1. General description
The HEF4013B is a dual D-type flip-flop that features independent set-direct input (SD),
clear-direct input (CD), clock input (CP) and outputs (Q, Q). Data is accepted when CP is
LOW and is transferred to the output on the positive-going edge of the clock. The active
HIGH asynchronous CD and SD inputs are independent and override the D or CP inputs.
The outputs are buffered for best system performance. The clock input’s Schmitt-trigger
action makes the circuit highly tolerant of slower clock rise and fall times.
It operates over a recommended VDD power supply range of 3 V to 15 V referenced to VSS
(usually ground). Unused inputs must be connected to VDD, VSS, or another input. The
device is suitable for use over both the industrial (40 °C to +85 °C) and automotive
(40 °C to +125 °C) temperature ranges.
2. Features
nTolerant of slow clock rise and fall times
nFully static operation
n5 V, 10 V, and 15 V parametric ratings
nStandardized symmetrical output characteristics
nOperates across the automotive temperature range from 40 °C to +125 °C
nComplies with JEDEC standard JESD 13-B
3. Applications
nAutomotive and industrial
nCounters and dividers
nRegisters
nToggle flip-flops
4. Ordering information
HEF4013B
Dual D-type flip-flop
Rev. 05 — 19 June 2009 Product data sheet
Table 1. Ordering information
All types operate from
40
°
C to +125
°
C
Type number Package
Name Description Version
HEF4013BP DIP14 plastic dual in-line package; 14 leads (300 mil) SOT27-1
HEF4013BT SO14 plastic small outline package; 14 leads; body width 3.9 mm SOT108-1
HEF4013BTT TSSOP14 plastic thin shrink small outline package; 14 leads; body width 4.4 mm SOT402-1
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 2 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
5. Functional diagram
Fig 1. Functional diagram
001aag084
1SD
1D
1CP
1CD
2SD
2D 2Q
2Q
1Q
1Q
13
12
1
2
2CP
2CD
6
5
3
4
8
9
11
10
SD
CD
DQ
FF1
CP Q
SD
CD
DQ
FF2
CP Q
Fig 2. Logic diagram (one flip-flop)
D
SD
CD
CP
C
C
001aag086
C
C
C
C
C
C
C
CQ
Q
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 3 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
6. Pinning information
6.1 Pinning
6.2 Pin description
7. Functional description
[1] H = HIGH voltage level; L = LOW voltage level; X = don’t care; = LOW-to-HIGH clock transition.
Fig 3. Pin configuration
HEF4013B
1Q VDD
1Q 2Q
1CP 2Q
1CD 2CP
1D 2CD
1SD 2D
VSS 2SD
001aag085
1
2
3
4
5
6
7 8
10
9
12
11
14
13
Table 2. Pin description
Symbol Pin Description
1Q, 2Q 1, 13 true output
1Q, 2Q 2, 12 complement output
1CP, 2CP 3, 11 clock input (LOW to HIGH edge-triggered)
1CD, 2CD 4, 10 asynchronous clear-direct input (active HIGH)
1D, 2D 5, 9 data input
1SD, 2SD 6, 8 asynchronous set-direct input (active HIGH)
VSS 7 ground (0 V)
VDD 14 supply voltage
Table 3. Function table[1]
Control Input Output
nSD nCD nCP nD nQ nQ
HLXXHL
LHXXLH
HHXXHH
LLLLH
LLHHL
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 4 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
8. Limiting values
[1] For DIP14 packages: above Tamb = 70 °C, Ptot derates linearly with 12 mW/K.
[2] For SO14 packages: above Tamb = 70 °C, Ptot derates linearly with 8 mW/K.
[3] For TSSOP14 packages: above Tamb = 60 °C, Ptot derates linearly with 5.5 mW/K.
9. Recommended operating conditions
Table 4. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to V
SS
= 0 V (ground).
