol Typ. [2] Max. Unit 0 - 50 A IPR(min) < IP < IPR(max) - 80 x VCC/5 - mV/A Unidirectional; IP = 0 A - VCC/10 - V TA = 25C, CL = 1 nF - 20.4 - mVp-p Test Conditions Min. NOMINAL PERFORMANCE Current Sensing Range Sensitivity Zero Current Output Voltage IPR Sens VIOUT(Q) ACCURACY PERFORMANCE Noise Sensitivity Error VN ESens VOE(TA) Electrical Offset Error Magnetic Offset Error Total Output Error TA = 25C, CL = 1 nF - 3.4 - mVRMS Full scale of IP, TA = 25C -1 0.7 1 % Full scale of IP, TA = 25C to 150C -1.25 0.8 1.25 % Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % -8 4 8 mV IP = 0 A, TA = 25C VOE(TA)HT IP = 0 A, TA = 25C to 150C -8 4 8 mV VOE(TA)LT IP = 0 A, TA = -40C to 25C -20 6 20 mV IERROM IP = 0 A, TA = 25C, after excursion of IPR(max) - 120 250 mA ETOT(HT) Full scale of IP, TA = 25C to 150C -1.5 0.9 1.5 % ETOT(LT) Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % LIFETIME ACCURACY CHARACTERISTICS [3] Sensitivity Error Including Lifetime Total Output Error Including Lifetime Electric Offset Error Including Lifetime ESens(LIFE)(HT) TA = 25C to 150C -2.1 1.6 2.1 % ESens(LIFE)(LT) TA = -40C to 25C -3.5 2.5 3.5 % ETOT(LIFE)(HT) TA = 25C to 150C -2.1 1.7 2.1 % ETOT(LIFE)(LT) TA = -40C to 25C -3.5 2.6 3.5 % EOFF(LIFE)(HT) TA = 25C to 150C -10 7 10 mV EOFF(LIFE)(LT) TA = -40C to 25C -20 8.9 20 mV [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [2] Typical values are 3 sigma values. [3] Min/max limits are derived from AEC-Q100 Grade 1 testing. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 6 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor X050B PERFORMANCE CHARACTERISTICS: TA = -40C to 150C [1], VCC= 5 V, unless otherwise specified Characteristic Symbol Test Conditions Typ. [2] Max. Unit -50 - 50 A - mV/A Min. NOMINAL PERFORMANCE Current Sensing Range Sensitivity Zero Current Output Voltage IPR Sens IPR(min) < IP < IPR(max) - 40 x VCC/5 VIOUT(Q) Bidirectional; IP = 0 A - VCC/2 - V TA = 25C, CL = 1 nF - 20.4 - mVp-p ACCURACY PERFORMANCE Noise Sensitivity Error VN ESens VOE(TA) Electrical Offset Error Magnetic Offset Error Total Output Error TA = 25C, CL = 1 nF - 3.4 - mVRMS Full scale of IP, TA = 25C -1 0.7 1 % Full scale of IP, TA = 25C to 150C -1.25 0.8 1.25 % Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % -8 4 8 mV IP = 0 A, TA = 25C VOE(TA)HT IP = 0 A, TA = 25C to 150C -8 4 8 mV VOE(TA)LT IP = 0 A, TA = -40C to 25C -20 6 20 mV IERROM IP = 0 A, TA = 25C, after excursion of IPR(max) - 210 250 mA ETOT(HT) Full scale of IP, TA = 25C to 150C -1.5 0.9 1.5 % ETOT(LT) Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % LIFETIME ACCURACY CHARACTERISTICS [3] Sensitivity Error Including Lifetime Total Output Error Including Lifetime Electric Offset Error Including Lifetime ESens(LIFE)(HT) TA = 25C to 150C -2.1 1.6 2.1 % ESens(LIFE)(LT) TA = -40C to 25C -3.5 2.5 3.5 % ETOT(LIFE)(HT) TA = 25C to 150C -2.1 1.7 2.1 % ETOT(LIFE)(LT) TA = -40C to 25C -3.5 2.6 3.5 % EOFF(LIFE)(HT) TA = 25C to 150C -10 7 10 mV EOFF(LIFE)(LT) TA = -40C to 25C -20 8.9 20 mV [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [2] Typical values are 3 sigma values. [3] Min/max limits are derived from AEC-Q100 Grade 1 testing. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 7 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor X100U PERFORMANCE CHARACTERISTICS: TA = -40C to 150C [1], VCC= 5 V, unless otherwise specified Characteristic Symbol Typ. [2] Max. Unit 0 - 100 A IPR(min) < IP < IPR(max) - 40 x VCC/5 - mV/A Unidirectional; IP = 0 A - VCC/10 - V TA = 25C, CL = 1 nF - 20.4 - mVp-p Test Conditions Min. NOMINAL PERFORMANCE Current Sensing Range Sensitivity Zero Current Output Voltage IPR Sens VIOUT(Q) ACCURACY PERFORMANCE Noise Sensitivity Error VN ESens VOE(TA) Electrical Offset Error Magnetic Offset Error Total Output Error TA = 25C, CL = 1 nF - 3.4 - mVRMS Full scale of IP, TA = 25C -1 0.7 1 % Full scale of IP, TA = 25C to 150C -1.25 0.8 1.25 % Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % -8 4 8 mV IP = 0 A, TA = 25C VOE(TA)HT IP = 0 A, TA = 25C to 150C -8 4 8 mV VOE(TA)LT IP = 0 A, TA = -40C to 25C -20 6 20 mV IERROM IP = 0 A, TA = 25C, after excursion of IPR(max) - 280 400 mA ETOT(HT) Full scale of IP, TA = 25C to 150C -1.5 0.9 1.5 % ETOT(LT) Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % LIFETIME ACCURACY CHARACTERISTICS [3] Sensitivity Error Including Lifetime Total Output Error Including Lifetime Electric Offset Error Including Lifetime ESens(LIFE)(HT) TA = 25C to 150C -2.1 1.6 2.1 % ESens(LIFE)(LT) TA = -40C to 25C -3.5 2.5 3.5 % ETOT(LIFE)(HT) TA = 25C to 150C -2.1 1.7 2.1 % ETOT(LIFE)(LT) TA = -40C to 25C -3.5 2.6 3.5 % EOFF(LIFE)(HT) TA = 25C to 150C -10 7 10 mV EOFF(LIFE)(LT) TA = -40C to 25C -20 8.9 20 mV [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [2] Typical values are 3 sigma values. [3] Min/max limits are derived from AEC-Q100 Grade 1 testing. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 8 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor X100B PERFORMANCE CHARACTERISTICS: TA = -40C to 150C [1], VCC= 5 V, unless otherwise specified Characteristic Symbol Test Conditions Typ. [2] Max. Unit -100 - 100 A - mV/A Min. NOMINAL PERFORMANCE Current Sensing Range Sensitivity Zero Current Output Voltage IPR Sens IPR(min) < IP < IPR(max) - 20 x VCC/5 VIOUT(Q) Bidirectional; IP = 0 A - VCC/2 - V TA = 25C, CL = 1 nF - 20.4 - mVp-p ACCURACY PERFORMANCE Noise Sensitivity Error VN ESens VOE(TA) Electrical Offset Error Magnetic Offset Error Total Output Error TA = 25C, CL = 1 nF - 3.4 - mVRMS Full scale of IP, TA = 25C -1 0.7 1 % Full scale of IP, TA = 25C to 150C -1.25 0.8 1.25 % Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % -8 4 8 mV IP = 0 A, TA = 25C VOE(TA)HT IP = 0 A, TA = 25C to 150C -8 4 8 mV VOE(TA)LT IP = 0 A, TA = -40C to 25C -20 6 20 mV IERROM IP = 0 A, TA = 25C, after excursion of IPR(max) - 175 400 mA ETOT(HT) Full scale of IP, TA = 25C to 150C -1.5 0.9 1.5 % ETOT(LT) Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % LIFETIME ACCURACY CHARACTERISTICS [3] Sensitivity Error Including Lifetime Total Output Error Including Lifetime Electric Offset Error Including Lifetime ESens(LIFE)(HT) TA = 25C to 150C -2.1 1.6 2.1 % ESens(LIFE)(LT) TA = -40C to 25C -3.5 2.5 3.5 % ETOT(LIFE)(HT) TA = 25C to 150C -2.1 1.7 2.1 % ETOT(LIFE)(LT) TA = -40C to 25C -3.5 2.6 3.5 % EOFF(LIFE)(HT) TA = 25C to 150C -10 7 10 mV EOFF(LIFE)(LT) TA = -40C to 25C -20 8.9 20 mV [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [2] Typical values are 3 sigma values. [3] Min/max limits are derived from AEC-Q100 Grade 1 testing. