SPICE Device Model Si4860DY
Vishay Siliconix
www.vishay.com Document Number: 70905
206-May-02
SPECIFICATIONS (TJ = 25°C UNLESS OTHERWISE NOTED)
Parameter Symbol Test Conditions Simulated
Data
Measured
Data Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA1.7 V
On-State Drain CurrentaID(on) VDS ≥ 5V, VGS = 10V 694 A
VGS = 10V, ID = 16A 0.0065 0.0066
Drain-Source On-State ResistancearDS(on) VGS = 4.5V, ID = 15A 0.0090 0.0090 Ω
Forward Transconductanceagfs VDS = 15V, ID = 16A 46 60 S
Diode Forward VoltageaVSD IS = 3A, VGS = 0V 0.74 0.70 V
Dynamicb
Total Gate Charge Qg14 13
Gate-Source Charge Qgs 55
Gate-Drain Charge Qgd
VDS = 15V, VGS = 4.5V, ID = 16A
44
nC
Turn-On Delay Time td(on) 16 18
Rise Time tr20 12
Turn-Off Delay Time td(off) 45 46
Fall Time tf
VDD = 15V, RL = 15Ω
ID ≅ 1A, VGEN = 10V, RG = 6Ω
69 19
Source-Drain Reverse Recovery Time trr IF = 3A, di/dt = 100 A/µs35 40
Ns
Notes
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2%.
b. Guaranteed by design, not subject to production testing.