Symbol Parameter Conditions Min Max Unit
VDD supply voltage 0.5 +18 V
IIK input clamping current VI<0.5 V or VI>V
DD + 0.5 V - ±10 mA
VIinput voltage 0.5 VDD + 0.5 V
IOK output clamping current VO<0.5 V or VO>V
DD + 0.5 V - ±10 mA
II/O input/output current - ±10 mA
IDD supply current - 50 mA
Tstg storage temperature 65 +150 °C
Tamb ambient temperature 40 +125 °C
Ptot total power dissipation Tamb = 40 °C to +125 °C
DIP14 [1] - 750 mW
SO14 [2] - 500 mW
TSSOP14 [3] - 500 mW
P power dissipation per output - 100 mW
Table 5. Recommended operating conditions
Symbol Parameter Conditions Min Max Unit
VDD supply voltage 3 15 V
VIinput voltage 0 VDD V
Tamb ambient temperature 40 +125 °C
t/V input transition rise and fall rate VDD = 5 V - 3.75 ns/V
VDD = 10 V - 0.5 ns/V
VDD = 15 V - 0.08 ns/V
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 5 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
10. Static characteristics
Table 6. Static characteristics
V
SS
= 0 V; V
I
=V
SS
or V
DD
; unless otherwise specified.
Symbol Parameter Conditions VDD Tamb = 40 °C Tamb = +25 °C Tamb = +85 °C Tamb = +125 °C Unit
Min Max Min Max Min Max Min Max
VIH HIGH-level
input voltage |IO| < 1 µA 5 V 3.5 - 3.5 - 3.5 - 3.5 - V
10 V 7.0 - 7.0 - 7.0 - 7.0 - V
15 V 11.0 - 11.0 - 11.0 - 11.0 - V
VIL LOW-level
input voltage |IO| < 1 µA 5 V - 1.5 - 1.5 - 1.5 - 1.5 V
10 V - 3.0 - 3.0 - 3.0 - 3.0 V
15 V - 4.0 - 4.0 - 4.0 - 4.0 V
VOH HIGH-level
output voltage |IO| < 1 µA 5 V 4.95 - 4.95 - 4.95 - 4.95 - V
10 V 9.95 - 9.95 - 9.95 - 9.95 - V
15 V 14.95 - 14.95 - 14.95 - 14.95 - V
VOL LOW-level
output voltage |IO| < 1 µA 5 V - 0.05 - 0.05 - 0.05 - 0.05 V
10 V - 0.05 - 0.05 - 0.05 - 0.05 V
15 V - 0.05 - 0.05 - 0.05 - 0.05 V
IOH HIGH-level
output current VO = 2.5 V 5 V 1.7 - 1.4 - 1.1 - 1.1 - mA
VO = 4.6 V 5 V 0.64 - 0.5 - 0.36 - 0.36 - mA
VO = 9.5 V 10 V 1.6 - 1.3 - 0.9 - 0.9 - mA
VO = 13.5 V 15 V 4.2 - 3.4 - 2.4 - 2.4 - mA
IOL LOW-level
output current VO = 0.4 V 5 V 0.64 - 0.5 - 0.36 - 0.36 - mA
VO = 0.5 V 10 V 1.6 - 1.3 - 0.9 - 0.9 - mA
VO = 1.5 V 15 V 4.2 - 3.4 - 2.4 - 2.4 - mA
IIinput leakage
current 15 V - ±0.1 - ±0.1 - ±1.0 - ±1.0 µA
IDD supply current all valid input
combinations;
|IO|=0 A
5 V - 1.0 - 1.0 - 30 - 30 µA
10 V - 2.0 - 2.0 - 60 - 60 µA
15 V - 4.0 - 4.0 - 120 - 120 µA
CIinput
capacitance - - - - 7.5 - - - - pF
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 6 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
11. Dynamic characteristics
Table 7. Dynamic characteristics
T
amb
= 25
°
C; unless otherwise specified. For test circuit see Figure 6.
