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Features
zHigh-performance, low-power Atmel® AVR® XMEGA® 8/16-bit Microcontroller
zNonvolatile program and data memories
z16K - 128KB of in-system self-programmable flash
z4K - 8KB boot section
z1K - 2KB EEPROM
z2K - 8KB internal SRAM
zPeripheral Features
zFour-channel DMA controller
zEight-channel event system
zFive 16-bit timer/counters
zThree timer/counters with 4 output compare or input capture channels
zTwo timer/counters with 2 output compare or input capture channels
zHigh-resolution extensions on all timer/counters
zAdvanced waveform extension (AWeX) on one timer/counter
zOne USB device interface
zUSB 2.0 full speed (12Mbps) and low speed (1.5Mbps) device compliant
z32 Endpoints with full configuration flexibility
zFive USARTs with IrDA support for one USART
zTwo Two-wire interfaces with dual address match (I2C and SMBus compatible)
zTwo serial peripheral interfaces (SPIs)
zAES and DES crypto engine
zCRC-16 (CRC-CCITT) and CRC-32 (IEEE® 802.3) generator
z16-bit real time counter (RTC) with separate oscillator
zOne twelve-channel, 12-bit, 2msps Analog to Digital Converter
zOne two-channel, 12-bit, 1msps Digital to Analog Converter
zTwo Analog Comparators with window compare function, and current sources
zExternal interrupts on all general purpose I/O pins
zProgrammable watchdog timer with separate on-chip ultra low power oscillator
zQTouch® library support
zCapacitive touch buttons, sliders and wheels
zSpecial microcontroller features
zPower-on reset and programmable brown-out detection
zInternal and external clock options with PLL and prescaler
zProgrammable multilevel interrupt controller
zFive sleep modes
zProgramming and debug interfaces
zPDI (program and debug interface)
zI/O and packages
z34 Programmable I/O pins
z44 - lead TQFP
z44 - pad VQFN/QFN
z49 - ball VFBGA
zOperating voltage
z1.6 – 3.6V
zOperating frequency
z0 – 12MHz from 1.6V
z0 – 32MHz from 2.7V
8/16-bit Atmel XMEGA Microcontroller
ATxmega128A4U / ATxmega64A4U /
ATxmega32A4U / ATxmega16A4U
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1. Ordering Information
Ordering code Flash (bytes) EEPROM (bytes) SRAM (bytes) Speed (MHz) Power supply Package (1)(2)(3) Temp.
ATxmega128A4U-AU 128K + 8K 2K 8K
32 1.6 - 3.6V
44A
-40°C - 85°C
ATxmega128A4U-AUR(4) 128K + 8K 2K 8K
ATxmega64A4U-AU 64K + 4K 2K 4K
ATxmega64A4U-AUR(4) 64K + 4K 2K 4K
ATxmega32A4U-AU 32K + 4K 1K 4K
ATxmega32A4U-AUR(4) 32K + 4K 1K 4K
ATxmega16A4U-AU 16K + 4K 1K 2K
ATxmega16A4U-AUR(4) 16K + 4K 1K 2K
ATxmega128A4U-MH 128K + 8K 2K 8K
PW
ATxmega128A4U-MHR(4) 128K + 8K 2K 8K
ATxmega64A4U-MH 64K + 4K 2K 4K
ATxmega64A4U-MHR(4) 64K + 4K 2K 4K
ATxmega32A4U-MH 32K + 4K 1K 4K
44M1
ATxmega32A4U-MHR(4) 32K + 4K 1K 4K
ATxmega16A4U-MH 16K + 4K 1K 2K
ATxmega16A4U-MHR(4) 16K + 4K 1K 2K
ATxmega128A4U-CU 128K + 8K 2K 8K
49C2
ATxmega128A4U-CUR(4) 128K + 8K 2K 8K
ATxmega64A4U-CU 64K + 4K 2K 4K
ATxmega64A4U-CUR(4) 64K + 4K 2K 4K
ATxmega32A4U-CU 32K + 4K 1K 4K
ATxmega32A4U-CUR(4) 32K + 4K 1K 4K
ATxmega16A4U-CU 16K + 4K 1K 2K
ATxmega16A4U-CUR(4) 16K + 4K 1K 2K
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Notes: 1. This device can also be supplied in wafer form. Please contact your local Atmel sales office for detailed ordering information.
2. Pb-free packaging, complies to the European Directive for Restriction of Hazardous Substances (RoHS directive). Also Halide free and fully Green.
3. For packaging information, see “Instruction Set Summary” on page 63.
4. Tape and Reel
Typical Applications
ATxmega128A4U-AN 128K + 8K 2K 8K
32 1.6 - 3.6V
44A
0°C - 105°C
ATxmega128A4U-ANR(4) 128K + 8K 2K 8K
ATxmega64A4U-AN 64K + 4K 2K 4K
ATxmega64A4U-ANR(4) 64K + 4K 2K 4K
ATxmega32A4U-AN 32K + 4K 1K 4K
ATxmega32A4U-ANR(4) 32K + 4K 1K 4K
ATxmega16A4U-AN 16K + 4K 1K 2K
ATxmega16A4U-ANR(4) 16K + 4K 1K 2K
ATxmega128A4U-M7 128K + 8K 2K 8K
PW
ATxmega128A4U-M7R(4) 128K + 8K 2K 8K
ATxmega64A4U-M7 64K + 4K 2K 4K
ATxmega64A4U-M7R(4) 64K + 4K 2K 4K
ATxmega32A4U-M7 32K + 4K 1K 4K
44M1
ATxmega32A4U-M7R(4) 32K + 4K 1K 4K
ATxmega16A4U-M7 16K + 4K 1K 2K
ATxmega16A4U-M7R(4) 16K + 4K 1K 2K
Package Type
44A 44-Lead, 10 x 10mm body size, 1.0mm body thickness, 0.8mm lead pitch, thin profile plastic quad flat package (TQFP)
44M1 44-Pad, 7x7x1mm body, lead pitch 0.50mm, 5.20mm exposed pad, thermally enhanced plastic very thin quad no lead package (VQFN)
PW 44-Pad, 7x7x1mm body, lead pitch 0.50mm, 5.20mm exposed pad, thermally enhanced plastic very thin quad no lead package (VQFN)
49C2 49-Ball (7 x 7 Array), 0.65mm Pitch, 5.0 x 5.0 x 1.0mm, very thin, fine-pitch ball grid array package (VFBGA)
Industrial control Climate control Low power battery applications
Factory automation RF and ZigBee®Power tools
Building control USB connectivity HVAC
Board control Sensor control Utility metering
White goods Optical Medical applications
Ordering code Flash (bytes) EEPROM (bytes) SRAM (bytes) Speed (MHz) Power supply Package (1)(2)(3) Temp.
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2. Pinout/Block Diagram
Figure 2-1. Block Diagram and QFN/TQFP pinout
Note: 1. For full details on pinout and pin functions refer to “Pinout and Pin Functions” on page 55.
1
2
3
4
44
43
42
41
40
39
38
5
6
7
8
9
10
11
33
32
31
30
29
28
27
26
25
24
23
37
36
35
34
12
13
14
15
16
17
18
19
20
21
22
PA0
PA1
PA2
PA3
PA4
PB0
PB1
PB3
PB2
PA7
PA6
PA5
GND
VCC
PC0
VCC
GND
PC1
PC2
PC3
PC4
PC5
PC6
PC7
PD0
PD1
PD2
PD3
PD4
PD5
PD6
VCC
GND
PD7
PE0
PE1
PE2
PE3
RESET/PDI
PDI
PR0
PR1
AVCC
GND
Power
Supervision
Port A
EVENT ROUTING NETWORK
DMA
Controller
BUS
matrix
SRAMFLASH
ADC
AC0:1
OCD
Port EPort D
Prog/Debug
Interface
EEPROM
Port C
TC0:1
Event System
Controller
Watchdog
Timer
Watchdog
OSC/CLK
Control
Real Time
Counter
Interrupt
Controller
DATA BUS
DATA BUS
Port R
USART0:1
TWI
SPI
TC0:1
USART0:1
SPI
TC0
USART0
TWI
Port B
DAC
AREF
AREF
Sleep
Controller
Reset
Controller
IRCOM
Crypto /
CRC
USB
CPU
Internal
references
Internal
oscillators
XOSC TOSC
Digital function
Analog function / Oscillators
Programming, debug, test
External clock / Crystal pins
General Purpose I /O
Ground
Power
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Figure 2-2. BGA pinout
Table 2-1. BGA pinout
A
B
C
D
E
F
G
1234567
A
B
C
D
E
F
G
7654321
Top view Bottom view
1 2 3 4 5 6 7
APA3 AVCC GND PR1 PR0 PDI_DATA PE3
BPA4 PA1 PA0 GND RESET/
PDI_CLK PE2 VCC
CPA5 PA2 PA6 PA7 GND PE1 GND
DPB1 PB2 PB3 PB0 GND PD7 PE0
EGND GND PC3 GND PD4 PD5 PD6
FVCC PC0 PC4 PC6 PD0 PD1 PD3
GPC1 PC2 PC5 PC7 GND VCC PD2
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3. Overview
The Atmel AVR XMEGA is a family of low power, high performance, and peripheral rich 8/16-bit microcontrollers
based on the AVR enhanced RISC architecture. By executing instructions in a single clock cycle, the AVR XMEGA
devices achieve CPU throughput approaching one million instructions per second (MIPS) per megahertz, allowing the
system designer to optimize power consumption versus processing speed.
The AVR CPU combines a rich instruction set with 32 general purpose working registers. All 32 registers are directly
connected to the arithmetic logic unit (ALU), allowing two independent registers to be accessed in a single instruction,
executed in one clock cycle. The resulting architecture is more code efficient while achieving throughputs many times
faster than conventional single-accumulator or CISC based microcontrollers.
The AVR XMEGA A4U devices provide the following features: in-system programmable flash with read-while-write
capabilities; internal EEPROM and SRAM; four-channel DMA controller, eight-channel event system and
programmable multilevel interrupt controller, 34 general purpose I/O lines, 16-bit real-time counter (RTC); five flexible,
16-bit timer/counters with compare and PWM channels; five USARTs; two two-wire serial interfaces (TWIs); one full
speed USB 2.0 interface; two serial peripheral interfaces (SPIs); AES and DES cryptographic engine; one twelve-
channel, 12-bit ADC with programmable gain; one 2-channel 12-bit DAC; two analog comparators (ACs) with window
mode; programmable watchdog timer with separate internal oscillator; accurate internal oscillators with PLL and
prescaler; and programmable brown-out detection.
The program and debug interface (PDI), a fast, two-pin interface for programming and debugging, is available.
The ATx devices have five software selectable power saving modes. The idle mode stops the CPU while allowing the
SRAM, DMA controller, event system, interrupt controller, and all peripherals to continue functioning. The power-down
mode saves the SRAM and register contents, but stops the oscillators, disabling all other functions until the next TWI,
USB resume, or pin-change interrupt, or reset. In power-save mode, the asynchronous real-time counter continues to
run, allowing the application to maintain a timer base while the rest of the device is sleeping. In standby mode, the
external crystal oscillator keeps running while the rest of the device is sleeping. This allows very fast startup from the
external crystal, combined with low power consumption. In extended standby mode, both the main oscillator and the
asynchronous timer continue to run. To further reduce power consumption, the peripheral clock to each individual
peripheral can optionally be stopped in active mode and idle sleep mode.
Atmel offers a free QTouch library for embedding capacitive touch buttons, sliders and wheels functionality into AVR
microcontrollers.
The devices are manufactured using Atmel high-density, nonvolatile memory technology. The program flash memory
can be reprogrammed in-system through the PDI. A boot loader running in the device can use any interface to
download the application program to the flash memory. The boot loader software in the boot flash section will continue
to run while the application flash section is updated, providing true read-while-write operation. By combining an 8/16-
bit RISC CPU with in-system, self-programmable flash, the AVR XMEGA is a powerful microcontroller family that
provides a highly flexible and cost effective solution for many embedded applications.
All Atmel AVR XMEGA devices are supported with a full suite of program and system development tools, including C
compilers, macro assemblers, program debugger/simulators, programmers, and evaluation kits.
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3.1 Block Diagram
Figure 3-1. XMEGA A4U Block Diagram
Power
Supervision
POR/BOD &
RESET
PORT A (8)
PORT B (8)
DMA
Controller
SRAM
ADCA
ACA
DACB
OCD
Int. Refs.
PDI
PA[0..7]
PB[0..7]
Watchdog
Timer
Watchdog
Oscillator
Interrupt
Controller
DATA BUS
Prog/Debug
Controller
VCC
GND
Oscillator
Circuits/
Clock
Generation
Oscillator
Control
Real Time
Counter
Event System
Controller
AREFA
AREFB
PDI_DATA
RESET/
PDI_CLK
Sleep
Controller
DES
CRC
PORT C (8)
PC[0..7]
TCC0:1
USARTC0:1
TWIC
SPIC
PD[0..7] PE[0..3]
PORT D (8)
TCD0:1
USARTD0:1
SPID
TCE0
USARTE0
TWIE
PORT E (4)
Tempref AES
USB
PORT R (2)
DATA BUS
NVM Controller
MORPEEhsalF
IRCOM
BUS Matrix
CPU
EVENT ROUTING NETWORK
XTAL1/
TOSC1
XTAL2/
TOSC2
PR[0..1]
TOSC1 (optional)
TOSC2
(optional)
Digital function
Analog function
Programming, debug, test
Oscillator/Crystal/Clock
General Purpose I/O
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4. Resources
A comprehensive set of development tools, application notes and datasheets are available for download on
http://www.atmel.com/avr.
4.1 Recommended reading
zAtmel AVR XMEGA AU manual
zXMEGA application notes
This device data sheet only contains part specific information with a short description of each peripheral and module.
The XMEGA AU manual describes the modules and peripherals in depth. The XMEGA application notes contain
example code and show applied use of the modules and peripherals.
All documentation are available from www.atmel.com/avr.
5. Capacitive touch sensing
The Atmel QTouch library provides a simple to use solution to realize touch sensitive interfaces on most Atmel AVR
microcontrollers. The patented charge-transfer signal acquisition offers robust sensing and includes fully debounced
reporting of touch keys and includes Adjacent Key Suppression® (AKS®) technology for unambiguous detection of key
events. The QTouch library includes support for the QTouch and QMatrix acquisition methods.
Touch sensing can be added to any application by linking the appropriate Atmel QTouch library for the AVR
microcontroller. This is done by using a simple set of APIs to define the touch channels and sensors, and then calling
the touch sensing API’s to retrieve the channel information and determine the touch sensor states.
The QTouch library is FREE and downloadable from the Atmel website at the following location:
www.atmel.com/qtouchlibrary. For implementation details and other information, refer to the QTouch library user
guide - also available for download from the Atmel website.
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6. AVR CPU
6.1 Features
z8/16-bit, high-performance Atmel AVR RISC CPU
z142 instructions
zHardware multiplier
z32x8-bit registers directly connected to the ALU
zStack in RAM
zStack pointer accessible in I/O memory space
zDirect addressing of up to 16MB of program memory and 16MB of data memory
zTrue 16/24-bit access to 16/24-bit I/O registers
zEfficient support for 8-, 16-, and 32-bit arithmetic
zConfiguration change protection of system-critical features
6.2 Overview
All Atmel AVR XMEGA devices use the 8/16-bit AVR CPU. The main function of the CPU is to execute the code and
perform all calculations. The CPU is able to access memories, perform calculations, control peripherals, and execute
the program in the flash memory. Interrupt handling is described in a separate section, refer to “Interrupts and
Programmable Multilevel Interrupt Controller” on page 29.
6.3 Architectural Overview
In order to maximize performance and parallelism, the AVR CPU uses a Harvard architecture with separate memories
and buses for program and data. Instructions in the program memory are executed with single-level pipelining. While
one instruction is being executed, the next instruction is pre-fetched from the program memory. This enables
instructions to be executed on every clock cycle. For details of all AVR instructions, refer to http://www.atmel.com/avr.
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Figure 6-1. Block diagram of the AVR CPU architecture.
The arithmetic logic unit (ALU) supports arithmetic and logic operations between registers or between a constant and
a register. Single-register operations can also be executed in the ALU. After an arithmetic operation, the status
register is updated to reflect information about the result of the operation.
The ALU is directly connected to the fast-access register file. The 32 x 8-bit general purpose working registers all
have single clock cycle access time allowing single-cycle arithmetic logic unit (ALU) operation between registers or
between a register and an immediate. Six of the 32 registers can be used as three 16-bit address pointers for program
and data space addressing, enabling efficient address calculations.
The memory spaces are linear. The data memory space and the program memory space are two different memory
spaces.
The data memory space is divided into I/O registers, SRAM, and external RAM. In addition, the EEPROM can be
memory mapped in the data memory.
All I/O status and control registers reside in the lowest 4KB addresses of the data memory. This is referred to as the
I/O memory space. The lowest 64 addresses can be accessed directly, or as the data space locations from 0x00 to
0x3F. The rest is the extended I/O memory space, ranging from 0x0040 to 0x0FFF. I/O registers here must be
accessed as data space locations using load (LD/LDS/LDD) and store (ST/STS/STD) instructions.
The SRAM holds data. Code execution from SRAM is not supported. It can easily be accessed through the five
different addressing modes supported in the AVR architecture. The first SRAM address is 0x2000.
Data addresses 0x1000 to 0x1FFF are reserved for memory mapping of EEPROM.
The program memory is divided in two sections, the application program section and the boot program section. Both
sections have dedicated lock bits for write and read/write protection. The SPM instruction that is used for self-
programming of the application flash memory must reside in the boot program section. The application section
contains an application table section with separate lock bits for write and read/write protection. The application table
section can be used for safe storing of nonvolatile data in the program memory.
6.4 ALU - Arithmetic Logic Unit
The arithmetic logic unit (ALU) supports arithmetic and logic operations between registers or between a constant and
a register. Single-register operations can also be executed. The ALU operates in direct connection with all 32 general
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purpose registers. In a single clock cycle, arithmetic operations between general purpose registers or between a
register and an immediate are executed and the result is stored in the register file. After an arithmetic or logic
operation, the status register is updated to reflect information about the result of the operation.
ALU operations are divided into three main categories – arithmetic, logical, and bit functions. Both 8- and 16-bit
arithmetic is supported, and the instruction set allows for efficient implementation of 32-bit aritmetic. The hardware
multiplier supports signed and unsigned multiplication and fractional format.
6.4.1 Hardware Multiplier
The multiplier is capable of multiplying two 8-bit numbers into a 16-bit result. The hardware multiplier supports
different variations of signed and unsigned integer and fractional numbers:
zMultiplication of unsigned integers
zMultiplication of signed integers
zMultiplication of a signed integer with an unsigned integer
zMultiplication of unsigned fractional numbers
zMultiplication of signed fractional numbers
zMultiplication of a signed fractional number with an unsigned one
A multiplication takes two CPU clock cycles.
6.5 Program Flow
After reset, the CPU starts to execute instructions from the lowest address in the flash programmemory ‘0.’ The
program counter (PC) addresses the next instruction to be fetched.
Program flow is provided by conditional and unconditional jump and call instructions capable of addressing the whole
address space directly. Most AVR instructions use a 16-bit word format, while a limited number use a 32-bit format.
During interrupts and subroutine calls, the return address PC is stored on the stack. The stack is allocated in the
general data SRAM, and consequently the stack size is only limited by the total SRAM size and the usage of the
SRAM. After reset, the stack pointer (SP) points to the highest address in the internal SRAM. The SP is read/write
accessible in the I/O memory space, enabling easy implementation of multiple stacks or stack areas. The data SRAM
can easily be accessed through the five different addressing modes supported in the AVR CPU.
6.6 Status Register
The status register (SREG) contains information about the result of the most recently executed arithmetic or logic
instruction. This information can be used for altering program flow in order to perform conditional operations. Note that
the status register is updated after all ALU operations, as specified in the instruction set reference. This will in many
cases remove the need for using the dedicated compare instructions, resulting in faster and more compact code.
The status register is not automatically stored when entering an interrupt routine nor restored when returning from an
interrupt. This must be handled by software.
The status register is accessible in the I/O memory space.
6.7 Stack and Stack Pointer
The stack is used for storing return addresses after interrupts and subroutine calls. It can also be used for storing
temporary data. The stack pointer (SP) register always points to the top of the stack. It is implemented as two 8-bit
registers that are accessible in the I/O memory space. Data are pushed and popped from the stack using the PUSH
and POP instructions. The stack grows from a higher memory location to a lower memory location. This implies that
pushing data onto the stack decreases the SP, and popping data off the stack increases the SP. The SP is
automatically loaded after reset, and the initial value is the highest address of the internal SRAM. If the SP is changed,
it must be set to point above address 0x2000, and it must be defined before any subroutine calls are executed or
before interrupts are enabled.
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During interrupts or subroutine calls, the return address is automatically pushed on the stack. The return address can
be two or three bytes, depending on program memory size of the device. For devices with 128KB or less of program
memory, the return address is two bytes, and hence the stack pointer is decremented/incremented by two. For
devices with more than 128KB of program memory, the return address is three bytes, and hence the SP is
decremented/incremented by three. The return address is popped off the stack when returning from interrupts using
the RETI instruction, and from subroutine calls using the RET instruction.
The SP is decremented by one when data are pushed on the stack with the PUSH instruction, and incremented by
one when data is popped off the stack using the POP instruction.
To prevent corruption when updating the stack pointer from software, a write to SPL will automatically disable
interrupts for up to four instructions or until the next I/O memory write.
After reset the stack pointer is initialized to the highest address of the SRAM. See Figure 7-1 on page 16.
6.8 Register File
The register file consists of 32 x 8-bit general purpose working registers with single clock cycle access time. The
register file supports the following input/output schemes:
zOne 8-bit output operand and one 8-bit result input
zTwo 8-bit output operands and one 8-bit result input
zTwo 8-bit output operands and one 16-bit result input
zOne 16-bit output operand and one 16-bit result input
Six of the 32 registers can be used as three 16-bit address register pointers for data space addressing, enabling
efficient address calculations. One of these address pointers can also be used as an address pointer for lookup tables
in flash program memory.
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7. Memories
7.1 Features
zFlash program memory
zOne linear address space
zIn-system programmable
zSelf-programming and boot loader support
zApplication section for application code
zApplication table section for application code or data storage
zBoot section for application code or boot loader code
zSeparate read/write protection lock bits for all sections
zBuilt in fast CRC check of a selectable flash program memory section
zData memory
zOne linear address space
zSingle-cycle access from CPU
zSRAM
zEEPROM
zByte and page accessible
zOptional memory mapping for direct load and store
zI/O memory
zConfiguration and status registers for all peripherals and modules
z16 bit-accessible general purpose registers for global variables or flags
zBus arbitration
zDeterministic priority handling between CPU, DMA controller, and other bus masters
zSeparate buses for SRAM, EEPROM and I/O memory
zSimultaneous bus access for CPU and DMA controller
zProduction signature row memory for factory programmed data
zID for each microcontroller device type
zSerial number for each device
zCalibration bytes for factory calibrated peripherals
zUser signature row
zOne flash page in size
zCan be read and written from software
zContent is kept after chip erase
7.2 Overview
The Atmel AVR architecture has two main memory spaces, the program memory and the data memory. Executable
code can reside only in the program memory, while data can be stored in the program memory and the data memory.
The data memory includes the internal SRAM, and EEPROM for nonvolatile data storage. All memory spaces are
linear and require no memory bank switching. Nonvolatile memory (NVM) spaces can be locked for further write and
read/write operations. This prevents unrestricted access to the application software.
A separate memory section contains the fuse bytes. These are used for configuring important system functions, and
can only be written by an external programmer.
The available memory size configurations are shown in “Ordering Information” on page 2. In addition, each device has
a Flash memory signature row for calibration data, device identification, serial number etc.
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7.3 Flash Program Memory
The Atmel AVR XMEGA devices contain on-chip, in-system reprogrammable flash memory for program storage. The
flash memory can be accessed for read and write from an external programmer through the PDI or from application
software running in the device.
All AVR CPU instructions are 16 or 32 bits wide, and each flash location is 16 bits wide. The flash memory is
organized in two main sections, the application section and the boot loader section. The sizes of the different sections
are fixed, but device-dependent. These two sections have separate lock bits, and can have different levels of
protection. The store program memory (SPM) instruction, which is used to write to the flash from the application
software, will only operate when executed from the boot loader section.
The application section contains an application table section with separate lock settings. This enables safe storage of
nonvolatile data in the program memory.
Table 7-1. Flash Program Memory (Hexadecimal address).
7.3.1 Application Section
The Application section is the section of the flash that is used for storing the executable application code. The
protection level for the application section can be selected by the boot lock bits for this section. The application section
can not store any boot loader code since the SPM instruction cannot be executed from the application section.
7.3.2 Application Table Section
The application table section is a part of the application section of the flash memory that can be used for storing data.
The size is identical to the boot loader section. The protection level for the application table section can be selected by
the boot lock bits for this section. The possibilities for different protection levels on the application section and the
application table section enable safe parameter storage in the program memory. If this section is not used for data,
application code can reside here.
7.3.3 Boot Loader Section
While the application section is used for storing the application code, the boot loader software must be located in the
boot loader section because the SPM instruction can only initiate programming when executing from this section. The
SPM instruction can access the entire flash, including the boot loader section itself. The protection level for the boot
loader section can be selected by the boot loader lock bits. If this section is not used for boot loader software,
application code can be stored here.
Word Address
ATxmega128A4U ATxmega64A4U ATxmega32A4U ATxmega16A4U
0000
Application Section
(128K/64K/32K/16K)
...
EFFF / 77FF / 37FF / 17FF
F000 / 7800 / 3800 / 1800 Application Table Section
(8K/4K/4K/4K)
FFFF / 7FFF / 3FFF / 1FFF
10000 / 8000 / 4000 / 2000 Boot Section
(8K/4K/4K/4K)
10FFF / 87FF / 47FF / 27FF
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7.3.4 Production Signature Row
The production signature row is a separate memory section for factory programmed data. It contains calibration data
for functions such as oscillators and analog modules. Some of the calibration values will be automatically loaded to
the corresponding module or peripheral unit during reset. Other values must be loaded from the signature row and
written to the corresponding peripheral registers from software. For details on calibration conditions, refer to “Electrical
Characteristics” on page 72.
The production signature row also contains an ID that identifies each microcontroller device type and a serial number
for each manufactured device. The serial number consists of the production lot number, wafer number, and wafer
coordinates for the device. The device ID for the available devices is shown in Table 7-2.
The production signature row cannot be written or erased, but it can be read from application software and external
programmers.
Table 7-2. Device ID bytes for Atmel AVR XMEGA A4U devices.
7.3.5 User Signature Row
The user signature row is a separate memory section that is fully accessible (read and write) from application software
and external programmers. It is one flash page in size, and is meant for static user parameter storage, such as
calibration data, custom serial number, identification numbers, random number seeds, etc. This section is not erased
by chip erase commands that erase the flash, and requires a dedicated erase command. This ensures parameter
storage during multiple program/erase operations and on-chip debug sessions.
7.4 Fuses and Lock bits
The fuses are used to configure important system functions, and can only be written from an external programmer.
The application software can read the fuses. The fuses are used to configure reset sources such as brownout detector
and watchdog, and startup configuration.
The lock bits are used to set protection levels for the different flash sections (that is, if read and/or write access should
be blocked). Lock bits can be written by external programmers and application software, but only to stricter protection
levels. Chip erase is the only way to erase the lock bits. To ensure that flash contents are protected even during chip
erase, the lock bits are erased after the rest of the flash memory has been erased.
An unprogrammed fuse or lock bit will have the value one, while a programmed fuse or lock bit will have the value
zero.
Both fuses and lock bits are reprogrammable like the flash program memory.
7.5 Data Memory
The data memory contains the I/O memory, internal SRAM, optionally memory mapped EEPROM, and external
memory if available. The data memory is organized as one continuous memory section, see Figure 7-1. To simplify
development, I/O Memory, EEPROM and SRAM will always have the same start addresses for all Atmel AVR
XMEGA devices.
Device Device ID bytes
Byte 2 Byte 1 Byte 0
ATxmega16A4U 41 94 1E
ATxmega32A4U 41 95 1E
ATxmega64A4U 46 96 1E
ATxmega128A4U 46 97 1E
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Figure 7-1. Data memory map (Hexadecimal address).
7.6 EEPROM
All devices have EEPROM for nonvolatile data storage. It is either addressable in a separate data space (default) or
memory mapped and accessed in normal data space. The EEPROM supports both byte and page access. Memory
mapped EEPROM allows highly efficient EEPROM reading and EEPROM buffer loading. When doing this, EEPROM
is accessible using load and store instructions. Memory mapped EEPROM will always start at hexadecimal address
0x1000.
7.7 I/O Memory
The status and configuration registers for peripherals and modules, including the CPU, are addressable through I/O
memory locations. All I/O locations can be accessed by the load (LD/LDS/LDD) and store (ST/STS/STD) instructions,
which are used to transfer data between the 32 registers in the register file and the I/O memory. The IN and OUT
instructions can address I/O memory locations in the range of 0x00 to 0x3F directly. In the address range 0x00 - 0x1F,
single-cycle instructions for manipulation and checking of individual bits are available.
The I/O memory address for all peripherals and modules in XMEGA A4U is shown in the “Peripheral Module Address
Map” on page 61.
7.7.1 General Purpose I/O Registers
The lowest 16 I/O memory addresses are reserved as general purpose I/O registers. These registers can be used for
storing global variables and flags, as they are directly bit-accessible using the SBI, CBI, SBIS, and SBIC instructions.
Byte Address ATxmega64A4U Byte Address ATxmega32A4U Byte Address ATxmega16A4U
0
I/O Registers (4K)
0
I/O Registers (4K)
0
I/O Registers (4K)
FFF FFF FFF
1000
EEPROM (2K)
1000
EEPROM (1K)
1000
EEPROM (1K)
17FF 13FF 13FF
RESERVED RESERVED RESERVED
2000
Internal SRAM (4K)
2000
Internal SRAM (4K)
2000
Internal SRAM (2K)
2FFF 2FFF 27FF
Byte Address ATxmega128A4U
0
I/O Registers (4K)
FFF
1000
EEPROM (2K)
17FF
RESERVED
2000
Internal SRAM (8K)
3FFF
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7.8 Data Memory and Bus Arbitration
Since the data memory is organized as four separate sets of memories, the different bus masters (CPU, DMA
controller read and DMA controller write, etc.) can access different memory sections at the same time.
7.9 Memory Timing
Read and write access to the I/O memory takes one CPU clock cycle. A write to SRAM takes one cycle, and a read
from SRAM takes two cycles. For burst read (DMA), new data are available every cycle. EEPROM page load (write)
takes one cycle, and three cycles are required for read. For burst read, new data are available every second cycle.
Refer to the instruction summary for more details on instructions and instruction timing.
7.10 Device ID and Revision
Each device has a three-byte device ID. This ID identifies Atmel as the manufacturer of the device and the device
type. A separate register contains the revision number of the device.
7.11 I/O Memory Protection
Some features in the device are regarded as critical for safety in some applications. Due to this, it is possible to lock
the I/O register related to the clock system, the event system, and the advanced waveform extensions. As long as the
lock is enabled, all related I/O registers are locked and they can not be written from the application software. The lock
registers themselves are protected by the configuration change protection mechanism.
7.12 Flash and EEPROM Page Size
The flash program memory and EEPROM data memory are organized in pages. The pages are word accessible for
the flash and byte accessible for the EEPROM.
Table 7-3 on page 17 shows the Flash Program Memory organization and Program Counter (PC) size. Flash write
and erase operations are performed on one page at a time, while reading the Flash is done one byte at a time. For
Flash access the Z-pointer (Z[m:n]) is used for addressing. The most significant bits in the address (FPAGE) give the
page number and the least significant address bits (FWORD) give the word in the page.
Table 7-3. Number of words and pages in the flash.
Table 7-4 shows EEPROM memory organization for the Atmel AVR XMEGA A4U devices. EEEPROM write and
erase operations can be performed one page or one byte at a time, while reading the EEPROM is done one byte at a
time. For EEPROM access the NVM address register (ADDR[m:n]) is used for addressing. The most significant bits in
the address (E2PAGE) give the page number and the least significant address bits (E2BYTE) give the byte in the
page.
