DATA SH EET
Product data sheet
Supersedes data of 1999 May 26 2003 Mar 25
DISCRETE SEMICONDUCTORS
BAT720
Schottky barrier diode
fpa
ge
M3D08
8
2003 Mar 25 2
NXP Semiconductors Product data sheet
Schottky barrier diode BAT720
FEATURES
Ultra high switching speed
Low forward vo lta ge
Guard ring protected
Small plastic SMD package.
APPLICATIONS
Ultra high-speed switching
Voltage clamping
Protection circuits.
DESCRIPTION
Planar Schottky barrier diode with an
integrated guard ring for stress
protection in a small SOT23 plastic
SMD package.
PINNING
PIN DESCRIPTION
1anode
2not connected
3cathode
Fig.1 Simplified outline (SOT23 ) and symbo l .
handbook, halfpage
MAM394
2
n.c.
1
3
Top view
12
3
MARKING
Note
1. = p : Made in Hong Kong.
= t : Made in Malaysia.
= W : Made in China.
TYPE NUMBER MARKING
CODE(1)
BAT720 L6*
LIMITING VALUES
In accordance with the A bsolute Maxi mum Rating Sys tem (IEC 60134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VRcontinuous revers e voltage 40 V
IFcontinuous forward current 500 mA
IFSM non-repetitive peak forward current tp < 10 ms 2 A
Tstg storage temperature 65 +150 °C
Tjjunction temperature 125 °C
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NXP Semiconductors Pr oduct dat a shee t
Schottky barrier diode BAT720
ELECTRICAL CHARACTERISTIC S
Tj = 25 °C unless otherwise specified.
THERMAL CHARACTE RISTICS
Note
1. Refer to SOT23 standard mountin g conditions.
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VFforward voltage IF = 500 mA; see Fig.2 550 mV
IRreverse current VR = 35 V; see Fig.3 100 μA
VR = 35 V; Tj = 100 °C; see Fig.3 10 mA
Cddiode capacit an ce f = 1 MHz; VR = 0; see Fig.4 60 90 pF
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth j-a thermal resistance from junction to ambient note 1 500 K/W
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NXP Semiconductors Pr oduct dat a shee t
Schottky barrier diode BAT720
GRAPHICAL DATA
Fig.2 Forward current as a function of forward
voltage; typical values.
(1) Tamb = 125 °C.
(2) Tamb = 85 °C.
(3) Tamb = 25 °C.
handbook, halfpage
VF (mV)
IF
(mA)
150 250 350 450 550
103
102
10
101
1
MBK578
(1)
(2)
(3)
Fig.3 Reverse curren t as a function of reverse
voltage; typical values.
(1) Tamb = 125 °C.
(2) Tamb = 85 °C.
(3) Tamb = 25 °C.
handbook, halfpage
4030 VR (V)
IR
(mA)
0 10 20
10
1
10
1
10
2
10
3
MBK579
(1)
(2)
(3)
Fig.4 Diode capacitance as a function of reverse
voltage; typical values.
f = 1 MHz; Tj = 25 °C.
handbook, halfpage
4030 V
R
(V)
Cd
(pF)
01020
10
2
10
1
MBK577
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NXP Semiconductors Pr oduct dat a shee t
Schottky barrier diode BAT720
PACKAGE OUTLINE
UNIT A1
max. bpcDE e1HELpQwv
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
97-02-28
99-09-13
IEC JEDEC EIAJ
mm 0.1 0.48
0.38 0.15
0.09 3.0
2.8 1.4
1.2 0.95
e
1.9 2.5
2.1 0.55
0.45 0.1
0.2
DIMENSIONS (mm are the original dimensions)
0.45
0.15
SOT23 TO-236AB
bp
D
e1
e
A
A1
Lp
Q
detail X
HE
E
wM
vMA
B
AB
0 1 2 mm
scale
A
1.1
0.9
c
X
12
3
Plastic surface mounted package; 3 leads SOT2
3
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NXP Semiconductors Pr oduct dat a shee t
Schottky barrier diode BAT720
DATA SHEET STATUS
Notes
1. Please consult the most recently issued docu ment before initiating or completing a des ign.
2. The prod uct status of device(s) described in this document may have changed since this document was publishe d
and may differ in case of multiple devices. The latest product status information is available on the Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the product specification.
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Applications Applications that are described herein for
any of these products are for illustrative purposes only.
NXP Semiconductors makes no representation or
warranty that such applications will be suitable for the
specified use witho ut fu rth e r testing or modificat ion .
Limiting values Stress abov e on e or more limit ing
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values a re s t ress ratings only and
operation of the device at these or an y other conditions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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Quick refer ence data The Quick reference data is an
extract of th e product data given in the Limiting values and
Characteristics sections of this document, and as such is
not complete, exhaus tive or legally binding.
NXP Semiconductors
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Customer notification
This data sheet was changed to reflect the new company name NXP Semicon ductors. No change s were
made to the content, except for the legal definitions and disclaimer s.
Printed in The Netherlands 613514/03/pp7 Date of release: 2003 Mar 25 Docum ent order numbe r: 9397 750 10964