ADR430/ADR431/ADR433/ADR434/ADR435/ADR439
Rev. C | Page 15 of 24
THEORY OF OPERATION
The ADR43x series of references uses a new reference generation
technique known as XFET (eXtra implanted junction FET).
This technique yields a reference with low supply current, good
thermal hysteresis, and exceptionally low noise. The core of the
XFET reference consists of two junction field-effect transistors
(JFETs), one of which has an extra channel implant to raise its
pinch-off voltage. By running the two JFETs at the same drain
current, the difference in pinch-off voltage can be amplified and
used to form a highly stable voltage reference.
The intrinsic reference voltage is around 0.5 V with a negative
temperature coefficient of about –120 ppm/°C. This slope is
essentially constant to the dielectric constant of silicon and can
be closely compensated by adding a correction term generated
in the same fashion as the proportional-to-temperature (PTAT)
term used to compensate band gap references. The primary
advantage of an XFET reference is its correction term, which is
some 30 times lower and requires less correction than that of a
band gap reference. Because most of the noise of a band gap
reference comes from the temperature compensation circuitry,
the XFET results in much lower noise.
Figure 29 shows the basic topology of the ADR43x series. The
temperature correction term is provided by a current source
with a value designed to be proportional to absolute temperature.
The general equation is
( )
PTAT
P
OUT IR1VGV ×−= (1)
where:
G is the gain of the reciprocal of the divider ratio.
∆VP is the difference in pinch-off voltage between the two JFETs.
IPTAT is the positive temperature coefficient correction current.
ADR43x devices are created by on-chip adjustment of R2
and R3 to achieve 2.048 V or 2.500 V, respectively, at the
reference output.
**
I
PTAT
I
1
I
1
*EXTRA CHANNEL IMPLANT
V
OUT
= G(ΔV
P
–R1
×
I
PTAT
)
R2
V
IN
V
OUT
GND
R3
R1
Δ
V
P
04500-0-002
ADR43x
Figure 29. Simplified Schematic Device
Power Dissipation Considerations
The ADR43x family of references is guaranteed to deliver load
currents to 10 mA with an input voltage that ranges from 4.5 V
to 18 V. When these devices are used in applications at higher
currents, users should use the following equation to account for
the temperature effects due to the power dissipation increases.
AJA
DJ TPT +θ×= (2)
where:
TJ and TA are the junction and ambient temperatures, respectively.
PD is the device power dissipation.
θJA is the device package thermal resistance.
BASIC VOLTAGE REFERENCE CONNECTIONS
Voltage references, in general, require a bypass capacitor
connected from VOUT to GND. The circuit in Figure 30
illustrates the basic configuration for the ADR43x family of
references. Other than a 0.1 µF capacitor at the output to help
improve noise suppression, a large output capacitor at the
output is not required for circuit stability.
+
NOTES:
1. NC = NO CONNECT
2. TP = TEST PIN (DO NOT CONNECT)
1
2
3
45
8
6
7
ADR43x
TOP VIEW
(Not to Scale)
TP
NC
VOUT
TRIM
TP
NC
GND
VIN
10µF 0.1µF
0.1µF
04500-0-003
Figure 30. Basic Voltage Reference Configuration
NOISE PERFORMANCE
The noise generated by the ADR43x family of references is
typically less than 3.75 µV p-p over the 0.1 Hz to 10.0 Hz band
for ADR430, ADR431, and ADR433. Figure 22 shows the
0.1 Hz to 10.0 Hz noise of the ADR431, which is only 3.5 µV p-p.
The noise measurement is made with a band-pass filter made
of a 2-pole high-pass filter with a corner frequency at 0.1 Hz
and a 2-pole low-pass filter with a corner frequency at 10.0 Hz.
TURN-ON TIME
Upon application of power (cold start), the time required for
the output voltage to reach its final value within a specified
error band is defined as the turn-on settling time. Two compo-
nents normally associated with this are the time for the active
circuits to settle and the time for the thermal gradients on the
chip to stabilize. Figure 17 and Figure 18 show the turn-on
settling time for the ADR431.