BSC018NE2LS OptiMOSTM Power-MOSFET Product Summary Features * Optimized for high performance Buck converter * Very low on-resistance R DS(on) @ V GS=4.5 V * 100% avalanche tested * Superior thermal resistance VDS 25 V RDS(on),max 1.8 mW ID 100 A QOSS 21 nC QG(0V..10V) 39 nC * N-channel * Qualified according to JEDEC1) for target applications PG-TDSON-8 * Pb-free lead plating; RoHS compliant * Halogen-free according to IEC61249-2-21 Type Package Marking BSC018NE2LS PG-TDSON-8 018NE2LS Maximum ratings, at T j=25 C, unless otherwise specified Parameter Symbol Conditions Continuous drain current ID Value V GS=10 V, T C=25 C 100 V GS=10 V, T C=100 C 97 V GS=4.5 V, T C=25 C 100 V GS=4.5 V, T C=100 C 86 V GS=10 V, T A=25 C, R thJA=50 K/W 2) 29 Unit A Pulsed drain current3) I D,pulse T C=25 C 400 Avalanche current, single pulse4) I AS T C=25 C 50 Avalanche energy, single pulse E AS I D=50 A, R GS=25 W 80 mJ Gate source voltage V GS 20 V 1) J-STD20 and JESD22 Rev. 2.2 page 1 2013-02-12 BSC018NE2LS Maximum ratings, at T j=25 C, unless otherwise specified Parameter Symbol Conditions Power dissipation P tot Value T C=25 C 69 T A=25 C, T j, T stg -55 ... 150 IEC climatic category; DIN IEC 68-1 Parameter W 2.5 R thJA=50 K/W 2) Operating and storage temperature Unit C 55/150/56 Values Symbol Conditions Unit min. typ. max. - - 1.8 top - - 20 6 cm2 cooling area2) - - 50 Thermal characteristics Thermal resistance, junction - case Device on PCB R thJC R thJA K/W Electrical characteristics, at T j=25 C, unless otherwise specified Static characteristics Drain-source breakdown voltage V (BR)DSS V GS=0 V, I D=1 mA 25 - - Gate threshold voltage V GS(th) V DS=V GS, I D=250 A 1.2 - 2.0 Zero gate voltage drain current I DSS V DS=25 V, V GS=0 V, T j=25 C - 0.1 1 V DS=25 V, V GS=0 V, T j=125 C - 10 100 V A Gate-source leakage current I GSS V GS=20 V, V DS=0 V - 10 100 nA Drain-source on-state resistance R DS(on) V GS=4.5 V, I D=30 A - 1.8 2.3 mW V GS=10 V, I D=30 A - 1.5 1.8 0.3 0.7 1.4 W 70 140 - S Gate resistance RG Transconductance g fs |V DS|>2|I D|R DS(on)max, I D=30 A 2) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 m thick) copper area for drain connection. PCB is vertical in still air. 3) See figure 3 for more detailed information Rev. 2.2 page 2 2013-02-12 BSC018NE2LS Parameter Values Symbol Conditions Unit min. typ. max. - 2800 3700 - 1000 1300 Dynamic characteristics Input capacitance C iss V GS=0 V, V DS=12 V, f =1 MHz Output capacitance C oss Reverse transfer capacitance Crss - 110 - Turn-on delay time t d(on) - 5.5 - Rise time tr - 4.4 - Turn-off delay time t d(off) - 26 - Fall time tf - 3.6 - Gate to source charge Q gs - 7.0 9.2 Gate charge at threshold Q g(th) - 4.5 6.0 Gate to drain charge Q gd - 4.3 6.4 Switching charge Q sw - 6.7 9.6 Gate charge total Qg - 19 25 Gate plateau voltage V plateau - 2.5 - Gate charge total Qg V DD=12 V, I D=30 A, V GS=0 to 10 V - 39 51 Gate charge total, sync. FET Q g(sync) V DS=0.1 V, V GS=0 to 4.5 V - 16 22 Output charge Q oss V DD=12 V, V GS=0 V - 21 28 - - 69 - - 250 V DD=12 V, V GS=10 V, I D=30 A, R G=1.6 W pF ns Gate Charge