June 2010 I
© 2010 Actel Corporation
IGLOO PLUS Low Power Flash FPGAs
with Flash*Freeze Technology
Features and Benefits
Low Power
• 1.2 V to 1.5 V Core Voltage Support for Low Power
• Supports Single-Voltage System Operation
• 5 µW Power Consumption in Flash*Freeze Mode
• Low Power Active FPGA Operation
• Flash*Freeze Technology Enables Ultra-Low Power
Consumption while Maintaining FPGA Content
• Configurable Hold Previous S tate, Trista te, HIGH, or LOW S t ate
per I/O in Fl as h* Freez e Mod e
• Easy Entry To / Exit From Ultra-Low Power Flash*Freeze Mode
Feature Rich
• 30 k to 125 k System Gates
• Up to 36 kbits of T rue Dual-Port SRAM
• Up to 212 User I/Os
Reprogrammable Flash Technology
• 130-nm, 7-Layer Metal, Flash-Based CMOS Process
• Live-at-Power-Up (LAPU) Level 0 Support
• Single-Chip Solution
• Retains Programmed Design When Powered Off
• 250 MHz (1.5 V systems) and 160 MHz (1.2 V systems) System
Performance
In-System Programming (ISP) and Security
• Secure ISP Using On-Chip 128-Bit Advanced Encryption
Standard (AES) Decryption via JTAG (IEEE 1532–compliant)†
• FlashLock® to Secure FPGA Contents
High-Performance Routing Hierarchy
• Segmented, Hierarchical Routing and Clock Structure
Advanced I/O
• 1.2 V, 1.5 V, 1.8 V, 2.5 V, and 3.3 V Mixed-Voltage Operation
• Bank-Selectable I/O Voltages—4 Banks per Chip on All
IGLOO® PLUS Devices
• Single-Ended I/O Standards: LVTTL, LVCMOS
3.3 V / 2.5 V / 1.8 V / 1.5 V / 1.2 V
• Selectable Schmitt Trigger Inputs
• Wide Range Power Supply Voltage Support per JESD8-B,
Allowing I/Os to Operate from 2.7 V to 3.6 V
• Wide Range Power Supply Voltage Support per JESD8-12,
Allowing I/Os to Operate from 1.14 V to 1.575 V
• I/O Registers on Input, Output, and Enable Paths
• Hot-Swap pable and Cold -Sparing I/Os
• Programmable Output Slew Rate and Drive S trength
• Weak Pull-Up/-Dow n
• IEEE 1149.1 (JTAG) Boundary Scan Test
• Pin-Compatible Small-Footprint Packages across the IGLOO
PLUS Family
Clock Conditioning Circuit (CCC) and PLL†
• Six CCC Blocks, One with an Integrated PLL
• Configurable Phase Shift, Multiply/Divide, Delay Capabilities,
and External Feedback
• Wide Input Frequency Range (1.5 MHz up to 250 MHz)
Embedded Memory
• 1 kbit of FlashROM User Nonvolatile Memory
• SRAMs and FIFOs with Variable-Aspect-Ratio 4,608-Bit RAM
Blocks (×1, ×2, ×4, ×9, and ×18 organizations)†
• T rue Dual-Port SRAM (except ×18)†
† The AGLP030 device does not support this feature.
Table 1 • IGLOO PLUS Product Family
IGLOO PLUS Devices AGLP030 AGLP060 AGLP125
System Gates 30,000 60,000 125,000
Typical Equivalent Macrocells 256 512 1,024
VersaTiles (D-flip-flops) 792 1,584 3,120
Flash*Freeze Mode (typ ical, µW) 5 10 16
RAM Kbits (1,024 bits) – 18 36
4,608-Bit Blocks – 4 8
Secure (AES) ISP – Yes Yes
FlashROM Kbits 1 11
Integrated PLL in CCCs 1– 1 1
VersaNet Globals 2618
18
I/O Banks 4 4 4
Maximum User I/Os 120 157 212
Package Pins
CS
VQ CS201, CS289
VQ128 CS201, CS289
VQ176 CS281, CS289
Notes:
1. AGLP060 in CS201 does not support the PLL.
2. Six chip (main) and twelve quadrant global networks are available for AGLP060 and AGLP125.
Revision 11
®
IGLOO PLUS Low Power Flash FPGAs
II Revision 11
I/Os Per Package 1
IGLOO PLUS Device Status
IGLOO PLUS Devices AGLP030 AGLP060 AGLP125
Package Single-Ended I/Os
CS201 120 157 –
CS281 – – 212
CS289 120 157 212
VQ128 101 – –
VQ176 – 137 –
Note: When the Flash*Freeze p in is used to directly enable Fla sh*Freeze mod e and not used as a regular I/O, the numb er of single-
ended user I/Os available is reduce d by one.
Table 2 • IGLOO PLUS FPGAs Package Si ze D imensions
Package CS201 CS281 CS289 VQ128 VQ176
Length × Width (mm/mm) 8 × 8 10 × 10 14 × 14 14 × 14 20 × 20
Nominal Area (mm2) 64 100 196 196 400
Pitch (mm) 0.5 0.5 0.8 0.4 0.4
Height (mm) 0.89 1.05 1.20 1.0 1.0
IGLOO PLUS Device Status
AGLP030 Production
AGLP060 Production
AGLP125 Production
IGLOO PLUS Low Power Flash FPGAs
Revision 11 III
IGLOO PLUS Ordering Information
Notes:
1. Marking information: IGLOO PLUS V2 devices do not have a V2 marking, but IGLOO PLUS V5 devices are marked accordingly.
2. "G" indicates RoHS-compliant packages.
Supply Voltage
2 = 1.2 V to 1.5 V
5 = 1.5 V only
AGLP125 V2 CS
_
Part Number
Package Type
289 I
Package Lead Count
G
Lead-Free Packaging
Application (Temperature Range)
Blank = Commercial (0°C to +70°C ambient temperature)
I = Industrial (–40°C to +85°C ambient temperature)
Blank = Standard Packaging
G= RoHS-Compliant Packaging
PP= Pre-Production
ES= Engineering Sample (room temperature only)
30,000 System Gates
AGLP030 =
60,000 System Gates
AGLP060 =
125,000 System Gates
AGLP125 =
CS =Chip Scale Package (0.5 mm and 0.8 mm pitches)
VQ =Very Thin Quad Flat Pack (0.4 mm pitch)
IGLOO PLUS Low Power Flash FPGAs
IV Revision 11
Temperature Grade Offerings
Contact your local Actel representative for device availability: http://www.actel.com/company/contact/default.aspx.
Package AGLP030 AGLP060 AGLP125
CS201 C, I C, I –
CS281 ––C, I
CS289 C, IC, IC, I
VQ128 C, I – –
VQ176 –C, I–
Notes:
1. C = Commercial temperature range: 0°C to 70°C ambient temperature.
2. I = Industrial temperature range: –40°C to 85°C ambient temperature.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 V
Table of Content s
IGLOO PLUS Device Family Overview
General Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-1
IGLOO PLUS DC and Switching Characteristics
General Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-1
Calculating Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-7
User I/O Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-15
VersaTile Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-51
Global Resource Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-57
Clock Conditioning Circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-61
Embedded SRAM and FIFO Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-64
Embedded FlashROM Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-77
JTAG 1532 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-78
Actel Safety Critical, Life Support, and High-Reliability Ap plications Policy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-79
Package Pin Assignments
128-Pin VQFP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-1
176-Pin VQFP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-4
201-Pin CSP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-7
281-Pin CSP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-12
289-Pin CSP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-16
Datasheet Information
List of Changes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-1
Datasheet Categories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-6
Actel Safety Critical, Life Support, and High-Reliability Ap plications Policy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-6
Revision 11 1-1
1 – IGLOO PLUS Device Family Overview
General Description
The IGLOO PLUS family of flash FPGAs, based on a 130 nm flash process, offers the lowest power
FPGA, a single-chip solution, small-footprint packages, reprogrammability, and an abundance of
advanced features.
The Flash*Freeze technology used in IGLOO PLUS devices enables entering and exiting an ultra-low
power mode that consumes as little as 5 µW while retaining the design information, SRAM content,
registers, and I/O states. Flash*Freeze tech nology simplifies power management through I/O and clock
management with rapid recovery to operation mode.
The Low Power Active capability (static idle) allows for ultra-low power consumption while the IGLOO
PLUS device is completely functional in the system. This allows the IGLOO PLUS device to control
system power management based on external inputs (e.g., scanning for keyboard stimulus) while
consuming minimal power.
Nonvolatile flash technology gives IGLOO PLUS devices the advantage of being a secure, low power,
single-chip solution that is live at p ower-up (L APU). IGL OO PLUS is reprogrammable and offers time-to-
market benefits at an ASIC-level unit cost.
These features enable designers to create high-density systems using existing ASIC or FPGA design
flows and tools.
IGLOO PLUS devices offer 1 kbit of on-chip, reprogrammable, nonvola tile Fl ashROM storage a s we ll as
clock conditioning circuitry based on an integrated phase-locked loop (PLL). IGLOO PLUS devices have
up to 125 k system gates, supported with up to 36 kbits of true dual-port SRAM and up to 212 user I/Os.
The AGLP030 devices have no PLL or RAM support.
Flash*Freeze Technology
The IGLOO PLUS device offers unique Flash*Freeze technology, allowing the device to enter and exit
ultra-low power Flash*Freeze mode. IGLOO PLUS devices do not need additional components to turn off
I/Os or clocks while retaining the design information, SRAM content, registers, and I/O states.
Flash*Freeze technology is combined with in-system programmability, which enables users to quickly
and easily upgrade and update their designs in the final stages of manufacturing or in the field. The
ability of IGLOO PLUS V2 devices to support a wide range of core and I/O voltages (1.2 V to 1.5 V)
allows further reduction in power consumption, thus achieving the lowest total system power.
During Flash*Freeze mode, each I/O can be set to the following configurations: hold previous state,
tristate, or set as HIGH or LOW.
The availability of low power modes, combin ed with reprogrammability, a single-chip and single-voltage
solution, and availability of small-footprint, high-pin-count packages, make IGLOO PLUS devices the
best fit for portable electronics.
Flash Advantages
Low Power
IGLOO PLUS devices exhibit power characteristics similar to those of an ASIC, making them an ideal
choice for power-sensiti ve appl ications. IGLOO PLUS devices have onl y a very li mite d powe r-on current
surge and no high-current transition period, both of which occur on many FPGAs.
IGLOO PLUS devices also have low dynamic power consumption to further maximize power savings;
power is even further reduced by the use of a 1.2 V core voltage.
Low dynamic power consumption, combined with low static power consumption and Flash*Freeze
technology, gives the IGLOO PLUS device the lowest total system power offered by any FPGA.
IGLOO PLUS Device Family Overview
1-2 Revision 11
Security
The nonvolatile, flash-based IGLOO PLUS devices do not require a boot PROM, so there is no
vulnerable external bitstream that can be easily copied. IGLOO PLUS devices incorporate FlashLock,
which provides a unique combination of reprogrammability and design security without external
overhead, advantages that only an FPGA with nonvolatile flash programming can offer.
IGLOO PLUS devices (except AGLP030) utilize a 128-bit flash-based lock and a separate AES key to
secure programmed intellectual property and configuration data. In addition, all FlashROM data in
IGLOO PLUS devices can be encrypted prior to loading, using the industry-leading AES-128 (FIPS192)
bit block cipher encryption standard. AES was adopted by the National Institute of Standards and
Technolog y (NIST) in 2000 and replaces th e 1977 DES standard. IGLOO PLUS devices have a built-in
AES decryption engine and a flash-based AES key that make them the most comprehensive
programmable logic device security solution available today. IGLOO PLUS devices with AES-based
security allow for secure, remote field updates over public networks such as the Internet, and ensure that
valuable IP remains out of the hands of system overbuilders, system cloners, and IP thieves. The
contents of a programmed IGLOO PLUS device cannot be read back, although secure design verification
is possible.
Security, bui lt into th e F PGA fabr ic, is an in heren t compone nt of the IGLOO PLUS famil y. The flash cells
are located beneath seven metal layers, and many device design and layout techniques have been used
to make invasive attacks extremely difficult. The IGLOO PLUS family, with FlashLock and AES security,
is unique in being highly resistant to both invasive and noninvasive attacks. Your valuable IP is protected
and secure, making remote ISP possible. An IGLOO PLUS device provides the most impenetrable
security for programmable logic designs.
Single Chip
Flash-based FPGAs store their configuration information in on-chip flash cells. Once programmed, the
configuration data is an inherent part of the FPGA structu re, a nd no exte rnal configuratio n data needs to
be loaded at system power-up (unlike SRAM-based FPGAs). Therefore, flash-based IGLOO PLUS
FPGAs do not require system configuration components such as EEPROMs or microcontrollers to load
device configuration data. This reduces bill-of-materials costs and PCB area, and increases security and
system reliability.
The IGLOO PLUS devices can be operated with a 1.2 V or 1.5 V single-voltage supply for core and I/Os,
eliminating the need for additional supplies while minimizing total power consumption.
Live at Power-Up
The Actel flash-based IGLOO PLUS devices support Level 0 of the LAPU classification standard. This
feature helps in system component initialization, execution of critical tasks before the processor wakes
up, setup and configuration of memory blocks, clock generation, and bus activity management. The
LAPU feature of flash-based IGLOO PLUS devices greatly simplifies total system design and reduces
total system cost, often eliminating the need for CPLDs and clock generation PLLs. In addition, glitches
and brownouts in system power will not corrupt the IGLOO PLUS device's flash configuration, and unlike
SRAM-based FPGAs, the device will not have to be reloaded when system power is restored. This
enables the reduction or complete removal of the configuration PROM, expensive voltage monitor,
brownout detection, and clock generator devices from the PCB design. Flash-based IGLOO PLUS
devices simplify total system design and reduce cost and design risk while increasin g system reliability
and improving system initialization time.
IGLOO PLUS flash FPGAs allow the user to quickly enter and exit Flash*Freeze mode. This is done
almost instantly (within 1 µs), and the device retains configuration and data in registers and RAM. Unlike
SRAM-based FPGAs, the device does not need to reload configuration and design state from external
memory components; instead, it retains all necessary information to resume operation immediately.
Reduced Cost of Ownership
Advantages to the designer extend beyond low unit cost, performance, and ease of use. Unlike SRAM-
based FPGAs, flash-based IGLOO PLUS devices allow all functionality to be live at power-up; no
external boot PROM is required. On-board security mechanisms preven t access to all the programming
information and enable secure remote updates of the FPGA logic. Designers can perform secure remote
in-system reprogramming to support future design iterations and field upgrades with confidence that
valuable intellectual property cannot be compromised or copied. Secure ISP can be performed using the
IGLOO PLUS Low Power Flash FPGAs
Revision 11 1-3
industry-standard AES algorithm. The IGLOO PLUS family device architecture mitigates the need for
ASIC migration at higher user volumes. This makes the IGLOO PLUS family a cost-effective ASIC
replacement solution, especially for applications in the consumer, networking/communications,
computing, and avionics markets.
Firm-Error Immunity
Firm errors occur most commonly when high-energy neutrons, generated in the upper atmosphere, strike
a configuration cell of an SRAM FPGA. The energy of the collision can change the state of the
configuration cell and thus change the logic, routing, or I/O behavior in an unpredictable way. These
errors are impossible to prevent in SRAM FPGAs. The consequence of this type of error can be a
complete system failure. Firm errors do not exist in the configuration memory of IGLOO PLUS flash-
based FPGAs. Once it is programmed, the flash cell configuration element of IGLOO PLUS FPGAs
cannot be altered by high-energy neutrons and is therefore immune to them. Recoverable (or soft) errors
occur in the user data SRAM of all FPGA devices. These can easily be mitigated by using error detection
and correction (EDAC) circuitry built in to the FPGA fabric.
Advanced Flash Technology
The IGLOO PLUS family offers many benefits, includ ing nonvolatility and reprogrammability, through an
advanced flash-based, 130 nm LVCMOS process with seven layers of metal. Standard CMOS design
techniques are used to implement logic and control functions. The combination of fine granularity,
enhanced flexible routing resources, and abundant flash switches allows for very high logic utilization
without compromising device routability or performance. Logic functions within the device are
interconnected through a four-level routing hierarchy.
IGLOO PLUS family FPGAs utilize design and process techni ques to minimi ze power consum ption in all
modes of operation.
Advanced Architecture
The proprietary IGLOO PLUS architecture provides granularity comparable to standard-cell ASICs. The
IGLOO PLUS device consists of five distinct and programmable architectural features (Figure 1-1 on
page 1-4):
• Flash*Free z e te ch no logy
• FPGA VersaTiles
• Dedicated FlashROM
• Dedicated SRAM/FIFO memory†
• Extensive CCCs and PLLs†
• Advanced I/O structur e
The FPGA core consists of a sea of VersaTiles. Each VersaTile can be confi gured as a three-input lo gic
function, a D-flip-flop (with or without enable), or a latch by programming the appropriate flash switch
interconnections. The versatility o f the IGLOO PLUS core tile as either a three-input lookup table (LUT)
equivalent or a D-flip-flop/latch with enable allows for efficient use of the FPGA fabric. The VersaTile
capability is unique to the Actel ProASIC famil y of third-generation-a rchitecture flash FPGAs. VersaTiles
are connected with any of the four levels of routing hierarchy. Flash switches are distributed throug hout
the device to provide nonvolatile, reconfigurable interconnect programming. Maximu m core utilization is
possible for virtually any design.
In addition, extensive on-chip programming circuitry allows for rapid, single-vo ltage (3.3 V) programming
of IGLOO PLUS devices via an IEEE 1532 JTAG interface.
† The AGLP030 device does not support PLL or SRAM.
IGLOO PLUS Device Family Overview
1-4 Revision 11
Flash*Freeze Technology
The IGLOO PLUS device has an ultra-low power static mode, called Flash*Freeze mode, which retains
all SRAM and register information and can still quickly return to normal operation. Flash*Freeze
technology enables the u ser to quickly (w ithin 1 µs) enter and e xit Flash*Freeze mode by activating the
Flash*Freeze pin while all power supplies are kept at their original values. In addition, I/Os and global
I/Os can still be driven and can be toggling without impact on power consumption, clocks can still be
driven or can be toggling without impact on power consumption, and the device retains all core registers,
SRAM information, and I/O states. I/Os can be individually configured to either hold thei r previous state
or be tristated during Flash*Freeze mode. Alternatively, they can be set to a certain st ate using weak pull-
up or pull-down I/O attribute confi guration. No power is consumed by the I/O banks, clocks, JTAG pins,
or PLL, and the device consumes as little as 5 µW in this mode.
Flash*Freeze technology allows the user to switch to Active mode on demand, thus simplifying the power
management of the device.
The Flash*Freeze pin (active low) can be rou ted internally to the core to allow the user's logic to decide
when it is safe to transition to this mode. Refer to Figure 1-2 for an illustration of entering/exiting
Flash*Freeze mode. It is also possible to use the Flash*Freeze pin as a regular I/O if Flash*Freeze mode
usage is not planned.
*Not supported by AGLP030 devices
Figure 1-1 • IGLOO PLUS Device Architecture Overview with Four I/O Banks (AGLP030, AGLP060, and
AGLP125)
RAM Block
4,608-Bit Dual-Port
SRAM or FIFO Block*
VersaTile
CCC
I/Os
ISP AES
Decryption* User Nonvolatile
FlashRom Flash*Freeze
Technology Charge
Pumps
Bank 0
Bank 1Bank 1
Bank 3Bank 3
Bank 2
*
Figure 1- 2 • IGLOO PLUS Flash*Freeze Mode
Actel
IGLOO PLUS
FPGA
Flash*Freeze
Mode Control
Flash*Freeze Pin
IGLOO PLUS Low Power Flash FPGAs
Revision 11 1-5
VersaTiles
The IGLOO PLUS core consists of VersaTiles, which have been enhanced beyond the ProASICPLUS®
core tiles. The IGLOO PLUS VersaTile supports the following:
• All 3-input logic functions—LUT-3 equivalent
• Latch with clear or set
• D-flip-flop with clear or set
• Enable D-flip-flop with clear or set
Refer to Figure 1-3 for VersaTile configurations.
User Nonvolatile FlashROM
Actel IGLOO PLUS devices have 1 kbit of on-chip, user-accessible, nonvolatile FlashROM. The
FlashROM can be used in diverse system applications:
• Internet protocol addressing (wireless or fixed)
• System calibration settings
• Device serialization and/or in ventory control
• Subscription-based business models (for example, set-top boxes)
• Secure key storage for secure communications algo rithms
• Asset management/tracking
• Date stamping
• Version management
The FlashROM is written using the standard IGLOO PLUS IEEE 1532 JTAG programming interface. The
core can be individually programmed (erased and written), and on-chip AES decryption can be used
selectively to securely load data over public netwo rks (except in AGLP030 devices), as in security keys
stored in the FlashROM for a user design.
The FlashROM can be programmed via the JTAG programming interface, and its contents can be read
back either through the JTAG programming interface or via direct FPGA core addressing. Note that the
FlashROM can only be programmed from the JTAG interface and cannot be programmed from the
internal logic array.
The FlashROM is programmed as 8 banks of 128 bi ts; however, reading is performed on a byte-by-byte
basis using a synchronous interface. A 7-bit address from the FPGA core defin es which of the 8 banks
and which of the 16 byte s within that bank are being read. T he three most significa nt bits (MSBs) of the
FlashROM address determine the bank, and the four least significant bits (LSBs) of the FlashROM
address define the byte.
The Actel IGLOO PLUS deve lopment software solutions, Libero ® Integrated Design Environment (IDE)
and Designer, have extensive support for the FlashROM. One such feature is auto-generation of
sequential programming files for applications requiring a unique serial number in each part. Another
feature allows the inclusion of static data for system version control. Data for the FlashROM can be
generated quickly and easily using Actel Libero IDE and Designer software tools. Comprehensive
programming file supp ort is also included to allow for easy programming of large numbers of parts with
differing FlashROM contents.
Figure 1-3 • VersaTile Configurations
X1 Y
X2
X3 LUT-3 Data Y
CLK
Enable
CLR
D-FF
Data Y
CLK
CLR D-FF
LUT-3 Equivalent D-Flip-Flop with Clear or Set Enable D-Flip-Flop with Clear or Set
IGLOO PLUS Device Family Overview
1-6 Revision 11
SRAM and FIFO
IGLOO PLUS devices (except AGLP030 devices) have embedded SRAM blocks along their north side.
Each variable-aspect-ratio SRAM block is 4,608 bits in size. Available memory configurations are
256×18, 512×9, 1k×4, 2k×2 , a nd 4k×1 b its. The individual blo cks have inde pend ent read and write po rts
that can be configured with different bit widths on each port. For example, data can be sent through a
4-bit port and read as a si ngle bitstream. The embedded SRAM blocks can be initialized via the device
JTAG port (ROM emulation mode) using the UJTAG macro (except in AGLP030 devices).
In addition, every SRAM block has an embedded FIFO control unit. The control unit allows the SRAM
block to be con figured as a synchro nous FIFO with out using additi onal core VersaTiles. The FIFO width
and depth are programmable. The FIFO also features programmable Almost Empty (AEMPTY) and
Almost Full (AFULL) flags in addition to the normal Empty and Full flags. The embedded FIFO control
unit contains the counters necessary for generation of the read and write address pointers. The
embedded SRAM/FIFO blocks can be cascaded to create larger configurations.
PLL and CCC
IGLOO PLUS devices provide designers with very flexible clock conditioning circuit (CCC) capabilities.
Each member of the IGLOO PLUS family contains six CCCs. One CCC (center west side) has a PLL.
The AGLP030 device does not have a PLL or CCCs; it contains only inputs to six globals.
The six CCC blocks are located at the four corners and the centers of the east and west sides. One CCC
(center west side) has a PLL.
The four corner CCCs and the east CCC allow simple clock delay operations as well as clock spine
access.
The inputs of the six CCC blocks are accessible from the FPGA core or from one of several inputs
located near the CCC that have dedicated connections to the CCC block.
The CCC block has these key features:
• Wide input frequency ra nge (fIN_CCC) = 1.5 MHz up to 250 MHz
• Output frequency range (fOUT_CCC) = 0.75 MHz up to 250 MHz
• 2 programmable delay types for clock skew minimization
• Clock frequency synthesis (for PLL only)
Additional CCC specifications:
• Internal phase shift = 0°, 90°, 180°, and 270°. Output phase shift depends on the output divider
configuration (for PLL only).
• Output duty cycle = 50% ± 1.5% or better (for PLL only)
• Low output jitter: worst case < 2.5% × clock per iod peak-to-peak period jitter when sin gle global
network used (for PLL only)
• Maximum acquisiti on time is 300 µs (for PLL only)
• Exceptional tolerance to in put period jitter—allowable input jitter is up to 1.5 ns (for PLL only)
• Four precise phases; maximum misalignment between adjacent phases (for PLL only) is 40 ps ×
250 MHz / fOUT_CCC
Global Clocking
IGLOO PLUS devices have extensive support for multiple clo cking domains. In additi on to the CCC and
PLL support described above, there is a comprehensive global clock distribution network.
Each VersaTile input and output port has access to nine VersaN ets: six chip (main) and th ree quadrant
global networks. The VersaNets can be driven by the CCC or directly accessed from the core via
multiplexers (MUXes). The VersaNets can be used to distribute low-skew clock signals or for rapid
distribution of high-fanout nets.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 1-7
I/Os with Advanced I/O Standards
The IGLOO PLUS family of FPGAs features a flexi ble I/O structure, supporting a range of voltages (1.2
V, 1.5 V, 1.8 V, 2.5 V, 3.0 V wide range, and 3.3 V). IGLOO PLUS FPGAs support many different I/O
standards.
The I/Os are organized into four banks. All devices in IGLOO PLUS have four banks. The configura tion
of these banks determines the I/O standards supported.
Each I/O module contains several input, output, and output enable registers.
Hot-swap (also called hot-pl ug, or hot-insertion ) is t he opera tion of h ot-insertion or hot-remova l of a card
in a powered-up system.
Cold-sparing (also called cold-swap) refers to the ability of a device to leave system data undisturbed
when the system is powered up, while the component itself is powered down, or when power supplies
are floating.
Wide Range I/O Support
Actel IGLOO PLUS devices support JEDEC-defined wide range I/O operation. IGLOO PLUS devices
support both the JESD8-B specification, covering 3 V and 3.3 V supplies, for an effective operating range
of 2.7 V to 3.6 V, and JESD8 - 12 with its 1.2 V nominal, supporting an effective operating range of 1.14 V
to 1.575 V.
Wider I/O range means d esigners can eli minate power suppl ies or powe r conditi oning comp onents from
the board or move to less costly components with greater tolerances. Wide range eases I/O bank
management and provides enhanced protection from system voltage spikes, while providing the flexibility
to easily run custom voltage applications.
Revision 11 2-1
2 – IGLOO PLUS DC and Switching Characteristics
General Specifications
Operating Conditions
Stresses beyond those listed in Table 2-1 may cause permanent damage to the device.
Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Absolute Maximum Ratings are stress ratings only; functional operation of the device at these or any
other conditions beyond those listed under the Recommended Operating Conditions specified in
Table 2-2 on page 2-2 is not implied.
Table 2-1 • Absolute Maximum Ratings
Symbol Parameter Limits Units
VCC DC core supply voltage –0.3 to 1.65 V
VJTAG JTAG DC voltage –0.3 to 3.75 V
VPUMP Programming vol tage –0.3 to 3.75 V
VCCPLL Analog power supply (PLL) –0.3 to 1.65 V
VCCI DC I/O buf fer supply voltage –0.3 to 3.75 V
VI1I/O input voltage –0.3 V to 3.6 V V
TSTG 2Storage temperature –65 to +150 °C
TJ2Junction temperature +125 °C
Notes:
1. The device should be operated within the limits specified by the datasheet. During transitions, the input signal may
undershoot or overshoot according to the limits shown in Table 2-4 on page 2-3.
2. For flash programming and retention maximum limits, refer to Table 2-3 on page 2-2, and for recommended operating
limits, re fer to Table 2-2 on page 2-2.
