AS91L1002S-10F100-I - Alliance Semiconductor

AS91L1002

July 2004

JTAG Test Sequencer

Description

The AS91L1002 device provides a solution

to perform stand alone IEEE1149.1 tests with out

any third party test hardware.

The device executes tests that have been

translated from the Serial Vector Format (SVF) to

the compact binary format, BVI which is stored in a

Flash memory. Upon completion of the test run the

user is presented with PASS/FAIL information,

thus enabling a high degree of confidence in the

operation of the PCB.

The AS91L1002 can be controlled by

using one of two different sources: a power-on

reset circuit or a front panel switch. Any one of

these can cause the AS91L1002 to execute tests

that have been loaded into the Flash memory.

When the AS91L1002 is running and performing

the tests, status lines are fed off chip to enable

the user to hold the PCB in a safe state until

completion of the tests.

When the tests have completed, the

status of the execution is presented off chip

through a status line to indicate the PASS/FAIL

condition.

Key Features

 Performs IEEE1149.1 tests in standalone mode

without any 3rd Party test hardware

 Eliminates the need for firmware development,

thereby speeding up time to market

 AS91L1002 can be used to perform self tests on

multiple PCBs on a system in parall el

 Pinout and feature set compatible (complete

second source) with the Firecron JTS02 device

 Available in a 100-pin LQFP or a 100-pin

FPBGA lead free package

Device Block Diagram

TMS Parallel to serial conver sion

TDO Paralle l to serial conversion

TDI Serial to parallel conversion

TCK Control Logic containing

16 Bit RTI Counters

Mode Control Registers

FLASH Interface logic

Address and Data IEEE 1149.1

Interface Logic

LFSR Signature

compactor

Power on ResetR or AS91L1002 run switch

BVF Execution

State Machines AS91L1002 running flag

AS91L1002 PASS/FAIL flag

IEEE1149.1 Inter face Port

Figure 1 - AS91L1002 JTAG Test Sequencer

Alliance Semiconductor

2575 Augustine Drive • Santa Clara, CA 95054 • T: 408-855-4900 • F: 408-855-4999 • www.alsc.com

July 2004 AS91L1002

BIST Sequencer Power On Operation

Test Pa ss /Fa il

PCB Asserts signal to

reset AS91L1002 (Low).

Signal JTS02_RST

BIST Se quence r

Device Resets Asserts

AS91L1002 _RST_OUT

(Low) BIST status bits (0

& 1)

Status (0) (Low) Busy/Idle

Status (1) (Low) Pass/Fail

PCB De-asserts signal to

reset AS91 L1002 (High )

Signal AS91L1002 _RST

BIST Se quence r

Device exi ts reset

Deasserts

AS91L1002 _RST_OUT

(High)

Asserts

AS91L1002 _RUN_OUT

(High)

BIST status bits (0 & 1)

Status ( 0 ) (High) Busy Idle

Status (1) (Low) Pass/Fail

BIST Sequen cer Device

waits 150us for BIST flash

to become available

BIST Sequen cer Device

acces s es BIST F l a sh

and start s IEEE 1149.1

stored test s

BIST Sequencer

Stored programmable

delay pri or to IEEE 1149.1

bus access

BIST Sequencer Load &

run IEEE 1149. 1 test

Generate CRC,

Store & Compare

End of stored

tests

BIST Sequencer

BIST status bits (0 & 1)

Status (0) (H ig h) Busy/ Id l e

Status (1) (H ig h) Pass/ F ail

BIST Sequencer

De-asserts

AS91L1008 _Run_Out

(Low)

BIST status bits (0 & 1)

Status (0) (Low) Busy/Idle

PCB reacts to AS91L1002

I/O and or BIST status bits

Board continues to boot

Fail

Pass

Yes

Figure 2 - AS91L1002 Power On Sequence

The AS91L1002 does not require a

microprocessor to operate and run IEEE1149.1

tests. It can be used to perform diagnostics on the

PCB. In systems with multiple cards, all cards can

simultaneously execute self tests without

processor intervention, thereby significantly

reducing test time. AS91L1002 utilizes IEEE1149.1

tests generated by industry standard ATPG tools,

thereby eliminating the need for custom firmware

development resulting in faster time to market.

