Preliminary Data Sheet 3 Revision 2.2, 2008-02-06
SLIC-E / TSLIC-E
PEF 4265 / PEF 4365
Trademarks of Infineon Technologies AG:
ABM™, A-GOLD™, AOP™, BlueMoon™, ConverGate™, Converpath™, COSIC™, C166™, DUALFALC™,
DuSLIC™, E-GOLD™, ELASTec™, Epic™, FALC™, FlexiSLIC™, GEMINAX™, GIGAFLOW™, GOLDMOS™,
INCA™, IOM™, IPVD™, Isac™, IWE™, IWORX™, LEDFET™, M-GOLD™, MuSLIC™, OCTALFALC™,
OCTAT™, OmniTune™, OmniVia™, OPTIVERSE™, PASi™, PROSOC™, QUADFALC™, SCEPTRE™,
SCOUT™, SEROCCO™, S-GOLD™, SICOFI™, SIEGET™, SLIC™, SMARTI™, SMARTiPM™, SMARTiPM+™,
SMARTiUE™, SMARTi3G™, SMARTi3G+™, SMINT™, SOCRATES™, TrueNTRY™, VINAX™, VINETIC™,
VIONTIC™, VOIPRO™, WDCT™, WildPass™, X-GOLD™, XMM™, X-PMU™.
Other trademarks: Microsoft®, Visio®, Windows® of Microsoft Corporation. Linux® of Linus Torvalds.
FrameMaker® of Adobe Systems Incorporated. APOXI®, COMNEON™ of Comneon GmbH & Co. OHG.
PrimeCell®, RealView®, ARM®, ARM® Developer Suite™ (ADS), Multi-ICE™, ARM1176JZ-S™, CoreSight™,
Embedded Trace Macrocell™ (ETM), Thumb®, ETM9™, AMBA™, ARM7™, ARM9™, ARM7TDMI-S™,
ARM926EJ-S™ of ARM Limited. OakDSPCore®, TeakLite® DSP Core, OCEM® of ParthusCeva Inc.
IndoorGPS™, GL-20000™, GL-LN-22™ of Global Locate. mipi™ of MIPI Alliance. CAT-iq™ of DECT Forum.
MIPS™, MIPS II™, 24KEc™ of MIPS Technologies, Inc. Texas Instruments®, PowerPAD™, C62x™, C55x™,
VLYNQ™, Telogy Software™, TMS320C62x™, Code Composer Studio™, SSI™ of Texas Instruments
Incorporated. Luxworks® of LSI Corporation. Bluetooth® of Bluetooth SIG, Inc. IrDA® of the Infrared Data
Association. Java™, SunOS™, Solaris™ of Sun Microsystems, Inc. Philips®, I2C-Bus® of Koninklijke Philips
Electronics N.V. Epson® of Seiko Epson Corporation. Seiko® of Kabushiki Kaisha Hattori Seiko Corporation.
Panasonic® of Matsushita Electric Industrial Co., Ltd. Murata® of Murata Manufacturing Company. Taiyo Yuden™
of Taiyo Yuden Co., Ltd. TDK® of TDK Electronics Company, Ltd. Motorola® of Motorola, Inc. National
Semiconductor®, MICROWIRE™ of National Semiconductor Corporation. IEEE® of The Institute of Electrical and
Electronics Engineers, Inc. Samsung®, OneNAND®, UtRAM® of Samsung Corporation. Toshiba® of Toshiba
Corporation. Dallas Semiconductor®, 1-Wire® of Dallas Semiconductor Corp. NOVeA™ of Virage Logic Corp.
ISO® of the International Organization for Standardization. IEC™ of the International Engineering Consortium.
EMV™ of EMVCo, LLC. Zetex® of Zetex Semiconductors. Rohm™ of Rohm Co., Ltd. Microtec® of Microtec
Research, Inc. Verilog® of Cadence Design Systems, Inc. ANSI® of the American National Standards Institute, Inc.
WindRiver® and VxWorks® of Wind River Systems, Inc. Nucleus™ of Mentor Graphics Corporation.
SLIC-E / TSLIC-E Subscriber Line Interface Circuit Enhanced Feature Set
Revision History: 2008-02-06, Revision 2.2
Previous Version: Revision 2.1
Page Subjects (major changes since last revision)
21 “Absolute Maximum Ratings” on Page 21: ESD SDM max. value changed from 1 kV to 500 V
36 “PG-VQFN-48-48 Package” on Page 36: package changed from PG-VQFN-48-15 to
PG-VQFN-48-48