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 9 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor X150U PERFORMANCE CHARACTERISTICS: TA = -40C to 150C [1], VCC= 5 V, unless otherwise specified Characteristic Symbol Typ. [2] Max. Unit 0 - 150 A IPR(min) < IP < IPR(max) - 26.66 x VCC/5 - mV/A Unidirectional; IP = 0 A - VCC/10 - V TA = 25C, CL = 1 nF - 20.4 - mVp-p Test Conditions Min. NOMINAL PERFORMANCE Current Sensing Range Sensitivity Zero Current Output Voltage IPR Sens VIOUT(Q) ACCURACY PERFORMANCE Noise Sensitivity Error VN ESens VOE(TA) Electrical Offset Error Magnetic Offset Error Total Output Error TA = 25C, CL = 1 nF - 3.4 - mVRMS Full scale of IP, TA = 25C -1 0.7 1 % Full scale of IP, TA = 25C to 150C -1.25 0.8 1.25 % Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % -8 4 8 mV IP = 0 A, TA = 25C VOE(TA)HT IP = 0 A, TA = 25C to 150C -8 4 8 mV VOE(TA)LT IP = 0 A, TA = -40C to 25C -20 6 20 mV IERROM IP = 0 A, TA = 25C, after excursion of IPR(max) - 280 400 mA ETOT(HT) Full scale of IP, TA = 25C to 150C -1.5 0.9 1.5 % ETOT(LT) Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % LIFETIME ACCURACY CHARACTERISTICS [3] Sensitivity Error Including Lifetime Total Output Error Including Lifetime Electric Offset Error Including Lifetime ESens(LIFE)(HT) TA = 25C to 150C -2.1 1.6 2.1 % ESens(LIFE)(LT) TA = -40C to 25C -3.5 2.5 3.5 % ETOT(LIFE)(HT) TA = 25C to 150C -2.1 1.7 2.1 % ETOT(LIFE)(LT) TA = -40C to 25C -3.5 2.6 3.5 % EOFF(LIFE)(HT) TA = 25C to 150C -10 7 10 mV EOFF(LIFE)(LT) TA = -40C to 25C -20 8.9 20 mV [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [2] Typical values are 3 sigma values. [3] Min/max limits are derived from AEC-Q100 Grade 1 testing. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 10 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor X150B PERFORMANCE CHARACTERISTICS: TA = -40C to 150C [1], VCC= 5 V, unless otherwise specified Characteristic Symbol Test Conditions Typ. [2] Max. Unit -150 - 150 A - mV/A Min. NOMINAL PERFORMANCE Current Sensing Range Sensitivity Zero Current Output Voltage IPR Sens IPR(min) < IP < IPR(max) - 13.33 x VCC/5 VIOUT(Q) Bidirectional; IP = 0 A - VCC/2 - V TA = 25C, CL = 1 nF - 7.2 - mVp-p ACCURACY PERFORMANCE Noise Sensitivity Error VN ESens VOE(TA) Electrical Offset Error Magnetic Offset Error Total Output Error TA = 25C, CL = 1 nF - 1.2 - mVRMS Full scale of IP, TA = 25C -1 0.7 1 % Full scale of IP, TA = 25C to 150C -1.25 0.8 1.25 % Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % -8 4 8 mV IP = 0 A, TA = 25C VOE(TA)HT IP = 0 A, TA = 25C to 150C -8 4 8 mV VOE(TA)LT IP = 0 A, TA = -40C to 25C -20 6 20 mV IERROM IP = 0 A, TA = 25C, after excursion of IPR(max) - 280 400 mA ETOT(HT) Full scale of IP, TA = 25C to 150C -1.5 0.9 1.5 % ETOT(LT) Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % LIFETIME ACCURACY CHARACTERISTICS [3] Sensitivity Error Including Lifetime Total Output Error Including Lifetime Electric Offset Error Including Lifetime ESens(LIFE)(HT) TA = 25C to 150C -2.1 1.6 2.1 % ESens(LIFE)(LT) TA = -40C to 25C -3.5 2.5 3.5 % ETOT(LIFE)(HT) TA = 25C to 150C -2.1 1.7 2.1 % ETOT(LIFE)(LT) TA = -40C to 25C -3.5 2.6 3.5 % EOFF(LIFE)(HT) TA = 25C to 150C -10 7 10 mV EOFF(LIFE)(LT) TA = -40C to 25C -20 8.9 20 mV [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [2] Typical values are 3 sigma values. [3] Min/max limits are derived from AEC-Q100 Grade 1 testing. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 11 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor X200U PERFORMANCE CHARACTERISTICS: TA = -40C to 150C [1], VCC= 5 V, unless otherwise specified Characteristic Symbol Typ. [2] Max. Unit 0 - 200 A IPR(min) < IP < IPR(max) - 20 x VCC/5 - mV/A Unidirectional; IP = 0 A - VCC/10 - V TA = 25C, CL = 1 nF - 7.2 - mVp-p Test Conditions Min. NOMINAL PERFORMANCE Current Sensing Range Sensitivity Zero Current Output Voltage IPR Sens VIOUT(Q) ACCURACY PERFORMANCE Noise Sensitivity Error VN ESens Magnetic Offset Error Total Output Error - 1.2 - mVRMS Full scale of IP, TA = 25C -1 0.5 1 % Full scale of IP, TA = 25C to 150C -1.25 0.7 1.25 % Full scale of IP, TA = -40C to 25C -3.5 1.5 3.5 % IP = 0 A, TA = 25C -8 4 8 mV VOE(TA)HT IP = 0 A, TA = 25C to 150C -20 6 20 mV VOE(TA)LT IP = 0 A, TA = -40C to 25C -20 6 20 mV VOE(TA) Electrical Offset Error TA = 25C, CL = 1 nF IERROM IP = 0 A, TA = 25C, after excursion of IPR(max) - 160 400 mA ETOT(HT) Full scale of IP, TA = 25C to 150C -1.5 0.9 1.5 % ETOT(LT) Full scale of IP, TA = -40C to 25C -3.5 1.7 3.5 % LIFETIME ACCURACY CHARACTERISTICS [3] Sensitivity Error Including Lifetime Total Output Error Including Lifetime Electric Offset Error Including Lifetime ESens(LIFE)(HT) TA = 25C to 150C -2.1 1.6 2.1 % ESens(LIFE)(LT) TA = -40C to 25C -3.5 2.5 3.5 % ETOT(LIFE)(HT) TA = 25C to 150C -2.1 1.7 2.1 % ETOT(LIFE)(LT) TA = -40C to 25C -3.5 2.6 3.5 % EOFF(LIFE)(HT) TA = 25C to 150C -10 7 10 mV EOFF(LIFE)(LT) TA = -40C to 25C -20 8.9 20 mV [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [2] Typical values are 3 sigma values. [3] Min/max limits are derived from AEC-Q100 Grade 1 testing. