Semiconductor
MSC23832D-xxBS16/DS16
8,388, 608- word x 32- bit DY NAMIC RAM MO DULE : FAST PAGE MODE TY P E
This vers ion: Mar. 8. 1999
DESCRIPTION
The MSC23832D-xxBS16/DS16 is a fully decoded, 8,388,608-word x 32-bit CMOS dynamic random access
memory module composed of sixteen 16Mb DRAMs (4Mx4) in SOJ packages mounted with sixteen decoupling
capacitors on a 72-pin glass epoxy si ngle in-line pac k age. This modul e support s any application wher e high density
and lar ge c apac ity of stor age memory ar e r equired.
FEATURES
· 8, 388,608-word x 32- bit or ganizat ion
· 72-pin Single In-Li ne M emory M odule
MSC23832D-xxBS16 : Gold tab
MSC23832D-xxDS16 : S older t ab
· Singl e +5V supply ± 10% tol er anc e
· I nput : T TL compatible
· Output : TTL compatible, 3-state
· Refresh : 2048cycles/32ms
· / CA S befor e /RAS refr esh, hidden refresh, /RAS only refresh capability
· F ast page mode capability
· Multi-bit t est mode capability
PRODUCT FAMILY
Access Time (Max. ) Power Dissipat i on
Family tRAC tAA tCAC
Cycle
Time
(Min.) Operating (Max. ) Standby (Max.)
MSC23832D-60BS16/DS16 60ns 30ns 15ns 110ns 5060mW
MSC23832D-70BS16/DS16 70ns 35ns 20ns 130ns 4620mW 88mW
Semiconductor MSC23832D
MODULE OUTLINE
1
72
R1.57
6.35
1.04Typ.
1.27±0.1
95.25
2.03Typ.
6.35Typ.
Typ.
6.35
Typ.
10.16
φ3.18
25.4±0.2
101.19Typ.
107.95±0.2
*1
3.38Typ.
3.17Min.
5.71Min.
9.3Max.
+0.1
-0.08
1.27
(Un i t : m m)
MSC23832D-xxBS16/DS16
*1 The common size difference of the board width 12.5mm of its height is specified as ±0.2.
The value above 12.5mm is specified as ±0.5.
Semiconductor MSC23832D
PIN C ONFIGURATI ON
Pin No. Pin Na me Pin No. Pin Na me Pin No. Pin Na me Pin No. Pin Na me
1V
SS 19 A10 37 NC 55 DQ11
2 DQ0 20 DQ4 38 NC 56 DQ27
3 DQ16 21 DQ20 39 VSS 57 DQ12
4 DQ1 22 DQ5 40 /CAS0 58 DQ28
5 DQ17 23 DQ21 41 /CAS2 59 VCC
6 DQ2 24 DQ6 42 /CAS3 60 DQ29
7 DQ18 25 DQ22 43 /CAS1 61 DQ13
8 DQ3 26 DQ7 44 /RAS0 62 DQ30
9 DQ19 27 DQ23 45 /RAS1 63 DQ14
10 VCC 28 A7 46 NC 64 DQ31
11 NC 29 NC 47 /WE 65 DQ15
12 A0 30 VCC 48 NC 66 NC
13 A1 31 A8 49 DQ8 67 PD1
14 A2 32 A9 50 DQ24 68 PD2
15 A3 33 /RAS3 51 DQ9 69 PD3
16 A4 34 /RAS2 52 DQ25 70 PD4
17 A5 35 NC 53 DQ10 71 NC
18 A6 36 NC 54 DQ26 72 VSS
Presence Det ect P ins
