DATA SH EET
Product specification
Supersedes data of 1997 Jun 23 2001 Dec 11
DISCRETE SEMICONDUCTORS
BSP130
N-channel enhancement mode
vertical D-MOS transistor
a
ge
M3D087
2001 Dec 11 2
Philips Semiconductors Product specification
N-channel enhancement mode
vertical D-MOS transistor BSP130
FEATURES
Direct interface to C-MOS, TTL, etc.
High-speed switching
No secondary breakdown.
APPLICATIONS
Line current interruptor in telephone sets
Relay, high-speed and line transformer drivers.
DESCRIPTION
N-channel enhancement mode vertical D-MOS transistor
in a SOT223 package.
PINNING - SOT223
PIN DESCRIPTION
1 gate
2 drain
3 source
4 drain
Fig.1 Simplified outline and symbol.
Marking code BSP130.
handbook, halfpage
MAM054
4
123
Top view
s
d
g
QUICK REFERENCE DATA
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134).
Note
1. Device mounted on an epoxy printed-circuit board, 40 x 40 x 1.5 mm, mounting pad for the drain tab minimum 6 cm2.
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VDS drain-source voltage (DC) 300 V
IDdrain current (DC) 350 mA
Ptot total power dissipation Tamb 25 °C1.5 W
VGSO gate-source voltage open drain −±20 V
RDSon drain-source on-state
resistance ID= 250 mA; VGS =10V 6
V
GSoff gate-source cut-off voltage ID= 1 mA; VDS =V
GS 0.8 2 V
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VDS drain-source voltage (DC) 300 V
VGSO gate-source voltage (DC) open drain −±20 V
IDdrain current (DC) 350 mA
IDM peak drain current 1.4 A
Ptot total power dissipation Tamb 25 °C; note 1 1.5 W
Tstg storage temperature 55 +150 °C
Tjjunction temperature 150 °C
2001 Dec 11 3
Philips Semiconductors Product specification
N-channel enhancement mode
vertical D-MOS transistor BSP130
THERMAL CHARACTERISTICS
Note
1. Device mounted on an epoxy printed-circuit board, 40 x 40 x 1.5 mm, mounting pad for the drain tab minimum 6 cm2.
STATIC CHARACTERISTICS
Tj = 25 °C unless otherwise specified.
SYMBOL PARAMETER VALUE UNIT
Rth j-a thermal resistance from junction to ambient; note 1 83.3 K/W
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V(BR)DSS drain-source breakdown voltage ID=10µA; VGS = 0 300 −−V
I
GSS gate-source leakage current VGS =±20 V; VDS =0 −−±100 nA
VGSth gate-source threshold voltage ID= 1 mA; VDS =V
GS 0.8 2V
R
DSon drain-source on-state resistance ID= 20 mA; VGS = 2.4 V 4.8 10
ID= 250 mA; VGS =10V 3.7 6
IDSS drain-source leakage current VDS = 240 V; VGS =0 −−100 nA
Yfstransfer admittance ID= 250 mA; VDS = 25 V 200 690 mS
Ciss input capacitance VDS = 25 V; VGS = 0; f = 1 MHz 100 120 pF
Coss output capacitance VDS = 25 V; VGS = 0; f = 1 MHz 21 30 pF
Crss feedback capacitance VDS = 25 V; VGS = 0; f = 1 MHz 10 15 pF
Switching times (see Figs 2 and 3)
ton turn-on time ID= 250 mA; VDD =50V;
V
GS =0to10V 610ns
t
off turn-off time ID = 250 mA; VDD = 50 V;
VGS = 10 to 0 V 46 60 ns
2001 Dec 11 4
Philips Semiconductors Product specification
N-channel enhancement mode
vertical D-MOS transistor BSP130
Fig.2 Switching times test circuit.
handbook, halfpage
MBB691
50
VDD = 50 V
ID
10 V
0 V
Fig.3 Input and output waveforms.
handbook, halfpage
MBB692
10 %
90 %
90 %
10 %
ton toff
OUTPUT
INPUT
Fig.4 Power derating curve.
handbook, halfpage
0 50 100 Tj (°C)
Ptot
(W)
200
2
1.5
0.5
0
1
150
MRC218
handbook, halfpage
250
010 30
020
50
100
150
200
MLD765
VDS (V)
C
(pF)
Crss
Coss
Ciss
Fig.5 Capacitance as a function of drain-source
voltage; typical values.
VGS = 0; f = 1 MHz; Tj=25°C.
2001 Dec 11 5
Philips Semiconductors Product specification
N-channel enhancement mode
vertical D-MOS transistor BSP130
handbook, halfpage
0
1.2
0.8
VDS (V)
ID
(A)
0.4
04812
MLD766
4 V
3.5 V 3 V
2 V
5 V
2.5 V
VGS = 10 V
Fig.6 Typical output characteristics.
Tj=25°C.
handbook, halfpage
010
1.2
0
0.4
0.8
2
ID
(A)
VGS (V)
468
MLD767
Fig.7 Typical transfer characteristics.
VDS = 10 V; Tj=25°C.
handbook, halfpage
30
10
0
20
MLD768
101110
I
D
(A)
RDSon
()
3 V 3.5 V
4 V
10 V
2.5 V
5 V
VGS = 2 V
Fig.8 Drain-source on-state resistance as a
function of drain current; typical values.
Tj=25°C.
handbook, halfpage
02 10
20
15
5
0
10
4VGS (V)
RDSon
()
68
MLD769
Fig.9 Drain-source on-state resistance as a function
of gate-source voltage; typical values.
VDS = 100 mV; Tj=25°C.
