General Description
The MAX120/MAX122 complete, BiCMOS, sampling 12-bit
analog-to-digital converters (ADCs) combine an on-chip
track/hold (T/H) and a low-drift voltage reference with fast
conversion speeds and low-power consumption. The T/H’s
350ns acquisition time combined with the MAX120’s 1.6µs
conversion time results in throughput rates as high as 500k
samples per second (ksps). Throughput rates of 333ksps
are possible with the 2.6µs conversion time of the MAX122.
The MAX120/MAX122 accept analog input voltages from
-5V to +5V. The only external components needed are
decoupling capacitors for the power-supply and refer-
ence voltages. The MAX120 operates with clocks in the
0.1MHz to 8MHz frequency range. The MAX122 accepts
0.1MHz to 5MHz clock frequencies.
The MAX120/MAX122 employ a standard microprocessor
(µP) interface. Three-state data outputs are configured
to operate with 12-bit data buses. Data-access and bus-
release timing specifications are compatible with most
popular µPs without resorting to wait states. In addition,
the MAX120/MAX122 can interface directly to a first-in,
first-out (FIFO) buffer, virtually eliminating µP interrupt
overhead. All logic inputs and outputs are TTL/CMOS
compatible. For applications requiring a serial interface,
refer to the MAX121.
Applications
Digital-Signal Processing
Audio and Telecom Processing
Speech Recognition and Synthesis
High-Speed Data Acquisition
Spectrum Analysis
Data Logging Systems
Features
12-Bit Resolution
No Missing Codes Over Temperature
20ppm/°C -5V Internal Reference
1.6µs Conversion Time/500ksps Throughput
(MAX120)
2.6µs Conversion Time/333ksps Throughput
(MAX122)
Low Noise and Distortion:
70dB (min) SINAD
-77dB (max) THD (MAX122)
Low Power Dissipation: 210mW
Separate Track/Hold Control Input
Continuous-Conversion Mode Available
±5V Input Range, Overvoltage Tolerant to ±15V
24-Pin Narrow DIP, Wide SO, and SSOP Packages
19-0030; Rev 1; 3/12
+Denotes a lead(Pb)-free/RoHS-compliant package.
PART TEMP RANGE PIN-
PACKAGE
INL
(LSB)
MAX120CNG+ 0°C to +70°C 24 PDIP ±1
MAX120CWG+ 0°C to +70°C 24 Wide SO ±1
MAX120CAG+ 0°C to +70°C 24 SSOP ±1
MAX120ENG+ -40°C to +85°C 24 PDIP ±1
MAX120EWG+ -40°C to +85°C 24 Wide SO ±1
V
DD
AIN CLKIN
1
2
24
23
MODE
V
SS
CS
INT/BUSY
RD
PDIP/SO/SSOP
TOP VIEW
3
4
22
21
D11
D10 D2
5
6
20
19
V
REF
AGND D0
D1
CONVST
7
8
18
17
D9 D39 16
D8 D4
10 15
D7 D5
11 14
DGND D6
12 13
MAX120
MAX122
+
MAX120/MAX122 500ksps, 12-Bit ADCs with Track/Hold
and Reference
Pin Conguration
Functional Diagram
Ordering Information
VDD to DGND .......................................................... -0.3V to +6V
VSS to DGND ........................................................+0.3V to -17V
AIN to AGND .......................................................................±15V
AGND to DGND .................................................................±0.3V
Digital Inputs/Outputs to DGND ....................-0.3V to (V + 0.3V)
Continuous Power Dissipation (TA = +70°C)
Narrow PDIP (derate 13.33mW/°C above +70°C) ....1067mW
SO (derate 11.76mW/°C above +70°C) ......................941mW
SSOP (derate 8.00mW/°C above +70°C) ...................640mW
Narrow CDIP (derate 12.50mW/°C above +70°C) ....1000mW
Operating Temperature Ranges
MAX12_C ...........................................................0°C to +70°C
MAX12_E_ .................................................... -40°C to +85°C
MAX12_MRG .............................................. -55°C to +125°C
Storage Temperature Range ..............................-65°C to+160°C
Lead Temperature (soldering, 10s) .................................+300°C
Soldering Temperature (reflow) ....................................... +260°C
(VDD = +4.75V to +5.25V, VSS = -10.8V to -15.75V, fCLK = 8MHz for MAX120 and 5MHz for MAX122, TA = TMIN to TMAX, unless
otherwise noted.)
