
FDC30N20DZ Dual N-Channel PowerTrench® MOSFET
www.fairchildsemi.com
2
©2016 Fairchild Semiconductor Corporation
FDC30N20DZ Rev.1.0
Electrical Characteristics TJ = 25 °C unless otherwise noted.
Off Characteristics
On Characteristics
Dynamic Characteristics
Switching Characteristics
Drain-Source Diode Characteristics
Symbol Parameter Test Conditions Min. Typ. Max. Units
BVDSS Drain to Source Breakdown Voltage ID = 250 μA, VGS = 0 V30 V
ΔBVDSS
ΔTJ
Breakdown Voltage Temperature
Coefficient ID = 250 μA, referenced to 25 °C 22 mV/°C
IDSS Zero Gate Voltage Drain Current VDS = 24 V, VGS = 0 V1μA
IGSS Gate to Source Leakage Current VGS = ±20 V, VDS = 0 V ±10 μA
VGS(th) Gate to Source Threshold Voltage VGS = VDS, ID = 250 μA11.73V
ΔVGS(th)
ΔTJ
Gate to Source Threshold Voltage
Temperature Coefficient ID = 250 μA, referenced to 25 °C -4 mV/°C
rDS(on) Static Drain to Source On Resistance VGS = 10 V, ID = 4.6 A 23 31 mΩVGS = 4.5 V, ID = 4.2 A2738
VGS = 10 V, ID = 4.6 A, TJ = 125 °C 31 42
gFS Forward Transconductance VDS = 5 V, ID = 4.6 A23S
Ciss Input Capacitance VDS = 15 V, VGS = 0 V,
f = 1MHz
356 535 pF
Coss Output Capacitance 110 165 pF
Crss Reverse Transfer Capacitance 18 30 pF
RgGate Resistance 0.1 3.5 7.0 Ω
td(on) Turn-On Delay Time VDD = 15 V, ID = 4.6 A,
VGS = 10 V, RGEN = 6 Ω
612ns
trRise Time 210ns
td(off) Turn-Off Delay Time 13 21 ns
tfFall Time 210ns
Qg(TOT) Total Gate Charge VGS = 0 V to 10 VVDD = 15 V,
ID = 4.6 A
5.6 7.9 nC
Qg(TOT) Total Gate Charge VGS = 0 V to 4.5 V2.73.8nC
Qgs Gate to Source Charge 0.9 nC
Qgd Gate to Drain “Miller” Charge 0.8 nC
VSD Source-Drain Diode Forward Voltage VGS = 0 V, IS = 4.6 A (Note 2) 0.85 1.2 V
trr Reverse Recovery Time IF = 4.6 A, di/dt = 100 A/μs 10 20 ns
Qrr Reverse Recovery Charge 2 10 nC
NOTES:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mount ing surfa ce of the drain pins.
RθJC is guaranteed by design while RθCA is determined by the user's board design.
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%.
3. EAS of 3 mJ starting TJ = 25 °C; N-ch: L = 0.1 mH, IAS = 8 A, VDD = 27 V, VGS = 10 V.
4. Pulse Id measured at td <= 250μs, refer to SOA graph for more details.
5. The diode connected between the gate and source serves only as protection against ESD. No gate overvoltage rating is implied.
130 °C/W when mounte d on
a 1 in2 pad of 2 oz copper
a)
180 °C/W when mo unted on a
mi nimum pad of 2 oz copper
b)
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DF
DS
SF
SS
G
DF
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SF
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