IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXTT170N10P IXTQ170N10P
IXTK170N10P
Symbol Test Conditions Characteristic Values
(TJ = 25°C, Unless Otherwise Specified) Min. Typ. Max.
gfs VDS = 10V, ID = 0.5 • ID25, Note 1 50 72 S
Ciss 6000 pF
Coss VGS = 0V, VDS = 25V, f = 1MHz 2340 pF
Crss 730 pF
td(on) 35 ns
tr 50 ns
td(off) 90 ns
tf 33 ns
Qg(on) 198 nC
Qgs VGS = 10V, VDS = 0.5 • VDSS, ID = 0.5 • ID25 39 nC
Qgd 107 nC
RthJC 0.21 °C/W
RthCS (TO-3P) 0.25 °C/W
(TO-264) 0.15 °C/W
Note 1. Pulse test, t ≤ 300μs, duty cycle, d ≤ 2%.
IXYS MOSFETs and IGBTs are covered 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 B1 6,683,344 6,727,585 7,005,734 B2 7,157,338B2
by one or more of the following U.S. patents: 4,850,072 5,017,508 5,063,307 5,381,025 6,259,123 B1 6,534,343 6,710,405 B2 6,759,692 7,063,975 B2
4,881,106 5,034,796 5,187,117 5,486,715 6,306,728 B1 6,583,505 6,710,463 6,771,478 B2 7,071,537
Resistive Switching Times
VGS = 10V, VDS = 0.5 • VDSS, ID = 60A
RG = 3.3Ω (External)
Source-Drain Diode
Symbol Test Conditions Characteristic Values
(TJ = 25°C, Unless Otherwise Specified) Min. Typ. Max.
ISVGS = 0V 170 A
ISM Repetitive, Pulse Width Limited by TJM 350 A
VSD IF = IS, VGS = 0V, Note 1 1.5 V
trr 120 ns
QRM 2.0 μC
IF = 25A, -di/dt = 100A/μs,
VR = 50V, VGS = 0V
TO-268 (IXTT) Outline
TO-3P (IXTQ) Outline
TO-264 AA ( IXTK) Outline
Dim. Millimeter Inches
Min. Max. Min. Max.
A 4.82 5.13 .190 .202
A1 2.54 2.89 .100 .114
A2 2.00 2.10 .079 .083
b 1.12 1.42 .044 .056
b1 2.39 2.69 .094 .106
b2 2.90 3.09 .114 .122
c 0.53 0.83 .021 .033
D 25.91 26.16 1.020 1.030
E 19.81 19.96 .780 .786
e 5.46 BSC .215 BSC
J 0.00 0.25 .000 .010
K 0.00 0.25 .000 .010
L 20.32 20.83 .800 .820
L1 2.29 2.59 .090 .102
P 3.17 3.66 .125 .144
Q 6.07 6.27 .239 .247
Q1 8.38 8.69 .330 .342
R 3.81 4.32 .150 .170
R1 1.78 2.29 .070 .090
S 6.04 6.30 .238 .248
T 1.57 1.83 .062 .072
Back Side 1 = Gate
2 = Drain
3 = Source
Tab = Drain
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