Pin No. Pin Na me MSC23832D
-60BS16/DS16 MSC23832D
-70BS16/DS16
67 PD1 NC NC
68 PD2 VSS VSS
69 PD3 NC VSS
70 PD4 NC NC
Semiconductor MSC23832D
BLOCK DIAGRAM
/WE
/CAS0
/RAS0
A0-A10
/CAS1
/RAS1
A0-A10
DQ
DQ
DQ0
DQ
DQ
/OE
V
SS
/RAS
/CAS
/WE
V
CC
A0-A10
DQ
DQ
DQ
DQ
/OE
V
CC
/RAS
/CAS
/WE
V
SS
DQ1
DQ2
DQ3
/CAS2
/RAS2
/CAS3
/RAS3
V
CC
V
SS
C1-C16
A0-A10
DQ
DQ
DQ
DQ
/OE
V
CC
/RAS
/CAS
/WE
V
SS
A0-A10
DQ
DQ
DQ
DQ
/OE
V
SS
/RAS
/CAS
/WE
V
CC
DQ4
DQ5
DQ6
DQ7
A0-A10
DQ
DQ
DQ
DQ
/OE
V
CC
/RAS
/CAS
/WE
V
SS
A0-A10
DQ
DQ
DQ
DQ
/OE
V
SS
/RAS
/CAS
/WE
V
CC
DQ8
DQ9
DQ10
DQ11
A0-A10
DQ
DQ
DQ
DQ
/OE
/RAS
/CAS
/WE
A0-A10
DQ
DQ
DQ
DQ
/OE
/RAS
/CAS
/WE
DQ12
DQ13
DQ14
DQ15
A0-A10
DQ
DQ
DQ16
DQ
DQ
/OE
/RAS
/CAS
/WE
A0-A10
DQ
DQ
DQ
DQ
/OE
/RAS
/CAS
/WE
DQ17
DQ18
DQ19
V
SS
V
CC
V
CC
V
SS
V
CC
V
SS
V
SS
V
CC
A0-A10
DQ
DQ
DQ20
DQ
DQ
/OE
/RAS
/CAS
/WE
A0-A10
DQ
DQ
DQ
DQ
/OE
/RAS
/CAS
/WE
DQ21
DQ22
DQ23
V
SS
V
CC
V
CC
V
SS
A0-A10
DQ
DQ
DQ26
DQ
DQ
/OE
/RAS
/CAS
/WE
A0-A10
DQ
DQ
DQ
DQ
/OE
/RAS
/CAS
/WE
DQ27
DQ28
DQ27
V
SS
V
CC
V
CC
V
SS
A0-A10
DQ
DQ
DQ28
DQ
DQ
/OE
/RAS
/CAS
/WE
A0-A10
DQ
DQ
DQ
DQ
/OE
/RAS
/CAS
/WE
DQ29
DQ30
DQ31
V
SS
V
CC
V
CC
V
SS
Semiconductor MSC23832D
ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings
Parameter Symbol Rating Unit
Volt age on Any Pin Relat i ve to VSS VIN, VOUT -0.5 to +7.0 V
Vol t age on VCC Supply Relative to V SS VCC -0.5 to +7.0 V
Short Ci r cuit Output Current IOS 50 mA
Power Dissipation PD *16W
Operating Temperature TOPR 0 to +70 °C
Storage Temperature TSTG - 40 to +125 °C
* Ta = 25°C
Recommen ded O perating Conditions ( Ta = 0°C to +70°C )
Parameter Symbol Min. Typ. Max. Unit
VCC 4.5 5.0 5.5 V
Power Suppl y Volt age VSS 000V
Input High Volt age VIH 2.4 - VCC + 0.5 V
Input Low Vol tage VIL -0.5 - 0.8 V
Capacitance ( VCC = 5V ± 10%, Ta = 25°C, f = 1 MHz )
Parameter Symbol Typ. Max. Unit
Input Capacitance (A0 - A10) CIN1 - 109 pF
Input Capaci t ance (/WE) CIN2 - 125 pF
Input Capaci t ance (/RAS0- /RAS3) CIN3 -35pF
Input Capaci t ance (/CAS0- /CAS3) CIN4 -35pF
I/O Capacitance (DQ0 - DQ31) CDQ -26pF
Semiconductor MSC23832D
DC CHARACTERISTICS (VCC = 5V ± 10% , Ta = 0°C to +70°C )
MSC23832D
-60BS16/DS16 MSC23832D
-70BS16/DS16
Parameter Symbol Condition
Min. Max. Min. Max.
