MIL SPECS T J oooo1es oooon3 y , MIL-S-19500/102A 29 December 1966 ' SUPERSEDING MIL-S-19500/102(NAVY) 19 July 1962 (See 6.2) MILITARY SPECIFICATION SEMICONDUCTOR DEVICE, TRANSISTORS, NPN, SILICON, HIGH-POWER TYPES 2N1016B, 2N1016C, AND 2N1016D This specification is mandatory for use by all Depart- ments and Agencies of the Department of Defense. 1. SCOPE 1,1 Scope. This specification covers the detail requirements for a high-power, NPN, silicon transistor. 1.2 Physical dimensions. See figure 1. 1,3 Maximum ratings, Pol/ CH Type T= 45 | CBO | YeBo | Ycx0| Io Tetg | Ty w vac | yde | vde | ade | cc [2 2N1016B 150 100 25 100 | 7.5 | -65 to +150) +150 2N1016C 150 150 25 150 | 7.5 | -65 to +150| +150 2N1016D 150 200 25 200 | 7.5 | -65 to +150) +150 2/ Derate linearly 1,428 W/ C for To > 45C. 1.4 Primary electrical characteristics. hFE hFE hfe Vor(sat) fhte fc = 20 Ap Ig= 5.0 Ade {I= 5.0 Ade |Iq = 5.0 Ade |1, = 5.0 Ade 65-c ; VcE = 4.0 Vou = 4.0 Vde | Vog = 4.0 Vde | Ip = 1.0 Ade | Vog = 4.0 Vde Vde kec_ C/W Min. 20 10 5 --- 20 Max, 80 35 --- 2.5 --- 0.7 2, APPLICABLE DOCUMENTS 2.1 The following documents, of the issue in effect on date of invitation for bids or request for proposal, form a part of the specification to the extent specified herein. FSC 5961 Tis pocument contains (|__ paces.MIL SPECS Ici go001e5 Oo00b5e2 & i MIL-S-19500/1024 SPECIFICATION MILITARY MIL-S-19500 - Semiconductor Devices, General Specification for, STANDARDS MILITARY MIL-STD-202 - Test Methods for Electronic and Electrical Component Parts. MIL-STD-750 - Test Methods for Semiconductor Devices. (Copies of specifications, standards, drawings, and publications required by suppliers in connection with specific procurement functions should be obtained from the procuring activity or as directed by the contracting officer, ) 2.2 Other publications. The following document forms a part of this specification to the extent specified herein. Unless otherwise indicated, the issue in effect on date of invitation for bids or request for proposal shall apply. NATIONAL BUREAU OF STANDARDS Handbook H28 - Screw-Thread Standards for Federal services. (Application for copies should be addressed to the Superintendent of Documents, Government Printing Office, Washington, D. C, 20402.) 3. REQUIREMENTS 3.1 General. Requirements shall be in accordance with MIL-S-19500, and as specified herein. 3.2 Abbreviations, symbols, and definitions, The abbreviations, symbols, and definitions used herein are defined in MIL-S-19500. 8.3 Design, construction, and physical dimensions, Transistors shall be of the design, construction, and physical dimensions shown on figure 1. 8.4 Performance characteristics. Performance characteristics shall be as specified in tables I, I and Il. . 3 3.5 Marking. The following marking specified in MIL-S-19500 may be omitted from the body of the transistor at the option of the manufacturer: (a) Country of origin. (b) Manufacturer's identification. . 4, QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection, Sampling and inspection shall be in accordance with MIL-S-19500, and as specified herein. 