Devices PC size Flash size Page Size FWORD FPAGE Application Boot
bits bytes words Size No of
pages Size No of
pages
ATxmega16A4U 14 16K + 4K 128 Z[6:0] Z[13:7] 16K 64 4K 16
ATxmega32A4U 15 32K + 4K 128 Z[6:0] Z[14:7] 32K 128 4K 16
ATxmega64A4U 16 64K + 4K 128 Z[6:0] Z[15:7] 64K 256 4K 16
ATxmega128A4U 17 128K + 8K 128 Z[6:0] Z[16:7] 128K 512 8K 32
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Table 7-4. Number of bytes and pages in the EEPROM.
Devices EEPROM Page Size E2BYTE E2PAGE No of Pages
Size bytes
ATxmega16A4U 1K 32 ADDR[4:0] ADDR[10:5] 32
ATxmega32A4U 1K 32 ADDR[4:0] ADDR[10:5] 32
ATxmega64A4U 2K 32 ADDR[4:0] ADDR[10:5] 64
ATxmega128A4U 2K 32 ADDR[4:0] ADDR[10:5] 64
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8. DMAC – Direct Memory Access Controller
8.1 Features
zAllows high speed data transfers with minimal CPU intervention
zfrom data memory to data memory
zfrom data memory to peripheral
zfrom peripheral to data memory
zfrom peripheral to peripheral
zFour DMA channels with separate
ztransfer triggers
zinterrupt vectors
zaddressing modes
zProgrammable channel priority
zFrom 1 byte to 16MB of data in a single transaction
zUp to 64KB block transfers with repeat
z1, 2, 4, or 8 byte burst transfers
zMultiple addressing modes
zStatic
zIncremental
zDecremental
zOptional reload of source and destination addresses at the end of each
zBurst
zBlock
zTransaction
zOptional interrupt on end of transaction
zOptional connection to CRC generator for CRC on DMA data
8.2 Overview
The four-channel direct memory access (DMA) controller can transfer data between memories and peripherals, and
thus offload these tasks from the CPU. It enables high data transfer rates with minimum CPU intervention, and frees
up CPU time. The four DMA channels enable up to four independent and parallel transfers.
The DMA controller can move data between SRAM and peripherals, between SRAM locations and directly between
peripheral registers. With access to all peripherals, the DMA controller can handle automatic transfer of data to/from
communication modules. The DMA controller can also read from memory mapped EEPROM.
Data transfers are done in continuous bursts of 1, 2, 4, or 8 bytes. They build block transfers of configurable size from
1 byte to 64KB. A repeat counter can be used to repeat each block transfer for single transactions up to 16MB. Source
and destination addressing can be static, incremental or decremental. Automatic reload of source and/or destination
addresses can be done after each burst or block transfer, or when a transaction is complete. Application software,
peripherals, and events can trigger DMA transfers.
The four DMA channels have individual configuration and control settings. This include source, destination, transfer
triggers, and transaction sizes. They have individual interrupt settings. Interrupt requests can be generated when a
transaction is complete or when the DMA controller detects an error on a DMA channel.
To allow for continuous transfers, two channels can be interlinked so that the second takes over the transfer when the
first is finished, and vice versa.
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9. Event System
9.1 Features
zSystem for direct peripheral-to-peripheral communication and signaling
zPeripherals can directly send, receive, and react to peripheral events
zCPU and DMA controller independent operation
z100% predictable signal timing
zShort and guaranteed response time
zEight event channels for up to eight different and parallel signal routing configurations
zEvents can be sent and/or used by most peripherals, clock system, and software
zAdditional functions include
zQuadrature decoders
zDigital filtering of I/O pin state
zWorks in active mode and idle sleep mode
9.2 Overview
The event system enables direct peripheral-to-peripheral communication and signaling. It allows a change in one
peripheral’s state to automatically trigger actions in other peripherals. It is designed to provide a predictable system
for short and predictable response times between peripherals. It allows for autonomous peripheral control and
interaction without the use of interrupts, CPU, or DMA controller resources, and is thus a powerful tool for reducing the
complexity, size and execution time of application code. It also allows for synchronized timing of actions in several
peripheral modules.
A change in a peripheral’s state is referred to as an event, and usually corresponds to the peripheral’s interrupt
conditions. Events can be directly passed to other peripherals using a dedicated routing network called the event
routing network. How events are routed and used by the peripherals is configured in software.
Figure 9-1 on page 20 shows a basic diagram of all connected peripherals. The event system can directly connect
together analog and digital converters, analog comparators, I/O port pins, the real-time counter, timer/counters, IR
communication module (IRCOM), and USB interface. It can also be used to trigger DMA transactions (DMA
controller). Events can also be generated from software and the peripheral clock.
Figure 9-1. Event system overview and connected peripherals.
The event routing network consists of eight software-configurable multiplexers that control how events are routed and
used. These are called event channels, and allow for up to eight parallel event routing configurations. The maximum
routing latency is two peripheral clock cycles. The event system works in both active mode and idle sleep mode.
DAC
Timer /
Counters
USB
ADC
Real Time
Counter
Port pins
CPU /
Software
DMA
Controller
IRCOM
Event Routing Network
Event
System
Controller
clk
PER
Prescaler
AC
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10. System Clock and Clock options
10.1 Features
zFast start-up time
zSafe run-time clock switching
zInternal oscillators:
z32MHz run-time calibrated and tuneable oscillator
z2MHz run-time calibrated oscillator
z32.768kHz calibrated oscillator
z32kHz ultra low power (ULP) oscillator with 1kHz output
zExternal clock options
z0.4MHz - 16MHz crystal oscillator
z32.768kHz crystal oscillator
zExternal clock
zPLL with 20MHz - 128MHz output frequency
zInternal and external clock options and 1x to 31x multiplication
zLock detector
zClock prescalers with 1x to 2048x division
zFast peripheral clocks running at two and four times the CPU clock
zAutomatic run-time calibration of internal oscillators
zExternal oscillator and PLL lock failure detection with optional non-maskable interrupt
10.2 Overview
Atmel AVR XMEGA A4U devices have a flexible clock system supporting a large number of clock sources. It
incorporates both accurate internal oscillators and external crystal oscillator and resonator support. A high-frequency
phase locked loop (PLL) and clock prescalers can be used to generate a wide range of clock frequencies. A
calibration feature (DFLL) is available, and can be used for automatic run-time calibration of the internal oscillators to
remove frequency drift over voltage and temperature. An oscillator failure monitor can be enabled to issue a non-
maskable interrupt and switch to the internal oscillator if the external oscillator or PLL fails.
When a reset occurs, all clock sources except the 32kHz ultra low power oscillator are disabled. After reset, the
device will always start up running from the 2MHz internal oscillator. During normal operation, the system clock
source and prescalers can be changed from software at any time.
Figure 10-1 on page 22 presents the principal clock system in the XMEGA A4U family of devices. Not all of the clocks
need to be active at a given time. The clocks for the CPU and peripherals can be stopped using sleep modes and
power reduction registers, as described in “Power Management and Sleep Modes” on page 24.
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Figure 10-1. The clock system, clock sources and clock distribution.
10.3 Clock Sources
The clock sources are divided in two main groups: internal oscillators and external clock sources. Most of the clock
sources can be directly enabled and disabled from software, while others are automatically enabled or disabled,
depending on peripheral settings. After reset, the device starts up running from the 2MHz internal oscillator. The other
clock sources, DFLLs and PLL, are turned off by default.
The internal oscillators do not require any external components to run. For details on characteristics and accuracy of
the internal oscillators, refer to the device datasheet.
10.3.1 32kHz Ultra Low Power Internal Oscillator
This oscillator provides an approximate 32kHz clock. The 32kHz ultra low power (ULP) internal oscillator is a very low
power clock source, and it is not designed for high accuracy. The oscillator employs a built-in prescaler that provides
Real Time
Counter Peripherals RAM AVR CPU Non-Volatile
Memory
Watchdog
Timer
Brown-out
Detector
System Clock Prescalers
USB
Prescaler
System Clock Multiplexer
(SCLKSEL)
PLLSRC
RTCSRC
DIV32
32 kHz
Int. ULP
32.768 kHz
Int. OSC
32.768 kHz
TOSC
2 MHz
Int. Osc
32 MHz
Int. Osc
0.4 – 16 MHz
XTAL
DIV32
DIV32
DIV4
XOSCSEL
PLL
USBSRC
TOSC1
TOSC2
XTAL1
XTAL2
clk
SYS
clk
RTC
clk
PER2
clk
PER
clk
CPU
clk
PER4
clk
USB
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a 1kHz output. The oscillator is automatically enabled/disabled when it is used as clock source for any part of the
device. This oscillator can be selected as the clock source for the RTC.
10.3.2 32.768kHz Calibrated Internal Oscillator
This oscillator provides an approximate 32.768kHz clock. It is calibrated during production to provide a default
frequency close to its nominal frequency. The calibration register can also be written from software for run-time
calibration of the oscillator frequency. The oscillator employs a built-in prescaler, which provides both a 32.768kHz
output and a 1.024kHz output.
10.3.3 32.768kHz Crystal Oscillator
A 32.768kHz crystal oscillator can be connected between the TOSC1 and TOSC2 pins and enables a dedicated low
frequency oscillator input circuit. A low power mode with reduced voltage swing on TOSC2 is available. This oscillator
can be used as a clock source for the system clock and RTC, and as the DFLL reference clock.
10.3.4 0.4 - 16MHz Crystal Oscillator
This oscillator can operate in four different modes optimized for different frequency ranges, all within 0.4 - 16MHz.
10.3.5 2MHz Run-time Calibrated Internal Oscillator
The 2MHz run-time calibrated internal oscillator is the default system clock source after reset. It is calibrated during
production to provide a default frequency close to its nominal frequency. A DFLL can be enabled for automatic run-
time calibration of the oscillator to compensate for temperature and voltage drift and optimize the oscillator accuracy.
10.3.6 32MHz Run-time Calibrated Internal Oscillator
The 32MHz run-time calibrated internal oscillator is a high-frequency oscillator. It is calibrated during production to
provide a default frequency close to its nominal frequency. A digital frequency looked loop (DFLL) can be enabled for
automatic run-time calibration of the oscillator to compensate for temperature and voltage drift and optimize the
oscillator accuracy. This oscillator can also be adjusted and calibrated to any frequency between 30MHz and 55MHz.
The production signature row contains 48MHz calibration values intended used when the oscillator is used a full-
speed USB clock source.
10.3.7 External Clock Sources
The XTAL1 and XTAL2 pins can be used to drive an external oscillator, either a quartz crystal or a ceramic resonator.
XTAL1 can be used as input for an external clock signal. The TOSC1 and TOSC2 pins is dedicated to driving a
32.768kHz crystal oscillator.
10.3.8 PLL with 1x-31x Multiplication Factor
The built-in phase locked loop (PLL) can be used to generate a high-frequency system clock. The PLL has a user-
selectable multiplication factor of from 1 to 31. In combination with the prescalers, this gives a wide range of output
frequencies from all clock sources.
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11. Power Management and Sleep Modes
11.1 Features
zPower management for adjusting power consumption and functions
zFive sleep modes
zIdle
zPower down
zPower save
zStandby
zExtended standby
zPower reduction register to disable clock and turn off unused peripherals in active and idle modes
11.2 Overview
Various sleep modes and clock gating are provided in order to tailor power consumption to application requirements.
This enables the Atmel AVR XMEGA microcontroller to stop unused modules to save power.
All sleep modes are available and can be entered from active mode. In active mode, the CPU is executing application
code. When the device enters sleep mode, program execution is stopped and interrupts or a reset is used to wake the
device again. The application code decides which sleep mode to enter and when. Interrupts from enabled peripherals
and all enabled reset sources can restore the microcontroller from sleep to active mode.
In addition, power reduction registers provide a method to stop the clock to individual peripherals from software. When
this is done, the current state of the peripheral is frozen, and there is no power consumption from that peripheral. This
reduces the power consumption in active mode and idle sleep modes and enables much more fine-tuned power
management than sleep modes alone.
11.3 Sleep Modes
Sleep modes are used to shut down modules and clock domains in the microcontroller in order to save power.
XMEGA microcontrollers have five different sleep modes tuned to match the typical functional stages during
application execution. A dedicated sleep instruction (SLEEP) is available to enter sleep mode. Interrupts are used to
wake the device from sleep, and the available interrupt wake-up sources are dependent on the configured sleep
mode. When an enabled interrupt occurs, the device will wake up and execute the interrupt service routine before
continuing normal program execution from the first instruction after the SLEEP instruction. If other, higher priority
interrupts are pending when the wake-up occurs, their interrupt service routines will be executed according to their
priority before the interrupt service routine for the wake-up interrupt is executed. After wake-up, the CPU is halted for
four cycles before execution starts.
The content of the register file, SRAM and registers are kept during sleep. If a reset occurs during sleep, the device
will reset, start up, and execute from the reset vector.
11.3.1 Idle Mode
In idle mode the CPU and nonvolatile memory are stopped (note that any ongoing programming will be completed),
but all peripherals, including the interrupt controller, event system and DMA controller are kept running. Any enabled
interrupt will wake the device.
11.3.2 Power-down Mode
In power-down mode, all clocks, including the real-time counter clock source, are stopped. This allows operation only
of asynchronous modules that do not require a running clock. The only interrupts that can wake up the MCU are the
two-wire interface address match interrupt, asynchronous port interrupts, and the USB resume interrupt.
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11.3.3 Power-save Mode
Power-save mode is identical to power down, with one exception. If the real-time counter (RTC) is enabled, it will keep
running during sleep, and the device can also wake up from either an RTC overflow or compare match interrupt.
11.3.4 Standby Mode
Standby mode is identical to power down, with the exception that the enabled system clock sources are kept running
while the CPU, peripheral, and RTC clocks are stopped. This reduces the wake-up time.
11.3.5 Extended Standby Mode
Extended standby mode is identical to power-save mode, with the exception that the enabled system clock sources
are kept running while the CPU and peripheral clocks are stopped. This reduces the wake-up time.
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12. System Control and Reset
12.1 Features
zReset the microcontroller and set it to initial state when a reset source goes active
zMultiple reset sources that cover different situations
zPower-on reset
zExternal reset
zWatchdog reset
zBrownout reset
zPDI reset
zSoftware reset
zAsynchronous operation
zNo running system clock in the device is required for reset
zReset status register for reading the reset source from the application code
12.2 Overview
The reset system issues a microcontroller reset and sets the device to its initial state. This is for situations where
operation should not start or continue, such as when the microcontroller operates below its power supply rating. If a
reset source goes active, the device enters and is kept in reset until all reset sources have released their reset. The
I/O pins are immediately tri-stated. The program counter is set to the reset vector location, and all I/O registers are set
to their initial values. The SRAM content is kept. However, if the device accesses the SRAM when a reset occurs, the
content of the accessed location can not be guaranteed.
After reset is released from all reset sources, the default oscillator is started and calibrated before the device starts
running from the reset vector address. By default, this is the lowest program memory address, 0, but it is possible to
move the reset vector to the lowest address in the boot section.
The reset functionality is asynchronous, and so no running system clock is required to reset the device. The software
reset feature makes it possible to issue a controlled system reset from the user software.
The reset status register has individual status flags for each reset source. It is cleared at power-on reset, and shows
which sources have issued a reset since the last power-on.
12.3 Reset Sequence
A reset request from any reset source will immediately reset the device and keep it in reset as long as the request is
active. When all reset requests are released, the device will go through three stages before the device starts running
again:
zReset counter delay
zOscillator startup
zOscillator calibration
If another reset requests occurs during this process, the reset sequence will start over again.
12.4 Reset Sources
12.4.1 Power-on Reset
A power-on reset (POR) is generated by an on-chip detection circuit. The POR is activated when the VCC rises and
reaches the POR threshold voltage (VPOT), and this will start the reset sequence.
The POR is also activated to power down the device properly when the VCC falls and drops below the VPOT level.
The VPOT level is higher for falling VCC than for rising VCC. Consult the datasheet for POR characteristics data.
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12.4.2 Brownout Detection
The on-chip brownout detection (BOD) circuit monitors the VCC level during operation by comparing it to a fixed,
programmable level that is selected by the BODLEVEL fuses. If disabled, BOD is forced on at the lowest level during
chip erase and when the PDI is enabled.
12.4.3 External Reset
The external reset circuit is connected to the external RESET pin. The external reset will trigger when the RESET pin
is driven below the RESET pin threshold voltage, VRST, for longer than the minimum pulse period, tEXT. The reset will
be held as long as the pin is kept low. The RESET pin includes an internal pull-up resistor.
12.4.4 Watchdog Reset
The watchdog timer (WDT) is a system function for monitoring correct program operation. If the WDT is not reset from
the software within a programmable timeout period, a watchdog reset will be given. The watchdog reset is active for
one to two clock cycles of the 2MHz internal oscillator. For more details see “WDT – Watchdog Timer” on page 28.
12.4.5 Software Reset
The software reset makes it possible to issue a system reset from software by writing to the software reset bit in the
reset control register.The reset will be issued within two CPU clock cycles after writing the bit. It is not possible to
execute any instruction from when a software reset is requested until it is issued.
12.4.6 Program and Debug Interface Reset
The program and debug interface reset contains a separate reset source that is used to reset the device during
external programming and debugging. This reset source is accessible only from external debuggers and
programmers.
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13. WDT – Watchdog Timer
13.1 Features
zIssues a device reset if the timer is not reset before its timeout period
zAsynchronous operation from dedicated oscillator
z1kHz output of the 32kHz ultra low power oscillator
z11 selectable timeout periods, from 8ms to 8s
zTwo operation modes:
zNormal mode
zWindow mode
zConfiguration lock to prevent unwanted changes
13.2 Overview
The watchdog timer (WDT) is a system function for monitoring correct program operation. It makes it possible to
recover from error situations such as runaway or deadlocked code. The WDT is a timer, configured to a predefined
timeout period, and is constantly running when enabled. If the WDT is not reset within the timeout period, it will issue
a microcontroller reset. The WDT is reset by executing the WDR (watchdog timer reset) instruction from the
application code.
The window mode makes it possible to define a time slot or window inside the total timeout period during which WDT
must be reset. If the WDT is reset outside this window, either too early or too late, a system reset will be issued.
Compared to the normal mode, this can also catch situations where a code error causes constant WDR execution.
The WDT will run in active mode and all sleep modes, if enabled. It is asynchronous, runs from a CPU-independent
clock source, and will continue to operate to issue a system reset even if the main clocks fail.
The configuration change protection mechanism ensures that the WDT settings cannot be changed by accident. For
increased safety, a fuse for locking the WDT settings is also available.
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14. Interrupts and Programmable Multilevel Interrupt Controller
14.1 Features
zShort and predictable interrupt response time
zSeparate interrupt configuration and vector address for each interrupt
zProgrammable multilevel interrupt controller
zInterrupt prioritizing according to level and vector address
zThree selectable interrupt levels for all interrupts: low, medium and high
zSelectable, round-robin priority scheme within low-level interrupts
zNon-maskable interrupts for critical functions
zInterrupt vectors optionally placed in the application section or the boot loader section
14.2 Overview
Interrupts signal a change of state in peripherals, and this can be used to alter program execution. Peripherals can
have one or more interrupts, and all are individually enabled and configured. When an interrupt is enabled and
configured, it will generate an interrupt request when the interrupt condition is present. The programmable multilevel
interrupt controller (PMIC) controls the handling and prioritizing of interrupt requests. When an interrupt request is
acknowledged by the PMIC, the program counter is set to point to the interrupt vector, and the interrupt handler can
be executed.
All peripherals can select between three different priority levels for their interrupts: low, medium, and high. Interrupts
are prioritized according to their level and their interrupt vector address. Medium-level interrupts will interrupt low-level
interrupt handlers. High-level interrupts will interrupt both medium- and low-level interrupt handlers. Within each level,
the interrupt priority is decided from the interrupt vector address, where the lowest interrupt vector address has the
highest interrupt priority. Low-level interrupts have an optional round-robin scheduling scheme to ensure that all
interrupts are serviced within a certain amount of time.
Non-maskable interrupts (NMI) are also supported, and can be used for system critical functions.
14.3 Interrupt vectors
The interrupt vector is the sum of the peripheral’s base interrupt address and the offset address for specific interrupts
in each peripheral. The base addresses for the Atmel AVR XMEGA A4U devices are shown in Table 14-1 on page 30.
Offset addresses for each interrupt available in the peripheral are described for each peripheral in the XMEGA AU
manual. For peripherals or modules that have only one interrupt, the interrupt vector is shown in Table 14-1 on page
30. The program address is the word address.
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Table 14-1. Reset and interrupt vectors
Program address
(base address) Source Interrupt description
0x000 RESET
0x002 OSCF_INT_vect Crystal oscillator failure interrupt vector (NMI)
0x004 PORTC_INT_base Port C interrupt base
0x008 PORTR_INT_base Port R interrupt base
0x00C DMA_INT_base DMA controller interrupt base
0x014 RTC_INT_base Real time counter interrupt base
0x018 TWIC_INT_base Two-Wire Interface on Port C interrupt base
0x01C TCC0_INT_base Timer/counter 0 on port C interrupt base
0x028 TCC1_INT_base Timer/counter 1 on port C interrupt base
0x030 SPIC_INT_vect SPI on port C interrupt vector
0x032 USARTC0_INT_base USART 0 on port C interrupt base
0x038 USARTC1_INT_base USART 1 on port C interrupt base
0x03E AES_INT_vect AES interrupt vector
0x040 NVM_INT_base Nonvolatile Memory interrupt base
0x044 PORTB_INT_base Port B interrupt base
0x056 PORTE_INT_base Port E interrupt base
0x05A TWIE_INT_base Two-wire Interface on Port E interrupt base
0x05E TCE0_INT_base Timer/counter 0 on port E interrupt base
0x06A TCE1_INT_base Timer/counter 1 on port E interrupt base
0x074 USARTE0_INT_base USART 0 on port E interrupt base
0x080 PORTD_INT_base Port D interrupt base
0x084 PORTA_INT_base Port A interrupt base
0x088 ACA_INT_base Analog Comparator on Port A interrupt base
0x08E ADCA_INT_base Analog to Digital Converter on Port A interrupt base
0x09A TCD0_INT_base Timer/counter 0 on port D interrupt base
0x0A6 TCD1_INT_base Timer/counter 1 on port D interrupt base
0x0AE SPID_INT_vector SPI on port D interrupt vector
0x0B0 USARTD0_INT_base USART 0 on port D interrupt base
0x0B6 USARTD1_INT_base USART 1 on port D interrupt base
0x0FA USB_INT_base USB on port D interrupt base
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15. I/O Ports
15.1 Features
z34 general purpose input and output pins with individual configuration
zOutput driver with configurable driver and pull settings:
zTotem-pole
zWired-AND
zWired-OR
zBus-keeper
zInverted I/O
zInput with synchronous and/or asynchronous sensing with interrupts and events
zSense both edges
zSense rising edges
zSense falling edges
zSense low level
zOptional pull-up and pull-down resistor on input and Wired-OR/AND configurations
zOptional slew rate control
zAsynchronous pin change sensing that can wake the device from all sleep modes
zTwo port interrupts with pin masking per I/O port
zEfficient and safe access to port pins
zHardware read-modify-write through dedicated toggle/clear/set registers
zConfiguration of multiple pins in a single operation
zMapping of port registers into bit-accessible I/O memory space
zPeripheral clocks output on port pin
zReal-time counter clock output to port pin
zEvent channels can be output on port pin
zRemapping of digital peripheral pin functions
zSelectable USART, SPI, and timer/counter input/output pin locations
15.2 Overview
One port consists of up to eight port pins: pin 0 to 7. Each port pin can be configured as input or output with
configurable driver and pull settings. They also implement synchronous and asynchronous input sensing with
interrupts and events for selectable pin change conditions. Asynchronous pin-change sensing means that a pin
change can wake the device from all sleep modes, included the modes where no clocks are running.
All functions are individual and configurable per pin, but several pins can be configured in a single operation. The pins
have hardware read-modify-write (RMW) functionality for safe and correct change of drive value and/or pull resistor
configuration. The direction of one port pin can be changed without unintentionally changing the direction of any other
pin.
The port pin configuration also controls input and output selection of other device functions. It is possible to have both
the peripheral clock and the real-time clock output to a port pin, and available for external use. The same applies to
events from the event system that can be used to synchronize and control external functions. Other digital
peripherals, such as USART, SPI, and timer/counters, can be remapped to selectable pin locations in order to
optimize pin-out versus application needs.
The notation of the ports are PORTA, PORTB, PORTC, PORTD, PORTE, and PORTR.
15.3 Output Driver
All port pins (Pn) have programmable output configuration. The port pins also have configurable slew rate limitation to
reduce electromagnetic emission.
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15.3.1 Push-pull
Figure 15-1. I/O configuration - Totem-pole.
15.3.2 Pull-down
Figure 15-2. I/O configuration - Totem-pole with pull-down (on input).
15.3.3 Pull-up
Figure 15-3. I/O configuration - Totem-pole with pull-up (on input).
15.3.4 Bus-keeper
The bus-keeper’s weak output produces the same logical level as the last output level. It acts as a pull-up if the last
level was ‘1’, and pull-down if the last level was ‘0’.
INn
OUTn
DIRn
Pn
INn
OUTn
DIRn
Pn
INn
OUTn
DIRn
Pn
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Figure 15-4. I/O configuration - Totem-pole with bus-keeper.
15.3.5 Others
Figure 15-5. Output configuration - Wired-OR with optional pull-down.
Figure 15-6. I/O configuration - Wired-AND with optional pull-up.
INn
OUTn
DIRn
Pn
INn
OUTn
Pn
INn
OUTn
Pn
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15.4 Input sensing
Input sensing is synchronous or asynchronous depending on the enabled clock for the ports, and the configuration is
shown in Figure 15-7.
Figure 15-7. Input sensing system overview.
When a pin is configured with inverted I/O, the pin value is inverted before the input sensing.
15.5 Alternate Port Functions
Most port pins have alternate pin functions in addition to being a general purpose I/O pin. When an alternate function
is enabled, it might override the normal port pin function or pin value. This happens when other peripherals that
require pins are enabled or configured to use pins. If and how a peripheral will override and use pins is described in
the section for that peripheral. “Pinout and Pin Functions” on page 55 shows which modules on peripherals that
enable alternate functions on a pin, and which alternate functions that are available on a pin.
INVERTED I/O
Interrupt
Control IREQ
Event
Pn
DQ
R
DQ
R
Synchronizer
INn
EDGE
DETECT
Asynchronous sensing
Synchronous sensing
EDGE
DETECT
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16. TC0/1 – 16-bit Timer/Counter Type 0 and 1
16.1 Features
zFive 16-bit timer/counters
zThree timer/counters of type 0
zTwo timer/counters of type 1
zSplit-mode enabling two 8-bit timer/counter from each timer/counter type 0
z32-bit timer/counter support by cascading two timer/counters
zUp to four compare or capture (CC) channels
zFour CC channels for timer/counters of type 0
zTwo CC channels for timer/counters of type 1
zDouble buffered timer period setting
zDouble buffered capture or compare channels
zWaveform generation:
zFrequency generation
zSingle-slope pulse width modulation
zDual-slope pulse width modulation
zInput capture:
zInput capture with noise cancelling
zFrequency capture
zPulse width capture
z32-bit input capture
zTimer overflow and error interrupts/events
zOne compare match or input capture interrupt/event per CC channel
zCan be used with event system for:
zQuadrature decoding
zCount and direction control
zCapture
zCan be used with DMA and to trigger DMA transactions
zHigh-resolution extension
zIncreases frequency and waveform resolution by 4x (2-bit) or 8x (3-bit)
zAdvanced waveform extension:
zLow- and high-side output with programmable dead-time insertion (DTI)
zEvent controlled fault protection for safe disabling of drivers
16.2 Overview
Atmel AVR XMEGA devices have a set of five flexible 16-bit Timer/Counters (TC). Their capabilities include accurate
program execution timing, frequency and waveform generation, and input capture with time and frequency
measurement of digital signals. Two timer/counters can be cascaded to create a 32-bit timer/counter with optional 32-
bit capture.
A timer/counter consists of a base counter and a set of compare or capture (CC) channels. The base counter can be
used to count clock cycles or events. It has direction control and period setting that can be used for timing. The CC
channels can be used together with the base counter to do compare match control, frequency generation, and pulse
width waveform modulation, as well as various input capture operations. A timer/counter can be configured for either
capture or compare functions, but cannot perform both at the same time.
A timer/counter can be clocked and timed from the peripheral clock with optional prescaling or from the event system.
The event system can also be used for direction control and capture trigger or to synchronize operations.
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There are two differences between timer/counter type 0 and type 1. Timer/counter 0 has four CC channels, and
timer/counter 1 has two CC channels. All information related to CC channels 3 and 4 is valid only for timer/counter 0.
Only Timer/Counter 0 has the split mode feature that split it into two 8-bit Timer/Counters with four compare channels
each.
Some timer/counters have extensions to enable more specialized waveform and frequency generation. The advanced
waveform extension (AWeX) is intended for motor control and other power control applications. It enables low- and
high-side output with dead-time insertion, as well as fault protection for disabling and shutting down external drivers. It
can also generate a synchronized bit pattern across the port pins.
The advanced waveform extension can be enabled to provide extra and more advanced features for the
Timer/Counter. This are only available for Timer/Counter 0. See “AWeX – Advanced Waveform Extension” on page
38 for more details.
The high-resolution (hi-res) extension can be used to increase the waveform output resolution by four or eight times
by using an internal clock source running up to four times faster than the peripheral clock. See “Hi-Res – High
Resolution Extension” on page 39 for more details.
Figure 16-1. Overview of a Timer/Counter and closely related peripherals.
PORTC and PORTD each has one Timer/Counter 0 and one Timer/Counter1. PORTE has one Timer/Conter0.
Notation of these are TCC0 (Time/Counter C0), TCC1, TCD0, TCD1 and TCE0, respectively.
AWeX
Compare/Capture Channel D
Compare/Capture Channel C
Compare/Capture Channel B
Compare/Capture Channel A
Waveform
Generation
Buffer
Comparator
Hi-Res
Fault
Protection
Capture
Control
Base Counter
Counter
Control Logic
Timer Period
Prescaler
Dead-Time
Insertion
Pattern
Generation
clkPER4
PORT
Event
System
clkPER
Timer/Counter
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17. TC2 - Timer/Counter Type 2
17.1 Features
zSix eight-bit timer/counters
zThree Low-byte timer/counter
zThree High-byte timer/counter
zUp to eight compare channels in each Timer/Counter 2
zFour compare channels for the low-byte timer/counter
zFour compare channels for the high-byte timer/counter
zWaveform generation
zSingle slope pulse width modulation
zTimer underflow interrupts/events
zOne compare match interrupt/event per compare channel for the low-byte timer/counter
zCan be used with the event system for count control
zCan be used to trigger DMA transactions
17.2 Overview
There are four Timer/Counter 2. These are realized when a Timer/Counter 0 is set in split mode. It is then a system of
two eight-bit timer/counters, each with four compare channels. This results in eight configurable pulse width
modulation (PWM) channels with individually controlled duty cycles, and is intended for applications that require a
high number of PWM channels.
The two eight-bit timer/counters in this system are referred to as the low-byte timer/counter and high-byte
timer/counter, respectively. The difference between them is that only the low-byte timer/counter can be used to
generate compare match interrupts, events and DMA triggers. The two eight-bit timer/counters have a shared clock
source and separate period and compare settings. They can be clocked and timed from the peripheral clock, with
optional prescaling, or from the event system. The counters are always counting down.
PORTC, and PORTD each has one Timer/Counter 2.
Notation of these are TCC2 (Time/Counter C2) and TCD2, respectively.
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18. AWeX – Advanced Waveform Extension
18.1 Features
zWaveform output with complementary output from each compare channel
zFour dead-time insertion (DTI) units
z8-bit resolution
zSeparate high and low side dead-time setting
zDouble buffered dead time
zOptionally halts timer during dead-time insertion
zPattern generation unit creating synchronised bit pattern across the port pins
zDouble buffered pattern generation
zOptional distribution of one compare channel output across the port pins
zEvent controlled fault protection for instant and predictable fault triggering
18.2 Overview
The advanced waveform extension (AWeX) provides extra functions to the timer/counter in waveform generation
(WG) modes. It is primarily intended for use with different types of motor control and other power control applications.