Symbol Parameter Conditions VDD Extrapolation formula Min Typ Max Unit
tPHL HIGH to LOW
propagation delay nCP to nQ, nQ;
see Figure 4 5 V [1] 83 + 0.55 × CL- 110 220 ns
10 V 34 + 0.23 × CL-4590ns
15 V 22 + 0.16 × CL-3060ns
nSD to nQ5 V
[1] 73 + 0.55 × CL- 100 200 ns
10 V 29 + 0.23 × CL-4080ns
15 V 22 + 0.16 × CL-3060ns
nCD to nQ 5 V [1] 73 + 0.55 × CL- 100 200 ns
10 V 29 + 0.23 × CL-4080ns
15 V 22 + 0.16 × CL-3060ns
tPLH LOW to HIGH
propagation delay nCP to nQ, nQ;
see Figure 4 5 V [1] 68 + 0.55 × CL- 95 190 ns
10 V 29 + 0.23 × CL-4080ns
15 V 22 + 0.16 × CL-3060ns
nSD to nQ 5 V [1] 48 + 0.55 × CL- 75 150 ns
10 V 24 + 0.23 × CL-3570ns
15 V 17 + 0.16 × CL-2550ns
nCD to nQ5 V
[1] 33 + 0.55 × CL- 60 120 ns
10 V 19 + 0.23 × CL-3060ns
15 V 12 + 0.16 × CL-2040ns
tttransition time see Figure 4 5 V [1] 10 + 1.00 × CL- 60 120 ns
10 V 9 + 0.42 × CL-3060ns
15 V 6 + 0.28 × CL-2040ns
tsu set-up time nD to nCP;
see Figure 4 5 V 40 20 - ns
10 V 25 10 - ns
15 V 15 5 - ns
thhold time nD to nCP;
see Figure 4 5 V 20 0 - ns
10 V 20 0 - ns
15 V 15 0 - ns
tWpulse width nCP input LOW;
see Figure 4 5 V 60 30 - ns
10 V 30 15 - ns
15 V 20 10 - ns
nSD input HIGH;
see Figure 5 5 V 50 25 - ns
10 V 24 12 - ns
15 V 20 10 - ns
nCD input HIGH;
see Figure 5 5 V 50 25 - ns
10 V 24 12 - ns
15 V 20 10 - ns
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 7 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
[1] Typical values of the propagation delays and output transition times can be calculated with the extrapolation formulas. CL is given in pF.
12. Waveforms
trec recovery time nSD input;
see Figure 5 5 V +15 5- ns
10 V 15 0 - ns
15 V 15 0 - ns
nCD input;
see Figure 5 5 V 40 25 - ns
10 V 25 10 - ns
15 V 25 10 - ns
fclk(max) maximum clock
frequency see Figure 4 5 V 7 14 - MHz
10 V 14 28 - MHz
15 V 20 40 - MHz
Table 7. Dynamic characteristics
…continued
T
amb
= 25
°
C; unless otherwise specified. For test circuit see Figure 6.
Symbol Parameter Conditions VDD Extrapolation formula Min Typ Max Unit
Table 8. Dynamic power dissipation
V
SS
= 0 V; t
r
= t
f
20 ns; T
amb
= 25
°
C.
Symbol Parameter VDD Typical formula Where
PDdynamic power dissipation 5 V PD = 850 × fi + Σ(fo× CL)× VDD2µWf
i = input frequency in MHz;
fo = output frequency in MHz;
CL = output load capacitance in pF;
Σ(fo× CL) = sum of the outputs;
VDD = supply voltage in V.
10 V PD = 3600 × fi + Σ(fo× CL)× VDD2µW
15 V PD = 9000 × fi + Σ(fo× CL)× VDD2µW
Set-up and hold times are shown as positive values but may be specified as negative values.
The shaded areas indicate when the input is permitted to change for predictable output performance.
Measurement points are given in Table 9.
Fig 4. Set-up time, hold time, minimum clock pulse width, propagation delays and transition times
001aah016
0 V
0 V
th
tsu
1/fclk(max)
th
tsu tftr
tW
VM
VM
VM
VI
VOH
VOL
VI
output nQ
input nCP
input nD
tt
tt
tPHL
tPLH
VY
VX
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 8 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
Recovery times are shown as positive values but may be specified as negative values.
Measurement points are given in Table 9.
