1
Radiation Hardened High Speed, Quad SPST, CMOS
Analog Switch
HS-201HSRH, HS-201HSEH
The HS-201HSRH, HS-201HSEH are monolithic CMOS analog
switch featuring power-off high input impedance, very fast
switching speeds and low ON-resistance. Fabrication on our
DI RSG process assures SEL immunity and only very slight
sensitivity to low dose rate (ELDRS). These Class V/Q devices
are tested and guaranteed for 300krad (Si) total dose
performance.
Power-off high input impedance enables the use of this device
in redundant circuits without causing data bus signal
degradation. ESD protection, overvoltage protection, fast
switching times, low ON-resistance, and guaranteed radiation
hardness, make the HS-201HSRH ideal for any space
application where improved switching performance is
required.
Specifications for Rad Hard QML devices are controlled by the
Defense Logistics Agency Land and Maritime (DLA). The SMD
numbers listed below must be used when ordering.
Detailed Electrical Specifications for these devices are
contained in SMD 5962-99618. A “hot-link” is provided on our
homepage for downloading.
Features
Electrically screened to DLA SMD# 5962-99618
QML qualified per MIL-PRF-38535
Radiation performance
- High dose rate (50-300rad(Si)/s). . . . . . . . . . . 300krad(Si)
- Low dose rate (0.01rad(SI)/s) . . . . . . . . . . . . . . 50krad(Si)
- SEL immune . . . . . . . . . . . . . . . . . . . . . . . . . DI RSG process
Overvoltage protection (power on, switch off) . . . . . . . . . . . ±30V
Power off high impedance . . . . . . . . . . . . . . . . . . . . . . . . ±17V
Fast switching times
-t
ON . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110ns (max)
-t
OFF . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80ns (max)
Low “ON” resistance . . . . . . . . . . . . . . . . . . . . . . . . 50Ω (max)
Pin compatible with industry standard 201 types
Operating supply range . . . . . . . . . . . . . . . . . . . . . . .±10V to ±15V
Wide analog voltage range (±15V supplies) . . . . . . . . . . . . ±15V
TTL compatible
Applications
High speed multiplexing
Sample and hold circuits
Digital filters
Operational amplifier gain switching networks
Integrator reset circuits
Pin Configuration
HS1-201HSRH, HS1-201HSEH SBDIP (CDIP2-T16)
HS9-201HSRH, HS9-201HSEH FLATPACK (CDFP4-F16)
TOP VIEW
14
15
16
9
13
12
11
10
1
2
3
4
5
7
6
8
A1
OUT1
IN1
V-
GND
IN4
A4
OUT4
A2
IN2
V+
NC
IN3
OUT3
A3
OUT2
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
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Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries.
All other trademarks mentioned are the property of their respective owners.
June 24, 2013
FN4874.2
HS-201HSRH, HS-201HSEH
2FN4874.2
June 24, 2013
Ordering Information
ORDERING
SMD NUMBER
(Note 3)
INTERNAL
MKT. NUMBER
(Notes 1, 2)
PART
MARKING
TEMP. RANGE
(°C)
PACKAGE
(RoHS Compliant)
PKG.
DWG. #
5962F9961801VEC HS1-201HSRH-Q Q 5962F99 61801VEC -55 to +125 16 Ld SBDIP D16.3
5962F9961802VEC HS1-201HSEH-Q Q 5962F99 61802VEC -55 to +125 16 Ld SBDIP D16.3
5962F9961801QEC HS1-201HSRH-8 Q 5962F99 61801QEC -55 to +125 16 Ld SBDIP D16.3
5962F9961801VXC HS9-201HSRH-Q Q 5962F99 61801VXC -55 to +125 16 Ld Flatpack K16.A
5962F9961802VXC HS9-201HSEH-Q Q 5962F99 61802VXC -55 to +125 16 Ld Flatpack K16.A
5962F9961801QXC HS9-201HSRH-8 Q 5962F99 61801QXC -55 to +125 16 Ld Flatpack K16.A
5962F9961801V9A HS0-201HSRH-Q -55 to +125 Die
5962F9961802V9A HS0-201HSEH-Q -55 to +125 Die
HS1-201HSRH/PROTO HS1-201HSRH/PROTO HS1-201HSRH/PROTO -55 to +125 16 Ld SBDIP D16.3
HS9-201HSRH/PROTO HS9-201HSRH/PROTO HS9-201HSRH/PROTO -55 to +125 16 Ld Flatpack K16.A
HS0-201HSRH/SAMPLE HS0-201HSRH/SAMPLE -55 to +125 Die
NOTE:
1. These Intersil Pb-free Hermetic packaged products employ 100% Au plate - e4 termination finish, which is RoHS compliant and compatible with both
SnPb and Pb-free soldering operations.
2. For Moisture Sensitivity Level (MSL), please see device information page for HS-201HSRH, HS-201HSEH. For more information on MSL, please see
tech brief TB363.