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
ACCURACY
Resolution RES 12 Bits
Differential Nonlinearity (Note 1) DNL
12-bit no missing
codes over
temperature range
MAX122AC/AE ±3/4
LSB
MAX120C/E,
MAX122BC/BE ±1
11-bit no missing
codes over
temperature range
MAX120M ±2
Integral Nonlinearity
(Note 1) INL
MAX122AC/AE ±3/4
LSB
MAX120C/E,
MAX122BC/BE ±1
Bipolar Zero Error (Note 1)
Code 00..00 to 00..01 transition,
near VAIN = 0V ±3 LSB
Temperature drift ±0.005
LSB/”C
Full-Scale Error (Notes 1, 2) Including reference; adjusted for bipolar
zero error; TA = +25°C ±8 LSB
Full-Scale Temperature Drift Excluding reference ±1
ppm/”C
Power-Supply Rejection Ratio
(Change in FS)
(Note 3)
PSRR
VDD only, 5V ±5% ±1/4 ±3/4
LSBVSS only, -12V ±10% ±1/4 ±1
VSS only, -15V ±5% ±1/4 ±1
ANALOG INPUT
Input Range -5 +5 V
Input Current VAIN = +5V (approximately 6kΩ to REF) 2.5 mA
Input Capacitance (Note 4) 10 pF
Full-Power Input Bandwidth 1.5 MHz
REFERENCE
Output Voltage No external load, VAIN = 5V, TA = +25°C -5 02 -4.98 V
External Load Regulation 0mA < ISINK < 5mA, VAIN = 0V 5 mV
Temperature Drift (Note 5) MAX12_C/E ±25
ppm/°C
MAX120/MAX122 500ksps, 12-Bit ADCs with Track/Hold
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Absolute Maximum Ratings
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these
or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
Electrical Characteristics
(VDD = +4.75V to +5.25V, VSS = -10.8V to -15.75V, fCLK = 8MHz for MAX120 and 5MHz for MAX122, TA = TMIN to TMAX, unless
otherwise noted.)
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
DYNAMIC PERFORMANCE (MAX120: fS = 500kHz, VAIN = ±5VP-P, 100kHz: MAX122: fS = 333kHz, VAIN = ±5VP-P, 50kHz
Signal-to-Noise Plus Distortion SINAD TA = +25°C
MAX120, MAX122 70 72
dBMAX122AC/AE 70
MAX122BC/BE 69
Total Harmonic Distortion
(First Five Harmonics) THD
TA = +25°C MAX120 -82 -77
dB
MAX122 -85 -78
MAX122AC/AE -77
MAX122BC/BE -75
Spurious-Free Dynamic Range SFDR
TA = +25°C MAX120 77 82
dB
MAX122 78 85
MAX122AC/AE 77
MAX122BC/BE 75
CONVERSION TIME
Synchronous tCONV 13tCLK
MAX120 1.63 µs
MAX122 2.60
Clock Frequency fCLK
MAX120 0.1 8 MHz
MAX122 0.1 5
DIGITAL INPUTS (CLKIN, CONVST, RD, CS)
Input High Voltage VIH 2.4 V
Input Low Voltage VIL 0.8 V
Input Capacitance (Note 4) 10 pF
Input Current VIN = 0V or VDD ±5 µA
DIGITAL OUTPUTS (INT/BUSY, D11–D0)
Output Low Voltage VOL ISINK = 1.6mA 0.4 V
Output High Voltage VOH ISOURCE = 1mA VDD - 0.5 V
Leakage Current ILKG VIN = 0V or VDD, D11–D0 ±5 µA
Output Capacitance (Note 4) 10 pF
POWER REQUIREMENTS
Positive Supply Voltage VDD Guaranteed by supply rejection test 4.75 5.25 V
Negative Supply Voltage VSS Guaranteed by supply rejection test -10.80 -15.75 V
Positive Supply Current (Note 6) IDD VDD = 5.25V, VSS = -15.75V, VAIN = 0V 9 15 mA
Negative Supply Current (Note 6) ISS VDD = 5.25V, VSS = -15.75V, VAIN = 0V 14 20 mA
Power Dissipation (Note 6) VDD = 5V, VSS = -12V, VAIN = 0V 210 315 mW
MAX120/MAX122 500ksps, 12-Bit ADCs with Track/Hold
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Electrical Characteristics (continued)
Note 1: These tests are performed at VDD = 5V, VSS = -15V. Operation over supply is guaranteed by supply rejection tests.