IGLOO PLUS DC and Switching Characteristi c s
2-2 Revision 11
Table 2-2 • Recommended Operating Cond itions1,2
Symbol Parameter Commercial Industrial Units
TAAmbient temperature 0 to +70 –40 to +85 °C
TJJunction temperature20 to + 85 –40 to +100 °C
VCC31.5 V DC core supply voltage 4 1.425 to 1.575 1.425 to 1.575 V
1.2 V–1.5 V wide range core voltage5,6 1.14 to 1.575 1.14 to 1.575 V
VJTAG JTAG DC voltage 1.4 to 3.6 1.4 to 3.6 V
VPUMP7Programming voltage Programming mode 3.15 to 3.45 3.15 to 3.45 V
Operation 0 to 3.6 0 to 3.6 V
VCCPLL8Analog power supply (PLL) 1.5 V DC core supply voltage4 1.425 to 1.575 1.425 to 1.575 V
1.2 V–1.5 V wide range core
voltage51.14 to 1.575 1.14 to 1.575 V
VCCI 1.2 V DC supply voltage51.14 to 1.26 1.14 to 1.26 V
1.2 V DC wide range supply voltage51.14 to 1.575 1.14 to 1.575 V
1.5 V DC supply voltage 1.425 to 1.575 1.425 to 1.575 V
1.8 V DC supply voltage 1.7 to 1.9 1.7 to 1.9 V
2.5 V DC supply voltage 2.3 to 2.7 2.3 to 2.7 V
3.3 V wide range DC supply voltage92.7 to 3.6 2.7 to 3.6 V
3.3 V DC supply voltage 3.0 to 3.6 3.0 to 3.6 V
Notes:
1. All parameters representing voltages are measured with respect to GND unless otherwise specified.
2. To ensure target ed reliabili ty stand ards are met across ambient a nd juncti on operating temperatures, Actel recommends
that the user follo w best design practices using Actel’s timing and power simulation tools.
3. The ranges given here are for power supplies only. The recommended input voltage ranges specific to each I/O
standard are given in Table 2-21 on page 2-19. VCCI should be at the same voltage within a given I/O bank.
4. For IGLOO® PLUS V5 devices
5. For IGLOO PLUS V2 devices only, operating at VCCI ≥ VCC.
6. All IGLOO PLUS devices (V5 and V2) must be programmed with the VCC core voltage at 1.5 V. Applications using V2
devices powered by a 1.2 V supply must switch the core supply to 1.5 V for in-system programming.
7. VPUMP can be left floating during operation (not programming mode).
8. VCCPLL pins should be tied to VCC pins. See the Pin Descriptions chapter of the IGLOO PLUS FPGA Fabric User ’s
Guide for further information.
9. 3.3 V wide range is compliant to t he JDEC8b specification and supports 3.0 V VCCI operation.
Table 2-3 • Flash Programmi ng Limits – Retention, Storage , and Operating Temp erature 1
Product
Grade Programming
Cycles
Program
Retention
(biased/unbiased)
Maximum Storage
Tem perature TSTG
(°C) 2
Maximum Operating
Junction
Temperature TJ (°C) 2
Commercial 500 20 years 110 100
Industrial 500 20 years 110 100
Notes:
1. This is a stress rating only; f unctional operation at any condition other than those indicated is not implied.
2. These limits apply for program/data retention only. Refer to Table 2-1 on page 2-1 and Table 2-2 for device operating
conditions and absolute limits.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-3
I/O Power-Up and Supply Voltage Thresholds for Power-On Reset
(Commercial and Industrial)
Sophisticated power-up management circuitry is designed into every IGLOO PLUS device. These
circuits ensure easy transition from the powered-off state to the powered-up state of the device. The
many different supplies can power up in any sequence with minimized current spikes or surges. In
addition, the I/O will be in a known state through the power-up sequence. The basic principle is shown in
Figure 2-1 on page 2-4.
There are five regions to consider durin g power-up.
IGLOO PLUS I/Os are activa ted only if ALL of the following three conditions are met:
1. VCC and VCCI are above the minimum specified trip points (Figure 2-1 and Figure 2-2 on
page 2-5).
2. VCCI > VCC – 0.75 V (typical)
3. Chip is in the operating mode.
VCCI Trip Point:
Ramping up (V5 devices): 0.6 V < trip_point_up < 1.2 V
Ramping down (V5 devices): 0.5 V < trip_point_down < 1.1 V
Ramping up (V2 devices): 0.75 V < trip_point_up < 1.05 V
Ramping down (V2 devices): 0.65 V < trip_point_down < 0.95 V
VCC Trip Point:
Ramping up (V5 devices): 0.6 V < trip_point_up < 1.1 V
Ramping down (V5 devices): 0.5 V < trip_point_down < 1.0 V
Ramping up (V2 devices): 0.65 V < trip_point_up < 1.05 V
Ramping down (V2 devices): 0.55 V < trip_point_down < 0.95 V
VCC and VCCI ramp-up trip points are about 100 mV higher than ramp-down trip points. This specifically
built-in hysteresis prevents undesirable power-up oscillations and current surges. Note the following:
• During programming, I/Os become tristated and weakly pulled up to VCCI.
• JTAG supply, PLL power supplies, and charge pump VPUMP supply have no influence on I/O
behavior.
Table 2-4 • Overshoot and Undershoot Limits 1
VCCI
Average VCCI–GND Overshoot or
Undershoot Duration
as a Percentage of Clock Cycle2Maximum Overshoot/
Undershoot2
2.7 V or less 10% 1.4 V
5% 1.49 V
3 V 10% 1.1 V
5% 1.19 V
3.3 V 10% 0.79 V
5% 0.88 V
3.6 V 10% 0.45 V
5% 0.54 V
Notes:
1. Based on reliability requiremen ts at 85°C.
2. The duration is allowed at one out of six clock cycles. If the overshoot/undershoot occurs at one out of two cycles, the
maximum overshoot/undershoot has to be reduced by 0.15 V.
IGLOO PLUS DC and Switching Characteristi c s
2-4 Revision 11
PLL Behavior at Brownout Condition
Actel recommends using monotonic power supplies or voltage regulators to ensure proper power-up
behavior. Power ramp-up should be monotonic at least until VCC and VCCPLX exceed brownout
activation levels (see Figure 2-1 and Figure 2-2 on page 2-5 for more details).
When PLL power supply voltage and/or VCC le vels dro p below the VCC b rownout level s (0.75 V ± 0.25
V for V5 devices, and 0.75 V ± 0.2 V for V2 devices), the PLL output lock signal goes Low and/or the
output clock is lost. Refer to the "Brownout Voltage" section in the "Power-Up/-Down Behavior of Low
Power Flash Devices" chapter of the IGLOO PLUS Device Family User’s Guide for information on clock
and lock recovery.
Internal Power-Up Activation Sequence
1. Core
2. Input buffers
3. Output buffers, after 200 ns delay from input buffer activation
To make sure the transition from input buffers to output buffers is clean, ensure that there is no path
longer than 100 ns from input buffer to output buffer in your design.
Figure 2-1 • V5 Devices – I/O State as a Function of VCCI and VCC Voltage Levels
Region 1: I/O buffers are OFF
Region 2: I/O buffers are ON.
I/Os are functional (except differential inputs)
but slower because VCCI / VCC are below
specification. For the same reason, input
buffers do not meet VIH / VIL levels, and
output buffers do not meet VOH / VOL levels.
Min VCCI datasheet specification
voltage at a selected I/O
standard; i.e., 1.425 V or 1.7 V
or 2.3 V or 3.0 V
VCC
VCC = 1.425 V
Region 1: I/O Buffers are OFF
Activation trip point:
Va = 0.85 V ± 0.25 V
Deactivation trip point:
Vd = 0.75 V ± 0.25 V
Activation trip point:
Va = 0.9 V ± 0.3 V
Deactivation trip point:
Vd = 0.8 V ± 0.3 V
VCC = 1.575 V
Region 5: I/O buffers are ON
and power supplies are within
specification.
I/Os meet the entire datasheet
and timer specifications for
speed, VIH / VIL, VOH / VOL,
etc.
Region 4: I/O
buffers are ON.
I/Os are functional
(except differential
but slower because VCCI
is below specification. For the
same reason, input buffers do not
meet VIH / VIL levels, and output
buffers do not meet VOH / VOL levels.
Region 4: I/O
buffers are ON.
I/Os are functional
(except differential inputs)
where VT can be from 0.58 V to 0.9 V (typically 0.75 V)
VCCI
Region 3: I/O buffers are ON.
I/Os are functional; I/O DC
specifications are met,
but I/Os are slower because
the VCC is below specification.
VCC = VCCI + VT
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-5
Figure 2-2 • V2 Devices – I/O State as a Function of VCCI and VCC Voltage Levels
Region 1: I/O buffers are OFF
Region 2: I/O buffers are ON.
I/Os are functional (except differential inputs)
but slower because VCCI/VCC are below
specification. For the same reason, input
buffers do not meet VIH/VIL levels, and
output buffers do not meet VOH/VOL levels.
Min VCCI datasheet specification
voltage at a selected I/O
standard; i.e., 1.14 V,1.425 V, 1.7 V,
2.3 V, or 3.0 V
VCC
VCC = 1.14 V
Region 1: I/O Buffers are OFF
Activation trip point:
Va = 0.85 V ± 0.2 V
Deactivation trip point:
Vd = 0.75 V ± 0.2 V
Activation trip point:
Va = 0.9 V ± 0.15 V
Deactivation trip point:
Vd = 0.8 V ± 0.15 V
VCC = 1.575 V
Region 5: I/O buffers are ON
and power supplies are within
specification.
I/Os meet the entire datasheet
and timer specifications for
speed, VIH / VIL , VOH / VOL , etc.
Region 4: I/O
buffers are ON.
I/Os are functional
(except differential
but slower because VCCI is
below specification. For the
same reason, input buffers do not
meet VIH / VIL levels, and output
buffers do not meet VOH / VOL levels.
Region 4: I/O
buffers are ON.
I/Os are functional
(except differential inputs)
where VT can be from 0.58 V to 0.9 V (typically 0.75 V)
VCCI
Region 3: I/O buffers are ON.
I/Os are functional; I/O DC
specifications are met,
but I/Os are slower because
the VCC is below specification.
VCC = VCCI + VT
IGLOO PLUS DC and Switching Characteristi c s
2-6 Revision 11
Thermal Characteristics
Introduction
The temperature variable in the Actel Designer software refers to the junction temperature, not the
ambient temperature. This is an important distinction because dynamic and static power consumption
cause the chip junction temperature to be higher than the ambient temp erature.
EQ 1 can be used to calculate junction temperature.
TJ = Junction Temperature = ΔT + TA EQ 1
where:
TA = Ambient te mperature
ΔT = Temperature gradient between junction (silicon) and ambient ΔT = θja * P
θja = Junction-to-ambient of the package. θja numbers are located in Figure 2-5.
P = Power dissipation
Package Thermal Characteristics
The device junction-to-case thermal resistivity is θjc and the juncti on-to-ambient air thermal resistivity is
θja. The thermal characteristics for θja are shown for two air flow rates. The maximum operating jun ction
temperature is 100°C. EQ 2 shows a sample calculation of the maximum operating power dissipation
allowed for a 484-pin FBGA package at commercial temperature and in still air.
EQ 2
Temperature and Voltage Derating Factors
Maximum Power Allowed Max. junction temp. (°C) Max. ambient temp. (°C)–
θja(°C/W)
------------------------------------------------------------------------------------------------------------------------------------------ 100°C70°C–
20.5°C/W
------------------------------------- 1.46 W===
Table 2-5 • Package Thermal Resistivities
Package Type Pin
Count θjc
θja
UnitsStill Air 200 ft./
min. 500 ft./
min.
Chip Scale Package (CSP) 201 TBD TBD TBD TBD C/W
281 TBD TBD TBD TBD C/W
289 TBD TBD TBD TBD C/W
Very Thin Quad Flat Package (VQFP) 128 TBD TBD TBD TBD C/W
176 TBD TBD TBD TBD C/W
Table 2-6 • Temperature and Voltage Derating Factors for Timing Delays (normalized to TJ = 70°C,
VCC =1.425V)
For IGLOO PLUS V2 or V5 devices, 1.5 V DC Core Supply Voltage
Array Voltage
VCC (V)
Junction Temperature (°C)
–40°C 0°C 25°C 70°C 85°C 100°C
1.425 0.934 0.953 0.971 1.000 1.007 1.013
1.5 0.855 0.874 0.891 0.917 0.924 0.929
1.575 0.799 0.816 0.832 0.857 0.864 0.868
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-7
Calculating Power Dissipation
Quiescent Supply Current
Quiescent supply current (IDD) calculation depends on multiple factors, including operating voltages
(VCC, VCCI, and VJTAG), operating temperature, system clock frequency, and power mode usage.
Actel recommends using the Power Calculator and SmartPower software estimation tools to evaluate the
projected static and active power based on the user design, power mode usage, opera ting voltage, and
temperature.
Table 2-7 • Temperature and Voltage Derating Factors for Timing Delays (normalized to TJ = 70°C,
VCC =1.14V)
For IGLOO PLUS V2, 1.2 V DC Core Supply Voltage
Array Voltage
VCC (V)
Junction Temperature (°C)
–40°C 0°C 25°C 70°C 85°C 100°C
1.14 0.963 0.975 0.989 1.000 1.007 1.011
1.2 0.853 0.865 .0877 0.893 0.893 0.897
1.26 0.781 0.792 0.803 0.813 0.819 0.822
Table 2-8 • Power Supply State per Mode
Modes/Power Supplies
Power Supply Configurations
VCC VCCPLL VCCI VJTAG VPUMP
Flash*Freeze On On On On On/off/floating
Sleep Off Off On Off Off
Shutdown Off Off Off Off Off
No Flash*Freeze On On On On On/off/floating
Note: Off: Power Supply level = 0 V
Table 2-9 • Quiescent Supply Current (IDD) Charac teristics, IGLOO PLUS Flash*Freeze Mode *
Core Voltage AGLP030 AGLP060 AGLP125 Units
Typical (25°C) 1.2 V 4 8 13 µA
1.5 V 6 10 18 µA
*IDD includes VCC, VPUMP, VCCI, VJTAG, and VCCPLL currents.
Table 2-10 • Quiescent Supply Current (IDD) Characteristics, IGLOO PLUS Sleep Mode*
ICCI Current Core Voltage AGLP030 AGLP060 AGLP125 Units
VCCI = 1.2 V (per bank) Typical (25°C) 1.2 V 1.7 1.7 1.7 µA
VCCI = 1.5 V (per bank) Typical (25°C) 1.2 V / 1.5 V 1.8 1.8 1.8 µA
VCCI = 1.8 V (per bank) Typical (25°C) 1.2 V / 1.5 V 1.9 1.9 1.9 µA
VCCI = 2.5 V (per bank) Typical (25°C) 1.2 V / 1.5 V 2.2 2.2 2.2 µA
VCCI = 3.3 V (per bank) Typical (25°C) 1.2 V / 1.5 V 2.5 2.5 2.5 µA
Note: *IDD = NBANKS * ICCI
IGLOO PLUS DC and Switching Characteristi c s
2-8 Revision 11
Table 2-11 • Quiescent Supply Current (IDD) Characteristics, IGLOO PLUS Shutdown Mode
Core Voltage AGLP030 AGLP060 AGLP125 Units
Typical (25°C) 1.2 V / 1.5 V 0 0 0 µA
Table 2-12 • Quiescent Supply Current (IDD ), No IGLOO PLUS Flash*Freeze Mode1
Core Voltage AGLP030 AGLP060 AGLP125 Units
ICCA Current 2
Typical (25°C) 1.2 V 6 10 13 µA
1.5 V 16 20 28 µA
ICCI or IJTAG Current
VCCI / VJTAG = 1.2 V (per bank)
Typical (25°C) 1.2 V 1.7 1.7 1.7 µA
VCCI / VJTAG = 1.5 V (per bank)
Typical (25°C) 1.2 V / 1.5 V 1.8 1.8 1.8 µA
VCCI / VJTAG = 1.8 V (per bank)
Typical (25°C) 1.2 V / 1.5 V 1.9 1.9 1. 9 µA
VCCI / VJTAG = 2.5 V (per bank)
Typical (25°C) 1.2 V / 1.5 V 2.2 2.2 2. 2 µA
VCCI / VJTAG = 3.3 V (per bank)
Typical (25°C) 1.2 V / 1.5 V 2.5 2.5 2. 5 µA
Notes:
1. IDD = NBANKS * ICCI + ICCA. JTAG counts as one bank when powered.
2. Includes VCC, VCCPLL, and VPUMP currents.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-9
Power per I/O Pin
Table 2-13 • Summary of I/O Input Buffer Power (per pin) – Default I/O Software Settings
VCCI (V) Dy namic Power
PAC9 (µW/MHz) 1
Single-Ended
3.3 V LVTTL / 3.3 V LVCMOS 3.3 16.26
3.3 V LVTTL / 3.3 V LVCMOS – Schmitt Trigger 3.3 18.95
3.3 V LVCMOS Wide Range23.3 16.26
3.3 V LVCMOS Wide Range2 – Schmitt Trigger 3.3 18.95
2.5 V LVCMOS 2.5 4.59
2.5 V LVCMOS – Schmitt Trigger 2.5 6.01
1.8 V LVCMOS 1.8 1.61
1.8 V LVCMOS – Schmitt Trigger 1.8 1.70
1.5 V LVCMOS (JESD8-11) 1.5 0.96
1.5 V LVCMOS (JESD8-11) – Schmitt T rigger 1.5 0.90
1.2 V LVCMOS31.2 0.55
1.2 V LVCMOS3 – Schmitt Trigger 1.2 0.47
1.2 V LVCMOS Wide Range31.2 0.55
1.2 V LVCMOS Wide Range3 – Schmitt Trigger 1.2 0.47
Notes:
1. PAC9 is the total dynamic power measured on VCCI.
2. All LVCMOS 3.3 V software macros support LVCMOS 3.3 V wide range as specified in the JESD-8B specification.
3. Applicable for IGLOO PLUS V2 devices only, operating at VCCI ≥ VCC.
Table 2-14 • Summary of I/O Output Bu ffer Power (per pin) – Default I/O Software Settings1
CLOAD (pF) VCCI (V) Dynamic Power
PAC10 (µW/MHz)2
Single-Ended
3.3 V LVTTL / 3.3 V LVCMOS 5 3.3 127.11
3.3 V LVCMOS Wide Range35 3.3 127.11
2.5 V LVCMOS 5 2.5 70.71
1.8 V LVCMOS 5 1.8 35.57
1.5 V LVCMOS (JESD8-11) 5 1.5 24.30
1.2 V LVCMOS451.2 15.22
1.2 V LVCMOS Wide Range451.2 15.22
Notes:
1. Dynamic power consumption is given for standard load and software default drive strength and output slew.
2. PAC10 is the total dynamic power measured on VCCI.
3. All LVCMOS 3.3 V software macros support LVCMOS 3.3 V wide range as specified in the JESD-8B specification.
4. Applicable for IGLOO PLUS V2 devices only, operating at VCCI ≥ VCC.
IGLOO PLUS DC and Switching Characteristi c s
2-10 Revision 11
Power Consumption of Various Internal Resources
Table 2-15 • Different Components Contributing to Dynamic Power Consumption in IGLOO PLUS Devices
For IGLOO PLUS V2 or V5 Devices, 1.5 V Core Supply Voltage
Parameter Definition
Device Specific Dynamic Power
(µW/MHz)
AGLP125 AGLP060 AGLP030
PAC1 Clock contribution of a Global Rib 11.03 9.3 9.3
PAC2 Clock contribution of a Global Spine 0.81 0.81 0.41
PAC3 Clock contribution of a VersaTile row 0.81
PAC4 Clock contribution of a VersaTile used as a sequential module 0.11
PAC5 First contribution of a VersaTile used as a sequential module 0.057
PAC6 Second contribution of a VersaTile used as a sequential module 0.207
PAC7 Contribution of a VersaTile used as a combinatorial module 0.17
PAC8 Average contribution of a routing net 0.7
PAC9 Contribution of an I/O input pin (standard-dependent) See Table 2-13 on page 2-9.
PAC10 Contribution of an I/O outpu t pin (standard-dependent) See Table 2-14 on page 2-9.
PAC11 Average contribution of a RAM block during a read operation 25.00
PAC12 Average contribution of a RAM block during a write operation 30.00
PAC13 Dynamic contribution for PLL 2.70
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-11
Table 2-16 • Different Components Contributing to the Static Power Consumption in IGLOO PLUS Devices
For IGLOO PLUS V2 or V5 Devices, 1.5 V Core Supply Voltage
Parameter Definition
Device-Specific Static Power (mW)
AGLP125 AGLP060 AGLP030
PDC1 Array static power in Active mode See Table 2-12 on page 2-8
PDC2 Array static power in Static (Idle) mode See Table 2-11 on page 2-8
PDC3 Array static power in Flash*F r eeze mode See Table 2-9 on page 2-7
PDC4 Static PLL contribution 1.841
PDC5 Bank quiescent power (VCCI-dependent) See Table 2-12 on page 2-8
Notes:
1. This is the minimum contribution of the PLL when operating at lowest frequency.
2. For a different out put l oad, dri ve streng th, o r slew rat e, Acte l rec ommend s usi ng the Ac tel po we r spreads heet ca lcu lat or
or the SmartPower tool in Actel Libero® Integrated Design Environment (IDE) software.
Table 2-17 • Different Components Contributing to Dynamic Power Consumption in IGLOO PLUS Devices
For IGLOO PLUS V2 Devices, 1.2 V Core Supply Voltage
Parameter Definition
Device-Specific Dynamic Power
(µW/MHz)
AGLP125 AGLP060 AGLP030
PAC1 Clock contribution of a Global Rib 7.07 5.96 5.96
PAC2 Clock contribution of a Global Spine 0.52 0.52 0.26
PAC3 Clock contribution of a VersaTile row 0.52
PAC4 Clock contri bution of a VersaTile used as a sequential module 0.07
PAC5 First con tribution of a VersaTile used as a sequential module 0.045
PAC6 Second contribution of a VersaTile used as a sequential module 0.186
PAC7 Contribution of a VersaTile used as a combinatorial module 0.11
PAC8 Average contribution of a routing net 0.45
PAC9 Contribution of an I/O input pin (standard-dependent) See Table 2-13 on page 2-9
PAC10 Contribution of an I/O output pin (standard-dependent) See Table 2-14 on page 2-9
PAC11 Average contribution of a RAM block during a read operation 25.00
PAC12 Average contribution of a RAM bl ock during a write operation 30.00
PAC13 Dynamic contribution for PLL 2.10
IGLOO PLUS DC and Switching Characteristi c s
2-12 Revision 11
Power Calculation Methodology
This section describes a simplified method to estimate power consumption of an application. For more
accurate and detailed power estimations, use the SmartPower tool in Actel Libero IDE software.
The power calculation methodology described below uses the following variables:
• The number of PLLs as well as the number and the frequency of each output clock generated
• The number of combinatorial and sequential cells used in the design
• The internal clock frequencies
• The number and the standard of I/O pins used in the design
• The number of RAM blocks used in the design
• Toggle rates of I/O pins as well as VersaTiles—guidelines are provided in Table 2-19 on
page 2-14.
• Enable rates of output buffers—guidelines are provided for typical applications in Table 2-20 on
page 2-14.
• Read rate and write rate to the memory—guidelines are provided for typical applications in
Table 2-20 on page 2-14. The calculation should be repeated for each clock domain defined in the
design.
Methodology
Total Power Consumption—PTOTAL
PTOTAL = PSTAT + PDYN
PSTAT is the total static power consumption.
PDYN is the total dynamic power consumption.
Total Static Power Consumption—PSTAT
PSTAT = (PDC1 or PDC2 or PDC3) + NBANKS * PDC5
NBANKS is the number of I/O banks powered in the design.
Total Dynamic Power Consumption—PDYN
PDYN = PCLOCK + PS-CELL + PC-CELL + PNET + PINPUTS + POUTPUTS + PMEMORY + PPLL
Global Clock Contribution—PCLOCK
PCLOCK = (PAC1 + NSPINE*PAC2 + NROW*PAC3 + NS-CELL* PAC4) * FCLK
NSPINE is the number of global spines used in the user design—guidelines are provided in
Table 2-19 on page 2-14.
NROW is the number of VersaTile rows used in the design—guidelines are provided in
Table 2-19 on page 2-14.
Table 2-18 • Different Components Contributing to the Static Power Consumption in IGLOO PLUS Devices
For IGLOO PLUS V2 Devices, 1.2 V Core Supply Voltage
Parameter Definition
Device-Specific Static Power (mW)
AGLP125 AGLP060 AGLP030
PDC1 Array static power in Active mode See Table 2-12 on page 2-8
PDC2 Array static power in S tatic (Idle) mode See Table 2-11 on page 2-8
PDC3 Array static power in Flash*Freeze mode See Table 2-9 on page 2-7
PDC4 Static PLL contribution 0.901
PDC5 Bank quiescent power (VCCI-dependent) See Table 2-12 on page 2-8
Notes:
1. This is the minimum contribution of the PLL when operating at lowest frequency.
2. For a different o utput load, drive strength, or slew rate, Actel recommends using the Actel power spreadsheet calcul ator
or the SmartPower tool in Actel Libero IDE software.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-13
FCLK is the global clock signal frequency.
NS-CELL is the number of VersaTiles used as sequential modules in the design.
PAC1, PAC2, PAC3, and PAC4 are device-dependent.
Sequential Cells Contribution—PS-CELL
PS-CELL = NS-CELL * (PAC5 + α1 / 2 * PAC6) * FCLK
NS-CELL is the number of VersaTiles used as sequential modules in the design. When a
multi-tile sequential cell is used, it should be accounted for as 1.
α1 is the toggle rate of VersaTile outputs—guidelines are provided in Table 2-19 on
page 2-14.
FCLK is the global clock signal frequency.
Combinatorial Cells Contribution—PC-CELL
PC-CELL = NC-CELL* α1 / 2 * PAC7 * FCLK
NC-CELL is the number of VersaTiles used as combinatorial modules in the design.
α1 is the toggle rate of VersaTile outputs—guidelines are provided in Table 2-19 on
page 2-14.
FCLK is the global clock signal frequency.
Routing Net Contribution—PNET
PNET = (NS-CELL + NC-CELL) * α1 / 2 * PAC8 * FCLK
NS-CELL is the number of VersaTiles used as sequential modules in the design.
NC-CELL is the number of VersaTiles used as combinatorial modules in the design.
α1 is the toggle rate of VersaTile outputs—guidelines are provided in Table 2-19 on
page 2-14.
FCLK is the global clock signal frequency.
I/O Input Buffer Contribution—PINPUTS
PINPUTS = NINPUTS * α2 / 2 * PAC9 * FCLK
NINPUTS is the number of I/O input buffers used in the design.
α2 is the I/O buffer toggle rate—guidelines are provided in Table 2-19 on page 2-14.
FCLK is the global clock signal frequency.
I/O Output Buffer Contribution—POUTPUTS
POUTPUTS = NOUTPUTS * α2 / 2 * β1 * PAC10 * FCLK
NOUTPUTS is the number of I/O output buffers used in the design.
α2 is the I/O buffer toggle rate—guidelines are provided in Table 2-19 on page 2-14.
β1 is the I/O buffer enable rate—guidelines are provided in Table 2-20 on page 2-14.
FCLK is the global clock signal frequency.
RAM Contribution—PMEMORY
PMEMORY = PAC11 * NBLOCKS * FREAD-CLOCK * β2 + PAC12 * NBLOCK * FWRITE-CLOCK * β3
NBLOCKS is the number of RAM blocks used in the design.
FREAD-CLOCK is the memory read clock frequency.
β2 is the RAM enable rate for read operations.
FWRITE-CLOCK is the memory write clock frequency.
β3 is the RAM enable rate for write operations—guidelines are provided in Table 2-20 on
page 2-14.
