IXSH 30N60B2D1
IXST 30N60B2D1
Reverse Diode (FRED) Characteristic Values
(TJ = 25°C, unless otherwise specified)
Symbol Test Conditions min. typ. max.
VF IF = 30A, VGE = 0 V TJ =150°C 1.6 V
2.5 V
IRM IF = 50A, VGE = 0 V, -diF/dt = 100 A/µs TJ = 100°C 2.0 2.5 A
trr VR = 100 V TJ = 100°C 150 ns
trr IF = 1 A; -di/dt = 100 A/µs; VR = 30 V 30 ns
RthJC 0.9 K/W
Symbol Test Conditions Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
gfs IC = 24A; VCE = 10 V, Note 1 7.0 12.0 S
Cies 1220 pF
Coes VCE = 25 V, VGE = 0 V 110 pF
f = 1 M Hz 20N60B2D1 140 p F
Cres 42 pF
Qg50 nC
Qge IC = 24A, VGE = 15 V, VCE = 0.5 VCES 23 nC
Qgc 15 nC
td(on) 30 ns
tri 30 ns
td(off) 130 280 ns
tfi 140 300 ns
Eoff 0.55 1.0 mJ
td(on) 30 ns
tri 50 ns
Eon 20N60B2 0.32 mJ
20N60B2D1 0.82 mJ
td(off) 202 ns
tfi 234 ns
Eoff 1.18 mJ
RthJC 0.50 K/W
RthCS 0.21 K/W
Inductive load, TJ = 25°°
°°
°C
IC = 24A, VGE = 15 V
VCE = 400 V, RG = 5 Ω
Switching times may increase for VCE
(Clamp) > 0.8 • VCES, higher TJ or
increased RG
Inductive load, TJ = 125°°
°°
°C
IC = 24 A, VGE = 15 V
VCE = 400 V, RG = 5 Ω
Switching times may increase for
VCE (Clamp) > 0.8 • VCES, higher TJ
or increased RG
Note 1: Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
TO-247 (IXSH) Outline
Dim. Millimeter Inches
Min. Max. Min. Max.
A 4.7 5.3 .185 .209
A12.2 2.54 .087 .102
A22.2 2.6 .059 .098
b 1.0 1.4 .040 .055
b11.65 2.13 .065 .084
b22.87 3.12 .113 .123
C .4 .8 .016 .031
D 20.80 21.46 .819 .845
E 15.75 16.26 .610 .640
e 5.20 5.72 0.205 0.225
L 19.81 20.32 .780 .800
L1 4.50 .177
∅P 3.55 3.65 .140 .144
Q 5.89 6.40 0.232 0.252
Terminals: 1 - Gate 2 - Drain
1 2 3
TO-268 (IXST) Outline
IXYS MOSFETs and IGBTs are covered by 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 B1 6,683,344 6,727,585
one or moreof the following U.S. patents: 4,850,072 5,017,508 5,063,307 5,381,025 6,259,123 B1 6,534,343 6,710,405B2 6,759,692
4,881,106 5,034,796 5,187,117 5,486,715 6,306,728 B1 6,583,505 6,710,463