3. Specifications for Rad Hard QML devices are controlled by the Defense Logistics Agency Land and Maritime (DLA). The SMD numbers listed in the
“Ordering Information” table on page 2 must be used when ordering
HS-201HSRH, HS-201HSEH
3FN4874.2
June 24, 2013
Die Characteristics
DIE DIMENSIONS
2790µm x 4950µm (110 mils x 195 mils)
Thickness: 483µm ±25.4µm (19 mils ±1 mil)
INTERFACE MATERIALS
Glassivation
Type: Phosphorus Silicon Glass (PSG)
Thickness: 8.0kÅ ±1.0kÅ
Metallization
Type: Ti/AlCu
Thickness: 16.0kÅ ± 2kÅ
Substrate
Rad Hard Silicon Gate, Dielectric Isolation
Backside Finish
Silicon
ASSEMBLY RELATED INFORMATION
Substrate Potential
Unbiased (DI)
ADDITIONAL INFORMATION
Worst Case Current Density
<2.0 x 105 A/cm2
Transistor Count
328
Metallization Mask Layout
OUT4 IN4 GND V- IN1
A4
A3
A1
A2
OUT3 IN3 V+ IN2 OUT2
OUT1
HS-201HSRH, HS-201HSEH
4FN4874.2
June 24, 2013
Package Outline Drawing
K16.A
16 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE
Rev 2, 1/10
SIDE VIEW
TOP VIEW
SECTION A-A
-D-
-C-
SEATING AND
BASE PLANE
-H-
BASE
LEAD FINISH
METAL
PIN NO. 1
ID AREA
0.022 (0.56)
0.015 (0.38)
0.050 (1.27 BSC)
0.440 (11.18)
0.005 (0.13)
MIN
MAX
0.115 (2.92)
0.045 (1.14) 0.045 (1.14)
0.026 (0.66) 0.285 (7.24)
0.245 (6.22)
0.009 (0.23)
0.004 (0.10)
0.370 (9.40)
0.250 (6.35)
0.03 (0.76) MIN
0.13 (3.30)
MIN
0.006 (0.15)
0.004 (0.10)
0.009 (0.23)
0.004 (0.10)
0.019 (0.48 )
0.015 (0.38 )
0.0015 (0.04)
MAX
0.022 (0.56)
0.015 (0.38)
0.015 (0.38)
0.008 (0.20) PIN NO. 1
ID OPTIONAL
1 2
4
6
3
LEAD FINISH
1. adjacent to pin one and shall be located within the shaded area shown.
The manufacturer’s identifica tion shall not be used as a pin one
identification mark. Alternatel y, a tab may be used to identify pin one.
2. of the tab dimension do not apply.
3. The maximum limits of lead dimensions (section A-A) shall be
measured at the centroid of the finished lead surfaces, when solder
dip or tin plate lead finish is applied.
4.
5. shall be mol d e d to the bottom of the package to cover the leads.
6. meniscus) of the lead from the body. Dimension minimum shall
be reduced by 0.0015 inch (0.038mm) maximum when solder dip
lead finish is applied.
7.
8.
NOTES:
Dimensioning and tolerancing per ANSI Y14.5M - 1982.
Controlling dimension: INCH.
Index area: A notch or a pin one identification mark shall be located
If a pin one identification mark is used in addition to a tab, the limits
Measure dimension at all four corners.
For bottom-brazed lead packages, no organic or polymeric materials
Dimension shall be measured at the point of exit (beyond the
HS-201HSRH, HS-201HSEH
5
Intersil products are manufactured, assembled and tested utilizing ISO9000 quality systems as noted
in the quality certifications found at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time
without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be
accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third
parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
FN4874.2
June 24, 2013
For additional products, see www.intersil.com/product_tree
Ceramic Dual-In-Line Metal Seal Packages (SBDIP)
NOTES:
1. Index area: A notch or a pin one identification mark shall be locat-
ed adjacent to pin one and shall be located within the shaded
area shown. The manufacturer’s identification shall not be used
as a pin one identification mark.
2. The maximum limits of lead dimensions b and c or M shall be
measured at the centroid of the finished lead surfaces, when
solder dip or tin plate lead finish is applied.
3. Dimensions b1 and c1 apply to lead base metal only. Dimension
M applies to lead plating and finish thickness.
4. Corner leads (1, N, N/2, and N/2+1) may be configured with a
partial lead paddle. For this configuration dimension b3 replaces
dimension b2.
5. Dimension Q shall be measured from the seating plane to the
base plane.
6. Measure dimension S1 at all four corners.
7. Measure dimension S2 from the top of the ceramic body to the
nearest metallization or lead.
8. N is the maximum number of terminal positions.
9. Braze fillets shall be concave.
10. Dimensioning and tolerancing per ANSI Y14.5M - 1982.
11. Controlling dimension: INCH.
bbb C A - B
S
c
Q
L
A
SEATING
BASE
D
PLANE
PLANE
SS
-D-
-A-
-C-
eA
-B-
aaa CA - BM DS S
ccc CA - BMDS S
D
E
S1
b2 b
A
e
M
c1
b1
(c)
(b)
SECTION A-A
BASE
LEAD FINISH
METAL
eA/2
S2
M
A
D16.3 MIL-STD-1835 CDIP2-T16 (D-2, CONFIGURATION C)
16 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE
SYMBOL
INCHES MILLIMETERS
NOTESMIN MAX MIN MAX
A - 0.200 - 5.08 -
b 0.014 0.026 0.36 0.66 2
b1 0.014 0.023 0.36 0.58 3
b2 0.045 0.065 1.14 1.65 -
b3 0.023 0.045 0.58 1.14 4
c 0.008 0.018 0.20 0.46 2
c1 0.008 0.015 0.20 0.38 3
D - 0.840 - 21.34 -
E 0.220 0.310 5.59 7.87 -
e 0.100 BSC 2.54 BSC -
eA 0.300 BSC 7.62 BSC -
eA/2 0.150 BSC 3.81 BSC -
L 0.125 0.200 3.18 5.08 -
Q 0.015 0.060 0.38 1.52 5
S1 0.005 - 0.13 - 6
S2 0.005 - 0.13 - 7
α90o105o90o105o-
aaa - 0.015 - 0.38 -
bbb - 0.030 - 0.76 -
ccc - 0.010 - 0.25 -
M - 0.0015 - 0.038 2
N16 168
Rev. 0 4/94