AlesisSemiconductor
12509BeatriceStreet
LosAngeles,CA90066
Phone(310)301-0780Fax(310)306-1551www.alesis-semi.com
-7-
DS3201-0401
Control/StatusWord0
Bit# Description
31:30 Reserved.Settozero.
29:16 B[13:0]:DRAMreaddata.1
15:11 Reserved.Settozero.
10 O:MACoverflow.Self-clearsafterread.Read
only.
9 P:Selftestpass.Readonly.
8R:Readyindication.Read/write/test/clear
complete.
7M:DigOutmuteinexternalmode.Resets
to1.
6Z:DRAMzero.Initiateszeroingcyclesuntil
deasserted.Resetsto0.2,3,4,5,6
5X:DRAMzerocancel.Preventszeroing
circuitryfromrunninguntildeasserted.
OverridesZ.Resetsto0.3
4L:LFOresetpulse.ResetsLFOinternal
statusregistersandclearsoverflowflag.Self
clearing.Resetsto0.
3
I:InstructionRAMdirectmode.Resetsto1.
1:Instructionsarewritten/readassoonas
received;0:Instructionsarewritten/read
whentheaddresscounterrollsaroundto
matchingaddress.7
2 Reserved.Settozero.
1S[1]:DRAMselftestpatternselect.
1:LoadDRAMwith2AAA/1555checkerboard;
0:LoadDRAMwith1555/2AAAcheckerboard.
0S[0]:DRAMselftestinitiate.Self-clearsafter
testcompletion.Resetsto0.2,3,6,8,9
Notes:
1.The floating point format used in the DRAM is:
E[2:0].S.F[9:0],whereEistheexponent,Sisthe
sign bit, and F is the fractional portion. The
expansionofthefloatingpointintofixedpointis
asfollows:
IfE<7,SE*S!SFFFFFFFFFF(8-E)*0
(whereE*SmeansEnumberofSbits).
IfE=7,SSSSSSSSFFFFFFFFFF00.
This method encodes one extra bit for sign
extensionslessthan7bits.
2.The DRAMzeroing circuitryand DRAM self test
circuitrysharegates;donotturnmorethanone
onatatime.
3.The DRAM zeroing cycle will run to completion
evenifZdeasserted.OnlytheXbitmaycancel
it mid-cycle. Until the cycle ends, self test
resultswillbeinaccurate.Thusdonotdeassert
Z and assert S[0] at the same time. Rather,
assertXandS[0]atthesametime.
Note that Z does not self-clear, and will affect
bothinternalandexternalmode.
4.After a DRAM zeroing cycle has completed, do
notstartanotherforonewordclockperiod.
5.A DRAM zeroing cycle takes approximately
5.33mstocompletewitha12MHzcrystal.
6.DuringDRAMzeroingandtestcycles,readsand
writestotheDRAMareignored.
7.For dynamically changing programs, deassert I
sothatchangingtheprogramdoesnotinterrupt
itsexecution.Otherwisereadsandwritestothe
Instruction RAM will usurp the address bus to
the RAM and cause address jumps in the
instruction sequence. With I deasserted, reads
and writes to each address may take up to one
word clock period to complete. Thus during
continuouswrites, the start of each instruction
word should be at least one word clock period
apart, andduringreads the serial clock should
wait 1 word clock after the address before
continuing.
8.The DRAMself testcycle will run to completion
even if S[0] is deasserted. It may not be
cancelled.
9.A DRAM self test cycle takes approximately
10.66mstocompletewitha12MHzcrystal.
Control/StatusWord1
Bit# Description
31
R:Readselect.ReaddatafromDRAM
addressA[15:0]andputdatainBof
control/statusword0.Self-clearsafter
completion.
30 W:Writeselect.WritedataD[13:0]toDRAM
addressA[15:0].Self-clearsaftercompletion.
29:16 D[13:0]:DRAMwritedata.
15:0 A[15:0]:DRAMaddress.TheMSBisunused
andreservedforfutureexpansion.
Note: Reading and writing DRAM will usurp DRAM
accessforonecycle,possiblydisruptingpropercode
execution.
Othernotes:
1.When in internal mode, program
changeswillstartaDRAMzerocycle.
2.ResetsalwaysstartaDRAMzerocycle.
3.Tomeetrefreshrequirementsbelow70
°C,accesseachaddress(modulo1024)
every1.34ms.Ifprogramcodedoesn't
do this, then (at 48 kHz) read 16
locationseachcyclespaced1024/16=
64 addresses apart, to meet refresh
requirements.(Forinstance,addresses
0x0002,0x0042,...,0x03C2.)
4.ROMs may not be read due to the
serial interface becoming the program
selectinterfacewhenininternalmode.
The4wordformats:LFO,MAC,CS0,CS1
LFO:PSXXFFFFFFFFFFFFFAAAAAAAAAAAAAAA
MAC:SCCCCCCCCWIIIIIIAAAAAAAAAAAAAAAA
CS0:--BBBBBBBBBBBBBB-----OPRMZXLI-SS
CS1:RWDDDDDDDDDDDDDDAAAAAAAAAAAAAAAA