PLL Contribution—PPLL
PPLL = PDC4 + PAC13 *FCLKOUT
FCLKOUT is the output clock frequency.1
IGLOO PLUS DC and Switching Characteristi c s
2-14 Revision 11
Guidelines
Toggle Rate Definition
A toggle rate defines the freque ncy of a net or logic elem ent relative to a clock. It is a percentage. If the
toggle rate of a net is 100%, this means that this net switches at half the clock frequency. Below are
some examples:
• The average toggle rate of a shift register is 100% because all flip-flop outputs toggle at half of the
clock frequency.
• The average toggle rate of an 8-bit counter is 25%:
– Bit 0 (LSB) = 100%
– Bit 1 = 50%
– Bit 2 = 25%
–…
– Bit 7 (MSB) = 0.78125%
– Average toggle rate = (100% + 50% + 25% + 12.5% + . . . + 0.78125%) / 8
Enable Rate Definition
Output enable rate is the average percentage of time during which tristate outputs are enabled. When
nontristate output buffers are used, the enable rate should be 100%.
1. If a PLL is used to generate more than one output clock, include each output clock in the formula by adding its corresponding
contribution (PAC13* FCLKOUT product) to the total PLL contribution.
Table 2-19 • Toggle Rate Guidelines Recommended for Power Calculation
Component Definition Guideline
α1Toggle rate of VersaTile outputs 10%
α2I/O buffer toggle rate 10%
Table 2-20 • Enable Rate Guidelines Recommended for Power Calculation
Component Definition Guideline
β1I/O output buffer enable rate 100%
β2RAM enable rate for read operations 12.5%
β3RAM enable rate for write operations 12.5%
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-15
User I/O Characteristics
Timing Model
Figure 2-3 • Timing Model
Operating Conditions: STD Speed, Commercial Temperature Range (TJ = 70°C), Worst-Case
VCC = 1.425 V, for DC 1.5 V Core Voltage, Applicable to V2 and V5 Devices
DQ
Y
Y
DQ
DQ DQ
Y
Combinational Cell
Combinational Cell
Combinational Cell
I/O Module
(Registered)
I/O Module
(Non-Registered)
Register Cell Register Cell I/O Module
(Registered)
I/O Module
(Non-Registered)
LVCMOS 2.5 V Output Drive
Strength = 12 mA High Slew Rate
Input LVCMOS 2.5 V
LVCMOS 1.5 V
LVTTL 3.3 V Output drive
strength = 12 mA High slew rate
Y
Combinational Cell
Y
Combinational Cell
Y
Combinational Cell
I/O Module
(Non-Registered)
LVTTLOutput drive strength = 8 mA
High slew rate
I/O Module
(Non-Registered)
LVCMOS 1.5 VOutput drive strength = 4 mA
High slew rate
LVTTLOutput drive strength = 12 mA
High slew rate
I/O Module
(Non-Registered)
Input LVTTL
Clock
Input LVTTL
Clock
Input LVTTL
Clock
tPD = 1.40 ns tPD = 0.89 ns tDP = 1.62 ns
tPD = 1.98 ns tDP = 1.62 ns
tPD = 1.24 ns tDP = 1.70 ns
tPD = 0.86 ns tDP = 2.07 ns
tPD = 0.87 ns
tPY = 0.85 ns
tCLKQ = 0.80 ns tOCLKQ = 0.89 ns
tSUD = 0.84 ns tOSUD = 0.18 ns
tDP = 1.62 ns
tPY = 0.85 ns
tPY = 1.15 ns
tCLKQ = 0.80 ns
tSUD = 0.84 ns
tPY = 0.85 ns
tICLKQ = 0.63 ns
tISUD = 0.18 ns
tPY = 1.06 ns
IGLOO PLUS DC and Switching Characteristi c s
2-16 Revision 11
Figure 2- 4 • Input Buffer Timing Model and Delays (example)
tPY
(R)
PAD
Y
Vtrip
GND tPY
(F)
Vtrip
50%
50%
VIH
VCC
VIL
tDOUT
(R)
DIN
GND tDOUT
(F)
50%50% VCC
PAD Y
tPY
D
CLK
Q
I/O Interface
DIN
tDIN
To Array
tPY = MAX(tPY(R), tPY(F))
tDIN = MAX(tDIN(R), tDIN(F))
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-17
Figure 2- 5 • Output Buffer Model and Delays (example)
tDP
(R)
PAD VOL
tDP
(F)
Vtrip
Vtrip
VOH
VCC
D50% 50%
VCC
0 V
DOUT 50% 50% 0 V
tDOUT
(R) tDOUT
(F)
From Array
PAD
tDP
Std
Load
D
CLK
Q
I/O Interface
DOUT
D
tDOUT
tDP = MAX(tDP(R), tDP(F))
tDOUT = MAX(tDOUT(R), tDOUT(F))
IGLOO PLUS DC and Switching Characteristi c s
2-18 Revision 11
Figure 2-6 • Tristate Output Buffer Timing Model and Delays (example )
D
CLK
Q
D
CLK
Q
10% V
CCI
t
ZL
Vtrip
50%
t
HZ
90% VCCI
t
ZH
Vtrip
50% 50% t
LZ
50%
EOUT
PAD
D
E50%
t
EOUT (R)
50%t
EOUT (F)
PAD
DOUT
EOUT
D
I/O Interface
E
t
EOUT
t
ZLS
Vtrip
50%
t
ZHS
Vtrip
50%
EOUT
PAD
D
E50% 50%
t
EOUT (R)
t
EOUT (F)
50%
VCC
VCC
VCC
VCCI
VCC
VCC
VCC
VOH
VOL
VOL
t
ZL
, t
ZH
, t
HZ
, t
LZ
, t
ZLS
, t
ZHS
t
EOUT
= MAX(t
EOUT
(r), t
EOUT
(f))
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-19
Overview of I/O Performance
Summary of I/O DC Input and Output Levels – Default I/O Software
Settings
Table 2-21 • Summary of Maximum and Minimum DC Input and Output Levels Applicable to Commercial and
Industrial Conditions—Software Default Settings
I/O Standard Drive
Strength
Equiv.
Software
Default
Drive
Strength
Option2Slew
Rate
VIL VIH VOL VOH IOL1IOH1
Min.
VMax.
VMin.
VMax.
VMax.
VMin.
VmAmA
3.3 V LVTT L /
3.3 V LVCMOS 12 mA 12 mA High –0 .3 0.8 2 3.6 0.4 2.4 12 12
3.3 V LVCMOS
Wide Range3100 µA 12 mA High –0.3 0.8 2 3.6 0 .2 VDD 3 0.2 0.1 0.1
2.5 V LVCMOS 12 mA 12 mA High –0.3 0.7 1.7 3.6 0.7 1.7 12 12
1.8 V LVCMOS 8 mA 8 mA High –0.3 0.35 * VCCI 0.65 * VCCI 3.6 0.45 VCCI – 0.45 8 8
1.5 V LVCMOS 4 mA 4 mA High –0.3 0.35 * VCCI 0.65 * VCCI 3.6 0.25 * VCCI 0.75 * VCCI 4 4
1.2 V
LVCMOS42 mA 2 mA High –0.3 0.35 * VCCI 0.65 * VCCI 3.6 0.25 * VCCI 0.75 * VCCI 2 2
1.2 V LVCMOS
Wide Range4,5 100 µA 2 mA High –0.3 0.3 * VCCI 0.7 * VCCI 3.6 0.1 VCCI – 0.1 0.1 0.1
Notes:
1. Currents are measured at 85°C junct ion temperature.
2. Note that 1.2 V LVCMOS and 3.3 V LVCMOS wide range are applicable to 100 µA drive strength only. The configuration
will not operate at the equivalent software default drive strength. These values are for norma l ranges only.
3. All LVCMOS 3.3 V software macros support LVCMOS 3.3 V wide range as specified in the JESD-8B specification.
4. Applicable to IGLOO PLUS V2 devices operating at VCCI
≥
VCC.
5. All LVCMOS 1.2 V software macros support LVCMOS 1.2 V wide range as specified in the JESD8-12 specification.
IGLOO PLUS DC and Switching Characteristi c s
2-20 Revision 11
Table 2-22 • Summary of Maximum and Minimum DC Input Levels
Applicable to Commercial and Industrial Conditions
DC I/O Standards
Commercial1Industrial2
IIL3IIH4IIL3IIH4
µA µA µA µA
3.3 V LVTTL / 3.3 V LVCMOS 10 10 15 15
3.3 V LVCMOS Wide Range 10 10 15 15
2.5 V LVCMOS 10 10 15 15
1.8 V LVCMOS 10 10 15 15
1.5 V LVCMOS 10 10 15 15
1.2 V LVCMOS5 10 10 15 15
1.2 V LVCMOS Wide Range510 10 15 15
Notes:
1. Commercial range (0°C < TA < 70°C)
2. Industrial range (–40°C < TA < 85°C)
3. IIL is the input leakage current per I/O pin over recommended operation conditions where –0.3 V < VI N < VIL.
4. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
5. Applicable to IGLOO PLUS V2 devices operating at VCCI
≥
VCC.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-21
Summary of I/O Timing Characteristics – Default I/O Software Settings
Table 2-23 • Summary of AC Measuring Points
Standard Measuring Trip Point (Vtrip)
3.3 V LVTTL / 3.3 V LVCMOS 1.4 V
3.3 V LVCMOS Wide Range 1.4 V
2.5 V LVCMOS 1.2 V
1.8 V LVCMOS 0.90 V
1.5 V LVCMOS 0.75 V
1.2 V LVCMOS 0.60 V
1.2 V LVCMOS Wide Range 0.60 V
Table 2-24 • I/O AC Parameter Definitions
Parameter Parameter Definition
tDP Data to Pad delay through the Output Buffer
tPY Pad to Data delay through the Input Buffer
tDOUT Data to Output Buf f er delay through the I/O interface
tEOUT Enable to Output Buffer Tristate Control delay through the I/O interface
tDIN Input Buffer to Data delay through the I/O interface
tHZ Enable to Pad delay through the Outpu t Buffer—High to Z
tZH Enable to Pad delay through the Output Buffer—Z to High
tLZ Enable to Pad delay through the Output Buffer—Low to Z
tZL Enable to Pad delay through the Output Buffer—Z to Low
tZHS Enable to Pad delay through the Output Buffer with delayed enable—Z to High
tZLS Enable to Pad delay through the Output Buffer with delayed enable—Z to Low
IGLOO PLUS DC and Switching Characteristi c s
2-22 Revision 11
Table 2-25 • Summary of I/O Timing Characteristics—Software Default Settings, STD Spee d Grade,
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 42 5 V, Wor s t-C as e VCCI = 3.0 V
I/O Standard
Drive Strength
Equivalent Software Default
Drive Strength Option1
Slew Rate
Capacitive Load (pF)
External Resistor (Ω)
tDOUT
tDP
tDIN
tPY
tPYS
tEOUT
tZL
tZH
tLZ
tHZ
Units
3.3 V LVTT L /
3.3 V LVCMOS 12 mA 12 mA High 5 pF – 0.97 1.76 0.18 0.85 1.15 0.66 1.80 1.39 2.20 2.64 ns
3.3 V LVCMOS
Wide Range2100 µA 12 mA High 5 pF – 0.97 2.47 0.18 1.18 1.64 0.66 2.48 1.91 3.16 3.76 ns
2.5 V LVCMOS 12 mA 12 mA High 5 pF – 0.97 1.77 0.18 1.06 1.22 0.66 1.81 1.51 2.2 2 2.56 ns
1.8 V LVCMOS 8 mA 8 mA High 5 pF – 0.97 2.00 0.18 1.00 1.43 0.66 2.04 1.76 2.29 2.55 ns
1.5 V LVCMOS 4 mA 4 mA High 5 pF – 0.97 2.29 0.18 1.16 1.62 0.66 2.33 2.00 2.37 2.57 ns
Notes:
1. Note that 3.3 V LVCMOS wide range is applicable to 100 µA drive strength only. The configuration will not operate at the
equivalent software de fault drive strength. These values are for normal ranges only.
2. All LVCMOS 3.3 V software macros support LVCMOS 3.3 V wide range as specified in the JESD-8B specification.
3. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derati n g valu es.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-23
Table 2-26 • Summary of I/O Timing Characteristics—Software Default Settings, STD Speed Grade
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 3.0 V
I/O Standard
Drive Strength
Equivalent Software Default
Drive Strength Option1
Slew Rate
Capacitive Load (pF)
External Resistor (Ω)
tDOUT
tDP
tDIN
tPY)
tPYS
tEOUT
tZL
tZH
tLZ
tHZ
Units
3.3 V LVTT L /
3.3 V LVCMOS 12 mA 12 mA High 5 pF – 0.98 2.31 0.19 0.99 1.37 0.67 2.34 1.86 2.65 3.38 ns
3.3 V LVCMOS
Wide Range2100 µA12 mA High 5 pF – 0.98 3.21 0.19 1.32 1.92 0.67 3.21 2.52 3.73 4.73 ns
2.5 V LVCMOS 12 mA 12 mA High 5 pF – 0.98 2.29 0.19 1.19 1.40 0.67 2.32 1.94 2.65 3.27 ns
1.8 V LVCMOS 8 mA 8 mA High 5 pF – 0.98 2.45 0.19 1.12 1.61 0.67 2.48 2.16 2.71 3.16 n s
1.5 V LVCMOS 4 mA 4 mA High 5 pF – 0.98 2.71 0.19 1.26 1.80 0.67 2.75 2.39 2.78 3.15 n s
1.2 V LVCMOS 2 mA 2 mA High 5 pF – 0.98 3.380.191.572.340.673.262.782.993.24ns
1.2 V LVCMOS
Wide Range3100 µA 2 mA High 5 pF – 0.98 3.38 0.19 1.57 2.34 0.67 3.26 2.78 2.99 3.24 ns
Notes:
1. The minimum drive strength for any LVCMOS 3.3 V software configuration when run in wide range is ±100 µA. Drive
strength displa yed in the software is supported for normal range only. For a detailed I/V curve, refer to the IBIS models.
2. All LVCMOS 3.3 V software macros support LVCMOS 3.3 V wide range as specified in the JESD-8B specification.
3. All LVCMOS 1.2 V software macros support LVCMOS 1.2 V wide range as specified in the JESD8-12 specification.
4. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derati n g valu es.
IGLOO PLUS DC and Switching Characteristi c s
2-24 Revision 11
Detailed I/O DC Characteristics
Table 2-27 • Input Capacitance
Symbol Definition Conditions Min. Max. Units
CIN Input capacitance VIN = 0, f = 1.0 MHz 8 pF
CINCLK Input capacitance on the clock pin VIN = 0, f = 1.0 MHz 8 pF
Table 2-28 • I/O Output Buffer Maximum Resistances 1
Standard Drive Strength RPULL-DOWN
(Ω)2RPULL-UP
(Ω)3
3.3 V LVTTL / 3.3V LVCMOS 2 mA 100 300
4 mA 100 300
6 mA 50 150
8 mA 50 150
12 mA 25 75
16 mA 25 75
3.3 V LVCMOS Wide Range 100 µA Same as equivalent software default drive
2.5 V LVCMOS 2 mA 100 200
4 mA 100 200
6 mA 50 100
8 mA 50 100
12 mA 25 50
1.8 V LVCMOS 2 mA 200 225
4 mA 100 112
6 mA 50 56
8 mA 50 56
1.5 V LVCMOS 2 mA 200 224
4 mA 100 112
1.2 V LVCMOS 2 mA 157.5 163.8
1.2 V LVCMOS Wide Range4100 µA 157.5 163.8
Notes:
1. These maximum values are provided for informational reasons only. Minimum output buffer resistance values depend
on VCCI, drive strength selection, temperature, and process. For board design considerations and detailed output buffer
resistances, use th e c orre spon din g IBI S mode l on t he Ac tel web sit e at http://www.actel.com/download/ibis/default.aspx.
2. R(PULL-DOWN-MAX) = (VOLspec) / IOLspec
3. R(PULL-UP-MAX) = (VCCImax – VOHspec) / IOHspec
4. Applicable to IGLOO PLUS V2 devices operating at VCCI ≥ VCC.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-25
Table 2-29 • I/O Weak Pull-Up/Pull-Down Resistances
Minimum and Maximum Weak Pull-Up/Pull-Down Resistance Values
VCCI
R(WEAK PULL-UP)1
(Ω)R(WEAK PULL-DOWN)2
(Ω)
Min. Max. Min. Max.
3.3 V 10 K 45 K 10 K 45 K
3.3 V (wide range I/Os) 10 K 45 K 10 K 45 K
2.5 V 11 K 55 K 12 K 74 K
1.8 V 18 K 70 K 17 K 110 K
1.5 V 19 K 90 K 19 K 140 K
1.2 V 25 K 110 K 25 K 150 K
1.2 V (wide range I/Os) 19 K 110 K 19 K 150 K
Notes:
1. R(WEAK PULL-UP-MAX) = (VCCImax – VOHspec) / I(WEAK PULL-U P-MIN)
2. R(WEAK PULLDOWN-MAX) = (VOLspec) / I(WEAK PULLDOWN-MIN)
Table 2-30 • I/O Short Currents IOSH/IOSL
Drive Strength IOSL (mA)* IOSH (mA)*
3.3 V LVTTL / 3.3 V LVCMOS 2 mA 27 25
4 mA 27 25
6 mA 54 51
8 mA 54 51
12 mA 109 103
16 mA 109 103
3.3 V LVCMOS Wide Range 100 µA Same as equivalen t software default drive
2.5 V LVCMOS 2 mA 18 16
4 mA 18 16
6 mA 37 32
8 mA 37 32
12 mA 74 65
1.8 V LVCMOS 2 mA 11 9
4 mA 22 17
6 mA 44 35
8 mA 44 35
1.5 V LVCMOS 2 mA 16 13
4 mA 33 25
1.2 V LVCMOS 2 mA 26 20
1.2 V LVCMOS Wide Range 100 µA 26 20
*TJ = 100°C
IGLOO PLUS DC and Switching Characteristi c s
2-26 Revision 11
The length of time an I/O can withstand IOSH/IOSL events depends on the junction temperature. The
reliability data below is based on a 3.3 V, 12 mA I/O setting, which is the worst case for this type of
analysis.
For example, at 100°C, the short curren t condition woul d have to be sustained for more than six months
to cause a reliability concern. The I/O design does not contain any short circuit protection, but such
protection would only be needed in extremely prolonged stress conditions.
Table 2-31 • Duration of Short Circuit Event before Failure
Temperature Time before Failure
–40°C > 20 years
0°C > 20 years
25°C > 20 years
70°C 5 years
85°C 2 years
100°C 6 months
Table 2-32 • Schmitt Trigger Input Hysteresis
Hysteresis Voltage Value (Typ.) for Schmitt Mode Input Buffers
Input Buffer Configuration Hysteresis Value (typ.)
3.3 V LVTTL/LVCMOS (Schmitt trigger mode) 240 mV
2.5 V LVCMOS (Schmitt trigger mode) 140 mV
1.8 V LVCMOS (Schmitt trigger mode) 80 mV
1.5 V LVCMOS (Schmitt trigger mode) 60 mV
1.2 V LVCMOS (Schmitt trigger mode) 40 mV
Table 2-33 • I/O Input Rise Time, Fall Time , and Related I/O Reliability
Input Buffer Input Rise/Fall
Time (min.) Input Rise/Fall Time
(max.) Reliability
LVTTL/LVCMOS (Schmitt trigger
disabled) No requireme nt 10 ns * 20 years (100°C)
LVTTL/LVCMOS (Schmitt trigger
enabled) No requirement No requirement, but
input noise voltage
cannot exceed Schmitt
hysteresis.
20 years (100°C)
*The maximum input rise/fall time is related to the noise i nduced into the inpu t buffer tra ce. If the noise is
low, then the rise time and fall time of input buffers can be increased beyond the maximum value. The
longer the rise/fall times, the more suscep tible the input signal is to the board noise. Actel recommends
signal integrity evaluation/characterization of the system to ensure that there is no excessive noise
coupling into input signals.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-27
Single-Ended I/O Characteristics
3.3 V LVTTL / 3.3 V LVCMOS
Low-Voltage Transistor–Transistor Logic (LVTTL) is a general-purpose standard (EIA/JESD) for 3.3 V
applications. It uses an LVTTL input buffer and push-pull output buffer.
Table 2-34 • Minimum and Maximum DC Input and Output Levels
3.3 V LVTTL /
3.3 V LVCMOS VIL VIH VOL VOH IOL IOH IOSL IOSH IIL1IIH2
Drive
Strength Min.
VMax.
VMin.
VMax.
VMax.
VMin.
VmAmAMax.
mA3Max.
mA3µA4µA4
2 mA –0.3 0.8 2 3.6 0.4 2.4 2 2 25 27 10 10
4 mA –0.3 0.8 2 3.6 0.4 2.4 4 4 25 27 10 10
6 mA –0.3 0.8 2 3.6 0.4 2.4 6 6 51 54 10 10
8 mA –0.3 0.8 2 3.6 0.4 2.4 8 8 51 54 10 10
12 mA –0.3 0.8 2 3.6 0.4 2.4 12 12 103 109 10 10
16 mA –0.3 0.8 2 3.6 0.4 2.4 16 16 103 109 10 10
Notes:
1. IIL is the input leakage current per I/O pin over recommended operation conditions where –0.3 V < VIN < VIL.
2. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
3. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
4. Currents are measured at 85°C junct ion temperature.
5. Software default selection highlighted in gray.
Figure 2-7 • AC Loading
Table 2-35 • AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V) Input High (V) Measuring Point* (V) CLOAD (pF)
03.31.45
*Measuring point = Vtrip. See Table 2-23 on page 2-21 for a complete table of trip points.
Test Point Test Point
Enable Path
Datapath 5 pF
R = 1 k R to VCCI for tLZ / tZL / tZLS
R to GND for tHZ / tZH / tZHS
35 pF for tZH / tZHS / tZL / tZLS
5 pF for tHZ / tLZ
IGLOO PLUS DC and Switching Characteristi c s
2-28 Revision 11
Timing Characteristics
Applies to 1.5 V DC Core Voltage
Applies to 1.2 V DC Core Voltage
Table 2-36 • 3.3 V LVTTL / 3.3 V LVCMOS Low Slew – Applies to 1.5 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 42 5 V, Wor s t-C as e VCCI = 3.0 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
4 mA STD 0.97 3.94 0.18 0.85 1.15 0.66 4.02 3.46 1.82 1.87 ns
6 mA STD 0.97 3.20 0.18 0.85 1.15 0.66 3.27 2.94 2.04 2.27 ns
8 mA STD 0.97 3.20 0.18 0.85 1.15 0.66 3.27 2.94 2.04 2.27 ns
12 mA STD 0.97 2.72 0.18 0.85 1.15 0.66 2.78 2.57 2.20 2.53 ns
16 mA STD 0.97 2.72 0.18 0.85 1.15 0.66 2.78 2.57 2.20 2.53 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
Table 2-37 • 3.3 V LVTTL / 3.3 V LVCMOS High Slew – Applies to 1.5 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.425 V, Worst-Case VCCI = 3.0 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
4 mA STD 0.97 2.36 0.18 0.85 1.15 0.66 2.41 1.90 1.82 1.98 ns
6 mA STD 0.97 1.96 0.18 0.85 1.15 0.66 2.01 1.56 2.04 2.38 ns
8 mA STD 0.97 1.96 0.18 0.85 1.15 0.66 2.01 1.56 2.04 2.38 ns
12 mA STD 0.97 1.76 0.18 0.85 1.15 0.66 1.80 1.39 2.20 2.64 ns
16 mA STD 0.97 1.76 0.18 0.85 1.15 0.66 1.80 1.39 2.20 2.64 ns
Notes:
1. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
2. Software default selection highlighted in gray.
Table 2-38 • 3.3 V LVTTL / 3.3 V LVCMOS Low Slew – Applies to 1.2 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 3.0 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
4 mA STD 0.98 4.56 0.19 0.99 1.37 0.67 4.63 3.98 2.26 2.57 ns
6 mA STD 0.98 3.80 0.19 0.99 1.37 0.67 3.96 3.45 2.49 2.98 ns
8 mA STD 0.98 3.80 0.19 0.99 137 0.67 3.86 3.45 2.49 2.98 ns
12 mA STD 0.98 3.31 0.19 0.99 1.37 0.67 3.36 3.07 2.65 3.25 ns
16 mA STD 0.98 3.31 0.19 0.99 1.37 0.67 3.36 3.07 2.65 3.25 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
Table 2-39 • 3.3 V LVTTL / 3.3 V LVCMOS High Slew – Applies to 1.2 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 3.0 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
4 mA STD 0.98 2.92 0.19 0.99 1.37 0.67 2.97 2.38 2.25 2.70 ns
6 mA STD 0.98 2.52 0.19 0.99 1.37 0.67 2.56 2.03 2.49 3.11 ns
8 mA STD 0.98 2.52 0.19 0.99 1.37 0.67 2.56 2.03 2.49 3.11 ns
12 mA STD 0.98 2.31 0.19 0.99 1.37 0.67 2.34 1.86 2.65 3.38 ns
16 mA STD 0.98 2.31 0.19 0.99 1.37 0.67 2.34 1.86 2.65 3.38 ns
Notes:
1. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
2. Software default selection highlighted in gray
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-29
3.3 V LVCMOS Wide Range
Table 2-40 • Minimum and Maximum DC Input and Output Levels
3.3 V L VCMOS
Wide Range
Equivalent
Software
Default
Drive
Strength
Option1VIL VIH VOL VOH IOL IOH IOSL IOSH IIL2IIH3
Drive
Strength Min.
VMax.
VMin.
VMax.
VMax.
VMin.
VµAµA
Max.
µA4Max.
µA4µA5µA5
100 µA 2 mA –0.3 0.8 2 3.6 0.2 VDD – 0.2 100 100 25 27 10 10
100 µA 4 mA –0.3 0.8 2 3.6 0.4 VDD – 0.2 100 100 25 27 10 10
100 µA 6 mA –0.3 0.8 2 3.6 0.4 VDD – 0.2 100 100 51 54 10 10
100 µA 8 mA –0.3 0.8 2 3.6 0.4 VDD – 0.2 100 100 51 54 10 10
100 µA 12 mA –0.3 0.8 2 3.6 0.4 VDD – 0.2 100 100 103 109 10 10
100 µA 16 mA –0.3 0.8 2 3.6 0.4 VDD – 0.2 100 100 103 109 10 10
Notes:
1. The minimum drive strength for any LVCMOS 3.3 V software configuration when run in wide range is ±100 µA. Drive
strength displayed in the software is supported for normal range only. Fo r a detailed I/V curve, refer to the IBIS models.
2. IIL is the input leakag e c urrent per I/O pin over recommended operation conditions where –0.3 V < VIN < VIL.
3. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < V CCI. Input current is
larger when operating outside recommended ranges.
4. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
5. Currents are measured at 85°C juncti on temperature.
6. Software default selection highlighted in gray.
Table 2-41 • AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V) Input High (V) Measuring Point* (V) CLOAD (pF)
03.31.45
*Measuring point = Vtrip. See Table 2-23 on page 2-21 for a complete table of trip points.
IGLOO PLUS DC and Switching Characteristi c s
2-30 Revision 11
Timing Characteristics
Applies to 1.5 V DC Core Voltage
Applies to 1.2 V DC Core Voltage
Table 2-42 • 3.3 V LVCMOS Wide Range Low Slew – Applies to 1.5 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 42 5 V, Wor s t-C as e VCCI = 2.7 V
Drive
Strength
Equivalent
Software
Default
Drive
Strength
Option1Speed
Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
100 µA 4 mA STD 0.97 5.85 0.18 1.18 1.64 0.66 5.86 5.05 2.57 2.57 ns
100 µA 6 mA STD 0.97 4.70 0.18 1.18 1.64 0.66 4.72 4.27 2.92 3.19 ns
100 µA 8 mA STD 0.97 4.70 0.18 1.18 1.64 0.66 4.72 4.27 2.92 3.19 ns
100 µA 12 mA STD 0.97 3.96 0.18 1.18 1.64 0.66 3.98 3.70 3.16 3.59 ns
100 µA 16 mA STD 0.97 3.96 0.18 1.18 1.64 0.66 3.98 3.70 3.16 3.59 ns
Notes:
1. The minimum drive strength for any LVCMOS 3.3 V software configuration when run in wide range is ±100 µA. Drive
strength displa yed in th e software is su pported fo r normal rang e only. For a det ailed I/V curve , refe r to the I BIS models.
2. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
Table 2-43 • 3.3 V LVCMOS Wide Range High Slew – Applies to 1.5 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.425 V, Worst-Case VCCI = 2.7 V
Drive
Strength
Equivalent
Software
Default
Drive
Strength
Option1S peed
Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
100 µA 4 mA STD 0.97 3.39 0.18 1.18 1.64 0.66 3.41 2.69 2.57 2.73 ns
100 µA 6 mA STD 0.97 2.79 0.18 1.18 1.64 0.66 2.80 2.17 2.92 3.36 ns
100 µA 8 mA STD 0.97 2.79 0.18 1.18 1.64 0.66 2.80 2.17 2.92 3.36 ns
100 µA 12 mA STD 0.97 2.47 0.18 1.18 1.64 0.66 2.48 1.91 3.16 3.76 ns
100 µA 16 mA STD 0.97 2.47 0.18 1.18 1.64 0.66 2.48 1.91 3.16 3.76 ns
Notes:
1. The minimum drive strength for any LVCMOS 3.3 V software configuration when run in wide range is ±100 µA. Drive
strength displayed in the software is supported for normal range only. For a detailed I/V curve, refer to the IBIS models.
2. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
3. Software default selection highlighted in gray.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-31
Table 2-44 • 3.3 V LVCMOS Wide Range Low Slew – Applies to 1.2 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 42 5 V, Wor s t-C as e VCCI = 2.7 V
Drive
Strength
Equivalent
Software
Default
Drive
Strength
Option1Speed
Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
100 µA 4 mA STD 0.98 6.68 0.19 1.32 1.92 0.67 6.68 5.74 3.13 3.47 ns
100 µA 6 mA STD 0.98 5.51 0.19 1.32 1.92 0.67 5.51 4.94 3.48 4.11 ns
100 µA 8 mA STD 0.98 5.51 0.19 1.32 1.92 0.67 5.51 4.94 3.48 4.11 ns
100 µA 12 mA STD 0.98 4.75 0.19 1.32 1.92 0.67 4.75 4.36 3.73 4.52 ns
100 µA 16 mA STD 0.98 4.75 0.19 1.32 1.92 0.67 4.75 4.36 3.73 4.52 ns
Notes:
1. The minimum drive strength for any LVCMOS 3.3 V software configuration when run in wide range is ±100 µA. Drive
strength displayed in the software is supported for normal range only. For a detailed I/V curve, refer to the IBIS models.
2. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
Table 2-45 • 3.3 V LVCMOS Wide Range High Slew – Applies to 1.2 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.425 V, Worst-Case VCCI = 2.7 V
Drive
Strength
Equivalent
Software
Default
Drive
Strength
Option1S peed
Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
100 µA 4 mA STD 0.98 4.16 0.19 1.32 1.92 0.67 4.16 3.32 3.12 3.66 ns
100 µA 6 mA STD 0.98 3.54 0.19 1.32 1.92 0.67 3.54 2.79 3.48 4.31 ns
100 µA 8 mA STD 0.98 3.54 0.19 1.32 1.92 0.67 3.54 2.79 3.48 4.31 ns
100 µA 12 mA STD 0.98 3.21 0.19 1.32 1.92 0.67 3.21 2.52 3.73 4.73 ns
100 µA 16 mA STD 0.98 3.21 0.19 1.32 1.92 0.67 3.21 2.52 3.73 4.73 ns
Notes:
1. The minimum drive strength for any LVCMOS 3.3 V software configuration when run in wide range is ±100 µA. Drive
strength displayed in the software is supported for normal range only. For a detailed I/V curve, refer to the IBIS models.
2. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
3. Software default selection highlighted in gray.
IGLOO PLUS DC and Switching Characteristi c s
2-32 Revision 11
2.5 V LVCMOS
Low-Voltage CMOS for 2.5 V is an extension of the LVCMOS standard (JESD8-5) used for general-
purpose 2.5 V applicati ons.
Table 2-46 • Minimum and Maximum DC Input and Output Levels
2.5 V
LVCMOS VIL VIH VOL VOH IOL IOH IOSL IOSH IIL1IIH2
Drive
Strength Min.
VMax.
VMin.
VMax.
VMax.
VMin.
VmAmAMax.
mA3Max.
mA3µA4µA4
2 mA –0.3 0.7 1.7 3.6 0.7 1.7 2 2 16 18 10 10
4 mA –0.3 0.7 1.7 3.6 0.7 1.7 4 4 16 18 10 10
6 mA –0.3 0.7 1.7 3.6 0.7 1.7 6 6 32 37 10 10
8 mA –0.3 0.7 1.7 3.6 0.7 1.7 8 8 32 37 10 10
12 mA –0.3 0.7 1.7 3.6 0.7 1.7 12 12 65 74 10 10
Notes:
1. IIL is the input leakage current per I/O pin over recommended operation conditions where –0.3 V < VIN < VIL.
2. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
3. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
4. Currents are measured at 85°C junction temperature.
5. Software default selection highlighted in gray.
Figure 2-8 • AC Loading
Table 2-47 • AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V) Input High (V) Measuring Point* (V) CLOAD (pF)
02.51.25
*Measuring point = Vtrip. See Table 2-23 on page 2-21 for a complete table of trip points.
Test Point Test Point
Enable Path
Datapath 5 pF
R = 1 k R to VCCI for tLZ / tZL / tZLS
R to GND for tHZ / tZH / tZHS
35 pF for tZH / tZHS / tZL / tZLS
5 pF for tHZ / tLZ
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-33
Timing Characteristics
Applies to 1.5 V DC Core Voltage
Applies to 1.2 V DC Core Voltage
Table 2-48 • 2.5 V LVCMOS Low Slew – Applies to 1.5 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 42 5 V, Wor s t-C as e VCCI = 2.3 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
4 mA STD 0.97 4.44 0.18 1.06 1.22 0.66 4.53 4.15 1.80 1.70 ns
6 mA STD 0.97 3.61 0.18 1.06 1.22 0.66 3.69 3.50 2.05 2.18 ns
8 mA STD 0.97 3.61 0.18 1.06 1.22 0.66 3.69 3.50 2.05 2.18 ns
12 mA STD 0.97 3.07 0.18 1.06 1.22 0.66 3.14 3.03 2.22 2.48 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
Table 2-49 • 2.5 V LVCMOS High Slew – Applies to 1.5 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 42 5 V, Wor s t-C as e VCCI = 2.3 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
4 mA STD 0.97 2.41 0.18 1.06 1.22 0.66 2.47 2.22 1.79 1.77 ns
6 mA STD 0.97 1.99 0.18 1.06 1.22 0.66 2.04 1.75 2.04 2.25 ns
8 mA STD 0.97 1.99 0.18 1.06 1.22 0.66 2.04 1.75 2.04 2.25 ns
12 mA STD 0.97 1.77 0.18 1.06 1.22 0.66 1.81 1.51 2.22 2.56 ns
Notes:
1. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
2. Software default selection highlighted in gray.
Table 2-50 • 2.5 LVCMOS Low Slew – Applies to 1.2 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 2.3 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
4 mA STD 0.98 5.04 0.19 1.19 1.40 0.67 5.12 4.65 2.22 2.36 ns
6 mA STD 0.98 4.19 0.19 1.19 1.40 0.67 4.25 3.98 2.48 2.85 ns
8 mA STD 0.98 4.19 0.19 1.19 1.40 0.67 4.25 3.98 2.48 2.85 ns
12 mA STD 0.98 3.63 0.19 1.19 1.40 0.67 3.69 3.50 2.66 3.16 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
Table 2-51 • 2.5 V LVCMOS High Slew – Applies to 1.2 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 2.3 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
4 mA STD 0.98 2.96 0.19 1.19 1.40 0.67 3.00 2.67 2.22 2.46 ns
6 mA STD 0.98 2.52 0.19 1.19 1.40 0.67 2.56 2.18 2.47 2.95 ns
8 mA STD 0.98 2.52 0.19 1.19 1.40 0.67 2.56 2.18 2.47 2.95 ns
12 mA STD 0.98 2.29 0.19 1.19 1.40 0.67 2.32 1.94 2.65 3.27 ns
Notes:
1. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
2. Software default selection highlighted in gray.
IGLOO PLUS DC and Switching Characteristi c s
2-34 Revision 11
1.8 V LVCMOS
Low-voltage CMOS for 1.8 V is an extension of the LVCMOS standard (JESD8-5) used for general-
purpose 1.8 V applications. It uses a 1.8 V input buffer and a push-pull output buffer.
Table 2-52 • Minimum and Maximum DC Input and Output Levels
1.8 V
LVCMOS VIL VIH VOL VOH IOL IOH IOSL IOSH IIL1IIH2
Drive
Strength Min., V Max., V Min., V Max., V Max., V Min., V mA mA Max., mA3Max., mA3µA4µA4
2 mA –0.3 0.35 * VCCI 0.65 * VCCI 3.6 0.45 VCCI – 0.45 2 2 9 11 10 10
4 mA –0.3 0.35 * VCCI 0.65 * VCCI 3.6 0.45 VCCI – 0.45 4 4 17 22 10 10
6 mA –0.3 0.35 * VCCI 0.65 * VCCI 3.6 0.45 VCCI – 0.45 6 6 35 44 10 10
8 mA –0.3 0.35 * VCCI 0.65 * VCCI 3.6 0.45 VCCI – 0.45 8 8 35 44 10 10
Notes:
1. IIL is the input leakag e current per I/O pin over recommended operation conditions where –0.3 V < VIN < VIL.
2. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
3. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
4. Currents are measured at 85°C juncti on temperature.
5. Software default selection highlighted in gray.
Figure 2-9 • AC Loading
Table 2-53 • AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V) Input High (V) Measuring Point* (V) CLOAD (pF)
01.80.95
*Measuring point = Vtrip. See Table 2-23 on page 2-21 for a complete table of trip points.
Test Point Test Point
Enable Path
Datapath 5 pF
R = 1 k R to VCCI for tLZ / tZL / tZLS
R to GND for tHZ / tZH / tZHS
35 pF for tZH / tZHS / tZL / tZLS
5 pF for tHZ / tLZ
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-35
Timing Characteristics
Applies to 1.5 V DC Core Voltage
Applies to 1.2 V DC Core Voltage
Table 2-54 • 1.8 V LVCMOS Low Slew – Applies to 1.5 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 42 5 V, Wor s t-C as e VCCI = 1.7 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
2 mA STD 0.97 5.89 0.18 1.00 1.43 0.66 6.01 5.43 1.78 1.30 ns
4 mA STD 0.97 4.82 0.18 1.00 1.43 0.66 4.92 4.56 2.08 2.08 ns
6 mA STD 0.97 4.13 0.18 1.00 1.43 0.66 4.21 3.96 2.30 2.46 ns
8 mA STD 0.97 4.13 0.18 1.00 1.43 0.66 4.21 3.96 2.30 2.46 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
Table 2-55 • 1.8 V LVCMOS High Slew – Applies to 1.5 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 42 5 V, Wor s t-C as e VCCI = 1.7 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
2 mA STD 0.97 2.82 0.18 1.00 1.43 0.66 2.88 2.78 1.78 1.35 ns
4 mA STD 0.97 2.30 0.18 1.00 1.43 0.66 2.35 2.11 2.08 2.15 ns
6 mA STD 0.97 2.00 0.18 1.00 1.43 0.66 2.04 1.76 2.29 2.55 ns
8 mA STD 0.97 2.00 0.18 1.00 1.43 0.66 2.04 1.76 2.29 2.55 ns
Notes:
1. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
2. Software default selection highlighted in gray.
Table 2-56 • 1.8 V LVCMOS Low Slew – Applies to 1.2 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 1.7 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
2 mA STD 0.98 6.43 0.19 1.12 1.61 0.67 6.54 5.93 2.19 1.88 ns
4 mA STD 0.98 5.33 0.19 1.12 1.61 0.67 5.41 5.03 2.50 2.68 ns
6 mA STD 0.98 4.61 0.19 1.12 1.61 0.67 4.69 4.41 2.72 3.07 ns
8 mA STD 0.98 4.61 0.19 1.12 1.61 0.67 4.69 4.41 2.72 3.07 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
Table 2-57 • 1.8 V LVCMOS High Slew – Applies to 1.2 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 1.7 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
2 mA STD 0.98 3.30 0.19 1.12 1.61 0.67 3.34 3.21 2.19 1.93 ns
4 mA STD 0.98 2.76 0.19 1.12 1.61 0.67 2.79 2.51 2.50 2.76 ns
6 mA STD 0.98 2.45 0.19 1.12 1.61 0.67 2.48 2.16 2.71 3.16 ns
8 mA STD 0.98 2.45 0.19 1.12 1.61 0.67 2.48 2.16 2.71 3.16 ns
Notes:
1. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
2. Software default selection highlighted in gray.
IGLOO PLUS DC and Switching Characteristi c s
2-36 Revision 11
1.5 V LVCMOS (JESD8-11)
Low-Voltage CMOS for 1.5 V is an extension of the LVCMOS standard (JESD8-5) used for general-
purpose 1.5 V applications. It uses a 1.5 V input buffer and a push-pull output buffer.
Table 2-58 • Minimum and Maximum DC Input and Output Levels
1.5 V
LVCMOS VIL VIH VOL VOH IOL IOH IOSL IOSH IIL1IIH2
Drive
Strength Min.
VMax.
VMin.
VMax.
VMax.
VMin.
VmAmA
Max.
mA3Max.
mA3µA4µA4
2 mA –0.3 0.35 * VCCI 0.7 * VCCI 3.6 0.25 * VCCI 0.75 * VCCI 2 2 13 16 10 10
4 mA –0.3 0.35 * VCCI 0.7 * VCCI 3.6 0.2 5 * VC CI 0.75 * VCCI 4 4 25 33 10 10
Notes:
1. IIL is the input leakag e current per I/O pin over recommended operation conditions where –0.3 V < VIN < VIL.
2. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
3. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
4. Currents are measured at 85°C juncti on temperature.
5. Software default selection highlighted in gray.
Figure 2-10 • AC Loading
Table 2-59 • AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V) Input High (V) Measuring Point* (V) CLOAD (pF)
01.50.755
*Measuring point = Vtrip. See Table 2-23 on page 2-21 for a complete table of trip points.
Test Point Test Point
Enable Path
Datapath 5 pF
R = 1 k R to VCCI for tLZ / tZL / tZLS
R to GND for tHZ / tZH / tZHS
35 pF for tZH / tZHS / tZL / tZLS
5 pF for tHZ / tLZ
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-37
Timing Characteristics
Applies to 1.5 V DC Core Voltage
Applies to 1.2 V DC Core Voltage
Table 2-60 • 1.5 V LVCMOS Low Slew – Applies to 1.5 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 42 5 V, Wor s t-C as e VCCI = 1.4 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
2 mA STD 0.97 6.07 0.18 1.16 1.62 0.66 6.19 5.53 2.13 2.02 ns
4 mA STD 0.97 5.24 0.18 1.16 1.62 0.66 5.34 4.81 2.37 2.47 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
Table 2-61 • 1.5 V LVCMOS High Slew – Applies to 1.5 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 42 5 V, Wor s t-C as e VCCI = 1.4 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
2 mA STD 0.97 2.65 0.18 1.16 1.62 0.66 2.71 2.43 2.13 2.11 ns
4 mA STD 0.97 2.29 0.18 1.16 1.62 0.66 2.33 2.00 2.37 2.57 ns
Notes:
1. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
2. Software default selection highlighted in gray.
Table 2-62 • 1.5 V LVCMOS Low Slew – Applies to 1.2 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 1.4 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
2 mA STD 0.98 6.57 0.19 1.26 1.80 0.67 6.68 6.01 2.54 2.59 ns
4 mA STD 0.98 5.72 0.19 1.26 1.80 0.67 5.81 5.27 2.79 3.05 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
Table 2-63 • 1.5 V LVCMOS High Slew – Applies to 1.2 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 1.4 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
2 mA STD 0.98 3.08 0.19 1.26 1.80 0.67 3.13 2.82 2.53 2.68 ns
4 mA STD 0.98 2.71 0.19 1.26 1.80 0.67 2.75 2.39 2.78 3.15 ns
Notes:
1. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
2. Software default selection highlighted in gray.
IGLOO PLUS DC and Switching Characteristi c s
2-38 Revision 11
1.2 V LVCMOS (JESD8-12A)
Low-V olt age CMOS for 1.2 V complies with the L VCMOS standard JESD8-12A for general purpose 1.2 V
applications. It uses a 1.2 V input buffer and a push-pull output buffer.
Timing Characteristics
Applies to 1.2 V DC Core Voltage
Table 2-64 • Minimum and Maximum DC Input and Output Levels
1.2 V
LVCMOS1VIL VIH VOL VOH IOL IOH IOSL IOSH IIL2IIH3
Drive
Strength Min.
VMax.
VMin.
VMax.
VMax.
VMin.
VmAmA
Max.
mA4Max.
mA4µA5µA5
2 mA –0.3 0. 35 * VCCI 0.65 * VCCI 3.6 0.25 * VCCI 0.75 * VCCI 2 2 20 26 10 10
Notes:
1. Applicable to IGLOO nano V2 devices operating at VCCI ≥ VCC.
2. IIL is the input leakag e current per I/O pin over recommended operation conditions where –0.3 V < VIN < VIL.
3. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
4. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
5. Currents are measured at 85°C juncti on temperature.
6. Software default selection highlighted in gray.
Figure 2-11 • AC Loading
Table 2-65 • AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V) Input High (V) Measuring Point* (V) CLOAD (pF)
01.20.65
*Measuring point = Vtrip. See Table 2-23 on page 2-21 for a complete table of trip points.
Test Point Test Point
Enable Path
Datapath 5 pF
R = 1 k R to VCCI for tLZ / tZL / tZLS
R to GND for tHZ / tZH / tZHS
35 pF for tZH / tZHS / tZL / tZLS
5 pF for tHZ / tLZ
Table 2-66 • 1.2 V LVCMOS Low Slew
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 1.14 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
2 mA STD 0.98 8.27 0.19 1.57 2.34 0.67 7.94 6.77 3.00 3.11 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
Table 2-67 • 1.2 V LVCMOS High Slew
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 1.14 V
Drive Strength Speed Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
2 mA STD 0.98 3.38 0.19 1.57 2.34 0.67 3.26 2.78 2.99 3.24 ns
Notes:
1. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
2. Software default selection highlighted in gray.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-39
1.2 V LVCMOS Wide Range
Table 2-68 • Minimum and Maximum DC Input and Output Levels
1.2 V
LVCMOS Wide
Range1VIL VIH VOL VOH IOL IOH IOSL IOSH IIL3IIH4
Drive
Strength
Equivalent
Software
Default
Drive
Strength
Option2Min.
VMax.
VMin.
VMax.
VMax.
VMin.
VmAmA
Max.
mA5Max
mA5µA6µA6
100 µA 2mA –0.3 0.35 * VCCI 0.65 * VCCI 3.6 0.25 * VCCI 0.75 * VCCI 2 2 20 26 10 10
Notes:
1. Applicable to V2 devices only.
2. The minimum drive strength for any LVCMOS 1.2 V software configuration when run in wide range is ±100 µA. Drive
strength displa yed in the software is supported for normal range only. For a detailed I/V curve, refer to the IBIS models.
3. IIL is the input leakage current per I/O pin over recommended operation conditions where –0.3 V < VIN < VIL.
4. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
5. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
6. Currents are measured at 85°C junct ion temperature.
7. Software default selection highlighted in gray.
Table 2-69 • AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V) Input High (V) Measuring Point* (V) CLOAD (pF)
01.20.65
*Measuring point = Vtrip. See Table 2-23 on page 2-21 for a complete table of trip points.
IGLOO PLUS DC and Switching Characteristi c s
2-40 Revision 11
Timing Characteristics
Applies to 1.2 V DC Core Voltage
Table 2-70 • 1.2 V LVCMOS Wide Range Low Slew – Applies to 1.2 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 1.14 V
Drive
Strength
Equivalent
Software
Default
Drive
Strength
Option1Speed
Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
100 µA 2 mA STD 0.98 8.27 0.19 1.57 2.34 0.67 7.94 6.77 3.00 3.11 ns
Notes:
1. The minimum drive strength for any LVCMOS 1.2 V software configuration when run in wide range is ±100 µA. Drive
strength displayed in the software is supported for normal range only. For a detailed I/V curve, refer to the IBIS models.
2. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
Table 2-71 • 1.2 V LVCMOS Wide Range High Slew – Applies to 1.2 V DC Core Voltage
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V, Worst-Case VCCI = 1.14 V
Drive
Strength
Equivalent
Software
Default
Drive
Strength
Option1S peed
Grade tDOUT tDP tDIN tPY tPYS tEOUT tZL tZH tLZ tHZ Units
100 µA 2 mA STD 0.98 3.38 0.19 1.57 2.34 0.67 3.26 2.78 2.99 3.24 ns
Notes:
1. The minimum drive strength for any LVCMOS 1.2 V software configuration when run in wide range is ±100 µA. Drive
strength displayed in the software is supported for normal range only. For a detailed I/V curve, refer to the IBIS models.
2. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
3. Software default selection highlighted in gray.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-41
I/O Register Specifications
Fully Registered I/O Buffers with Asynchronous Preset
Figure 2-12 • Timing Model of Registere d I/O Buffers with Asyn chronous Preset
INBUF INBUF
TRIBUF
CLKBUF
INBUF
CLKBUF
Data Input I/O Register with:
Active High Preset
Positive-Edge Triggered
Data Output Register and
Enable Output Register with:
Active High Preset
Postive-Edge Triggered
Pad Out
CLK
Preset
Data_out
Data
EOUT
DOUT
CLK
DQ
DFN1P1
PRE
DQ
DFN1P1
PRE
DQ
DFN1P1
PRE
D_Enable
A
C
D
EF
H
I
J
L
YCore
Array
IGLOO PLUS DC and Switching Characteristi c s
2-42 Revision 11
Table 2-72 • Parameter Definition and Measuring Nodes
Parameter Name Parameter Definition Measuring Nodes
(from, to)*
tOCLKQ Clock-to-Q of the Output Data Register H, DOUT
tOSUD Data Setup Time for the Output Data Register F, H
tOHD Data Hold Time for the Output Data Register F, H
tOPRE2Q Asynchronous Preset-to-Q of the Output Data Register L, DOUT
tOREMPRE Asynchronous Preset Removal Time for the Outpu t Da ta Register L, H
tORECPRE Asynchronou s Preset Reco very Time for the Output Data Register L, H
tOECLKQ Clock-to-Q of the Output Enable Register H, EOUT
tOESUD Data Setup Time for the Output Enable Register J, H
tOEHD Data Hold Time for the Output Enable Register J, H
tOEPRE2Q Asynchronous Preset-to-Q of th e Output Enable Register I, EOUT
tOEREMPRE Asynchronous Preset Removal Time for the Output Ena ble Register I, H
tOERECPRE Asyn chronous Preset Recovery Time for the Output Enable Register I, H
tICLKQ Clock-to-Q of the Input Data Register A, E
tISUD Data Setup Time for the Input Data Register C, A
tIHD Data Hold Time for the Input Data Register C, A
tIPRE2Q Asynchronous Preset-to-Q of the Input Data Register D, E
tIREMPRE Asynchronous Preset Removal Time for the Input Data Register D, A
tIRECPRE Asynchronous Preset Recovery Time for the Input Data Register D, A
*See Figure 2-12 on page 2-41 for more information.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-43
Fully Registered I/O Buffers with Asynchronous Clear
Figure 2-13 • Timing Mode l of the Registered I/O Buffer s with Asynchronous Cl ear
CLK
Pad Out
CLK
CLR
Data_out
Data Y
AA
EOUT
DOUT
Core
Array
DQ
DFN1C1
CLR
DQ
DFN1C1
CLR
DQ
DFN1C1
CLR
D_Enable
CC
DD
EE
FF
LL
HH
JJ
CLKBUF
INBUF
TRIBUF
INBUF CLKBUF
INBUF
Data Input I/O Register with
Active High Clear
Positive-Edge Triggered Data Output Register and
Enable Output Register with
Active High Clear
Positive-Edge Triggered
IGLOO PLUS DC and Switching Characteristi c s
2-44 Revision 11
Table 2-73 • Parameter Definition and Measuring Nodes
Parameter Name Parameter Definition Measuring Nodes
(from, to)*
tOCLKQ Clock-to-Q of the Output Data Register HH, DOUT
tOSUD Data Setup Time for the Output Data Register FF, HH
tOHD Data Hold Time for the Output Data Register FF, HH
tOCLR2Q Asynchronous Clear-to-Q of the Output Data Register LL, DOUT
tOREMCLR Asynchronous Clear Removal Time for the Output Data Register LL, HH
tORECCLR Asynchronous Clear Recovery Time for the Output Data Register LL, HH
tOECLKQ Clock-to-Q of the Output Enable Register HH, EOUT
tOESUD Data Setup Time for the Output Enable Register JJ, HH
tOEHD Data Hold Time for the Output Enable Register JJ, HH
tOECLR2Q Asynchronous Clear-to-Q of the Output Enable Register II, EOUT
tOEREMCLR Asynchronous Clear Removal Time for the Output Enable Register II, HH
tOERECCLR Asynchronous Clear Recovery Time for the Outpu t Enab le Register II, HH
tICLKQ Clock-to-Q of the Input Data Register AA, EE
tISUD Data Setup Time for the Input Data Register CC, AA
tIHD Data Hold Time for the Input Data Register CC, AA
tICLR2Q Asynchronous Clear-to-Q of the Input Data Register DD, EE
tIREMCLR Asynchronous Clear Remo val Time for the Input Data Register DD , AA
tIRECCLR Asynchronous Clear Recovery Time for the Input Data Register DD, AA
*See Figure 2-13 on page 2-43 for more information.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-45
Input Register
Timing Characteristics
1.5 V DC Core Voltage
Figure 2-14 • Input Register Timing Diagram
50%
Clear
Out_1
CLK
Data
Preset
50%
tISUD tIHD
50% 50%
tICLKQ
10
tIRECPRE tIREMPRE
tIRECCLR tIREMCLR
tIWCLR
tIWPRE
tIPRE2Q
tICLR2Q
tICKMPWH tICKMPWL
50% 50%
50% 50% 50%
50% 50%
50% 50% 50% 50% 50% 50%
50%
Table 2-74 • Input Data Register Propagation Delays
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.425 V
Parameter Description Std. Units
tICLKQ Clock-to-Q of the Input Data Register 0.41 ns
tISUD Data Setup Time for the Input Data Register 0.32 ns
tIHD Data Hold Time for the Input Data Register 0.00 ns
tICLR2Q Asynchronous Clear-to-Q of the Input Data Register 0.57 ns
tIPRE2Q Asynchronous Preset-to-Q of the Input Data Register 0.57 ns
tIREMCLR Asynchronous Clear Removal Time for the Input Data Register 0.00 ns
tIRECCLR Asynchronous Clear Recove ry Time for the Input Data Register 0.24 ns
tIREMPRE Asynchronous Preset Removal Time for the Input Data Register 0.00 ns
tIRECPRE Asynchronous Preset Recovery Time for the Input Data Register 0.24 ns
tIWCLR Asynchronous Clear Minimum Pulse Width for the Input Data Register 0.19 ns
tIWPRE Asynchronous Preset Minimum Pulse Width for the Input Data Register 0.19 ns
tICKMPWH Clock Minimum Pulse Width High for the Input Data Register 0.31 ns
tICKMPWL Clock Minimum Pulse Width Low for the Input Data Register 0.28 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
IGLOO PLUS DC and Switching Characteristi c s
2-46 Revision 11
1.2 V DC Core Voltage
Table 2-75 • Input Data Register Propagation Delays
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V
Parameter Description Std. Units
tICLKQ Clock-to-Q of the Input Data Register 0.66 ns
tISUD Data Setup Time for the Input Data Register 0.43 ns
tIHD Data Hold Time for the Input Data Register 0.00 ns
tICLR2Q Asynchronous Clear-to-Q of the Input Data Register 0.86 ns
tIPRE2Q Asynchronous Preset-to-Q of the Input Data Register 0.86 ns
tIREMCLR Asynchronous Clear Removal Time for the Input Data Register 0.00 ns
tIRECCLR Asynchronou s Clear Recovery Time for the Input Data Register 0.24 ns
tIREMPRE Asynchronous Preset Removal Time for the Input Data Register 0.00 ns
tIRECPRE Asynchronous Preset Recovery Time for the Input Data Register 0.24 ns
tIWCLR Asynchronous Clear Minimum Pulse Width for the Input Data Register 0.19 ns
tIWPRE Asynchronous Preset Minimum Pulse Width for the Input Data Register 0.19 ns
tICKMPWH Clock Minimum Pulse Width High for the Input Data Register 0.31 ns
tICKMPWL Clock Minimum Pulse Width Low for the Input Data Register 0.28 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-7 on page 2-7 for derating values.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-47
Output Register
Timing Characteristics
1.5 V DC Core Voltage
Figure 2-15 • Output Register Timing Diagram
Clear
DOUT
CLK
Data_out
Preset
50%
tOSUD tOHD
50% 50%
tOCLKQ
10
tORECPRE
tOREMPRE
tORECCLR tOREMCLR
tOWCLR
tOWPRE
tOPRE2Q
tOCLR2Q
tOCKMPWH tOCKMPWL
50% 50%
50% 50% 50%
50% 50%
50% 50% 50% 50% 50% 50%
50%
50%
Table 2-76 • Output Data Register Propagation Delays
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.425 V
Parameter Description Std. Units
tOCLKQ Clock-to-Q of the Output Data Register 0.66 ns
tOSUD Data Setup Time for the Output Data Register 0.33 ns
tOHD Data Hold Time for the Output Data Register 0.00 ns
tOCLR2Q Asynchronous Clear-to-Q of the Output Data Register 0.82 ns
tOPRE2Q Asynchronous Preset-to-Q of the Output Data Register 0.88 ns
tOREMCLR Asynchronous Clear Removal Time for the Output Data Register 0.00 ns
tORECCLR Asynchronous Clear Recovery Time for the Output Data Register 0.24 ns
tOREMPRE Asynchronous Preset Removal Time for the Output Data Register 0.00 ns
tORECPRE Asynchronous Preset Recovery Time for the Output Data Register 0.24 ns
tOWCLR Asynchronous Clear Minimum Pulse Width for the Output Data Register 0.19 ns
tOWPRE Asynchronous Preset Minimum Pulse Wid th for the Output Data Register 0.19 ns
tOCKMPWH Clock Minimum Pulse Width High for the Output Data Register 0.31 n s
tOCKMPWL Clock Minimum Pulse Width Low for the Output Data Register 0.28 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
IGLOO PLUS DC and Switching Characteristi c s
2-48 Revision 11
1.2 V DC Core Voltage
Table 2-77 • Output Data Register Propagation Delays
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 14 V
Parameter Description Std. Units
tOCLKQ Clock-to-Q of the Output Data Register 1.03 ns
tOSUD Data Setup Time for the Output Data Register 0.52 ns
tOHD Data Hold Time for the Output Data Register 0.00 ns
tOCLR2Q Asynchronous Clear-to-Q of the Output Data Register 1.22 ns
tOPRE2Q Asynchronous Preset-to-Q of the Output Data Register 1.31 ns
tOREMCLR Asynchronous Clear Removal Time for the Output Data Register 0.00 ns
tORECCLR Asynchronous Clear Recovery Time for the Output Data Register 0.24 ns
tOREMPRE Asynchronous Preset Removal Time for the Output Data Register 0.00 ns
tORECPRE Asynchronous Preset Recovery Time for the Output Data Register 0.24 ns
tOWCLR Asynchronous Clear Minimum Pulse Width for the Output Data Register 0.19 ns
tOWPRE Asynchronous Preset Minimum Pulse Wid th for the Output Data Register 0.19 ns
tOCKMPWH Clock Minimum Pulse Width High for the Output Data Register 0.31 n s
tOCKMPWL Clock Minimum Pulse Width Low for the Output Data Register 0.28 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-7 on page 2-7 for derating values.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-49
Output Enable Register
Timing Characteristics
1.5 V DC Core Voltage
Figure 2-16 • Output Enable Register Timing Diagram
50%
Preset
Clear
EOUT
CLK
D_Enable
50%
t
OESUD
t
OEHD
50% 50%
t
OECLKQ
10
t
OERECPRE
t
OEREMPRE
t
OERECCLR
t
OEREMCLR
t
OEWCLR
t
OEWPRE
t
OEPRE2Q
t
OECLR2Q
t
OECKMPWH
t
OECKMPWL
50% 50%
50% 50% 50%
50% 50%
50% 50% 50% 50% 50% 50%
50%
Table 2-78 • Output Enable Register Propagation Delays
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.425 V
Parameter Description Std. Units
tOECLKQ Clock-to-Q of the Output Enable Register 0.68 ns
tOESUD Data Setup Time for the Output Enable Register 0.33 ns
tOEHD Data Hold Time for the Output Enable Register 0.00 ns
tOECLR2Q Asynchronous Clear-to-Q of the Output Enable Register 0.84 ns
tOEPRE2Q Asynchronous Preset-to-Q of the Output Enable Registe r 0.91 ns
tOEREMCLR Asynchronous Clear Removal Time for the Output Enable Reg ister 0.00 ns
tOERECCLR Asynchronou s Clear Recovery Time for the Output Enable Register 0.24 n s
tOEREMPRE Asynchronous Preset Removal Time for the Output Enable Register 0.00 ns
tOERECPRE Asynch ronous Preset Recovery Time for the Output Enable Register 0.24 ns
tOEWCLR Asynchronous Clear Minimum Pulse Width for the Output Enable Register 0 .1 9 ns
tOEWPRE Asynchronous Preset Minimum Pulse Width for the Output Enable Register 0.19 ns
tOECKMPWH Clock Minimum Pulse Width High for the Output Enable Register 0.31 ns
tOECKMPWL Clock Minimum Pulse Width Low for the Output Enable Register 0.28 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
IGLOO PLUS DC and Switching Characteristi c s
2-50 Revision 11
1.2 V DC Core Voltage
Table 2-79 • Output Enable Register Propagation Delays
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 14 V
Parameter Description Std. Units
tOECLKQ Clock-to-Q of the Output Enable Register 1.06 ns
tOESUD Data Setup Time for the Output Enable Register 0.52 ns
tOEHD Data Hold Time for the Output Enable Register 0.00 ns
tOECLR2Q Asynchronous Clear-to-Q of the Output Enable Register 1.25 ns
tOEPRE2Q Asynchronous Preset-to-Q of the Output Enable Registe r 1.36 ns
tOEREMCLR Asynchronous Clear Removal Time for the Output Enable Reg ister 0.00 ns
tOERECCLR Asynchronou s Clear Recovery Time for the Output Enable Register 0.24 ns
tOEREMPRE Asynchronous Preset Removal Time for the Output Enable Register 0.00 ns
tOERECPRE Asynch ronous Preset Recovery Time for the Output Enable Register 0.24 n s
tOEWCLR Asynchronous Clear Minimum Pulse Width for the Output Enable Register 0.19 ns
tOEWPRE Asynchronous Preset Minimum Pulse Width for the Output Enable Register 0.19 ns
tOECKMPWH Clock Minimum Pulse Width High for the Output Enable Register 0.31 ns
tOECKMPWL Clock Minimum Pulse Width Low for the Output Enable Register 0.28 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-7 on page 2-7 for derating values.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-51
VersaTile Characteristics
VersaTile Specifications as a Combinatorial Module
The IGLOO PLUS library offers all combina tions of LUT-3 combinatorial functions. In this section, timing
characteristics are presented for a sample of the library. For more details, re fer to the Fu sion, IGLOO/e,
and ProASIC3/ E Macro Library Guide.
Figure 2-17 • Sample of Combinatorial Cells
MAJ3
A
C
BY
MUX2
B
0
1
A
S
Y
AY
B
B
AXOR2 Y
NOR2
B
AY
B
AYOR2
INV
AY
AND2
B
AY
NAND3
B
A
C
XOR3 Y
B
A
C
NAND2
IGLOO PLUS DC and Switching Characteristi c s
2-52 Revision 11
Figure 2-18 • Timing Model and Waveforms
Net A
Y
B
Length = 1 VersaTile
Net A
Y
B
Length = 1 VersaTile
Net A
Y
B
Length = 1 VersaTile
Net A
Y
B
Length = 1 VersaTile
NAND2 or Any
Combinatorial
Logic
NAND2 or Any
Combinatorial
Logic
NAND2 or Any
Combinatorial
Logic
NAND2 or Any
Combinatorial
Logic
tPD = MAX(tPD(RR), tPD(RF), tPD(FF), tPD(FR))
where edges are applicable for a particular
combinatorial cell
Fanout = 4
tPD
tPD
tPD
50%
VCC
VCC
VCC
50%
GND
A, B, C
50% 50%
50%
(RR)
(RF) GND
OUT
OUT
GND
50%
(FF)
(FR)
tPD
tPD
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-53
Timing Characteristics
1.5 V DC Core Voltage
1.2 V DC Core Voltage
Table 2-80 • Combinatorial Cel l Propagation Delays
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.425 V
Combinatorial Cell Equation Parameter Std. Units
INV Y = !A tPD 0.72 ns
AND2 Y = A · B tPD 0.86 ns
NAND2 Y = !(A · B) tPD 1.00 ns
OR2 Y = A + B tPD 1.26 ns
NOR2 Y = !(A + B) tPD 1.16 ns
XOR2 Y = A ⊕ Bt
PD 1.46 ns
MAJ3 Y = MAJ(A, B, C) tPD 1.47 ns
XOR3 Y = A ⊕ B ⊕ Ct
PD 2.12 ns
MUX2 Y = A !S + B S tPD 1.24 ns
AND3 Y = A · B · C tPD 1.40 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
Table 2-81 • Combinatorial Cel l Propagation Delays
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V
Combinatorial Cell Equation Parameter Std. Units
INV Y = !A tPD 1.26 ns
AND2 Y = A · B tPD 1.46 ns
NAND2 Y = !(A · B) tPD 1.78 ns
OR2 Y = A + B tPD 2.47 ns
NOR2 Y = !(A + B) tPD 2.17 ns
XOR2 Y = A ⊕ Bt
PD 2.62 ns
MAJ3 Y = MAJ(A, B, C) tPD 2.66 ns
XOR3 Y = A ⊕ B ⊕ Ct
PD 3.77 ns
MUX2 Y = A !S + B S tPD 2.20 ns
AND3 Y = A · B · C tPD 2.49 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-7 on page 2-7 for derating values.
IGLOO PLUS DC and Switching Characteristi c s
2-54 Revision 11
VersaTile Specifications as a Sequential Module
The IGLOO PLUS library offers a wide variety of sequential cells, including flip-flops and latches. Each
has a data input and optional enable, clear, or preset. In this section, timing characteristics are presented
for a representative sample from the library. For more details, refer to the Fusion, IGLOO/e, and
ProASIC3/E Macro Library Guide.
Figure 2- 19 • Sample of Sequential Cells
DQ
DFN1
Data
CLK
Out
DQ
DFN1C1
Data
CLK
Out
CLR
DQ
DFI1E1P1
Data
CLK
Out
En
PRE
DQ
DFN1E1
Data
CLK
Out
En
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-55
Timing Characteristics
1.5 V DC Core Voltage
Figure 2-20 • Timing Model and Waveforms
PRE
CLR
Out
CLK
Data
EN
tSUE
50%
50%
tSUD tHD
50% 50%
tCLKQ
0
tHE
tRECPRE tREMPRE
tRECCLR tREMCLRtWCLR
tWPRE
tPRE2Q tCLR2Q
tCKMPWH tCKMPWL
50% 50%
50% 50% 50%
50% 50%
50% 50% 50% 50% 50% 50%
50%
50%
Table 2-82 • Register Delays
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.425 V
Parameter Description Std. Units
tCLKQ Clock-to-Q of the Core Register 0.89 ns
tSUD Data Setup Time for the Core Register 0.81 ns
tHD Data Hold Time for the Core Register 0.00 ns
tSUE Enable Setup Time for the Core Register 0.73 ns
tHE Enable Hold Time for the Core Register 0.00 ns
tCLR2Q Asynchronous Clear-to-Q of the Core Register 0 .60 ns
tPRE2Q Asynchronous Preset-to-Q of the Core Register 0.62 ns
tREMCLR Asynchronous Clear Removal Time for the Core Register 0.00 ns
tRECCLR Asynchronous Clear Recovery Time for the Core Register 0.24 ns
tREMPRE Asynchronous Preset Removal Time for the Core Register 0.00 ns
tRECPRE Asynchronous Preset Recovery Time for the Core Register 0 .2 3 ns
tWCLR Asynchronous Clear Minimum Pulse Width for the Core Register 0.30 ns
tWPRE Asynchronous Preset Minimum Pulse Width for the Core Register 0.30 ns
tCKMPWH Clock Minimum Pulse Width High for the Core Register 0.56 ns
tCKMPWL Clock Minimum Pulse Width Low for the Core Register 0.56 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
IGLOO PLUS DC and Switching Characteristi c s
2-56 Revision 11
1.2 V DC Core Voltage
Table 2-83 • Register Delays
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 14 V
Parameter Description Std. Units
tCLKQ Clock-to-Q of the Core Register 1.61 ns
tSUD Data Setup Time for the Core Register 1.17 ns
tHD Data Hold Time for the Core Register 0.00 ns
tSUE Enable Setup Time for the Core Register 1.29 ns
tHE Enable Hold Time for the Core Register 0.00 ns
tCLR2Q Asynchronous Clear-to-Q of the Core Register 0 .87 ns
tPRE2Q Asynchronous Preset-to-Q of the Core Register 0.89 ns
tREMCLR Asynchronous Clear Removal Time for the Core Register 0.00 ns
tRECCLR Asynchronous Clear Recovery Time for the Core Register 0.24 ns
tREMPRE Asynchronous Preset Removal Time for the Core Register 0.00 ns
tRECPRE Asynchronous Preset Recovery Time for the Core Register 0 .24 ns
tWCLR Asynchronous Clear Minimum Pulse Width for the Core Register 0.46 ns
tWPRE Asynchronous Preset Minimum Pulse Width for the Core Register 0.46 ns
tCKMPWH Clock Minimum Pulse Width High for the Core Register 0.95 ns
tCKMPWL Clock Minimum Pulse Width Low for the Core Register 0.95 ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-7 on page 2-7 for derating values.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-57
Global Resource Characteristics
AGLP125 Clock Tree Topology
Clock delays are device-specific. Figure 2-21 is an example of a global tree used for clock ro uting. The
global tree presented in Figure 2-21 is driven by a CCC located on the west side of the AGLP125 device.
It is used to drive all D-flip-flops in the device.
Figure 2-21 • Example of Global Tree Use in an AGLP125 Device for Clock Routing
Central
Global Rib
VersaTile
Rows
Global Spine
CCC
IGLOO PLUS DC and Switching Characteristi c s
2-58 Revision 11
Global Tree Timing Characteristics
Global clock delays include the central rib delay, the spine delay, and the row delay. Delays do not
include I/O input buffer clock delays, as th ese are I/O standard–depe nde nt, and th e cl ock may be d riven
and conditioned i nternally by the CCC mo dule. For more details on clock conditioning capabilities, refer
to the "Clock Condition ing Circuits" section on page 2-61. Table 2-84 to Table 2-89 on page 2-60 present
minimum and maximum global clock delays within each device. Minimum and maximum delays are
measured with minimum and maximum loading.
Timing Characteristics
1.5 V DC Core Voltage
Table 2-84 • AGLP030 Global Resource
Commercial-Case Conditions: TJ = 70°C, VCC = 1.425 V
Parameter Description
Std.
UnitsMin.1Max.2
tRCKL Input Low Delay for Global Clock 1.21 1.42 ns
tRCKH Input High Delay for Global Clock 1.23 1.49 ns
tRCKMPWH Minimum Pulse Width High for Global Clock ns
tRCKMPWL Minimum Pulse Width Low for Global Clock ns
tRCKSW Maximum Skew for Global Clock 0.27 ns
FRMAX Maximum Frequency for Globa l Clock MHz
Notes:
1. Value reflects minimum load. The delay is measured from the CCC output to the clock pin of a sequential element,
located in a lightly loaded row (single element is connected to the global net).
2. Value reflects ma ximum l oad. The del ay is measured on the cloc k pin of th e farthest sequen tial el ement, l ocated in a ful ly
loaded row (all available flip-flops are connected to the global net in the row).
3. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
Table 2-85 • AGLP060 Global Resource
Commercial-Case Conditions: TJ = 70°C, VCC = 1.425 V
Parameter Description
Std.
UnitsMin.1Max.2
tRCKL Input Low Delay for Global Clock 1.32 1.62 ns
tRCKH Input High Delay for Global Clock 1.34 1.72 ns
tRCKMPWH Minimum Pulse Width High for Global Clock ns
tRCKMPWL Minimum Pulse Width Low for Global Clock ns
tRCKSW Maximum Skew for Global Clock 0.38 ns
FRMAX Maximum Frequency for Globa l Clock MHz
Notes:
1. Value reflects minimum load. The delay is measured from the CCC output to the clock pin of a sequential element,
located in a lightly loaded row (single element is connected to the global net).
2. Value reflects ma ximum l oad. The del ay is measured on the cloc k pin of th e farthest sequen tial el ement, l ocated in a ful ly
loaded row (all available flip-flops are connected to the global net in the row).
3. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-59
1.2 V DC Core Voltage
Table 2-86 • AGLP125 Global Resource
Commercial-Case Conditions: TJ = 70°C, VCC = 1.425 V
Parameter Description
Std.
UnitsMin.1Max.2
tRCKL Input Low Delay for Global Clock 1.36 1.71 ns
tRCKH Input High Delay for Global Clock 1.39 1.82 ns
tRCKMPWH Minimum Pulse Width High for Global Clock ns
tRCKMPWL Minimum Pulse Width Low for Global Clock ns
tRCKSW Maximum Skew for Global Clock 0.43 ns
FRMAX Maximum Frequency for Globa l Clock MHz
Notes:
1. Value reflects minimum load. The delay is measured from the CCC output to the clock pin of a sequential element,
located in a lightly loaded row (single element is connected to the global net).
2. Value reflects ma ximum l oad. The del ay is measured on the cloc k pin of th e farthest sequen tial el ement, l ocated in a ful ly
loaded row (all available flip-flops are connected to the global net in the row).
3. For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
Table 2-87 • AGLP030 Global Resource
Commercial-Case Conditions: TJ = 70°C, VCC = 1.14 V
Parameter Description
Std.
UnitsMin.1Max.2
tRCKL Input Low Delay for Global Clock 1.80 2.09 ns
tRCKH Input High Delay for Global Clock 1.88 2.27 ns
tRCKMPWH Minimum Pulse Width High for Global Clock ns
tRCKMPWL Minimum Pulse Width Low for Global Clock ns
tRCKSW Maximum Skew for Global Clock 0.39 ns
FRMAX Maximum Frequency for Globa l Clock MHz
Notes:
1. Value reflects minimum load. The delay is measured from the CCC output to the clock pin of a sequential element,
located in a lightly loaded row (single element is connected to the global net).
2. Value reflects ma ximum l oad. The del ay is measured on the cloc k pin of th e farthest sequen tial el ement, l ocated in a ful ly
loaded row (all available flip-flops are connected to the global net in the row).
3. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-7 for derating values.
IGLOO PLUS DC and Switching Characteristi c s
2-60 Revision 11
Table 2-88 • AGLP060 Global Resource
Commercial-Case Conditions: TJ = 70°C, VCC = 1.14 V
Parameter Description
Std.
UnitsMin.1Max.2
tRCKL Input Low Delay for Global Clock 2.02 2.43 ns
tRCKH Input High Delay for Global Clock 2.09 2.65 ns
tRCKMPWH Minimum Pulse Width High for Global Clock ns
tRCKMPWL Minimum Pulse Width Low for Global Clock ns
tRCKSW Maximum Skew for Global Clock 0.56 ns
FRMAX Maximum Frequency for Globa l Clock MHz
Notes:
1. Value reflects minimum load. The delay is measured from the CCC output to the clock pin of a sequential element,
located in a lightly loaded row (single element is connected to the global net).
2. Value reflects ma ximum l oad. The del ay is measured on the cloc k pin of th e farthest sequen tial el ement, l ocated in a ful ly
loaded row (all available flip-flops are connected to the global net in the row).
3. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-7 for derating values.
Table 2-89 • AGLP125 Global Resource
Commercial-Case Conditions: TJ = 70°C, VCC = 1.14 V
Parameter Description
Std.
UnitsMin.1Max.2
tRCKL Input Low Delay for Global Clock 2.08 2.54 ns
tRCKH Input High Delay for Global Clock 2.15 2.77 ns
tRCKMPWH Minimum Pulse Width High for Global Clock ns
tRCKMPWL Minimum Pulse Width Low for Global Clock ns
tRCKSW Maximum Skew for Global Clock 0.62 ns
FRMAX Maximum Frequency for Globa l Clock MHz
Notes:
1. Value reflects minimum load. The delay is measured from the CCC output to the clock pin of a sequential element,
located in a lightly loaded row (single element is connected to the global net).
2. Value reflects ma ximum l oad. The del ay is measured on the cloc k pin of th e farthest sequen tial el ement, l ocated in a ful ly
loaded row (all available flip-flops are connected to the global net in the row).
3. For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-7 for derating values.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-61
Clock Conditioning Circuits
CCC Electrical Specifications
Timing Characteristics
Table 2-90 • IGLOO PLUS CCC/PLL Specification
For IGLOO PLUS V2 or V5 devices, 1.5 V DC Core Supply Voltage
Parameter Min. Typ. Max. Units
Clock Conditioning Circuitry Input Frequency fIN_CCC 1.5 250 MHz
Clock Conditioning Circuitry Output Frequency fOUT_CCC 0.75 250 MHz
Delay Increments in Programmable Delay Blocks 1, 2 360 ps
Number of Programmable Values in Each Programmable Delay Block 32
Serial Clock (SCLK) for Dynamic PLL3,4
Input Cycle-to-Cycle Jitter (peak magni tu de ) 100 MHz
Acquisition Time
LockControl = 0 300 µs
LockControl = 1 6.0 ms
Tracking Jitter5
LockControl = 0 2.5
LockControl = 1 1.5 ns
Output Duty Cycle 48.5 51.5 %
Delay Range in Block: Programmable Delay 1 1, 2 1.25 15.65 ns
Delay Range in Block: Programmable Delay 2 1, 2 0.469 15.65 ns
Delay Range in Block: Fixed Delay 1, 2 3.5 ns
VCO Output Peak-to-Peak Period Jitter FCCC_OUT6 Maximum Peak-to-Peak Period Jitter6,7,8
SSO ≤ 2 SSO ≤ 4 SSO ≤ 8 SSO ≤ 16
0.75 MHz to 50 MHz 0.50% 0.60% 0.80% 1.20%
50 MHz to 250 MHz 2.50% 4.00% 6.00% 12.00%
Notes:
1. This delay is a func tion of volt age an d temperat ure. See Table 2-6 on page 2-6 and Table 2-7 on page 2-7 for deratings.
2. TJ = 25°C, VCC = 1.5 V
3. Maximum value obtained for a STD speed grade device in Worst Case Commercial Conditions. For specific junction
temperature and voltage supply, refer to Table 2-6 on page 2-6 and Table 2-7 on page 2-7 for derating values.
4. The AGLP030 device does not support a PLL.
5. Tracking jitter is defined as the variation in clock edge position of PLL outputs with reference to the PLL input clock
edge. Tracking jitter does not measure the variation in PLL output period, which is covered by the period jitter
parameter.
6. VCO output jitter is calculated as a percentage of the VCO frequency. The jitter (in ps) can be calculated by multiplying
the VCO period by the per cent jitter. The VCO jitter (in ps) applies to CCC_OUT regardless of the output divider
settings. For example, if the jitter on VCO is 300 ps, the jitter on CCC_OUT is also 300 ps, regardless of the output
divider settings.
7. Measurements done with LVTTL 3.3 V 8 mA I/O drive strength and high slew rate, VCC/VCCPLL = 1.14 V,
VCCI = 3.3 V, VQ/PQ/TQ type of packages, 20 pF load.
8. SSO are outputs that are synchronous to a single clock domain and have clock-to-out times that are within ±200 ps of
each other.Switching I/Os are placed outside of the PLL bank. Refer to the "ProASIC3/E SSO and Pin Placement
Guidelines" chapter of the ProASIC3 FPGA Fabric User’s Guide.
IGLOO PLUS DC and Switching Characteristi c s
2-62 Revision 11
Table 2-91 • IGLOO PLUS CCC/PLL Specification
For IGLOO PLUS V2 Devices, 1.2 V DC Core Supply Voltage
Parameter Min. Typ. Max. Units
Clock Conditioning Circuitry Input Frequency fIN_CCC 1.5 160 MHz
Clock Conditioning Circuitry Output Frequency fOUT_CCC 0.75 160 MHz
Delay Increments in Programmable Delay Blocks 1, 2 580 ps
Number of Programmable Values in Each Programmable Delay Block 32
Serial Clock (SCLK) for Dynamic PLL3,4
Input Cycle-to-Cycle Jitter (peak magni tu de ) 60 MHz
Acquisition Time
LockControl = 0 300 µs
LockControl = 1 6.0 ms
Tracking Jitter5
LockControl = 0 4 ns
LockControl = 1 3 ns
Output Duty Cycle 48.5 51.5 %
Delay Range in Block: Programmable Delay 1 1, 2 2.3 20.86 ns
Delay Range in Block: Programmable Delay 2 1, 2 0.025 20.86 ns
Delay Range in Block: Fixed Delay 1, 2 5.7 ns
VCO Output Peak-to-Peak Period Jitter FCCC_OUT6Maximum Peak-to-Peak Period Jitter6,7,8
SSO ≤ 2 SSO ≤ 4 SSO ≤ 8 SSO ≤ 16
0.75 MHz to 50 MHz 0.50% 1.20% 2.00% 3.00%
50 MHz to 160 MH z 2.50% 5.00% 7.00% 15.00%
Notes:
1. This delay is a function of voltage and temperature. See Table 2-6 on page 2-6 and Table 2-7 on page 2-7 for deratings.
2. TJ = 25°C, VCC = 1.2 V
3. Maximum value obtained for a STD speed grade device in Worst Case Commercial Conditions.For specific junction
temperature and voltage supply levels, refer to Table 2-6 on page 2-6 and Table 2-7 on page 2-7 for derating values.
4. The AGLP030 device does not support PLL.
5. Tracking jitter is defined as the variation in clock edge position of PLL outputs with reference to PLL input clock edge.
Tracking jitter does not measure the variation in PLL output period, which is covered by period jitter parameter.
6. VCO output jitter is calculated as a percentage of the VCO frequency. The jitter (in ps) can be calculated by multiplying
the VCO period by the per cent jitter. The VCO jitter (in ps) applies to CCC_OUT regardless of the output divider
settings. For example, if the jitter on VCO is 300 ps, the jitter on CCC_OUT is also 300 ps, regardless of the output
divider settings.
7. Measurements are done with LVTTL 3.3 V, 8 mA, I/O drive strength and high slew rate. VCC/VCCPLL = 1.14 V,
VCCI = 3.3 V, VQ/PQ/TQ type of packages, 20 pF load.
8. SSO are outputs t hat are sync hronous t o a singl e cloc k domai n, and hav e thei r clock-to-out times wi thin ±200 ps of each
other. Switching I/Os are placed outsid e of the PLL bank. Refer to th e "ProASIC3/E SSO and Pin Placement Guidelines"
chapter of the ProASIC3 FPGA Fabric User ’s Guide.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-63
Note: Peak-to-peak jitter measurements are defi ned by T peak-to-peak = Tperiod_max – Tperiod_min.