It enables low- and high side output with dead-time insertion and fault protection for disabling and shutting down
external drivers. It can also generate a synchronized bit pattern across the port pins.
Each of the waveform generator outputs from the timer/counter 0 are split into a complimentary pair of outputs when
any AWeX features are enabled. These output pairs go through a dead-time insertion (DTI) unit that generates the
non-inverted low side (LS) and inverted high side (HS) of the WG output with dead-time insertion between LS and HS
switching. The DTI output will override the normal port value according to the port override setting.
The pattern generation unit can be used to generate a synchronized bit pattern on the port it is connected to. In
addition, the WG output from compare channel A can be distributed to and override all the port pins. When the pattern
generator unit is enabled, the DTI unit is bypassed.
The fault protection unit is connected to the event system, enabling any event to trigger a fault condition that will
disable the AWeX output. The event system ensures predictable and instant fault reaction, and gives flexibility in the
selection of fault triggers.
The AWeX is available for TCC0. The notation of this is AWEXC.
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19. Hi-Res – High Resolution Extension
19.1 Features
zIncreases waveform generator resolution up to 8x (three bits)
zSupports frequency, single-slope PWM, and dual-slope PWM generation
zSupports the AWeX when this is used for the same timer/counter
19.2 Overview
The high-resolution (hi-res) extension can be used to increase the resolution of the waveform generation output from
a timer/counter by four or eight. It can be used for a timer/counter doing frequency, single-slope PWM, or dual-slope
PWM generation. It can also be used with the AWeX if this is used for the same timer/counter.
The hi-res extension uses the peripheral 4x clock (ClkPER4). The system clock prescalers must be configured so the
peripheral 4x clock frequency is four times higher than the peripheral and CPU clock frequency when the hi-res
extension is enabled.
There are three hi-res extensions that each can be enabled for each timer/counters pair on PORTC, PORTD and
PORTE. The notation of these are HIRESC, HIRESD and HIRESE, respectively.
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20. RTC – 16-bit Real-Time Counter
20.1 Features
z16-bit resolution
zSelectable clock source
z32.768kHz external crystal
zExternal clock
z32.768kHz internal oscillator
z32kHz internal ULP oscillator
zProgrammable 10-bit clock prescaling
zOne compare register
zOne period register
zClear counter on period overflow
zOptional interrupt/event on overflow and compare match
20.2 Overview
The 16-bit real-time counter (RTC) is a counter that typically runs continuously, including in low-power sleep modes,
to keep track of time. It can wake up the device from sleep modes and/or interrupt the device at regular intervals.
The reference clock is typically the 1.024kHz output from a high-accuracy crystal of 32.768kHz, and this is the
configuration most optimized for low power consumption. The faster 32.768kHz output can be selected if the RTC
needs a resolution higher than 1ms. The RTC can also be clocked from an external clock signal, the 32.768kHz
internal oscillator or the 32kHz internal ULP oscillator.
The RTC includes a 10-bit programmable prescaler that can scale down the reference clock before it reaches the
counter. A wide range of resolutions and time-out periods can be configured. With a 32.768kHz clock source, the
maximum resolution is 30.5µs, and time-out periods can range up to 2000 seconds. With a resolution of 1s, the
maximum timeout period is more than18 hours (65536 seconds). The RTC can give a compare interrupt and/or event
when the counter equals the compare register value, and an overflow interrupt and/or event when it equals the period
register value.
Figure 20-1. Real-time counter overview.
32.768kHz Crystal Osc
32.768kHz Int. Osc
TOSC1
TOSC2
External Clock
DIV32
DIV32
32kHz int ULP (DIV32)
RTCSRC
10-bit
prescaler
clkRTC
CNT
PER
COMP
=
=
”match”/
Compare
TOP/
Overflow
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21. USB – Universal Serial Bus Interface
21.1 Features
zOne USB 2.0 full speed (12Mbps) and low speed (1.5Mbps) device compliant interface
zIntegrated on-chip USB transceiver, no external components needed
z16 endpoint addresses with full endpoint flexibility for up to 31 endpoints
zOne input endpoint per endpoint address
zOne output endpoint per endpoint address
zEndpoint address transfer type selectable to
zControl transfers
zInterrupt transfers
zBulk transfers
zIsochronous transfers
zConfigurable data payload size per endpoint, up to 1023 bytes
zEndpoint configuration and data buffers located in internal SRAM
zConfigurable location for endpoint configuration data
zConfigurable location for each endpoint's data buffer
zBuilt-in direct memory access (DMA) to internal SRAM for:
zEndpoint configurations
zReading and writing endpoint data
zPing-pong operation for higher throughput and double buffered operation
zInput and output endpoint data buffers used in a single direction
zCPU/DMA controller can update data buffer during transfer
zMultipacket transfer for reduced interrupt load and software intervention
zData payload exceeding maximum packet size is transferred in one continuous transfer
zNo interrupts or software interaction on packet transaction level
zTransaction complete FIFO for workflow management when using multiple endpoints
zTracks all completed transactions in a first-come, first-served work queue
zClock selection independent of system clock source and selection
zMinimum 1.5MHz CPU clock required for low speed USB operation
zMinimum 12MHz CPU clock required for full speed operation
zConnection to event system
zOn chip debug possibilities during USB transactions
21.2 Overview
The USB module is a USB 2.0 full speed (12Mbps) and low speed (1.5Mbps) device compliant interface.
The USB supports 16 endpoint addresses. All endpoint addresses have one input and one output endpoint, for a total
of 31 configurable endpoints and one control endpoint. Each endpoint address is fully configurable and can be
configured for any of the four transfer types; control, interrupt, bulk, or isochronous. The data payload size is also
selectable, and it supports data payloads up to 1023 bytes.
No dedicated memory is allocated for or included in the USB module. Internal SRAM is used to keep the configuration
for each endpoint address and the data buffer for each endpoint. The memory locations used for endpoint
configurations and data buffers are fully configurable. The amount of memory allocated is fully dynamic, according to
the number of endpoints in use and the configuration of these. The USB module has built-in direct memory access
(DMA), and will read/write data from/to the SRAM when a USB transaction takes place.
To maximize throughput, an endpoint address can be configured for ping-pong operation. When done, the input and
output endpoints are both used in the same direction. The CPU or DMA controller can then read/write one data buffer
while the USB module writes/reads the others, and vice versa. This gives double buffered communication.
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Multipacket transfer enables a data payload exceeding the maximum packet size of an endpoint to be transferred as
multiple packets without software intervention. This reduces the CPU intervention and the interrupts needed for USB
transfers.
For low-power operation, the USB module can put the microcontroller into any sleep mode when the USB bus is idle
and a suspend condition is given. Upon bus resumes, the USB module can wake up the microcontroller from any
sleep mode.
PORTD has one USB. Notation of this is USB.
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22. TWI – Two-Wire Interface
22.1 Features
zTwo Identical two-wire interface peripherals
zBidirectional, two-wire communication interface
zPhillips I2C compatible
zSystem Management Bus (SMBus) compatible
zBus master and slave operation supported
zSlave operation
zSingle bus master operation
zBus master in multi-master bus environment
zMulti-master arbitration
zFlexible slave address match functions
z7-bit and general call address recognition in hardware
z10-bit addressing supported
zAddress mask register for dual address match or address range masking
zOptional software address recognition for unlimited number of addresses
zSlave can operate in all sleep modes, including power-down
zSlave address match can wake device from all sleep modes
z100kHz and 400kHz bus frequency support
zSlew-rate limited output drivers
zInput filter for bus noise and spike suppression
zSupport arbitration between start/repeated start and data bit (SMBus)
zSlave arbitration allows support for address resolve protocol (ARP) (SMBus)
22.2 Overview
The two-wire interface (TWI) is a bidirectional, two-wire communication interface. It is I2C and System Management
Bus (SMBus) compatible. The only external hardware needed to implement the bus is one pull-up resistor on each
bus line.
A device connected to the bus must act as a master or a slave. The master initiates a data transaction by addressing
a slave on the bus and telling whether it wants to transmit or receive data. One bus can have many slaves and one or
several masters that can take control of the bus. An arbitration process handles priority if more than one master tries
to transmit data at the same time. Mechanisms for resolving bus contention are inherent in the protocol.
The TWI module supports master and slave functionality. The master and slave functionality are separated from each
other, and can be enabled and configured separately. The master module supports multi-master bus operation and
arbitration. It contains the baud rate generator. Both 100kHz and 400kHz bus frequency is supported. Quick
command and smart mode can be enabled to auto-trigger operations and reduce software complexity.
The slave module implements 7-bit address match and general address call recognition in hardware. 10-bit
addressing is also supported. A dedicated address mask register can act as a second address match register or as a
register for address range masking. The slave continues to operate in all sleep modes, including power-down mode.
This enables the slave to wake up the device from all sleep modes on TWI address match. It is possible to disable the
address matching to let this be handled in software instead.
The TWI module will detect START and STOP conditions, bus collisions, and bus errors. Arbitration lost, errors,
collision, and clock hold on the bus are also detected and indicated in separate status flags available in both master
and slave modes.
It is possible to disable the TWI drivers in the device, and enable a four-wire digital interface for connecting to an
external TWI bus driver. This can be used for applications where the device operates from a different VCC voltage than
used by the TWI bus.
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PORTC and PORTE each has one TWI. Notation of these peripherals are TWIC and TWIE.
23. SPI – Serial Peripheral Interface
23.1 Features
zTwo Identical SPI peripherals
zFull-duplex, three-wire synchronous data transfer
zMaster or slave operation
zLsb first or msb first data transfer
zEight programmable bit rates
zInterrupt flag at the end of transmission
zWrite collision flag to indicate data collision
zWake up from idle sleep mode
zDouble speed master mode
23.2 Overview
The Serial Peripheral Interface (SPI) is a high-speed synchronous data transfer interface using three or four pins. It
allows fast communication between an Atmel AVR XMEGA device and peripheral devices or between several
microcontrollers. The SPI supports full-duplex communication.
A device connected to the bus must act as a master or slave. The master initiates and controls all data transactions.
PORTC and PORTD each has one SPI. Notation of these peripherals are SPIC and SPID.
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24. USART
24.1 Features
zFive identical USART peripherals
zFull-duplex operation
zAsynchronous or synchronous operation
zSynchronous clock rates up to 1/2 of the device clock frequency
zAsynchronous clock rates up to 1/8 of the device clock frequency
zSupports serial frames with 5, 6, 7, 8, or 9 data bits and 1 or 2 stop bits
zFractional baud rate generator
zCan generate desired baud rate from any system clock frequency
zNo need for external oscillator with certain frequencies
zBuilt-in error detection and correction schemes
zOdd or even parity generation and parity check
zData overrun and framing error detection
zNoise filtering includes false start bit detection and digital low-pass filter
zSeparate interrupts for
zTransmit complete
zTransmit data register empty
zReceive complete
zMultiprocessor communication mode
zAddressing scheme to address a specific devices on a multidevice bus
zEnable unaddressed devices to automatically ignore all frames
zMaster SPI mode
zDouble buffered operation
zOperation up to 1/2 of the peripheral clock frequency
zIRCOM module for IrDA compliant pulse modulation/demodulation
24.2 Overview
The universal synchronous and asynchronous serial receiver and transmitter (USART) is a fast and flexible serial
communication module. The USART supports full-duplex communication and asynchronous and synchronous
operation. The USART can be configured to operate in SPI master mode and used for SPI communication.
Communication is frame based, and the frame format can be customized to support a wide range of standards. The
USART is buffered in both directions, enabling continued data transmission without any delay between frames.
Separate interrupts for receive and transmit complete enable fully interrupt driven communication. Frame error and
buffer overflow are detected in hardware and indicated with separate status flags. Even or odd parity generation and
parity check can also be enabled.
The clock generator includes a fractional baud rate generator that is able to generate a wide range of USART baud
rates from any system clock frequencies. This removes the need to use an external crystal oscillator with a specific
frequency to achieve a required baud rate. It also supports external clock input in synchronous slave operation.
When the USART is set in master SPI mode, all USART-specific logic is disabled, leaving the transmit and receive
buffers, shift registers, and baud rate generator enabled. Pin control and interrupt generation are identical in both
modes. The registers are used in both modes, but their functionality differs for some control settings.
An IRCOM module can be enabled for one USART to support IrDA 1.4 physical compliant pulse modulation and
demodulation for baud rates up to 115.2Kbps.
PORTC and PORTD each has two USARTs. PORTE has one USART. Notation of these peripherals are USARTC0,
USARTC1, USARTD0, USARTD1 and USARTE0, respectively.
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25. IRCOM – IR Communication Module
25.1 Features
zPulse modulation/demodulation for infrared communication
zIrDA compatible for baud rates up to 115.2Kbps
zSelectable pulse modulation scheme
z3/16 of the baud rate period
zFixed pulse period, 8-bit programmable
zPulse modulation disabled
zBuilt-in filtering
zCan be connected to and used by any USART
25.2 Overview
Atmel AVR XMEGA devices contain an infrared communication module (IRCOM) that is IrDA compatible for baud
rates up to 115.2Kbps. It can be connected to any USART to enable infrared pulse encoding/decoding for that
USART.
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26. AES and DES Crypto Engine
26.1 Features
zData Encryption Standard (DES) CPU instruction
zAdvanced Encryption Standard (AES) crypto module
zDES Instruction
zEncryption and decryption
zDES supported
zEncryption/decryption in 16 CPU clock cycles per 8-byte block
zAES crypto module
zEncryption and decryption
zSupports 128-bit keys
zSupports XOR data load mode to the state memory
zEncryption/decryption in 375 clock cycles per 16-byte block
26.2 Overview
The Advanced Encryption Standard (AES) and Data Encryption Standard (DES) are two commonly used standards
for cryptography. These are supported through an AES peripheral module and a DES CPU instruction, and the
communication interfaces and the CPU can use these for fast, encrypted communication and secure data storage.
DES is supported by an instruction in the AVR CPU. The 8-byte key and 8-byte data blocks must be loaded into the
register file, and then the DES instruction must be executed 16 times to encrypt/decrypt the data block.
The AES crypto module encrypts and decrypts 128-bit data blocks with the use of a 128-bit key. The key and data
must be loaded into the key and state memory in the module before encryption/decryption is started. It takes 375
peripheral clock cycles before the encryption/decryption is done. The encrypted/encrypted data can then be read out,
and an optional interrupt can be generated. The AES crypto module also has DMA support with transfer triggers when
encryption/decryption is done and optional auto-start of encryption/decryption when the state memory is fully loaded.
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27. CRC – Cyclic Redundancy Check Generator
27.1 Features
zCyclic redundancy check (CRC) generation and checking for
zCommunication data
zProgram or data in flash memory
zData in SRAM and I/O memory space
zIntegrated with flash memory, DMA controller and CPU
zContinuous CRC on data going through a DMA channel
zAutomatic CRC of the complete or a selectable range of the flash memory
zCPU can load data to the CRC generator through the I/O interface
zCRC polynomial software selectable to
zCRC-16 (CRC-CCITT)
zCRC-32 (IEEE 802.3)
zZero remainder detection
27.2 Overview
A cyclic redundancy check (CRC) is an error detection technique test algorithm used to find accidental errors in data,
and it is commonly used to determine the correctness of a data transmission, and data present in the data and
program memories. A CRC takes a data stream or a block of data as input and generates a 16- or 32-bit output that
can be appended to the data and used as a checksum. When the same data are later received or read, the device or
application repeats the calculation. If the new CRC result does not match the one calculated earlier, the block contains
a data error. The application will then detect this and may take a corrective action, such as requesting the data to be
sent again or simply not using the incorrect data.
Typically, an n-bit CRC applied to a data block of arbitrary length will detect any single error burst not longer than n
bits (any single alteration that spans no more than n bits of the data), and will detect the fraction 1-2-n of all longer
error bursts. The CRC module in Atmel AVR XMEGA devices supports two commonly used CRC polynomials; CRC-
16 (CRC-CCITT) and CRC-32 (IEEE 802.3).
zCRC-16:
zCRC-32:
Polynomial: x16+x12+x5+1
Hex value: 0x1021
Polynomial: x32+x26+x23+x22+x16+x12+x11+x10+x8+x7+x5+x4+x2+x+1
Hex value: 0x04C11DB7
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28. ADC – 12-bit Analog to Digital Converter
28.1 Features
zOne Analog to Digital Converter (ADC)
z12-bit resolution
zUp to two million samples per second
zTwo inputs can be sampled simultaneously using ADC and 1x gain stage
zFour inputs can be sampled within 1.5µs
zDown to 2.5µs conversion time with 8-bit resolution
zDown to 3.5µs conversion time with 12-bit resolution
zDifferential and single-ended input
zUp to 12 single-ended inputs
z12x4 differential inputs without gain
z8x4 differential inputs with gain
zBuilt-in differential gain stage
z1/2x, 1x, 2x, 4x, 8x, 16x, 32x, and 64x gain options
zSingle, continuous and scan conversion options
zFour internal inputs
zInternal temperature sensor
zDAC output
zAVCC voltage divided by 10
z1.1V bandgap voltage
zFour conversion channels with individual input control and result registers
zEnable four parallel configurations and results
zInternal and external reference options
zCompare function for accurate monitoring of user defined thresholds
zOptional event triggered conversion for accurate timing
zOptional DMA transfer of conversion results
zOptional interrupt/event on compare result
28.2 Overview
The ADC converts analog signals to digital values. The ADC has 12-bit resolution and is capable of converting up to
two million samples per second (msps). The input selection is flexible, and both single-ended and differential
measurements can be done. For differential measurements, an optional gain stage is available to increase the
dynamic range. In addition, several internal signal inputs are available. The ADC can provide both signed and
unsigned results.
This is a pipelined ADC that consists of several consecutive stages. The pipelined design allows a high sample rate at
a low system clock frequency. It also means that a new input can be sampled and a new ADC conversion started
while other ADC conversions are still ongoing. This removes dependencies between sample rate and propagation
delay.
The ADC has four conversion channels (0-3) with individual input selection, result registers, and conversion start
control. The ADC can then keep and use four parallel configurations and results, and this will ease use for
applications with high data throughput or for multiple modules using the ADC independently. It is possible to use DMA
to move ADC results directly to memory or peripherals when conversions are done.
Both internal and external reference voltages can be used. An integrated temperature sensor is available for use with
the ADC. The output from the DAC, AVCC/10 and the bandgap voltage can also be measured by the ADC.
The ADC has a compare function for accurate monitoring of user defined thresholds with minimum software
intervention required.
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Figure 28-1. ADC overview.
Two inputs can be sampled simultaneously as both the ADC and the gain stage include sample and hold circuits, and
the gain stage has 1x gain setting. Four inputs can be sampled within 1.5µs without any intervention by the
application.
The ADC may be configured for 8- or 12-bit result, reducing the minimum conversion time (propagation delay) from
3.5µs for 12-bit to 2.5µs for 8-bit result.
ADC conversion results are provided left- or right adjusted with optional ‘1’ or ‘0’ padding. This eases calculation when
the result is represented as a signed integer (signed 16-bit number).
PORTA has one ADC. Notation of this peripheral is ADCA.
CH1 Result
CH0 Result
CH2 Result
Compare
<
>Threshold
(Int Req)
Internal 1.00V
Internal AVCC/1.6V
AREFA
AREFB
V
INP
V
INN
Internal
signals
Internal AVCC/2
Internal
signals
CH3 Result
ADC0
ADC7
ADC4
ADC7
ADC0
ADC3
•
•
•
Int. signals
Int. signals
Reference
Voltage
½x - 64x
•
•
•
•
•
•
ADC0
ADC11
•
•
•
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29. DAC – 12-bit Digital to Analog Converter
29.1 Features
zOne Digital to Analog Converter (DAC)
z12-bit resolution
zTwo independent, continuous-drive output channels
zUp to one million samples per second conversion rate per DAC channel
zBuilt-in calibration that removes:
zOffset error
zGain error
zMultiple conversion trigger sources
zOn new available data
zEvents from the event system
zHigh drive capabilities and support for
zResistive loads
zCapacitive loads
zCombined resistive and capacitive loads
zInternal and external reference options
zDAC output available as input to analog comparator and ADC
zLow-power mode, with reduced drive strength
zOptional DMA transfer of data
29.2 Overview
The digital-to-analog converter (DAC) converts digital values to voltages. The DAC has two channels, each with 12-bit
resolution, and is capable of converting up to one million samples per second (msps) on each channel. The built-in
calibration system can remove offset and gain error when loaded with calibration values from software.
Figure 29-1. DAC overview.
DAC0
DAC1
CTRLA
CH1DATA
CH0DATA
Trigger
Trigger
Internal Output
enable
Enable
Internal 1.00V
AREFA
AREFB
Reference
selection
AVCC
Output
Driver
Output
Driver
D
A
T
A
Int.
driver
D
A
T
A
CTRLB
DMA req
(Data Empty)
DMA req
(Data Empty)
Select
12
12
Select
Enable
To
AC/ADC
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A DAC conversion is automatically started when new data to be converted are available. Events from the event
system can also be used to trigger a conversion, and this enables synchronized and timed conversions between the
DAC and other peripherals, such as a timer/counter. The DMA controller can be used to transfer data to the DAC.
The DAC has high drive strength, and is capable of driving both resistive and capacitive loads, aswell as loads which
combine both. A low-power mode is available, which will reduce the drive strength of the output. Internal and external
voltage references can be used. The DAC output is also internally available for use as input to the analog comparator
or ADC.
PORTB has one DAC. Notation of this peripheral is DACB.
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30. AC – Analog Comparator
30.1 Features
zTwo Analog Comparators (ACs)
zSelectable propagation delay versus current consumption
zSelectable hysteresis
zNo
zSmall
zLarge
zAnalog comparator output available on pin
zFlexible input selection
zAll pins on the port
zOutput from the DAC
zBandgap reference voltage
zA 64-level programmable voltage scaler of the internal AVCC voltage
zInterrupt and event generation on:
zRising edge
zFalling edge
zToggle
zWindow function interrupt and event generation on:
zSignal above window
zSignal inside window
zSignal below window
zConstant current source with configurable output pin selection
30.2 Overview
The analog comparator (AC) compares the voltage levels on two inputs and gives a digital output based on this
comparison. The analog comparator may be configured to generate interrupt requests and/or events upon several
different combinations of input change.
Two important properties of the analog comparator’s dynamic behavior are: hysteresis and propagation delay. Both of
these parameters may be adjusted in order to achieve the optimal operation for each application.
The input selection includes analog port pins, several internal signals, and a 64-level programmable voltage scaler.
The analog comparator output state can also be output on a pin for use by external devices.
A constant current source can be enabled and output on a selectable pin. This can be used to replace, for example,
external resistors used to charge capacitors in capacitive touch sensing applications.
The analog comparators are always grouped in pairs on each port. These are called analog comparator 0 (AC0) and
analog comparator 1 (AC1). They have identical behavior, but separate control registers. Used as pair, they can be
set in window mode to compare a signal to a voltage range instead of a voltage level.
PORTA has one AC pair. Notation is ACA.
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Figure 30-1. Analog comparator overview.
The window function is realized by connecting the external inputs of the two analog comparators in a pair as shown in
Figure 30-2.
Figure 30-2. Analog comparator window function.
ACnMUXCTRL ACnCTRL
Interrupt
Mode
Enable
Enable
Hysteresis
Hysteresis
AC1OUT
WINCTRL
Interrupt
Sensititivity
Control
&
Window
Function
Events
Interrupts
AC0OUT
Pin Input
Pin Input
Pin Input
Pin Input
Voltage
Scaler
DAC
Bandgap
AC0
+
-
AC1
+
-
Input signal
Upper limit of window
Lower limit of window
Interrupt
sensitivity
control
Interrupts
Events
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31. Programming and Debugging
31.1 Features
zProgramming
zExternal programming through PDI interface
zMinimal protocol overhead for fast operation
zBuilt-in error detection and handling for reliable operation
zBoot loader support for programming through any communication interface
zDebugging
zNonintrusive, real-time, on-chip debug system
zNo software or hardware resources required from device except pin connection
zProgram flow control
zGo, Stop, Reset, Step Into, Step Over, Step Out, Run-to-Cursor
zUnlimited number of user program breakpoints
zUnlimited number of user data breakpoints, break on:
zData location read, write, or both read and write
zData location content equal or not equal to a value
zData location content is greater or smaller than a value
zData location content is within or outside a range
zNo limitation on device clock frequency
zProgram and Debug Interface (PDI)
zTwo-pin interface for external programming and debugging
zUses the Reset pin and a dedicated pin
zNo I/O pins required during programming or debugging
31.2 Overview
The Program and Debug Interface (PDI) is an Atmel proprietary interface for external programming and on-chip
debugging of a device.
The PDI supports fast programming of nonvolatile memory (NVM) spaces; flash, EEPOM, fuses, lock bits, and the
user signature row.
Debug is supported through an on-chip debug system that offers nonintrusive, real-time debug. It does not require any
software or hardware resources except for the device pin connection. Using the Atmel tool chain, it offers complete
program flow control and support for an unlimited number of program and complex data breakpoints. Application
debug can be done from a C or other high-level language source code level, as well as from an assembler and
disassembler level.
Programming and debugging can be done through the PDI physical layer. This is a two-pin interface that uses the
Reset pin for the clock input (PDI_CLK) and one other dedicated pin for data input and output (PDI_DATA). Any
external programmer or on-chip debugger/emulator can be directly connected to this interface.
32. Pinout and Pin Functions
The device pinout is shown in “Pinout/Block Diagram” on page 4. In addition to general purpose I/O functionality, each
pin can have several alternate functions. This will depend on which peripheral is enabled and connected to the actual
pin. Only one of the pin functions can be used at time.
32.1 Alternate Pin Function Description
The tables below show the notation for all pin functions available and describe its function.
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32.1.1 Operation/Power Supply
32.1.2 Port Interrupt functions
32.1.3 Analog functions
32.1.4 Timer/Counter and AWEX functions
VCC Digital supply voltage
AVCC Analog supply voltage
GND Ground
SYNC Port pin with full synchronous and limited asynchronous interrupt function
ASYNC Port pin with full synchronous and full asynchronous interrupt function
ACn Analog Comparator input pin n
ACnOUT Analog Comparator n Output
ADCn Analog to Digital Converter input pin n
DACn Digital to Analog Converter output pin n
AREF Analog Reference input pin
OCnxLS Output Compare Channel x Low Side for Timer/Counter n
OCnxHS Output Compare Channel x High Side for Timer/Counter n
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32.1.5 Communication functions
32.1.6 Oscillators, Clock and Event
32.1.7 Debug/System functions
SCL Serial Clock for TWI
SDA Serial Data for TWI
SCLIN Serial Clock In for TWI when external driver interface is enabled
SCLOUT Serial Clock Out for TWI when external driver interface is enabled
SDAIN Serial Data In for TWI when external driver interface is enabled
SDAOUT Serial Data Out for TWI when external driver interface is enabled
XCKn Transfer Clock for USART n
RXDn Receiver Data for USART n
TXDn Transmitter Data for USART n
SS Slave Select for SPI
MOSI Master Out Slave In for SPI
MISO Master In Slave Out for SPI
SCK Serial Clock for SPI
D- Data- for USB
D+ Data+ for USB
TOSCn Timer Oscillator pin n
XTALn Input/Output for Oscillator pin n
CLKOUT Peripheral Clock Output
EVOUT Event Channel Output
RTCOUT RTC Clock Source Output
RESET Reset pin
PDI_CLK Program and Debug Interface Clock pin
PDI_DATA Program and Debug Interface Data pin
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32.2 Alternate Pin Functions
The tables below show the primary/default function for each pin on a port in the first column, the pin number in the
second column, and then all alternate pin functions in the remaining columns. The head row shows what peripheral
that enable and use the alternate pin functions.
For better flexibility, some alternate functions also have selectable pin locations for their functions, this is noted under
the first table where this apply.
Table 32-1. Port A - alternate functions.
Table 32-2. Port B - alternate functions.
PORT A PIN # INTERRUPT ADCA POS/
GAINPOS
ADCA NEG ADCA
GAINNEG
ACA POS ACA NEG ACAOUT REFA
GND 38
AVCC 39
PA0 40 SYNC ADC0 ADC0 AC0 AC0 AREF
PA1 41 SYNC ADC1 ADC1 AC1 AC1
PA2 42 SYNC/ASYNC ADC2 ADC2 AC2
PA3 43 SYNC ADC3 ADC3 AC3 AC3
PA4 44 SYNC ADC4 ADC4 AC4
PA5 1SYNC ADC5 ADC5 AC5 AC5
PA6 2SYNC ADC6 ADC6 AC6 AC1OUT
PA7 3SYNC ADC7 ADC7 AC7 AC0OUT
PORT B PIN # INTERRUPT ADCA POS DACB REFB
PB0 4SYNC ADC8 AREF
PB1 5SYNC ADC9
PB2 6SYNC/ASYNC ADC10 DAC0
PB3 7SYNC ADC11 DAC1
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Table 32-3. Port C - alternate functions.
Notes: 1. Pin mapping of all TC0 can optionally be moved to high nibble of port
2. If TC0 is configured as TC2 all eight pins can be used for PWM output.
3. Pin mapping of all USART0 can optionally be moved to high nibble of port.
4. Pins MOSI and SCK for all SPI can optionally be swapped.
5. CLKOUT can optionally be moved between port C, D and E and between pin 4 and 7.
6. EVOUT can optionally be moved between port C, D and E and between pin 4 and 7.
Table 32-4. Port D - alternate functions.
PORT C PIN # INTERRUPT TCC0
(1)(2)
AWEXC TCC1 USART
C0(3)
USART
C1
SPIC(4) TWIC TWIC
w/ext
driver
CLOCKOUT
(5)
EVENTOUT
(6)
GND 8
VCC 9
PC0 10 SYNC OC0A OC0ALS SDA SDAIN
PC1 11 SYNC OC0B OC0AHS XCK0 SCL SCLIN
PC2 12 SYNC/
ASYNC OC0C OC0BLS RXD0 SDAOUT
PC3 13 SYNC OC0D OC0BHS TXD0 SCLOUT
PC4 14 SYNC OC0CLS OC1A SS
PC5 15 SYNC OC0CHS OC1B XCK1 MOSI
PC6 16 SYNC OC0DLS RXD1 MISO clkRTC
PC7 17 SYNC OC0DHS TXD1 SCK clkPER EVOUT
PORT D PIN # INTERRUPT TCD0 TCD1 USB USARTD0 USARTD1 SPID CLOCKOUT EVENTOUT
GND 18
VCC 19
PD0 20 SYNC OC0A
PD1 21 SYNC OC0B XCK0
PD2 22 SYNC/ASYNC OC0C RXD0
PD3 23 SYNC OC0D TXD0
PD4 24 SYNC OC1A SS
PD5 25 SYNC OC1B XCK1 MOSI
PD6 26 SYNC D- RXD1 MISO
PD7 27 SYNC D+ TXD1 SCK clkPER EVOUT
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Table 32-5. Port E - alternate functions.
Table 32-6. Port R - alternate functions.
Note: 1. TOSC pins can optionally be moved to PE2/PE3.
PORT E PIN # INTERRUPT TCE0 USARTE0 TWIE
PE0 28 SYNC OC0A SDA
PE1 29 SYNC OC0B XCK0 SCL
GND 30
VCC 31
PE2 32 SYNC/ASYNC OC0C RXD0
PE3 33 SYNC OC0D TXD0
PORT R PIN # INTERRUPT PDI XTAL TOSC(1)
PDI 34 PDI_DATA
RESET 35 PDI_CLOCK
PR0 36 SYNC XTAL2 TOSC2
PR1 37 SYNC XTAL1 TOSC1
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33. Peripheral Module Address Map
The address maps show the base address for each peripheral and module in Atmel AVR XMEGA A4U. For complete
register description and summary for each peripheral module, refer to the XMEGA AU manual.
Table 33-1. Peripheral module address map.