Note 2: Ideal full-scale transition is at +5V - 3/2 LSB = +4.9963V, adjusted for offset error.
Note 3: Supply rejection defined as change in full-scale transition voltage with the specified change in supply voltage = (FS at nomi-
nal supply)- (FS at nominal supply ± tolerance), expressed in LSBs.
Note 4: For design guidance only, not tested.
Note 5: Temperature drift is defined as the change in output voltage from +25°C to TMIN or TMAX. It is calculated as TC = ΔVREF/
VREF/(ΔT).
Note 6: VCS = VRD = VCONVST = 0V, VMODE = 5V.
Note 7: Control inputs specified with tr = tf = 5ns ( 10% to 90% of +5V) and timed from a 1.6V voltage level. Output delays are
measured to +0.8V if going low, or +2.4V if going high. For bus-relinquish time, a change of 0.5V is measured. See Figures
1 and 2 for load circuits.
Note 8: For design guidance only, not tested.
(VDD = +5V, VSS = -12V to -15V, 100% tested, TA = TMIN to TMAX, unless otherwise noted.) (Note 7)
PARAMETER SYMBOL CONDITIONS TA = +25°C MAX12_C/E UNITS
MIN TYP MAX MIN TYP MAX
CS to RD Setup Time tCS 0 0 ns
CS to RD Hold Time tCH 0 0 ns
CONVST Pulse Width tCW 30 30 ns
RD Pulse Width tRW tDA tDA ns
Data-Access Time tDA CL = 100pF 40 75 100 ns
Bus-Relinquish Time tDH 30 50 65 ns
RD or CONVST to BUSY tB0 CL = 50pF 30 75 100 ns
CLKIN to BUSY or INT tB1 CL = 50pF 70 110 150 ns
CLKIN to BUSY Low tB2 In mode 5 45 90 120 ns
RD to INT High tIH CL = 50pF 30 50 75 ns
BUSY or INT to Data Valid tBD
CL (Data) = 100pF,
CL (INT, BUSY) = 50pF 20 30 ns
Acquisition Time (Note 8) tACQ 350 350 ns
Aperture Delay (Note 8) tAP 10 ns
Aperture Jitter (Note 8) 30 ps
PIN NAME FUNCTION
1 MODE
Mode Input. Hardwire to set operational mode.
VDD: Single conversion, INT Output
OPEN: Single conversion, BUSY Output
DGND: Continuous conversions, BUSY Output
2 VSS Negative Power Supply, -12V or -15V
3 VDD Positive Power Supply, +5V
4 AIN Sampling Analog Input, ±5V bipolar input range
5 VREF -5V Reference Output. Bypass to AGND with 22µF || 0.1µF.
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Timing Characteristics
Pin Description
Detailed Description
ADC Operation
The MAX120/MAX122 use successive approximation and
input T/H circuitry to convert an analog signal to a series
of 12-bit digital-output codes. The control logic interfaces
easily to most µPs, requiring only a few passive compo-
nents tor most applications. The T/H does not require an
external capacitor. Figure 3 shows the MAX120/MAX122
in the simplest operational configuration.
Analog Input Track/Hold
Figure 4 shows the equivalent input circuit, illustrating the
sampling architecture of the ADC’s analog comparator.
An internal buffer charges the hold capacitor to minimize
the required acquisition time between conversions. The
analog input appears as a 6kΩ resistor in parallel with a
10pF capacitor.
Between conversions, the buffer input is connected to AIN
through the input resistance. When a conversion starts,
the buffer input disconnects from AIN, thus sampling the
input. At the end of the conversion, the buffer input recon-
nects to AIN, and the hold capacitor once again charges
to the input voltage.
The T/H is in tracking mode whenever a conversion is
NOT in progress. Hold mode starts approximately 10ns
after a conversion is initiated. Variation in this delay from
one conversion to the next (aperture jitter) is typically
30ps. Figures 7 through 11 detail the T/H mode and inter-
face timing for the various interface modes.
Figure 1. Load Circuits for Access Time
Figure 2. Load Circuits for Bus-Relinquish Time
PIN NAME FUNCTION
6 AGND Analog Ground
7–11, 13–19 D11–D0 Three-State Data Outputs D11 (MSB) to D0 (LSB)
12 DGND Digital Ground
20 CONVST Convert Start Input. Initiates conversions on its falling edge.
21 CLKIN Clock Input. Drive with TTL-compatible clock from 0.1MHz to 8MHz (MAX120), 0.1MHz to 5MHz
(MAX122)
22 INT/BUSY
Interrupt or Busy Output. Indicates converter status. If MODE is connected to VDD, congure
for an INT output. If MODE is open or connected to DGND, congure for a BUSY output. See
operational diagrams.
