©2003 Fairchild Semiconductor Corporation Rev. A, May 2003
FJP5021
NPN Silicon Transistor
Absolute Maximu m Rating s TC=25°C u nless otherwise noted
Electrical Characteristics TC=25°C unless otherwise noted
hFE Classifi cation
Symbol Parameter Value Units
VCBO Collector-Base Voltage 800 V
VCEO Collector-Emitter Voltage 500 V
VEBO Emitter-Base Voltage 7 V
IC Collector Current (DC) 5 A
ICP Collector Current (Pulse) 10 A
IB Base Current 2 A
PC Collector Dissipation (TC=25°C) 50 W
TJ Junction Temperature 150 °C
TSTG Storage Temperature - 55 ~ 150 °C
Symbol Parameter Test Condition Min. Typ. Max. Unit s
BVCBO Collector-Base Breakdown V oltage IC = 1mA, IE = 0 800 V
BVCEO Collector-Emitter Breakdown Voltage IC = 5mA, IB = 0 500 V
BVEBO Emitter-Base Breakdown Voltage IE = 1mA, IC = 0 7 V
VCEX(sus) Collector-Emitter Sustaining V olt age IC = 2.5A, IB1 = -IB2 = 1A
L = 1mH, Clamped 500 V
ICBO Collector Cut-off Current VCB = 500V, IE = 0 10 µA
IEBO Em itter Cut-off Current VEB = 5V, IC = 0 10 µA
hFE1
hFE2
DC Current Gain VCE = 5V, IC = 0.6A
VCE = 5V, IC = 3A 15
8 50
VCE(sat) Collector-Emitter Saturation Vo ltage IC = 3A, IB = 0.6A 1 V
VBE(sat) Base-Emitter Satura tion Volt age IC = 3A, IB = 0.6A 1.5 V
Cob Output Capacitance VCB = 10V, IE = 0, f=1MHz 80 pF
fT Current Gain Bandwidth Product VCE = 10V, IC = 0.6A 18 MHz
tON Turn On Time VCC = 200V
IC = 5IB1 = -2.5IB2 = 4A
RL = 50
0.5 µs
tSTG St orage Time 3 µs
tF Fall Time 0.1 0.3 µs
Classification R O Y
hFE1 15 ~ 30 20 ~ 40 30 ~ 50
FJP5021
High Voltage and High Reliability
High Speed Switching : tF = 0.1µs (Typ . )
Wide SOA
1.Base 2.Collector 3.Emitter
1TO-220
©2003 Fairchild Semiconductor Corporation
FJP5021
Rev. A, May 2003
Typical Characteristics
Figure 1. Static Characteristic F i gure 2. DC current Gain
Figure 3. Base-Emitter Saturation Vo ltage
Collector-Emitter Saturation Voltage Figure 4. Base-Emitter On Voltage
Figure 5. Switching Time Figure 6. Forward Bias Safe Operating Area
0246810
0
1
2
3
4
5
IB = 1.2 A
IB = 1A
IB = 800mA IB = 600mA
IB = 400mA
IB = 200mA
IB = 100mA
IB = 50mA
IB = 20mA
IB = 0
IC[A], COLLECTOR CURRENT
VCE[V], COLLECTOR-EMITTER VOLTAGE
0.01 0.1 1 10
1
10
100
VCE = 5V
hFE, DC CURRENT G AIN
IC[A], COLLECTOR CURRENT
0.01 0.1 1 10
0.01
0.1
1
10
IC = 5 IB
VCE(sat)
VBE(sat)
VBE(sat), VCE(sat)[V], SATURATION VOLTAGE
IC[A], COLLECTOR CURRENT
0.0 0.2 0.4 0.6 0.8 1.0 1.2
0
1
2
3
4
5
6
VCE = 5V
IC[A], COLLECTOR CURRENT
VBE[V], BASE-EMITTER VOLTAGE
0.1 1 10
0.01
0.1
1
10
tF
tON
tSTG
tON, tSTG, tF [µs], TIME
IC[A], COLLECTOR CURRENT
1 10 100 1000
0.01
0.1
1
10
100
50µs
500µs
1ms
10ms
DC
ICP(max)
IC(max)
IC[A], COLLECTOR CURRENT
VCE[V], COLLECTOR-EMITT ER VOLTAGE
©2003 Fairchild Semiconductor Corporation
FJP5021
Rev. A, May 2003
Typical Characteristics (Continued)
Figure 7. Reverse Bias Safe Operating Area Figure 8. Power Derating
10 100 1000 10000
0.01
0.1
1
10
100 Vcc=50V,
IB1=1A, IB2 = -1A
L = 1mH
IC[A], COLLECTOR CURRENT
VCE[V], COLLE C T OR - EMITTER VOLTAGE
0 25 50 75 100 125 150 175
0
10
20
30
40
50
60
70
80
PC[W], POWE R DISSI PATIO N
TC[oC], CASE TEMPERATURE
Package Dimensions
FJP5021
Dimensions in Millimeters
©2003 Fairchild Semiconductor Corporation Rev. A, May 2003
4.50
±0.20
9.90
±0.20
1.52
±0.10
0.80
±0.10
2.40
±0.20
10.00
±0.20
1.27
±0.10
ø3.60
±0.10
(8.70)
2.80
±0.10
15.90
±0.20
10.08
±0.30
18.95MAX.
(1.70)
(3.70)(3.00)
(1.46)
(1.00)
(45°)
9.20
±0.20
13.08
±0.20
1.30
±0.10
1.30
+0.10
–0.05
0.50
+0.10
–0.05
2.54TYP
[2.54
±0.20
]2.54TYP
[2.54
±0.20
]
TO-220
©2003 Fairchild Semiconductor Corporation Rev. I2
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device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
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Design This datasheet contains the design specifications for
product development. Specifications may change in
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