4,2 Qualification inspection. Qualification inspection shall consist of the examinations and tests specified in tables I, 0, and I. 4.3 Quality conformance inspection, Quality conformance inspection shall consist of groups A, B, and C inspections,MIL SPECS rc coco1es 000693 a f MIL-S-19500/102A SEATING / PLANE D | 4{/f (SEE NOTE 9~/ > R, DIA(HOLE ORIENTATION UNDEFINED) with metric Ltr | equivalents (mm) in parentheses | Notes (see note 2) Minimum 1.28 COLLECTOR (SEE NOTE 6) ol Me | NOTES: 1. Dimensions are in inches. 2, Metric equivalents (to the nearest .01 mm) are given for general information only and are based upon 1 inch = 25.4 mm. . See NBS Handbook H28. 5/16 - 24 UNF-2A. . Two leads. Refexence point for temperature measurement. Collector shall be internally connected to the mounting Se. aon m ww os FIGURE 1. Outline dimensions of transistor types 2NIO16B, 2N1O16C and 2N1OL6D.MIL SPECS TC ff ooo012s dooowsy Tt i MIL-S-19500/102A 4,3.1 Group A inspection. Group A inspection shall consist of the examinations and tests specified in table I. : 4.3.2 Group B inspection. Group B inspection shall consist of the examinations and tests specified in table II, 4.3.3 Group C inspection, Group C inspection shall consist of the examinacions and tests specifiec in table Ii, This inspection shall be conducted on the initial lot and thereafter every 6 months during production. Uper failare of any rour sub, tps cr upem ceterminaticn by wne insrester 3 3 are RCL being met, ihe spector shail require let oy lot inerection for 6 minimum : - eitling ma Gr ate the fsiling aroup C subgrcurs. 4.3.4 Group B and group C life-test samples, Samples that have been subjected to group B, 340-hours life-test, may be continued on test for 1, 000-hours in order to satisfy group C life-test requirements, These samples shall be predesignated, and shall remain subjected to the group C 1, 000-hour acceptance evaiuation after they have passed the group B, 340-hour acceptance criteria, The cumulative total of failures found during 340-hour test and during the subsequent interval up to 1, 000 hours shall be com- puted for 1, 000 hour acceptance criteria, see 4, 3.3, > WOU . vests 4,4 Methods of examination and test. Methods of examination and test shall be as specified in tables I, If, and O. 4.4.1 Terminal strength (stud torque), Acceptance criteria after the stud torque test for external threaded parts (dimension "T" of figure 1) shall be in accordance with handbook H28. 4,4.2 Solderability. The solderability test shall apply to the two, lug-terminals only, The depth of immersion is to be within 1/4-inch of the seating plane. Acceptance criteria shall be that each termination is 95-percent covered by a continuous new solder coating to within 3/8-inch + 1/32-inch of the seating plane. TABLE I. Group A inspection. MIL-STD-750 L Limits Examination or test T Method Details P Symbol | Min | Max | Unit Subgroup 1 10 Visual and mechanical 2071 --- --- wn- | --- examination Subgroup 2 5 Breakdown voltage, 3011 | Bias cond. D; BVcEO collector to emitter Io = 200 mAdc 2N1016B 100 --- | Vdc 2N1016C 150 --- | Vde 2N1016D 200 --- | Vde Collector to emitter 3041 | Bias cond. A; IcEx cutoff current Vep = 1.5 