MCH15
Ceramic capacitors
CN (R) (B) (X7R) FN (F) (Y5V)
−55°C ~ +125°C−30°C ~ +85°C
Class 2 (High dielectric constant)
Temperature characteristics
Item
Operating temperature
Nominal capacitance (C)
Dissipation factor (tan
δ)
Insulation resistance (IR)
Withstanding voltage
Temperature characteristics
Terminal adherence
Resistance
to vibration
Appearance
Rate of capacitance change
Dissipation factor (tan
δ)
Solderability
Resistance
to soldering
heat
Appearance
Rate of capacitance change
Dissipation factor (tan
δ)
Insulation resistance
Withstanding voltage
Temperature
cycling
Appearance
Rate of capacitance change
Dissipation factor (tan
δ)
Insulation resistance
Humidity load
test
Appearance
Rate of capacitance change
Dissipation factor (tan
δ)
Insulation resistance
High-
temperature
load test
Appearance
Rate of capacitance change
Dissipation factor (tan
δ)
Insulation resistance
Must be within the specified tolerance range.
2.5% or less
(when rated voltage is 16V: 3.5% or less) 5.0% or less
(when rated voltage is 16V: 7.5% or less)
10,000M
Ω
or 500M
Ω ⋅ µ
F, whichever is smaller
The insulation must not be damaged.
Within
±
15%
+
22,
+
82%
No detachment or signs of detachment
There must be no mechanical damage.
Must be within initial tolerance.
Must satisfy initial specified value.
At least 3/4 of the surface of the two terminals must be covered with new solder.
There must be no mechanical damage.
Within
±
5.0% Within
±
20.0%
Must satisfy initial specified value.
10,000M
Ω
or 500M
Ω ⋅ µ
F, whichever is smaller
The insulation must not be damaged.
There must be no mechanical damage.
Within
±
7.5% Within
±
20.0%
Must satisfy initial specified value.
10,000M
Ω
or 500M
Ω ⋅ µ
F, whichever is smaller
There must be no mechanical damage.
±
12.5% or less Within
±
30.0%
5.0% or less 7.5% or less
(when rated voltage is 16V: 10.0%)
500M
Ω
or 25M
Ω ⋅ µ
F, whichever is smaller
There must be no mechanical damage.
Within
±
10.0% Within
±
30.0%
5.0% or less 7.5% or less
(when rated voltage is 16V: 10.0%)
1,000M
Ω
or 50M
Ω ⋅ µ
F, whichever is smaller
Test methods/conditions
(based on JIS C 5102)
Based on paragraph 7.8
Measured at room temperature and standard humidity,
Measurement frequency
Measurement voltage
Based on paragraph 7.6
Measurement is made after rated voltage
is applied for 60
±
5s.
Based on paragraph 7.1
Apply 250% of the rated voltage for 1 to 5s then measure.
The temperature coefficients in paragraph 7.12,
table 8, condition B, are based on measurements
carried out at 20
°
C
, with no voltage applied.
Based on paragraph 8. 11. 2.
Apply 5N for 10
±
1s
in the direction indicated
by the arrow.
Capacitor
Test board
Pressure (5N)
Chip is mounted to a board in the
manner shown on the right, subjected
to vibration (type A in paragraph 8.2),
and measured 48
±
4 hrs. later.
Board
Soldering temperature
Based on paragraph 8. 13
Soldering time
Based on paragraph 8. 14.
Soldering temperature
Soldering time
Preheating
Based on paragraph 9.3
Number of cycles : 5
Capacitance measured after 48
±
4 hrs.
Test temperature
Based on paragraph 9.9
Relative humidity
Applied voltage
Test time
Capacitance measured after 48
±
4 hrs.
Applied voltage
Test time
Capacitance measured after 48
±
4 hrs.
Test temperature
Based on paragraph 9.10
: 1
±
0.1 kHz
: 1.0
±
0.2 Vrms.
: 235
±
5
°C
: 2
±
0.5s
: 260
±
5
°C
: 5
±
0.5s
: 150
±
10
°C
for
1 to 2 min.
: 40
±
2
°C
: 90% to 95%
: rated voltage
: 500 to 524 hrs.
: Max. operating temp.
: rated voltage
×
200%
: 1,000 to 1,048 hrs.
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.