©2001 Fairchild Semiconductor Corporation BUZ1 Rev. A
Absolute Maximum Ratings
T
C
= 25
o
C, Unless Otherwise Specified
BUZ11 UNITS
Drain to Source Breakdown Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
DS
50 V
Drain to Gate Voltage (R
GS
= 20k
Ω
) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
DGR
50 V
Continuous Drain Current T
C
= 30
o
C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
D
30 A
Pulsed Drain Current (Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
DM
120 A
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
GS
±
20 V
Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .P
D
75 W
Linear Derating Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.6 W/
o
C
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
J,
T
STG
-55 to 150
o
C
DIN Humidity Category - DIN 40040 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
IEC Climatic Category - DIN IEC 68-1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55/150/56
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
L
Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
pkg
300
260
o
C
o
C
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. T
J
= 25
o
C to 125
o
C.
Electrical Specifications T
C
= 25
o
C, Unless Otherwise Specified
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Drain to Source Breakdown Voltage BV
DSS
I
D
= 250
µ
A, V
GS
= 0V 50 - - V
Gate Threshold Voltage V
GS(TH)
V
GS
= V
DS
, I
D
= 1mA (Figure 9) 2.1 3 4 V
Zero Gate Voltage Drain Current I
DSS
T
J
= 25
o
C, V
DS
= 50V, V
GS
= 0V - 20 250
µ
A
T
J
= 125
o
C, V
DS
= 50V, V
GS
= 0V - 100 1000
µ
A
Gate to Source Leakage Current I
GSS
V
GS
= 20V, V
DS
= 0V - 10 100 nA
Drain to Source On Resistance (Note 2) r
DS(ON)
I
D
= 15A, V
GS
= 10V (Figure 8) - 0.03 0.04
Ω
Forward Transconductance (Note 2) gfs V
DS
= 25V, I
D
= 15A (Figure 11) 4 8 - S
Turn-On Delay Time t
d(ON)
V
CC
= 30V, I
D
≈
3A, V
GS
= 10V, R
GS
= 50
Ω,
R
L
= 10
Ω
-3045ns
Rise Time t
r
- 70 110 ns
Turn-Off Delay Time t
d(OFF)
- 180 230 ns
Fall Time t
f
- 130 170 ns
Input Capacitance C
ISS
V
DS
= 25V, V
GS
= 0V, f = 1MHz (Figure 10) - 1500 2000 pF
Output Capacitance C
OSS
- 750 1100 pF
Reverse Transfer Capacitance C
RSS
- 250 400 pF
Thermal Resistance Junction to Case R
θ
JC
≤
1.67
o
C/W
Thermal Resistance Junction to Ambient R
θ
JA
≤
75
o
C/W
Source to Drain Diode Specifications
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Continuous Source to Drain Current I
SD
T
C
= 25
o
C--30A
Pulsed Source to Drain Current I
SDM
T
C
= 25
o
C - - 120 A
Source to Drain Diode Voltage V
SD
T
J
= 25
o
C, I
SD
= 60A, V
GS
= 0V - 1.7 2.6 V
Reverse Recovery Time t
rr
T
J
= 25
o
C, I
SD
= 30A, dI
SD
/dt = 100A/
µ
s,
V
R
= 30V
- 200 - ns
Reverse Recovery Charge Q
RR
- 0.25 -
µ
C
NOTES:
2. Pulse Test: Pulse width
≤
300ms, duty cycle
≤
2%.
3. Repetitive rating: pulse width limited by maximum junction temperature. See Transient Thermal Impedance curve (Figure 3).
BUZ11