23 CS Chip-Select Input, Active-Low. When RD is low, enables the three-state outputs. If CONVST and
RD are low, a conversion is initiated on the falling edge of CS.
24 RD Read Input, Active-Low. When CS is low, RD enables the three-state outputs. If CONVST and CS
are low, conversion is initiated on the falling egde of RD.
MAX120/MAX122 500ksps, 12-Bit ADCs with Track/Hold
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Pin Description (continued)
Internal Reference
The MAX120/MAX122 -5.00V buried-zener reference
biases the internal DAC. The reference output is available
at the VREF pin and must be bypassed to the AGND pin
with a 0.1µF ceramic capacitor in parallel with a 22µF or
greater electrolytic capacitor. The electrolytic capacitor’s
equivalent series resistance (ESR) must be 100mΩ or
less to properly compensate the reference output buffer.
Sanyo’s organic semiconductor works well.
Sanyo Video Components (USA)
Phone: (619) 661-6835 FAX: (619) 661-1055
Sanyo Electric Company, LTD. (Japan)
Phone: 0720-70-1005 FAX: 0720-70-1174
Sanyo Fisher Vertriebs GmbH (Germany)
Phone: 06102-27041, ext. 44 FAX: 06102-27045
Proper bypassing minimizes reference noise and main-
tains a low impedance at high frequencies. The internal
reference output buffer can sink up to a 5mA external load.
An external reference voltage can be used to overdrive
the MAX120/MAX122’s internal reference if it ranges from
-5.05V to -5.10V and is capable of sinking a minimum
of 5mA. The external VREF bypass capacitors are still
required.
Digital Interlace
External Clock
The MAX120/MAX122 require a TTL-compatible clock
for proper operation. The MAX120 accepts clocks in
the 0.1MHz to 8MHz frequency range when operating
in modes 1–4 (see the Operating Modes section). The
maximum clock frequency is limited to 6MHz when oper-
ating in mode 5. The MAX122 requires a 0.1MHz to 5MHz
clock for operation in all five modes. The minimum clock
frequency for both the MAX120 and MAX122 is limited to
0.1MHz, due to the T/H’s droop rate.
Clock and Control Synchronization
The clock and convert start inputs (CONVST or RD and
CS, see the Operating Modes section) are not synchro-
nized, the conversion time can vary from 13 to 14 clock
cycles. The successive approximation register (SAR)
always changes state on the CLKIN input’s rising edge.
To ensure a fixed conversion time, see Figure 5 and the
following guidelines.
For a conversion time of 13 clock cycles, the convert start
input(s) should go low at least 50ns before CLKIN’s next
rising edge. For a conversion time of 14 clock cycles,
the convert start input(s) should go low within 10ns of
CLKIN’s next rising edge. If the convert start input(s) go
low from 10ns to 50ns before CLKIN’s next rising edge,
the number of clock cycles required is undefined and can
be either 13 or 14. For best analog performance, synchro-
nize the convert start inputs with the clock input.
Figure 4. Equivalent Input Circuit
Figure 3. MAX120/MAX122 in the Simplest Operational Mode
(Continuous Conversion)
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Output Data Format
The conversion result is output on a 12-bit data bus with
a 75ns data-access time. The output data format is twos-
complement. Three input control signals (CS, RD, and
CONVST), the INT/BUSY converter status output, and the
12 bits of output data can interface directly to a 16-bit data
bus. See Figure 6 for data-access timing.
Timing and Control
The MAX120/MAX122 have five operational modes as
outlined in Figures 7 to 11 and discussed in the Operating
Modes section.
Full-control mode (mode 1) provides maximum control to
the user for convert start and data-read operations.
Full-control mode is for µPs with or without wait-state
capability. Stand-alone mode (mode 2) and continuous-
conversion mode (mode 5) are for systems without µPs,
or for µP-based systems where the ADC and the µP are
linked through first-in, first-out (FIFO) buffers or direct
memory access (DMA) ports. Slow-memory mode (mode
3) is intended for µPs that can be forced into a wait state
during the ADC’s conversion time. ROM mode (mode 4) is
for µPs that cannot be forced into a wait state.
