MDSC-00036-03 QUALITY SEMICONDUCTOR, INC. 3
SEPTEMBER 22, 1998
QS5920A
4
Now an Company
Symbol Parameter Test Conditions Typ Max Unit
ICCQ Quiescent Power VCC = Max., TEST = High, CLKIN = Low 15 30 mA
Supply Current sOE = Low, All outputs unloaded
∆ICC Power Supply Current VCC = Max., VIN = 3.0V 1.0 30 µA
Per Input HIGH(1)
ICCD Dynamic Power Supply VCC = Max., CL = 0pF 55 90 µA/
Current Per Output(1) MHz
ICTotal Power Supply Current(1) VCC = 3.3V, fCLKIN = 50MHz(2) 70 mA
VCC = 3.3V, fCLKIN = 100MHz(2) 130
Symbol Parameter Test Condition Min Typ(1) Max Unit
VIH Input HIGH Voltage Guaranteed Logic HIGH for inputs 2.0 V
VIL Input LOW Voltage Guaranteed Logic LOW for inputs 0.8 V
VIC Clamp Diode Voltage VCC = Min., IIN = –18mA –0.7 –1.2 V
VOH Output HIGH Voltage VCC = Min., IOH = –12mA 2.0 V
(Q0:9, QFB) VCC = Min., IOH = –8mA 2.4
VCC = Min., IOH = –100µA 2.8
VOL Output LOW Voltage VCC = Min., IOL = 12mA 0.5 V
(Q0:9, QFB) VCC = Min., IOL = 8mA 0.4
VCC = Min., IOL = 100µA 0.2
IINInput Leakage Current VCC = Max., 0 ≤ VIN ≤ VCC 1µA
Table 5. DC Electrical Characteristics Over Operating Range
Note:
1. Typical values indicate VCC = 3.3V and TA = 25°C.
Table 6. Power Supply Characteristics
Notes:
1. Guaranteed by characterization but not production tested.
2. For 11 outputs each loaded with 15pF.
Symbol Parameter Min Max Unit
VCC Power Supply Voltage 3.0 3.6 V
VIN Input Voltage 0 VCC V
TAAmbient Operating Temperature –40 85 °C
Table 4. Recommended Operating Conditions
Table 3. Capacitance
TA = 25°C, f = 1MHz, VIN = 0V
QSOP
Pins Typ Max Units
CIN 57pF
Note: Capacitance is characterized but not tested.