Base address Name Description
0x0000 GPIO General Purpose IO Registers
0x0010 VPORT0 Virtual Port 0
0x0014 VPORT1 Virtual Port 1
0x0018 VPORT2 Virtual Port 2
0x001C VPORT3 Virtual Port 2
0x0030 CPU CPU
0x0040 CLK Clock Control
0x0048 SLEEP Sleep Controller
0x0050 OSC Oscillator Control
0x0060 DFLLRC32M DFLL for the 32MHz Internal RC Oscillator
0x0068 DFLLRC2M DFLL for the 2MHz RC Oscillator
0x0070 PR Power Reduction
0x0078 RST Reset Controller
0x0080 WDT Watch-Dog Timer
0x0090 MCU MCU Control
0x00A0 PMIC Programmable MUltilevel Interrupt Controller
0x00B0 PORTCFG Port Configuration
0x00C0 AES AES Module
0x00D0 CRC CRC Module
0x0100 DMA DMA Module
0x0180 EVSYS Event System
0x01C0 NVM Non Volatile Memory (NVM) Controller
0x0200 ADCA Analog to Digital Converter on port A
0x0380 ACA Analog Comparator pair on port A
0x0400 RTC Real Time Counter
0x0480 TWIC Two Wire Interface on port C
0x04A0 TWIE Two Wire Interface on port E
0x04C0 USB Universal Serial Bus Interface
0x0600 PORTA Port A
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0x0620 PORTB Port B
0x0640 PORTC Port C
0x0660 PORTD Port D
0x0680 PORTE Port E
0x07E0 PORTR Port R
0x0800 TCC0 Timer/Counter 0 on port C
0x0840 TCC1 Timer/Counter 1 on port C
0x0880 AWEXC Advanced Waveform Extension on port C
0x0890 HIRESC High Resolution Extension on port C
0x08A0 USARTC0 USART 0 on port C
0x08B0 USARTC1 USART 1 on port C
0x08C0 SPIC Serial Peripheral Interface on port C
0x08F8 IRCOM Infrared Communication Module
0x0900 TCD0 Timer/Counter 0 on port D
0x0940 TCD1 Timer/Counter 1 on port D
0x0990 HIRESD High Resolution Extension on port D
0x09A0 USARTD0 USART 0 on port D
0x09B0 USARTD1 USART 1 on port D
0x09C0 SPID Serial Peripheral Interface on port D
0x0A00 TCE0 Timer/Counter 0 on port E
0x0A80 AWEXE Advanced Waveform Extensionon port E
0x0A90 HIRESE High Resolution Extension on port E
0x0AA0 USARTE0 USART 0 on port E
Base address Name Description
63
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34. Instruction Set Summary
Mnemonic
s
Operand
sDescription Operation Flags
#Clock
s
Arithmetic and Logic Instructions
ADD Rd, Rr Add without Carry Rd ←Rd + Rr Z,C,N,V,S,H 1
ADC Rd, Rr Add with Carry Rd ←Rd + Rr + C Z,C,N,V,S,H 1
ADIW Rd, K Add Immediate to Word Rd ←Rd + 1:Rd + K Z,C,N,V,S 2
SUB Rd, Rr Subtract without Carry Rd ←Rd - Rr Z,C,N,V,S,H 1
SUBI Rd, K Subtract Immediate Rd ←Rd - K Z,C,N,V,S,H 1
SBC Rd, Rr Subtract with Carry Rd ←Rd - Rr - C Z,C,N,V,S,H 1
SBCI Rd, K Subtract Immediate with Carry Rd ←Rd - K - C Z,C,N,V,S,H 1
SBIW Rd, K Subtract Immediate from Word Rd + 1:Rd ←Rd + 1:Rd - K Z,C,N,V,S 2
AND Rd, Rr Logical AND Rd ←Rd • Rr Z,N,V,S 1
ANDI Rd, K Logical AND with Immediate Rd ←Rd • K Z,N,V,S 1
OR Rd, Rr Logical OR Rd ←Rd v Rr Z,N,V,S 1
ORI Rd, K Logical OR with Immediate Rd ←Rd v K Z,N,V,S 1
EOR Rd, Rr Exclusive OR Rd ←Rd ⊕ Rr Z,N,V,S 1
COM Rd One’s Complement Rd ←$FF - Rd Z,C,N,V,S 1
NEG Rd Two’s Complement Rd ←$00 - Rd Z,C,N,V,S,H 1
SBR Rd,K Set Bit(s) in Register Rd ←Rd v K Z,N,V,S 1
CBR Rd,K Clear Bit(s) in Register Rd ←Rd • ($FFh - K) Z,N,V,S 1
INC Rd Increment Rd ←Rd + 1 Z,N,V,S 1
DEC Rd Decrement Rd ←Rd - 1 Z,N,V,S 1
TST Rd Test for Zero or Minus Rd ←Rd • Rd Z,N,V,S 1
CLR Rd Clear Register Rd ←Rd ⊕ Rd Z,N,V,S 1
SER Rd Set Register Rd ←$FF None 1
MUL Rd,Rr Multiply Unsigned R1:R0 ←Rd x Rr (UU) Z,C 2
MULS Rd,Rr Multiply Signed R1:R0 ←Rd x Rr (SS) Z,C 2
MULSU Rd,Rr Multiply Signed with Unsigned R1:R0 ←Rd x Rr (SU) Z,C 2
FMUL Rd,Rr Fractional Multiply Unsigned R1:R0 ←Rd x Rr<<1 (UU) Z,C 2
FMULS Rd,Rr Fractional Multiply Signed R1:R0 ←Rd x Rr<<1 (SS) Z,C 2
FMULSU Rd,Rr Fractional Multiply Signed with Unsigned R1:R0 ←Rd x Rr<<1 (SU) Z,C 2
DES KData Encryption if (H = 0) then R15:R0
else if (H = 1) then R15:R0
←
←
Encrypt(R15:R0, K)
Decrypt(R15:R0, K)
1/2
Branch instructions
RJMP kRelative Jump PC ←PC + k + 1 None 2
IJMP Indirect Jump to (Z) PC(15:0)
PC(21:16)
←
←
Z,
0
None 2
EIJMP Extended Indirect Jump to (Z) PC(15:0)
PC(21:16)
←
←
Z,
EIND
None 2
JMP kJump PC ←kNone 3
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RCALL kRelative Call Subroutine PC ←PC + k + 1 None 2 / 3 (1)
ICALL Indirect Call to (Z) PC(15:0)
PC(21:16)
←
←
Z,
0
None 2 / 3 (1)
EICALL Extended Indirect Call to (Z) PC(15:0)
PC(21:16)
←
←
Z,
EIND
None 3 (1)
CALL kcall Subroutine PC ←kNone 3 / 4 (1)
RET Subroutine Return PC ←STACK None 4 / 5 (1)
RETI Interrupt Return PC ←STACK I4 / 5 (1)
CPSE Rd,Rr Compare, Skip if Equal if (Rd = Rr) PC ←PC + 2 or 3 None 1 / 2 / 3
CP Rd,Rr Compare Rd - Rr Z,C,N,V,S,H 1
CPC Rd,Rr Compare with Carry Rd - Rr - C Z,C,N,V,S,H 1
CPI Rd,K Compare with Immediate Rd - K Z,C,N,V,S,H 1
SBRC Rr, b Skip if Bit in Register Cleared if (Rr(b) = 0) PC ←PC + 2 or 3 None 1 / 2 / 3
SBRS Rr, b Skip if Bit in Register Set if (Rr(b) = 1) PC ←PC + 2 or 3 None 1 / 2 / 3
SBIC A, b Skip if Bit in I/O Register Cleared if (I/O(A,b) = 0) PC ←PC + 2 or 3 None 2 / 3 / 4
SBIS A, b Skip if Bit in I/O Register Set If (I/O(A,b) =1) PC ←PC + 2 or 3 None 2 / 3 / 4
BRBS s, k Branch if Status Flag Set if (SREG(s) = 1) then PC ←PC + k + 1 None 1 / 2
BRBC s, k Branch if Status Flag Cleared if (SREG(s) = 0) then PC ←PC + k + 1 None 1 / 2
BREQ k Branch if Equal if (Z = 1) then PC ←PC + k + 1 None 1 / 2
BRNE k Branch if Not Equal if (Z = 0) then PC ←PC + k + 1 None 1 / 2
BRCS k Branch if Carry Set if (C = 1) then PC ←PC + k + 1 None 1 / 2
BRCC k Branch if Carry Cleared if (C = 0) then PC ←PC + k + 1 None 1 / 2
BRSH k Branch if Same or Higher if (C = 0) then PC ←PC + k + 1 None 1 / 2
BRLO k Branch if Lower if (C = 1) then PC ←PC + k + 1 None 1 / 2
BRMI k Branch if Minus if (N = 1) then PC ←PC + k + 1 None 1 / 2
BRPL k Branch if Plus if (N = 0) then PC ←PC + k + 1 None 1 / 2
BRGE k Branch if Greater or Equal, Signed if (N ⊕ V= 0) then PC ←PC + k + 1 None 1 / 2
BRLT k Branch if Less Than, Signed if (N ⊕ V= 1) then PC ←PC + k + 1 None 1 / 2
BRHS k Branch if Half Carry Flag Set if (H = 1) then PC ←PC + k + 1 None 1 / 2
BRHC k Branch if Half Carry Flag Cleared if (H = 0) then PC ←PC + k + 1 None 1 / 2
BRTS k Branch if T Flag Set if (T = 1) then PC ←PC + k + 1 None 1 / 2
BRTC k Branch if T Flag Cleared if (T = 0) then PC ←PC + k + 1 None 1 / 2
BRVS k Branch if Overflow Flag is Set if (V = 1) then PC ←PC + k + 1 None 1 / 2
BRVC k Branch if Overflow Flag is Cleared if (V = 0) then PC ←PC + k + 1 None 1 / 2
BRIE k Branch if Interrupt Enabled if (I = 1) then PC ←PC + k + 1 None 1 / 2
BRID k Branch if Interrupt Disabled if (I = 0) then PC ←PC + k + 1 None 1 / 2
Data transfer instructions
MOV Rd, Rr Copy Register Rd ←Rr None 1
Mnemonic
s
Operand
sDescription Operation Flags
#Clock
s
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MOVW Rd, Rr Copy Register Pair Rd+1:Rd ←Rr+1:Rr None 1
LDI Rd, K Load Immediate Rd ←KNone 1
LDS Rd, k Load Direct from data space Rd ←(k) None 2 (1)(2)
LD Rd, X Load Indirect Rd ←(X) None 1 (1)(2)
LD Rd, X+ Load Indirect and Post-Increment Rd
X
←
←
(X)
X + 1
None 1 (1)(2)
LD Rd, -X Load Indirect and Pre-Decrement X ← X - 1,
Rd ← (X)
←
←
X - 1
(X)
None 2 (1)(2)
LD Rd, Y Load Indirect Rd ← (Y) ←(Y) None 1 (1)(2)
LD Rd, Y+ Load Indirect and Post-Increment Rd
Y
←
←
(Y)
Y + 1
None 1 (1)(2)
LD Rd, -Y Load Indirect and Pre-Decrement Y
Rd
←
←
Y - 1
(Y)
None 2 (1)(2)
LDD Rd, Y+q Load Indirect with Displacement Rd ←(Y + q) None 2 (1)(2)
LD Rd, Z Load Indirect Rd ←(Z) None 1 (1)(2)
LD Rd, Z+ Load Indirect and Post-Increment Rd
Z
←
←
(Z),
Z+1
None 1 (1)(2)
LD Rd, -Z Load Indirect and Pre-Decrement Z
Rd
←
←
Z - 1,
(Z)
None 2 (1)(2)
LDD Rd, Z+q Load Indirect with Displacement Rd ←(Z + q) None 2 (1)(2)
STS k, Rr Store Direct to Data Space (k) ←Rd None 2 (1)
ST X, Rr Store Indirect (X) ←Rr None 1 (1)
ST X+, Rr Store Indirect and Post-Increment (X)
X
←
←
Rr,
X + 1
None 1 (1)
ST -X, Rr Store Indirect and Pre-Decrement X
(X)
←
←
X - 1,
Rr
None 2 (1)
ST Y, R r Store Indirect (Y) ←Rr None 1 (1)
ST Y+, Rr Store Indirect and Post-Increment (Y)
Y
←
←
Rr,
Y + 1
None 1 (1)
ST -Y, Rr Store Indirect and Pre-Decrement Y
(Y)
←
←
Y - 1,
Rr
None 2 (1)
STD Y+q, Rr Store Indirect with Displacement (Y + q) ←Rr None 2 (1)
ST Z, Rr Store Indirect (Z) ←Rr None 1 (1)
ST Z+, Rr Store Indirect and Post-Increment (Z)
Z
←
←
Rr
Z + 1
None 1 (1)
ST -Z, Rr Store Indirect and Pre-Decrement Z←Z - 1 None 2 (1)
STD Z+q,Rr Store Indirect with Displacement (Z + q) ←Rr None 2 (1)
LPM Load Program Memory R0 ←(Z) None 3
LPM Rd, Z Load Program Memory Rd ←(Z) None 3
LPM Rd, Z+ Load Program Memory and Post-Increment Rd
Z
←
←
(Z),
Z + 1
None 3
ELPM Extended Load Program Memory R0 ←(RAMPZ:Z) None 3
ELPM Rd, Z Extended Load Program Memory Rd ←(RAMPZ:Z) None 3
Mnemonic
s
Operand
sDescription Operation Flags
#Clock
s
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ELPM Rd, Z+ Extended Load Program Memory and Post-
Increment
Rd
Z
←
←
(RAMPZ:Z),
Z + 1
None 3
SPM Store Program Memory (RAMPZ:Z) ←R1:R0 None -
SPM Z+ Store Program Memory and Post-Increment
by 2
(RAMPZ:Z)
Z
←
←
R1:R0,
Z + 2
None -
IN Rd, A In From I/O Location Rd ←I/O(A) None 1
OUT A, Rr Out To I/O Location I/O(A) ←Rr None 1
PUSH Rr Push Register on Stack STACK ←Rr None 1 (1)
POP Rd Pop Register from Stack Rd ←STACK None 2 (1)
XCH Z, Rd Exchange RAM location Temp
Rd
(Z)
←
←
←
Rd,
(Z),
Temp
None 2
LAS Z, Rd Load and Set RAM location Temp
Rd
(Z)
←
←
←
Rd,
(Z),
Temp v (Z)
None 2
LAC Z, Rd Load and Clear RAM location Tem p
Rd
(Z)
←
←
←
Rd,
(Z),
($FFh – Rd) z (Z)
None 2
LAT Z, Rd Load and Toggle RAM location Temp
Rd
(Z)
←
←
←
Rd,
(Z),
Temp ⊕ (Z)
None 2
Bit and bit-test instructions
LSL Rd Logical Shift Left Rd(n+1)
Rd(0)
C
←
←
←
Rd(n),
0,
Rd(7)
Z,C,N,V,H 1
LSR Rd Logical Shift Right Rd(n)
Rd(7)
C
←
←
←
Rd(n+1),
0,
Rd(0)
Z,C,N,V 1
ROL Rd Rotate Left Through Carry Rd(0)
Rd(n+1)
C
←
←
←
C,
Rd(n),
Rd(7)
Z,C,N,V,H 1
ROR Rd Rotate Right Through Carry Rd(7)
Rd(n)
C
←
←
←
C,
Rd(n+1),
Rd(0)
Z,C,N,V 1
ASR Rd Arithmetic Shift Right Rd(n) ←Rd(n+1), n=0..6 Z,C,N,V 1
SWAP Rd Swap Nibbles Rd(3..0) ↔Rd(7..4) None 1
BSET sFlag Set SREG(s) ←1SREG(s) 1
BCLR sFlag Clear SREG(s) ←0SREG(s) 1
SBI A, b Set Bit in I/O Register I/O(A, b) ←1None 1
CBI A, b Clear Bit in I/O Register I/O(A, b) ←0None 1
BST Rr, b Bit Store from Register to T T←Rr(b) T 1
BLD Rd, b Bit load from T to Register Rd(b) ←TNone 1
SEC Set Carry C←1 C 1
CLC Clear Carry C←0 C 1
SEN Set Negative Flag N←1 N 1
CLN Clear Negative Flag N←0 N 1
SEZ Set Zero Flag Z←1 Z 1
Mnemonic
s
Operand
sDescription Operation Flags
#Clock
s
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XMEGA A4U [DATASHEET]
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Notes: 1. Cycle times for Data memory accesses assume internal memory accesses, and are not valid for accesses via the external RAM interface.
2. One extra cycle must be added when accessing Internal SRAM.
CLZ Clear Zero Flag Z←0 Z 1
SEI Global Interrupt Enable I←1 I 1
CLI Global Interrupt Disable I←0 I 1
SES Set Signed Test Flag S←1 S 1
CLS Clear Signed Test Flag S←0 S 1
SEV Set Two’s Complement Overflow V←1 V 1
CLV Clear Two’s Complement Overflow V←0 V 1
SET Set T in SREG T←1 T 1
CLT Clear T in SREG T←0 T 1
SEH Set Half Carry Flag in SREG H←1 H 1
CLH Clear Half Carry Flag in SREG H←0 H 1
MCU control instructions
BREAK Break (See specific descr. for BREAK) None 1
NOP No Operation None 1
SLEEP Sleep (see specific descr. for Sleep) None 1
WDR Watchdog Reset (see specific descr. for WDR) None 1
Mnemonic
s
Operand
sDescription Operation Flags
#Clock
s
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35. Packaging information
35.1 44A
44A, 44-lead, 10 x 10mm body size, 1.0mm body thickness,
0.8 mm lead pitch, thin profile plastic quad flat package (TQFP) C
44A
06/02/2014
PIN 1 IDENTIFIER
0°~7°
PIN 1
L
C
A1 A2 A
D1
D
e
E1 E
B
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
Notes:
1. This package conforms to JEDEC reference MS-026, Variation ACB.
2. Dimensions D1 and E1 do not include mold protrusion. Allowable
protrusion is 0.25mm per side. Dimensions D1 and E1 are maximum
plastic body size dimensions including mold mismatch.
3. Lead coplanarity is 0.10mm maximum.
A – – 1.20
A1 0.05 – 0.15
A2 0.95 1.00 1.05
D 11.75 12.00 12.25
D1 9.90 10.00 10.10 Note 2
E 11.75 12.00 12.25
E1 9.90 10.00 10.10 Note 2
B 0.30 0.37 0.45
C 0.09 (0.17) 0.20
L 0.45 0.60 0.75
e 0.80 TYP
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35.2 PW
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35.3 44M1
TITLE DRAWING NO.GPC REV.
Package Drawing Contact:
packagedrawings@atmel.com 44M1ZWS H
44M1, 44-pad, 7 x 7 x 1.0mm body, lead
pitch 0.50mm, 5.20mm exposed pad, thermally
enhanced plastic very thin quad flat no
lead package (VQFN)
02/13/2014
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
A 0.80 0.90 1.00
A1 – 0.02 0.05
A3 0.20 REF
b 0.18 0.23 0.30
D
D2 5.00 5.20 5.40
6.90 7.00 7.10
6.90 7.00 7.10
E
E2 5.00 5.20 5.40
e 0.50 BSC
L 0.59 0.64 0.69
K 0.20 0.26 0.41
Note: JEDEC Standard MO-220, Fig . 1 (S AW Singulation) VKKD-3 .
TOP VIE W
SIDE VIEW
B OT TOM VIE W
D
E
Marked Pin# 1 I D
E2
D2
be
Pin #1 Co rner
L
A1
A3
A
SE ATING PLAN E
Pin #1
Triangle
Pin #1
Cham fer
(C 0.30)
Option A
Option B
Pin #1
Notch
(0.20 R)
Option C
K
K
1
2
3
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35.4 49C2
TITLE DRAWING NO.GPC REV.
Package Drawing Contact:
packagedrawings@atmel.com 49C2CBD A
49C2, 49-ball (7 x 7 array), 0.65mm pitch,
5.0 x 5.0 x 1.0mm, very thin, ne-pitch
ball grid array package (VFBGA)
3/14/08
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
A – – 1.00
A1 0.20 – –
A2 0.65 – –
D 4.90 5.00 5.10
D1 3.90 BSC
E 4.90 5.00 5.10
E1 3.90 BSC
b 0.30 0.35 0.40
e 0.65 BSC
TOP VIEW
SIDE VIEW
A1 BALL ID
G
F
E
D
C
B
A
12 3 4 5 6 7
A
A1
A2
D
E
0.10
E1
D1
49 - Ø0.35 ±0.05
e
A1 BALL CORNER
BOTTOM VIEW
b e
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36. Electrical Characteristics
All typical values are measured at T = 25°C unless other temperature condition is given. All minimum and maximum
values are valid across operating temperature and voltage unless other conditions are given.
36.1 ATxmega16A4U
36.1.1 Absolute Maximum Ratings
Stresses beyond those listed in Table 36-1 may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or other conditions beyond those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
Table 36-1. Absolute maximum ratings.
36.1.2 General Operating Ratings
The device must operate within the ratings listed in Table 36-2 in order for all other electrical characteristics and
typical characteristics of the device to be valid.
Table 36-2. General operating conditions.
Symbol Parameter Condition Min. Typ. Max. Units
VCC Power supply voltage -0.3 4 V
IVCC Current into a VCC pin 200 mA
IGND Current out of a Gnd pin 200 mA
VPIN Pin voltage with respect to Gnd and VCC -0.5 VCC+0.5 V
IPIN I/O pin sink/source current -25 25 mA
TAStorage temperature -65 150 °C
TjJunction temperature 150 °C
Symbol Parameter Condition Min. Typ. Max. Units
VCC Power supply voltage 1.60 3.6 V
AVCC Analog supply voltage 1.60 3.6 V
TATemperature range -40 85 °C
TjJunction temperature -40 105 °C
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Table 36-3. Operating voltage and frequency.
The maximum CPU clock frequency depends on VCC. As shown in Figure 36-1 the Frequency vs. VCC curve is linear
between 1.8V < VCC <2.7V.
Figure 36-1. Maximum Frequency vs. VCC.
Symbol Parameter Condition Min. Typ. Max. Units
ClkCPU CPU clock frequency
VCC = 1.6V 012
MHz
VCC = 1.8V 012
VCC = 2.7V 032
VCC = 3.6V 032
1.8
12
32
MHz
V
2.7 3.6
1.6
Safe Operating Area
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36.1.3 Current consumption
Table 36-4. Current consumption for Active mode and sleep modes.
Notes: 1. All Power Reduction Registers set.
2. Maximum limits are based on characterization, and not tested in production.
Symbol Parameter Condition Min. Typ. Max. Units
ICC
Active power
consumption (1)
32kHz, Ext. Clk
VCC = 1.8V 40
µA
VCC = 3.0V 80
1MHz, Ext. Clk
VCC = 1.8V 230
VCC = 3.0V 480
2MHz, Ext. Clk
VCC = 1.8V 430 600
VCC = 3.0V
0.9 1.4
mA
32MHz, Ext. Clk 9.6 12
Idle power
consumption (1)
32kHz, Ext. Clk
VCC = 1.8V 2.4
µA
VCC = 3.0V 3.9
1MHz, Ext. Clk
VCC = 1.8V 62
VCC = 3.0V 118
2MHz, Ext. Clk
VCC = 1.8V 125 225
VCC = 3.0V
240 350
32MHz, Ext. Clk 3.8 5.5 mA
Power-down power
consumption
T = 25°C
VCC = 3.0V
0.1 1.0
µA
T = 85°C 1.2 4.5
T = 105°C 3.5 6.0
WDT and Sampled BOD enabled,
T = 25°C
VCC = 3.0V
1.3 3.0
WDT and Sampled BOD enabled,
T = 85°C 2.4 6.0
WDT and Sampled BOD enabled,
T = 105°C 4.5 8.0
Power-save power
consumption (2)
RTC from ULP clock, WDT and sampled
BOD enabled, T = 25°C
VCC = 1.8V 1.2
µA
VCC = 3.0V 1.3
RTC from 1.024kHz low power
32.768kHz TOSC, T = 25°C
VCC = 1.8V 0.6 2.0
VCC = 3.0V 0.7 2.0
RTC from low power 32.768kHz TOSC,
T = 25°C
VCC = 1.8V 0.8 3.0
VCC = 3.0V 1.0 3.0
Reset power consumption Current through RESET pin substracted VCC = 3.0V 320 µA
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Table 36-5. Current consumption for modules and peripherals.
Note: 1. All parameters measured as the difference in current consumption between module enabled and disabled. All data at VCC = 3.0V, ClkSYS = 1MHz external
clock without prescaling, T = 25°C unless other conditions are given.
Symbol Parameter Condition (1) Min. Typ. Max. Units
ICC
ULP oscillator 1.0 µA
32.768kHz int. oscillator 27 µA
2MHz int. oscillator
85
µA
DFLL enabled with 32.768kHz int. osc. as reference 115
32MHz int. oscillator
270
µA
DFLL enabled with 32.768kHz int. osc. as reference 460
PLL 20x multiplication factor,
32MHz int. osc. DIV4 as reference 220 µA
Watchdog timer 1.0 µA
BOD
Continuous mode 138
µA
Sampled mode, includes ULP oscillator 1.2
Internal 1.0V reference 100 µA
Temperature sensor 95 µA
ADC 250ksps
VREF = Ext ref
3.0
mA
CURRLIMIT = LOW 2.6
CURRLIMIT = MEDIUM 2.1
CURRLIMIT = HIGH 1.6
DAC
250ksps
VREF = Ext ref
No load
Normal mode 1.9
mA
Low Power mode 1.1
AC
High speed mode 330
µA
Low power mode 130
DMA 615kbps between I/O registers and SRAM 108 µA
Timer/counter 16 µA
USART Rx and Tx enabled, 9600 BAUD 2.5 µA
Flash memory and EEPROM programming 4.0 8.0 mA
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36.1.4 Wake-up time from sleep modes
Table 36-6. Device wake-up time from sleep modes with various system clock sources.
Note: 1. The wake-up time is the time from the wake-up request is given until the peripheral clock is available on pin, see Figure 36-2. All peripherals and modules
start execution from the first clock cycle, expect the CPU that is halted for four clock cycles before program execution starts.
Figure 36-2. Wake-up time definition.
Symbol Parameter Condition Min. Typ. (1) Max. Units
twakeup
Wake-up time from idle,
standby, and extended standby
mode
External 2MHz clock 2.0
µs
32.768kHz internal oscillator 120
2MHz internal oscillator 2.0
32MHz internal oscillator 0.2
Wake-up time from power-save
and power-down mode
External 2MHz clock 4.5
32.768kHz internal oscillator 320
2MHz internal oscillator 9.0
32MHz internal oscillator 5.0
Wakeup request
Clock output
Wakeup time
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36.1.5 I/O Pin Characteristics
The I/O pins comply with the JEDEC LVTTL and LVCMOS specification and the high- and low level input and output
voltage limits reflect or exceed this specification.
Table 36-7. I/O pin characteristics.
Notes: 1. The sum of all IOH for PORTA and PORTB must not exceed 100mA.
The sum of all IOH for PORTC must not exceed 200mA.
The sum of all IOH for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOH for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
2. The sum of all IOL for PORTA and PORTB must not exceed 100mA.
The sum of all IOL for PORTC must not exceed 200mA.
The sum of all IOL for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOL for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
Symbol Parameter Condition Min. Typ. Max. Units
IOH (1)/
IOL (2) I/O pin source/sink current -20 20 mA
VIH High level input voltage
VCC = 2.7 - 3.6V 2.0 VCC+0.3
VVCC = 2.0 - 2.7V 0.7*VCC VCC+0.3
VCC = 1.6 - 2.0V 0.8*VCC VCC+0.3
VIL Low level input voltage
VCC = 2.7- 3.6V -0.3 0.8
VVCC = 2.0 - 2.7V -0.3 0.3*VCC
VCC = 1.6 - 2.0V -0.3 0.2*VCC
VOH High level output voltage
VCC = 3.0 - 3.6V IOH = -2mA 2.4 0.94*VCC
V
VCC = 2.3 - 2.7V
IOH = -1mA 2.0 0.96*VCC
IOH = -2mA 1.7 0.92*VCC
VCC = 3.3V IOH = -8mA 2.6 2.9
VCC = 3.0V IOH = -6mA 2.1 2.6
VCC = 1.8V IOH = -2mA 1.4 1.6
VOL Low level output voltage
VCC = 3.0 - 3.6V IOL = 2mA 0.05*VCC 0.4
V
VCC = 2.3 - 2.7V
IOL = 1mA 0.03*VCC 0.4
IOL = 2mA 0.06*VCC 0.7
VCC = 3.3V IOL = 15mA 0.4 0.76
VCC = 3.0V IOL = 10mA 0.3 0.64
VCC = 1.8V IOL = 5mA 0.2 0.46
IIN Input leakage current T = 25°C <0.01 0.1 µA
RPPull/buss keeper resistor 24 kΩ
trRise time No load
4.0
ns
slew rate limitation 7.0
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36.1.6 ADC characteristics
Table 36-8. Power supply, reference and input range.
Table 36-9. Clock and timing.
Symbol Parameter Condition Min. Typ. Max. Units
AVCC Analog supply voltage VCC- 0.3 VCC+ 0.3 V
VREF Reference voltage 1.0 AVCC- 0.6 V
Rin Input resistance Switched 4.0 kΩ
Csample Input capacitance Switched 4.4 pF
RAREF Reference input resistance (leakage only) >10 MΩ
CAREF Reference input capacitance Static load 7.0 pF
VIN Input range -0.1 AVCC+0.1 V
Conversion range Differential mode, Vinp - Vinn -VREF VREF V
Conversion range Single ended unsigned mode, Vinp -ΔV VREF-ΔV V
∆VFixed offset voltage 190 LSB
Symbol Parameter Condition Min. Typ. Max. Units
ClkADC ADC Clock frequency
Maximum is 1/4 of peripheral clock
frequency 100 2000
kHz
Measuring internal signals 100 125
fADC Sample rate
Current limitation (CURRLIMIT) off 100 2000
ksps
CURRLIMIT = LOW 100 1500
CURRLIMIT = MEDIUM 100 1000
CURRLIMIT = HIGH 100 500
Sampling time 1/2 ClkADC cycle 0.25 5µs
Conversion time (latency) (RES+2)/2+(GAIN !=0)
RES (Resolution) = 8 or 12 5 8 ClkADC
cycles
Start-up time ADC clock cycles 12 24 ClkADC
cycles
ADC settling time
After changing reference or input mode 7 7 ClkADC
cycles
After ADC flush 1 1
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Table 36-10. Accuracy characteristics.
Notes: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% input voltage range.
2. Unless otherwise noted all linearity, offset and gain error numbers are valid under the condition that external VREF is used.
Table 36-11. Gain stage characteristics.
Symbol Parameter Condition (2) Min. Typ. Max. Units
RES Resolution Programmable to 8 or 12 bit 812 12 Bits
INL (1) Integral non-linearity
500ksps
VCC-1.0V < VREF< VCC-0.6V ±1.2 ±2.0
lsb
All VREF ±1.5 ±3.0
2000ksps
VCC-1.0V < VREF< VCC-0.6V ±1.0 ±2.0
All VREF ±1.5 ±3.0
DNL (1) Differential non-linearity guaranteed monotonic <±0.8 <±1.0 lsb
Offset error
-1.0 mV
Temperature drift <0.01 mV/K
Operating voltage drift <0.6 mV/V
Gain error
Differential
mode
External reference -1.0
mV
AVCC/1.6 10
AVCC/2.0 8.0
Bandgap ±5.0
Temperature drift <0.02 mV/K
Operating voltage drift <0.5 mV/V
Noise Differential mode, shorted input
2msps, VCC = 3.6V, ClkPER = 16MHz 0.4 mV
rms
Symbol Parameter Condition Min. Typ. Max. Units
Rin Input resistance Switched in normal mode 4.0 kΩ
Csample Input capacitance Switched in normal mode 4.4 pF
Signal range Gain stage output 0 VCC- 0.6 V
Propagation delay ADC conversion rate 1.0 ClkADC
cycles
Sample rate Same as ADC 100 1000 kHz
INL (1) Integral non-linearity 500ksps All gain
settings ±1.5 ±4 lsb
Gain error
1x gain, normal mode -0.8
%8x gain, normal mode -2.5
64x gain, normal mode -3.5
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Note: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% input voltage range.
