POE International Corp
M01-00-E-07
SPECIFICATION OF POWER CHIP RESISTOR
Ver: 1
Page: 6 of 7
TEST AND REQUIREMENTS
TEST PROCEDURE REQUIREMENT
DC resistance DC resistance values measured at the test voltages
specified below :
<10Ω@0.1V, <100Ω@0.3V, <1KΩ@1.0V,
<10KΩ@3V, <100KΩ@10V, <1MΩ@25V,
<10MΩ@30V
Within the specified tolerance
Temperature
Coefficient of
Resistance
( TCR )
Natural resistance change per change in degree
centigrade.
( )
6
121
12 10×
−
ttR RR (ppm/°C)
R1 : Resistance at reference temperature
R2 : Resistance at test temperature
t1 : 25°C
Test temperature –55 ~ +125°C
1Ω ≤ Rn < 9.76Ω, ± 300 ppm/°C
10Ω ≤ Rn < 1MΩ, ± 200 ppm/°C
1MΩ ≤ Rn < 10MΩ, ± 300 ppm/°C
Short time
overload (STOL)
Permanent resistance change after a 5second application
of a voltage 2.5 times RCWV or the maximum overload
voltage specified in the above list, whichever is less.
∆R/R max. ±(2%+0.1Ω)
Resistance to
soldering heat Unmounted chips 10±1 seconds, 260±5ºC no visible damage
∆ R/R max. ±(1%+0.05Ω)
Solderability Termination SnPb base : Unmounted chips completely
immersed for 2±0.5 sec. in a solder bath at 230±5ºC
Termination Sn base (lead free) : Unmounted chip
completely immersed in a lead free solder bath,
245°C±5°C, 3±1 sec
good tinning (>95% covered)
no visible damage
Isolation voltage
AC 500V, 60 sec. no visible damage or flashover
R≥1GΩ
Temperature
cycling 1. 30 minutes at -55°C±3°C,
2. 2~3 minutes at room temperature,
3. 30 minutes at +125°±3°C,
4. 2~3 minutes at room temperature,
Total 5 continuous cycles
no visible damage
∆R/R max. ±(1%+0.05Ω)
Load life
(endurance) 70±2ºC, 1000 hours, loaded with RCWV or Vmax,1.5
hours on and 0.5 hours off ∆R/R max. ±(5%+0.1Ω)
Load life in
Humidity 1000 hours, at rated continuous working voltage in
humidity chamber controller at 40°C±2°C and 90~95%
relative humidity, 1.5hours on and 0.5 hours off
∆R/R max. ±(5%+0.1Ω)
Bending and
Termination
strength
Resistors mounted on a 90mm glass epoxy resin
PCB(FR4); bending : 2 mm, once for 10 seconds
Pulling test : 500grams
∆R/R max. ±(1%+0.05Ω)