Vde 2N1016B Ver = 100 Vde --- 1.0 | mAdc 2N1016C VCE = 150 Vdc --- 1.0 | mAdc 2N1016D Vcr = 200 Vdc -- 1.0 | mAdc Collector to base 3036 | Bias cond. D IcBo cutoff current 2N1016B Vcp = 100 Vde --- 1,0] mAdc 2N1016C Vop = 150 Vdc --- 1.0}; mAde 2N1016D Vop = 200 Vde --- 1.0] mAdecMIL SPECS icf 0000125 gooon4ss 4 I MIL-S-19500/102A TABLE I. Group A inspection - Continued MIL-STD-750 L Limits Examination or test T Method |. Details P| Symbol | Min | Max | Unit Subgroup 2 - Continued Emitter to base cutoff 3061 | Bias cond. D; Ippo --- 1.0 | mAdc current Vep = 25 Vde Forward-current transfer 3076 | Vog = 4 Vde; hpp 20 80 } --- ratio Ig = 2 Adc Forward-current transfer 3076 | Vopr = 4 Vde; hpp 10 35 j --- ratio Ic = 5 Ade Forward-current transfer 3076 Vog = 4 Vdc; hep 6 20 | --- ratio Ic = 7.5 Adc Smali-signal short-circuit 8206 | Vor = 4 Vdc; he, 5 w-- [| --- forward-current transfer Ic = 5 Ade ratio Small-signal short-circuit 3301 | Vop = 4 Vdc; fhte 20 --- | ke forward-current transfer - Iq = 5 Ade . ratio cutoff frequency Subgroup 3 5 Collector to emitter voltage 3071 | Ig = 5 Ade; Vop(sat)} --- 2.51 Vde (saturated) Ip = 1 Adc Base emitter voltage 3066 | Test cond. A; Ia = 5 Adc; Vpr(sat)) --- 4,0} Vde (saturated) Ip = 1 Adc Pulse response --- | Ig = 5 Adc; Vp = 6 Ve; tg + tp --- 10| usec CE = 12 Vde; Ipi and Ipe = 1.5 Adc (see figure 2) Pulse response --- | Ig = 5 Adc; Vep = 6 Vde; tg+ t --- 15] psec Vog = 12 Vde; Ipi and Ipg = 1.5 Ade (see figure 2) Subgroup 4 5 High-temperature operation: Tc = +150 +3C Emitter to base cutoff 3061 | Bias cond. D; Ippo --- 10} mAdc current Vp = 25 Vde Collector to emitter 3041 | Bias cond. A; IcEX cutoff current VEB = 1.5 Vde 2N1016B Vor = 100 Vde --- 10} mAde 2N1016C Vor = 150 Vde --- 10} mAd 2N1016D VoE = 200 Vde --- 10| mAdq Low-temperature operation: Tc = ~55 3C Forward-current transfer 3076 | Veg = 4 Vde; hpr 10 35] +-- ratio Ig = 5 AdeMIL SPECS cf oooo1es OOOOB9b 3 o MIL-S-19500/102A TABLE Il. Group B inspection L : MIL-STD-750 T Limits Examination or test p Method Details D Symbol {| Min Max | Unit Subgroup 1 . 20 Physical dimensions 2066 | (See figure 1) eo --- --- | --- Subgroup 2 15 Solderability 2026 | Omit aging (see 4. 4. 2) --- w-~ | wee | -He Thermal shock 1051 | Test cond. F --- --- --- | --- (temperature cycling) Thermal shock (glass strain)| 1056 | Test cond. A --- wan --- | --- Terminal strength (tension) 2036 | Test cond. A; weight = 5 lbs --- ~-- we- | --- + 1 02z.; application time = 15 sec. to each terminal Terminal strength (terminal 2036 | Test cond. D1; 7 --- --- | --- torque) torque = 5 oz. -in. to be applied to flat of each terminal for t = 15 sec. Terminal strength (stud 2036 | Test cond. D2; ane ~- -.