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©2016 Fairchild Semiconductor Corporation
FDC30N20DZ Rev.1.0 www.fairchildsemi.com
1
FDC30N20DZ Dual N-Channel PowerTrench® MOSFET
March 2016
FDC30N20DZ
Dual N-Channel PowerTrench® MOSFET
30 V, 4.6 A, 31 mΩ
Features
Max rDS(on) = 31 mΩ at VGS = 10 V, ID = 4.6 A
Max rDS(on) = 38 mΩ at VGS = 4.5 V, ID = 4.2 A
High Performance Trench® Technology for Extremely Low
rDS(on)
Fast Switching Speed
100% UIL Tested
Typical CDM ESD protection level > 2.0 kV (Note 5)
RoHS Compliant
General Description
This N-Channel MOSFET is produced using Fairchild
Semiconductor‘s advanced PowerTrench® process. This pro-
cess has been optimized for rDS(on), sw itching perfor mance and
ruggedness.
Applications
Load Switch
Synchronous Rectifier
SuperSOTTM -6
G2
D2
S2
S1
D1
G1
Pin 1
G1
S2
G2
D1
S1
D2
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted.
Thermal Characteristics
Package Marking and Ordering Information
Symbol Parameter Ratings Units
VDS Drain to Source Voltage 30 V
VGS Gate to Source Voltage ±20 V
IDDrain Current -Continuous (Note 1a) 4.6 A
-Pulsed (Note 4) 30 A
EAS Single Pulse Avalanche Energy (Note 3) 3 mJ
PDPower Dissipation (Note 1a) 0.96 W
Power Dissipation (Note 1b) 0.69
TJ, TSTG Operating and Storage Junction Temperature Range -55 to +150 °C
RθJA Thermal Resistance, Junction to Ambient (Note 1a) 130 °C/W
RθJA Thermal Resistance, Junction to Ambient (Note 1b) 180
Device Marking Device Package Reel Size Tape Width Quantity
.30N20 FDC30N20DZ SSOT-6 7 ’’ 8 mm 3000 units
FDC30N20DZ Dual N-Channel PowerTrench® MOSFET
www.fairchildsemi.com
2
©2016 Fairchild Semiconductor Corporation
FDC30N20DZ Rev.1.0
Electrical Characteristics TJ = 25 °C unless otherwise noted.
Off Characteristics
On Characteristics
Dynamic Characteristics
Switching Characteristics
Drain-Source Diode Characteristics
Symbol Parameter Test Conditions Min. Typ. Max. Units
BVDSS Drain to Source Breakdown Voltage ID = 250 μA, VGS = 0 V30 V
ΔBVDSS
ΔTJ
Breakdown Voltage Temperature
Coefficient ID = 250 μA, referenced to 25 °C 22 mV/°C
IDSS Zero Gate Voltage Drain Current VDS = 24 V, VGS = 0 V1μA
IGSS Gate to Source Leakage Current VGS = ±20 V, VDS = 0 V ±10 μA
VGS(th) Gate to Source Threshold Voltage VGS = VDS, ID = 250 μA11.73V
ΔVGS(th)
ΔTJ
Gate to Source Threshold Voltage
Temperature Coefficient ID = 250 μA, referenced to 25 °C -4 mV/°C
rDS(on) Static Drain to Source On Resistance VGS = 10 V, ID = 4.6 A 23 31 mΩVGS = 4.5 V, ID = 4.2 A2738
VGS = 10 V, ID = 4.6 A, TJ = 125 °C 31 42
gFS Forward Transconductance VDS = 5 V, ID = 4.6 A23S
Ciss Input Capacitance VDS = 15 V, VGS = 0 V,
f = 1MHz
356 535 pF
Coss Output Capacitance 110 165 pF
Crss Reverse Transfer Capacitance 18 30 pF
RgGate Resistance 0.1 3.5 7.0 Ω
td(on) Turn-On Delay Time VDD = 15 V, ID = 4.6 A,
VGS = 10 V, RGEN = 6 Ω
612ns
trRise Time 210ns
td(off) Turn-Off Delay Time 13 21 ns
tfFall Time 210ns
Qg(TOT) Total Gate Charge VGS = 0 V to 10 VVDD = 15 V,
ID = 4.6 A
5.6 7.9 nC
Qg(TOT) Total Gate Charge VGS = 0 V to 4.5 V2.73.8nC
Qgs Gate to Source Charge 0.9 nC
Qgd Gate to Drain “Miller” Charge 0.8 nC
VSD Source-Drain Diode Forward Voltage VGS = 0 V, IS = 4.6 A (Note 2) 0.85 1.2 V
trr Reverse Recovery Time IF = 4.6 A, di/dt = 100 A/μs 10 20 ns
Qrr Reverse Recovery Charge 2 10 nC
NOTES:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mount ing surfa ce of the drain pins.