In all five operating modes, the start of a conversion is
controlled by one of three digital inputs: CONVST, RD, or
CS. Figure 12 shows the logic equivalent for the conver-
sion circuitry. In any operating mode, CONVST must be
low for a conversion to occur. Once the conversion is in
progress, it cannot be restarted.
Read operations are controlled by RD and CS. Both of
these digital inputs must be low to read output data. The
INT/BUSY output indicates the converter’s status and
determines when the data from the most recent conver-
sion is available. The MODE input configures the INT/
BUSY output as follows:
If MODE = VDD, INT/BUSY functions as an
INTERRUPT output. In this configuration, INT/BUSY
goes low when the conversion is complete and returns
high after the conversion data has been read.
If MODE is left open or tied to DGND, INT/BUSY
functions as a BUSY output. In this case, INT/BUSY
goes low at the start of a conversion and remains low
until the conversion is complete and the data is avail-
able at D0–D11.
Figure 5. Clock and Control Synchronization
Figure 7. Full-Control Mode (Mode 1)
Figure 6. Data-Access and Bus-Relinquish Timing
MAX120/MAX122 500ksps, 12-Bit ADCs with Track/Hold
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Initialization After Power-Up
On power-up, the first MAX120/MAX122 conversion is
valid if the following conditions are met:
1) Allow 14 clock cycles for the internal T/H to enter the
track mode, plus a minimum of 350ns in the track
mode for the data-acquisition time.
2) Make sure the reference voltage has settled. Allow
0.5ms for each 1µF of reference bypass capacitance
(11ms for a 22µF capacitor).
Operating Modes
Mode 1: (Full-Control Mode)
Figure 7 shows the timing diagram for full-control mode
(mode 1). In this mode, the µP controls the conversion-
start and data-read operations independently.
A falling edge on CONVST places the T/H into hold mode
and starts a conversion in the SAR. The conversion is
complete in 13 or 14 clock cycles as discussed in the
Clock and Control Synchronization section. A change in
the INT/BUSY output state signals the end of a conver-
sion as follows:
If MODE = VDD, the end of conversion is signaled by the
INT/BUSY output falling edge.
If MODE = OPEN or DGND, the INT/BUSY output goes
low while the conversion is in progress and returns high
when the conversion is complete.
When the conversion is complete, the data can be read
without initiating a new conversion by pulling RD and CS
low and leaving CONVST high. To start a new conversion
without reading data, RD and CS should remain high
while CONVST is driven low. To simultaneous read data
and initiate a new conversion, CONVST, RD, and CS
should all be pulled low. Note: Allow at least 350ns for
T/H acquisition time between the end of one conversion
and the beginning of the next.
Mode 2: Stand-Alone Operation
(MODE= OPEN, RD = CS = DGND)
For systems that do not use or require full-bus interfac-
ing, the MAX120/MAX122 can be operated in stand-alone
mode directly linked to memory through DMA ports or a
FIFO buffer. In stand-alone mode, a conversion is initi-
ated by a falling edge on CONVST. The data outputs are
always enabled; data changes at the end of a conversion
as indicated by a rising edge on INT/BUSY. See Figure 8
for stand-alone mode timing.
Mode 3: Slow-Memory Mode
(CONVST = GND, MODE= OPEN)
Taking RD and CS lo laces the T/H into hold mode and
starts a conversion. INT/BUSY remains low while the
conversion is in progress and can be used as a wait input
to the µP. Data from the previous conversion appears on
the data bus until the conversion end is indicated by INT/
BUSY. See Figure 9 for slow-memory mode timing.
Figure 8. Stand-Alone Mode (Mode 2) Figure 9. Slow-Memory Mode (Mode 3)
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Mode 4: ROM Mode
(MODE = OPEN, CONVST = GND)
In ROM mode, the MAX120/MAX122 behave like a fast-
access memory location avoid placing the µP into a wait
state. Pulling RD and CS low places the T/H in hold mode,
starts a conversion, and reads data from the previous
conversion. Data from the first read in a sequence is often
disregarded when this interface mode is used. A second
read operation accesses the first conversion’s result and
also starts a new conversion. The time between succes-
sive read operations must be longer than the sum of the
T/H acquisition time and the MAX120/MAX122 conver-
sion time. See Figure 10 for ROM-mode timing.
