IXTA26P20P IXTP26P20P
IXTP26P20P IXTQ26P20P
IXYS reserves the right to change limits, test conditions, and dimensions.
Symbol Test Conditions Characteristic Values
(TJ = 25°C, unless otherwise specified) Min. Typ. Max.
gfs VDS = -10V, ID = 0.5 • ID25, (Note 1) 10 17 S
Ciss 2920 pF
Coss VGS = 0V, VDS = -25V, f = 1MHz 540 pF
Crss 100 pF
td(on) 18 ns
tr 33 ns
td(off) 46 ns
tf 21 ns
Qg(on) 56 nC
Qgs VGS = -10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25 18 nC
Qgd 20 nC
RthJC 0.5 °C/W
RthCS (TO-3P)(TO-247) 0.21 °C/W
(TO-220) 0.25 °C/W
Source-Drain Diode
Symbol Test Conditions Characteristic Values
(TJ = 25°C, unless otherwise specified) Min. Typ. Max.
ISVGS = 0V - 26 A
ISM Repetitive - 104 A
VSD IF = -13A, VGS = 0V, Note 1 - 3.0 V
trr 240 ns
QRM 2.20 μC
IRM -18.0 A
IXYS MOSFETs and IGBTs are covered 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 B1 6,683,344 6,727,585 7,005,734 B2 7,157,338B2
by one or moreof the following U.S. patents: 4,850,072 5,017,508 5,063,307 5,381,025 6,259,123 B1 6,534,343 6,710,405 B2 6,759,692 7,063,975 B2
4,881,106 5,034,796 5,187,117 5,486,715 6,306,728 B1 6,583,505 6,710,463 6,771,478 B2 7,071,537
Note 1: Pulse test, t ≤ 300μs; duty cycle, d ≤ 2%.
PRELIMINARY TECHNICAL INFORMATION
The product presented herein is under development. The Technical Specifications offered are derived
from data gathered during objective characterizations of preliminary engineering lots; but also may yet
contain some information supplied during a pre-production design evaluation. IXYS reserves the right
to change limits, test conditions, and dimensions without notice.
Resistive Switching Times
VGS = -10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25
RG = 3.3Ω (External)
IF = -13A, -di/dt = -100A/μs
VR = -100V, VGS = 0V