Fig 5. nSD, nCD recovery time and pulse width
001aag088
input nSD
input nCD
input nCP
VI
0 V
0 V
VOL
0 V
VI
VI
VOH
tW
VM
tW
VM
VM
output nQ
trec trec
Table 9. Measurement points
Supply voltage Input Output
VDD VMVMVXVY
5 V to 15 V 0.5VDD 0.5VDD 0.1VDD 0.9VDD
Test and measurement data is given in Table 10;
Definitions test circuit:
DUT = Device Under Test.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
Fig 6. Test circuit for measuring switching times
VDD
VIVO
001aag182
DUT
CL
RT
G
Table 10. Test data
Supply voltage Input Load
VDD VItr, tfCL
5 V to 15 V VSS or VDD 20 ns 50 pF
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 9 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
13. Application information
Fig 7. N-stage shift register
Fig 8. Binary ripple up-counter; divide-by-2n
Fig 9. Modified ring counter; divide-by-(n + 1)
001aag089
CP
FF
1
Q
Q
DDQ
clock
CP
FF
2
Q
Q
D
CP
FF
n
Q
Q
D
001aag090
CP
T-type flip-flop
FF
1
Q
Q
DQ
clock CP
FF
2
Q
Q
D
CP
FF
n
Q
Q
D
001aag091
CP
FF
1
Q
Q
DQ
clock
CP
FF
2
Q
Q
D
CP
FF
n
Q
Q
D
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 10 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
14. Package outline
Fig 10. Package outline SOT27-1 (DIP14)
UNIT A
max. 1 2 (1) (1)
b1cD (1)
Z
Ee M
H
L
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
mm
inches
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
SOT27-1 99-12-27
03-02-13
A
min. A
max. bmax.
w
ME
e1
1.73
1.13 0.53
0.38 0.36
0.23 19.50
18.55 6.48
6.20 3.60
3.05 0.2542.54 7.62 8.25
7.80 10.0
8.3 2.24.2 0.51 3.2
0.068
0.044 0.021
0.015 0.77
0.73
0.014
0.009 0.26
0.24 0.14
0.12 0.010.1 0.3 0.32
0.31 0.39
0.33 0.0870.17 0.02 0.13
050G04 MO-001 SC-501-14
MH
c
(e )
1
ME
A
L
seating plane
A1
wM
b1
e
D
A2
Z
14
1
8
7
b
E
pin 1 index
0 5 10 mm
scale
Note
1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included.
DIP14: plastic dual in-line package; 14 leads (300 mil) SOT27-1
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 11 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
Fig 11. Package outline SOT108-1 (SO14)
UNIT A
max. A1A2A3bpcD
(1) E(1) (1)
eH
ELL
pQZywv θ
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
mm
inches
1.75 0.25
0.10 1.45
1.25 0.25 0.49
0.36 0.25
0.19 8.75
8.55 4.0
3.8 1.27 6.2
5.8 0.7
0.6 0.7
0.3 8
0
o
o
0.25 0.1
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
Note
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
1.0
0.4
SOT108-1
X
wM
θ
A
A1
A2
bp
D
HE
Lp
Q
detail X
E
Z
e
c
L
vMA
(A )
3
A
7
8
1
14
y
076E06 MS-012
pin 1 index
0.069 0.010
0.004 0.057
0.049 0.01 0.019
0.014 0.0100
0.0075 0.35
0.34 0.16
0.15 0.05
1.05
0.041
0.244
0.228 0.028
0.024 0.028
0.012
0.01
0.25
0.01 0.004
0.039
0.016
99-12-27
03-02-19
0 2.5 5 mm
scale
SO14: plastic small outline package; 14 leads; body width 3.9 mm SOT108-1
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 12 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
Fig 12. Package outline SOT402-1 (TSSOP14)
UNIT A1A2A3bpcD
(1) E(2) (1)
eH
ELL
pQZywv θ
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
mm 0.15
0.05 0.95
0.80 0.30
0.19 0.2
0.1 5.1
4.9 4.5
4.3 0.65 6.6
6.2 0.4
0.3 0.72
0.38 8
0
o
o
0.13 0.10.21
DIMENSIONS (mm are the original dimensions)
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic interlead protrusions of 0.25 mm maximum per side are not included.