36.1.7 DAC Characteristics
Table 36-12. Power supply, reference and output range.
Offset error,
input referred
1x gain, normal mode -2
mV8x gain, normal mode -5
64x gain, normal mode -4
Noise
1x gain, normal mode
VCC = 3.6V
Ext. VREF
0.5
mV
rms
8x gain, normal mode 1.5
64x gain, normal mode 11
Symbol Parameter Condition Min. Typ. Max. Units
Symbol Parameter Condition Min. Typ. Max. Units
AVCC Analog supply voltage VCC-
0.3 VCC+ 0.3 V
AVREF External reference voltage 1.0 VCC- 0.6 V
Rchannel DC output impedance 50 Ω
Linear output voltage range 0.15 AVCC-0.15 V
RAREF Reference input resistance >10 MΩ
CAREF Reference input capacitance Static load 7pF
Minimum resistance load 1.0 kΩ
Maximum capacitance load
100 pF
1000Ω serial resistance 1.0 nF
Output sink/source
Operating within accuracy specification AVCC/1000
mA
Safe operation 10
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Table 36-13. Clock and timing.
Table 36-14. Accuracy characteristics.
Note: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% output voltage range.
Symbol Parameter Condition Min. Typ. Max. Units
fDAC Conversion rate Cload=100pF,
maximum step size
Normal mode 01000
ksps
Low power mode 500
Symbol Parameter Condition Min. Typ. Max. Units
RES Input resolution 12 Bits
INL (1) Integral non-linearity
VREF= Ext 1.0V
VCC = 1.6V ±2.0 ±3
lsb
VCC = 3.6V ±1.5 ±2.5
VREF=AVCC
VCC = 1.6V ±2.0 ±4
VCC = 3.6V ±1.5 ±4
VREF=INT1V
VCC = 1.6V ±5.0
VCC = 3.6V ±5.0
DNL (1) Differential non-linearity
VREF=Ext 1.0V
VCC = 1.6V ±1.5 3.0
lsb
VCC = 3.6V ±0.6 1.5
VREF=AVCC
VCC = 1.6V ±1.0 3.5
VCC = 3.6V ±0.6 1.5
VREF=INT1V
VCC = 1.6V ±4.5
VCC = 3.6V ±4.5
Gain error After calibration <4.0 lsb
Gain calibration step size 4.0 lsb
Gain calibration drift VREF= Ext 1.0V <0.2 mV/K
Offset error After calibration <1.0 lsb
Offset calibration step size 1.0
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36.1.8 Analog Comparator Characteristics
Table 36-15. Analog Comparator characteristics.
36.1.9 Bandgap and Internal 1.0V Reference Characteristics
Table 36-16. Bandgap and Internal 1.0V reference characteristics.
Symbol Parameter Condition Min. Typ. Max. Units
Voff Input offset voltage <±10 mV
Ilk Input leakage current <1.0 nA
Input voltage range -0.1 AVCC V
AC startup time 100 µs
Vhys1 Hysteresis, none 0mV
Vhys2 Hysteresis, small
mode = High Speed (HS) 13
mV
mode = Low Power (LP) 30
Vhys3 Hysteresis, large
mode = HS 30
mV
mode = LP 60
tdelay Propagation delay
VCC = 3.0V, T= 85°C mode = HS 30 90
ns
mode = HS 30
VCC = 3.0V, T= 85°C mode = LP 130 500
mode = LP 130
64-level voltage scaler Integral non-linearity (INL) 0.3 0.5 lsb
Symbol Parameter Condition Min. Typ. Max. Units
Startup time
As reference for ADC or DAC 1 ClkPER + 2.5µs
µs
As input voltage to ADC and AC 1.5
Bandgap voltage 1.1 V
INT1V Internal 1.00V reference T= 85°C, after calibration 0.99 1.0 1.01 V
Variation over voltage and temperature Relative to T= 85°C, VCC = 3.0V ±1.5 %
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36.1.10 Brownout Detection Characteristics
Table 36-17. Brownout detection characteristics.
36.1.11 External Reset Characteristics
Table 36-18. External reset characteristics.
36.1.12 Power-on Reset Characteristics
Table 36-19. Power-on reset characteristics.
Note: 1. VPOT- values are only valid when BOD is disabled. When BOD is enabled VPOT- = VPOT+.
Symbol Parameter Condition Min. Typ. Max. Units
VBOT
BOD level 0 falling VCC 1.60 1.62 1.72
V
BOD level 1 falling VCC 1.8
BOD level 2 falling VCC 2.0
BOD level 3 falling VCC 2.2
BOD level 4 falling VCC 2.4
BOD level 5 falling VCC 2.6
BOD level 6 falling VCC 2.8
BOD level 7 falling VCC 3.0
tBOD Detection time
Continuous mode 0.4
µs
Sampled mode 1000
VHYST Hysteresis 1.2 %
Symbol Parameter Condition Min. Typ. Max. Units
tEXT Minimum reset pulse width 95 1000 ns
VRST
Reset threshold voltage (VIH)
VCC = 2.7 - 3.6V 0.60×VCC
V
VCC = 1.6 - 2.7V 0.60×VCC
Reset threshold voltage (VIL)
VCC = 2.7 - 3.6V 0.50×VCC
VCC = 1.6 - 2.7V 0.40×VCC
RRST Reset pin Pull-up Resistor 25 kΩ
Symbol Parameter Condition Min. Typ. Max. Units
VPOT- (1) POR threshold voltage falling VCC
VCC falls faster than 1V/ms 0.4 1.0
V
VCC falls at 1V/ms or slower 0.8 1.0
VPOT+ POR threshold voltage rising VCC 1.3 1.59 V
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36.1.13 Flash and EEPROM Memory Characteristics
Table 36-20. Endurance and data retention.
Table 36-21. Programming time.
Notes: 1. Programming is timed from the 2MHz internal oscillator.
2. EEPROM is not erased if the EESAVE fuse is programmed.
Symbol Parameter Condition Min. Typ. Max. Units
Flash
Write/Erase cycles
25°C 10K
Cycle85°C 10K
105°C 2K
Data retention
25°C 100
Year85°C 25
105°C 10
EEPROM
Write/Erase cycles
25°C 100K
Cycle85°C 100K
105°C 30K
Data retention
25°C 100
Year85°C 25
105°C 10
Symbol Parameter Condition Min. Typ.(1) Max. Units
Chip Erase 16KB Flash, EEPROM(2) and
SRAM Erase 45 ms
Application Erase Section erase 6ms
Flash
Page erase 4
msPage write 4
Atomic page erase and write 8
EEPROM
Page erase 4
msPage write 4
Atomic page erase and write 8
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36.1.14 Clock and Oscillator Characteristics
36.1.14.1 Calibrated 32.768kHz Internal Oscillator characteristics
Table 36-22. 32.768kHz internal oscillator characteristics.
36.1.14.2 Calibrated 2MHz RC Internal Oscillator characteristics
Table 36-23. 2MHz internal oscillator characteristics.
36.1.14.3 Calibrated and tunable 32MHz internal oscillator characteristics
Table 36-24. 32MHz internal oscillator characteristics.
36.1.14.4 32kHz Internal ULP Oscillator characteristics
Table 36-25. 32kHz internal ULP oscillator characteristics.
Symbol Parameter Condition Min. Typ. Max. Units
Frequency 32.768 kHz
Factory calibration accuracy T = 85°C, VCC = 3.0V -0.5 0.5 %
User calibration accuracy -0.5 0.5 %
Symbol Parameter Condition Min. Typ. Max. Units
Frequency range DFLL can tune to this frequency over
voltage and temperature 1.8 2.2 MHz
Factory calibrated frequency 2.0 MHz
Factory calibration accuracy T = 85°C, VCC= 3.0V -1.5 1.5 %
User calibration accuracy -0.2 0.2 %
DFLL calibration stepsize 0.21 %
Symbol Parameter Condition Min. Typ. Max. Units
Frequency range DFLL can tune to this frequency over
voltage and temperature 30 55 MHz
Factory calibrated frequency 32 MHz
Factory calibration accuracy T = 85°C, VCC= 3.0V -1.5 1.5 %
User calibration accuracy -0.2 0.2 %
DFLL calibration step size 0.22 %
Symbol Parameter Condition Min. Typ. Max. Units
Output frequency 32 kHz
Accuracy -30 30 %
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36.1.14.5 Internal Phase Locked Loop (PLL) characteristics
Table 36-26. Internal PLL characteristics.
Note: 1. The maximum output frequency vs. supply voltage is linear between 1.8V and 2.7V, and can never be higher than four times the maximum CPU frequency.
36.1.14.6 External clock characteristics
Figure 36-3. External clock drive waveform
Table 36-27. External clock used as system clock without prescaling.
Note: 1. The maximum frequency vs. supply voltage is linear between 1.6V and 2.7V, and the same applies for all other parameters with supply voltage conditions.
Symbo
lParameter Condition Min. Typ. Max. Units
fIN Input frequency Output frequency must be within fOUT 0.4 64 MHz
fOUT Output frequency (1)
VCC= 1.6 - 1.8V 20 48
MHz
VCC= 2.7 - 3.6V 20 128
Start-up time 25 µs
Re-lock time 25 µs
tCH
tCL
tCK
tCH
VIL1
VIH1
tCR tCF
Symbol Parameter Condition Min. Typ. Max. Units
1/tCK Clock Frequency (1)
VCC = 1.6 - 1.8V 012
MHz
VCC = 2.7 - 3.6V 032
tCK Clock Period
VCC = 1.6 - 1.8V 83.3
ns
VCC = 2.7 - 3.6V 31.5
tCH Clock High Time
VCC = 1.6 - 1.8V 30.0
ns
VCC = 2.7 - 3.6V 12.5
tCL Clock Low Time
VCC = 1.6 - 1.8V 30.0
ns
VCC = 2.7 - 3.6V 12.5
tCR Rise Time (for maximum frequency)
VCC = 1.6 - 1.8V 10
ns
VCC = 2.7 - 3.6V 3
tCF Fall Time (for maximum frequency)
VCC = 1.6 - 1.8V 10
ns
VCC = 2.7 - 3.6V 3
ΔtCK Change in period from one clock cycle to the next 10 %
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Table 36-28. External clock with prescaler (1)for system clock.
Notes: 1. System Clock Prescalers must be set so that maximum CPU clock frequency for device is not exceeded.
2. The maximum frequency vs. supply voltage is linear between 1.6V and 2.7V, and the same applies for all other parameters with supply voltage conditions.
36.1.14.7 External 16MHz crystal oscillator and XOSC characteristic
Table 36-29. External 16MHz crystal oscillator and XOSC characteristics.
Symbol Parameter Condition Min. Typ. Max. Units
1/tCK Clock Frequency (2)
VCC = 1.6 - 1.8V 090
MHz
VCC = 2.7 - 3.6V 0142
tCK Clock Period
VCC = 1.6 - 1.8V 11
ns
VCC = 2.7 - 3.6V 7
tCH Clock High Time
VCC = 1.6 - 1.8V 4.5
ns
VCC = 2.7 - 3.6V 2.4
tCL Clock Low Time
VCC = 1.6 - 1.8V 4.5
ns
VCC = 2.7 - 3.6V 2.4
tCR Rise Time (for maximum frequency)
VCC = 1.6 - 1.8V 1.5
ns
VCC = 2.7 - 3.6V 1.0
tCF Fall Time (for maximum frequency)
VCC = 1.6 - 1.8V 1.5
ns
VCC = 2.7 - 3.6V 1.0
ΔtCK Change in period from one clock cycle to the next 10 %
Symbol Parameter Condition Min. Typ. Max. Units
Cycle to cycle jitter
XOSCPWR=0
FRQRANGE=0 <10
nsFRQRANGE=1, 2, or 3 <1.0
XOSCPWR=1 <1.0
Long term jitter
XOSCPWR=0
FRQRANGE=0 <6.0
nsFRQRANGE=1, 2, or 3 <0.5
XOSCPWR=1 <0.5
Frequency error
XOSCPWR=0
FRQRANGE=0 <0.1
%
FRQRANGE=1 <0.05
FRQRANGE=2 or 3 <0.005
XOSCPWR=1 <0.005
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Note: 1. Numbers for negative impedance are not tested in production but guaranteed from design and characterization.
Duty cycle
XOSCPWR=0
FRQRANGE=0 40
%
FRQRANGE=1 42
FRQRANGE=2 or 3 45
XOSCPWR=1 48
RQNegative impedance (1)
XOSCPWR=0,
FRQRANGE=0
0.4MHz resonator,
CL=100pF 2.4k
Ω
1MHz crystal, CL=20pF 8.7k
2MHz crystal, CL=20pF 2.1k
XOSCPWR=0,
FRQRANGE=1,
CL=20pF
2MHz crystal 4.2k
8MHz crystal 250
9MHz crystal 195
XOSCPWR=0,
FRQRANGE=2,
CL=20pF
8MHz crystal 360
9MHz crystal 285
12MHz crystal 155
XOSCPWR=0,
FRQRANGE=3,
CL=20pF
9MHz crystal 365
12MHz crystal 200
16MHz crystal 105
XOSCPWR=1,
FRQRANGE=0,
CL=20pF
9MHz crystal 435
12MHz crystal 235
16MHz crystal 125
XOSCPWR=1,
FRQRANGE=1,
CL=20pF
9MHz crystal 495
12MHz crystal 270
16MHz crystal 145
XOSCPWR=1,
FRQRANGE=2,
CL=20pF
12MHz crystal 305
16MHz crystal 160
XOSCPWR=1,
FRQRANGE=3,
CL=20pF
12MHz crystal 380
16MHz crystal 205
ESR SF = Safety factor min(RQ)/SF kΩ
CXTAL1
Parasitic capacitance
XTAL1 pin 5.4 pF
CXTAL2
Parasitic capacitance
XTAL2 pin 7.1 pF
CLOAD
Parasitic capacitance
load 3.07 pF
Symbol Parameter Condition Min. Typ. Max. Units
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36.1.14.8 External 32.768kHz crystal oscillator and TOSC characteristics
Table 36-30. External 32.768kHz crystal oscillator and TOSC characteristics.
Note: 1. See Figure 36-4 for definition.
Figure 36-4. TOSC input capacitance.
The parasitic capacitance between the TOSC pins is CL1 + CL2 in series as seen from the crystal when oscillating
without external capacitors.
Symbol Parameter Condition Min. Typ. Max. Units
ESR/R1 Recommended crystal equivalent
series resistance (ESR)
Crystal load capacitance 6.5pF 60
kΩ
Crystal load capacitance 9.0pF 35
CTOSC1 Parasitic capacitance TOSC1 pin
5.4
pF
Alternate TOSC location 4.0
CTOSC2 Parasitic capacitance TOSC2 pin
7.1
pF
Alternate TOSC location 4.0
Recommended safety factor capacitance load matched to
crystal specification 3
C
L1
C
L2
2CS
O
T
1
CS
O
TDevice internal
External
32.768kHz crystal
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36.1.15 SPI Characteristics
Figure 36-5. SPI timing requirements in master mode.
Figure 36-6. SPI timing requirements in slave mode.
MSB LSB
MSB LSB
tMOS
tMIS tMIH
tSCKW
tSCK
tMOH tMOH
tSCKF
tSCKR
tSCKW
MOSI
(Data output)
MISO
(Data input)
SCK
(CPOL = 1)
SCK
(CPOL = 0)
SS
MSB LSB
MSB LSB
tSIS tSIH
tSSCKW
tSSCKW
tSSCK
tSSH
tSOSSH
tSCKR tSCKF
tSOS
tSSS
tSOSSS
MISO
(Data output)
MOSI
(Data input)
SCK
(CPOL = 1)
SCK
(CPOL = 0)
SS
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Table 36-31. SPI timing characteristics and requirements.
36.1.16 Two-Wire Interface Characteristics
Table 36-32 on page 92 describes the requirements for devices connected to the Two-Wire Interface Bus. The Atmel
AVR XMEGA Two-Wire Interface meets or exceeds these requirements under the noted conditions. Timing symbols
refer to Figure 36-7 on page 91.
Figure 36-7. Two-wire interface bus timing.
Symbol Parameter Condition Min. Typ. Max. Units
tSCK SCK period Master (See Table 21-4 in
XMEGA AU Manual)
ns
tSCKW SCK high/low width Master 0.5*SCK
tSCKR SCK rise time Master 2.7
tSCKF SCK fall time Master 2.7
tMIS MISO setup to SCK Master 10
tMIH MISO hold after SCK Master 10
tMOS MOSI setup SCK Master 0.5*SCK
tMOH MOSI hold after SCK Master 1
tSSCK Slave SCK Period Slave 4*t ClkPER
tSSCKW SCK high/low width Slave 2*t ClkPER
tSSCKR SCK rise time Slave 1600
tSSCKF SCK fall time Slave 1600
tSIS MOSI setup to SCK Slave 3
tSIH MOSI hold after SCK Slave t ClkPER
tSSS SS setup to SCK Slave 21
tSSH SS hold after SCK Slave 20
tSOS MISO setup SCK Slave 8
tSOH MISO hold after SCK Slave 13
tSOSS MISO setup after SS low Slave 11
tSOSH MISO hold after SS high Slave 8
tHD;STA
tof
SDA
SCL
tLOW
tHIGH
tSU;STA
tBUF
tr
tHD;DAT tSU;DAT tSU;STO
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Table 36-32. Two-wire interface characteristics.
Notes: 1. Required only for fSCL > 100kHz.
2. Cb = Capacitance of one bus line in pF.
3. fPER = Peripheral clock frequency.
Symbol Parameter Condition Min. Typ. Max. Units
VIH Input high voltage 0.7*VCC VCC+0.5 V
VIL Input low voltage 0.5 0.3*VCC V
Vhys Hysteresis of Schmitt trigger inputs 0.05*VCC (1) V
VOL Output low voltage 3mA, sink current 00.4 V
trRise time for both SDA and SCL 20+0.1Cb (1)(2) 300 ns
tof Output fall time from VIHmin to VILmax 10pF < Cb < 400pF (2) 20+0.1Cb (1)(2) 250 ns
tSP Spikes suppressed by input filter 050 ns
IIInput current for each I/O Pin 0.1VCC < VI < 0.9VCC -10 10 µA
CICapacitance for each I/O Pin 10 pF
fSCL SCL clock frequency fPER (3)>max(10fSCL, 250kHz) 0400 kHz
RPValue of pull-up resistor
fSCL ≤ 100kHz
Ω
fSCL > 100kHz
tHD;STA Hold time (repeated) START condition
fSCL ≤ 100kHz 4.0
µs
fSCL > 100kHz 0.6
tLOW Low period of SCL clock
fSCL ≤ 100kHz 4.7
µs
fSCL > 100kHz 1.3
tHIGH High period of SCL clock
fSCL ≤ 100kHz 4.0
µs
fSCL > 100kHz 0.6
tSU;STA
Set-up time for a repeated START
condition
fSCL ≤ 100kHz 4.7
µs
fSCL > 100kHz 0.6
tHD;DAT Data hold time
fSCL ≤ 100kHz 03.45
µs
fSCL > 100kHz 00.9
tSU;DAT Data setup time
fSCL ≤ 100kHz 250
ns
fSCL > 100kHz 100
tSU;STO Setup time for STOP condition
fSCL ≤ 100kHz 4.0
µs
fSCL > 100kHz 0.6
tBUF
Bus free time between a STOP and
START condition
fSCL ≤ 100kHz 4.7
µs
fSCL > 100kHz 1.3
VCC 0.4V–
3mA
----------------------------
100ns
Cb
---------------
300ns
Cb
---------------
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36.2 ATxmega32A4U
36.2.1 Absolute Maximum Ratings
Stresses beyond those listed in Table 36-33 may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or other conditions beyond those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
Table 36-33. Absolute maximum ratings.
36.2.2 General Operating Ratings
The device must operate within the ratings listed in Table 36-34 in order for all other electrical characteristics and
typical characteristics of the device to be valid.
Table 36-34. General operating conditions.
Table 36-35. Operating voltage and frequency.
The maximum CPU clock frequency depends on VCC. As shown in Figure 36-8 the Frequency vs. VCC curve is linear
between 1.8V < VCC <2.7V.
Symbol Parameter Condition Min. Typ. Max. Units
VCC Power supply voltage -0.3 4 V
IVCC Current into a VCC pin 200 mA
IGND Current out of a Gnd pin 200 mA
VPIN Pin voltage with respect to Gnd and VCC -0.5 VCC+0.5 V
IPIN I/O pin sink/source current -25 25 mA
TAStorage temperature -65 150 °C
TjJunction temperature 150 °C
Symbol Parameter Condition Min. Typ. Max. Units
VCC Power supply voltage 1.60 3.6 V
AVCC Analog supply voltage 1.60 3.6 V
TATemperature range -40 85 °C
TjJunction temperature -40 105 °C
Symbol Parameter Condition Min. Typ. Max. Units
ClkCPU CPU clock frequency
VCC = 1.6V 012
MHz
VCC = 1.8V 012
VCC = 2.7V 032
VCC = 3.6V 032
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Figure 36-8. Maximum Frequency vs. VCC.
1.8
12
32
MHz
V
2.7 3.6
1.6
Safe Operating Area
95
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36.2.3 Current consumption
Table 36-36. Current consumption for Active mode and sleep modes.
Notes: 1. All Power Reduction Registers set.
2. Maximum limits are based on characterization, and not tested in production.
Symbol Parameter Condition Min. Typ. Max. Units
ICC
Active power
consumption(1)
32kHz, Ext. Clk
VCC = 1.8V 40
µA
VCC = 3.0V 80
1MHz, Ext. Clk
VCC = 1.8V 230
VCC = 3.0V 480
2MHz, Ext. Clk
VCC = 1.8V 430 600
VCC = 3.0V
0.9 1.4
mA
32MHz, Ext. Clk 9.6 12
Idle power
consumption(1)
32kHz, Ext. Clk
VCC = 1.8V 2.4
µA
VCC = 3.0V 3.9
1MHz, Ext. Clk
VCC = 1.8V 62
VCC = 3.0V 118
2MHz, Ext. Clk
VCC = 1.8V 125 225
VCC = 3.0V
240 350
32MHz, Ext. Clk 3.8 5.5 mA
Power-down power
consumption
T = 25°C
VCC = 3.0V
0.1 1.0
µA
T = 85°C 1.2 4.5
T = 105°C 3.5 6.0
WDT and sampled BOD enabled,
T = 25°C
VCC = 3.0V
1.3 3.0
WDT and sampled BOD enabled,
T = 85°C 2.4 6.0
WDT and sampled BOD enabled,
T = 105°C 4.5 8.0
Power-save power
consumption(2)
RTC from ULP clock, WDT and
sampled BOD enabled, T = 25°C
VCC = 1.8V 1.2
µA
VCC = 3.0V 1.3
RTC from 1.024kHz low power
32.768kHz TOSC, T = 25°C
VCC = 1.8V 0.6 2.0
VCC = 3.0V 0.7 2.0
RTC from low power 32.768kHz
TOSC, T = 25°C
VCC = 1.8V 0.8 3.0
VCC = 3.0V 1.0 3.0
Reset power consumption Current through RESET pin
substracted VCC = 3.0V 320
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Table 36-37. Current consumption for modules and peripherals.
Note: 1. All parameters measured as the difference in current consumption between module enabled and disabled. All data at VCC = 3.0V, ClkSYS = 1MHz external
clock without prescaling, T = 25°C unless other conditions are given.
Symbol Parameter Condition (1) Min. Typ. Max. Units
ICC
ULP oscillator 1.0 µA
32.768kHz int. oscillator 27 µA
2MHz int. oscillator
85
µA
DFLL enabled with 32.768kHz int. osc. as reference 115
32MHz int. oscillator
270
µA
DFLL enabled with 32.768kHz int. osc. as reference 460
PLL 20x multiplication factor,
32MHz int. osc. DIV4 as reference 220 µA
Watchdog timer 1.0 µA
BOD
Continuous mode 138
µA
Sampled mode, includes ULP oscillator 1.2
Internal 1.0V reference 100 µA
Temperature sensor 95 µA
ADC 250ksps
VREF = Ext ref
3.0
mA
CURRLIMIT = LOW 2.6
CURRLIMIT = MEDIUM 2.1
CURRLIMIT = HIGH 1.6
DAC
250ksps
VREF = Ext ref
No load
Normal mode 1.9
mA
Low power mode 1.1
AC
High speed mode 330
µA
Low power mode 130
DMA 615kbps between I/O registers and SRAM 108 µA
Timer/counter 16 µA
USART Rx and Tx enabled, 9600 BAUD 2.5 µA
Flash memory and EEPROM programming 4.0 8.0 mA
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36.2.4 Wake-up time from sleep modes
Table 36-38. Device wake-up time from sleep modes with various system clock sources.
Note: 1. The wake-up time is the time from the wake-up request is given until the peripheral clock is available on pin, see Figure 36-9. All peripherals and modules
start execution from the first clock cycle, expect the CPU that is halted for four clock cycles before program execution starts.
Figure 36-9. Wake-up time definition.
Symbol Parameter Condition Min. Typ. (1) Max. Units
twakeup
Wake-up time from idle,
standby, and extended standby
mode
External 2MHz clock 2.0
µs
32.768kHz internal oscillator 120
2MHz internal oscillator 2.0
32MHz internal oscillator 0.2
Wake-up time from power-save
and power-down mode
External 2MHz clock 4.5
µs
32.768kHz internal oscillator 320
2MHz internal oscillator 9.0
32MHz internal oscillator 5.0
Wakeup request
Clock output
Wakeup time
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36.2.5 I/O Pin Characteristics
The I/O pins comply with the JEDEC LVTTL and LVCMOS specification and the high- and low level input and output
voltage limits reflect or exceed this specification.
Table 36-39. I/O pin characteristics.
Notes: 1. The sum of all IOH for PORTA and PORTB must not exceed 100mA.
The sum of all IOH for PORTC must not exceed 200mA.
The sum of all IOH for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOH for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
2. The sum of all IOL for PORTA and PORTB must not exceed 100mA.
The sum of all IOL for PORTC must not exceed 200mA.
The sum of all IOL for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOL for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
Symbol Parameter Condition Min. Typ. Max. Units
IOH (1)/
IOL (2) I/O pin source/sink current -20 20 mA
VIH High level input voltage
VCC = 2.7 - 3.6V 2.0 VCC+0.3
VVCC = 2.0 - 2.7V 0.7*VCC VCC+0.3
VCC = 1.6 - 2.0V 0.8*VCC VCC+0.3
VIL Low level input voltage
VCC = 2.7- 3.6V -0.3 0.8
VVCC = 2.0 - 2.7V -0.3 0.3*VCC
VCC = 1.6 - 2.0V -0.3 0.2*VCC
VOH High level output voltage
VCC = 3.0 - 3.6V IOH = -2mA 2.4 0.94*VCC
V
VCC = 2.3 - 2.7V
IOH = -1mA 2.0 0.96*VCC
IOH = -2mA 1.7 0.92*VCC
VCC = 3.3V IOH = -8mA 2.6 2.9
VCC = 3.0V IOH = -6mA 2.1 2.6
VCC = 1.8V IOH = -2mA 1.4 1.6
VOL Low level output voltage
VCC = 3.0 - 3.6V IOL = 2mA 0.05*VCC 0.4
V
VCC = 2.3 - 2.7V
IOL = 1mA 0.03*VCC 0.4
IOL = 2mA 0.06*VCC 0.7
VCC = 3.3V IOL = 15mA 0.4 0.76
VCC = 3.0V IOL = 10mA 0.3 0.64
VCC = 1.8V IOL = 5mA 0.2 0.46
IIN Input leakage current T = 25°C <0.01 0.1 µA
RPPull/buss keeper resistor 24 kΩ
trRise time No load
4.0
ns
slew rate limitation 7.0
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36.2.6 ADC characteristics
Table 36-40. Power supply, reference and input range.
Table 36-41. Clock and timing.
Symbol Parameter Condition Min. Typ. Max. Units
AVCC Analog supply voltage VCC- 0.3 VCC+ 0.3 V
VREF Reference voltage 1AVCC- 0.6 V
Rin Input resistance Switched 4.0 kΩ
Csample Input capacitance Switched 4.4 pF
RAREF Reference input resistance (leakage only) >10 MΩ
CAREF Reference input capacitance Static load 7pF
VIN Input range -0.1 AVCC+0.1 V
Conversion range Differential mode, Vinp - Vinn -VREF VREF V
Conversion range Single ended unsigned mode, Vinp -ΔV VREF-ΔV V
∆VFixed offset voltage 190 LSB
Symbol Parameter Condition Min. Typ. Max. Units
ClkADC ADC clock frequency
Maximum is 1/4 of peripheral clock
frequency 100 2000
kHz
Measuring internal signals 100 125
fADC Sample rate
Current limitation (CURRLIMIT) off 100 2000
ksps
CURRLIMIT = LOW 100 1500
CURRLIMIT = MEDIUM 100 1000
CURRLIMIT = HIGH 100 500
Sampling time 1/2 ClkADC cycle 0.25 5µs
Conversion time (latency) (RES+2)/2+(GAIN !=0)
RES (Resolution) = 8 or 12 5 8 ClkADC
cycles
Start-up time ADC clock cycles 12 24 ClkADC
cycles
ADC settling time
After changing reference or input mode 7 7 ClkADC
cycles
After ADC flush 1 1
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Table 36-42. Accuracy characteristics.
Notes: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% input voltage range.
2. Unless otherwise noted all linearity, offset and gain error numbers are valid under the condition that external VREF is used.
Table 36-43. Gain stage characteristics.
Symbol Parameter Condition (2) Min. Typ. Max. Units
RES Resolution Programmable to 8 or 12 bit 812 12 Bits
INL(1) Integral non-linearity
500ksps
VCC-1.0V < VREF< VCC-0.6V ±1.2 ±2.0
lsb
All VREF ±1.5 ±3.0
2000ksps
VCC-1.0V < VREF< VCC-0.6V ±1.0 ±2.0
All VREF ±1.5 ±3.0
DNL(1) Differential non-linearity guaranteed monotonic <±0.8 <±1.0 lsb
Offset error
-1.0 mV
Temperature drift <0.01 mV/K
Operating voltage drift <0.6 mV/V
Gain error
Differential
mode
External reference -1.0
mV
AVCC/1.6 10
AVCC/2.0 8.0
Bandgap ±5.0
Temperature drift <0.02 mV/K
Operating voltage drift <0.5 mV/V
Noise Differential mode, shorted input
2msps, VCC = 3.6V, ClkPER = 16MHz 0.4 mV
rms
Symbol Parameter Condition Min. Typ. Max. Units
Rin Input resistance Switched in normal mode 4.0 kΩ
Csample Input capacitance Switched in normal mode 4.4 pF
Signal range Gain stage output 0 VCC- 0.6 V
Propagation delay ADC conversion rate 1.0 ClkADC
cycles
Sample rate Same as ADC 100 1000 kHz
INL (1) Integral non-linearity 500ksps All gain
settings ±1.5 ±4.0 lsb
Gain error
1x gain, normal mode -0.8
%8x gain, normal mode -2.5
64x gain, normal mode -3.5
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Note: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% input voltage range.
36.2.7 DAC Characteristics
Table 36-44. Power supply, reference and output range.
Table 36-45. Clock and timing.
Offset error,
input referred
1x gain, normal mode -2.0
mV8x gain, normal mode -5.0
64x gain, normal mode -4.0
Noise
1x gain, normal mode
VCC = 3.6V
Ext. VREF
0.5
mV
rms
8x gain, normal mode 1.5
64x gain, normal mode 11
Symbol Parameter Condition Min. Typ. Max. Units
Symbol Parameter Condition Min. Typ. Max. Units
AVCC Analog supply voltage VCC- 0.3 VCC+ 0.3 V
AVREF External reference voltage 1.0 VCC- 0.6 V
Rchannel DC output impedance 50 Ω
Linear output voltage range 0.15 AVCC-0.15 V
RAREF Reference input resistance >10 MΩ
CAREF Reference input capacitance Static load 7.0 pF
Minimum Resistance load 1.0 kΩ
Maximum capacitance load
100 pF
1000Ω serial resistance 1.0 nF
Output sink/source
Operating within accuracy specification AVCC/1000
mA
Safe operation 10
Symbol Parameter Condition Min. Typ. Max. Units
fDAC Conversion rate Cload=100pF,
maximum step size
Normal mode 01000
ksps
Low power mode 500
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Table 36-46. Accuracy characteristics.
