Specification of Automotive MLCC Supplier : Samsung electro-mechanics Samsung P/N : Product : Multi-layer Ceramic Capacitor CAP, 22, 50V, 5%, C0G, 0603 Description : AEC-Q 200 Specified CL10C220JB81PNC A. Samsung Part Number Series CL 10 C 220 J B 8 1 P N C Samsung Multi-layer Ceramic Capacitor Size 0603 (inch code) Dielectric C0G Capacitance L: 1.6 0.1 mm 22 5 % Capacitance tolerance Rated Voltage 50 V Thickness 0.8 0.1 mm 0.8 0.1 mm W: Inner electrode Ni Termination Cu Plating Sn 100% (Pb Free) Product Automotive Grade code Standard Packaging Cardboard Type, 7" reel B. Reliablility Test and Judgement condition Performance Test condition High Temperature Appearance : No abnormal exterior appearance Unpowered, 1000hrs@T=150 Exposure Capacitance Change : Measurement at 242hrs after test conclusion within 2.5% or 0.25 whichever is larger Q: 840 min IR : More than 10,000 or 500x Whichever is Smaller Temperature Cycling Appearance : No abnormal exterior appearance 1000Cycles Capacitance Change : Measurement at 242hrs after test conclusion within 2.5% or 0.25 whichever is larger Q: 840 min IR : More than 10,000 or 500x 1 cycle condition : -55+0/-3(153min) -> Room Temp(1min.) -> 125+3/-0(153min) -> Room Temp(1min.) Whichever is Smaller Destructive Physical No Defects or abnormalities Per EIA 469 Appearance : No abnormal exterior appearance 10Cycles, t=24hrs/cycle Capacitance Change : Heat (25~65) and humidity (80~98%), Unpowered Analysis Moisture Resistance within 2.5% or 0.25 whichever is larger Q: 330 measurement at 242hrs after test conclusion min IR : More than 10,000 or 500x Whichever is Smaller Humidity Bias Appearance : No abnormal exterior appearance 1000hrs 85/85%RH, Rated Voltate and 1.3~1.5V, Capacitance Change : Add 100kohm resistor within 2.5% or 0.25 whichever is larger Q: 173.33 min Measurement at 242hrs after test conclusion The charge/discharge current is less than 50mA. IR : More than 500 or 25x Whichever is Smaller High Temperature Appearance : No abnormal exterior appearance 1000hrs @ TA=125, 200% Rated Voltage, Operating Life Capacitance Change : Measurement at 242hrs after test conclusion within 3.0% or 0.3 whichever is larger Q: 330 min IR : More than 10,000 or 500x Whichever is Smaller The charge/discharge current is less than 50mA. Test condition Performance External Visual No abnormal exterior appearance Physical Dimensions Within the specified dimensions Mechanical Shock Microscope (10) Using The calipers Appearance : No abnormal exterior appearance Three shocks in each direction should be applied along Capacitance Change : 3 mutually perpendicular axes of the test specimen (18 shocks) within 2.5% or 0.25 whichever is larger Q, IR : initial spec. Vibration Peakvalue Duration Wave Velocity 1,500G 0.5ms Half sine 4.7m/sec. Appearance : No abnormal exterior appearance 5g's for 20min., 12cycles each of 3 orientations, Capacitance Change : Use 8"x5" PCB 0.031" Thick 7 secure points on one long side within 2.5% or 0.25 whichever is larger and 2 secure points at corners of opposite sides. Parts mounted Q, IR : initial spec. within 2" from any secure point. Test from 10~2000. Resistance to Appearance : No abnormal exterior appearance Solder pot : 2605, 101sec. Solder Heat Capacitance Change : within 2.5% or 0.25 whichever is larger Q, IR : initial spec. Thermal Shock Appearance : No abnormal exterior appearance -55/+125. Capacitance Change : Note: Number of cycles required-300, within 2.5% or 0.25 whichever is larger Maximum transfer time-20 sec, Dwell time-15min. Air-Air Q, IR : initial spec. Appearance : No abnormal exterior appearance ESD AEC-Q200-002 Capacitance Change : within 2.5% or 0.25 whichever is larger Q, IR : initial spec. Solderability 95% of the terminations is to be soldered a) Preheat at 155 for 4 hours, Immerse in solder for 5s at 2455 evenly and continuously b) Steam aging for 8 hours, Immerse in solder for 5s at 2455 c) Steam aging for 8 hours, Immerse in solder for 120s at 2605 solder : a solution ethanol and rosin Electrical Capacitance : Within specified tolerance The Capacitance /Q should be measured at 25 , Characterization Q: 110%, 0.5~5Vrms 840 max. IR(25) : More than 100,000 or 1,000x I.R. should be measured with a DC voltage not exceeding IR(125) : More than10,000 or 100x Rated Voltage @25, @125 for 60~120 sec. Whichever is Smaller Dielectric Strength : 250% of the rated voltage for 1~5 seconds Dielectric Strength Board Flex Appearance : No abnormal exterior appearance Bending to the limit (3) for 5 seconds Capacitance Change : within 5.0% or 0.5 whichever is larger Terminal Appearance : No abnormal exterior appearance Strength(SMD) Capacitance Change : Beam Load Destruction value should not be exceed Beam speed Chip Length < 2.5 0.50.05/sec 10N, for 601 sec. within 2.5% or 0.25 whichever is larger a) Chip Thickness > 0.5 : 20N b) Chip Thickness 0.5 : 8N Temperature C0G Characterisitcs (From -55 to 125, Capacitance change shoud be within 30PPM/) C. Recommended Soldering method : Reflow ( Reflow Peak Temperature : 260+0/-5, 10sec. Max ) Meet IPC/JEDEC J-STD-020 D Standard * For the more detail Specification, Please refer to the Samsung MLCC catalogue.