Figure 2-22 • Peak-to-Peak Jitter Definition
T
period_max
T
period_min
Output Signal
IGLOO PLUS DC and Switching Characteristi c s
2-64 Revision 11
Embedded SRAM and FIFO Characteristics
SRAM
Figure 2- 23 • RAM Models
ADDRA11 DOUTA8
DOUTA7
DOUTA0
DOUTB8
DOUTB7
DOUTB0
ADDRA10
ADDRA0
DINA8
DINA7
DINA0
WIDTHA1
WIDTHA0
PIPEA
WMODEA
BLKA
WENA
CLKA
ADDRB11
ADDRB10
ADDRB0
DINB8
DINB7
DINB0
WIDTHB1
WIDTHB0
PIPEB
WMODEB
BLKB
WENB
CLKB
RAM4K9
RADDR8 RD17
RADDR7 RD16
RADDR0 RD0
WD17
WD16
WD0
WW1
WW0
RW1
RW0
PIPE
REN
RCLK
RAM512X18
WADDR8
WADDR7
WADDR0
WEN
WCLK
RESET
RESET
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-65
Timing Waveforms
Figure 2-24 • RAM Read for Pass-Through Output
Figure 2-25 • RAM Read for Pipelined Output
CLK
ADD
BLK_B
WEN_B
DO
A0A1A2
D0D1D2
tCYC
tCKH tCKL
tAS tAH
tBKS
tENS tENH
tDOH1
tBKH
Dn
tCKQ1
CLK
ADD
BLK_B
WEN_B
DO
A0A1A2
D0D1
tCYC
tCKH tCKL
tAS tAH
tBKS
tENS tENH
tDOH2
tCKQ2
tBKH
Dn
IGLOO PLUS DC and Switching Characteristi c s
2-66 Revision 11
Figure 2-26 • RAM Write, Output Retained (WMODE = 0)
Figure 2-27 • RAM Write, Output as Write Data (WMODE = 1)
tCYC
tCKH tCKL
A0A1A2
DI0DI1
tAS tAH
tBKS
tENS tENH
tDS tDH
CLK
BLK_B
WEN_B
ADD
DI
Dn
DO
tBKH
D2
tCYC
tCKH tCKL
A0A1A2
DI0DI1
tAS tAH
tBKS
tENS
tDS tDH
CLK
BLK_B
WEN_B
ADD
DI
tBKH
DO
(pass-through) DI1
DnDI0
DO
(pipelined) DI0DI1
Dn
DI2
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-67
Figure 2-28 • Write Access after Read onto Same Address
Figure 2-29 • RAM Reset
A0A1A0
A0A1A3
D1D2D3
t
AH
t
AS
t
AH
t
AS
t
CKQ1
t
CKQ1
t
CKQ2
t
CCKH
CLK1
ADD1
WEN_B1
DO1
(pass-through)
DO1
(pipelined)
CLK2
ADD2
DI2
WEN_B2
Dn
Dn
D0D1
D0
CLK
RESET_B
DO Dn
tCYC
tCKH tCKL
tRSTBQ
Dm
IGLOO PLUS DC and Switching Characteristi c s
2-68 Revision 11
Timing Characteristics
1.5 V DC Core Voltage
Table 2-92 • RAM4K9
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.425 V
Parameter Description Std. Units
tAS Address setup time 0.69 ns
tAH Address hold time 0.13 ns
tENS REN_B, WEN_B setup time 0.68 ns
tENH REN_B, WEN_B hold time 0.13 ns
tBKS BLK_B setup time 1.37 ns
tBKH BLK_B hold time 0.13 ns
tDS Input data (DI) setup time 0.59 ns
tDH Input data (DI) hold time 0.30 ns
tCKQ1 Clock High to new data valid on DO (output retained, WMODE = 0) 2.94 ns
Clock High to new data valid on DO (flow-through, WMODE = 1) 2.55 ns
tCKQ2 Clock High to new data valid on DO (pipelined) 1.51 ns
tC2CWWL Address collision clk-to-clk delay for reliable write after write on same address – applicable
to closing edge 0.29 ns
tC2CRWH Address collision clk-to-clk delay for reliable read access after write on same address –
applicable to opening edge 0.24 ns
tC2CWRH Address collision clk-to-clk delay for reliable write access after read on same address –
applicable to opening edge 0.40 ns
tRSTBQ RESET_B Low to data out Low on DO (flow-through) 1.72 ns
RESET_B Low to data out Low on DO (pipelined) 1.72 ns
tREMRSTB RESET_B removal 0.51 ns
tRECRSTB RESET_B recovery 2.68 ns
tMPWRSTB RESET_B minimum pulse width 0.68 ns
tCYC Clock cycle time 6.24 ns
FMAX Maximum frequency 160 MHz
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-69
Table 2-93 • RAM512X18
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.425 V
Parameter Description Std. Units
tAS Address setup time 0.69 ns
tAH Address hold time 0.13 ns
tENS REN_B, WEN_B setup time 0.61 ns
tENH REN_B, WEN_B hold time 0.07 ns
tDS Input data (DI) setup time 0.59 ns
tDH Input data (DI) hold time 0.30 ns
tCKQ1 Clock High to new data valid on DO (output retained, WMODE = 0) 3.51 ns
tCKQ2 Clock High to new data valid on DO (pipelined) 1.43 ns
tC2CRWH Address collision clk-to-clk delay for reliable read access after write on same address –
applicable to opening edge 0.21 ns
tC2CWRH Address collision clk-to-clk delay for reliable write access after read on same address –
applicable to opening edge 0.25 ns
tRSTBQ RESET_B Low to data out Low on DO (flow-through) 1.72 ns
RESET_B Low to data out Low on DO (pipelined) 1.72 ns
tREMRSTB RESET_B removal 0.51 ns
tRECRSTB RESET_B recovery 2.68 ns
tMPWRSTB RESET_B minimum pulse width 0.68 ns
tCYC Clock cycle time 6.24 ns
FMAX Maximum frequency 160 MHz
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
IGLOO PLUS DC and Switching Characteristi c s
2-70 Revision 11
1.2 V DC Core Voltage
Table 2-94 • RAM4K9
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 14 V
Parameter Description Std. Units
tAS Address setup time 1.28 ns
tAH Address hold time 0.25 ns
tENS REN_B, WEN_B setup time 1.25 ns
tENH REN_B, WEN_B hold time 0.25 ns
tBKS BLK_B setup time 2.54 ns
tBKH BLK_B hold time 0.25 ns
tDS Input data (DI) setup time 1.10 ns
tDH Input data (DI) hold time 0.55 ns
tCKQ1 Clock High to new data valid on DO (output retained, WMODE = 0) 5.51 ns
Clock High to new data valid on DO (flow-through, WMODE = 1) 4.77 ns
tCKQ2 Clock High to new data valid on DO (pipelined) 2.82 ns
tC2CWWL Address collision clk-to-clk delay for reliable write after write on same address –
applicable to closing edge 0.30 ns
tC2CRWH Address collision clk-to-clk delay for reliable read access after write on same address –
applicable to opening edge 0.32 ns
tC2CWRH Address collision clk-to-clk delay for reliable write access after read on same address –
applicable to opening edge 0.44 ns
tRSTBQ RESET_B Low to data out Low on DO (flow-through) 3.21 ns
RESET_B Low to data out Low on DO (pipelined) 3.21 ns
tREMRSTB RESET_B removal 0.93 ns
tRECRSTB RESET_B recovery 4.94 ns
tMPWRSTB RESET_B minimum pulse width 1.18 ns
tCYC Clock cycle time 10.90 ns
FMAX Maximum frequency 92 MHz
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-7 on page 2-7 for derating values.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-71
Table 2-95 • RAM512X18
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1. 14 V
Parameter Description Std. Units
tAS Address setup time 1.28 ns
tAH Address hold time 0.25 ns
tENS REN_B, WEN_B setup time 1.13 ns
tENH REN_B, WEN_B hold time 0.13 ns
tDS Input data (DI) setup time 1.10 ns
tDH Input data (DI) hold time 0.55 ns
tCKQ1 Clock High to new data valid on DO (output retained, WMODE = 0) 6.56 ns
tCKQ2 Clock High to new data valid on DO (pipelined) 2.67 ns
tC2CRWH Address collision clk-to-clk delay for reliable read access after write on same address –
applicable to opening edge 0.29 ns
tC2CWRH Address collision clk-to-clk delay for reliable write access after read on same address –
applicable to opening edge 0.36 ns
tRSTBQ RESET_B Low to data out Low on DO (flow through) 3.21 ns
RESET_B Low to data out Low on DO (pipelined) 3.21 ns
tREMRSTB RESET_B removal 0.93 ns
tRECRSTB RESET_B recovery 4.94 ns
tMPWRSTB RESET_B minimum pulse width 1.18 ns
tCYC Clock cycle time 10.90 ns
FMAX Maximum frequency 92 MHz
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-7 on page 2-7 for derating values.
IGLOO PLUS DC and Switching Characteristi c s
2-72 Revision 11
FIFO
Figure 2- 30 • FIFO Model
FIFO4K18
RW2
RD17
RW1
RD16
RW0
WW2
WW1
WW0 RD0
ESTOP
FSTOP
FULL
AFULL
EMPTY
AFVAL11
AEMPTY
AFVAL10
AFVAL0
AEVAL11
AEVAL10
AEVAL0
REN
RBLK
RCLK
WEN
WBLK
WCLK
RPIPE
WD17
WD16
WD0
RESET
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-73
Timing Waveforms
Figure 2-31 • FIFO Reset
Figure 2-32 • FIFO EMPTY Flag and AEMPTY Flag Assertion
MATCH (A
0
)
t
MPWRSTB
t
RSTFG
t
RSTCK
t
RSTAF
RCLK/
WCLK
RESET_B
EMPTY
AEMPTY
WA/RA
(Address Counter)
t
RSTFG
t
RSTAF
FULL
AFULL
RCLK
NO MATCH NO MATCH Dist = AEF_TH MATCH (EMPTY)
tCKAF
tRCKEF
EMPTY
AEMPTY
tCYC
WA/RA
(Address Counter)
IGLOO PLUS DC and Switching Characteristi c s
2-74 Revision 11
Figure 2-33 • FIFO FULL Flag and AFULL Flag Assertion
Figure 2-34 • FIFO EMPTY Flag and AEMPTY Flag Deassertion
Figure 2-35 • FIFO FULL Flag and AFULL Flag Deassertion
NO MATCH NO MATCH Dist = AFF_TH MATCH (FULL)
t
CKAF
t
WCKFF
t
CYC
WCLK
FULL
AFULL
WA/RA
(Address Counter)
WCLK
WA/RA
(Address Counter)
MATCH
(EMPTY) NO MATCH NO MATCH NO MATCH Dist = AEF_TH + 1
NO MATCH
RCLK
EMPTY
1st Rising
Edge
After 1st
Write
2nd Rising
Edge
After 1st
Write
tRCKEF
tCKAF
AEMPTY
Dist = AFF_TH – 1
MATCH (FULL) NO MATCH NO MATCH NO MATCH NO MATCH
tWCKF
tCKAF
1st Rising
Edge
After 1st
Read
1st Rising
Edge
After 2nd
Read
RCLK
WA/RA
(Address Counter)
WCLK
FULL
AFULL
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-75
Timing Characteristics
1.5 V DC Core Voltage
Table 2-96 • FIFO
Worst Commercial-Case Conditions: TJ = 70°C, VCC = 1.425 V
Parameter Description Std. Units
tENS REN_B, WEN_B Setup Time 1.66 ns
tENH REN_B, WEN_B Hold T ime 0.13 ns
tBKS BLK_B Setup Time 0.30 ns
tBKH BLK_B Hold Time 0.00 ns
tDS Input Data (DI) Setup Time 0.63 ns
tDH Input Data (DI) Hold Time 0.20 ns
tCKQ1 Clock High to New Data Valid on DO (flow-through) 2.77 ns
tCKQ2 Clock High to New Data Valid on DO (pipelined) 1.50 ns
tRCKEF RCLK High to Empty Flag Valid 2.94 ns
tWCKFF WCLK High to Full Flag Valid 2.79 ns
tCKAF Clock High to Almost Empty/Full Flag Valid 10.71 ns
tRSTFG RESET_B Low to Empty/Full Flag Vali d 2.90 ns
tRSTAF RESET_B Low to Almost Empty/Full Flag Valid 10.60 ns
tRSTBQ RESET_B Low to Data Out Low on DO (flow-through) 1.68 ns
RESET_B Low to Data Out Low on DO (pipelined) 1.68 ns
tREMRSTB RESET_B Removal 0.51 ns
tRECRSTB RESET_B Recovery 2.68 ns
tMPWRSTB RESET_B Minimum Pulse Width 0.68 ns
tCYC Clock Cycle Time 6.24 ns
FMAX Maximum Frequency for FIFO 160 MHz
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
IGLOO PLUS DC and Switching Characteristi c s
2-76 Revision 11
1.2 V DC Core Voltage
Table 2-97 • FIFO
Worst Commercial-Case Conditions: TJ = 70°C, VCC = 1.14 V
Parameter Description Std. Units
tENS REN_B, WEN_B Setup Time 3.44 ns
tENH REN_B, WEN_B Hold T ime 0.26 ns
tBKS BLK_B Setup Time 0.30 ns
tBKH BLK_B Hold Time 0.00 ns
tDS Input Data (DI) Setup Time 1.30 ns
tDH Input Data (DI) Hold Time 0.41 ns
tCKQ1 Clock High to New Data Valid on DO (flow-through) 5.67 ns
tCKQ2 Clock High to New Data Valid on DO (pipelined) 3.02 ns
tRCKEF RCLK High to Empty Flag Valid 6.02 ns
tWCKFF WCLK High to Full Flag Valid 5.71 ns
tCKAF Clock High to Almost Empty/Full Flag Valid 22.17 ns
tRSTFG RESET_B Low to Empty/Full Flag Vali d 5.93 ns
tRSTAF RESET_B Low to Almost Empty/Full Flag Valid 21.94 ns
tRSTBQ RESET_B Low to Data Out Low on DO (flow-through) 3.41 ns
RESET_B Low to Data Out Low on DO (pipelined) 3.41 ns
tREMRSTB RESET_B Removal 1.02 ns
tRECRSTB RESET_B Recovery 5.48 ns
tMPWRSTB RESET_B Minimum Pulse Width 1.18 ns
tCYC Clock Cycle Time 10.90 ns
FMAX Maximum Frequency for FIFO 92 MHz
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-7 on page 2-7 for derating values.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-77
Embedded FlashROM Characteristics
Timing Characteristics
1.5 V DC Core Voltage
1.2 V DC Core Voltage
Figure 2-36 • Timing Diagram
A
0
A
1
t
SU
t
HOLD
t
SU
t
HOLD
t
SU
t
HOLD
t
CKQ2
t
CKQ2
t
CKQ2
CLK
A
ddress
Data D
0
D
0
D
1
Table 2-98 • Embedded FlashROM Access Time
Worst Commercial-Case Conditions: TJ = 70°C, VCC = 1.425 V
Parameter Description Std. Units
tSU Address Setup Time 0.57 ns
tHOLD Address Hold T ime 0.00 ns
tCK2Q Clock to Out 17.58 ns
FMAX Maximum Clock Frequency 1 5 MHz
Table 2-99 • Embedded FlashROM Access Time
Worst Commercial-Case Conditions: TJ = 70°C, VCC = 1.14 V
Parameter Description Std. Units
tSU Address Setup Time 0.59 ns
tHOLD Address Hold T ime 0.00 ns
tCK2Q Clock to Out 30.94 ns
FMAX Maximum Clock Frequency 1 0 MHz
IGLOO PLUS DC and Switching Characteristi c s
2-78 Revision 11
JTAG 1532 Characteristics
JTAG timing dela ys do not include JTAG I/Os. To obtain complete JTAG timing, add I/O buffer delays to
the corresponding standard selected; refer to the I/O timing characteristics in the "User I/O
Characteristics" section on page 2-15 for more details.
Timing Characteristics
1.5 V DC Core Voltage
1.2 V DC Core Voltage
Table 2-100 • JTAG 1532
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.425 V
Parameter Description Std. Units
tDISU Test Data Input Setup Time 1.00 ns
tDIHD Test Data Input Hold Time 2.00 ns
tTMSSU Test Mode Select Setup Time 1.00 ns
tTMDHD Test Mode Select Hold Time 2.00 ns
tTCK2Q Clock to Q (data out) 8.00 ns
tRSTB2Q Reset to Q (data out) 25.00 ns
FTCKMAX TCK Maximum Frequency 15 M Hz
tTRSTREM ResetB Removal Time 0.58 ns
tTRSTREC ResetB Recovery Time 0.00 ns
tTRSTMPW ResetB Minimum Pulse TBD ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
Table 2-101 • JTAG 1532
Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.14 V
Parameter Description Std. Units
tDISU Test Data Input Setup Time 1.50 ns
tDIHD Test Data Input Hold Time 3.00 ns
tTMSSU Test Mode Select Setup Time 1.50 ns
tTMDHD Test Mode Select Hold Time 3.00 ns
tTCK2Q Clock to Q (data out) 11.00 ns
tRSTB2Q Reset to Q (data out) 30.00 ns
FTCKMAX TCK Maximum Frequency 9.00 MHz
tTRSTREM ResetB Removal Time 1.18 ns
tTRSTREC ResetB Recovery Time 0.00 ns
tTRSTMPW ResetB Minimum Pulse TBD ns
Note: For specific junction temperature and voltag e supply levels, refer to Tab le 2-6 on page 2-6 for derating values.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 2-79
Actel Safety Critical, Life Support, and High-Reliability
Applications Policy
The Actel products described in this advance status datasheet may not have completed Actel’s
qualification process. Actel may amend or enhance products during the product introduction and
qualification process, resulting in changes in device functionality or performance. It is the responsibility of
each customer to ensure the fitness of any Actel product (b ut especially a new product) for a particular
purpose, including appropriateness for safety-critical, life-supp ort, and other high-reliability applications.
Consult Actel’s Terms and Conditions for specific liabili ty exclusions relating to life-support applications.
A reliability report covering all of Actel’s products is available on the Actel website at
http://www.actel.com/documents/ORT_Report.pdf. Actel also offers a variety of enhanced qualification
and lot acceptance screening procedures. Contact your local Actel sales office for additional reliability
information.
Revision 11 3-1
IGLOO PLUS Low Power Flash FPGAs
3 – Package Pin Assignment s
128-Pin VQFP
Note
For Package Manufacturing and Environmental information, visit the Resource Center at
http://www.actel.com/products/solutions/package/docs.aspx.
Pin information is in the "Pin Descriptions" chapter of the IGLOO PLUS FPGA Fabric User’s Guide.
Note: This is the bottom view of the package.
1
128-Pin
VQFP
128
Package Pin Assignments
3-2 Revision 11
128-Pin VQFP
Pin Number AGLP030
Function
1 IO119RSB3
2 IO118RSB3
3 IO117RSB3
4 IO115RSB3
5 IO116RSB3
6 IO113RSB3
7 IO114RSB3
8GND
9VCCIB3
10 IO112RSB3
11 IO111RSB3
12 IO110RSB3
13 IO109RSB3
14 GEC0/IO108RSB3
15 GEA0/IO107RSB3
16 GEB0/IO106RSB3
17 VCC
18 IO104RSB3
19 IO103RSB3
20 IO102RSB3
21 IO101RSB3
22 IO100RSB3
23 IO99RSB3
24 GND
25 VCCIB3
26 IO97RSB3
27 IO98RSB3
28 IO95RSB3
29 IO96RSB3
30 IO94RSB3
31 IO93RSB3
32 IO92RSB3
33 IO91RSB2
34 FF/IO90RSB2
35 IO89RSB2
36 IO88RSB2
37 IO86RSB2
38 IO84RSB2
39 IO83RSB2
40 GND
41 VCCIB2
42 IO82RSB2
43 IO81RSB2
44 IO79RSB2
45 IO78RSB2
46 IO77RSB2
47 IO75RSB2
48 IO74RSB2
49 VCC
50 IO73RSB2
51 IO72RSB2
52 IO70RSB2
53 IO69RSB2
54 IO68RSB2
55 IO66RSB2
56 IO65RSB2
57 GND
58 VCCIB2
59 IO63RSB2
60 IO61RSB2
61 IO59RSB2
62 TCK
63 TDI
64 TMS
65 VPUMP
66 TDO
67 TRST
68 IO58RSB1
69 VJTAG
70 IO56RSB1
128-Pin VQFP
Pin Number AGLP030
Function
71 IO57RSB1
72 VCCIB1
73 GND
74 IO55RSB1
75 IO54RSB1
76 IO53RSB1
77 IO52RSB1
78 IO51RSB1
79 IO50RSB1
80 IO49RSB1
81 VCC
82 GDB0/IO48RSB1
83 GDA0/IO47RSB1
84 GDC0/IO46RSB1
85 IO45RSB1
86 IO44RSB1
87 IO43RSB1
88 IO42RSB1
89 VCCIB1
90 GND
91 IO40RSB1
92 IO41RSB1
93 IO39RSB1
94 IO38RSB1
95 IO37RSB1
96 IO36RSB1
97 IO35RSB0
98 IO34RSB0
99 IO33RSB0
100 IO32RSB0
101 IO30RSB0
102 IO28RSB0
103 IO27RSB0
104 VCCIB0
105 GND
128-Pin VQFP
Pin Number AGLP030
Function
IGLOO PLUS Low Power Flash FPGAs
Revision 11 3-3
106 IO26RSB0
107 IO25RSB0
108 IO23RSB0
109 IO22RSB0
110 IO21RSB0
111 IO19RSB0
112 IO18RSB0
113 VCC
114 IO17RSB0
115 IO16RSB0
116 IO14RSB0
117 IO13RSB0
118 IO12RSB0
119 IO10RSB0
120 IO09RSB0
121 VCCIB0
122 GND
123 IO07RSB0
124 IO05RSB0
125 IO03RSB0
126 IO02RSB0
127 IO01RSB0
128 IO00RSB0
128-Pin VQFP
Pin Number AGLP030
Function
IGLOO PLUS Low Power Flash FPGAs
Revision 11 3-5
176-Pin VQFP
Pin Number AGLP060
Function
1 GAA2/IO156RSB3
2 IO155RSB3
3 GAB2/IO154RSB3
4 IO153RSB3
5 GAC2/IO152RSB3
6GND
7 VCCIB3
8 IO149RSB3
9 IO147RSB3
10 IO145RSB3
11 IO144RSB3
12 IO143RSB3
13 VCC
14 IO141RSB3
15 GFC1/IO140RSB3
16 GFB1/IO138RSB3
17 GFB0/IO137RSB3
18 VCOMPLF
19 GFA1/IO136RSB3
20 VCCPLF
21 GFA0/IO135RSB3
22 GND
23 VCCIB3
24 GFA2/IO134RSB3
25 GFB2/IO133RSB3
26 GFC2/IO132RSB3
27 IO131RSB3
28 IO130RSB3
29 IO129RSB3
30 IO127RSB3
31 IO126RSB3
32 IO125RSB3
33 IO123RSB3
34 IO122RSB3
35 IO121RSB3
36 IO119RSB3
37 GND
38 VCCIB3
39 GEC1/IO116RSB3
40 GEB1/IO114RSB3
41 GEC0/IO115RSB3
42 GEB0/IO113RSB3
43 GEA1/IO112RSB3
44 GEA0/IO111RSB3
45 GEA2/IO110RSB2
46 NC
47 FF/GEB2/IO109R
SB2
48 GEC2/IO108RSB2
49 IO106RSB2
50 IO107RSB2
51 IO104RSB2
52 IO105RSB2
53 IO102RSB2
54 IO103RSB2
55 GND
56 VCCIB2
57 IO101RSB2
58 IO100RSB2
59 IO99RSB2
60 IO98RSB2
61 IO97RSB2
62 IO96RSB2
63 IO95RSB2
64 IO94RSB2
65 IO93RSB2
66 VCC
67 IO92RSB2
68 IO91RSB2
69 IO90RSB2
176-Pin VQFP
Pin Number AGLP060
Function
70 IO89RSB2
71 IO88RSB2
72 IO87RSB2
73 IO86RSB2
74 IO85RSB2
75 IO84RSB2
76 GND
77 VCCIB2
78 IO83RSB2
79 IO82RSB2
80 GDC2/IO80RSB2
81 IO81RSB2
82 GDA2/IO78RSB2
83 GDB2/IO79RSB2
84 NC
85 NC
86 TCK
87 TDI
88 TMS
89 VPUMP
90 TDO
91 TRST
92 VJTAG
93 GDA1/IO76RSB1
94 GDC0/IO73RSB1
95 GDB1/IO74RSB1
96 GDC1/IO72RSB1
97 VCCIB1
98 GND
99 IO70RSB1
100 IO69RSB1
101 IO67RSB1
102 IO66RSB1
103 IO65RSB1
104 IO63RSB1
176-Pin VQFP
Pin Number AGLP060
Function
Package Pin Assignments
3-6 Revision 11
105 IO62RSB1
106 IO61RSB1
107 GCC2/IO60RSB1
108 GCB2/IO59RSB1
109 GCA2/IO58RSB1
110 GCA0/IO57RSB1
111 GCA1/IO56RSB1
112 VCCIB1
113 GND
114 GCB0/IO55RSB1
115 GCB1/IO54RSB1
116 GCC0/IO53RSB1
117 GCC1/IO52RSB1
118 IO51RSB1
119 IO50RSB1
120 VCC
121 IO48RSB1
122 IO47RSB1
123 IO45RSB1
124 IO44RSB1
125 IO43RSB1
126 VCCIB1
127 GND
128 GBC2/IO40RSB1
129 IO39RSB1
130 GBB2/IO38RSB1
131 IO37RSB1
132 GBA2/IO36RSB1
133 GBA1/IO35RSB0
134 NC
135 GBA0/IO34RSB0
136 NC
137 GBB1/IO33RSB0
138 NC
139 GBC1/IO31RSB0
176-Pin VQFP
Pin Number AGLP060
Function
140 GBB0/IO32RSB0
141 GBC0/IO30RSB0
142 IO29RSB0
143 IO28RSB0
144 IO27RSB0
145 VCCIB0
146 GND
147 IO26RSB0
148 IO25RSB0
149 IO24RSB0
150 IO23RSB0
151 IO22RSB0
152 IO21RSB0
153 IO20RSB0
154 IO19RSB0
155 IO18RSB0
156 VCC
157 IO17RSB0
158 IO16RSB0
159 IO15RSB0
160 IO14RSB0
161 IO13RSB0
162 IO12RSB0
163 IO11RSB0
164 IO10RSB0
165 IO09RSB0
166 VCCIB0
167 GND
168 IO07RSB0
169 IO08RSB0
170 GAC1/IO05RSB0
171 IO06RSB0
172 GAB1/IO03RSB0
173 GAC0/IO04RSB0
174 GAB0/IO02RSB0
176-Pin VQFP
Pin Number AGLP060
Function
175 GAA1/IO01RSB0
176 GAA0/IO00RSB0
176-Pin VQFP
Pin Number AGLP060
Function
Package Pin Assignments
3-8 Revision 11
201-Pin CSP
Pin Number AGLP030
Function
A1 NC
A2 IO04RSB0
A3 IO06RSB0
A4 IO09RSB0
A5 IO11RSB0
A6 IO13RSB0
A7 IO17RSB0
A8 IO18RSB0
A9 IO24RSB0
A10 IO26RSB0
A11 IO27RSB0
A12 IO31RSB0
A13 NC
A14 NC
A15 NC
B1 NC
B2 NC
B3 IO08RSB0
B4 IO05RSB0
B5 IO07RSB0
B6 IO15RSB0
B7 IO14RSB0
B8 IO16RSB0
B9 IO20RSB0
B10 IO22RSB0
B11 IO34RSB0
B12 IO29RSB0
B13 NC
B14 NC
B15 NC
C1 NC
C2 NC
C3 GND
C4 IO00RSB0
C5 IO02RSB0
C6 IO12RSB0
C7 IO23RSB0
C8 IO19RSB0
C9 IO28RSB0
C10 IO32RSB0
C11 IO35RSB0
C12 NC
C13 GND
C14 IO41RSB1
C15 IO37RSB1
D1 IO117RSB3
D2 IO118RSB3
D3 NC
D4 GND
D5 IO01RSB0
D6 IO03RSB0
D7 IO10RSB0
D8 IO21RSB0
D9 IO25RSB0
D10 IO30RSB0
D11 IO33RSB0
D12 GND
D13 NC
D14 IO36RSB1
D15 IO39RSB1
E1 IO115RSB3
E2 IO114RSB3
E3 NC
E4 NC
E12 NC
E13 NC
E14 GDC0/IO46RSB1
E15 GDB0/IO48RSB1
F1 IO113RSB3
F2 IO116RSB3
201-Pin CSP
Pin Number AGLP030
Function
F3 IO119RSB3
F4 IO111RSB3
F6 GND
F7 VCC
F8 VCCIB0
F9 VCCIB0
F10 VCCIB0
F12 NC
F13 NC
F14 IO40RSB1
F15 IO38RSB1
G1 NC
G2 IO112RSB3
G3 IO110RSB3
G4 IO109RSB3
G6 VCCIB3
G7 GND
G8 VCC
G9 GND
G10 GND
G12 NC
G13 NC
G14 IO42RSB1
G15 IO44RSB1
H1 NC
H2 GEB0/IO106RSB3
H3 GEC0/IO108RSB3
H4 NC
H6 VCCIB3
H7 GND
H8 VCC
H9 GND
H10 VCCIB1
H12 IO54RSB1
H13 GDA0/IO47RSB1
201-Pin CSP
Pin Number AGLP030
Function
IGLOO PLUS Low Power Flash FPGAs
Revision 11 3-9
H14 IO45RSB1
H15 IO43RSB1
J1 GEA0/IO107RSB3
J2 IO105RSB3
J3 IO104RSB3
J4 IO102RSB3
J6 VCCIB3
J7 GND
J8 VCC
J9 GND
J10 VCCIB1
J12 NC
J13 NC
J14 IO52RSB1
J15 IO50RSB1
K1 IO103RSB3
K2 IO101RSB3
K3 IO99RSB3
K4 IO100RSB3
K6 GND
K7 VCCIB2
K8 VCCIB2
K9 VCCIB2
K10 VCCIB1
K12 NC
K13 IO57RSB1
K14 IO49RSB1
K15 IO53RSB1
L1 IO96RSB3
L2 IO98RSB3
L3 IO95RSB3
L4 IO94RSB3
L12 NC
L13 NC
L14 IO51RSB1
201-Pin CSP
Pin Number AGLP030
Function
L15 IO58RSB1
M1 IO93RSB3
M2 IO92RSB3
M3 IO97RSB3
M4 GND
M5 NC
M6 IO79RSB2
M7 IO77RSB2
M8 IO72RSB2
M9 IO70RSB2
M10 IO61RSB2
M11 IO59RSB2
M12 GND
M13 NC
M14 IO55RSB1
M15 IO56RSB1
N1 NC
N2 NC
N3 GND
N4 NC
N5 IO88RSB2
N6 IO81RSB2
N7 IO75RSB2
N8 IO68RSB2
N9 IO66RSB2
N10 IO65RSB2
N11 IO71RSB2
N12 IO63RSB2
N13 GND
N14 TDO
N15 VJTAG
P1 NC
P2 NC
P3 NC
P4 NC
201-Pin CSP
Pin Number AGLP030
Function
P5 IO87RSB2
P6 IO86RSB2
P7 IO84RSB2
P8 IO80RSB2
P9 IO74RSB2
P10 IO73RSB2
P11 IO76RSB2
P12 IO67RSB2
P13 IO64RSB2
P14 VPUMP
P15 TRST
R1 NC
R2 NC
R3 IO91RSB2
R4 FF/IO90RSB2
R5 IO89RSB2
R6 IO83RSB2
R7 IO82RSB2
R8 IO85RSB2
R9 IO78RSB2
R10 IO69RSB2
R11 IO62RSB2
R12 IO60RSB2
R13 TMS
R14 TDI
R15 TCK
201-Pin CSP
Pin Number AGLP030
Function
Package Pin Assignments
3-10 Revision 11
201-Pin CSP
Pin Number AGLP060
Function
A1 IO150RSB3
A2 GAA0/IO00RSB0
A3 GAC0/IO04RSB0
A4 IO08RSB0
A5 IO11RSB0
A6 IO15RSB0
A7 IO17RSB0
A8 IO18RSB0
A9 IO22RSB0
A10 IO26RSB0
A11 IO29RSB0
A12 GBC1/IO31RSB0
A13 GBA2/IO36RSB1
A14 IO41RSB1
A15 NC
B1 IO151RSB3
B2 GAB2/IO154RSB3
B3 IO06RSB0
B4 IO09RSB0
B5 IO13RSB0
B6 IO10RSB0
B7 IO12RSB0
B8 IO20RSB0
B9 IO23RSB0
B10 IO25RSB0
B11 IO24RSB0
B12 IO27RSB0
B13 IO37RSB1
B14 IO46RSB1
B15 IO42RSB1
C1 IO155RSB3
C2 GAA2/IO156RSB3
C3 GND
C4 GAA1/IO01RSB0
C5 GAB1/IO03RSB0
C6 IO07RSB0
C7 IO16RSB0
C8 IO21RSB0
C9 IO28RSB0
C10 GBB1/IO33RSB0
C11 GBA1/IO35RSB0
C12 GBB2/IO38RSB1
C13 GND
C14 IO48RSB1
C15 IO39RSB1
D1 IO146RSB3
D2 IO144RSB3
D3 IO148RSB3
D4 GND
D5 GAB0/IO02RSB0
D6 GAC1/IO05RSB0
D7 IO14RSB0
D8 IO19RSB0
D9 GBC0/IO30RSB0
D10 GBB0/IO32RSB0
D11 GBA0/IO34RSB0
D12 GND
D13 GBC2/IO40RSB1
D14 IO51RSB1
D15 IO44RSB1
E1 IO142RSB3
E2 IO149RSB3
E3 IO153RSB3
E4 GAC2/IO152RSB3
E12 IO43RSB1
E13 IO49RSB1
E14 GCC0/IO53RSB1
E15 GCB0/IO55RSB1
F1 IO141RSB3
F2 GFC1/IO140RSB3
201-Pin CSP
Pin Number AGLP060
Function
F3 IO145RSB3
F4 IO147RSB3
F6 GND
F7 VCC
F8 VCCIB0
F9 VCCIB0
F10 VCCIB0
F12 IO47RSB1
F13 IO45RSB1
F14 GCC1/IO52RSB1
F15 GCA1/IO56RSB1
G1* VCOMPLF
G2 GFB0/IO137RSB3
G3 GFC0/IO139RSB3
G4 IO143RSB3
G6 VCCIB3
G7 GND
G8 VCC
G9 GND
G10 GND
G12 IO50RSB1
G13 GCB1/IO54RSB1
G14 GCC2/IO60RSB1
G15 GCA2/IO58RSB1
H1* VCCPLF
H2 GFA1/IO136RSB3
H3 GFB1/IO138RSB3
H4 NC
H6 VCCIB3
H7 GND
H8 VCC
H9 GND
H10 VCCIB1
H12 GCB2/IO59RSB1
H13 GCA0/IO57RSB1
201-Pin CSP
Pin Number AGLP060
Function
*Pin numbers G1 and H1 must be conne cted to ground because a PLL is not su pported for AGLP060-CS/G201.
