Note 1: Electrical characteristics determined at 25ºC unless otherwise specified.
Note 2: This device is intended for limited fault protection. Repeated trip events or extended trip endurance can
degrade the device and may affect performance to specifications. Performance impact will depend on
multiple factors including, but not limited to, voltage, trip current, trip duration, trip cycles, and circuit
design. For details or ratings specific to your application contact Littelfuse Circuit Protection directly.
Note 3: Specifications developed using 1.0 ounce 0.045” wide copper traces on dedicated FR4 test boards.
Performance in your application may vary.
Note 4: Izt is the current at which Vz is measured (VZ = VOUT). Additional VZ values are available on request.
Note 5: IHOLD : Maximum steady state IPTC (current entering or exiting the VIN pin of the device) that will not
generate a trip event at the specified temperature. Specification assumes IFLT (current flowing through
the Zener diode) is sufficiently low so as to prevent the diode from acting as a heat source. Testing is
conducted with an “open” Zener.
Note 6: R Typ: Resistance between VIN and VOUT pins during normal operation at room temperature.
Note 7: R1Max: The maximum resistance between VIN and VOUT pins at room temperature, one hour after 1st trip
or after reflow soldering.
Note 8: VINT Max: VINT Max relates to the voltage across the PPTC portion of the PolyZen device (VIN-VOUT).
VINT Max is defined as the voltage (VIN-VOUT) at which typical qualification devices (98% devices, 95%
confidence) survived at least 100 trip cycles and 24 hours trip endurance at the specified voltage (VIN-
VOUT) and current (IPTC). VINT Max testing is conducted using a "shorted" load (VOUT = 0V). VINT Max is a
survivability rating, not a performance rating.
Note 9: IFLT Max: IFLT Max relates to the stead state current flowing through the diode portion of the PolyZen
device in a fault condition, prior to a trip event. IFLT Max is defined as the current at which typical
qualification devices (12 parts per lot from 3 lots) survived 100 test cycles. RMS fault currents above
IFLT Max may permanently damage the diode portion of the PolyZen device. Testing is conducted with
NO load connected to VOUT, such that IOUT = 0. “Test voltage” is defined as the voltage between VIN to
GND and includes the PolyZen Diode drop. Specification is dependent on the direction of current flow
through the diode. IFLT Max is a survivability rating, not a performance rating.
Note 10: The power dissipated by the device when in the “tripped” state, as measured on Littelfuse test boards
(see note 3).
Note 11: Specifications based on limited qualification data and subject to change.