In the AS91L1002, the IEEE1149.1 test

preparation is a two-step process. The first step is

to convert the industry standard SVF format into

the compact Alliance binary BVF file. One or more

IEEE1149.1 tests represented as Alliance BVF

files can then be further compressed into an

Alliance BVI file which is then exported to a binary

file for programming into the flash device, and

then used by the AS91L1002 for test execution.

The user is able to specify the TCK rate

for each individual test execution based on a

programmable divider within the AS91L1002,

along with a programmable test start delay time

based upon the number of TCKs.

These features enable multiple tests to be

stored, in the AS91L1002 test flash. It allows each

test to operate at different TCK rate, and allows

for sufficient settling time before each test starts

to ensure that the PCB is in a stable condition.

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July 2004 AS91L1002

Signal Description

PIN NAME PIN NUMBER

LQFP PIN NUMBER

FPBGA DESCRIPTION

TOE 88 B6 Test Output Enable: When this signal i s taken to

logic ‘0’, all I/O on the device is placed in HighZ.

POR 14 F4 Power on Reset: This signal when taken to logic

‘0’ causes the AS91L1002 to reset. When the

signal returns to logic ‘1’ the AS91L1002 starts

test execution.

SW_RUN 10 E3 Switch AS91L1002 Run: This signal when taken

to logic ‘0’ causes the AS91L1002 to reset. When

the signal returns to logic ‘ 1’ the AS91L1002 starts

test execution.

OSC_IN 16 F1 Oscillator Input: Provides the master clock into the

AS91L1002, Max freq 66 MHz.

BUSY_IDLE 25 K1 BUSY IDLE: This output indicates the state of the

AS91L1002. When High, it indicates that the

AS91L1002 is active.

PASS_FAIL 24 J1 PASS FAIL: This output provides status of the test

execution. When at logic’1’ after test execution the

stored IEEE1149.1 test has failed due to data

errors.

FLASH_ADD[0..23] 70, 69, 67, 65,

64, 63, ,61,

60, 57, 28, 29,

30, 31, 32, 35,

36, 37, 40, 41,

42, 45, 46, 47,

D10, D9, E8,

E10, E9, F7,

F10, F9,

G10, J2, K3,

J3, H4, J4,

H5, J5, K5,

K6, J6, H6,

J7, H7, J8, K8

FLASH ADD: These outputs provide the address

pins to the flash device that is used to store the

IEEE1149.1 tests.

FLASH_DB[0..15] 72, 75, 76, 78,

79, 80, 81, 83,

84, 85, 92, 93,

94, 96, 97, 98

C9, C10, B10,

A9, A8, B8,

A7, B7, C7,

C6, C5, C4,

B4, A4, B3,

FLASH DB: These inputs provide the stored

IEEE1149.1 test data within the flash device to the

AS91L1002 sequencer.

FLASH_RD 50 K10 FLASH READ: This output provides an active ‘0’

signal to indicate that the AS91L1002 wishes to

read data from the flash device.

TRST 22 H2 TRST: This output signal provides the IEEE1149.1

TRST signal for the devices to be tested.

TMS 21 G2 TMS: This output signal provides the IEEE1149.1

TMS signal for the devices to be tested.

TCK 87 A6 TCK: This output signal provides the IEEE1149.1

TCK signal for the devices to be tested. The clock

frequency is based upon the frequency of

oscillator to the AS91L1002 and is programmabl e

for each tests execution.

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July 2004 AS91L1002

PIN NAME PIN NUMBER

LQFP PIN NUMBER

FPBGA DESCRIPTION

TDO 20 G1 TDO: This output signal provides the IEEE1149.1

data for the devices to be tested. It should be

connected to the TDI pin on the first device in the

IEEE1149.1 chain.

TDI 19 G3 TDI: This input signal receives the IEEE1149.1

data from the devices to be tested. It should be

connected to the TDO pin on the last device in the

IEEE1149.1 chain.

DEVICE_TCK

62 F8 Silicon TAP Port Signal

DEVICE_TDI

4 A1 Silicon TAP Port Signal

DEVICE_TDO

73 A10 Silicon TAP Port Signal

DEVICE_TMS

15 F3 Silicon TAP Port Signal

Signal Ground 55,56, 89, 38,

86, 11, 26, 43,

59, 74, 95, 2,

17, 90

J9,G9,B5, D6,

G5, C3, D7,

E5, F6,

G4,H8, A5,

F2, B1

3.3 V Supply 39, 91,23, 3,

18, 34, 51, 66,

82,54

H9, C8, D4,

E6, F5, G7,

H3, H1, D5,

Table 1 - Signal Description

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July 2004 AS91L1002

Signal Functions

Signal Name Signal Function

TRST TRST: This output signal provides the IEEE1149.1 TRST signal for the devices to be

tested.