Mode 5: Continuous-Conversion Mode
(CONVST = RD = CS = MODE = GND)
For systems that do not use or require full-bus interfacing,
the MAX120/MAX122 can operate in continuous-conver-
sion mode, directly linked to memory through DMA ports
or a FIFO buffer. In this mode, conversions are performed
continuously at the rate of one conversion for every 14
clock cycles, which includes 2 clock cycles for the T/H
acquisition time. To satisfy the 350ns minimum acquisi-
tion time requirement within 2 clock cycles, the MAX120’s
maximum clock frequency is 6MHz when operating in
mode 5.
The data outputs are always enabled and “new” disap-
pears on the output bus at the end of a conversion as
indicated by the INT/BUSY output rising edge. The MODE
input should be hard-wired to GND. Pulling CS, RD,
or CONVST high stops conversions. See Figure 11 for
continuous-conversion mode timing.
Applications Information
Using FIFO Buffers
Using FIFO memory to buffer blocks of data from the
MAX120 reduces µP interrupt overhead time by enabling
the µP to process data while the MAX120, unassisted,
writes conversion results to the FIFO. To retrieve a block
of data, the µP reads from the FIFO via a read-interrupt
cycle. Read and write operations for the FIFO are com-
pletely asynchronous. Figure 13 shows the MAX120
operating in continuous-conversion mode (mode 5),writ-
ing data directly into the two IDT7200 256 x 9 FIFO buf-
fers at the rate of 428ksps. The µP is interrupted to read
the accumulated data by the FIFO’s half-full (HF) flag
approximately three times per millisecond. For operation
at 500ksps, use an 8MHz clock, and pulse CONVST at
500kHz. The full flag (FF) indicates that the FIFO is full.
If this flag is ignored, data may be lost. If necessary, con-
versions can be inhibited by pulling CS, RD, or CONVST
high. The FIFO’s read cycle times are as fast as 15ns,
satisfying most system speed requirements. The RESET
input resets all data in the FIFO to zero.
For synchronous operation, the CONVST pin may be
used to initiate conversions, as described in the Operating
Modes section (Mode 2: Stand-Alone Operation).
Figure 10. ROM Mode (Mode 4)
Figure 11. Continuous-Conversion Mode (Mode 5)
Figure 12. Conversion-Control Logic
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Digital-Bus Noise
If the ADC’s data bus is active during a conversion,
coupling from the data pins to the ADC comparator can
cause errors. Using slow-memory mode (mode 3) avoids
this problem by placing the µP in a wait state during the
conversion. If the data bus is active during the conversion
in either mode 1 or 4, use three-state drivers to isolate the
bus from the ADC.
In ROM mode (mode 4), considerable digital noise is
generated in the ADC when RD or CS go high, disabling
the output buffers after a conversion is started. This noise
can cause errors if it occurs at the same instant the SAR
latches a comparator decision. To avoid this problem, RD
and CS should be active for less than 1 clock cycle. If
this is not possible, RD or CS should go high coinciding
with CLKIN’s falling edge, since the comparator output is
always latched at CLKIN’s rising edge
Layout, Grounding, and Bypassing
For best system performance, use PCBs with separate
analog and digital ground planes. Wire wrap boards are
not recommended. The two ground planes should be tied
together at the low-impedance power-supply source, as
shown in Figure 14.
The board layout should ensure that digital and analog
signal lines are kept separate from each other as much as
possible. Do not run analog and digital (especially clock)
lines parallel to one another.
The ADC’s high-speed comparator is sensitive to high-
frequency noise in the VDD and VSS power supplies.
Bypass these supplies to the analog ground plane with
0.1µF and 10µF bypass capacitors. Minimize capacitor
lead lengths for best noise rejection. If the +5V power
supply is very noisy, connect a 5Ω resistor, as shown in
Figure 14. Figure 15 shows the negative power-supply
(VSS) rejection vs. frequency. Figure 16 shows the posi-
tive power-supply (VDD) rejection vs. frequency, with and
without the optional 5Ω resistor.
Figure 13. Using MAX120 with FIFO Memory
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Gain and Offset Adjustment
Figure 17 plots the bipolar input/output transfer func-
tion for the MAX120/MAX122. Code transitions occur
halfway between successive integer LSB values. Output
coding is two’s-complement binary with 1 LSB = 2.44mV
(10V/4096).
In applications where gain (full-scale range) adjustment
is required, Figure 18’s circuit can be used. If both offset
and gain (full-scale range) need adjustment, either of the
circuits in Figures 19 and 20 can be used. Offset should
be adjusted before gain for either of these circuits.
