Philips Semiconductors Product specification
74ABT32Quad 2-input OR gate
1995 Sep 22 3
ABSOLUTE MAXIMUM RATINGS1, 2
SYMBOL PARAMETER CONDITIONS RATING UNIT
VCC DC supply voltage –0.5 to +7.0 V
IIK DC input diode current VI < 0 –18 mA
VIDC input voltage3–1.2 to +7.0 V
IOK DC output diode current VO < 0 –50 mA
VOUT DC output voltage3output in Off or High state –0.5 to +5.5 V
IOUT DC output current output in Low state 40 mA
Tstg Storage temperature range –65 to 150 °C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
RECOMMENDED OPERATING CONDITIONS
LIMITS
MIN MAX
VCC DC supply voltage 4.5 5.5 V
VIInput voltage 0 VCC V
VIH High-level input voltage 2.0 V
VIL Low-level input voltage 0.8 V
IOH High-level output current –15 mA
IOL Low-level output current 20 mA
∆t/∆vInput transition rise or fall rate 0 10 ns/V
Tamb Operating free-air temperature range –40 +85 °C
DC ELECTRICAL CHARACTERISTICS LIMITS
SYMBOL PARAMETER TEST CONDITIONS Tamb = +25°CTamb = –40°C
to +85°CUNIT
MIN TYP MAX MIN MAX
VIK Input clamp voltage VCC = 4.5V ; IIK = –18mA –0.9 –1.2 –1.2 V
VOH High-level output voltage VCC = 4.5V ; IOH = –15mA; VI = VIL or VIH 2.5 2.9 2.5 V
VOL Low-level output voltage VCC = 4.5V ; IOL = 20mA; VI = VIL or VIH 0.35 0.5 0.5 V
IIInput leakage current VCC = 5.5V ; V I = GND or 5.5V ±0.01 ±1.0 ±1.0 µA
IOFF Power-of f leakage current VCC = 0.0V ; V O or VI ≤ 4.5V ±5.0 ±100 ±100 µA
ICEX Output High leakage current VCC = 5.5V ; V O = 5.5V; VI = GND or VCC 5.0 50 50 µA
IOOutput current1VCC = 5.5V; VO = 2.5V –50 –75 –180 –50 –180 mA
ICC Quiescent supply current VCC = 5.5V ; V I = GND or VCC 2 50 50 µA
∆ICC Additional supply current per
input pin2VCC = 5.5V ; One data input at 3.4V, other
inputs at VCC or GND 0.25 500 500 µA
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flop or latch after applying the power.