IGLOO PLUS Low Power Flash FPGAs
Revision 11 3-11
H14 IO64RSB1
H15 IO62RSB1
J1 GFA2/IO134RSB3
J2 GFA0/IO135RSB3
J3 GFB2/IO133RSB3
J4 IO131RSB3
J6 VCCIB3
J7 GND
J8 VCC
J9 GND
J10 VCCIB1
J12 IO61RSB1
J13 IO63RSB1
J14 IO68RSB1
J15 IO66RSB1
K1 IO130RSB3
K2 GFC2/IO132RSB3
K3 IO127RSB3
K4 IO129RSB3
K6 GND
K7 VCCIB2
K8 VCCIB2
K9 VCCIB2
K10 VCCIB1
K12 IO65RSB1
K13 IO67RSB1
K14 IO69RSB1
K15 IO70RSB1
L1 IO126RSB3
L2 IO128RSB3
L3 IO121RSB3
L4 IO123RSB3
L12 GDB1/IO74RSB1
L13 GDC1/IO72RSB1
L14 IO71RSB1
201-Pin CSP
Pin Number AGLP060
Function
L15 GDC0/IO73RSB1
M1 IO122RSB3
M2 IO124RSB3
M3 IO119RSB3
M4 GND
M5 IO125RSB3
M6 IO98RSB2
M7 IO96RSB2
M8 IO91RSB2
M9 IO89RSB2
M10 IO82RSB2
M11 GDA2/IO78RSB2
M12 GND
M13 GDA1/IO76RSB1
M14 GDA0/IO77RSB1
M15 GDB0/IO75RSB1
N1 IO117RSB3
N2 IO120RSB3
N3 GND
N4 GEB1/IO114RSB3
N5 IO107RSB2
N6 IO100RSB2
N7 IO94RSB2
N8 IO87RSB2
N9 IO85RSB2
N10 GDC2/IO80RSB2
N11 IO90RSB2
N12 IO84RSB2
N13 GND
N14 TDO
N15 VJTAG
P1 GEC0/IO115RSB3
P2 GEC1/IO116RSB3
P3 GEA0/IO111RSB3
P4 GEA1/IO112RSB3
201-Pin CSP
Pin Number AGLP060
Function
P5 IO106RSB2
P6 IO105RSB2
P7 IO103RSB2
P8 IO99RSB2
P9 IO93RSB2
P10 IO92RSB2
P11 IO95RSB2
P12 IO86RSB2
P13 IO83RSB2
P14 VPUMP
P15 TRST
R1 IO118RSB3
R2 GEB0/IO113RSB3
R3 GEA2/IO110RSB2
R4 FF/GEB2/IO109RS
B2
R5 GEC2/IO108RSB2
R6 IO102RSB2
R7 IO101RSB2
R8 IO104RSB2
R9 IO97RSB2
R10 IO88RSB2
R11 IO81RSB2
R12 GDB2/IO79RSB2
R13 TMS
R14 TDI
R15 TCK
201-Pin CSP
Pin Number AGLP060
Function
Package Pin Assignments
3-12 Revision 11
281-Pin CSP
Note
For Package Manufacturing and Environmental information, visit the Resource Center at
http://www.actel.com/products/solutions/package/docs.aspx
Note: This is the bottom view of the package.
10 9 8 7 6 5 4 3 2 1111213141516171819
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IGLOO PLUS Low Power Flash FPGAs
Revision 11 3-13
281-Pin CSP
Pin Number AGLP125 Fun ction
A1 GND
A2 GAB0/IO02RSB0
A3 GAC1/IO05RSB0
A4 IO09RSB0
A5 IO13RSB0
A6 IO15RSB0
A7 IO18RSB0
A8 IO23RSB0
A9 IO25RSB0
A10 VCCIB0
A11 IO33RSB0
A12 IO41RSB0
A13 IO43RSB0
A14 IO46RSB0
A15 IO55RSB0
A16 IO56RSB0
A17 GBC1/IO58RSB0
A18 GBA0/IO61RSB0
A19 GND
B1 GAA2/IO211RSB3
B2 VCCIB0
B3 GAB1/IO03RSB0
B4 GAC0/IO04RSB0
B5 IO11RSB0
B6 GND
B7 IO21RSB0
B8 IO22RSB0
B9 IO28RSB0
B10 IO32RSB0
B11 IO36RSB0
B12 IO39RSB0
B13 IO42RSB0
B14 GND
B15 IO52RSB0
B16 GBC0/IO57RSB0
B17 GBA1/IO62RSB0
B18 VCCIB1
B19 IO64RSB1
C1 GAB2/IO209RSB3
C2 IO210RSB3
C6 IO12RSB0
C14 IO47RSB0
C18 IO54RSB0
C19 GBB2/IO65RSB1
D1 IO206RSB3
D2 IO208RSB3
D4 GAA0/IO00RSB0
D5 GAA1/IO01RSB0
D6 IO10RSB0
D7 IO17RSB0
D8 IO24RSB0
D9 IO27RSB0
D10 GND
D11 IO31RSB0
D12 IO40RSB0
D13 IO49RSB0
D14 IO45RSB0
D15 GBB0/IO59RSB0
D16 GBA2/IO63RSB1
D18 GBC2/IO67RSB1
D19 IO66RSB1
E1 IO203RSB3
E2 IO205RSB3
E4 IO07RSB0
E5 IO06RSB0
E6 IO14RSB0
E7 IO20RSB0
E8 IO29RSB0
E9 IO34RSB0
E10 IO30RSB0
E11 IO37RSB0
E12 IO38RSB0
281-Pin CSP
Pin Number AGLP125 Function
E13 IO48RSB0
E14 GBB1/IO60RSB0
E15 IO53RSB0
E16 IO69RSB1
E18 IO68RSB1
E19 IO71RSB1
F1 IO198RSB3
F2 GND
F3 IO201RSB3
F4 IO204RSB3
F5 IO16RSB0
F15 IO50RSB0
F16 IO74RSB1
F17 IO72RSB1
F18 GND
F19 IO73RSB1
G1 IO195RSB3
G2 IO200RSB3
G4 IO202RSB3
G5 IO08RSB0
G7 GAC2/IO207RSB3
G8 VCCIB0
G9 IO26RSB0
G10 IO35RSB0
G11 IO44RSB0
G12 VCCIB0
G13 IO51RSB0
G15 IO70RSB1
G16 IO75RSB1
G18 GCC0/IO80RSB1
G19 GCB1/IO81RSB1
H1 GFB0/IO191RSB3
H2 IO196RSB3
H4 GFC1/IO194RSB3
H5 GFB1/IO192RSB3
H7 VCCIB3
281-Pin CSP
Pin Number AGLP125 Function
Package Pin Assignments
3-14 Revision 11
H8 VCC
H9 VCCIB0
H10 VCC
H11 VCCIB0
H12 VCC
H13 VCCIB1
H15 IO77RSB1
H16 GCB0/IO82RSB1
H18 GCA1/IO83RSB1
H19 GCA2/IO85RSB1
J1 VCOMPLF
J2 GFA0/IO189RSB3
J4 VCCPLF
J5 GFC0/IO193RSB3
J7 GFA2/IO188RSB3
J8 VCCIB3
J9 GND
J10 GND
J11 GND
J12 VCCIB1
J13 GCC1/IO79RSB1
J15 GCA0/IO84RSB1
J16 GCB2/IO86RSB1
J18 IO76RSB1
J19 IO78RSB1
K1 VCCIB3
K2 GFA1/IO190RSB3
K4 GND
K5 IO19RSB0
K7 IO197RSB3
K8 VCC
K9 GND
K10 GND
K11 GND
K12 VCC
K13 GCC2/IO87RSB1
281-Pin CSP
Pin Number AGLP125 Fun ction
K15 IO89RSB1
K16 GND
K18 IO88RSB1
K19 VCCIB1
L1 GFB2/IO187RSB3
L2 IO185RSB3
L4 GFC2/IO186RSB3
L5 IO184RSB3
L7 IO199RSB3
L8 VCCIB3
L9 GND
L10 GND
L11 GND
L12 VCCIB1
L13 IO95RSB1
L15 IO91RSB1
L16 NC
L18 IO90RSB1
L19 NC
M1 IO180RSB3
M2 IO179RSB3
M4 IO181RSB3
M5 IO183RSB3
M7 VCCIB3
M8 VCC
M9 VCCIB2
M10 VCC
M11 VCCIB2
M12 VCC
M13 VCCIB1
M15 IO122RSB2
M16 IO93RSB1
M18 IO92RSB1
M19 NC
N1 IO178RSB3
N2 IO175RSB3
281-Pin CSP
Pin Number AGLP125 Function
N4 IO182RSB3
N5 IO161RSB2
N7 GEA2/IO164RSB2
N8 VCCIB2
N9 IO137RSB2
N10 IO135RSB2
N11 IO131RSB2
N12 VCCIB2
N13 VPUMP
N15 IO117RSB2
N16 IO96RSB1
N18 IO98RSB1
N19 IO94RSB1
P1 IO174RSB3
P2 GND
P3 IO176RSB3
P4 IO177RSB3
P5 GEA0/IO165RSB3
P15 IO111RSB2
P16 IO108RSB2
P17 GDC1/IO99RSB1
P18 GND
P19 IO97RSB1
R1 IO173RSB3
R2 IO172RSB3
R4 GEC1/IO170RSB3
R5 GEB1/IO168RSB3
R6 IO154RSB2
R7 IO149RSB2
R8 IO146RSB2
R9 IO138RSB2
R10 IO134RSB2
R11 IO132RSB2
R12 IO130RSB2
R13 IO118RSB2
R14 IO112RSB2
281-Pin CSP
Pin Number AGLP125 Function
IGLOO PLUS Low Power Flash FPGAs
Revision 11 3-15
R15 IO109RSB2
R16 GDA1/IO103RSB1
R18 GDB0/IO102RSB1
R19 GDC0/IO100RSB1
T1 IO171RSB3
T2 GEC0/IO169RSB3
T4 GEB0/IO167RSB3
T5 IO157RSB2
T6 IO158RSB2
T7 IO148RSB2
T8 IO145RSB2
T9 IO143RSB2
T10 GND
T11 IO129RSB2
T12 IO126RSB2
T13 IO125RSB2
T14 IO116RSB2
T15 GDC2/IO107RSB2
T16 TMS
T18 VJTAG
T19 GDB1/IO101RSB1
U1 IO160RSB2
U2 GEA1/IO166RSB3
U6 IO151RSB2
U14 IO121RSB2
U18 TRST
U19 GDA0/IO104RSB1
V1 IO159RSB2
V2 VCCIB3
V3 GEC2/IO162RSB2
V4 IO156RSB2
V5 IO153RSB2
V6 GND
V7 IO144RSB2
V8 IO141RSB2
V9 IO140RSB2
281-Pin CSP
Pin Number AGLP125 Fun ction
V10 IO133RSB2
V11 IO127RSB2
V12 IO123RSB2
V13 IO120RSB2
V14 GND
V15 IO113RSB2
V16 GDA2/IO105RSB2
V17 TDI
V18 VCCIB2
V19 TDO
W1 GND
W2 FF/GEB2/IO163RSB
2
W3 IO155RSB2
W4 IO152RSB2
W5 IO150RSB2
W6 IO147RSB2
W7 IO142RSB2
W8 IO139RSB2
W9 IO136RSB2
W10 VCCIB2
W11 IO128RSB2
W12 IO124RSB2
W13 IO119RSB2
W14 IO115RSB2
W15 IO114RSB2
W16 IO110RSB2
W17 GDB2/IO106RSB2
W18 TCK
W19 GND
281-Pin CSP
Pin Number AGLP125 Function
Package Pin Assignments
3-16 Revision 11
289-Pin CSP
Note
For Package Manufacturing and Environmental information, visit the Resource Center at
http://www.actel.com/products/solutions/package/docs.aspx .
Note: This is the bottom view of the package.
17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1
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A1 Ball Pad Corner
IGLOO PLUS Low Power Flash FPGAs
Revision 11 3-17
289-Pin CSP
Pin Number AGLP030
Function
A1 IO03RSB0
A2 NC
A3 NC
A4 GND
A5 IO10RSB0
A6 IO14RSB0
A7 IO16RSB0
A8 IO18RSB0
A9 GND
A10 IO23RSB0
A11 IO27RSB0
A12 NC
A13 NC
A14 GND
A15 NC
A16 NC
A17 IO30RSB0
B1 IO01RSB0
B2 GND
B3 NC
B4 NC
B5 IO07RSB0
B6 NC
B7 VCCIB0
B8 IO17RSB0
B9 IO19RSB0
B10 IO24RSB0
B11 IO28RSB0
B12 VCCIB0
B13 NC
B14 NC
B15 NC
B16 IO31RSB0
B17 GND
C1 NC
C2 IO00RSB0
C3 IO04RSB0
C4 NC
C5 VCCIB0
C6 IO09RSB0
C7 IO13RSB0
C8 IO15RSB0
C9 IO21RSB0
C10 GND
C11 IO29RSB0
C12 NC
C13 NC
C14 NC
C15 GND
C16 IO34RSB0
C17 NC
D1 NC
D2 IO119RSB3
D3 GND
D4 IO02RSB0
D5 NC
D6 NC
D7 NC
D8 GND
D9 IO20RSB0
D10 IO25RSB0
D11 NC
D12 NC
D13 GND
D14 IO32RSB0
D15 IO35RSB0
D16 NC
D17 NC
E1 VCCIB3
E2 IO114RSB3
E3 IO115RSB3
E4 IO118RSB3
E5 IO05RSB0
E6 NC
289-Pin CSP
Pin Number AGLP030
Function
E7 IO06RSB0
E8 IO11RSB0
E9 IO22RSB0
E10 IO26RSB0
E11 VCCIB0
E12 NC
E13 IO33RSB0
E14 IO36RSB1
E15 IO38RSB1
E16 VCCIB1
E17 NC
F1 IO111RSB3
F2 NC
F3 IO116RSB3
F4 VCCIB3
F5 IO117RSB3
F6 NC
F7 NC
F8 IO08RSB0
F9 IO12RSB0
F10 NC
F11 NC
F12 NC
F13 NC
F14 GND
F15 NC
F16 IO37RSB1
F17 IO41RSB1
G1 IO110RSB3
G2 GND
G3 IO113RSB3
G4 NC
G5 NC
G6 NC
G7 GND
G8 GND
G9 VCC
289-Pin CSP
Pin Number AGLP030
Function
Package Pin Assignments
3-18 Revision 11
G10 GND
G11 GND
G12 IO40RSB1
G13 NC
G14 IO39RSB1
G15 IO44RSB1
G16 NC
G17 GND
H1 NC
H2 GEC0/IO108RSB3
H3 NC
H4 IO112RSB3
H5 NC
H6 IO109RSB3
H7 GND
H8 GND
H9 GND
H10 GND
H11 GND
H12 NC
H13 NC
H14 IO45RSB1
H15 VCCIB1
H16 GDB0/IO48RSB1
H17 IO42RSB1
J1 NC
J2 GEA0/IO107RSB3
J3 VCCIB3
J4 IO105RSB3
J5 NC
J6 NC
J7 VCC
J8 GND
J9 GND
J10 GND
J11 VCC
J12 IO50RSB1
289-Pin CSP
Pin Number AGLP030
Function
J13 IO43RSB1
J14 IO51RSB1
J15 IO52RSB1
J16 GDC0/IO46RSB1
J17 GDA0/IO47RSB1
K1 GND
K2 GEB0/IO106RSB3
K3 IO102RSB3
K4 IO104RSB3
K5 IO99RSB3
K6 NC
K7 GND
K8 GND
K9 GND
K10 GND
K11 GND
K12 NC
K13 NC
K14 NC
K15 IO53RSB1
K16 GND
K17 IO49RSB1
L1 IO103RSB3
L2 IO101RSB3
L3 NC
L4 GND
L5 NC
L6 NC
L7 GND
L8 GND
L9 VCC
L10 GND
L11 GND
L12 IO58RSB1
L13 IO54RSB1
L14 VCCIB1
L15 NC
289-Pin CSP
Pin Number AGLP030
Function
L16 NC
L17 NC
M1 NC
M2 VCCIB3
M3 IO100RSB3
M4 IO98RSB3
M5 IO93RSB3
M6 IO97RSB3
M7 NC
M8 NC
M9 IO71RSB2
M10 NC
M11 IO63RSB2
M12 NC
M13 IO57RSB1
M14 NC
M15 NC
M16 NC
M17 VCCIB1
N1 NC
N2 NC
N3 IO95RSB3
N4 IO96RSB3
N5 GND
N6 NC
N7 IO85RSB2
N8 IO79RSB2
N9 IO77RSB2
N10 VCCIB2
N11 NC
N12 NC
N13 IO59RSB2
N14 NC
N15 GND
N16 IO56RSB1
N17 IO55RSB1
P1 IO94RSB3
289-Pin CSP
Pin Number AGLP030
Function
IGLOO PLUS Low Power Flash FPGAs
Revision 11 3-19
P2 NC
P3 GND
P4 NC
P5 NC
P6 IO87RSB2
P7 IO80RSB2
P8 GND
P9 IO72RSB2
P10 IO67RSB2
P11 IO61RSB2
P12 NC
P13 VCCIB2
P14 NC
P15 IO60RSB2
P16 IO62RSB2
P17 VJTAG
R1 GND
R2 IO91RSB2
R3 NC
R4 NC
R5 NC
R6 VCCIB2
R7 IO83RSB2
R8 IO78RSB2
R9 IO74RSB2
R10 IO70RSB2
R11 GND
R12 NC
R13 NC
R14 NC
R15 NC
R16 TMS
R17 TRST
T1 IO92RSB3
T2 IO89RSB2
T3 NC
T4 GND
289-Pin CSP
Pin Number AGLP030
Function
T5 NC
T6 IO84RSB2
T7 IO81RSB2
T8 IO76RSB2
T9 VCCIB2
T10 IO69RSB2
T11 IO65RSB2
T12 IO64RSB2
T13 NC
T14 GND
T15 NC
T16 TDI
T17 TDO
U1 FF/IO90RSB2
U2 GND
U3 NC
U4 IO88RSB2
U5 IO86RSB2
U6 IO82RSB2
U7 GND
U8 IO75RSB2
U9 IO73RSB2
U10 IO68RSB2
U11 IO66RSB2
U12 GND
U13 NC
U14 NC
U15 NC
U16 TCK
U17 VPUMP
289-Pin CSP
Pin Number AGLP030
Function
Package Pin Assignments
3-20 Revision 11
289-Pin CSP
Pin Number AGLP060 Function
A1 GAB1/IO03RSB0
A2 NC
A3 NC
A4 GND
A5 IO10RSB0
A6 IO14RSB0
A7 IO16RSB0
A8 IO18RSB0
A9 GND
A10 IO23RSB0
A11 IO27RSB0
A12 NC
A13 NC
A14 GND
A15 NC
A16 NC
A17 GBC0/IO30RSB0
B1 GAA1/IO01RSB0
B2 GND
B3 NC
B4 NC
B5 IO07RSB0
B6 NC
B7 VCCIB0
B8 IO17RSB0
B9 IO19RSB0
B10 IO24RSB0
B11 IO28RSB0
B12 VCCIB0
B13 NC
B14 NC
B15 NC
B16 GBC1/IO31RSB0
B17 GND
C1 IO155RSB3
C2 GAA0/IO00RSB0
C3 GAC0/IO04RSB0
C4 NC
C5 VCCIB0
C6 IO09RSB0
C7 IO13RSB0
C8 IO15RSB0
C9 IO21RSB0
C10 GND
C11 IO29RSB0
C12 NC
C13 NC
C14 NC
C15 GND
C16 GBA0/IO34RSB0
C17 IO39RSB1
D1 IO150RSB3
D2 IO151RSB3
D3 GND
D4 GAB0/IO02RSB0
D5 NC
D6 NC
D7 NC
D8 GND
D9 IO20RSB0
D10 IO25RSB0
D11 NC
D12 NC
D13 GND
D14 GBB0/IO32RSB0
D15 GBA1/IO35RSB0
D16 IO37RSB1
D17 IO42RSB1
E1 VCCIB3
E2 IO147RSB3
E3 GAC2/IO152RSB3
E4 GAA2/IO156RSB3
E5 GAC1/IO05RSB0
E6 NC
E7 IO06RSB0
E8 IO11RSB0
289-Pin CSP
Pin Number AGLP060 Function
E9 IO22RSB0
E10 IO26RSB0
E11 VCCIB0
E12 NC
E13 GBB1/IO33RSB0
E14 GBA2/IO36RSB1
E15 GBB2/IO38RSB1
E16 VCCIB1
E17 IO44RSB1
F1 GFC1/IO140RSB3
F2 IO142RSB3
F3 IO149RSB3
F4 VCCIB3
F5 GAB2/IO154RSB3
F6 IO153RSB3
F7 NC
F8 IO08RSB0
F9 IO12RSB0
F10 NC
F11 NC
F12 NC
F13 GBC2/IO40RSB1
F14 GND
F15 IO43RSB1
F16 IO46RSB1
F17 IO45RSB1
G1 GFC0/IO139RSB3
G2 GND
G3 IO144RSB3
G4 IO145RSB3
G5 IO146RSB3
G6 IO148RSB3
G7 GND
G8 GND
G9 VCC
G10 GND
G11 GND
G12 IO48RSB1
289-Pin CSP
Pin Number AGLP060 Function
IGLOO PLUS Low Power Flash FPGAs
Revision 11 3-21
G13 IO41RSB1
G14 IO47RSB1
G15 IO49RSB1
G16 IO50RSB1
G17 GND
H1 VCOMPLF
H2 GFB0/IO137RSB3
H3 NC
H4 IO141RSB3
H5 IO143RSB3
H6 GFB1/IO138RSB3
H7 GND
H8 GND
H9 GND
H10 GND
H11 GND
H12 GCC1/IO52RSB1
H13 IO51RSB1
H14 GCA0/IO57RSB1
H15 VCCIB1
H16 GCA2/IO58RSB1
H17 GCC0/IO53RSB1
J1 VCCPLF
J2 GFA1/IO136RSB3
J3 VCCIB3
J4 IO131RSB3
J5 IO130RSB3
J6 IO129RSB3
J7 VCC
J8 GND
J9 GND
J10 GND
J11 VCC
J12 GCB2/IO59RSB1
J13 GCB1/IO54RSB1
J14 IO62RSB1
J15 IO63RSB1
J16 GCB0/IO55RSB1
289-Pin CSP
Pin Number AGLP060 Function
J17 GCA1/IO56RSB1
K1 GND
K2 GFA0/IO135RSB3
K3 GFB2/IO133RSB3
K4 IO128RSB3
K5 IO123RSB3
K6 IO125RSB3
K7 GND
K8 GND
K9 GND
K10 GND
K11 GND
K12 IO64RSB1
K13 IO61RSB1
K14 IO66RSB1
K15 IO65RSB1
K16 GND
K17 GCC2/IO60RSB1
L1 GFA2/IO134RSB3
L2 GFC2/IO132RSB3
L3 IO127RSB3
L4 GND
L5 IO121RSB3
L6 GEC1/IO116RSB3
L7 GND
L8 GND
L9 VCC
L10 GND
L11 GND
L12 GDC1/IO72RSB1
L13 GDB1/IO74RSB1
L14 VCCIB1
L15 IO70RSB1
L16 IO68RSB1
L17 IO67RSB1
M1 IO126RSB3
M2 VCCIB3
M3 IO124RSB3
289-Pin CSP
Pin Number AGLP060 Function
M4 IO122RSB3
M5 GEB0/IO113RSB3
M6 GEB1/IO114RSB3
M7 NC
M8 NC
M9 IO90RSB2
M10 NC
M11 IO83RSB2
M12 NC
M13 GDA1/IO76RSB1
M14 GDA0/IO77RSB1
M15 IO71RSB1
M16 IO69RSB1
M17 VCCIB1
N1 IO119RSB3
N2 IO120RSB3
N3 GEC0/IO115RSB3
N4 GEA0/IO111RSB3
N5 GND
N6 NC
N7 IO104RSB2
N8 IO98RSB2
N9 IO96RSB2
N10 VCCIB2
N11 NC
N12 NC
N13 GDB2/IO79RSB2
N14 NC
N15 GND
N16 GDB0/IO75RSB1
N17 GDC0/IO73RSB1
P1 IO118RSB3
P2 IO117RSB3
P3 GND
P4 NC
P5 NC
P6 IO106RSB2
P7 IO99RSB2
289-Pin CSP
Pin Number AGLP060 Function
Package Pin Assignments
3-22 Revision 11
P8 GND
P9 IO91RSB2
P10 IO86RSB2
P11 IO81RSB2
P12 NC
P13 VCCIB2
P14 NC
P15 GDA2/IO78RSB2
P16 GDC2/IO80RSB2
P17 VJTAG
R1 GND
R2 GEA2/IO110RSB2
R3 NC
R4 NC
R5 NC
R6 VCCIB2
R7 IO102RSB2
R8 IO97RSB2
R9 IO93RSB2
R10 IO89RSB2
R11 GND
R12 NC
R13 NC
R14 NC
R15 NC
R16 TMS
R17 TRST
T1 GEA1/IO112RSB3
T2 GEC2/IO108RSB2
T3 NC
T4 GND
T5 NC
T6 IO103RSB2
T7 IO100RSB2
T8 IO95RSB2
T9 VCCIB2
T10 IO88RSB2
T11 IO84RSB2
289-Pin CSP
Pin Number AGLP060 Function
T12 IO82RSB2
T13 NC
T14 GND
T15 NC
T16 TDI
T17 TDO
U1 FF/GEB2/IO109RS
B2
U2 GND
U3 NC
U4 IO107RSB2
U5 IO105RSB2
U6 IO101RSB2
U7 GND
U8 IO94RSB2
U9 IO92RSB2
U10 IO87RSB2
U11 IO85RSB2
U12 GND
U13 NC
U14 NC
U15 NC
U16 TCK
U17 VPUMP
289-Pin CSP
Pin Number AGLP060 Function
IGLOO PLUS Low Power Flash FPGAs
Revision 11 3-23
289-Pin CSP
Pin Number AGLP125 Function
A1 GAB1/IO03RSB0
A2 IO11RSB0
A3 IO08RSB0
A4 GND
A5 IO19RSB0
A6 IO24RSB0
A7 IO26RSB0
A8 IO30RSB0
A9 GND
A10 IO35RSB0
A11 IO38RSB0
A12 IO40RSB0
A13 IO42RSB0
A14 GND
A15 IO48RSB0
A16 IO54RSB0
A17 GBC0/IO57RSB0
B1 GAA1/IO01RSB0
B2 GND
B3 IO06RSB0
B4 IO13RSB0
B5 IO15RSB0
B6 IO21RSB0
B7 VCCIB0
B8 IO28RSB0
B9 IO31RSB0
B10 IO37RSB0
B11 IO39RSB0
B12 VCCIB0
B13 IO44RSB0
B14 IO46RSB0
B15 IO49RSB0
B16 GBC1/IO58RSB0
B17 GND
C1 IO210RSB3
C2 GAA0/IO00RSB0
C3 GAC0/IO04RSB0
C4 IO09RSB0
C5 VCCIB0
C6 IO17RSB0
C7 IO23RSB0
C8 IO27RSB0
C9 IO33RSB0
C10 GND
C11 IO43RSB0
C12 IO45RSB0
C13 IO50RSB0
C14 IO52RSB0
C15 GND
C16 GBA0/IO61RSB0
C17 IO68RSB1
D1 IO204RSB3
D2 IO205RSB3
D3 GND
D4 GAB0/IO02RSB0
D5 IO07RSB0
D6 IO10RSB0
D7 IO18RSB0
D8 GND
D9 IO34RSB0
D10 IO41RSB0
D11 IO47RSB0
D12 IO55RSB0
D13 GND
D14 GBB0/IO59RSB0
D15 GBA1/IO62RSB0
D16 IO66RSB1
D17 IO70RSB1
E1 VCCIB3
E2 IO200RSB3
E3 GAC2/IO207RSB3
E4 GAA2/IO211RSB3
E5 GAC1/IO05RSB0
E6 IO12RSB0
E7 IO16RSB0
E8 IO22RSB0
289-Pin CSP
Pin Number AGLP125 Function
E9 IO32RSB0
E10 IO36RSB0
E11 VCCIB0
E12 IO56RSB0
E13 GBB1/IO60RSB0
E14 GBA2/IO63RSB1
E15 GBB2/IO65RSB1
E16 VCCIB1
E17 IO73RSB1
F1 GFC1/IO194RSB3
F2 IO196RSB3
F3 IO202RSB3
F4 VCCIB3
F5 GAB2/IO209RSB3
F6 IO208RSB3
F7 IO14RSB0
F8 IO20RSB0
F9 IO25RSB0
F10 IO29RSB0
F11 IO51RSB0
F12 IO53RSB0
F13 GBC2/IO67RSB1
F14 GND
F15 IO75RSB1
F16 IO71RSB1
F17 IO77RSB1
G1 GFC0/IO193RSB3
G2 GND
G3 IO198RSB3
G4 IO203RSB3
G5 IO201RSB3
G6 IO206RSB3
G7 GND
G8 GND
G9 VCC
G10 GND
G11 GND
G12 IO72RSB1
289-Pin CSP
Pin Number AGLP125 Function
Package Pin Assignments
3-24 Revision 11
G13 IO64RSB1
G14 IO69RSB1
G15 IO78RSB1
G16 IO76RSB1
G17 GND
H1 VCOMPLF
H2 GFB0/IO191RSB3
H3 IO195RSB3
H4 IO197RSB3
H5 IO199RSB3
H6 GFB1/IO192RSB3
H7 GND
H8 GND
H9 GND
H10 GND
H11 GND
H12 GCC1/IO79RSB1
H13 IO74RSB1
H14 GCA0/IO84RSB1
H15 VCCIB1
H16 GCA2/IO85RSB1
H17 GCC0/IO80RSB1
J1 VCCPLF
J2 GFA1/IO190RSB3
J3 VCCIB3
J4 IO185RSB3
J5 IO183RSB3
J6 IO181RSB3
J7 VCC
J8 GND
J9 GND
J10 GND
J11 VCC
J12 GCB2/IO86RSB1
J13 GCB1/IO81RSB1
J14 IO90RSB1
J15 IO89RSB1
J16 GCB0/IO82RSB1
289-Pin CSP
Pin Number AGLP125 Function
J17 GCA1/IO83RSB1
K1 GND
K2 GFA0/IO189RSB3
K3 GFB2/IO187RSB3
K4 IO179RSB3
K5 IO175RSB3
K6 IO177RSB3
K7 GND
K8 GND
K9 GND
K10 GND
K11 GND
K12 IO88RSB1
K13 IO94RSB1
K14 IO95RSB1
K15 IO93RSB1
K16 GND
K17 GCC2/IO87RSB1
L1 GFA2/IO188RSB3
L2 GFC2/IO186RSB3
L3 IO182RSB3
L4 GND
L5 IO173RSB3
L6 GEC1/IO170RSB3
L7 GND
L8 GND
L9 VCC
L10 GND
L11 GND
L12 GDC1/IO99RSB1
L13 GDB1/IO101RSB1
L14 VCCIB1
L15 IO98RSB1
L16 IO92RSB1
