©2001 Fairchild Semiconductor Corporation IRF9530, RF1S9530SM Rev. A
Absolute Maximum Ratings TC = 25oC, Unless Otherwise Specified
IRF9530,
RF1S9530SM UNITS
Drain to Source Breakdown Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDS -100 V
Drain to Gate Voltage (RGS = 20kΩ) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .VDGR -100 V
Continuous Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .ID
TC = 100oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .ID
-12
-7.5
A
A
Pulsed Drain Current (Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IDM -48 A
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
GS ±20 V
Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . PD 75 W
Dissipation Derating Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.6 W/oC
Single Pulse Avalanche Energy Rating (Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . EAS 500 mJ
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ, TSTG -55 to 150 oC
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TL
Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .Tpkg
300
260
oC
oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. TJ = 25oC to TJ = 125oC.
Electrical Specifications TC = 25oC, Unless Otherwise Specified
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Drain to Source Breakdown Voltage BVDSS ID = -250µA, VGS = 0V, (Figure 10) -100 - - V
Gate Threshold Voltage VGS(TH) VGS = VDS, ID = -250µA -2 - -4 V
Zero Gate Voltage Drain Current IDSS VDS = Rated BVDSS, VGS = 0V - - -25 µA
VDS = 0.8 x Rated BVDSS, VGS = 0V, TC= 125oC- - -250 µA
On-State Drain Current (Note 2) ID(ON) VDS > ID(ON) x rDS(ON)MAX, VGS = -10V,
(Figure 7)
-12 - - A
Gate to Source Leakage Current IGSS VGS = ±20V - - ±100 nA
Drain to Source On Resistance (Note 2) rDS(ON) ID = -6.5A, VGS = -10V, (Figures 8, 9) - 0.250 0.300 Ω
Forward Transconductance (Note 2) gfs VDS > ID(ON) x rDS(ON) Max, ID = -6.5A
(Figure 12)
2 3.8 - S
Turn-On Delay Time td(ON) VDD = 50V, ID ≈ -12A, RG = 50Ω, VGS = 10V
RL = 4.2Ω, (Figures 17, 18)
MOSFET Switching Times are Essentially Inde-
pendent of Operating Temperature
-3060 ns
Rise Time tr- 70 140 ns
Turn-Off Delay Time td(off) - 70 140 ns
Fall Time tf- 70 140 ns
Total Gate Charge
(Gate to Source + Gate to Drain)
Qg(TOT) VGS = -10V, ID = -12A, VDSS= 0.8 x Rated BVDSS,
(Figure 14, 19, 20) Gate Charge
is Essentially Independent of Operating
Temperature
-2545nC
Gate to Source Charge Qgs -13 - nC
Gate to Drain (“Miller”) Charge Qgd -12 - nC
Input Capacitance CISS VDS = -25V, VGS = 0V, f = 1MHz, (Figure 11) - 500 - pF
Output Capacitance COSS - 300 - pF
Reverse Transfer Capacitance CRSS - 100 - pF
Internal Drain Inductance LDMeasured From the
Contact Screw On Tab To
Center of Die
Modified MOSFET
Symbol Showing the
Internal Devices
Inductances
- 3.5 - nH
Measured From the Drain
Lead, 6mm (0.25in) From
Package to Center of Die
- 4.5 - nH
Internal Source Inductance LSMeasured From The
Source Lead, 6mm
(0.25in) From Header to
Source Bonding Pad
- 7.5 - nH
Thermal Resistance Junction to Case RθJC - - 1.67 oC/W
Thermal Resistance Junction to Ambient RθJA Typical Socket Mount - - 62.5 oC/W
LS
LD
G
D
S
IRF9530, RF1S9530SM