Unit Note
Input Leakage Current ILI
0V ≤ VIN ≤ 6.5V;
All ot her pins not
under test = 0V -160 160 -160 160 µA
Out put Leakage Current ILO DQ disable
0V ≤ VOUT ≤ 5.5V -20 20 -20 20 µA
Out put Hi gh Volt age VOH IOH = -5.0mA 2.4 VCC 2.4 VCC V
Out put Low Vol tage VOL IOL = 4.2mA 0 0.4 0 0.4 V
Average Power
Supply Current
(Operating) ICC1 /RAS, /CAS cyc ling ,
tRC = Min. - 920 - 840 mA 1, 2
/RAS, /CAS = VIH -32-32mA1
Power supply current
(Standby) ICC2 /RAS, /CAS
≥ VCC -0.2V -16-16mA1
Average Power
Supply Current
(/RAS only r efresh) ICC3
/RAS cy c lin g ,
/CAS = VIH,
tRC = Min. - 920 - 840 mA 1, 2
Average Power
Supply Current
(/CAS before /RAS refresh) ICC6 /RAS cycli ng ,
/CAS before /RAS - 920 - 840 mA 1, 2
Average Power
Supply Current
(Fast Page Mode) ICC7
/RAS = VIL,
/CAS cy c lin g ,
tPC = Min. - 760 - 680 m A 1, 3
Notes: 1. ICC Max. is specified as ICC for output open condition.
2. Address can be changed once or less whil e /RAS = VIL.
3. Address can be changed once or less whil e /CAS = VIH.
Semiconductor MSC23832D
AC CHARACTERI STI CS (1/2) (VCC = 5V ± 10% , Ta = 0°C to +70°C ) Note: 1, 2, 3, 9, 10
MSC23832D
-60BS16/DS16 MSC23832D
-70BS16/DS16
Parameter Symbol
Min. Max. Min. Max.
Unit Note
Random Read or Wr ite Cycle Time tRC 110 - 130 - ns
Fast Page Mode Cycle Time tPC 40 - 45 - ns
Access Time from /RAS tRAC - 60 - 70 ns 4, 5, 6
Access Time from /CAS tCAC - 15 - 20 ns 4, 5
Access Time from Colum n Address tAA - 30 - 35 ns 4, 6
Access Time from /CAS Precharge tCPA - 35 - 40 ns 4
Out put Low Impedance Tim e from /CAS t CLZ 0-0-ns4
/CAS to Data Output Buffer Turn-off Delay Time tOFF 0 15 0 20 ns 7
Transi tion Time tT3 50 3 50 ns 3
Refr esh Period tREF -32-32ms
/RAS Pr echarge Time tRP 40 - 50 - ns
/RAS Pulse Wi d th tRAS 60 10K 70 10K ns
/RAS Pulse Widt h ( Fast Page Mode) tRASP 60 100K 70 100K ns
/RAS Hold Time tRSH 15 - 20 - ns
/CAS Precharge Time (Fast Page Mode) tCP 10 - 10 - ns
/CAS Pulse Wi d th tCAS 15 10K 20 10K ns
/CAS Hold Time tCSH 60 - 70 - ns
/CAS t o /RAS Prechar ge Time tCRP 5-5-ns
/RAS Hold Time from /CAS Precharge tRHCP 35 - 40 - ns
/RAS to /CAS Delay Time tRCD 20 45 20 50 ns 5
/RAS to Column Address Delay Time tRAD 15 30 15 35 ns 6
Row Address Set-up Time tASR 0-0-ns
Row Address Hol d Ti me tRAH 10 - 10 - ns
Column Address Set-up Time tASC 0-0-ns
Col u mn Add ress Hol d Ti me tCAH 15 - 15 - ns
Column Address to /RAS Lead Time tRAL 30 - 35 - ns
Read Com mand Set-up Tim e tRCS 0-0-ns
Read Com mand Hold Time tRCH 0-0-ns8
Read Com mand Hold Time referenced t o / RAS tRRH 0-0-ns8
Semiconductor MSC23832D
AC Characteristics (2/2) (VCC = 5V ± 10% , Ta = 0°C to +70°C ) Note: 1, 2, 3, 9, 10
MSC23832D
-60BS16/DS16 MSC23832D
-70BS16/DS16
Parameter Symbol
Min. Max. Min. Max.
