IRFI530NPbF
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 100 V VGS = 0V, ID = 250µA
∆V(BR)DSS/∆T
JBreakdown Voltage Temp. Coefficient 0.12 V/°C Reference to 25°C, ID = 1mA
RDS(on) Static Drain-to-Source On-Resistance 0.11 ΩVGS = 10V, ID = 6.6A
VGS(th) Gate Threshold Voltage 2.0 4.0 V VDS = VGS, ID = 250µA
gfs Forward Transconductance 6.4 S VDS = 50V, ID = 9.0A
25 VDS = 100V, VGS = 0V
250 VDS = 80V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage 100 VGS = 20V
Gate-to-Source Reverse Leakage -100 VGS = -20V
QgTotal Gate Charge 44 ID = 9.0A
Qgs Gate-to-Source Charge 6.2 nC VDS = 80V
Qgd Gate-to-Drain ("Miller") Charge 21 VGS = 10V, See Fig. 6 and 13
td(on) Turn-On Delay Time 6.4 VDD = 50V
trRise Time 27 ID = 9.0A
td(off) Turn-Off Delay Time 37 RG = 12Ω
tfFall Time 25 RD = 5.5Ω, See Fig. 10
Between lead,
6mm (0.25in.)
from package
and center of die contact
Ciss Input Capacitance 640 VGS = 0V
Coss Output Capacitance 160 VDS = 25V
Crss Reverse Transfer Capacitance 88 = 1.0MHz, See Fig. 5
C Drain to Sink Capacitance 12 = 1.0MHz
Parameter Min. Typ. Max. Units Conditions
ISContinuous Source Current MOSFET symbol
(Body Diode) showing the
ISM Pulsed Source Current integral reverse
(Body Diode) p-n junction diode.
VSD Diode Forward Voltage 1.3 V TJ = 25°C, IS = 6.6A, VGS = 0V
trr Reverse Recovery Time 130 190 ns TJ = 25°C, IF = 9.0A
Qrr Reverse Recovery Charge 650 970 nC di/dt = 100A/µs
nH
µA
nA
IDSS Drain-to-Source Leakage Current
IGSS
ns
G
4.5
7.5
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
LDInternal Drain Inductance
pF
Source-Drain Ratings and Characteristics
A
60
12
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
VDD = 15V, starting TJ = 25°C, L = 3.1mH
RG = 25Ω, IAS = 9.0A. (See Figure 12)
t=60s, =60Hz
ISD ≤ 9.0A, di/dt ≤ 520A/µs, VDD ≤ V(BR)DSS,
TJ ≤ 175°C
Uses IRF530N data and test conditions
Pulse width ≤ 300µs; duty cycle ≤ 2%.
LSInternal Source Inductance