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 12 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor X200B PERFORMANCE CHARACTERISTICS: TA = -40C to 150C [1], VCC= 5 V, unless otherwise specified Characteristic Symbol Test Conditions Typ. [2] Max. Unit -200 - 200 A - mV/A Min. NOMINAL PERFORMANCE Current Sensing Range Sensitivity Zero Current Output Voltage IPR Sens IPR(min) < IP < IPR(max) - 10 x VCC/5 VIOUT(Q) Bidirectional; IP = 0 A - VCC/2 - V TA = 25C, CL = 1 nF - 5.1 - mVp-p TA = 25C, CL = 1 nF - 0.85 - mVRMS Full scale of IP, TA = 25C -1 0.5 1 % Full scale of IP, TA = 25C to 150C -1.25 0.7 1.25 % Full scale of IP, TA = -40C to 25C -3.5 1.5 3.5 % -8 4 8 mV ACCURACY PERFORMANCE Noise Sensitivity Error VN ESens VOE(TA) Electrical Offset Error Magnetic Offset Error Total Output Error IP = 0 A, TA = 25C VOE(TA)HT IP = 0 A, TA = 25C to 150C -8 4 8 mV VOE(TA)LT IP = 0 A, TA = -40C to 25C -20 6 20 mV IERROM IP = 0 A, TA = 25C, after excursion of IPR(max) - 380 400 mA ETOT(HT) Full scale of IP, TA = 25C to 150C -1.5 0.7 1.5 % ETOT(LT) Full scale of IP, TA = -40C to 25C -3.5 1.5 3.5 % LIFETIME ACCURACY CHARACTERISTICS [3] Sensitivity Error Including Lifetime Total Output Error Including Lifetime Electric Offset Error Including Lifetime ESens(LIFE)(HT) TA = 25C to 150C -2.1 1.6 2.1 % ESens(LIFE)(LT) TA = -40C to 25C -3.5 2.5 3.5 % ETOT(LIFE)(HT) TA = 25C to 150C -2.1 1.7 2.1 % ETOT(LIFE)(LT) TA = -40C to 25C -3.5 2.6 3.5 % EOFF(LIFE)(HT) TA = 25C to 150C -10 7 10 mV EOFF(LIFE)(LT) TA = -40C to 25C -20 8.9 20 mV [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [2] Typical values are 3 sigma values. [3] Min/max limits are derived from AEC-Q100 Grade 1 testing. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 13 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor X250U PERFORMANCE CHARACTERISTICS: TA = -40C to 150C [1], VCC= 5 V, unless otherwise specified Characteristic Symbol Typ. [2] Max. Unit 0 - 250 A IPR(min) < IP < IPR(max) - 16 x VCC/5 - mV/A Unidirectional; IP = 0 A - VCC/10 - V TA = 25C, CL = 1 nF - 5.1 - mVp-p TA = 25C, CL = 1 nF - 0.85 - mVRMS IP = 200 A, not tested at full scale IP; TA = 25C -1 0.7 1 % IP = 200 A, not tested at full scale IP; TA = 25C to 150C -1.25 0.8 1.25 % IP = 200 A, not tested at full scale IP; TA = -40C to 25C -3.5 1.7 3.5 % -8 4 8 mV Test Conditions Min. NOMINAL PERFORMANCE Current Sensing Range Sensitivity Zero Current Output Voltage IPR Sens VIOUT(Q) ACCURACY PERFORMANCE Noise Sensitivity Error VN ESens VOE(TA) Electrical Offset Error Magnetic Offset Error Total Output Error IP = 0 A, TA = 25C VOE(TA)HT IP = 0 A, TA = 25C to 150C -8 4 8 mV VOE(TA)LT IP = 0 A, TA = -40C to 25C -20 6 20 mV IERROM IP = 0 A, TA = 25C, after excursion of IPR(max) - 200 400 mA ETOT(HT) IP = 200 A, not tested at full scale IP; TA = 25C to 150C -1.5 0.9 1.5 % ETOT(LT) IP = 200 A, not tested at full scale IP; TA = -40C to 25C -3.5 1.7 3.5 % ESens(LIFE)(HT) TA = 25C to 150C -2.1 1.6 2.1 % ESens(LIFE)(LT) TA = -40C to 25C -3.5 2.5 3.5 % ETOT(LIFE)(HT) TA = 25C to 150C -2.1 1.7 2.1 % LIFETIME ACCURACY CHARACTERISTICS [3] Sensitivity Error Including Lifetime Total Output Error Including Lifetime Electric Offset Error Including Lifetime ETOT(LIFE)(LT) TA = -40C to 25C -3.5 2.6 3.5 % EOFF(LIFE)(HT) TA = 25C to 150C -10 7 10 mV EOFF(LIFE)(LT) TA = -40C to 25C -20 8.9 20 mV [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [2] Typical values are 3 sigma values. [3] Min/max limits are derived from AEC-Q100 Grade 1 testing. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 14 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor X250B PERFORMANCE CHARACTERISTICS: TA = -40C to 150C [1], VCC= 5 V, unless otherwise specified Characteristic Symbol Test Conditions Typ. [2] Max. Unit -250 - 250 A - mV/A Min. NOMINAL PERFORMANCE Current Sensing Range Sensitivity Zero Current Output Voltage IPR Sens IPR(min) < IP < IPR(max) - 8x VCC/5 VIOUT(Q) Bidirectional; IP = 0 A - VCC/2 - V TA = 25C, CL = 1 nF - 5.1 - mVp-p TA = 25C, CL = 1 nF - 0.85 - mVRMS IP = 200 A, not tested at full scale IP; TA = 25C -1 0.7 1 % IP = 200 A, not tested at full scale IP; TA = 25C to 150C -1.25 0.8 1.25 % IP = 200 A, not tested at full scale IP; TA = -40C to 25C -3.5 1.7 3.5 % -8 4 8 mV ACCURACY PERFORMANCE Noise Sensitivity Error VN ESens VOE(TA) Electrical Offset Error Magnetic Offset Error Total Output Error IP = 0 A, TA = 25C VOE(TA)HT IP = 0 A, TA = 25C to 150C -8 4 8 mV VOE(TA)LT IP = 0 A, TA = -40C to 25C -20 6 20 mV IERROM IP = 0 A, TA = 25C, after excursion of IPR(max) - 175 400 mA ETOT(HT) IP = 200 A, not tested at full scale IP; TA = 25C to 150C -1.5 0.9 1.5 % ETOT(LT) IP = 200 A, not tested at full scale IP; TA = -40C to 25C -3.5 1.7 3.5 % ESens(LIFE)(HT) TA = 25C to 150C -2.1 1.6 2.1 % ESens(LIFE)(LT) TA = -40C to 25C -3.5 2.5 3.5 % ETOT(LIFE)(HT) TA = 25C to 150C -2.1 1.7 2.1 % LIFETIME ACCURACY CHARACTERISTICS [3] Sensitivity Error Including Lifetime Total Output Error Including Lifetime Electric Offset Error Including Lifetime ETOT(LIFE)(LT) TA = -40C to 25C -3.5 2.6 3.5 % EOFF(LIFE)(HT) TA = 25C to 150C -10 7 10 mV EOFF(LIFE)(LT) TA = -40C to 25C -20 8.9 20 mV [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [2] Typical values are 3 sigma values. [3] Min/max limits are derived from AEC-Q100 Grade 1 testing. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 15 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor X300B PERFORMANCE CHARACTERISTICS: TA = -40C to 150C [1], VCC= 5 V, unless otherwise specified Characteristic Symbol Test Conditions Typ. [2] Max. Unit -300 - 300 A - mV/A Min. NOMINAL PERFORMANCE Current Sensing Range Sensitivity Zero Current Output Voltage IPR Sens IPR(min) < IP < IPR(max) - 6.66 x VCC/5 VIOUT(Q) Bidirectional; IP = 0 A - VCC/2 - V TA = 25C, CL = 1 nF - 5.1 - mVp-p TA = 25C, CL = 1 nF - 0.85 - mVRMS IP = 200 A, not tested at full scale IP; TA = 25C -1 0.7 1 % IP = 200 A, not tested at full scale IP; TA = 25C to 150C -1.25 0.8 1.25 % IP = 200 A, not tested at full scale IP; TA = -40C to 25C -3.5 1.7 3.5 % -8 4 8 mV ACCURACY PERFORMANCE Noise Sensitivity Error VN ESens VOE(TA) Electrical Offset Error Magnetic Offset Error Total Output Error IP = 0 A, TA = 25C VOE(TA)HT IP = 0 A, TA = 25C to 150C -8 4 8 mV VOE(TA)LT IP = 0 A, TA = -40C to 25C -20 6 20 mV IERROM IP = 0 A, TA = 25C, after excursion of IPR(max) - 175 400 mA ETOT(HT) IP = 200 A, not tested at full scale IP; TA = 25C to 150C -1.5 0.9 1.5 % ETOT(LT) IP = 200 A, not tested at full scale IP; TA = -40C to 25C -3.5 1.7 3.5 % ESens(LIFE)(HT) TA = 25C to 150C -2.1 1.6 2.1 % ESens(LIFE)(LT) TA = -40C to 25C -3.5 2.5 3.5 % ETOT(LIFE)(HT) TA = 25C to 150C -2.1 1.7 2.1 % LIFETIME ACCURACY CHARACTERISTICS [3] Sensitivity Error Including Lifetime Total Output Error Including Lifetime Electric Offset Error Including Lifetime ETOT(LIFE)(LT) TA = -40C to 25C -3.5 2.6 3.5 % EOFF(LIFE)(HT) TA = 25C to 150C -10 7 10 mV EOFF(LIFE)(LT) TA = -40C to 25C -20 8.9 20 mV [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [2] Typical values are 3 sigma values. [3] Min/max limits are derived from AEC-Q100 Grade 1 testing. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 16 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor X400B PERFORMANCE CHARACTERISTICS: TA = -40C to 150C [1], VCC= 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit -400 - 400 A NOMINAL PERFORMANCE Current Sensing Range Sensitivity Zero Current Output Voltage IPR Sens IPR(min) < IP < IPR(max) - 5x VCC/5 - mV/A VIOUT(Q) Bidirectional; IP = 0 A - VCC/2 - V TA = 25C, CL = 1 nF - 5.1 - mVp-p TA = 25C, CL = 1 nF - 0.85 - mVRMS IP = 200 A, not tested at full scale IP; TA = 25C -1 0.7 1 % IP = 200 A, not tested at full scale IP; TA = 25C to 150C -1.25 0.8 1.25 % IP = 200 A, not tested at full scale IP; TA = -40C to 25C -3.5 1.7 3.5 % -8 4 8 mV ACCURACY PERFORMANCE Noise Sensitivity Error VN ESens VOE(TA) Electrical Offset Error Magnetic Offset Error Total Output Error IP = 0 A, TA = 25C VOE(TA)HT IP = 0 A, TA = 25C to 150C -8 4 8 mV VOE(TA)LT IP = 0 A, TA = -40C to 25C -20 6 20 mV IERROM IP = 0 A, TA = 25C, after excursion of IPR(max) - 175 400 mA ETOT(HT) IP = 200 A, not tested at full scale IP; TA = 25C to 150C -1.5 0.9 1.5 % ETOT(LT) IP = 200 A, not tested at full scale IP; TA = -40C to 25C -3.5 1.7 3.5 % ESens(LIFE)(HT) TA = 25C to 150C -2.1 1.6 2.1 % ESens(LIFE)(LT) TA = -40C to 25C -3.5 2.5 3.5 % ETOT(LIFE)(HT) TA = 25C to 150C -2.1 1.7 2.1 % LIFETIME ACCURACY CHARACTERISTICS [3] Sensitivity Error Including Lifetime Total Output Error Including Lifetime Electric Offset Error Including Lifetime ETOT(LIFE)(LT) TA = -40C to 25C -3.5 2.6 3.5 % EOFF(LIFE)(HT) TA = 25C to 150C -10 7 10 mV EOFF(LIFE)(LT) TA = -40C to 25C -20 8.9 20 mV [1] All ACS772 devices are production tested and guaranteed to TA = 150C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum Ratings and Thermal Application section of this datasheet for more information. [2] Typical values are 3 sigma values. [3] Min/max limits are derived from AEC-Q100 Grade 1 testing. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 17 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 CHARACTERISTIC PERFORMANCE DATA ACS772LCB-050U-PFF-T Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature 10 82 8 81.5 6 81 Sens(mV/A) Voe(mV) 4 2 0 -2 -4 80.5 80 79.5 -6 79 -8 -10 -50 -25 0 25 50 75 100 125 78.5 150 -50 -25 0 25 0.6 2 0.5 1.5 0.4 1 Error(%) 2.5 0.3 0.2 0.1 100 125 150 125 150 Avg-3 Avg Avg+3 0.5 0 -0.5 0 -1 -0.1 -1.5 -50 -25 0 25 50 75 100 125 -2 150 Ta() -50 -25 0 25 50 75 100 Ta() Magnetic Offset Error versus Ambient Temperature 180 160 140 Ierrom(mA) Elin(%) 75 Total Output Error versus Ambient Temperature Nonlinearity versus Ambient Temperature 0.7 -0.2 50 Ta() Ta() 120 100 80 60 Avg-3 40 Avg 20 0 Avg+3 -50 -25 0 25 50 75 100 125 150 Ta() Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 18 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 CHARACTERISTIC PERFORMANCE DATA ACS772LCB-050B-PFF-T Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature 8 40.6 6 40.4 Sens(mV/A) Voe(mV) 4 2 0 -2 40 39.8 39.6 -4 -6 40.2 39.4 -50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150 125 150 Ta() Ta() Nonlinearity versus Ambient Temperature Total Output Error versus Ambient Temperature 0.8 1.5 0.7 1 0.6 0.5 Error(%) 0.4 0.3 0 -0.5 0.2 -1 0.1 0 -50 -25 0 25 50 75 100 125 -1.5 150 Ta() -50 -25 0 25 50 75 100 Ta() Magnetic Offset Error versus Ambient Temperature 180 160 140 Ierrom(mA) Elin(%) 0.5 120 100 80 60 40 20 0 -50 -25 0 25 50 75 100 125 150 Ta() Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 19 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 CHARACTERISTIC PERFORMANCE DATA ACS772LCB-100U-PFF-T Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature 10 40.6 8 40.4 Sens(mV/A) Voe(mV) 6 4 2 0 40 39.8 39.6 -2 -4 40.2 -50 -25 0 25 50 75 100 125 39.4 150 -50 -25 0 25 Ta() 2.5 0.6 2 Error(%) 0.3 Avg-3 Avg -25 150 125 150 Avg-3 Avg+3 1 0.5 0 -1 Avg+3 -50 125 -0.5 -1.5 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 Ta() Ta() Magnetic Offset Error versus Ambient Temperature 250 200 Ierrom(mA) Elin(%) 0.4 0.1 100 Avg 1.5 0.5 0.2 75 Total Output Error versus Ambient Temperature Nonlinearity versus Ambient Temperature 0.7 0 50 Ta() 150 100 Avg-3 50 Avg Avg+3 0 -50 -25 0 25 50 75 100 125 150 Ta() Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 20 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 CHARACTERISTIC PERFORMANCE DATA ACS772LCB-100B-PFF-T Sensitivity versus Ambient Temperature Electrical Offset Voltage versus Ambient Temperature 20.5 6 20.4 4 20.3 Sens(mV/A) Voe(mV) 2 0 -2 20.1 20 19.9 19.8 -4 -6 20.2 19.7 19.6 -50 -25 0 25 50 75 100 125 150 -50 -25 0 25 100 125 150 125 150 2.5 2 0.7 1.5 0.6 1 Error(%) 0.5 0.4 0.3 0.5 0 -0.5 0.2 -1 0.1 -1.5 -2 -50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 Ta() Ta() Magnetic Offset Error versus Ambient Temperature 300 250 Ierrom(mA) Elin(%) 75 Total Output Error versus Ambient Temperature Nonlinearity versus Ambient Temperature 0.8 0 50 Ta() Ta() 200 150 100 50 0 -50 -25 0 25 50 75 100 125 150 Ta() Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 21 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 CHARACTERISTIC PERFORMANCE DATA ACS772KCB-150U-PFF-T Sensitivity versus Ambient Temperature 27.2 5 27.1 4 27 3 26.9 Sens(mV/A) Voe(mV) Electrical Offset Voltage versus Ambient Temperature 6 2 1 0 26.8 26.7 26.6 -1 26.5 -2 26.4 -3 26.3 -4 26.2 -50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150 Ta() Ta() Total Output Error versus Ambient Temperature Nonlinearity versus Ambient Temperature 2.5 0.6 