TOE Test Output Enable: When this signal i s take n to logic ‘0’ all I/O on the device is

placed in HighZ.

TMS TMS: This output signal provides the IEEE1149.1 TMS signal for the devices to be

tested.

TDO TDO: This output signal provides the IEEE1149.1 data for the devices to be tested. It

should be connected to the TDI pin on t he first device in the IEEE1149.1 chain.

TDI TDI: This input signal receives the IEEE1149.1 data from the devices to be tested. It

should be connected to the TDO pin on the last device in the IEEE1149.1 chain.

TCK TCK: This output signal provides the IEEE1149.1 TCK signal for the devices to be

tested. The clock frequency is based upon the frequency of oscillator to the

AS91L1002 and is programmable for each tests execution.

SW_RUN Switch AS91L1002 Run: This signal when taken to logic ‘0’ causes the AS91L1002 to

reset. When the signal returns to logic ‘1’ the AS91L10 02 starts test execution.

RST_OUT RESET OUT: This output signal pulses low before the start of each test execution. It is

used to reset the Flash device to ensure that they are in a stable state before the

AS91L1002 access the stored data.

POR Power on Reset: This signal whe n taken to logic ‘0’ causes the AS91L1002 to reset.

When the signal returns to logic ‘1’ the AS 91L1002 starts test execution.

PASS_FAIL PASS FAIL: This output provides status of the test execution. When at logic’1’ after

test execution, the stored IEEE1149.1 test has failed due to data erro rs.

OSC_IN Oscillator Input: Provides the maste r clock into the AS91L1002, M ax freq 66 MHz.

FLASH_RD FLASH READ: This output provides an active ‘0’ signal to indicate that the

AS91L1002 wishes to read data from the flash device.

FLASH_DB[0..15] FLASH DB: These inputs provide the stored IEEE1149.1 test data within the flash.

FLASH_ADD[0..23] FLASH ADD: These outputs provid e the address pins to the flash device that is used

to store the IEEE1149.1 tests.

BUSY_IDLE BUSY IDLE: This output indicates the state of the AS91L1002. When Hig h, it indicates

the AS91L1002 is active.

Table 2 - Signal Functions

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July 2004 AS91L1002

Absolute Maximum Ratings

Parameter Maximum Range

Supply Voltage (Vcc) -0.3V to 5.5V

DC Input Voltage (Vi) -0.5V to Vcc +0.5V

Max sink current when Vi = -0.5V -20mA

Max source current when Vi = Vcc + 0.5V +20mA

Max Junction Temperature with power applied Tj +125 degrees C

Max Storage temperature -55 to +150 degree C

Table 3 - Absolute Maximum Ratings

 Note: Stress above the stated maximum values may cause irreparable damage to the device,

correct operation of the dev i ce at these values is not guaranteed.

Recommended Operating Conditions

Parameter Operating Range

Supply Voltage (Vcc) 3.0V to 3.6V

Input Voltage (Vi) 0V to Vcc

Output Voltage (Vo) 0V to Vcc

Operating Temperature (Ta)

Commercial 0 C to 70 C

Industrial (Ta) -40 deg C to +85 d eg C, 3.00V to 3.6V

Table 4 - Recommended Operating Conditions

DC Electrical Characteristics

Symbol Parameter Min Max Condition

VIH Minimum High Input

Voltage 2.0 5.25

VIL Maximum Low Input

Voltage -0.3V 0.8V

Symbol Parameter Value Condition

VOH Minimum High Output

Voltage 2.4V Ioh=24mA or 8mA as

defined by pin

VOL Minimum Low Output

Voltage 0.4V Iol=24mA or 8mA as

defined by pin

Ioz Tristate output leakage -10 or 10 mA

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July 2004 AS91L1002

Symbol Parameter Min Max Condition

Icc Maximum quiescent

supply current 2mA

Iccd Maximum dynamic

supply current 80mA TCK freq equal to 10 MHz

Table 5 - AS91L1002 DC Electrical Ch aracteristics

Packaging Information

The AS91L1002 is available in a 100-pin LQFP or a 1 00-pin FPBGA lead free package.