Note: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% output voltage range.
Symbol Parameter Condition Min. Typ. Max. Units
RES Input resolution 12 Bits
INL (1) Integral non-linearity
VREF= Ext 1.0V
VCC = 1.6V ±2.0 ±3.0
lsb
VCC = 3.6V ±1.5 ±2.5
VREF=AVCC
VCC = 1.6V ±2.0 ±4.0
VCC = 3.6V ±1.5 ±4.0
VREF=INT1V
VCC = 1.6V ±5.0
VCC = 3.6V ±5.0
DNL (1) Differential non-linearity
VREF=Ext 1.0V
VCC = 1.6V ±1.5 3.0
lsb
VCC = 3.6V ±0.6 1.5
VREF=AVCC
VCC = 1.6V ±1.0 3.5
VCC = 3.6V ±0.6 1.5
VREF=INT1V
VCC = 1.6V ±4.5
VCC = 3.6V ±4.5
Gain error After calibration <4.0 lsb
Gain calibration step size 4.0 lsb
Gain calibration drift VREF= Ext 1.0V <0.2 mV/K
Offset error After calibration <1.0 lsb
Offset calibration step size 1.0
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36.2.8 Analog Comparator Characteristics
Table 36-47. Analog Comparator characteristics.
36.2.9 Bandgap and Internal 1.0V Reference Characteristics
Table 36-48. Bandgap and Internal 1.0V reference characteristics.
Symbol Parameter Condition Min. Typ. Max. Units
Voff Input offset voltage <±10 mV
Ilk Input leakage current <1 nA
Input voltage range -0.1 AVCC V
AC startup time 100 µs
Vhys1 Hysteresis, none 0mV
Vhys2 Hysteresis, small
mode = High Speed (HS) 13
mV
mode = Low Power (LP) 30
Vhys3 Hysteresis, large
mode = HS 30
mV
mode = LP 60
tdelay Propagation delay
VCC = 3.0V, T= 85°C mode = HS 30 90
ns
mode = HS 30
VCC = 3.0V, T= 85°C mode = LP 130 500
mode = LP 130
64-level voltage scaler Integral non-linearity (INL) 0.3 0.5 lsb
Symbol Parameter Condition Min. Typ. Max. Units
Startup time
As reference for ADC or DAC 1 ClkPER + 2.5µs
µs
As input voltage to ADC and AC 1.5
Bandgap voltage 1.1 V
INT1V Internal 1.00V reference T= 85°C, after calibration 0.99 1.0 1.01 V
Variation over voltage and temperature Relative to T= 85°C, VCC = 3.0V ±1.5 %
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36.2.10 Brownout Detection Characteristics
Table 36-49. Brownout detection characteristics.
36.2.11 External Reset Characteristics
Table 36-50. External reset characteristics.
36.2.12 Power-on Reset Characteristics
Table 36-51. Power-on reset characteristics.
Note: 1. VPOT- values are only valid when BOD is disabled. When BOD is enabled VPOT- = VPOT+.
Symbol Parameter Condition Min. Typ. Max. Units
VBOT
BOD level 0 falling VCC 1.60 1.62 1.72
V
BOD level 1 falling VCC 1.8
BOD level 2 falling VCC 2.0
BOD level 3 falling VCC 2.2
BOD level 4 falling VCC 2.4
BOD level 5 falling VCC 2.6
BOD level 6 falling VCC 2.8
BOD level 7 falling VCC 3.0
tBOD Detection time
Continuous mode 0.4
µs
Sampled mode 1000
VHYST Hysteresis 1.2 %
Symbol Parameter Condition Min. Typ. Max. Units
tEXT Minimum reset pulse width 95 1000 ns
VRST
Reset threshold voltage (VIH)
VCC = 2.7 - 3.6V 0.60*VCC
V
VCC = 1.6 - 2.7V 0.60*VCC
Reset threshold voltage (VIL)
VCC = 2.7 - 3.6V 0.50*VCC
VCC = 1.6 - 2.7V 0.40*VCC
RRST Reset pin Pull-up Resistor 25 kΩ
Symbol Parameter Condition Min. Typ. Max. Units
VPOT- (1) POR threshold voltage falling VCC
VCC falls faster than 1V/ms 0.4 1.0
V
VCC falls at 1V/ms or slower 0.8 1.0
VPOT+ POR threshold voltage rising VCC 1.3 1.59 V
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36.2.13 Flash and EEPROM Memory Characteristics
Table 36-52. Endurance and data retention.
Table 36-53. Programming time.
Notes: 1. Programming is timed from the 2MHz internal oscillator.
2. EEPROM is not erased if the EESAVE fuse is programmed.
Symbol Parameter Condition Min. Typ. Max. Units
Flash
Write/Erase cycles
25°C 10K
Cycle85°C 10K
105°C 2K
Data retention
25°C 100
Year85°C 25
105°C 10
EEPROM
Write/Erase cycles
25°C 100K
Cycle85°C 100K
105°C 30K
Data retention
25°C 100
Year85°C 25
105°C 10
Symbol Parameter Condition Min. Typ.(1) Max. Units
Chip Erase 32KB Flash, EEPROM(2) and SRAM erase 50 ms
Application Erase Section erase 6ms
Flash
Page erase 4
msPage write 4
Atomic page erase and write 8
EEPROM
Page erase 4
msPage write 4
Atomic page erase and write 8
106
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36.2.14 Clock and Oscillator Characteristics
36.2.14.1 Calibrated 32.768kHz Internal Oscillator characteristics
Table 36-54. 32.768kHz internal oscillator characteristics.
36.2.14.2 Calibrated 2MHz RC Internal Oscillator characteristics
Table 36-55. 2MHz internal oscillator characteristics.
36.2.14.3 Calibrated and tunable 32MHz internal oscillator characteristics
Table 36-56. 32MHz internal oscillator characteristics.
36.2.14.4 32kHz Internal ULP Oscillator characteristics
Table 36-57. 32kHz internal ULP oscillator characteristics.
Symbol Parameter Condition Min. Typ. Max. Units
Frequency 32.768 kHz
Factory calibration accuracy T = 85°C, VCC = 3.0V -0.5 0.5 %
User calibration accuracy -0.5 0.5 %
Symbol Parameter Condition Min. Typ. Max. Units
Frequency range DFLL can tune to this frequency over
voltage and temperature 1.8 2.2 MHz
Factory calibrated frequency 2.0 MHz
Factory calibration accuracy T = 85°C, VCC= 3.0V -1.5 1.5 %
User calibration accuracy -0.2 0.2 %
DFLL calibration stepsize 0.21 %
Symbol Parameter Condition Min. Typ. Max. Units
Frequency range DFLL can tune to this frequency over
voltage and temperature 30 55 MHz
Factory calibrated frequency 32 MHz
Factory calibration accuracy T = 85°C, VCC= 3.0V -1.5 1.5 %
User calibration accuracy -0.2 0.2 %
DFLL calibration step size 0.22 %
Symbol Parameter Condition Min. Typ. Max. Units
Output frequency 32 kHz
Accuracy -30 30 %
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36.2.14.5 Internal Phase Locked Loop (PLL) characteristics
Table 36-58. Internal PLL characteristics.
Note: 1. The maximum output frequency vs. supply voltage is linear between 1.8V and 2.7V, and can never be higher than four times the maximum CPU frequency.
36.2.14.6 External clock characteristics
Figure 36-10. External clock drive waveform
Table 36-59. External clock used as system clock without prescaling.
Note: 1. The maximum frequency vs. supply voltage is linear between 1.6V and 2.7V, and the same applies for all other parameters with supply voltage conditions.
Symbo
lParameter Condition Min. Typ. Max. Units
fIN Input frequency Output frequency must be within fOUT 0.4 64 MHz
fOUT Output frequency (1) VCC= 1.6 - 1.8V 20 48
MHz
VCC= 2.7 - 3.6V 20 128
Start-up time 25 µs
Re-lock time 25 µs
tCH
tCL
tCK
tCH
VIL1
VIH1
tCR tCF
Symbol Parameter Condition Min. Typ. Max. Units
1/tCK Clock Frequency (1) VCC = 1.6 - 1.8V 012
MHz
VCC = 2.7 - 3.6V 032
tCK Clock Period
VCC = 1.6 - 1.8V 83.3
ns
VCC = 2.7 - 3.6V 31.5
tCH Clock High Time
VCC = 1.6 - 1.8V 30.0
ns
VCC = 2.7 - 3.6V 12.5
tCL Clock Low Time
VCC = 1.6 - 1.8V 30.0
ns
VCC = 2.7 - 3.6V 12.5
tCR Rise Time (for maximum frequency)
VCC = 1.6 - 1.8V 10
ns
VCC = 2.7 - 3.6V 3
tCF Fall Time (for maximum frequency)
VCC = 1.6 - 1.8V 10
ns
VCC = 2.7 - 3.6V 3
ΔtCK Change in period from one clock cycle to the next 10 %
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Table 36-60. External clock with prescaler (1)for system clock.
Notes: 1. System Clock Prescalers must be set so that maximum CPU clock frequency for device is not exceeded.
2. The maximum frequency vs. supply voltage is linear between 1.6V and 2.7V, and the same applies for all other parameters with supply voltage conditions.
36.2.14.7 External 16MHz crystal oscillator and XOSC characteristic
Table 36-61. External 16MHz crystal oscillator and XOSC characteristics.
Symbol Parameter Condition Min. Typ. Max. Units
1/tCK Clock Frequency (2) VCC = 1.6 - 1.8V 090
MHz
VCC = 2.7 - 3.6V 0142
tCK Clock Period
VCC = 1.6 - 1.8V 11
ns
VCC = 2.7 - 3.6V 7
tCH Clock High Time
VCC = 1.6 - 1.8V 4.5
ns
VCC = 2.7 - 3.6V 2.4
tCL Clock Low Time
VCC = 1.6 - 1.8V 4.5
ns
VCC = 2.7 - 3.6V 2.4
tCR Rise Time (for maximum frequency)
VCC = 1.6 - 1.8V 1.5
ns
VCC = 2.7 - 3.6V 1.0
tCF Fall Time (for maximum frequency)
VCC = 1.6 - 1.8V 1.5
ns
VCC = 2.7 - 3.6V 1.0
ΔtCK Change in period from one clock cycle to the next 10 %
Symbol Parameter Condition Min. Typ. Max. Units
Cycle to cycle jitter
XOSCPWR=0
FRQRANGE=0 <10
nsFRQRANGE=1, 2, or 3 <1
XOSCPWR=1 <1
Long term jitter
XOSCPWR=0
FRQRANGE=0 <6
nsFRQRANGE=1, 2, or 3 <0.5
XOSCPWR=1 <0.5
Frequency error
XOSCPWR=0
FRQRANGE=0 <0.1
%
FRQRANGE=1 <0.05
FRQRANGE=2 or 3 <0.005
XOSCPWR=1 <0.005
Duty cycle
XOSCPWR=0
FRQRANGE=0 40
%
FRQRANGE=1 42
FRQRANGE=2 or 3 45
XOSCPWR=1 48
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Note: 1. Numbers for negative impedance are not tested in production but guaranteed from design and characterization.
RQ
Negative
impedance (1)
XOSCPWR=0,
FRQRANGE=0
0.4MHz resonator,
CL=100pF 2.4k
Ω
1MHz crystal, CL=20pF 8.7k
2MHz crystal, CL=20pF 2.1k
XOSCPWR=0,
FRQRANGE=1,
CL=20pF
2MHz crystal 4.2k
8MHz crystal 250
9MHz crystal 195
XOSCPWR=0,
FRQRANGE=2,
CL=20pF
8MHz crystal 360
9MHz crystal 285
12MHz crystal 155
XOSCPWR=0,
FRQRANGE=3,
CL=20pF
9MHz crystal 365
12MHz crystal 200
16MHz crystal 105
XOSCPWR=1,
FRQRANGE=0,
CL=20pF
9MHz crystal 435
12MHz crystal 235
16MHz crystal 125
XOSCPWR=1,
FRQRANGE=1,
CL=20pF
9MHz crystal 495
12MHz crystal 270
16MHz crystal 145
XOSCPWR=1,
FRQRANGE=2,
CL=20pF
12MHz crystal 305
16MHz crystal 160
XOSCPWR=1,
FRQRANGE=3,
CL=20pF
12MHz crystal 380
16MHz crystal 205
ESR SF = Safety factor min(RQ)/SF kΩ
CXTAL1
Parasitic
capacitance XTAL1
pin
5.4 pF
CXTAL2
Parasitic
capacitance XTAL2
pin
7.1 pF
CLOAD
Parasitic
capacitance load 3.07 pF
Symbol Parameter Condition Min. Typ. Max. Units
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36.2.14.8 External 32.768kHz crystal oscillator and TOSC characteristics
Table 36-62. External 32.768kHz crystal oscillator and TOSC characteristics.
Note: 1. See Figure 36-11 for definition.
Figure 36-11.TOSC input capacitance.
The parasitic capacitance between the TOSC pins is CL1 + CL2 in series as seen from the crystal when oscillating
without external capacitors.
Symbol Parameter Condition Min. Typ. Max. Units
ESR/R1 Recommended crystal equivalent
series resistance (ESR)
Crystal load capacitance 6.5pF 60
kΩ
Crystal load capacitance 9.0pF 35
CTOSC1 Parasitic capacitance TOSC1 pin
5.4
pF
Alternate TOSC location 4.0
CTOSC2 Parasitic capacitance TOSC2 pin
7.1
pF
Alternate TOSC location 4.0
Recommended safety factor capacitance load matched to
crystal specification 3.0
C
L1
C
L2
2CS
O
T
1
CS
O
TDevice internal
External
32.768kHz crystal
111
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36.2.15 SPI Characteristics
Figure 36-12. SPI timing requirements in master mode.
Figure 36-13. SPI timing requirements in slave mode.
MSB LSB
MSB LSB
tMOS
tMIS tMIH
tSCKW
tSCK
tMOH tMOH
tSCKF
tSCKR
tSCKW
MOSI
(Data output)
MISO
(Data input)
SCK
(CPOL = 1)
SCK
(CPOL = 0)
SS
MSB LSB
MSB LSB
tSIS tSIH
tSSCKW
tSSCKW
tSSCK
tSSH
tSOSSH
tSCKR tSCKF
tSOS
tSSS
tSOSSS
MISO
(Data output)
MOSI
(Data input)
SCK
(CPOL = 1)
SCK
(CPOL = 0)
SS
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Table 36-63. SPI timing characteristics and requirements.
Symbol Parameter Condition Min. Typ. Max. Units
tSCK SCK period Master (See Table 21-4 in
XMEGA AU Manual)
ns
tSCKW SCK high/low width Master 0.5×SCK
tSCKR SCK rise time Master 2.7
tSCKF SCK fall time Master 2.7
tMIS MISO setup to SCK Master 10
tMIH MISO hold after SCK Master 10
tMOS MOSI setup SCK Master 0.5×SCK
tMOH MOSI hold after SCK Master 1.0
tSSCK Slave SCK Period Slave 4×t ClkPER
tSSCKW SCK high/low width Slave 2×t ClkPER
tSSCKR SCK rise time Slave 1600
tSSCKF SCK fall time Slave 1600
tSIS MOSI setup to SCK Slave 3.0
tSIH MOSI hold after SCK Slave t ClkPER
tSSS SS setup to SCK Slave 21
tSSH SS hold after SCK Slave 20
tSOS MISO setup SCK Slave 8.0
tSOH MISO hold after SCK Slave 13
tSOSS MISO setup after SS low Slave 11
tSOSH MISO hold after SS high Slave 8.0
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36.2.16 Two-Wire Interface Characteristics
Table 36-64 describes the requirements for devices connected to the Two-Wire Interface Bus. The Atmel AVR
XMEGA Two-Wire Interface meets or exceeds these requirements under the noted conditions. Timing symbols refer
to Figure 36-14.
Figure 36-14. Two-wire interface bus timing.
Table 36-64. Two-wire interface characteristics.
tHD;STA
tof
SDA
SCL
tLOW
tHIGH
tSU;STA
tBUF
tr
tHD;DAT tSU;DAT tSU;STO
Symbol Parameter Condition Min. Typ. Max. Units
VIH Input high voltage 0.7VCC VCC+0.5 V
VIL Input low voltage 0.5 0.3×VCC V
Vhys Hysteresis of Schmitt trigger inputs 0.05VCC (1) V
VOL Output low voltage 3mA, sink current 00.4 V
trRise time for both SDA and SCL 20+0.1Cb (1)(2) 300 ns
tof Output fall time from VIHmin to VILmax 10pF < Cb < 400pF (2) 20+0.1Cb (1)(2) 250 ns
tSP Spikes suppressed by Input filter 050 ns
IIInput current for each I/O Pin 0.1VCC < VI < 0.9VCC -10 10 µA
CICapacitance for each I/O Pin 10 pF
fSCL SCL clock frequency fPER (3)>max(10fSCL, 250kHz) 0400 kHz
RPValue of pull-up resistor
fSCL ≤ 100kHz
Ω
fSCL > 100kHz
tHD;STA Hold time (repeated) START condition
fSCL ≤ 100kHz 4.0
µs
fSCL > 100kHz 0.6
tLOW Low period of SCL Clock
fSCL ≤ 100kHz 4.7
µs
fSCL > 100kHz 1.3
tHIGH High period of SCL Clock
fSCL ≤ 100kHz 4.0
µs
fSCL > 100kHz 0.6
tSU;STA
Set-up time for a repeated START
condition
fSCL ≤ 100kHz 4.7
µs
fSCL > 100kHz 0.6
VCC 0.4V–
3mA
----------------------------
100ns
Cb
---------------
300ns
Cb
---------------
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Notes: 1. Required only for fSCL > 100kHz.
2. Cb = Capacitance of one bus line in pF.
3. fPER = Peripheral clock frequency.
tHD;DAT Data hold time
fSCL ≤ 100kHz 03.45
µs
fSCL > 100kHz 00.9
tSU;DAT Data setup time
fSCL ≤ 100kHz 250
ns
fSCL > 100kHz 100
tSU;STO Setup time for STOP condition
fSCL ≤ 100kHz 4.0
µs
fSCL > 100kHz 0.6
tBUF
Bus free time between a STOP and
START condition
fSCL ≤ 100kHz 4.7
µs
fSCL > 100kHz 1.3
Symbol Parameter Condition Min. Typ. Max. Units
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36.3 ATxmega64A4U
36.3.1 Absolute Maximum Ratings
Stresses beyond those listed in Table 36-65 may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or other conditions beyond those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
Table 36-65. Absolute maximum ratings.
36.3.2 General Operating Ratings
The device must operate within the ratings listed in Table 36-66 in order for all other electrical characteristics and
typical characteristics of the device to be valid.
Table 36-66. General operating conditions.
Table 36-67. Operating voltage and frequency.
The maximum CPU clock frequency depends on VCC. As shown in Figure 36-15 the Frequency vs. VCC curve is linear
between 1.8V < VCC <2.7V.
Symbol Parameter Condition Min. Typ. Max. Units
VCC Power supply voltage -0.3 4.0 V
IVCC Current into a VCC pin 200 mA
IGND Current out of a Gnd pin 200 mA
VPIN Pin voltage with respect to Gnd and VCC -0.5 VCC+0.5 V
IPIN I/O pin sink/source current -25 25 mA
TAStorage temperature -65 150 °C
TjJunction temperature 150 °C
Symbol Parameter Condition Min. Typ. Max. Units
VCC Power supply voltage 1.60 3.6 V
AVCC Analog supply voltage 1.60 3.6 V
TATemperature range -40 85 °C
TjJunction temperature -40 105 °C
Symbol Parameter Condition Min. Typ. Max. Units
ClkCPU CPU clock frequency
VCC = 1.6V 012
MHz
VCC = 1.8V 012
VCC = 2.7V 032
VCC = 3.6V 032
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Figure 36-15.Maximum Frequency vs. VCC.
1.8
12
32
MHz
V
2.7 3.6
1.6
Safe Operating Area
117
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36.3.3 Current consumption
Table 36-68. Current consumption for Active mode and sleep modes.
Notes: 1. All Power Reduction Registers set.
2. Maximum limits are based on characterization, and not tested in production.
Symbol Parameter Condition Min. Typ. Max. Units
ICC
Active power
consumption (1)
32kHz, Ext. Clk
VCC = 1.8V 52
µA
VCC = 3.0V 132
1MHz, Ext. Clk
VCC = 1.8V 223
VCC = 3.0V 476
2MHz, Ext. Clk
VCC = 1.8V 400 600
VCC = 3.0V
0.8 1.4
mA
32MHz, Ext. Clk 8.2 12
Idle power
consumption (1)
32kHz, Ext. Clk
VCC = 1.8V 2.4
µA
VCC = 3.0V 3.5
1MHz, Ext. Clk
VCC = 1.8V 57
VCC = 3.0V 110
2MHz, Ext. Clk
VCC = 1.8V 115 225
VCC = 3.0V
216 350
32MHz, Ext. Clk 3.5 5.5 mA
Power-down power
consumption
T = 25°C
VCC = 3.0V
0.1 1.0
µA
T = 85°C 1.2 4.5
T = 105°C 2.4 6.0
WDT and Sampled BOD enabled,
T = 25°C
VCC = 3.0V
1.4 3.0
WDT and Sampled BOD enabled,
T = 85°C 2.4 6.0
WDT and Sampled BOD enabled,
T = 105°C 3.5 8.0
Power-save power
consumption (2)
RTC from ULP clock, WDT and
sampled BOD enabled, T = 25°C
VCC = 1.8V 1.2
µA
VCC = 3.0V 1.5
RTC from 1.024kHz low power
32.768kHz TOSC, T = 25°C
VCC = 1.8V 0.6 2.0
VCC = 3.0V 0.7 2.0
RTC from low power 32.768kHz TOSC,
T = 25°C
VCC = 1.8V 0.8 3.0
VCC = 3.0V 1.0 3.0
Reset power consumption Current through RESET pin substracted VCC = 3.0V 140
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Table 36-69. Current consumption for modules and peripherals.
Note: 1. All parameters measured as the difference in current consumption between module enabled and disabled. All data at VCC = 3.0V, ClkSYS = 1MHz external
clock without prescaling, T = 25°C unless other conditions are given.
Symbol Parameter Condition (1) Min. Typ. Max. Units
ICC
ULP oscillator 1.0 µA
32.768kHz int. oscillator 29 µA
2MHz int. oscillator
85
µA
DFLL enabled with 32.768kHz int. osc. as reference 120
32MHz int. oscillator
300
µA
DFLL enabled with 32.768kHz int. osc. as reference 465
PLL 20x multiplication factor,
32MHz int. osc. DIV4 as reference 320 µA
Watchdog timer 1.0 µA
BOD
Continuous mode 138
µA
Sampled mode, includes ULP oscillator 1.0
Internal 1.0V reference 103 µA
Temperature sensor 100 µA
ADC 250ksps
VREF = Ext ref
3.0
mA
CURRLIMIT = LOW 2.6
CURRLIMIT = MEDIUM 2.1
CURRLIMIT = HIGH 1.6
DAC
250ksps
VREF = Ext ref
No load
Normal mode 1.9
mA
Low power mode 1.1
AC
High speed mode 330
µA
Low pPower mode 130
DMA 615KBps between I/O registers and SRAM 108 µA
Timer/counter 16 µA
USART Rx and Tx enabled, 9600 BAUD 2.5 µA
Flash memory and EEPROM programming 8.0 mA
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36.3.4 Wake-up time from sleep modes
Table 36-70. Device wake-up time from sleep modes with various system clock sources.
Note: 1. The wake-up time is the time from the wake-up request is given until the peripheral clock is available on pin, see Figure 36-16. All peripherals and modules
start execution from the first clock cycle, expect the CPU that is halted for four clock cycles before program execution starts.
Figure 36-16.Wake-up time definition.
Symbol Parameter Condition Min. Typ. (1) Max. Units
twakeup
Wake-up time from idle,
standby, and extended standby
mode
External 2MHz clock 2.0
µs
32.768kHz internal oscillator 120
2MHz internal oscillator 2.0
32MHz internal oscillator 0.2
Wake-up time from power-save
and power-down mode
External 2MHz clock 4.5
µs
32.768kHz internal oscillator 320
2MHz internal oscillator 9.0
32MHz internal oscillator 4.0
Wakeup request
Clock output
Wakeup time
120
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36.3.5 I/O Pin Characteristics
The I/O pins comply with the JEDEC LVTTL and LVCMOS specification and the high- and low level input and output
voltage limits reflect or exceed this specification.
Table 36-71. I/O pin characteristics.
Notes: 1. The sum of all IOH for PORTA and PORTB must not exceed 100mA.
The sum of all IOH for PORTC must not exceed 200mA.
The sum of all IOH for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOH for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
2. The sum of all IOL for PORTA and PORTB must not exceed 100mA.
The sum of all IOL for PORTC must not exceed 200mA.
The sum of all IOL for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOL for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
Symbol Parameter Condition Min. Typ. Max. Units
IOH (1)/
IOL (2) I/O pin source/sink current -20 20 mA
VIH High level input voltage
VCC = 2.7- 3.6V 2.0 VCC+0.3
VVCC = 2.0 - 2.7V 0.7*VCC VCC+0.3
VCC = 1.6 - 2.0V 0.8*VCC VCC+0.3
VIL Low level input voltage
VCC = 2.7- 3.6V -0.3 0.8
VVCC = 2.0 - 2.7V -0.3 0.3*VCC
VCC = 1.6 - 2.0V -0.3 0.2*VCC
VOH High level output voltage
VCC = 3.0 - 3.6V IOH = -2mA 2.4 0.94*VCC
V
VCC = 2.3 - 2.7V
IOH = -1mA 2.0 0.96*VCC
IOH = -2mA 1.7 0.92*VCC
VCC = 3.3V IOH = -8mA 2.6 2.9
VCC = 3.0V IOH = -6mA 2.1 2.6
VCC = 1.8V IOH = -2mA 1.4 1.6
VOL Low level output voltage
VCC = 3.0 - 3.6V IOL = 2mA 0.02*VCC 0.4
V
VCC = 2.3 - 2.7V
IOL = 1mA 0.01*VCC 0.4
IOL = 2mA 0.02*VCC 0.7
VCC = 3.3V IOL = 15mA 0.4 0.76
VCC = 3.0V IOL = 10mA 0.3 0.64
VCC = 1.8V IOL = 5mA 0.2 0.46
IIN Input leakage current
T = 25°C <0.01 0.1
µA
XOSC and
TOSC pins <0.02 1.1
RPPull/buss keeper resistor 24 kΩ
trRise time No load
4.0
ns
slew rate limitation 7.0
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36.3.6 ADC characteristics
Table 36-72. Power supply, reference and input range.
Table 36-73. Clock and timing.
Symbol Parameter Condition Min. Typ. Max. Units
AVCC Analog supply voltage VCC- 0.3 VCC+ 0.3 V
VREF Reference voltage 1.0 AVCC- 0.6 V
Rin Input resistance Switched 4.0 kΩ
Csample Input capacitance Switched 4.4 pF
RAREF Reference input resistance (leakage only) >10 MΩ
CAREF Reference input capacitance Static load 7.0 pF
VIN Input range -0.1 AVCC+0.1 V
Conversion range Differential mode, Vinp - Vinn -VREF VREF V
Conversion range Single ended unsigned mode, Vinp -ΔV VREF-ΔV V
∆VFixed offset voltage 190 lsb
Symbol Parameter Condition Min. Typ. Max. Units
ClkADC ADC clock frequency
Maximum is 1/4 of peripheral clock
frequency 100 2000
kHz
Measuring internal signals 100 125
fADC Sample rate
Current limitation (CURRLIMIT) off 100 2000
ksps
CURRLIMIT = LOW 100 1500
CURRLIMIT = MEDIUM 100 1000
CURRLIMIT = HIGH 100 500
Sampling time 1/2 ClkADC cycle 0.25 5µs
Conversion time (latency) (RES+2)/2+(GAIN !=0)
RES (Resolution) = 8 or 12 5 8 ClkADC
cycles
Start-up time ADC clock cycles 12 24 ClkADC
cycles
ADC settling time
After changing reference or input mode 7 7 ClkADC
cycles
After ADC flush 1 1
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Table 36-74. Accuracy characteristics.
Notes: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% input voltage range.
2. Unless otherwise noted all linearity, offset and gain error numbers are valid under the condition that external VREF is used.
Table 36-75. Gain stage characteristics.
Symbol Parameter Condition (2) Min. Typ. Max. Units
RES Resolution Programmable to 8 or 12 bit 812 12 Bits
INL (1) Integral non-linearity
500ksps
VCC-1.0V < VREF< VCC-0.6V ±1.2 ±2
lsb
All VREF ±1.5 ±3
2000ksps
VCC-1.0V < VREF< VCC-0.6V ±1.0 ±2
All VREF ±1.5 ±3
DNL (1) Differential non-linearity guaranteed monotonic <±0.8 <±1 lsb
Offset error
-1 mV
Temperature drift <0.01 mV/K
Operating voltage drift <0.6 mV/V
Gain error
Differential
mode
External reference -1
mV
AVCC/1.6 10
AVCC/2.0 8
Bandgap ±5
Temperature drift <0.02 mV/K
Operating voltage drift <0.5 mV/V
Noise Differential mode, shorted input
2msps, VCC = 3.6V, ClkPER = 16MHz 0.4 mV
rms
Symbol Parameter Condition Min. Typ. Max. Units
Rin Input resistance Switched in normal mode 4.0 kΩ
Csample Input capacitance Switched in normal mode 4.4 pF
Signal range Gain stage output 0 VCC- 0.6 V
Propagation delay ADC conversion rate 1.0 ClkADC
cycles
Sample rate Same as ADC 100 1000 kHz
INL (1) Integral non-linearity 500ksps All gain
settings ±1.5 ±4.0 lsb
Gain error
1x gain, normal mode -0.8
%8x gain, normal mode -2.5
64x gain, normal mode -3.5
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Note: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% input voltage range.
36.3.7 DAC Characteristics
Table 36-76. Power supply, reference and output range.
Table 36-77. Clock and timing.
Offset error,
input referred
1x gain, normal mode -2
mV8x gain, normal mode -5
64x gain, normal mode -4
Noise
1x gain, normal mode
VCC = 3.6V
Ext. VREF
0.5
mV
rms
8x gain, normal mode 1.5
64x gain, normal mode 11
Symbol Parameter Condition Min. Typ. Max. Units
Symbol Parameter Condition Min. Typ. Max. Units
AVCC Analog supply voltage VCC- 0.3 VCC+ 0.3 V
AVREF External reference voltage 1.0 VCC- 0.6 V
Rchannel DC output impedance 50 Ω
Linear output voltage range 0.15 AVCC-0.15 V
RAREF Reference input resistance >10 MΩ
CAREF Reference input capacitance Static load 7pF
Minimum resistance load 1.0 kΩ
Maximum capacitance load
100 pF
1000Ω serial resistance 1.0 nF
Output sink/source
Operating within accuracy specification AVCC/1000
mA
Safe operation 10
Symbol Parameter Condition Min. Typ. Max. Units
fDAC Conversion rate Cload=100pF,
maximum step size
Normal mode 01000
ksps
Low power mode 500
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Table 36-78. Accuracy characteristics.
Note: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% output voltage range.
