F 1048A
F 1048B
GaAlAs-Infrarot- Lumineszenzdiode (880 nm)
GaAlAs Infrared Emitting Diode (880 nm)
Vorläufige Date n / Preliminary Da ta
2003-04-10 1
Wesentliche Merkmale
Typ. Gesamtleistung: 25 mW @ 100 mA im
TOPLED® Gehäuse
Chipgröße 400 x 400 µm2
GaAlAs-LED mit sehr hohem Wirkungsgrad
Hohe Zuverlässigkeit
Hohe Impulsbelastbarkeit
Gute spektrale Anpassung an
Si-Fotoempfänger
Vorderseitenmetallisierung: Aluminium
Rückseitenmetallisierung: Goldlegierung
Lieferung: vereinzelt auf Folie
Anwendungen
Gerätefernsteuerungen für Gleich- und
Wechsellichtbetrieb
Lichtschranken bis 500 kHz
Sensorik
Diskrete Optokoppler
Typ
Type Bestellnummer
Ordering Code Beschreibung
Description
F 1048A Q67220-C1277 Infrarot emittierender Chip, Oberseite Kathodenanschluss
Infrared emitting die, top side cathode connection
F 1048B on request Infrarot emittierender Chip, Oberseite Kathodenanschluss,
Oberfläche aufgerauht.
Infrared emitting die, top side cathode connection, surface
frosted
Features
Typ. total radiant power: 25 mW @ 100 mA in
TOPLED® package.
Chipsize: 400 x 400 µm²
Very highly efficient GaAlAs LED
High reliability
High pulse handling capability
Good spectral match to silicon photodetectors
Frontside metallization: aluminum
Backside metallization: gold alloy
Delivery: diced on foil
Applications
Remote control for steady and varying
intensity
Light-reflection switches (max. 500 kHz)
Sensor technology
Discrete optocouplers
2003-04-10 2
F 1048A, F 1048B
Elektrische Werte (TA = 25 °C)
Electrical values1) (TA = 25 °C)
Bezeichnung
Parameter Symbol
Symbol Wert
Value2) Einheit
Unit
min. typ. max.
Emissionswellenlänge
Peak wavelength
IF = 10 mA
λpeak 880 nm
Spektrale Bandbreite bei 50% von Imax,
Spectral bandwidth at 50% of Imax
IF = 10 mA
∆λ 100 nm
Schaltzeiten, Ie von 10% auf 90% und von 90% auf
10%, bei IF = 100 mA, RL = 50
Switching times, Ie from 10% to 90% a nd from 90%
to 10%, IF = 100 mA, RL = 50
tr, tf0.5/0.4 µs
Sperrspannung
Reverse voltage
IR = 1µA
VR5V
Durchlaβspannung
Forward voltage
IF = 100 mA
VF1.9 V
Strahlungsleistung
Radiant Power3)
IF = 100 mA
F1048A
F1048B
Φe
12
14 mW
mW
Photostrom (Spezifikationsparameter)
Photocurrent (specified parameter)
IF = 100 mA
F1048A
F1048B
Ie
0.50
0.65 a.u.
a.u.
1) Measurement limits describe actual settings and do not include measurement uncertainties. Each wafer and each
fragment o f a wa fe r is su bj ect to fina l te sti ng. The wafer or its pi ec es are i nd iv idu al ly atta ched on f oi ls (r in g) . Sa mpl e
chips are picked f rom each foil and place d on a special carrier f or measurement purposes. The sampl ing density is one
chip per 1c m². If a sampl e f ai ls , t he a rea a r ound t hat sampl e is tested agai n by taking sampl es i n fo urf ol d den sit y. I f a
sample fails in that measurement, an area of 0,25 cm² around each failed sample is marked by pen.
All el. values are referenced to the vendor's measurement system (correlation to customer product(s) is required)
2) Typical (re fere d to as ty p.) dat a a re def i ned as l on g- te rm production me an va lu es and are only given for informa ti on .
This is no t a specified value
3) Radiant power is measured on TO-18 header in integrating sphere.
F 1048A, F 1048B
2003-04-10 3
Mechanische Werte
Mechanical values
Bezeichnung
Parameter Symbol
Symbol Wert
Value1) Einheit
Unit
min. typ. max.
Chipkantenlänge (x-Richtun g)
Length of chip edge (x-direction) Lx0.38 0.40 0.42 mm
Chipkantenlänge (y-Richtun g)
Length of chip edge (y-direction) Ly0.38 0.40 0.42 mm
Durchmesser des Wafers
Diameter of the wafer D48 mm
Chiphöhe
Die height H210 µm
Bondpadmaße
Bondpad dimensions d110 x
110 µm²
Weitere Informationen
Additional information2)
Vorderseitenmetallisierung
Metallization frontside Aluminium
Aluminum
Rückseitenmetallisierung
Metallization backside Goldlegierung
Au-Alloy
Trennverfahren
Dicing Sägen
Sawing
Verbindung Chip - Träger
Die bonding Kleben
Glueing
1) Typical (ref ered t o a s typ.) d at a are def in ed a s long-term pro duc ti on mean values and are only g iv en f or inf orma ti on .