2 0.5 1.5 Error(%) 0.3 0.2 1 0.5 0 -0.5 0.1 0 -1 -1.5 -50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150 Ta() Ta() Magnetic Offset Error versus Ambient Temperature 300 250 Ierrom(mA) Elin(%) 0.4 200 150 100 50 0 -50 -25 0 25 50 75 100 125 150 Ta() Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 22 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 CHARACTERISTIC PERFORMANCE DATA ACS772KCB-150B-PFF-T Sensitivity versus Ambient Temperature 13.7 6 13.6 4 13.5 Sens(mV/A) Voe(mV) Electrical Offset Voltage versus Ambient Temperature 8 2 0 13.3 13.2 -2 -4 13.4 13.1 -50 -25 0 25 50 75 100 125 150 -50 -25 0 25 100 125 150 3 2.5 0.6 2 1.5 Error(%) 0.5 0.4 0.3 1 0.5 0 -0.5 0.2 -1 0.1 -1.5 -2 -50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150 Ta() Ta() Magnetic Offset Error versus Ambient Temperature 350 300 250 Ierrom(mA) Elin(%) 75 Total Output Error versus Ambient Temperature Nonlinearity versus Ambient Temperature 0.7 0 50 Ta() Ta() 200 150 100 50 0 -50 -25 0 25 50 75 100 125 150 Ta() Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 23 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 CHARACTERISTIC PERFORMANCE DATA ACS772ECB-200U-PFF-T Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature 8 20.5 20.4 6 20.3 20.2 Sens(mV/A) Voe(mV) 4 2 0 -2 20 19.9 19.8 19.7 19.6 -4 -6 20.1 19.5 -50 -25 0 25 50 75 100 125 19.4 150 Ta() -50 -25 0 25 50 75 100 125 150 125 150 Ta() Nonlinearity versus Ambient Temperature Total Output Error versus Ambient Temperature 0.4 3 0.35 2 0.3 1 Error(%) 0.2 0.15 -2 0.05 0 0 -1 0.1 -50 -25 0 25 50 75 100 125 -3 150 Ta() -50 -25 0 25 50 75 100 Ta() Magnetic Offset Error versus Ambient Temperature 250 200 Ierrom(mA) Elin(%) 0.25 150 100 50 0 -50 -25 0 25 50 75 100 125 150 Ta() Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 24 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 CHARACTERISTIC PERFORMANCE DATA ACS772ECB-200B-PFF-T Sensitivity versus Ambient Temperature Electrical Offset Voltage versus Ambient Temperature 10.15 5 4 10.1 3 10.05 1 Sens(mV/A) Voe(mV) 2 0 -1 -2 9.9 -3 -4 9.85 -5 -6 10 9.95 9.8 -50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150 125 150 Ta() Ta() Total Output Error versus Ambient Temperature Nonlinearity versus Ambient Temperature 2 0.6 1.5 0.5 1 Error(%) 0.3 0.2 0.5 0 -0.5 -1 0.1 0 -1.5 -2 -50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 Ta() Ta() Magnetic Offset Error versus Ambient Temperature 350 300 250 Ierrom(mA) Elin(%) 0.4 200 150 100 Avg-3 Avg 50 0 Avg+3 -50 -25 0 25 50 75 100 125 150 Ta() Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 25 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 CHARACTERISTIC PERFORMANCE DATA ACS772ECB-250U-PFF-T Sensitivity versus Ambient Temperature Electrical Offset Voltage versus Ambient Temperature 16.25 12 16.2 10 16.15 16.1 Sens(mV/A) Voe(mV) 8 6 4 2 16 15.95 15.9 15.85 0 15.8 -2 -4 16.05 15.75 15.7 -50 -25 0 25 50 75 100 125 -50 150 -25 0 25 Nonlinearity versus Ambient Temperature 100 125 150 125 150 2 0.45 1.5 0.4 1 0.35 Error(%) 0.3 0.25 0.2 0.15 0.5 0 -0.5 -1 0.1 -1.5 0.05 -50 -25 0 25 50 75 100 125 -2 150 -50 -25 0 25 Ta() 50 75 100 Ta() Magnetic Offset Error versus Ambient Temperature 300 250 Ierrom(mA) Elin(%) 75 Total Output Error versus Ambient Temperature 0.5 0 50 Ta() Ta() 200 150 100 50 0 -50 -25 0 25 50 75 100 125 150 Ta() Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 26 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 CHARACTERISTIC PERFORMANCE DATA ACS772ECB-250B-PFF-T Electrical Offset Voltage versus Ambient Temperature Sensitivity versus Ambient Temperature 8.15 4 8.1 2 8.05 Sens(mV/A) Voe(mV) 6 0 -2 7.95 7.9 -4 -6 8 7.85 -50 -25 0 25 50 75 100 125 150 -50 -25 0 25 Nonlinearity versus Ambient Temperature 2 0.5 1.5 100 125 150 125 150 1 Error(%) 0.4 0.3 0.2 0.5 0 -0.5 0.1 -1 -50 -25 0 25 50 75 100 125 -1.5 150 Ta() -50 -25 0 25 50 75 100 Ta() Magnetic Offset Error versus Ambient Temperature 350 300 250 Ierrom(mA) Elin(%) 75 Total Output Error versus Ambient Temperature 0.6 0 50 Ta() Ta() 200 150 100 50 0 -50 -25 0 25 50 75 100 125 150 Ta() Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 27 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor CHARACTERISTIC PERFORMANCE DATA Response Time (tRESPONSE) 70 A excitation signal with 10%-90% rise time = 1 s Sensitivity = 13.33 mV/A, TA = 25C, CBYPASS = 0.1 F, CLOAD = 1 nF Propagation Delay (tPROP) 70 A excitation signal with 10%-90% rise time = 1 s Sensitivity = 13.33 mV/A, TA = 25C, CBYPASS = 0.1 F, CLOAD = 1 nF Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 28 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor Rise Time (tR) 70 A excitation signal with 10%-90% rise time = 1 s Sensitivity = 13.33 mV/A, TA = 25C, CBYPASS = 0.1 F, CLOAD = 1 nF Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 29 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor UVLO Enable Time (tUVLOE) VCC 5 V to 3 V fall time = 1.5 s, CL = 1 nF UVLO Disble Time (tUVLOD) VCC 3 V to 5 V recovery time = 1.5 s, CL = 1 nF Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 30 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 CHARACTERISTIC DEFINITIONS Definitions of Accuracy Characteristics SENSITIVITY (Sens) The change in sensor IC output in response to a 1A change through the primary conductor. The sensitivity is the product of the magnetic circuit sensitivity (G/A; 1G = 0.1mT) and the linear IC amplifier gain (mV/G). The linear IC amplifier gain is programmed at the factory to optimize the sensitivity (mV/A) for the full-scale current of the device. SENSITIVITY ERROR (ESens) The sensitivity error is the percent difference between the measured sensitivity and the ideal sensitivity. For example, in the case of VCC = 5 V: ESens = SensMeas(5V) - SensIdeal(5V) SensIDEAL(5V) x 100 (%) NOISE (V N) The noise floor is derived from the thermal and shot noise observed in Hall elements. Dividing the noise (mV) by the sensitivity (mV/A) provides the smallest current that the device is able to resolve. NONLINEARITY (E LIN) ies in proportion to either a positive or negative