To adjust bipolar offset with Figure 19’s circuit, apply +1/2
LSB (0.61mV) to the noninverting amplifier input and
adjust R4 for output-code flicker between 0000 and 0000
0000 0001. For full scale, apply FS - the output code flick-
ers between 0111 1111 1110 and 0111 1111 1111. There
may be some interaction between these adjustments. The
MAX120/MAX122 transfer function used in conjunction
with Figure 19’s circuit is the same as Figure 17, except
the full-scale range is reduced to 2.5V.
To adjust bipolar offset with Figure 20’s circuit, apply
-1/2 LSB (-1.22mV) at VIN and adjust R5 for output-code
flicker between 0000 0000 0000 and 0000 0000 0001. For
gain adjustment, apply -FS + ½ LSB (-4.9951V) at VIN
and adjust R1 so the output code flickers between 0111
1111 1110 and 0111 1111 1111. As with Figure 20’s circuit,
the offset and gain adjustments may interact. Figure 21
plots the transfer function for Figure 20’s circuit.
Dynamic Performance
High-speed sampling capability and 500ksps throughput
(333ksps for the MAX122) make the MAX120/MAX122
ideal for wideband-signal processing. To support these
and other related applications, fast fourier transform (FFT)
test techniques are used to guarantee the ADC’s dynamic
frequency response, distortion, and noise at the rated
throughput. Specifically, this involves applying a low-
distortion sine wave to the ADC input and recording the
digital conversion results for a specified time. The data is
then analyzed using an FFT algorithm, which determines
its spectral content.
Figure 14. Power-Supply Grounding
Figure 15. VSS Power-Supply Rejection vs. Frequency
Figure 16. VDD Power-Supply Rejection vs. Frequency
MAX120/MAX122 500ksps, 12-Bit ADCs with Track/Hold
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ADCs have traditionally been evaluated by specifications
such as zero and full-scale error, integral nonlinearity
(INL), and differential nonlinearity (DNL). Such parame
ters are widely accepted for specifying performance with
DC and slowly varying signals, but are less useful in
signal processing applications where the ADC’s impact
on the system transfer function is the main concern. The
sig nificance of various DC errors does not translate well
to the dynamic case, so different tests are required.
Signal-to-Noise Ratio and
Effective Number of Bits
The signal-to-noise plus distortion ratio (SINAD) is the
ratio of the fundamental input frequency’s RMS amplitude
to the RMS amplitude of all other ADC output signals. The
output band is limited to frequencies above DC and below
one-half the ADC sample rate.
The theoretical minimum ADC noise is caused by quanti-
zation error and is a direct result of the ADC’s resolution:
SNR = (6.02N + 1.76)dB, where N is the number of bits
of resolution. A perfect 12-bit ADC can, therefore, do no
better than 74dB. An FFT plot shows the output level in
various spectral bands. Figure 22 shows the result of
sampling a pure 100kHz sinusoid at a 500ksps rate with
the MAX120.
By transposing the equation that converts resolution to
SNR, we can, from the measured SINAD, determine the
effective resolution (or effective number of bits) the ADC
provides: N = (SINAD - 1.76)/6.02. Figure 22 shows the
effective number of bits as a function of the input fre-
quency for the MAX120. The MAX122 performs similarly.
Figure 17. Bipolar Transfer Function
Figure 18. Trim Circuit for Gain Only
Figure 19. Offset and Gain Adjustment (Noninverting)
Figure 19. Offset and Gain Adjustment (Noninverting)
MAX120/MAX122 500ksps, 12-Bit ADCs with Track/Hold
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Total Harmonic Distortion
If a pure sine wave is sampled by an ADC at greater than
the Nyquist frequency, the nonlinearities in the ADC’s
transfer function create harmonics of the input frequency
in the sampled output data.
Total harmonic distortion (THD) is the ratio of the RMS
sum of all harmonics (in the frequency band above DC
and below one-half the sample rate, but not including the
DC component) to the RMS amplitude of the fundamental
frequency. This is expressed as follows:
222 2
234 N
1
V V V ... V
THD 20log V
++ +
=
where V1 is the fundamental RMS amplitude, and V2 to
VN are the amplitudes of the 2nd through Nth harmonics.
The THD specification in the Electrical Characteristics
table includes the 2nd through 5th harmonics.
lntermodulation Distortion
If the ADC input signal consists of more than one spec-
tral component, the ADC transfer function nonlinearities
produce intermodulation distortion (IMD) in addition to
THD. IMD is the change in one sinusoidal input caused
by the presence of another sinusoidal input at a different
frequency
If two pure sine waves of frequency fa and fb are applied
to the ADC input, nonlinearities in the ADC transfer func-
tion create distortion products at sum and difference
frequencies of mfa ± nfb, where m and n = 0, 1, 2, 3, etc.