This is no t a specified value
2) All chips are checked according to the following procedure and the OSRAM OS specification of the visual inspection
A63501-Q0013-N001-*-76G3:The visual inspection shall be made in accordance to the "specification of the visual
inspection" as referenced.The visual inspection of chip backside is performed by eye for 100% of the area of each
wafer. If decisions (good/bad) are not possible additional a stereo microscope with incident light with 40x-80x
magnific ation is used. Are as > ¼ cm² which have a n amount of more tha n 5% failed dies wi ll be marked manuall y with
pen.The visual inspection of chip frontside is performed by a stereo microscope with incident light with 40x-80x
magnification for 100% of the area of each wafer.Areas greater than 5x5 mm² and with a failure density higher than
25% are marked by pen and inked around. Areas with failure density higher than 10% each failure die is inked
individua lly.The inked a rea from backside must be transf ered to frontsi de and has to be mark ed manually wi th pen and
inked around.The quality inspection (final visual inspection) is performed by production. An additional visual
inspection step as special release procedure by QM after the final visual inspection is not installed.
F 1048A, F 1048B
2003-04-10 4
fj
Grenzwert1)
Maximum Ratings
Bezeichnung
Parameter Symbol
Symbol Wert
Value Einheit
Unit
Maximaler Betriebstemperaturbereich
Maximum Operating temperature range Top -40...+100 °C
Maximaler Lagertemperaturbereich
Maximum storage temperature range Tstg -40...+100 °C
Maximaler Durchlaßstrom
Maximum forward current IF100 mA
Maximaler Stoßstrom
Maximum surge current
tp = 10 µs, D = 0.005
IS2.5 A
Maximale Sperrschichttemperatur
Maximum junction temperature Tj125 °C
1)Maximum ratings are strongly package dependent and may differ between different packages. The values given
represent the chip in a TO-18 package.
F 1048A, F 1048B
2003-04-10 5
Relati ve Sp ectral Emission1) IFrel= f (λ)
TA = 25 °C
Forward Cu rrent1)
IF= f (VF), Single pulse, tp = 20 ms, TA = 25 °C
1) Based on typ.(see page 2, footnote 2 for explanation)
data measured in OSRAM Opto Semiconductors
TOPLED® package.
Radiant Intensity1) Ie/Ie(100mA) = f (IF)
TA = 25 °C, single pulse: tp = 20 µs
Permissible Pulse Po wer1)
Duty cycle D = parameter, TA = 25 °C
0
750
Ι
rel
OHR00877
800 850 900 950 nm 1000
20
40
60
80
%
100
λ
10
OHR01173
F
V
-3
-2
10
-1
10
0
10
1
10
0
A
Ι
F
1 2 3 4 5
10
OHR00878
Ιe
F
Ι
-3
-2
10
-1
10
0
10
1
10
2
10
0
10 101102104
mA
e
Ι
(100mA)
3
10
t
OHR00948
p
-5
10
10 2
Ι
F
10 3
10 4
10 -4 10 -3 10 -2 10 -1 10 0
s
5
DC
0.2
0.5
0.1
0.005
0.010.020.05
tp
T
Ι
F
tp
T
D=
5
mA
D=
2003-04-10 6
F 1048A, F 1048B
Maßzeichnung
Chip Outlines
Maße werden als typische1) Werte wie folgt angegeben: mm (inch) / Dimensions are specified as typical1) values as
follows: mm (inch).
Published by OSRAM Opto Semiconductors GmbH
Wernerwerkstrasse 2, D-93049 Regensburg
© All Rights Reserved.
Attention please!
The inform ation gen erally descri bes the type of compone nt and shall not be considered as assured ch aracteristic s or
detaile d sp ec if ic at ion.
Terms of delivery and rights to change design reserved. Due to technical requirements components may contain
dangerous substanc es . For information on the types in question ple as e c ont ac t our s ales organization.
Handling and Storage Conditions:
The hermetically sealed shipment lot shall be opened under temperature and moisture controlled cleanroom
environment only. Customer has to follow the according rules for disposition of material that can be hazardous for
humans and environment.
Packing
Chips are placed on a blue foil, wh ic h is fixed in a yellow frame of 5 diameter.
For shipment the wafers of a shipment lot are arranged to stacks. The top and bottom of the stack is covered by a
dummy disk to protect the top and bottom wafer from damage. The whole package is fixed by rubber strings and
hermetically sealed in a plastic bag for storage and shipment. Please use the recycling operators known to you. We can
also help you get in touch with your nearest sales office. By agreement we will take packing material back, if it is
sorted. You will have to bear the costs of transport. For packing material that is returned to us unsorted or which we are
not oblig ed t o ac c ept , we shall have to invoice y ou f or any costs incurred.
Further Conditions:
If not otherwise arranged, the General Conditions for the supply of products and services of the electrical and
electronics industry apply for any shipment, just as the Supplier Addendum " Chip business" to the General Conditions
for the supply of products and services of the electrical and electronics industry. If these documents are not familiar to
you, please request them at our nearest sales office.
Com pon en ts used in life-su pport device s or systems must be ex pressly autho r ized b y us for such purpose!
Critical components2), may only be used in life-support devices or systems3) with the express written approval of
OSRAM OS.
1) Typical (refered to as typ.) data are defined as long-term production mean values and are only given for information.
This is no t a specified val ue.
2)A critical comp onent is a component used in a life-supp ort device or system whose fail ure can reasonably be expec ted to
cause the failure of that life-support device or system, or to affect its safety or effectiveness of that device or system.
3)Life support devices or systems are intended (a) to be implanted in the human body, or (b) to support and/or maintain
and sustain human life. If they fail, it is reasonable to assume that the health of the user may be endangered.
GMOY6077
0.21 (0.0083)
0.11 (0.0043)
n-contact
p-contact
0.4 (0.0157)