RθJC is guaranteed by design while RθCA is determined by the user's board design.
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%.
3. EAS of 3 mJ starting TJ = 25 °C; N-ch: L = 0.1 mH, IAS = 8 A, VDD = 27 V, VGS = 10 V.
4. Pulse Id measured at td <= 250μs, refer to SOA graph for more details.
5. The diode connected between the gate and source serves only as protection against ESD. No gate overvoltage rating is implied.
130 °C/W when mounte d on
a 1 in2 pad of 2 oz copper
a)
180 °C/W when mo unted on a
mi nimum pad of 2 oz copper
b)
G
DF
DS
SF
SS
G
DF
DS
SF
SS
FDC30N20DZ Dual N-Channel PowerTrench® MOSFET
www.fairchildsemi.com
3
©2016 Fairchild Semiconductor Corporation
FDC30N20DZ Rev.1.0
Typical Characteristics TJ = 25 °C unless otherwise noted.
Figure 1.
0.00.51.01.52.02.53.0
0
5
10
15
20
25
30
VGS = 4 V VGS = 3.5 V
VGS = 4.5 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
VGS = 3 V
VGS = 10 V
ID, DRAIN CURRENT (A)
VDS, DRAIN TO SOURCE VOLTAGE (V)
On-Region Characteristics Figure 2.
0 6 12 18 24 30
0.0
1.5
3.0
4.5
6.0 VGS = 3.5 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
ID, DRAIN CURRENT (A )
VGS = 4 V
VGS = 4.5 V
VGS = 3 V
VGS = 10 V
Normalized On-Resistance
vs. Drain Current and Gate Voltage
Figure 3. Normalized On- Resistance
-75 -50 -25 0 25 50 75 100 125 150
0.7
0.8
0.9
1.0
1.1
1.2
1.3
1.4
1.5
ID = 4.6 A
VGS = 10 V
NORMALIZED
DRAIN TO SOURCE ON-RESIST ANCE
TJ, JUNCTION TEMPERATURE (oC)
vs. Junction Temperature Figure 4.
2345678910
0
50
100
150
TJ = 125 oC
ID = 4.6 A
TJ = 25 oC
VGS, GATE TO SOURCE VOLTAG E (V)
rDS(on), DRAIN TO
SOURCE ON-RESIS TANCE (mΩ)
PULSE DURA TION = 80 μs
DUTY CYCLE = 0.5% MA X
On-Resistance vs. Gate to
Source Voltage
Figure 5. Transfer Characteristics
12345
0
6
12
18
24
30
TJ = 150 oC
VDS = 5 V
PULSE DURA TION = 80 μs
DUTY CYCLE = 0.5% MAX
TJ = -55 oC
TJ = 25 oC
ID, DRAIN CURRENT (A)
VGS, GA TE T O SOUR CE VOLTAGE (V)
Figure 6.
0.0 0.2 0.4 0.6 0.8 1.0 1.2
0.001
0.01
0.1
1
10
30
TJ = -55 oC
TJ = 25 oC
TJ = 150 oC
VGS = 0 V
IS, REVERSE DRAIN CURRENT (A)
VSD, BODY DIODE FO RWARD VOLTAGE (V)
Source to Drain Diode
Forward Voltage vs. Source Current
FDC30N20DZ Dual N-Channel PowerTrench® MOSFET
www.fairchildsemi.com
4
©2016 Fairchild Semiconductor Corporation
FDC30N20DZ Rev.1.0
Figure 7.
