DRAM MODULE KMM53632000BK/BKG
CAPACITANCE (TA = 25°C, VCC=5V, f = 1MHz)
Item Symbol Min Max Unit
Input capacitance[A0-A11]
Input capacitance[W]
Input capacitance[RAS0 - RAS3]
Input capacitance[CAS0 - CAS3]
Input/Output capacitance[DQ0-35]
CIN1
CIN2
CIN3
CIN4
CDQ
-
-
-
-
-
130
178
52
52
17
pF
pF
pF
pF
pF
Test condition : Vih/Vil=2.4/0.8V, Voh/Vol=2.4/0.4V, output loading CL=100pF
Parameter Symbol -5 -6 Unit Note
Min Max Min Max
Random read or write cycle time tRC 90 110 ns
Access time from RAS tRAC 50 60 ns 3,4,10
Access time from CAS tCAC 13 15 ns 3,4,5
Access time from column address tAA 25 30 ns 3,10
CAS to output in Low-Z tCLZ 0 0 ns 3
Output buffer turn-off delay tOFF 013 0 15 ns 6
Transition time(rise and fall) tT150 1 50 ns 2
RAS precharge time tRP 30 40 ns
RAS pulse width tRAS 50 10K 60 10K ns
RAS hold time tRSH 13 15 ns
CAS hold time tCSH 50 60 ns
CAS pulse width tCAS 13 10K 15 10K ns
RAS to CAS delay time tRCD 20 37 20 45 ns 4
RAS to column address delay time tRAD 15 25 15 30 ns 10
CAS to RAS precharge time tCRP 5 5 ns
Row address set-up time tASR 0 0 ns
Row address hold time tRAH 10 10 ns
Column address set-up time tASC 0 0 ns
Column address hold time tCAH 10 10 ns
Column address to RAS lead time tRAL 25 30 ns
Read command set-up time tRCS 0 0 ns
Read command hold referenced to CAS tRCH 0 0 ns 8
Read command hold referenced to RAS tRRH 0 0 ns 8
Write command hold time tWCH 10 10 ns
Write command pulse width tWP 10 10 ns
Write command to RAS lead time tRWL 15 15 ns
Write command to CAS lead time tCWL 13 15 ns
Data set-up time tDS 0 0 ns 9
Data hold time tDH 10 10 ns 9
Refresh period tREF 64 64 ms
Write command set-up time tWCS 0 0 ns 7
CAS setup time(CAS-before-RAS refresh) tCSR 5 5 ns
CAS hold time(CAS-before-RAS refresh) tCHR 10 10 ns
RAS to CAS precharge time tRPC 5 5 ns
Access time from CAS precharge tCPA 30 35 ns 3
AC CHARACTERISTICS (0°C≤TA≤70°C, VCC=5.0V±10%. See notes 1,2.)