L17 IO91RSB1
M1 IO184RSB3
M2 VCCIB3
M3 IO176RSB3
289-Pin CSP
Pin Number AGLP125 Function
M4 IO172RSB3
M5 GEB0/IO167RSB3
M6 GEB1/IO168RSB3
M7 IO159RSB2
M8 IO161RSB2
M9 IO135RSB2
M10 IO128RSB2
M11 IO121RSB2
M12 IO113RSB2
M13 GDA1/IO103RSB1
M14 GDA0/IO104RSB1
M15 IO97RSB1
M16 IO96RSB1
M17 VCCIB1
N1 IO180RSB3
N2 IO178RSB3
N3 GEC0/IO169RSB3
N4 GEA0/IO165RSB3
N5 GND
N6 IO156RSB2
N7 IO148RSB2
N8 IO144RSB2
N9 IO137RSB2
N10 VCCIB2
N11 IO119RSB2
N12 IO111RSB2
N13 GDB2/IO106RSB2
N14 IO109RSB2
N15 GND
N16 GDB0/IO102RSB1
N17 GDC0/IO100RSB1
P1 IO174RSB3
P2 IO171RSB3
P3 GND
P4 IO160RSB2
P5 IO157RSB2
P6 IO154RSB2
P7 IO152RSB2
289-Pin CSP
Pin Number AGLP125 Function
IGLOO PLUS Low Power Flash FPGAs
Revision 11 3-25
P8 GND
P9 IO132RSB2
P10 IO125RSB2
P11 IO126RSB2
P12 IO112RSB2
P13 VCCIB2
P14 IO108RSB2
P15 GDA2/IO105RSB2
P16 GDC2/IO107RSB2
P17 VJTAG
R1 GND
R2 GEA2/IO164RSB2
R3 IO158RSB2
R4 IO155RSB2
R5 IO150RSB2
R6 VCCIB2
R7 IO145RSB2
R8 IO141RSB2
R9 IO134RSB2
R10 IO130RSB2
R11 GND
R12 IO118RSB2
R13 IO116RSB2
R14 IO114RSB2
R15 IO110RSB2
R16 TMS
R17 TRST
T1 GEA1/IO166RSB3
T2 GEC2/IO162RSB2
T3 IO153RSB2
T4 GND
T5 IO147RSB2
T6 IO143RSB2
T7 IO140RSB2
T8 IO139RSB2
T9 VCCIB2
T10 IO131RSB2
T11 IO127RSB2
289-Pin CSP
Pin Number AGLP125 Function
T12 IO124RSB2
T13 IO122RSB2
T14 GND
T15 IO115RSB2
T16 TDI
T17 TDO
U1 FF/GEB2/IO163RS
B2
U2 GND
U3 IO151RSB2
U4 IO149RSB2
U5 IO146RSB2
U6 IO142RSB2
U7 GND
U8 IO138RSB2
U9 IO136RSB2
U10 IO133RSB2
U11 IO129RSB2
U12 GND
U13 IO123RSB2
U14 IO120RSB2
U15 IO117RSB2
U16 TCK
U17 VPUMP
289-Pin CSP
Pin Number AGLP125 Function
Revision 11 4-1
4 – Dat asheet Information
List of Changes
The following table lists critical changes that were made in each revision of the IGLOO PLUS datasheet.
Revision Changes Page
Revision 1 1 (Jun 200 9) The versioning system for datasheets has been changed. Datasheets are
assigned a revision number that increments each time the datasheet is revised.
The "IGLOO PLUS Device Status" table indicates the status for each device in
the family.
N/A
The "Reprogrammable Flash Technology" section was revised to add "250 MHz
(1.5 V systems) and 160 MHz (1.2 V systems) System Performance." I
The "I/Os with Advanced I/O S tandards" section was revised to add definitions for
hot-swap and cold-sparing. 1-7
Conditional statements regarding hot insertion were removed from the
description of VI in Table 2-1 • Absolute Maximum Ratings, since all IGLOO
PLUS devices are hot insertion enabled.
2-1
Table 2-2 • Recommended Ope rating Conditions1,2 was revised. 1.2 V DC wide
range supply voltage and 3.3 V wide range supply voltage (SAR 26270) were
added for VCCI. VJTAG DC Voltage was revised (SAR 24052). The value range
for VPUMP programming voltage for operation was changed from "0 to 3.45" to
"0 to 3.6" (SAR 25220).
2-2
Table 2-6 • Temperature and Voltage Derating Factors for Timing Delays
(normalized to TJ = 70°C, VCC = 1.425 V) and Table 2-7 • Temperature and
Voltage Derating Factors for Timing Delays (normalized to TJ = 70°C,
VCC = 1.14 V) were revised.
2-6, 2-7
Table 2-8 • Power Supply State per Mode is new. 2-7
The tables in the "Quiescent Supply Current" section were updated (SARs 24882
and 24112). Some of the table notes were changed or deleted. 2-7
VIH maximum values in tables were updated as needed to 3.6 V (SAR 20990
and SAR 79370). N/A
Datasheet Information
4-2 Revision 11
Revision 1 1 (continued) The values in the following tables were updated. 3.3 V LVCMOS and 1.2 V
LVCMOS wide range were added to the tables where applicable.
Table 2-13 • Summary of I/O Input Buffer Power (per pin) – Default I/O Software
Settings
Table 2-14 • Summary of I/O Output Buffer Power (per pin) – Default I/O Software
Settings1
Table 2-21 • Summary of Maximum and Minimum DC Input and Output Levels
Applicable to Commercial and Industrial Conditions—Software Default Settings
Table 2-22 • Summary of Maximum and Minimum DC Input Levels
Table 2-23 • Summary of AC Measuring Points
Table 2-25 • Summary of I/O Timing Charac teristics—Software Default Settings,
STD S peed Grade, Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC =
1.425 V, Worst-Case VCCI = 3.0 V
Table 2-26 • Summary of I/O Timing Charac teristics—Software Default Settings,
STD Speed Grade Commercia l-Case Condition s: TJ = 70°C, Worst-Case VCC =
1.14 V, Worst-Case VCCI = 3.0 V
Table 2-28 • I/O Output Buffer Maximum Resistances 1
2-9
2-9
2-19
2-20
2-21
2-22
2-23
2-24
A table note was added to Table 2-16 • Different Components Contributing to the
Static Power Consumption in IGLOO PLUS Devices and Table 2-18 • Different
Components Contributing to the Static Power Consumption in IGLOO PLUS
Devices stating the value for PDC4 is the minimum contribution o f the PLL when
operating at lowest frequency.
2-11,
2-12
Table 2-29 • I/O Weak Pull-Up/Pull-Down Resistances was revised, including
addition of 3.3 V and 1.2 V LVCMOS wide range. The notes defining RWEAK PULL-
UP-MAX and RWEAK PULLDOWN-MAX were revised (SAR 21348).
2-25
Table 2-30 • I/O Short Currents IOSH/IOSL was revi sed to include data for 3.3 V
and 1.2 V LVCMOS wide range (SAR 79353 and SAR 79366). 2-25
Tab le 2-31 • Duration of Short Circuit Event before Failure was revised to change
the maximum temp erature from 110°C to 100°C, with an examp le of six months
instead of three months (SAR 26259).
2-26
The tables in the "Single-Ended I/O Characteristics" section were updated. Notes
clarifying IIL and IIH were added.
Tables for 3.3 V LVCMOS and 1.2 V LVCMOS wide range were added (SAR
79370, SAR 79353, and SAR 79366).
Notes in the wide range tables state that the minimum drive strength for any
LVCMOS 3.3 V (or LVCMOS 1.2 V) software configuration when run in wide
range is ±100 µA. Drive strength displayed in the software is supported for
normal range only. For a detailed I/V curve, refer to the IBIS models (SAR
25700).
2-27
The following sentence was dele ted from the "2.5 V LVCMOS" section: It uses a
5 V–tole rant input buffer and push-pull output buffer (SAR 24916). 2-32
The tables in the "Input Register" section, "Output Register" section, and "Output
Enable Register" section were updated. The tables in the "VersaTile
Characteristics" section were updated.
2-45
through
2-56
Revision Changes Page
IGLOO PLUS Low Power Flash FPGAs
Revision 11 4-3
Revision 1 1 (continued) The following tables were updated in the "Global Tree Timing Characteristics"
section:
Table 2-85 • AGLP060 Global Resource (1.5 V)
Table 2-86 • AGLP125 Global Resource (1.5 V)
Table 2-88 • AGLP060 Global Resource (1.2 V)
2-58
Table 2-90 • IGLOO PL US CC C/P LL Specification and Table 2-91 • IGLOO PLUS
CCC/PLL Specification were revised (SAR 79388). VCO output jitter and
maximum peak-to-peak jitter data were changed. Three notes were added to the
table in connection with these changes.
2-61
Figure 2-28 • Write Access after Write onto Same Address and Figure 2-29 •
Write Access after Read onto Same Address were deleted . N/A
The tables in the "SRAM", "FIFO" and "Embedded FlashROM Characteristics"
sections were updated. 2-68,
2-77
Revision 10 (Apr 2009)
Product Brief v1.5
DC and Switching
Characteristics
Advance v0.5
The –F speed grade is no longer offered for IGLOO PLUS devices. References to
it have been removed from the document. The speed grade column and note
regarding –F speed grade were removed from "IGLOO PLUS Ordering
Information". The "Speed Grade and Temperature Grade Matrix" section was
removed.
III, IV
Revision 9 (Feb 2009)
Product Brief v1.4 The "Advanced I/O" section was revised to add two bullets regarding support of
wide range power supply voltage. I
The "I/Os with Advanced I/O Standards" section was revised to add 3.0 V wide
range to the list of supported voltages. The "Wid e Range I/O Support" section is
new.
1-7
Revision 8 (Jan 2009)
Packaging v1.5 The "201-Pin CSP" pin table was revised to add a note regarding pins G1 and
H1. 3-8
Revision 7 (Dec 2008)
Product Brief v1.3 A note was added to IGLOO PLUS Devices: "AGLP060 in CS201 does not
support the PLL." I
Table 2 • IGLOO PLUS FPGAs Package Size Dimensions was updated to
change the nominal size of VQ176 from 100 to 400 mm2.II
Revision 6 (Oct 2008)
DC and Switching
Characteristics
Advance v0.4
Data was revised significantly in the following tables:
Table 2-25 • Summary of I/O Timing Charac teristics—Software Default Settings,
STD S peed Grade, Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC =
1.425 V, Worst-Case VCCI = 3.0 V
Table 2-26 • Summary of I/O Timing Charac teristics—Software Default Settings,
STD Speed Grade Commercia l-Case Condition s: TJ = 70°C, Worst-Case VCC =
1.14 V, Worst-Case VCCI = 3.0 V
Table 2-50 • 2.5 LVCMOS Low Slew – Applies to 1.2 V DC Core Voltage
Table 2-51 • 2.5 V LVCMOS High Slew – Ap plies to 1.2 V DC Core Voltage
2-22,
2-33
Revision 5 (Aug 2008)
Product Brief v1.2 The VQ128 and VQ176 packages were added to Table 1 • IGLOO PLUS Product
Family, the "I/Os Per Package 1" tab le, Table 2 • IG LOO PLUS FPGAs Package
Size Dimensions, "IGLOO PLUS Ordering Information", and the "Temperature
Grade Offerings" table.
I to IV
Packaging v1.4 The "128-Pin VQFP" package drawing and pin table are new. 3-2
The "176-Pin VQFP" package drawing and pin table are new. 3-5
Revision Changes Page
Datasheet Information
4-4 Revision 11
Revision 4 (Jul 2008)
Product Brief v1.1
DC and Switching
Characteristics
Advance v0.3
As a result of the Libero IDE v8.4 release, Actel now offers a wide range of core
voltage support. The document was updated to change 1.2 V / 1.5 V to 1.2 V to
1.5 V.
N/A
Revision 3 (Jun 2008)
DC and Switching
Characteristics
Advance v0.2
Tables have been updated to reflect default values in the software. The default
I/O capacitance is 5 pF. Tables have bee n updated to incl ude the LVCMOS 1.2 V
I/O set.
N/A
Tab le note 3 was updated in Table 2-2 • Recommended Operating Con ditions1,2
to add the sentence, "VCCI should be at the same voltage within a given I/O
bank." References to table notes 5, 6, 7, and 8 were added. Reference to table
note 3 was removed from VPUMP Operation and placed next to VCC.
2-2
Table 2-4 • Overshoot and Undershoot Limits 1 was revised to remove "as
measured on quiet I/Os" from the title. Table note 2 was revised to remove
"estimated SSO density over cycles." Table note 3 was deleted.
2-3
The table note for Table 2-9 • Quiescent Supply Current (IDD) Characteristics,
IGLOO PLUS Flash*Freeze Mode* to remove the sentence stating that values do
not include I/O static contribution.
2-7
The table note for Table 2-10 • Quiescent Supply Current (IDD) Characteristics,
IGLOO PLUS Sleep Mode* was updated to remove VJTAG and VCCI and the
statement that values do not include I/O static contribution.
2-7
The table note for Table 2-11 • Quiescent Supply Current (IDD) Characteristics,
IGLOO PLUS Shutdown Mode was updated to remove t he statement that values
do not include I/O static contribution.
2-8
Note 2 of Table 2-12 • Quiescent Supply Current (IDD), No IGLOO PLUS
Flash*Freeze Mode 1 was updated to include VCCPLL. Table not e 4 was deleted. 2-8
Table 2-13 • Summary of I/O Input Buffer Power (per pin) – Default I/O Software
Settings and Table 2-14 • Summary of I/O Output Buffer Power (per pin) – Default
I/O Software Settings1 were updated to remove static power. The table notes
were updated to reflect that power was measured on VCCI. Table note 2 was
added to Table 2-13 • Summary of I/O Input Buffer Power (per pin) – Default I/O
Software Settings.
2-9, 2-9
Table 2-16 • Different Components Contributing to the Static Power Consumption
in IGLOO PLUS Devices and Table 2-18 • Different Componen ts Contributing to
the Static Power Consumption in IGLOO PLUS Devices we re up dated to change
the definition for PDC5 from bank static power to bank quiescent power. Table
subtitles were added for Table 2-16 • Different Components Contributing to the
Static Power Consumption in IGLOO PLUS Devices, Table 2-17 • Different
Components Contributing to Dynamic Power Consumption in IGLOO PLUS
Devices, and Table 2-18 • Different Components Contributing to the Static Power
Consumption in IGLOO PLUS Devices.
2-11,
2-12
The "Total Static Power Cons umption—PSTAT" section was revised. 2-12
Table 2-32 • Schmitt Trigger Input Hysteresis is new. 2-26
Packaging v1.3 The "281-Pin CSP" package drawing is new. 3-13
The "281-Pin CSP" table for the AGLP125 device is new. 3-13
Revision Changes Page
IGLOO PLUS Low Power Flash FPGAs
Revision 11 4-5
Revision 3 (continued) The "289-Pin CS P" package drawing was incorrect. The graphic was showing the
CS281 mechanical drawing and not the CS289 mechanical drawing. This has
now been corrected.
3-17
Revision 2 (Jun 2008)
Packaging v1.2 The "289-Pin CSP" table for the AGLP030 device is new. 3-17
Revision 1 (Jun 2008)
Packaging v1.1 The "289-Pin CSP" table for the AGLP060 device is new. 3-20
The "289-Pin CSP" table for the AGLP125 device is new. 3-23
Revision Changes Page
Datasheet Information
4-6 Revision 11
Datasheet Categories
Categories
In order to provide the latest information to des igners, some datasheet parameters are published before
data has been fully characterized from silicon devices. The data provided for a given device, as
highlighted in the "IGLOO PLUS Device" table on page II, is designated as either "Product Brief,"
"Advance," "Preliminary," or "Production." The definitions of these categories are as follows:
Product Brief
The product brief is a summarized versi on of a datasheet (ad vance or producti on) and contains general
product information. This document gives an overvie w of specific de vice and family information.
Advance
This version contains initial estimated information based on simulation, other products, devices, or speed
grades. This info rmation can b e used as estimates, bu t not for production. This label only appl ies to the
DC and Switching Characteristics chapter of the da tasheet and will only be use d when the data has not
been fully characterized.
Preliminary
The datasheet contains information based on simulation and/or initial characterization. The information is
believed to be correct, but changes are possible.
Unmarked (production)
This version contains information that is considered to be final.
Export Administration Regulations (EAR)
The products described in this document are subject to the Export Administration Regulations (EAR).
They could require an approved export license prior to export from the United States. An export includes
release of product or disclosure of technology to a foreign national inside or outside the United States.
Actel Safety Critical, Life Support, and High-Reliability
Applications Policy
The Actel products described in this advance status document may not have completed Actel’s
qualification process. Actel may amend or enhance products during the product introduction and
qualification process, resulting in changes in device functionality or performance. It is the responsibility of
each customer to ensure the fitness of any Actel product (b ut especially a new product) for a particular
purpose, including appropriateness for safety-critical, life-supp ort, and other high-reliability applications.
Consult Actel’s Terms and Conditions for specific liabili ty exclusions relating to life-support applications.
A reliability report covering all of Actel’s products is available on the Actel website at
http://www.actel.com/documents/ORT_Report.pdf. Actel also offers a variety of enhanced qualification
and lot acceptance screening procedures. Contact your local Actel sales office for additional reliability
information.
Actel is the leader in low power FPGAs and mixed signal FPGAs and offers the most comprehensive portfolio of
system and power management solutions. Power Matters. Learn more at www.actel.com.
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