Symbol Parameter Condition Min. Typ. Max. Units
RES Input resolution 12 Bits
INL (1) Integral non-linearity
VREF= Ext 1.0V
VCC = 1.6V ±2.0 ±3.0
lsb
VCC = 3.6V ±1.5 ±2.5
VREF=AVCC
VCC = 1.6V ±2.0 ±4.0
VCC = 3.6V ±1.5 ±4.0
VREF=INT1V
VCC = 1.6V ±5.0
VCC = 3.6V ±5.0
DNL (1) Differential non-linearity
VREF=Ext 1.0V
VCC = 1.6V ±1.5 3.0
lsb
VCC = 3.6V ±0.6 1.5
VREF=AVCC
VCC = 1.6V ±1.0 3.5
VCC = 3.6V ±0.6 1.5
VREF=INT1V
VCC = 1.6V ±4.5
VCC = 3.6V ±4.5
Gain error After calibration <4.0 lsb
Gain calibration step size 4.0 lsb
Gain calibration drift VREF= Ext 1.0V <0.2 mV/K
Offset error After calibration <1.0 lsb
Offset calibration step size 1.0
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36.3.8 Analog Comparator Characteristics
Table 36-79. Analog Comparator characteristics.
36.3.9 Bandgap and Internal 1.0V Reference Characteristics
Table 36-80. Bandgap and Internal 1.0V reference characteristics.
Symbol Parameter Condition Min. Typ. Max. Units
Voff Input offset voltage <±10 mV
Ilk Input leakage current <1 nA
Input voltage range -0.1 AVCC V
AC startup time 100 µs
Vhys1 Hysteresis, none 0mV
Vhys2 Hysteresis, small
mode = High Speed (HS) 20
mV
mode = Low Power (LP) 30
Vhys3 Hysteresis, large
mode = HS 35
mV
mode = LP 60
tdelay Propagation delay
VCC = 3.0V, T= 85°C mode = HS 30 90
ns
mode = HS 30
VCC = 3.0V, T= 85°C mode = LP 130 500
mode = LP 130
64-level voltage scaler Integral non-linearity (INL) 0.3 0.5 lsb
Symbol Parameter Condition Min. Typ. Max. Units
Startup time
As reference for ADC or DAC 1 ClkPER + 2.5µs
µs
As input voltage to ADC and AC 1.5
Bandgap voltage 1.1 V
INT1V Internal 1.00V reference T= 85°C, after calibration 0.99 11.01 V
Variation over voltage and temperature Relative to T= 85°C, VCC = 3.0V ±1.5 %
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36.3.10 Brownout Detection Characteristics
Table 36-81. Brownout detection characteristics.
36.3.11 External Reset Characteristics
Table 36-82. External reset characteristics.
36.3.12 Power-on Reset Characteristics
Table 36-83. Power-on reset characteristics.
Note: 1. VPOT- values are only valid when BOD is disabled. When BOD is enabled VPOT- = VPOT+.
Symbol Parameter Condition Min. Typ. Max. Units
VBOT
BOD level 0 falling VCC 1.50 1.62 1.72
V
BOD level 1 falling VCC 1.8
BOD level 2 falling VCC 2.0
BOD level 3 falling VCC 2.2
BOD level 4 falling VCC 2.4
BOD level 5 falling VCC 2.6
BOD level 6 falling VCC 2.8
BOD level 7 falling VCC 3.0
tBOD Detection time
Continuous mode 0.4
µs
Sampled mode 1000
VHYST Hysteresis 1.2 %
Symbol Parameter Condition Min. Typ. Max. Units
tEXT Minimum reset pulse width 1000 95 ns
VRST
Reset threshold voltage (VIH)
VCC = 2.7 - 3.6V 0.60×VCC
V
VCC = 1.6 - 2.7V 0.60×VCC
Reset threshold voltage (VIL)
VCC = 2.7 - 3.6V 0.50×VCC
VCC = 1.6 - 2.7V 0.40×VCC
RRST Reset pin Pull-up Resistor 25 kΩ
Symbol Parameter Condition Min. Typ. Max. Units
VPOT- (1) POR threshold voltage falling VCC
VCC falls faster than 1V/ms 0.4 1.0
V
VCC falls at 1V/ms or slower 0.8 1.0
VPOT+ POR threshold voltage rising VCC 1.3 1.59
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36.3.13 Flash and EEPROM Memory Characteristics
Table 36-84. Endurance and data retention.
Table 36-85. Programming time.
Notes: 1. Programming is timed from the 2MHz internal oscillator.
2. EEPROM is not erased if the EESAVE fuse is programmed.
Symbol Parameter Condition Min. Typ. Max. Units
Flash
Write/Erase cycles
25°C 10K
Cycle85°C 10K
105°C 2K
Data retention
25°C 100
Year85°C 25
105°C 10
EEPROM
Write/Erase cycles
25°C 100K
Cycle85°C 100K
105°C 30K
Data retention
25°C 100
Year85°C 25
105°C 10
Symbol Parameter Condition Min. Typ.(1) Max. Units
Chip Erase 64KB Flash, EEPROM(2) and SRAM Erase 55 ms
Application Erase Section erase 6ms
Flash
Page erase 4
msPage write 4
Atomic page erase and write 8
EEPROM
Page erase 4
msPage write 4
Atomic page erase and write 8
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36.3.14 Clock and Oscillator Characteristics
36.3.14.1 Calibrated 32.768kHz Internal Oscillator characteristics
Table 36-86. 32.768kHz internal oscillator characteristics.
36.3.14.2 Calibrated 2MHz RC Internal Oscillator characteristics
Table 36-87. 2MHz internal oscillator characteristics.
36.3.14.3 Calibrated and tunable 32MHz internal oscillator characteristics
Table 36-88. 32MHz internal oscillator characteristics.
Symbol Parameter Condition Min. Typ. Max. Units
Frequency 32.768 kHz
Factory calibration accuracy T = 85°C, VCC = 3.0V -0.5 0.5 %
User calibration accuracy -0.5 0.5 %
Symbol Parameter Condition Min. Typ. Max. Units
Frequency range DFLL can tune to this frequency over
voltage and temperature 1.8 2.2 MHz
Factory calibrated frequency 2.0 MHz
Factory calibration accuracy T = 85°C, VCC= 3.0V -1.5 1.5 %
User calibration accuracy -0.2 0.2 %
DFLL calibration stepsize 0.21 %
Symbol Parameter Condition Min. Typ. Max. Units
Frequency range DFLL can tune to this frequency over
voltage and temperature 30 55 MHz
Factory calibrated frequency 32 MHz
Factory calibration accuracy T = 85°C, VCC= 3.0V -1.5 1.5 %
User calibration accuracy -0.2 0.2 %
DFLL calibration step size 0.22 %
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36.3.14.4 32kHz Internal ULP Oscillator characteristics
Table 36-89. 32kHz internal ULP oscillator characteristics.
36.3.14.5 Internal Phase Locked Loop (PLL) characteristics
Table 36-90. Internal PLL characteristics.
Note: 1. The maximum output frequency vs. supply voltage is linear between 1.8V and 2.7V, and can never be higher than four times the maximum CPU frequency.
36.3.14.6 External clock characteristics
Figure 36-17. External clock drive waveform
Table 36-91. External clock used as system clock without prescaling.
Symbol Parameter Condition Min. Typ. Max. Units
Factory calibrated frequency 32 kHz
Factory calibrated accuracy T = 85°C, VCC = 3.0V -12 12 %
Accuracy -30 30 %
Symbo
lParameter Condition Min. Typ. Max. Units
fIN Input frequency Output frequency must be within fOUT 0.4 64 MHz
fOUT Output frequency (1) VCC= 1.6 - 1.8V 20 48
MHz
VCC= 2.7 - 3.6V 20 128
Start-up time 25 µs
Re-lock time 25 µs
tCH
tCL
tCK
tCH
VIL1
VIH1
tCR tCF
Symbol Parameter Condition Min. Typ. Max. Units
1/tCK Clock Frequency (1) VCC = 1.6 - 1.8V 012
MHz
VCC = 2.7 - 3.6V 032
tCK Clock Period
VCC = 1.6 - 1.8V 83.3
ns
VCC = 2.7 - 3.6V 31.5
tCH Clock High Time
VCC = 1.6 - 1.8V 30.0
ns
VCC = 2.7 - 3.6V 12.5
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Note: 1. The maximum frequency vs. supply voltage is linear between 1.6V and 2.7V, and the same applies for all other parameters with supply voltage conditions.
Table 36-92. External clock with prescaler (1)for system clock.
Notes: 1. System Clock Prescalers must be set so that maximum CPU clock frequency for device is not exceeded.
2. The maximum frequency vs. supply voltage is linear between 1.6V and 2.7V, and the same applies for all other parameters with supply voltage conditions.
36.3.14.7 External 16MHz crystal oscillator and XOSC characteristic
Table 36-93. External 16MHz crystal oscillator and XOSC characteristics.
tCL Clock Low Time
VCC = 1.6 - 1.8V 30.0
ns
VCC = 2.7 - 3.6V 12.5
tCR Rise Time (for maximum frequency)
VCC = 1.6 - 1.8V 10
ns
VCC = 2.7 - 3.6V 3
tCF Fall Time (for maximum frequency)
VCC = 1.6 - 1.8V 10
ns
VCC = 2.7 - 3.6V 3
ΔtCK Change in period from one clock cycle to the next 10 %
Symbol Parameter Condition Min. Typ. Max. Units
Symbol Parameter Condition Min. Typ. Max. Units
1/tCK Clock Frequency (2) VCC = 1.6 - 1.8V 090
MHz
VCC = 2.7 - 3.6V 0142
tCK Clock Period
VCC = 1.6 - 1.8V 11
ns
VCC = 2.7 - 3.6V 7
tCH Clock High Time
VCC = 1.6 - 1.8V 4.5
ns
VCC = 2.7 - 3.6V 2.4
tCL Clock Low Time
VCC = 1.6 - 1.8V 4.5
ns
VCC = 2.7 - 3.6V 2.4
tCR Rise Time (for maximum frequency)
VCC = 1.6 - 1.8V 1.5
ns
VCC = 2.7 - 3.6V 1.0
tCF Fall Time (for maximum frequency)
VCC = 1.6 - 1.8V 1.5 ns
VCC = 2.7 - 3.6V 1.0
ΔtCK Change in period from one clock cycle to the next 10 %
Symbol Parameter Condition Min. Typ. Max. Units
Cycle to cycle jitter
XOSCPWR=0
FRQRANGE=0 <10
nsFRQRANGE=1, 2, or 3 <1
XOSCPWR=1 <1
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Long term jitter
XOSCPWR=0
FRQRANGE=0 <6
nsFRQRANGE=1, 2, or 3 <0.5
XOSCPWR=1 <0.5
Frequency error
XOSCPWR=0
FRQRANGE=0 <0.1
%
FRQRANGE=1 <0.05
FRQRANGE=2 or 3 <0.005
XOSCPWR=1 <0.005
Duty cycle
XOSCPWR=0
FRQRANGE=0 40
%
FRQRANGE=1 42
FRQRANGE=2 or 3 45
XOSCPWR=1 48
RQNegative impedance (1)
XOSCPWR=0,
FRQRANGE=0
0.4MHz resonator,
CL=100pF 2.4k
Ω
1MHz crystal, CL=20pF 8.7k
2MHz crystal, CL=20pF 2.1k
XOSCPWR=0,
FRQRANGE=1,
CL=20pF
2MHz crystal 4.2k
8MHz crystal 250
9MHz crystal 195
XOSCPWR=0,
FRQRANGE=2,
CL=20pF
8MHz crystal 360
9MHz crystal 285
12MHz crystal 155
XOSCPWR=0,
FRQRANGE=3,
CL=20pF
9MHz crystal 365
12MHz crystal 200
16MHz crystal 105
XOSCPWR=1,
FRQRANGE=0,
CL=20pF
9MHz crystal 435
12MHz crystal 235
16MHz crystal 125
XOSCPWR=1,
FRQRANGE=1,
CL=20pF
9MHz crystal 495
12MHz crystal 270
16MHz crystal 145
XOSCPWR=1,
FRQRANGE=2,
CL=20pF
12MHz crystal 305
16MHz crystal 160
XOSCPWR=1,
FRQRANGE=3,
CL=20pF
12MHz crystal 380
16MHz crystal 205
Symbol Parameter Condition Min. Typ. Max. Units
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Note: 1. Numbers for negative impedance are not tested in production but guaranteed from design and characterization
36.3.14.8 External 32.768kHz crystal oscillator and TOSC characteristics
Table 36-94. External 32.768kHz crystal oscillator and TOSC characteristics.
Note: 1. See Figure 36-18 for definition.
Figure 36-18. TOSC input capacitance.
The parasitic capacitance between the TOSC pins is CL1 + CL2 in series as seen from the crystal when oscillating
without external capacitors.
ESR SF = Safety factor min(RQ)/SF kΩ
CXTAL1
Parasitic capacitance
XTAL1 pin 5.60 pF
CXTAL2
Parasitic capacitance
XTAL2 pin 7.62 pF
CLOAD
Parasitic capacitance
load 3.23 pF
Symbol Parameter Condition Min. Typ. Max. Units
Symbol Parameter Condition Min. Typ. Max. Units
ESR/R1 Recommended crystal equivalent
series resistance (ESR)
Crystal load capacitance 6.5pF 60
kΩ
Crystal load capacitance 9.0pF 35
CTOSC1 Parasitic capacitance TOSC1 pin
5.4 pF
Alternate TOSC location 4.0
CTOSC2 Parasitic capacitance TOSC2 pin
7.1 pF
Alternate TOSC location 4.0
Recommended safety factor capacitance load matched to
crystal specification 3
C
L1
C
L2
2CS
O
T
1
CS
O
TDevice internal
External
32.768kHz crystal
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36.3.15 SPI Characteristics
Figure 36-19.SPI timing requirements in master mode.
Figure 36-20.SPI timing requirements in slave mode.
MSB LSB
MSB LSB
tMOS
tMIS tMIH
tSCKW
tSCK
tMOH tMOH
tSCKF
tSCKR
tSCKW
MOSI
(Data output)
MISO
(Data input)
SCK
(CPOL = 1)
SCK
(CPOL = 0)
SS
MSB LSB
MSB LSB
tSIS tSIH
tSSCKW
tSSCKW
tSSCK
tSSH
tSOSSH
tSCKR tSCKF
tSOS
tSSS
tSOSSS
MISO
(Data output)
MOSI
(Data input)
SCK
(CPOL = 1)
SCK
(CPOL = 0)
SS
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Table 36-95. SPI timing characteristics and requirements.
Symbol Parameter Condition Min. Typ. Max. Units
tSCK SCK period Master (See Table 21-4 in
XMEGA AU Manual)
ns
tSCKW SCK high/low width Master 0.5*SCK
tSCKR SCK rise time Master 2.7
tSCKF SCK fall time Master 2.7
tMIS MISO setup to SCK Master 11
tMIH MISO hold after SCK Master 0
tMOS MOSI setup SCK Master 0.5*SCK
tMOH MOSI hold after SCK Master 1.0
tSSCK Slave SCK Period Slave 4*t ClkPER
tSSCKW SCK high/low width Slave 2*t ClkPER
tSSCKR SCK rise time Slave 1600
tSSCKF SCK fall time Slave 1600
tSIS MOSI setup to SCK Slave 3.0
tSIH MOSI hold after SCK Slave tPER
tSSS SS setup to SCK Slave 20
tSSH SS hold after SCK Slave 20
tSOS MISO setup SCK Slave 8.0
tSOH MISO hold after SCK Slave 13.0
tSOSS MISO setup after SS low Slave 11.0
tSOSH MISO hold after SS high Slave 8.0
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36.3.16 Two-Wire Interface Characteristics
Table 36-96 describes the requirements for devices connected to the Two-Wire Interface Bus. The Atmel AVR
XMEGA Two-Wire Interface meets or exceeds these requirements under the noted conditions. Timing symbols refer
to Figure 36-21.
Figure 36-21.Two-wire interface bus timing.
Table 36-96. Two-wire interface characteristics.
tHD;STA
tof
SDA
SCL
tLOW
tHIGH
tSU;STA
tBUF
tr
tHD;DAT tSU;DAT tSU;STO
Symbol Parameter Condition Min. Typ. Max. Units
VIH Input high voltage 0.7*VCC VCC+0.5 V
VIL Input low voltage -0.5 0.3*VCC V
Vhys Hysteresis of Schmitt trigger inputs 0.05*VCC (1) 0 V
VOL Output low voltage 3mA, sink current 00.4 V
trRise time for both SDA and SCL 20+0.1Cb (1)(2) 0ns
tof Output fall time from VIHmin to VILmax 10pF < Cb < 400pF (2) 20+0.1Cb (1)(2) 300 ns
tSP Spikes suppressed by input filter 050 ns
IIInput current for each I/O pin 0.1VCC < VI < 0.9VCC -10 10 µA
CICapacitance for each I/O pin 010 pF
fSCL SCL clock frequency fPER (3)>max(10fSCL, 250kHz) 0400 kHz
RPValue of pull-up resistor
fSCL ≤ 100kHz
Ω
fSCL > 100kHz
tHD;STA Hold time (repeated) START condition
fSCL ≤ 100kHz 4.0
µs
fSCL > 100kHz 0.6
tLOW Low period of SCL clock
fSCL ≤ 100kHz 4.7
µs
fSCL > 100kHz 1.3
tHIGH High period of SCL clock
fSCL ≤ 100kHz 4.0
µs
fSCL > 100kHz 0.6
tSU;STA
Set-up time for a repeated START
condition
fSCL ≤ 100kHz 4.7
µs
fSCL > 100kHz 0.6
VCC 0.4V–
3mA
----------------------------
100ns
Cb
---------------
300ns
Cb
---------------
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Notes: 1. Required only for fSCL > 100kHz.
2. Cb = Capacitance of one bus line in pF.
3. fPER = Peripheral clock frequency.
tHD;DAT Data hold time
fSCL ≤ 100kHz 03.45
µs
fSCL > 100kHz 00.9
tSU;DAT Data setup time
fSCL ≤ 100kHz 250
ns
fSCL > 100kHz 100
tSU;STO Setup time for STOP condition
fSCL ≤ 100kHz 4.0
µs
fSCL > 100kHz 0.6
tBUF
Bus free time between a STOP and
START condition
fSCL ≤ 100kHz 4.7
µs
fSCL > 100kHz 1.3
Symbol Parameter Condition Min. Typ. Max. Units
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36.4 ATxmega128A4U
36.4.1 Absolute Maximum Ratings
Stresses beyond those listed in Table 36-97 may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or other conditions beyond those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
Table 36-97. Absolute maximum ratings.
36.4.2 General Operating Ratings
The device must operate within the ratings listed in Table 36-98 in order for all other electrical characteristics and
typical characteristics of the device to be valid.
Table 36-98. General operating conditions.
Table 36-99. Operating voltage and frequency.
The maximum CPU clock frequency depends on VCC. As shown in Figure 36-22 the Frequency vs. VCC curve is linear
between 1.8V < VCC <2.7V.
Symbol Parameter Condition Min. Typ. Max. Units
VCC Power supply voltage -0.3 4 V
IVCC Current into a VCC pin 200 mA
IGND Current out of a Gnd pin 200 mA
VPIN Pin voltage with respect to Gnd and VCC -0.5 VCC+0.5 V
IPIN I/O pin sink/source current -25 25 mA
TAStorage temperature -65 150 °C
TjJunction temperature 150 °C
Symbol Parameter Condition Min. Typ. Max. Units
VCC Power supply voltage 1.60 3.6 V
AVCC Analog supply voltage 1.60 3.6 V
TATemperature range -40 85 °C
TjJunction temperature -40 105 °C
Symbol Parameter Condition Min. Typ. Max. Units
ClkCPU CPU clock frequency
VCC = 1.6V 012
MHz
VCC = 1.8V 012
VCC = 2.7V 032
VCC = 3.6V 032
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Figure 36-22.Maximum Frequency vs. VCC.
1.8
12
32
MHz
V
2.7 3.6
1.6
Safe Operating Area
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36.4.3 Current consumption
Table 36-100.Current consumption for Active mode and sleep modes.
Notes: 1. All Power Reduction Registers set.
2. Maximum limits are based on characterization, and not tested in production.
Symbol Parameter Condition Min. Typ. Max. Units
ICC
Active power
consumption (1)
32kHz, Ext. Clk
VCC = 1.8V 55
µA
VCC = 3.0V 135
1MHz, Ext. Clk
VCC = 1.8V 255
VCC = 3.0V 535
2MHz, Ext. Clk
VCC = 1.8V 460 600
VCC = 3.0V
1.0 1.4
mA
32MHz, Ext. Clk 9.5 12
Idle power
consumption (1)
32kHz, Ext. Clk
VCC = 1.8V 2.9
µA
VCC = 3.0V 3.9
1MHz, Ext. Clk
VCC = 1.8V 62
VCC = 3.0V 118
2MHz, Ext. Clk
VCC = 1.8V 125 225
VCC = 3.0V
240 350
32MHz, Ext. Clk 3.8 5.5 mA
Power-down power
consumption
T = 25°C
VCC = 3.0V
0.1 1.0
µA
T = 85°C 1.5 4.5
T = 105°C 0.1 8.6
WDT and Sampled BOD enabled,
T = 25°C
VCC = 3.0V
1.4 3.0
WDT and Sampled BOD enabled,
T = 85°C 2.8 6.0
WDT and Sampled BOD enabled,
T = 105°C 1.4 8.8
Power-save power
consumption (2)
RTC from ULP clock, WDT and
sampled BOD enabled, T = 25°C
VCC = 1.8V 1.2
µA
VCC = 3.0V 1.5
RTC from 1.024kHz low power
32.768kHz TOSC, T = 25°C
VCC = 1.8V 0.6 2.0
VCC = 3.0V 0.7 2.0
RTC from low power 32.768kHz
TOSC, T = 25°C
VCC = 1.8V 0.8 3.0
VCC = 3.0V 1.0 3.0
Reset power consumption Current through RESET pin
substracted VCC = 3.0V 300 µA
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Table 36-101.Current consumption for modules and peripherals.
Note: 1. All parameters measured as the difference in current consumption between module enabled and disabled. All data at VCC = 3.0V, ClkSYS = 1MHz external
clock without prescaling, T = 25°C unless other conditions are given.
Symbol Parameter Condition (1) Min. Typ. Max. Units
ICC
ULP oscillator 1.0 µA
32.768kHz int. oscillator 29 µA
2MHz int. oscillator
85
µA
DFLL enabled with 32.768kHz int. osc. as reference 115
32MHz int. oscillator
270
µA
DFLL enabled with 32.768kHz int. osc. as reference 440
PLL 20x multiplication factor,
32MHz int. osc. DIV4 as reference 320 µA
Watchdog timer 1.0 µA
BOD
Continuous mode 138
µA
Sampled mode, includes ULP oscillator 1.2
Internal 1.0V reference 260 µA
Temperature sensor 250 µA
ADC 250ksps
VREF = Ext ref
3.0 mA
CURRLIMIT = LOW 2.6
CURRLIMIT = MEDIUM 2.1
CURRLIMIT = HIGH 1.6
DAC
250ksps
VREF = Ext ref
No load
Normal mode 1.9
mA
Low power mode 1.1
AC
High speed mode 330
µA
Low power mode 130
DMA 615kbps between I/O registers and SRAM 108 µA
Timer/counter 16 µA
USART Rx and Tx enabled, 9600 BAUD 2.5 µA
Flash memory and EEPROM programming 4.0 8.0 mA
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36.4.4 Wake-up time from sleep modes
Table 36-102. Device wake-up time from sleep modes with various system clock sources.
Note: 1. The wake-up time is the time from the wake-up request is given until the peripheral clock is available on pin, see Figure 36-23. All peripherals and modules
start execution from the first clock cycle, expect the CPU that is halted for four clock cycles before program execution starts.
Figure 36-23.Wake-up time definition.
Symbol Parameter Condition Min. Typ. (1) Max. Units
twakeup
Wake-up time from idle,
standby, and extended standby
mode
External 2MHz clock 2.0
µs
32.768kHz internal oscillator 120
2MHz internal oscillator 2.0
32MHz internal oscillator 0.2
Wake-up time from power-save
and power-down mode
External 2MHz clock 4.5
µs
32.768kHz internal oscillator 320
2MHz internal oscillator 9.0
32MHz internal oscillator 5.0
Wakeup request
Clock output
Wakeup time
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36.4.5 I/O Pin Characteristics
The I/O pins comply with the JEDEC LVTTL and LVCMOS specification and the high- and low level input and output
voltage limits reflect or exceed this specification.
Table 36-103.I/O pin characteristics.
Notes: 1. The sum of all IOH for PORTA and PORTB must not exceed 100mA.
The sum of all IOH for PORTC must not exceed 200mA.
The sum of all IOH for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOH for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
2. The sum of all IOL for PORTA and PORTB must not exceed 100mA.
The sum of all IOL for PORTC must not exceed 200mA.
The sum of all IOL for PORTD and pins PE[0-1] on PORTE must not exceed 200mA.
The sum of all IOL for PE[2-3] on PORTE, PORTR and PDI must not exceed 100mA.
Symbol Parameter Condition Min. Typ. Max. Units
IOH (1)/
IOL (2) I/O pin source/sink current -20 20 mA
VIH High level input voltage
VCC = 2.7 - 3.6V 2.0 VCC+0.3
VVCC = 2.0 - 2.7V 0.7*VCC VCC+0.3
VCC = 1.6 - 2.0V 0.8*VCC VCC+0.3
VIL Low level input voltage
VCC = 2.7- 3.6V -0.3 0.8
VVCC = 2.0 - 2.7V -0.3 0.3*VCC
VCC = 1.6 - 2.0V -0.3 0.2*VCC
VOH High level output voltage
VCC = 3.0 - 3.6V IOH = -2mA 2.4 0.94*VCC
V
VCC = 2.3 - 2.7V
IOH = -1mA 2.0 0.96*VCC
IOH = -2mA 1.7 0.92*VCC
VCC = 3.3V IOH = -8mA 2.6 2.9
VCC = 3.0V IOH = -6mA 2.1 2.6
VCC = 1.8V IOH = -2mA 1.4 1.6
VOL Low level output voltage
VCC = 3.0 - 3.6V IOL = 2mA 0.05 0.4
V
VCC = 2.3 - 2.7V
IOL = 1mA 0.03 0.4
IOL = 2mA 0.06 0.7
VCC = 3.3V IOL = 15mA 0.4 0.76
VCC = 3.0V IOL = 10mA 0.3 0.64
VCC = 1.8V IOL = 5mA 0.2 0.46
IIN Input leakage current T = 25°C <0.01 0.1 µA
RPPull/buss keeper resistor 24 kΩ
trRise time No load
4.0
ns
slew rate limitation 7.0
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36.4.6 ADC characteristics
Table 36-104.Power supply, reference and input range.
Table 36-105.Clock and timing.
Symbol Parameter Condition Min. Typ. Max. Units
AVCC Analog supply voltage VCC- 0.3 VCC+ 0.3 V
VREF Reference voltage 1AVCC- 0.6 V
Rin Input resistance Switched 4.0 kΩ
Csample Input capacitance Switched 4.4 pF
RAREF Reference input resistance (leakage only) >10 MΩ
CAREF Reference input capacitance Static load 7pF
VIN Input range -0.1 AVCC+0.1 V
Conversion range Differential mode, Vinp - Vinn -VREF VREF V
Conversion range Single ended unsigned mode, Vinp -ΔV VREF-ΔV V
∆VFixed offset voltage 190 lsb
Symbol Parameter Condition Min. Typ. Max. Units
ClkADC ADC Clock frequency
Maximum is 1/4 of Peripheral clock
frequency 100 2000
kHz
Measuring internal signals 100 125
fADC Sample rate
Current limitation (CURRLIMIT) off 100 2000
ksps
CURRLIMIT = LOW 100 1500
CURRLIMIT = MEDIUM 100 1000
CURRLIMIT = HIGH 100 500
Sampling time 1/2 ClkADC cycle 0.25 5µs
Conversion time (latency) (RES+2)/2+(GAIN !=0)
RES (Resolution) = 8 or 12 5 8 ClkADC
cycles
Start-up time ADC clock cycles 12 24 ClkADC
cycles
ADC settling time
After changing reference or input mode 7 7 ClkADC
cycles
After ADC flush 1 1
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Table 36-106. Accuracy characteristics.
Notes: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% input voltage range.
2. Unless otherwise noted all linearity, offset and gain error numbers are valid under the condition that external VREF is used.
Table 36-107. Gain stage characteristics.
Symbol Parameter Condition (2) Min. Typ. Max. Units
RES Resolution Programmable to 8 or 12 bit 812 12 Bits
INL (1) Integral non-linearity
500ksps
VCC-1.0V < VREF< VCC-0.6V ±1.2 ±2 lsb
All VREF ±1.5 ±3
2000ksps
VCC-1.0V < VREF< VCC-0.6V ±1.0 ±2
All VREF ±1.5 ±3
DNL (1) Differential non-linearity guaranteed monotonic <±0.8 <±1 lsb
Offset error
-1.0 mV
Temperature drift <0.01 mV/K
Operating voltage drift <0.6 mV/V
Gain error
Differential
mode
External reference -1
mV
AVCC/1.6 10
AVCC/2.0 8.0
Bandgap ±5
Temperature drift <0.02 mV/K
Operating voltage drift <0.5 mV/V
Noise Differential mode, shorted input
2msps, VCC = 3.6V, ClkPER = 16MHz 0.4 mV
rms
Symbol Parameter Condition Min. Typ. Max. Units
Rin Input resistance Switched in normal mode 4.0 kΩ
Csample Input capacitance Switched in normal mode 4.4 pF
Signal range Gain stage output 0 VCC- 0.6 V
Propagation delay ADC conversion rate 1.0 ClkADC
cycles
Sample rate Same as ADC 100 1000 kHz
INL (1) Integral Non-Linearity 500ksps All gain
settings ±1.5 ±4.0 lsb
Gain error
1x gain, normal mode -0.8
%8x gain, normal mode -2.5
64x gain, normal mode -3.5
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Note: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% input voltage range.
36.4.7 DAC Characteristics
Table 36-108. Power supply, reference and output range.
Table 36-109. Clock and timing.
Offset error,
input referred
1x gain, normal mode -2.0
mV8x gain, normal mode -5.0
64x gain, normal mode -4.0
Noise
1x gain, normal mode
VCC = 3.6V
Ext. VREF
0.5
mV
rms
8x gain, normal mode 1.5
64x gain, normal mode 11
Symbol Parameter Condition Min. Typ. Max. Units
Symbol Parameter Condition Min. Typ. Max. Units
AVCC Analog supply voltage VCC- 0.3 VCC+ 0.3
AVREF External reference voltage 1.0 VCC- 0.6 V
Rchannel DC output impedance 50 Ω
Linear output voltage range 0.15 AVCC-0.15 V
RAREF Reference input resistance >10 MΩ
CAREF Reference input capacitance Static load 7.0 pF
Minimum Resistance load 1 kΩ
Maximum capacitance load
100 pF
1000Ω serial resistance 1nF
Output sink/source
Operating within accuracy specification AVCC/1000
mA
Safe operation 10
Symbol Parameter Condition Min. Typ. Max. Units
fDAC Conversion rate Cload=100pF,
maximum step size
Normal mode 01000
ksps
Low power mode 500
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Table 36-110.Accuracy characteristics.
Note: 1. Maximum numbers are based on characterisation and not tested in production, and valid for 5% to 95% output voltage range.
Symbol Parameter Condition Min. Typ. Max. Units
RES Input resolution 12 Bits
INL (1) Integral non-linearity
VREF= Ext 1.0V
VCC = 1.6V ±2.0 ±3.0
lsb
VCC = 3.6V ±1.5 ±2.5
VREF=AVCC
VCC = 1.6V ±2.0 ±4.0
VCC = 3.6V ±1.5 ±4.0
VREF=INT1V
VCC = 1.6V ±5.0
VCC = 3.6V ±5.0
DNL (1) Differential non-linearity
VREF=Ext 1.0V
VCC = 1.6V ±1.5 3.0
lsb
VCC = 3.6V ±0.6 1.5
VREF=AVCC
VCC = 1.6V ±1.0 3.5
VCC = 3.6V ±0.6 1.5
VREF=INT1V
VCC = 1.6V ±4.5
VCC = 3.6V ±4.5
Gain error After calibration <4.0 lsb
Gain calibration step size 4.0 lsb
Gain calibration drift VREF= Ext 1.0V <0.2 mV/K
Offset error After calibration <1.0 lsb
Offset calibration step size 1.0
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36.4.8 Analog Comparator Characteristics
Table 36-111. Analog Comparator characteristics.