Unit Note
W r ite Command Set-up Time tWCS 0-0-ns
W r ite Command Hold Time t WCH 10 - 15 - ns
W r ite Command Pulse Wi dt h tWP 10 - 10 - ns
W r ite Command to / RAS Lead Ti me t RWL 15 - 20 - ns
W r ite Command to / CAS Lead Ti me t CWL 15 - 20 - ns
Data-i n Set-up Time tDS 0-0-ns
Dat a-i n Ho ld Time t DH 10 - 15 - ns
/CAS Active Delay Time from /RAS Precharge tRPC 5-5-ns
/RAS to /CAS Set-up Time
(/ CAS b efore /RAS) tCSR 10 - 10 - ns
/RAS to /CAS Hold Tim e
(/ CAS b efore /RAS) tCHR 10 - 10 - ns
/WE to /RAS Precharge Ti me
(/ CAS b efore /RAS) tWRP 10 - 10 - ns
/WE Hold Time from /RAS
(/ CAS b efore /RAS) tWRH 10 - 10 - ns
/RAS to /W E Set-up Time
(Test Mode) tWTS 10 - 10 - ns
/RAS to /W E Hold Tim e
(Test Mode) tWTH 10 - 10 - ns
Semiconductor MSC23832D
Notes: 1. A start- up delay of 200µs is required after power-up, followed by a mi nimum of eight ini tializ ation cycles
(/RA S only refr esh or / CA S befor e /RAS refr esh) before pr oper devic e oper ation is achieved.
2. The AC c har ac teri stics assumes tT = 5ns.
3. VIH(Min. ) and VIL(Max .) are ref erence l ev els for measuring input timi ng signals. Transiti on ti me (tT) are
m easured bet ween VIH and VIL.
4. This parameter i s measured wi th a load c ircuit equivalent to 2TT L loads and 100pF.
5. Operation within the tRCD(M ax. ) li mit ensures that t RAC(Max . ) can be met.
tRCD(Max.) is s pecified as a reference point only . If tRCD is greater than the s pecified tRCD(Max.) limit, then
the acc ess ti me is controlled by tCAC.
6. Operation within the tRAD(Max.) li mit ensures that tRAC(Max . ) can be met.
tRAD(Max.) is s pecified as a reference point only. If tRAD is greater than the specified tRAD(Max.) limit, the n
the acc ess ti me is controlled by tAA.
7. tOFF(Max.) define the time at w hich the output achieves the open circuit condition and are not referenced
to out put voltage levels.
8. tRCH or tRRH must be satisfied for a read cycle.
9. The test mode is initiated by performing a /WE and /CAS before /RAS refresh cycle. This mode is
latched and remains in effect until the exit cycle is generated. The test mode specified in this data sheet
is an 8-bi t parall el test function. CA0, CA1 and CA10 are not used. In a read cycl e, if all internal bits are
equal, the DQ pin w ill ind ica te a h igh le vel. If an y in ter na l b its ar e n o t equal, the DQ pin will in dic at e a low
level. The test mode is cleared and the memory devic e retur ned to i ts normal operati ng state by a /RAS
only refresh or /CAS bef ore /RAS ref resh cycle.
10. In a test mode read cycle, the value of access time parameters is delayed for 5ns for the specified value.
These parameters should be specified in test mode cycle by adding the abov e value to the specified
value in this data sheet.