2001 Dec 11 6
Philips Semiconductors Product specification
N-channel enhancement mode
vertical D-MOS transistor BSP130
Fig.10 Transient thermal resistance from junction to ambient as a function of pulse time.
handbook, full pagewidth
102
10
Rth j-a
(K/W)
1
101
MRC221
1051041031021011tp (s)
10 102103
tp
tp
T
P
t
T
δ =
δ =
0.5
0.75
0.2
0.1
0.05
0
0.01
0.02
handbook, halfpage
MLD773
10
1
10 102
103
102
101
103
1VDS (V)
ID
(A)
tpT
P
t
tp
T
δ=
DC
(1)
1 ms
10 ms
100 ms
1s
100 µs
tp =
10 µs
Fig.11 SOAR curve.
δ= 0.01; Tamb =25°C.
(1) RDSon limitation.
2001 Dec 11 7
Philips Semiconductors Product specification
N-channel enhancement mode
vertical D-MOS transistor BSP130
handbook, halfpage
50 0
(1)
(2)
Tj (°C)
k
50 150
2
1.5
0.5
0
1
100
MLD771
Fig.12 Temperature coefficient of drain-source
on-state resistance; typical values.
Typical RDSon;
(1) ID= 250 mA; VGS =10V.
(2) ID= 20 mA; VGS = 2.4 V.
kRDS(on) at Tj
RDS(on)at 25 °C
-----------------------------------------
=
handbook, halfpage
-50 0 Tj (°C)
k
50 150
1.25
0
1
100
0.75
0.5
0.25
MLD772
Fig.13 Temperature coefficient of gate-source
threshold voltage; typical values.
Typical VGSth at 1 mA.
kVGS th()
at Tj
VGS th()
at 25 °C
------------------------------------------- .=
2001 Dec 11 8
Philips Semiconductors Product specification
N-channel enhancement mode
vertical D-MOS transistor BSP130
PACKAGE OUTLINE
UNIT A1bpcDEe
1H
EL
pQywv
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC EIAJ
mm 0.10
0.01
1.8
1.5 0.80
0.60
b1
3.1
2.9 0.32
0.22 6.7
6.3 3.7
3.3 2.3
e
4.6 7.3
6.7 1.1
0.7 0.95
0.85 0.1 0.10.2
DIMENSIONS (mm are the original dimensions)
SOT223 SC-73 97-02-28
99-09-13
wM
bp
D
b1
e1
e
A
A1
Lp
Q
detail X
HE
E
vMA
AB
B
c
y
0 2 4 mm
scale
A
X
132
4
Plastic surface mounted package; collector pad for good heat transfer; 4 leads SOT223
2001 Dec 11 9
Philips Semiconductors Product specification
N-channel enhancement mode
vertical D-MOS transistor BSP130
DATA SHEET STATUS
Notes
1. Please consult the most recently issued data sheet before initiating or completing a design.
2. The product status of the device(s) described in this data sheet may have changed since this data sheet was
published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com.
DATA SHEET STATUS(1) PRODUCT
STATUS(2) DEFINITIONS
Objective data Development This data sheet contains data from the objective specification for product
development. Philips Semiconductors reserves the right to change the
specification in any manner without notice.
Preliminary data Qualification This data sheet contains data from the preliminary specification.
Supplementary data will be published at a later date. Philips
Semiconductors reserves the right to change the specification without
notice, in order to improve the design and supply the best possible
product.
Product data Production This data sheet contains data from the product specification. Philips
Semiconductors reserves the right to make changes at any time in order
to improve the design, manufacturing and supply. Changes will be
communicated according to the Customer Product/Process Change
Notification (CPCN) procedure SNW-SQ-650A.
DEFINITIONS
Short-form specification The data in a short-form
specification is extracted from a full data sheet with the
same type number and title. For detailed information see
the relevant data sheet or data handbook.
Limiting values definition Limiting values given are in
accordance with the Absolute Maximum Rating System
(IEC 60134). Stress above one or more of the limiting
values may cause permanent damage to the device.
These are stress ratings only and operation of the device
attheseoratany otherconditionsabove thosegivenin the
Characteristics sections of the specification is not implied.
Exposure to limiting values for extended periods may
affect device reliability.
Application information Applications that are
described herein for any of these products are for
illustrative purposes only. Philips Semiconductors make
norepresentationor warrantythatsuchapplicationswill be
suitable for the specified use without further testing or
modification.
DISCLAIMERS
Life support applications These products are not
designed for use in life support appliances, devices, or
systems where malfunction of these products can
reasonably be expected to result in personal injury. Philips
Semiconductorscustomersusing orsellingthese products
for use in such applications do so at their own risk and
agree to fully indemnify Philips Semiconductors for any
damages resulting from such application.
Right to make changes Philips Semiconductors
reserves the right to make changes, without notice, in the
products, including circuits, standard cells, and/or
software, described or contained herein in order to
improve design and/or performance. Philips
Semiconductors assumes no responsibility or liability for
theuseofanyoftheseproducts,conveys nolicence ortitle
under any patent, copyright, or mask work right to these
products,and makes norepresentationsor warranties that
these products are free from patent, copyright, or mask
work right infringement, unless otherwise specified.
2001 Dec 11 10
Philips Semiconductors Product specification
N-channel enhancement mode
vertical D-MOS transistor BSP130
NOTES
2001 Dec 11 11
Philips Semiconductors Product specification
N-channel enhancement mode
vertical D-MOS transistor BSP130
NOTES
© Koninklijke Philips Electronics N.V. 2001 SCA73
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Printed in The Netherlands 613510/03/pp12 Date of release: 2001 Dec 11 Document order number: 9397 750 09064