0.75
0.50
SOT402-1 MO-153 99-12-27
03-02-18
wM
bp
D
Z
e
0.25
17
14 8
θ
A
A1
A2
Lp
Q
detail X
L
(A )
3
HE
E
c
vMA
X
A
y
0 2.5 5 mm
scale
TSSOP14: plastic thin shrink small outline package; 14 leads; body width 4.4 mm SOT402-1
A
max.
1.1
pin 1 index
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 13 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
15. Revision history
Table 11. Revision history
Document ID Release date Data sheet status Change notice Supersedes
HEF4013B_5 20090619 Product data sheet - HEF4013B_4
Modifications: Section 2 “Features” ESD (ElectroStatic Discharge) values removed.
Table 4 “Limiting values” the conditions values of VI and VI for IIK and IOK modified.
Abbreviations section removed.
Section 16 “Legal information” export control statement added.
HEF4013B_4 20080515 Product data sheet - HEF4013B_CNV_3
HEF4013B_CNV_3 19950101 Product specification - HEF4013B_CNV_2
HEF4013B_CNV_2 19950101 Product specification - -
HEF4013B_5 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 05 — 19 June 2009 14 of 15
NXP Semiconductors HEF4013B
Dual D-type flip-flop
16. Legal information
16.1 Data sheet status
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
16.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
16.3 Disclaimers
General — Information in this document is believed to be accurate and
reliable. However, NXP Semiconductors does not give any representations or
warranties, expressed or implied, as to the accuracy or completeness of such
information and shall have no liability for the consequences of use of such
information.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in medical, military, aircraft,
space or life support equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liability for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) may cause permanent
damage to the device. Limiting values are stress ratings only and operation of
the device at these or any other conditions above those given in the
Characteristics sections of this document is not implied. Exposure to limiting
values for extended periods may affect device reliability.
Terms and conditions of sale — NXP Semiconductors products are sold
subject to the general terms and conditions of commercial sale, as published
at http://www.nxp.com/profile/terms, including those pertaining to warranty,
intellectual property rights infringement and limitation of liability, unless
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of
any inconsistency or conflict between information in this document and such
terms and conditions, the latter will prevail.
No offer to sell or license — Nothing in this document may be interpreted
or construed as an offer to sell products that is open for acceptance or the
grant, conveyance or implication of any license under any copyrights, patents
or other industrial or intellectual property rights.
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from national authorities.
16.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
17. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Document status[1][2] Product status[3] Definition
Objective [short] data sheet Development This document contains data from the objective specification for product development.
Preliminary [short] data sheet Qualification This document contains data from the preliminary specification.
Product [short] data sheet Production This document contains the product specification.
NXP Semiconductors HEF4013B
Dual D-type flip-flop
© NXP B.V. 2009. All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 19 June 2009
Document identifier: HEF4013B_5
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
18. Contents
1 General description. . . . . . . . . . . . . . . . . . . . . . 1
2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
4 Ordering information. . . . . . . . . . . . . . . . . . . . . 1
5 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2
6 Pinning information. . . . . . . . . . . . . . . . . . . . . . 3
6.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
6.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3
7 Functional description . . . . . . . . . . . . . . . . . . . 3
8 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4
9 Recommended operating conditions. . . . . . . . 4
10 Static characteristics. . . . . . . . . . . . . . . . . . . . . 5
11 Dynamic characteristics . . . . . . . . . . . . . . . . . . 6
12 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
13 Application information. . . . . . . . . . . . . . . . . . . 9
14 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 10
15 Revision history. . . . . . . . . . . . . . . . . . . . . . . . 13
16 Legal information. . . . . . . . . . . . . . . . . . . . . . . 14
16.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 14
16.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
16.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 14
16.4 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 14
17 Contact information. . . . . . . . . . . . . . . . . . . . . 14
18 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15