half-scale primary current. The following equation is used to derive symmetry: 100 x ( VIOUT_+half-scale amperes - VIOUT(Q) VIOUT(Q) - VIOUT_-half-scale amperes ) RATIOMETRY ERROR The device features a ratiometric output. This means that the quiescent voltage output, VIOUTQ, and the magnetic sensitivity, Sens, are proportional to the supply voltage, VCC.The ratiometric change (%) in the quiescent voltage output is defined as: RatErrQVO = [ 1- (VIOUTQ(VCC) / VIOUTQ(5V)) VCC / 5 V ] x 100% and the ratiometric change (%) in sensitivity is defined as: [ RatErrSens = 1 - (Sens(VCC) / Sense(5V)) VCC / 5 V ] x 100% ZERO CURRENT OUTPUT VOLTAGE (VIOUT(Q)) The ACS772 is designed to provide a linear output in response to a ramping current. Consider two current levels: I1 and I2. Ideally, the sensitivity of a device is the same for both currents, for a given supply voltage and temperature. Nonlinearity is present when there is a difference between the sensitivities measured at I1 and I2. Nonlinearity is calculated separately for the positive (ELINpos ) and negative (ELINneg ) applied currents as follows: The output of the sensor when the primary current is zero. It nominally remains at 0.5 x VCC for a bidirectional device and 0.1 x VCC for a unidirectional device. For example, in the case of a bidirectional output device, VCC = 5V translates into VIOUT(Q) = 2.5V. Variation in VIOUT(Q) can be attributed to the resolution of the Allegro linear IC quiescent voltage trim and thermal drift. ELINpos = 100 (%) x {1 - (SensIPOS2 / SensIPOS1) } where: The deviation of the device output from its ideal quiescent value of 0.5 x VCC (bidirectional) or 0.1 x VCC (unidirectional) due to nonmagnetic causes. To convert this voltage to amperes, divide by the device sensitivity, Sens. SensIx = (VIOUT(Ix) - VIOUT(Q))/ Ix MAGNETIC OFFSET ERROR (I ERROM) ELINneg = 100 (%) x {1 - (SensINEG2 / SensINEG1)} and IPOSx and INEGx are positive and negative currents and IPOS2 = 2 x IPOS1 and INEG2 = 2 x INEG1. Then: ELIN = max( ELINpos , ELINneg ) SYMMETRY (E SYM) The degree to which the absolute voltage output from the IC var- ELECTRICAL OFFSET VOLTAGE (VOE) The magnetic offset is due to the residual magnetism (remnant field) of the core material. The magnetic offset error is highest when the magnetic circuit has been saturated, usually when the device has been subjected to a full-scale or high-current overload condition. The magnetic offset is largely dependent on the material used as a flux concentrator. The larger magnetic offsets are observed at the lower operating temperatures. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 31 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 TOTAL OUTPUT ERROR (E TOT) The difference between the current measurement from the sensor IC and the actual current (IP), relative to the actual current. This is equivalent to the difference between the ideal output voltage and the actual output voltage, divided by the ideal sensitivity, relative to the current flowing through the primary conduction path: ETOT(IP) = VIOUT(IP) - VIOUT(ideal)(IP) Sensideal x IP x 100(%) where The Total Output Error incorporates all sources of error and is a function of IP. At relatively high currents, ETOT will be mostly due to sensitivity error, and at relatively low currents, ETOT will be mostly due to Offset Voltage (VOE). In fact, as IP approaches zero, ETOT approaches infinity due to the offset voltage. This is illustrated in Figure 1 and Figure 2. Figure 1 shows a distribution of output voltages versus IP at 25C and across temperature. Figure 2 shows the corresponding ETOT versus IP. VIOUT(ideal)(IP) = VIOUT(Q) + (SensIDEAL x IP ) Increasing VIOUT (V) Accuracy Across Temperature Accuracy at 25C Only +ETOT Ideal VIOUT Accuracy Across Temperature Accuracy at 25C Only Across Temperature IPR(min) VIOUT(Q) 25C Only +IP (A) -IP (A) -IP Full Scale IP +IP IPR(max) 0A Accuracy at 25C Only Accuracy Across Temperature Decreasing VIOUT (V) Figure 1: Output Voltage versus Sensed Current -ETOT Figure 2: Total Output Error versus Sensed Current Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 32 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor Definitions of Dynamic Response Characteristics POWER-ON DELAY (tPOD) When the supply is ramped to its operating voltage, the device requires a finite time to power its internal components before responding to an input magnetic field. Power-On Delay, tPOD, is defined as the time it takes for the output voltage to settle within 10% of its steady-state value under an applied magnetic field, after the power supply has reached its minimum specified operating voltage, VCC(min), as shown in the chart at right. V VCC VCC(typ) VIOUT 90% VIOUT VCC(min) t1 RISE TIME (tr) The time interval between a) when the sensor reaches 10% of its full-scale value, and b) when it reaches 90% of its full-scale value. t2= time at which output voltage settles within 10% of its steady-state value under an applied magnetic field The time interval between a) when the sensed current reaches 20% of its full-scale value, and b) when the sensor output reaches 20% of its full-scale value. The time interval between a) when the applied current reaches 90% of its final value, and b) when the sensor reaches 90% of its output corresponding to the applied current. tPOD t1= time at which power supply reaches minimum specified operating voltage PROPAGATION DELAY (tPROP) RESPONSE TIME (tRESPONSE) t2 0 +t Figure 3: Power-On Delay (tPOD) (%) 90 Primary Current VIOUT Rise Time, tr 20 10 0 Propagation Delay, tPROP t Figure 4: Rise Time (tr) and Propagation Delay (tPROP) (%) 90 Primary Current VIOUT Response Time, tRESPONSE 0 t Figure 5: Response Time (tRESPONSE) Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 33 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor FUNCTIONAL DESCRIPTION Power-On Reset (POR) and Undervoltage Lockout (UVLO) Operation The descriptions in this section assume: temperature = 25C, no output load (RL, CL), and no significant magnetic field is present. Power-Up At