Square

D1BASIC 14.00

DBASIC 18.00

L0.15 0.60

A2MIN NOM MAX 1.35 1.40 1.45

L1 REF 1.00

AMAX. 1.60

bMIN MAX 0.1 7 0 .2 7

A10.05 0.15

eBASIC 0.50

JEDEC REF # MS-026

ccc MAX 0.08

ddd NOM 0.08

SYMBOL 100 LEA D

TOL. LEADS

MIN MAX

NOTES:

1. A L L LINEA R DIMEN S IONS A RE IN MIL L IM ETE R S .

2. PLASTIC BODY DIMENSIO NS DO NO T INC LUDE FLASH OR PROTUSIO N.

MAX ALLOWABLE 0.25 PER SIDE.

3. LEAD COUN T O N DRA W ING NOT REPRESENTATIVE OF ACTUAL PACKAGE.

0.25

0.09/0.20 TYP

0 - 7

TYP

LL1 b

- C -

CCC

LEAD COPLAN A R ITY

al al al A-B S D S

A2 A

12 NOM

Figure 4 - LQFP-100

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July 2004 AS91L1002

Revisions

REV. DESCRIPTION ECN DATE

A Initial document release. 91253 12-04-01

B Updated ball coplanarity limits from

0.20mm to 0.15mm.

0.15 C

1 2 3 4 5 6 7 8 9 10

b 0.25 M C

0.25 M C A B

DIMENSIONS

SYMBOL MIN. NOM. MAX.

A -- -- 1.70

A1 0.30 -- --

A2 0.25 -- 1.10

b 0.50 0.60 0.70

D 11.00 BSC

D1 9.00 BSC

E 11.00 BSC

E1 9.00 BSC

e 1.00

PACKAGE NUMBER FBGA0100-11F

JEDEC REF # MO-192 VAR. AAC-1

Figure 5 - FPBGA-100

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July 2004 AS91L1002

Device Selector Guide and Ordering Information

AS91L XXXX UU - CC PP - TEMP - L

Aliance Semiconductor

system solution

Device family

1001

1002

1003

1006

Product version

S = standard

U = 16-bit user code

BU = 8-bit status/user code

E = enhanced

C = Commercial (0 to 70 degrees C)

I = Industrial (-40 to 85 degrees C)

Package

L100 = 100 pin LQFP

F100 = 100 pin FP BGA

Clock speed

10 = 10 MHz TCK

40 = 40 MHz TCK

Blank = le aded

F = lead free

G = green

Figure 6 - Part Numbering Guide

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July 2004 AS91L1002

Part Number Description

AS91L1002S – 10L100-C

JTAG Test Sequencer, 100-pin LQFP

package, commercial

AS91L1002S – 10L100-CF JTAG Test Sequencer, 100-pin LQFP

package, commercial, lead free

AS91L1002S – 10L100-I

JTAG Test Sequencer, 100-pin LQFP

package, industrial

AS91L1002S – 10L100-IF JTAG Test Sequencer, 100-pin LQFP

package, industrial, lead free

AS91L1002S – 10F100-C

JTAG Test Sequencer 100-pin FPBGA

package, commercial

AS91L1002S – 10F100-CG JTAG Test Sequencer 100-pin FPBGA,

commercial, green package

AS91L1002S – 10F100-I

JTAG Test Sequencer 100-pin FPBGA

package, industrial

AS91L1002S – 10F100-IG JTAG Test Sequencer 100-pin FPBGA,

industrial, green package

AS91L1002S – 40L100-CF JTAG Test Sequencer, 100-pin LQFP

package, commercial, lead free, 40 MHz

TCK

AS91L1002S – 40L100-IF JTAG Test Sequencer, 100-pin LQFP

package, industrial, lead free, 40 MHz

TCK

AS91L1002S – 40F100-CG JTAG Test Sequencer 100-pin FPBGA,

commercial, green package, 40 MHz TCK

AS91L1002S – 40F100-IG JTAG Test Sequencer 100-pin FPBGA,

industrial, green package, 40 MHz TCK

Table 6 - Valid Part Number Combinations

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July 2004 AS91L1002

Package Options

Device

Master Description

FPBGA-100

(1mm pitch) LQFP-100

AS91L1001 JTAG Test Controller x x

AS91L1002 JTAG Test Sequencer x x

AS91L1003U 3-Port Gateway x x

AS91L1006BU 6-Port Gateway x x

Table 7 - JTAG Controller Product Family

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July 2004 AS91L1002

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