7
0015P–EPROM–10/11
Atmel AT27C512R
Table 5-6. DC programming characteristics
Table 5-7. AC programming characteristics
Notes: 1. VCC must be applied simultaneously with or before OE/VPP and removed simultaneously with or after OE/VPP.
2. This parameter is only sampled, and is not 100% tested. Output float is defined as the point where data is no longer driven.
See timing diagram.
3. Program pulse width tolerance is 100µsec±5%.
Table 5-8. The Atmel AT27C512R integrated product identification code
TA = 25 ± 5°C, VCC = 6.5 ± 0.25V, OE/VPP = 13.0 ± 0.25V
Symbol Parameter Test conditions
Limits
UnitsMin Max
ILI Input load current VIN = VIL,VIH ±10 µA
VIL Input low level -0.6 0.8 V
VIH Input high level 2.0 VCC + 1 V
VOL Output low voltage IOL = 2.1mA 0.4 V
VOH Output high voltage IOH = -400µA 2.4 V
ICC2 VCC supply current (program and verify) 25 mA
IPP2 OE/VPP current CE = VIL 25 mA
VID A9 product identification voltage 11.5 12.5 V
TA = 25 5°C, VCC = 6.5 0.25V, OE/VPP = 13.0 0.25V
Symbol Parameter Test conditions(1)
Limits
UnitsMin Max
tAS Address setup time
Input rise and fall times
(10% to 90%) 20ns
Input pulse levels
0.45V to 2.4V
Input timing reference level
0.8V to 2.0V
Output timing reference level
0.8V to 2.0V
2µs
tOES OE/VPP setup time 2 µs
tOEH OE/VPP hold time 2 µs
tDS Data setup time 2 µs
tAH Address hold time 0 µs
tDH Data hold time 2 µs
tDFP CE high to output float delay(2) 0 130 ns
tVCS VCC setup time 2 µs
tPW CE program pulse width(3) 95 105 µs
tDV Data valid from CE(2) 1µs
tVR OE/VPP recovery time 2 µs
tPRT
OE/VPP pulse rise time during
programming 50 ns
Codes
Pins
Hex dataA0 O7 O6 O5 O4 O3 O2 O1 O0
Manufacturer 0 0 0 0 1 1 1 1 0 1E
Device type 1 0 0 0 0 1 1 0 1 0D