Characteristics5) V DD=12 V, I D=30 A, V GS=0 to 4.5 V nC V nC Reverse Diode Diode continuous forward current IS A T C=25 C Diode pulse current I S,pulse Diode forward voltage V SD V GS=0 V, I F=30 A, T j=25 C - 0.85 1 V Reverse recovery charge Q rr V R=15 V, I F=I S, di F/dt =400 A/s - 20 - nC 4) 5) See figure 13 for more detailed information See figure 16 for gate charge parameter definition Rev. 2.2 page 3 2013-02-12 BSC018NE2LS 1 Power dissipation 2 Drain current P tot=f(T C) I D=f(T C); V GS10 V 80 120 70 100 60 80 ID [A] Ptot [W] 50 40 60 30 40 20 20 10 0 0 0 40 80 120 160 0 40 80 TC [C] 120 160 TC [C] 3 Safe operating area 4 Max. transient thermal impedance I D=f(V DS); T C=25 C; D =0 Z thJC=f(t p) parameter: t p parameter: D =t p/T 103 101 limited by on-state resistance 1 s 10 s 100 s 102 100 10 ms ID [A] 0.5 ZthJC [K/W] 1 ms 101 DC 0.2 0.1 0.05 10-1 0.02 100 0.01 single pulse 10-1 10-2 10-1 100 101 102 VDS [V] Rev. 2.2 10-6 10-5 10-4 10-3 10-2 10-1 100 tp [s] page 4 2013-02-12 BSC018NE2LS 5 Typ. output characteristics 6 Typ. drain-source on resistance I D=f(V DS); T j=25 C R DS(on)=f(I D); T j=25 C parameter: V GS parameter: V GS 4 400 5V 10 V 350 4.5 V 300 3 3.5 V RDS(on) [mW] 3.3 V ID [A] 250 200 3.2 V 4V 2 4.5 V 5V 8V 150 3V 7V 10 V 1 100 2.8 V 50 0 0 0 1 2 0 3 10 20 VDS [V] 30 40 50 ID [A] 7 Typ. transfer characteristics 8 Typ. forward transconductance I D=f(V GS); |V DS|>2|I D|R DS(on)max g fs=f(I D); T j=25 C parameter: T j 400 300 250 320 200 ID [A] gfs [S] 240 150 160 100 150 C 80 50 25 C 0 0 0 1 2 3 4 5 VGS [V] Rev. 2.2 0 40 80 120 160 ID [A] page 5 2013-02-12 BSC018NE2LS 10 Typ. gate threshold voltage R DS(on)=f(T j); I D=30 A; V GS=10 V V GS(th)=f(T j); V GS=V DS; I D=250 A 2.5 2.5 2.0 2 typ 1.5 VGS(th) [V] RDS(on) [mW] 9 Drain-source on-state resistance 1.5 1.0 1 0.5 0.5 0.0 0 -60 -20 20 60 100 140 180 -60 -20 20 60 Tj [C] 100 140 180 Tj [C] 11 Typ. capacitances 12 Forward characteristics of reverse diode C =f(V DS); V GS=0 V; f =1 MHz I F=f(V SD) parameter: T j 104 102 10000 Ciss 1000 IF [A] 102 101 100 10 5 10 15 20 25 VDS [V] Rev. 2.2 101 Crss 100 0 25 C 150 C Coss C [pF] 103 0 0.2 0.4 0.6 0.8 1 VSD [V] page 6 2013-02-12 BSC018NE2LS 13 Avalanche characteristics 14 Typ. gate charge I AS=f(t AV); R GS=25 W V GS=f(Q gate); I D=30 A pulsed parameter: T j(start) parameter: V DD 100 12 12 V 10 5V 20 V 25 C 100 C 8 VGS [V] IAV [A] 125 C 10 6 4 2 1 0 1 10 100 1000 0 10 tAV [s] 20 30 40 50 Qgate [nC] 15 Drain-source breakdown voltage 16 Gate charge waveforms V BR(DSS)=f(T j); I D=1 mA 28 V GS 27 Qg VBR(DSS) [V] 26 25 24 V gs(th) 23 22 Q g(th) 21 Q sw Q gs 20 -60 -20 20 60 100 140 Q gate Q gd 180 Tj [C] Rev. 2.2 page 7 2013-02-12 BSC018NE2LS Package Outline PG-TDSON-8 PG-TDSON-8: Outline Rev. 2.2 page 8 2013-02-12 BSC018NE2LS Package Outline PG-TDSON-8: Tape Dimensions in mm Rev. 2.2 page 9 2013-02-12 BSC018NE2LS Published by Infineon Technologies AG 81726 Munich, Germany (c) 2010 Infineon Technologies AG All Rights Reserved. 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Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Rev. 2.2 page 10 2013-02-12