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Semikron.com/SKR2F17/04
{"I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"450","I(O) Max.(A) Output Current":"26","@t(w) (s) (Test Condition)":"10m","@I(R) (A) (Test Condition)":"1.0","V(FM) Max.(V) Forward Voltage":"2.2","@Temp. (°C) (Test Condition)":"130","@V(R) (V)(Test Condition)":"400","V(RRM)(V) Rep.Pk.Rev. Voltage":"400","Package":"StR-M6","I(RM) Max.(A) Pk. Rev. Current":"16m","@I(F) (A) (Test Condition)":"1.0","Military":"N","Semiconductor Material":"Silicon","t(rr) Max.(s) Rev.Rec. Time":"150n","@Temp (°C) (Test Condition)":...
1098 Bytes - 18:40:49, 04 January 2025
Semikron.com/SKR2F17/04UNF
{"I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"450","I(O) Max.(A) Output Current":"26","@t(w) (s) (Test Condition)":"10m","@I(R) (A) (Test Condition)":"1.0","V(FM) Max.(V) Forward Voltage":"2.2","@Temp. (°C) (Test Condition)":"130","@V(R) (V)(Test Condition)":"400","V(RRM)(V) Rep.Pk.Rev. Voltage":"400","Package":"DO-203AA","I(RM) Max.(A) Pk. Rev. Current":"16m","@I(F) (A) (Test Condition)":"1.0","Military":"N","Semiconductor Material":"Silicon","t(rr) Max.(s) Rev.Rec. Time":"150n","@Temp (°C) (Test Condition)...
1115 Bytes - 18:40:49, 04 January 2025
Semikron.com/SKR2F17/06
{"I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"450","I(O) Max.(A) Output Current":"26","@t(w) (s) (Test Condition)":"10m","@I(R) (A) (Test Condition)":"1.0","V(FM) Max.(V) Forward Voltage":"2.2","@Temp. (°C) (Test Condition)":"130","@V(R) (V)(Test Condition)":"400","V(RRM)(V) Rep.Pk.Rev. Voltage":"600","Package":"StR-M6","I(RM) Max.(A) Pk. Rev. Current":"16m","@I(F) (A) (Test Condition)":"1.0","Military":"N","Semiconductor Material":"Silicon","t(rr) Max.(s) Rev.Rec. Time":"150n","@Temp (°C) (Test Condition)":...
1097 Bytes - 18:40:49, 04 January 2025
Semikron.com/SKR2F17/06UNF
{"I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"450","I(O) Max.(A) Output Current":"26","@t(w) (s) (Test Condition)":"10m","@I(R) (A) (Test Condition)":"1.0","V(FM) Max.(V) Forward Voltage":"2.2","@Temp. (°C) (Test Condition)":"130","@V(R) (V)(Test Condition)":"400","V(RRM)(V) Rep.Pk.Rev. Voltage":"600","Package":"DO-203AA","I(RM) Max.(A) Pk. Rev. Current":"16m","@I(F) (A) (Test Condition)":"1.0","Military":"N","Semiconductor Material":"Silicon","t(rr) Max.(s) Rev.Rec. Time":"150n","@Temp (°C) (Test Condition)...
1115 Bytes - 18:40:49, 04 January 2025
Semikron.com/SKR2F17/08
{"I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"450","I(O) Max.(A) Output Current":"26","@t(w) (s) (Test Condition)":"10m","@I(R) (A) (Test Condition)":"1.0","V(FM) Max.(V) Forward Voltage":"2.2","@Temp. (°C) (Test Condition)":"130","@V(R) (V)(Test Condition)":"400","V(RRM)(V) Rep.Pk.Rev. Voltage":"800","Package":"StR-M6","I(RM) Max.(A) Pk. Rev. Current":"16m","@I(F) (A) (Test Condition)":"1.0","Military":"N","Semiconductor Material":"Silicon","t(rr) Max.(s) Rev.Rec. Time":"150n","@Temp (°C) (Test Condition)":...
1097 Bytes - 18:40:49, 04 January 2025
Semikron.com/SKR2F17/08UNF
{"I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"450","I(O) Max.(A) Output Current":"26","@t(w) (s) (Test Condition)":"10m","@I(R) (A) (Test Condition)":"1.0","V(FM) Max.(V) Forward Voltage":"2.2","@Temp. (°C) (Test Condition)":"130","@V(R) (V)(Test Condition)":"400","V(RRM)(V) Rep.Pk.Rev. Voltage":"800","Package":"DO-203AA","I(RM) Max.(A) Pk. Rev. Current":"16m","@I(F) (A) (Test Condition)":"1.0","Military":"N","Semiconductor Material":"Silicon","t(rr) Max.(s) Rev.Rec. Time":"150n","@Temp (°C) (Test Condition)...
1115 Bytes - 18:40:49, 04 January 2025
Semikron.com/SKR2F17/10
{"I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"450","I(O) Max.(A) Output Current":"26","@t(w) (s) (Test Condition)":"10m","@I(R) (A) (Test Condition)":"1.0","V(FM) Max.(V) Forward Voltage":"2.2","@Temp. (°C) (Test Condition)":"130","@V(R) (V)(Test Condition)":"400","V(RRM)(V) Rep.Pk.Rev. Voltage":"1.0k","Package":"StR-M6","I(RM) Max.(A) Pk. Rev. Current":"16m","@I(F) (A) (Test Condition)":"1.0","Military":"N","Semiconductor Material":"Silicon","t(rr) Max.(s) Rev.Rec. Time":"150n","@Temp (°C) (Test Condition)"...
1099 Bytes - 18:40:49, 04 January 2025
Semikron.com/SKR2F17/10UNF
{"I(FSM) Max.(A) Pk.Fwd.Sur.Cur.":"450","I(O) Max.(A) Output Current":"26","@t(w) (s) (Test Condition)":"10m","@I(R) (A) (Test Condition)":"1.0","V(FM) Max.(V) Forward Voltage":"2.2","@Temp. (°C) (Test Condition)":"130","@V(R) (V)(Test Condition)":"400","V(RRM)(V) Rep.Pk.Rev. Voltage":"1.0k","Package":"DO-203AA","I(RM) Max.(A) Pk. Rev. Current":"16m","@I(F) (A) (Test Condition)":"1.0","Military":"N","Semiconductor Material":"Silicon","t(rr) Max.(s) Rev.Rec. Time":"150n","@Temp (°C) (Test Condition...
1115 Bytes - 18:40:49, 04 January 2025
Documentation and Support
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SKR2F17-10UNF.pdf | 0.43 | 1 | Request | |
SKR2F17-10.pdf | 0.43 | 1 | Request | |
SKR2F17-10.pdf | 0.43 | 1 | Request | |
SKR2F17-10UNF.pdf | 0.43 | 1 | Request |