-| --- torque) torque = 40 lb. -in. for = 15sec. (see 4.4.1) Seal (leak rate) --- | Method 112, MIL-STD-202, one --- [5x1077} atm test cond. C, procedure II; ce/sec test cond. A for gross leaks Moisture resistance 1021 | Omit initial conditioning --- --- ane | --- End points: Collector to emitter 3041 | Bias cond. A; Iorx cutoff current Ven= 1.5 Vde 2N1016B Vor = 100 Vde --- 1.0} mAdec 2N1016C Vog = 150 Vde o-- 1.0] mAdc 2N1016D Vog = 200 Vde --- 1.0} mAdc Collector to emitter 3071 | Ig = 5 Ade; Vor(sat} --- 2.5] Vde voltage (saturated) Ip = 1 Ade Forward-current transfer 3076 | Vop = 4 Vde; bpp 10 35] --- ratio Ic = 5 Ade Subgroup 3 15 Shock Nonoperating; 500 G; wee wee ---| --- for 1.0 msec; 5 blows in each orientation: X4, Yi, Yo, and Z Vibration fatigue 2046 | Nonoperating --- wee wen] ane Vibration, variable 2056 --- w--] --- frequency .MIL SPECS icf OO001e5 oooob4? I MIL-S-19500/102A TABLE I. Group B inspection - Continued L aod MIL-STD-750 Ty Limits Examination or test P Method Details D Symbol | Min Max | Unit Subgroup 3 ~ Continued Constant acceleration 2006 | 5000 G; in each orientation: --- woe w-- | --- X41, Yz, Yo, and Z4 End points; (Same as subgroup 2) Subgroup 4 15 Salt atmosphere (corrosion) 1041 --- woo nd End points: (Same as subgroup 2) Subgroup 5 10 High-temperature life 1031 | Tgtg = 150C; t = 340 hours --- ane | eee] eee (nonoperating) (se 4.3.4) End points: Collector to emitter 3041 {| Bias cond. A; IcEX cutoff current Vp = +1.5 Vde 2N1016B Vox = 100 Vde --- 2.0] mAdc 2N1016C VoR = 150 Vdc --- | 2.0] mAdc 2Ni016D Veg = 200 Vde --- 2.0] mAde Collector to emitter 3071 | Ig = 5 Ade; Vor(sat)}) --- | 2.5] Vde voltage (saturated) Ip = 1 Adc Forward-current transfer 3076 | Vor = 4 Vde; hrr 8 42) --- ratio Ic = 5 Ade Subgroup 6 10 Steady state operation life 1026 | Ta = + 100 C; --- w-- | wee] --- VB = 30 Vde; Ic = 2.39 Ade; t = 340 hrs (see 4.3.4) End points: (Same as subgroup 5)MIL SPECS cf oooo1es OOoOoL4s 7? az MIL-S-19500/102A TABLE fil. Group C inspection MIL-STD-750 t Limits Examination or test P Method , Details p | Symbol | Min | Max {| Unit Subgroup 1 15 Barometric pressure, 1001 | Normal mounting; --- a+ ---| -.- reduced (altitude operation) pressure = 8 mm Hg for 60 sec min. Measurement during test: Collector to base cutoff 3036 | Bias cond. D; Icpo current 2N1016B Vop = 100 Vde wee 1.0] mAdc 2N1016C Vop = 150 Vde oe 1.0] mAdec 2N1016D Vop = 200 Vde | o-. 1.0| mAde Thermal resistance, 3151 9 520 wee | 0.7] C/W junction to case Subgroup 2 A= 10 High-temperature life 1031 | Tgtg = +150C --- wee | nen] oe (nonoperating) (see 4.3.4) End points: (Same as subgroup 5 of Group B) Subgroup 3 r= 10 Steady state operation life 1026 | Tc = +100C; Vap = 30 --- w-- | ---] -+- vie; Tq = 2.39 Adc (see 4.3.4) End points: (Same as subgroup 5 of Group B) __!B! I 80 Cy He reLay C) c TO SCOPE 2 OHMS TO SCOPE SYNC 3 OHMS * NON-INDUCTIVE RESISTORS FIGURE 2. Switching-time test circuit,MIL SPECS cf oooo125 ooooL99 4 iy MIL-S-19500/102A 5. PREPARATION FOR DELIVERY 5.1 See MIL-S-19500, section 5. 6. NOTES 6.1 Notes. The notes specified in MIL-S-19500 are applicable to this specification. 6.2 Changes from previous issue. Asterisks are not used in this revision to identify changes with respect to the previous issue, due to the extensiveness of the changes. Custodians Preparing activity: Army - EL Navy - SH Navy - SH Air Force - li (Project 5961-0002-28) Review activities: Army - EL, MI, MU Navy - SH Air Force - 11, 17, 85 Code "C" User activities: Army - EL, SM Navy - CG, MC, AS, OS Air Force - 14, 19 U. 8S. GOVERNMENT PRINTING OF FICK. 1967-261-510/4168 2406