THD includes those distortion products with m or n equal
to zero. lntermodulation distortion consists of all distor-
tion products for which neither m nor n equal zero. For
example, the 2nd-order IMD terms include (fa + fb) and
(fa - fb) while the 3rd-order IMD terms include (2fa + fb),
(2fa - fb) , (fa + 2fb), and (fa - 2fb).
If the two input sine waves are equal in magnitude, the
value (in decibels) of the 2nd-order IMD products can be
expressed by the following formula:
amplitude at (fa fb)
IMD (fa fb) 20log amplitude at fa

±
±=


Figure 21. Inverting Bipolar Transfer Function
Figure 22. MAX120 FFT Plot
Figure 23. Effective Bits vs. Input Frequency
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Spurious-Free Dynamic Range
Spurious-free dynamic range is the ratio of the fundamen-
tal RMS amplitude to the amplitude of the next largest
spectral component (in the frequency band above DC and
below one-half the sample rate). Usually the next largest
spectral component occurs at some harmonic of the input
frequency. However, if the ADC is exceptionally linear, it
may occur only at a random peak in the ADC’s noise floor.
+Denotes a lead(Pb)-free/RoHS-compliant package.
MAX120 EV kit can be used to evaluate the MAX122; when
ordering the EV kit, ask for a free sample of the MAX122.
-Denotes a package containing lead(Pb).
PART TEMP RANGE PIN-
PACKAGE
INL
(LSB)
MAX120EAG+ -40°C to +85°C 24 SSOP ±1
MAX122ACNG+ 0°C to +70°C 24 PDIP ±3/4
MAX122BCNG+ 0°C to +70°C 24 PDIP ±1
MAX122ACWG+ 0°C to +70°C 24 Wide SO ±3/4
MAX122BCWG+ 0°C to +70°C 24 Wide SO ±1
MAX122ACAG+ 0°C to +70°C 24 SSOP ±3/4
MAX122BCAG+ 0°C to +70°C 24 SSOP ±1
MAX122AENG+ -40°C to +85°C 24 PDIP ±3/4
MAX122BENG+ -40°C to +85°C 24 PDIP ±1
MAX122AEWG+ -40°C to +85°C 24 Wide SO ±3/4
MAX122BEWG+ -40°C to +85°C 24 Wide SO ±1
MAX122AEAG+ -40°C to +85°C 24 SSOP ±3/4
MAX122BEAG+ -40°C to +85°C 24 SSOP ±1
MAX122BMRG- -55°C to +125°C 24 CERDIP ±1
MAX120EVKIT-DIP0°C to +70°C PDIP – Through Hole
PACKAGE
TYPE
PACKAGE
CODE
OUTLINE
NO.
LAND
PATTERN NO.
24 CDIP R24-4 21-0045
24 PDIP N24+3 21-0043
24 SO W24+2 21-0042 90-0182
24 SSOP A24+2 21-0056 90-0110
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14
Package Information
For the latest package outline information and land patterns
(footprints), go to www.maximintegrated.com/packages. Note
that a “+”, “#”, or “-” in the package code indicates RoHS status
only. Package drawings may show a different suffix character, but
the drawing pertains to the package regardless of RoHS status.
Chip Information
PROCESS: BiCMOS
Ordering Information (continued)
REVISION
NUMBER
REVISION
DATE DESCRIPTION PAGES
CHANGED
0 9/92 Initial release
1 3/12 Removed PDIP, CERDIP packages from Ordering Information. Updated style
throughout data sheet. 1–16
Revision History
Maxim Integrated cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim Integrated product. No circuit patent licenses
are implied. Maxim Integrated reserves the right to change the circuitry and specications without notice at any time. The parametric values (min and max limits)
shown in the Electrical Characteristics table are guaranteed. Other parametric values quoted in this data sheet are provided for guidance.
Maxim Integrated and the Maxim Integrated logo are trademarks of Maxim Integrated Products, Inc.
MAX120/MAX122 500ksps, 12-Bit ADCs with Track/Hold
and Reference
© 2012 Maxim Integrated Products, Inc.
15
For pricing, delivery, and ordering information, please contact Maxim Direct at 1-888-629-4642, or visit Maxim Integrated’s website at www.maximintegrated.com.