power-up, as VCC ramps up, the output is in a high-impedance state. When VCC crosses VPORH (location [1] in Figure 6 and [1] in Figure 7), the POR Release counter starts counting for tPORR. At this point, if VCC exceeds VUVLOH [2], the output will go to VCC / 2 after tUVLOD [3]. If VCC does not exceed VUVLOH [2], the output will stay in the high-impedance state until VCC reaches VUVLOH [3] and then will go to VCC / 2 after tUVLOD [4]. VCC drops below VCC(min) = 4.5 V If VCC drops below VUVLOL [4, 5], the UVLO Enable Counter starts counting. If VCC is still below VUVLOL when the counter reaches tUVLOE, the UVLO function will be enabled and the ouput will be pulled near GND[6]. If VCC exceeds VUVLOL before the UVLO Enable Counter reaches tUVLOE [5], the output will continue to be VCC/2. Coming Out of UVLO While UVLO is enabled [6], if VCC exceeds VUVLOH [7], UVLO will be disabled after tUVLOD, and the output will be VCC / 2 [8]. Power-Down As VCC ramps down below VUVLOL [6, 9], the UVLO Enable Counter will start counting. If VCC is higher than VPORL when the counter reaches tUVLOE, the UVLO function will be enabled and the output will be pulled near GND [10]. The output will enter a high-impedance state as VCC goes below VPORL [11]. If VCC falls below VPORL before the UVLO Enable Counter reaches tUVLOE, the output will transition directly into a high-impedance state [7]. EEPROM Error Checking And Correction Hamming code methodology is implemented for EEPROM checking and correction. The device has ECC enabled after power-up. If an uncorrectable error has occurred, the VOUT pin will go to high impedance and the device will not respond to applied magnetic field. Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 34 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 VCC 1 2 3 5.0 5 4 VUVLOH VUVLOL VPORH VPORL 6 7 9 8 10 11 tUVLOE tUVLOE GND VOUT Time Slope = VCC / 2 2.5 tPORR tUVLOD GND tUVLOD High Impedance High Impedance Time Figure 6: POR and UVLO Operation: Slow Rise Time Case VCC 5.0 VUVLOH VUVLOL VPORH VPORL 1' 2' 3' 4' 5' 6' 7' < tUVLOE GND VOUT Time tPORR 2.5 Slope = VCC / 2 < tUVLOE Slope = VCC / 2 tUVLOD GND High Impedance Time High Impedance Figure 7: POR and UVLO Operation: Fast Rise Time Case Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 35 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor Chopper Stabilization Technique When using Hall-effect technology, a limiting factor for switchpoint accuracy is the small signal voltage developed across the Hall element. This voltage is disproportionally small relative to the offset that can be produced at the output of the Hall sensor IC. This makes it difficult to process the signal while maintaining an accurate, reliable output over the specified operating temperature and voltage ranges. Chopper stabilization is a unique approach used to minimize Hall offset on the chip. Allegro employs a technique to remove key sources of the output drift induced by thermal and mechanical stresses. This offset reduction technique is based on a signal modulation-demodulation process. The undesired offset signal is separated from the magnetic field-induced signal in the frequency domain, through modulation. The subsequent demodulation acts as a modulation process for the offset, causing the magnetic fieldinduced signal to recover its original spectrum at baseband, while the DC offset becomes a high-frequency signal. The magnetic- sourced signal then can pass through a low-pass filter, while the modulated DC offset is suppressed. In addition to the removal of the thermal and stress related offset, this novel technique also reduces the amount of thermal noise in the Hall sensor IC while completely removing the modulated residue resulting from the chopper operation. The chopper stabilization technique uses a high-frequency sampling clock. For demodulation process, a sample-and-hold technique is used. This high-frequency operation allows a greater sampling rate, which results in higher accuracy and faster signal-processing capability. This approach desensitizes the chip to the effects of thermal and mechanical stresses, and produces devices that have extremely stable quiescent Hall output voltages and precise recoverability after temperature cycling. This technique is made possible through the use of a BiCMOS process, which allows the use of low-offset, low-noise amplifiers in combination with high-density logic integration and sample-and-hold circuits. Regulator Clock/Logic Hall Element Amp Anti-Aliasing LP Filter Tuned Filter Figure 8: Concept of Chopper Stabilization Technique Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 36 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor APPLICATION INFORMATION Thermal Rise vs. Primary Current ASEK772 Evaluation Board Layout Self-heating due to the flow of current should be considered during the design of any current sensing system. The sensor, printed circuit board (PCB), and contacts to the PCB will generate heat as current moves through the system. Thermal data shown in Figure 9 was collected using the ASEK772 Evaluation Board (TED-85-0385-001). This board includes 1500 mm2 of 2 oz. (0.0694 mm) copper connected to pins 4 and 5, with thermal vias connecting the layers. Top and bottom layers of the PCB are shown below in Figure 10. The thermal response is highly dependent on PCB layout, copper thickness, cooling techniques, and the profile of the injected current. The current profile includes peak current, current "on-time", and duty cycle. While the data presented in this section was collected with direct current (DC), these numbers may be used to approximate thermal response for both AC signals and current pulses. The plot in Figure 9 shows the measured rise in steady-state die temperature of the ACS772 versus DC input current at an ambient temperature, TA, of 25C. The thermal offset curves may be directly applied to other values of TA. Figure 9: Self-Heating in the CB Package Due to Current Flow The thermal capacity of the ACS772 should be verified by the end user in the application's specific conditions. The maximum junction temperature, TJ(max), should not be exceeded. Further information on this application testing is available in the DC Current Capability and Fuse Characteristics of Current Sensor ICs with 50 to 200 A Measurement Capability application note on the Allegro website (https://www.allegromicro.com/en/DesignCenter/Technical-Documents/Hall-Effect-Sensor-IC-Publications/ DC-Current-Capability-Fuse-Characteristics-Current-Sensor-ICs50-200-A.aspx). Figure 10: Top and Bottom Layers for ASEK772 Evaluation Board Gerber files for the ASEK772 evaluation board are available for download from the Allegro website; see the technical documents section of the ACS772 webpage (https://www.allegromicro.com/ en/Products/Current-Sensor-ICs/Fifty-To-Two-Hundred-AmpIntegrated-Conductor-Sensor-ICs/ACS772.aspx). Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 37 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 PACKAGE OUTLINE DRAWING For Reference Only - Not for Tooling Use (Reference DWG-9111 & DWG-9110) Dimensions in millimeters - NOT TO SCALE Dimensions exclusive of mold flash, gate burs, and dambar protrusions Exact case and lead configuration at supplier discretion within limits shown 14.0 0.2 3.5 0.2 4.0 0.2 3.0 0.2 1 2 1.50 0.10 5 0.5 R1 = 1.0 R2 = 2.05 R3 = 3.0 4 A O 0.5 B 3 17.5 0.2 4 21.4 13.00 0.10 Branded Face 4.40 0.10 O 0.8 1.9 0.2 1 2 O 1.5 2.9 0.2 0.51 0.10 3 0.381 10.00 0.10 +0.060 -0.030 1.91 5 5 B 3.5 0.2 PCB Layout Reference View 7.00 0.10 XXXXXXX XXX-XXX XXXXXXX XXXX A Dambar removal intrusion B Perimeter through-holes recommended C Branding scale and appearance at supplier discretion 1 C Standard Branding Reference View Lines 1, 2, 3, 4 = 7 characters. Line 1: Part Number Line 2: Package Temperature - Amperes Line 3: Lot Number Line 4: Date Code, Logo A Creepage distance, current terminals to signal pins: 7.25 mm Clearance distance, current terminals to signal pins: 7.25 mm Package mass: 4.63 g typical Figure 11: Package CB, 5-Pin, Leadform PFF Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 38 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 For Reference Only - Not for Tooling Use (Reference DWG-9111, DWG-9110) Dimensions in millimeters - NOT TO SCALE Dimensions exclusive of mold flash, gate burs, and dambar protrusions Exact case and lead configuration at supplier discretion within limits shown 14.0 0.2 4.0 0.2 3.0 0.2 0.8 5 4 1.5 1.50 0.10 1.91 B 2.75 0.10 A PCB Layout Reference View 23.50 0.5 XXXXXXX XXX-XXX 13.00 0.10 4.40 0.10 Branded Face XXXXXXX XXXX 1.9 0.2 2.9 0.2 0.51 0.10 1 2 3 0.381 +0.060 -0.030 1 C Lines 1, 2, 3, 4 = 7 characters. 55 Line 1: Part Number Line 2: Package Temperature - Amperes Line 3: Lot Number Line 4: Date Code, Logo A 3.5 0.2 10.00 0.10 7.00 0.10 Standard Branding Reference View A Dambar removal intrusion B Perimeter through-holes recommended C Branding scale and appearance at supplier discretion Figure 12: Package CB, 5-Pin, Leadform PSF Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 39 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor ACS772 For Reference Only - Not for Tooling Use (Reference DWG-9111, DWG-9110) Dimensions in millimeters - NOT TO SCALE Dimensions exclusive of mold flash, gate burs, and dambar protrusions Exact case and lead configuration at supplier discretion within limits shown 14.0 0.2 0.8 4.0 0.2 1.5 3.0 0.2 5 4 1.91 1.50 0.10 A B PCB Layout Reference View 2.75 0.10 XXXXXXX XXX-XXX 23.50 0.5 XXXXXXX XXXX 13.00 0.10 4.40 0.10 1 Branded Face 1 2 C 3 Lines 1, 2, 3, 4 = 7 characters. 3.18 0.10 1.9 0.2 11.0 0.05 Standard Branding Reference View 0.51 0.10 +0.060 0.381 -0.030 Line 1: Part Number Line 2: Package Temperature - Amperes Line 3: Lot Number Line 4: Date Code, Logo A 10.00 0.10 7.00 0.10 A Dambar removal intrusion B Perimeter through-holes recommended C Branding scale and appearance at supplier discretion Figure 13: Package CB, 5-Pin, Leadform PSS Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 40 ACS772 High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth, Galvanically Isolated Current Sensor IC with 100 Current Conductor Revision History Number Date Description - December 12, 2017 Initial release 1 January 30, 2018 2 May 14, 2018 3 September 24, 2018 Added -PSF leadform option; updated Magnetic Offset Error value (page 13) and Characteristic Performance Data charts (pages 26 to 28) 4 November 12, 2018 Added -300B part option (page 2 and 16); added -PSS leadform option (pages 1, 2, and 39) and Applications Information section (page 36); updated Typical Application (page 1), pinout diagram (page 4), and TOP to TA (pages 2 and 5-15). 5 December 13, 2018 Added UL certificate; updated package outline drawing PCB layouts and branding (pages 37-39) Added Dielectric Surge Strength Test Voltage characteristic (page 3) and EEPROM Error Checking and Correction section (page 16) Added -050U, -100B, -150U, -200U, -250U, and -250B part options 6 January 7, 2019 Corrected Sensitivity Error values for -200U part option (page 12) 7 January 24, 2019 Added -400B part option (page 2 and 17) 8 March 14, 2019 Updated package branding (pages 38-40) and Temperature ratings (pages 2-3, 6-17) Copyright 2019, Allegro MicroSystems, LLC Allegro MicroSystems, LLC reserves the right to make, from time to time, such departures from the detail specifications as may be required to permit improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the information being relied upon is current. Allegro's products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of Allegro's product can reasonably be expected to cause bodily harm. The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems, LLC assumes no responsibility for its use; nor for any infringement of patents or other rights of third parties which may result from its use. Copies of this document are considered uncontrolled documents. For the latest version of this document, visit our website: www.allegromicro.com Allegro MicroSystems, LLC 955 Perimeter Road Manchester, NH 03103-3353 U.S.A. www.allegromicro.com 41