0246
0
2
4
6
8
10 ID = 4.6 A
VDD = 20 V
VDD = 15 V
VGS, GATE TO SOURCE VOLTAGE (V)
Qg, GATE CHARGE (nC)
VDD = 10 V
Gate Charge Characteristics Figure 8.
0.1 1 10 30
1
10
100
1000
f = 1 MHz
VGS = 0 V
CAPACITANCE (pF)
VDS, DRAIN TO SOURC E VOLTAGE (V)
Crss
Coss
Ciss
Capacitance vs. Drain
to Source Voltage
Figure 9.
0 5 10 15 20 25 30 35
10-9
10-8
10-7
10-6
10-5
10-4
10-3
10-2
10-1
VDS = 0 V
TJ = 25 oC
TJ = 125 oC
VGS, GATE TO SOURCE VOLTAGE (V)
Ig, GATE LEAKAGE CURRENT (A)
Gate Leakage Current vs Gate to Source
Voltage Figure 10. Forward Bias Safe Operating Area
0.01 0.1 1 10 100
0.01
0.1
1
10
100
10 s
100 μs
CURVE BENT TO
MEASURED DATA
10 μs
10 ms
DC
1 s
100 ms
1 ms
ID, DRAIN CURRENT (A)
VDS, DRA IN to SOURCE VOLTAGE (V)
THIS AREA IS
LIMITED BY rDS(on)
SINGLE PULSE
TJ = MAX RATED
RθJA = 180 oC/W
TA = 25 oC
Figure 11.
10-5 10-4 10-3 10-2 10-1 110
100 1000
0.1
1
10
100
1000
10000
P(PK), PEAK TRANSIENT POWER (W)
SINGLE PULSE
RθJA = 180 oC/W
TA = 25 oC
t, PULSE WIDTH (sec)
Single Pulse Maximum Power Dissipation
Typical Characteristics TJ = 25 °C unless otherwise noted.
FDC30N20DZ Dual N-Channel PowerTrench® MOSFET
www.fairchildsemi.com
5
©2016 Fairchild Semiconductor Corporation
FDC30N20DZ Rev.1.0
Figure 12. Junction to Ambient Transient Thermal Response Curve
10-5 10-4 10-3 10-2 10-1 110
100 100
0.0001
0.001
0.01
0.1
1
2
SINGLE PULSE
DUTY CYCLE-DESCENDING ORDER
r(t), NORMALIZED EFFECTIVE TRANSIENT
THERMAL RESISTANCE
t, RECTANGULAR PULSE DURATION (sec)
D = 0.5
0.2
0.1
0.0 5
0.0 2
0.0 1
PDM
t1t2
NOTES:
DUTY FACTO R : D = t1/t2
PEAK TJ = PDM x ZθJA x RθJA + TA
Typical Characteristics TJ = 25 °C unless otherwise noted.
NOTES: UNLESS OTHERWISE SPECIFIED
A) THIS PACKAGE CONFORMS TO JEDEC MO-193.
VAR. AA, ISSUE E.
B) ALL DIMENSIONS ARE IN MILLIMETERS.
C PACKAGE LENGTH DOES NOT INCLUDE MOLD
FLASH, PROTRUSIONS OR GATE BURRS. MOLD
FLASH, PROTRUSIONS OR GATE BURRS SHALL
NOT EXCEED 0.25mm PER END. PACKAGE WIDTH
DOES NOT INCLUDE INTERLEAD FLASH OR
PROTRUSION. INTERLEAD FLASH OR
PROTRUSION SHALL NOT EXCEED 0.25mm PER
SIDE. PACKAGE LENGTH AND WIDTH DIMENSIONS
ARE DETERMINED AT DATUM H.
D) DRAWING FILE NAME: MKT-MA06AREVF
1.00
0.70
0.10
0.00
SEATING PLANE
0.60 REF
0.55
0.35
SCALE: 50X
DETAIL A
SEE DETAIL A
GAGE PLANE
0.25
1.10 MAX
0.20
0.08
0.950.95
3.00
2.80
0.70 MIN
LAND PATTERN RECOMMENDATION
3.00
2.60
0.50
0.30
1.90
0.95
1.70
1.50
1.00 MIN
2.60
SYMM
C
L
(0.30)
1
6
3
4
C
A B
C
0.20 M
0.10
A
B
H
C
C
www.onsemi.com
1
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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