36.4.9 Bandgap and Internal 1.0V Reference Characteristics
Table 36-112. Bandgap and Internal 1.0V reference characteristics.
Symbol Parameter Condition Min. Typ. Max. Units
Voff Input offset voltage <±10 mV
Ilk Input leakage current <1 nA
Input voltage range -0.1 AVCC V
AC startup time 100 µs
Vhys1 Hysteresis, none 0mV
Vhys2 Hysteresis, small
mode = High Speed (HS) 13
mV
mode = Low Power (LP) 30
Vhys3 Hysteresis, large
mode = HS 30
mV
mode = LP 60
tdelay Propagation delay
VCC = 3.0V, T= 85°C mode = HS 30 90
ns
mode = HS 30
VCC = 3.0V, T= 85°C mode = LP 130 500
mode = LP 130
64-level voltage scaler Integral non-linearity (INL) 0.3 0.5 lsb
Symbol Parameter Condition Min. Typ. Max. Units
Startup time
As reference for ADC or DAC 1 ClkPER + 2.5µs
µs
As input voltage to ADC and AC 1.5
Bandgap voltage 1.1 V
INT1V Internal 1.00V reference T= 85°C, after calibration 0.99 1.0 1.01 V
Variation over voltage and temperature Relative to T= 85°C, VCC = 3.0V ±1.5 %
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36.4.10 Brownout Detection Characteristics
Table 36-113. Brownout detection characteristics.
36.4.11 External Reset Characteristics
Table 36-114. External reset characteristics.
36.4.12 Power-on Reset Characteristics
Table 36-115. Power-on reset characteristics.
Note: 1. VPOT- values are only valid when BOD is disabled. When BOD is enabled VPOT- = VPOT+.
Symbol Parameter Condition Min. Typ. Max. Units
VBOT
BOD level 0 falling VCC 1.50 1.62 1.72
V
BOD level 1 falling VCC 1.8
BOD level 2 falling VCC 2.0
BOD level 3 falling VCC 2.2
BOD level 4 falling VCC 2.4
BOD level 5 falling VCC 2.6
BOD level 6 falling VCC 2.8
BOD level 7 falling VCC 3.0
tBOD Detection time
Continuous mode 0.4
µs
Sampled mode 1000
VHYST Hysteresis 1.2 %
Symbol Parameter Condition Min. Typ. Max. Units
tEXT Minimum reset pulse width 1000 95 ns
VRST
Reset threshold voltage (VIH)
VCC = 2.7 - 3.6V 0.60×VCC
V
VCC = 1.6 - 2.7V 0.60×VCC
Reset threshold voltage (VIL)
VCC = 2.7 - 3.6V 0.50×VCC
VCC = 1.6 - 2.7V 0.40×VCC
RRST Reset pin Pull-up Resistor 25 kΩ
Symbol Parameter Condition Min. Typ. Max. Units
VPOT- (1) POR threshold voltage falling VCC
VCC falls faster than 1V/ms 0.4 1.0
V
VCC falls at 1V/ms or slower 0.8 1.0
VPOT+ POR threshold voltage rising VCC 1.3 1.59 mV
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36.4.13 Flash and EEPROM Memory Characteristics
Table 36-116. Endurance and data retention.
Table 36-117. Programming time.
Notes: 1. Programming is timed from the 2MHz internal oscillator.
2. EEPROM is not erased if the EESAVE fuse is programmed.
Symbol Parameter Condition Min. Typ. Max. Units
Flash
Write/Erase cycles
25°C 10K
Cycle85°C 10K
105°C 2K
Data retention
25°C 100
Year85°C 25
105°C 10
EEPROM
Write/Erase cycles
25°C 100K
Cycle85°C 100K
105°C 30K
Data retention
25°C 100
Year85°C 25
105°C 10
Symbol Parameter Condition Min. Typ.(1) Max. Units
Chip Erase 128KB Flash, EEPROM(2) and SRAM Erase 75 ms
Application Erase Section erase 6ms
Flash
Page erase 4
msPage write 4
Atomic page erase and write 8
EEPROM
Page erase 4
msPage write 4
Atomic page erase and write 8
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36.4.14 Clock and Oscillator Characteristics
36.4.14.1 Calibrated 32.768kHz Internal Oscillator characteristics
Table 36-118. 32.768kHz internal oscillator characteristics.
36.4.14.2 Calibrated 2MHz RC Internal Oscillator characteristics
Table 36-119. 2MHz internal oscillator characteristics.
36.4.14.3 Calibrated and tunable 32MHz internal oscillator characteristics
Table 36-120. 32MHz internal oscillator characteristics.
36.4.14.4 32kHz Internal ULP Oscillator characteristics
Table 36-121. 32kHz internal ULP oscillator characteristics.
Symbol Parameter Condition Min. Typ. Max. Units
Frequency 32.768 kHz
Factory calibration accuracy T = 85°C, VCC = 3.0V -0.5 0.5 %
User calibration accuracy -0.5 0.5 %
Symbol Parameter Condition Min. Typ. Max. Units
Frequency range DFLL can tune to this frequency over
voltage and temperature 1.8 2.2 MHz
Factory calibrated frequency 2.0 MHz
Factory calibration accuracy T = 85°C, VCC= 3.0V -1.5 1.5 %
User calibration accuracy -0.2 0.2 %
DFLL calibration stepsize 0.21 %
Symbol Parameter Condition Min. Typ. Max. Units
Frequency range DFLL can tune to this frequency over
voltage and temperature 30 55 MHz
Factory calibrated frequency 32 MHz
Factory calibration accuracy T = 85°C, VCC= 3.0V -1.5 1.5 %
User calibration accuracy -0.2 0.2 %
DFLL calibration step size 0.22 %
Symbol Parameter Condition Min. Typ. Max. Units
Output frequency 32 kHz
Accuracy -30 30 %
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36.4.14.5 Internal Phase Locked Loop (PLL) characteristics
Table 36-122. Internal PLL characteristics.
Note: 1. The maximum output frequency vs. supply voltage is linear between 1.8V and 2.7V, and can never be higher than four times the maximum CPU frequency.
36.4.14.6 External clock characteristics
Figure 36-24. External clock drive waveform
Table 36-123.External clock used as system clock without prescaling.
Note: 1. The maximum frequency vs. supply voltage is linear between 1.6V and 2.7V, and the same applies for all other parameters with supply voltage conditions.
Symbo
lParameter Condition Min. Typ. Max. Units
fIN Input frequency Output frequency must be within fOUT 0.4 64 MHz
fOUT Output frequency (1) VCC= 1.6 - 1.8V 20 48
MHz
VCC= 2.7 - 3.6V 20 128
Start-up time 25 µs
Re-lock time 25 µs
tCH
tCL
tCK
tCH
VIL1
VIH1
tCR tCF
Symbol Parameter Condition Min. Typ. Max. Units
1/tCK Clock Frequency (1) VCC = 1.6 - 1.8V 012
MHz
VCC = 2.7 - 3.6V 032
tCK Clock Period
VCC = 1.6 - 1.8V 83.3
ns
VCC = 2.7 - 3.6V 31.5
tCH Clock High Time
VCC = 1.6 - 1.8V 30.0
ns
VCC = 2.7 - 3.6V 12.5
tCL Clock Low Time
VCC = 1.6 - 1.8V 30.0
ns
VCC = 2.7 - 3.6V 12.5
tCR Rise Time (for maximum frequency)
VCC = 1.6 - 1.8V 10
ns
VCC = 2.7 - 3.6V 3
tCF Fall Time (for maximum frequency)
VCC = 1.6 - 1.8V 10
ns
VCC = 2.7 - 3.6V 3
ΔtCK Change in period from one clock cycle to the next 10 %
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Table 36-124. External clock with prescaler (1)for system clock.
Notes: 1. System Clock Prescalers must be set so that maximum CPU clock frequency for device is not exceeded.
2. The maximum frequency vs. supply voltage is linear between 1.6V and 2.7V, and the same applies for all other parameters with supply voltage conditions.
36.4.14.7 External 16MHz crystal oscillator and XOSC characteristic
Table 36-125. External 16MHz crystal oscillator and XOSC characteristics.
Symbol Parameter Condition Min. Typ. Max. Units
1/tCK Clock Frequency (2) VCC = 1.6 - 1.8V 090
MHz
VCC = 2.7 - 3.6V 0142
tCK Clock Period
VCC = 1.6 - 1.8V 11
ns
VCC = 2.7 - 3.6V 7
tCH Clock High Time
VCC = 1.6 - 1.8V 4.5
ns
VCC = 2.7 - 3.6V 2.4
tCL Clock Low Time
VCC = 1.6 - 1.8V 4.5
ns
VCC = 2.7 - 3.6V 2.4
tCR Rise Time (for maximum frequency)
VCC = 1.6 - 1.8V 1.5
ns
VCC = 2.7 - 3.6V 1.0
tCF Fall Time (for maximum frequency)
VCC = 1.6 - 1.8V 1.5
ns
VCC = 2.7 - 3.6V 1.0
ΔtCK Change in period from one clock cycle to the next 10 %
Symbol Parameter Condition Min. Typ. Max. Units
Cycle to cycle jitter
XOSCPWR=0
FRQRANGE=0 <10
nsFRQRANGE=1, 2, or 3 <1
XOSCPWR=1 <1
Long term jitter
XOSCPWR=0
FRQRANGE=0 <6
nsFRQRANGE=1, 2, or 3 <0.5
XOSCPWR=1 <0.5
Frequency error
XOSCPWR=0
FRQRANGE=0 <0.1
%
FRQRANGE=1 <0.05
FRQRANGE=2 or 3 <0.005
XOSCPWR=1 <0.005
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Note: 1. Numbers for negative impedance are not tested in production but guaranteed from design and characterization.
Duty cycle
XOSCPWR=0
FRQRANGE=0 40
%
FRQRANGE=1 42
FRQRANGE=2 or 3 45
XOSCPWR=1 48
RQNegative impedance (1)
XOSCPWR=0,
FRQRANGE=0
0.4MHz resonator,
CL=100pF 2.4k
Ω
1MHz crystal, CL=20pF 8.7k
2MHz crystal, CL=20pF 2.1k
XOSCPWR=0,
FRQRANGE=1,
CL=20pF
2MHz crystal 4.2k
8MHz crystal 250
9MHz crystal 195
XOSCPWR=0,
FRQRANGE=2,
CL=20pF
8MHz crystal 360
9MHz crystal 285
12MHz crystal 155
XOSCPWR=0,
FRQRANGE=3,
CL=20pF
9MHz crystal 365
12MHz crystal 200
16MHz crystal 105
XOSCPWR=1,
FRQRANGE=0,
CL=20pF
9MHz crystal 435
12MHz crystal 235
16MHz crystal 125
XOSCPWR=1,
FRQRANGE=1,
CL=20pF
9MHz crystal 495
12MHz crystal 270
16MHz crystal 145
XOSCPWR=1,
FRQRANGE=2,
CL=20pF
12MHz crystal 305
16MHz crystal 160
XOSCPWR=1,
FRQRANGE=3,
CL=20pF
12MHz crystal 380
16MHz crystal 205
ESR SF = Safety factor min(RQ)/SF kΩ
CXTAL1
Parasitic capacitance
XTAL1 pin 5.45 pF
CXTAL2
Parasitic capacitance
XTAL2 pin 7.51 pF
CLOAD
Parasitic capacitance
load 3.16 pF
Symbol Parameter Condition Min. Typ. Max. Units
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36.4.14.8 External 32.768kHz crystal oscillator and TOSC characteristics
Table 36-126. External 32.768kHz crystal oscillator and TOSC characteristics.
Note: 1. See Figure 36-25 for definition.
Figure 36-25. TOSC input capacitance.
The parasitic capacitance between the TOSC pins is CL1 + CL2 in series as seen from the crystal when oscillating
without external capacitors.
Symbol Parameter Condition Min. Typ. Max. Units
ESR/R1 Recommended crystal equivalent
series resistance (ESR)
Crystal load capacitance 6.5pF 60
kΩ
Crystal load capacitance 9.0pF 35
CTOSC1 Parasitic capacitance TOSC1 pin
5.4
pF
Alternate TOSC location 4.0
CTOSC2 Parasitic capacitance TOSC2 pin
7.1
pF
Alternate TOSC location 4.0
Recommended safety factor capacitance load matched to
crystal specification 3
C
L1
C
L2
2CS
O
T
1
CS
O
TDevice internal
External
32.768kHz crystal
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36.4.15 SPI Characteristics
Figure 36-26. SPI timing requirements in master mode.
Figure 36-27. SPI timing requirements in slave mode.
MSB LSB
MSB LSB
tMOS
tMIS tMIH
tSCKW
tSCK
tMOH tMOH
tSCKF
tSCKR
tSCKW
MOSI
(Data output)
MISO
(Data input)
SCK
(CPOL = 1)
SCK
(CPOL = 0)
SS
MSB LSB
MSB LSB
tSIS tSIH
tSSCKW
tSSCKW
tSSCK
tSSH
tSOSSH
tSCKR tSCKF
tSOS
tSSS
tSOSSS
MISO
(Data output)
MOSI
(Data input)
SCK
(CPOL = 1)
SCK
(CPOL = 0)
SS
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Table 36-127. SPI timing characteristics and requirements.
Symbol Parameter Condition Min. Typ. Max. Units
tSCK SCK Period Master (See Table 21-4 in
XMEGA AU Manual)
ns
tSCKW SCK high/low width Master 0.5×SCK
tSCKR SCK Rise time Master 2.7
tSCKF SCK Fall time Master 2.7
tMIS MISO setup to SCK Master 10
tMIH MISO hold after SCK Master 10
tMOS MOSI setup SCK Master 0.5×SCK
tMOH MOSI hold after SCK Master 1
tSSCK Slave SCK Period Slave 4×t ClkPER
tSSCKW SCK high/low width Slave 2×t ClkPER
tSSCKR SCK Rise time Slave 1600
tSSCKF SCK Fall time Slave 1600
tSIS MOSI setup to SCK Slave 3
tSIH MOSI hold after SCK Slave t ClkPER
tSSS SS setup to SCK Slave 21
tSSH SS hold after SCK Slave 20
tSOS MISO setup SCK Slave 8
tSOH MISO hold after SCK Slave 13
tSOSS MISO setup after SS low Slave 11
tSOSH MISO hold after SS high Slave 8
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36.4.16 Two-Wire Interface Characteristics
Table 36-128 describes the requirements for devices connected to the Two-Wire Interface Bus. The Atmel AVR
XMEGA Two-Wire Interface meets or exceeds these requirements under the noted conditions. Timing symbols refer
to Figure 36-28.
Figure 36-28. Two-wire interface bus timing.
Table 36-128. Two-wire interface characteristics.
tHD;STA
tof
SDA
SCL
tLOW
tHIGH
tSU;STA
tBUF
tr
tHD;DAT tSU;DAT tSU;STO
Symbol Parameter Condition Min. Typ. Max. Units
VIH Input High Voltage 0.7VCC VCC+0.5 V
VIL Input Low Voltage 0.5 0.3×VCC V
Vhys Hysteresis of Schmitt Trigger Inputs 0.05VCC (1) V
VOL Output Low Voltage 3mA, sink current 00.4 V
trRise Time for both SDA and SCL 20+0.1Cb (1)(2) 300 ns
tof Output Fall Time from VIHmin to VILmax 10pF < Cb < 400pF (2) 20+0.1Cb (1)(2) 250 ns
tSP Spikes Suppressed by Input Filter 050 ns
IIInput Current for each I/O Pin 0.1VCC < VI < 0.9VCC -10 10 µA
CICapacitance for each I/O Pin 10 pF
fSCL SCL Clock Frequency fPER (3)>max(10fSCL, 250kHz) 0400 kHz
RPValue of Pull-up resistor
fSCL ≤ 100kHz
Ω
fSCL > 100kHz
tHD;STA Hold Time (repeated) START condition
fSCL ≤ 100kHz 4.0
µs
fSCL > 100kHz 0.6
tLOW Low Period of SCL Clock
fSCL ≤ 100kHz 4.7
µs
fSCL > 100kHz 1.3
tHIGH High Period of SCL Clock
fSCL ≤ 100kHz 4.0
µs
fSCL > 100kHz 0.6
tSU;STA
Set-up time for a repeated START
condition
fSCL ≤ 100kHz 4.7
µs
fSCL > 100kHz 0.6
VCC 0.4V–
3mA
----------------------------
100ns
Cb
---------------
300ns
Cb
---------------
158
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Notes: 1. Required only for fSCL > 100kHz.
2. Cb = Capacitance of one bus line in pF.
3. fPER = Peripheral clock frequency.
tHD;DAT Data hold time
fSCL ≤ 100kHz 03.45
µs
fSCL > 100kHz 00.9
tSU;DAT Data setup time
fSCL ≤ 100kHz 250
ns
fSCL > 100kHz 100
tSU;STO Setup time for STOP condition
fSCL ≤ 100kHz 4.0
µs
fSCL > 100kHz 0.6
tBUF
Bus free time between a STOP and
START condition
fSCL ≤ 100kHz 4.7
µs
fSCL > 100kHz 1.3
Symbol Parameter Condition Min. Typ. Max. Units
159
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37. Typical Characteristics
37.1 ATxmega16A4U
37.1.1 Current consumption
37.1.1.1 Active mode supply current
Figure 37-1. Active supply current vs. frequency.
fSYS = 0 - 1MHz external clock, T = 25°C.
Figure 37-2. Active supply current vs. frequency.
fSYS = 1 - 32MHz external clock, T = 25°C.
3.3V
3.0V
2.7V
2.2V
1.8V
0
60
120
180
240
300
360
420
480
540
600
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency [MHz]
I
CC
[µA]
3.3V
3.0V
2.7V
0
2
4
6
8
10
12
0 4 8 121620242832
Frequency [MHz]
I
CC
[mA]
2.2V
1.8V
160
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-3. Active mode supply current vs. VCC.
fSYS = 32.768kHz internal oscillator.
Figure 37-4. Active mode supply current vs. VCC.
fSYS = 1MHz external clock.
105 °C
85 °C
25 °C
-40 °C
70
90
110
130
150
170
190
210
230
250
270
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
200
300
400
500
600
700
800
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
161
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-5. Active mode supply current vs. VCC.
fSYS = 2MHz internal oscillator.
Figure 37-6. Active mode supply current vs. VCC.
fSYS = 32MHz internal oscillator prescaled to 8MHz.
105 °C
85 °C
25 °C
-40 °C
400
600
800
1000
1200
1400
1600
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
1400
1900
2400
2900
3400
3900
4400
4900
5400
5900
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
162
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-7. Active mode supply current vs. VCC.
fSYS = 32MHz internal oscillator.
37.1.1.2 Idle mode supply current
Figure 37-8. Idle mode supply current vs. frequency.
fSYS = 0 - 1MHz external clock, T = 25°C.
105 °C
85 °C
25 °C
-40 °C
3400
3625
3850
4075
4300
4525
4750
4975
5200
5425
5650
2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
I
CC
[uA]
V
CC
[V]
3.3V
3.0V
2.7V
2.2V
1.8V
0
20
40
60
80
100
120
140
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
Frequency [MHz]
I
CC
[µA]
163
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-9. Idle mode supply current vs. frequency.
fSYS = 1 - 32MHz external clock, T = 25°C.
Figure 37-10. Idle mode supply current vs. VCC.
fSYS = 32.768kHz internal oscillator.
3.3V
3.0V
2.7V
0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
0 4 8 121620242832
Frequency [MHz]
I
CC
[mA]
2.2V
1.8V
105 °C
85 °C
25 °C
-40 °C
27
28
29
30
31
32
33
34
35
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
164
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-11. Idle mode supply current vs. VCC.
fSYS = 1MHz external clock.
Figure 37-12. Idle mode supply current vs. VCC.
fSYS = 2MHz internal oscillator.
105 °C
85 °C
25 °C
-40 °C
50
62
74
86
98
110
122
134
146
158
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
160
185
210
235
260
285
310
335
360
385
410
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
165
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-13. Idle mode supply current vs. VCC.
fSYS = 32MHz internal oscillator prescaled to 8MHz.
Figure 37-14. Idle mode current vs. VCC.
fSYS = 32MHz internal oscillator.
105 °C
85 °C
25 °C
-40 °C
600
800
1000
1200
1400
1600
1800
2000
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
3400
3625
3850
4075
4300
4525
4750
4975
5200
5425
5650
2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
I
CC
[uA]
V
CC
[V]
166
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.1.3 Power-down mode supply current
Figure 37-15. Power-down mode supply current vs. temperature.
All functions disabled.
Figure 37-16. Power-down mode supply current vs. VCC.
All functions disabled.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
0.00
0.50
1.00
1.50
2.00
2.50
3.00
3.50
-40 -25 -10 5 20 35 50 65 80 95 110
I
CC
[uA]
Temperature [°C]
105 °C
85 °C
25 °C
-40 °C
0.0
0.4
0.8
1.2
1.6
2.0
2.4
2.8
3.2
3.6
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
ICC [uA]
VCC [V]
167
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-17. Power-down mode supply current vs. VCC.
Watchdog and sampled BOD enabled.
37.1.1.4 Power-save mode supply current
Figure 37-18. Power-save mode supply current vs.VCC.
Real Time Counter enabled and running from 1.024kHz output of 32.768kHz TOSC.
105 °C
85
°
C
25 °C
-40 °C
1.1
1.6
2.1
2.6
3.1
3.6
4.1
4.6
5.1
1.61.82.02.22.42.62.83.03.23.43.6
I
CC
[µA]
V
CC
[V]
Normal mode
Low-power mode
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
V
CC
[V]
I
CC
[µA]
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
168
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.1.5 Standby mode supply current
Figure 37-19. Standby supply current vs. VCC.
Standby, fSYS =1MHz.
Figure 37-20. Standby supply current vs. VCC.
25°C, running from different crystal oscillators.
105 °C
85 °C
25 °C
-40 °C
2.5
3.5
4.5
5.5
6.5
7.5
8.5
9.5
10.5
11.5
12.5
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
16MHz
12MHz
8MHz
2MHz
0.454MHz
160
200
240
280
320
360
400
440
480
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
CC
[V]
I
CC
[µA]
169
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.2 I/O Pin Characteristics
37.1.2.1 Pull-up
Figure 37-21. I/O pin pull-up resistor current vs. input voltage.
VCC = 1.8V.
Figure 37-22. I/O pin pull-up resistor current vs. input voltage.
VCC = 3.0V.
105 °C
85 °C
25 °C
- 40 °C
0
8
16
24
32
40
48
56
64
72
0.00.20.40.60.81.01.21.41.61.8
I [µA]
V
PIN
[V]
105 °C
85 °C
25 °C
-40 °C
0
15
30
45
60
75
90
105
120
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
I [µA]
V
PIN
[V]
170
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-23. I/O pin pull-up resistor current vs. input voltage.
VCC = 3.3V.
37.1.2.2 Output Voltage vs. Sink/Source Current
Figure 37-24. I/O pin output voltage vs. source current.
VCC = 1.8V.
105 °C
85 °C
25 °C
-40 °C
0
15
30
45
60
75
90
105
120
135
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
I [µA]
V
PIN
[V]
105 °C
85 °C
25 °C-40 °C
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
-10-9-8-7-6-5-4-3-2-1 0
V
PIN
[V]
I
PIN
[mA]
171
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-25. I/O pin output voltage vs. source current.
VCC = 3.0V.
Figure 37-26. I/O pin output voltage vs. source current.
VCC = 3.3V.
105 °C
85 °C
25 °C
-40 °C
0.0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
3.0
-32-28-24-20-16-12 -8 -4 0
V
PIN
[V]
I
PIN
[mA]
105 °C
85 °C
25 °C
-40 °C
0.0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
3.0
3.3
-32-28-24-20-16-12 -8 -4 0
V
PIN
[V]
I
PIN
[mA]
172
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-27. I/O pin output voltage vs. source current.
Figure 37-28. I/O pin output voltage vs. sink current.
VCC = 1.8V.
3.6V
3.3V
3.0V
2.7V
2.3V
1.8V
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
-24 -21 -18 -15 -12 -9 -6 -3 0
I
PIN
[mA]
V
PIN
[V]
105
°
C
85 °C
25 °C
-40 °C
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
0246810121416
V
PIN
[V]
I
PIN
[mA]
173
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-29. I/O pin output voltage vs. sink current.
VCC = 3.0V.
Figure 37-30. I/O pin output voltage vs. sink current.
VCC = 3.3V.
Figure 37-31. I/O pin output voltage vs. sink current.
105 °C
85 °C
25 °C
-40 °C
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
02468101214161820
V
PIN
[V]
I
PIN
[mA]
105 °C
85 °C
25 °C
-40 °C
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
0 4 8 121620242832
V
PIN
[V]
I
PIN
[mA]
0
0.3
0.6
0.9
1.2
1.5
0 5 10 15 20 25 30
I
PIN
[mA]
V
PIN
[V]
1.8V
3.6V
3.3V
3.0V
2.7V
2.3V
174
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.2.3 Thresholds and Hysteresis
Figure 37-32. I/O pin input threshold voltage vs. VCC.
T = 25°C.
Figure 37-33. I/O pin input threshold voltage vs. VCC.
VIH I/O pin read as “1”.
VIL
VIH
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
Vcc [V]
Vthreshold [V]
105 °C
85 °C
25 °C
-40 °C
0.8
0.9
1.0
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.61.82.02.22.42.62.83.03.23.43.6
V
threshold
[V]
V
CC
[V]
175
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-34. I/O pin input threshold voltage vs. VCC.
VIL I/O pin read as “0”.
Figure 37-35. I/O pin input hysteresis vs. VCC.
105 °C
85 °C
25 °C
-40 °C
0.55
0.70
0.85
1.00
1.15
1.30
1.45
1.60
1.75
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
threshold
[V]
V
CC
[V]
105 °C
85 °C
25 °C -40 °C
0.08
0.11
0.14
0.17
0.20
0.23
0.26
0.29
0.32
1.61.82.02.22.42.62.83.03.23.43.6
V
threshold
[V]
V
CC
[V]
176
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.3 ADC Characteristics
Figure 37-36. INL error vs. external VREF.
T = 25
°
C, VCC = 3.6V, external reference.
Figure 37-37. INL error vs. sample rate.
T = 25
°
C, VCC = 3.6V, VREF = 3.0V external.
Single-ended Unsigned
Single-ended Signed
Differential Signed
0.7
0.8
0.9
1
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
V [V]
INL [LSB]
REF
Single-ended Unsigned
Single-ended Signed
Differential Mode
0.9
0.95
1
1.05
1.1
1.15
1.2
1.25
1.3
1.35
1.4
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
ADC Sample Rate [kSPS]
INL [LSB]
177
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-38. INL error vs. input code
Figure 37-39. DNL error vs. external VREF.
T = 25
°
C, VCC = 3.6V, external reference.
-2.0
-1.5
-1.0
-0.5
0
0.5
1.0
1.5
2.0
0 512 1024 1536 2048 2560 3072 3584 4096
ADC input code
INL [LSB]
Single-ended Unsigned
Single-ended Signed
Differential Mode
0.72
0.74
0.76
0.78
0.8
0.82
0.84
0.86
0.88
0.9
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
DNL [LSB]
V [V]
REF
178
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-40. DNL error vs. sample rate.
T = 25
°
C, VCC = 3.6V, VREF = 3.0V external.
Figure 37-41. DNL error vs. input code.
Single-ended Unsigned
Single-ended Signed
Differential Signed
0.79
0.8
0.81
0.82
0.83
0.84
0.85
0.86
0.87
0.88
0.89
0.9
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
ADC Sample Rate [kSPS]
DNL [LSB]
-0.6
-0.4
-0.2
0
0.2
0.4
0.6
0.8
0 512 1024 1536 2048 2560 3072 3584 4096
ADC Input Code
DNL [LSB]
179
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-42. Gain error vs. VREF.
T = 25
°
C, VCC = 3.6V, ADC sampling speed = 500ksps.
Figure 37-43. Gain error vs. VCC.
T = 25
°
C, VREF = external 1.0V, ADC sampling speed = 500ksps.
Single-ended Unsigned
Single-ended Signed
Differential Mode
-4
-3
-2
-1
0
1
2
3
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
V
Gain Error [mV]
REF [V]
Single-ended Unsigned
Single-ended Signed
Differential Mode
-0.5
-0.2
0.1
0.4
0.7
1
1.3
1.6
1.9
2.2
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
Gain Error [mV]
180
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-44. Offset error vs. VREF.
T = 25
°
C, VCC = 3.6V, ADC sampling speed = 500ksps.
Figure 37-45. Gain error vs. temperature.
VCC = 3.0V, VREF = external 2.0V.
Differential Mode
-2
-1.9
-1.8
-1.7
-1.6
-1.5
-1.4
-1.3
-1.2
-1.1
-1
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
Offset Error [mV]
VREF
[V]
Single-ended unsigned mode
Single-ended signed mode
Diff erential mode
-4
-3
-2
-1
0
1
2
3
4
-45-35-25-15-5 5 152535455565758595105
Gain Error [mV]
Temp erature [ºC]
181
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-46. Offset error vs. VCC.
T = 25
°
C, VREF = external 1.0V, ADC sampling speed = 500ksps.
Figure 37-47. Noise vs. VREF.
T = 25
°
C, VCC = 3.6V, ADC sampling speed = 500ksps.
Differential Signed
-1.2
-1.1
-1
-0.9
-0.8
-0.7
-0.6
-0.5
-0.4
-0.3
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
CC
[V]
Offset Error [mV]
Single-ended Unsigned
Single-ended Signed
Differential Signed
0.4
0.55
0.7
0.85
1
1.15
1.3
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
Noise [mV RMS]
182
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-48. Noise vs. VCC.
T = 25
°
C, VREF = external 1.0V, ADC sampling speed = 500ksps.
37.1.4 DAC Characteristics
Figure 37-49. DAC INL error vs. VREF.
VCC = 3.6V.
Single-ended Unsigned
Single-ended Signed
Differential Signed
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
1.1
1.2
1.3
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
Noise [mV RMS]
25°C
105°C
85°C
-40°C
0.0
0.5
1.0
1.5
2.0
2.5
3.0
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
INL [LSB]
Vref [V]
183
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-50. DNL error vs. VREF.
VCC = 3.6V.
Figure 37-51. DAC noise vs. temperature.
VCC = 3.0V, VREF = 2.4V .
25ºC
105°C
85°C
-40°C
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
DNL[LSB]
Vref [V]
0.150
0.155
0.160
0.165
0.170
0.175
0.180
0.185
-45-35-25-15-5 5 152535455565758595105
No ise [mV RMS]
Temp erature [ºC]
184
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.5 Analog Comparator Characteristics
Figure 37-52. Analog comparator hysteresis vs. VCC.
High-speed, small hysteresis.
Figure 37-53. Analog comparator hysteresis vs. VCC.
Low power, small hysteresis.
105 °C
85 °C
25
°C
-40 °
C
7
8
9
10
11
12
13
14
15
16
17
18
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
25
26
27
28
29
30
31
32
33
34
35
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
185
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-54. Analog comparator hysteresis vs. VCC.
High-speed mode, large hysteresis.
Figure 37-55. Analog comparator hysteresis vs. VCC.
Low power, large hysteresis.
105 °C
85 °C
25 °C
-40 °C
20
22
24
26
28
30
32
34
36
38
40
42
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
50
53
56
59
62
65
68
71
74
77
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
186
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-56. Analog comparator current source vs. calibration value.
Temperature = 25°C.
Figure 37-57. Analog comparator current source vs. calibration value.
VCC = 3.0V.
3.3 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
2.0
2.6
3.2
3.8
4.4
5.0
5.6
6.2
6.8
7.4
0 1 2 3 4 5 6 7 8 9 101112131415
I
CURRENTSOURCE
[µA]
CURRCALIBA[3..0]
105 °C
85 °C
25 °C
-40 °C
3
3.5
4
4.5
5
5.5
6
6.5
7
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
I
CURRENTSOURCE
[uA]
CURRCALIBA[3..0]
V
CC
3.0V
187
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-58. Voltage scaler INL vs. SCALEFAC.
T = 25
°
C, VCC = 3.0V.
37.1.6 Internal 1.0V reference Characteristics
Figure 37-59. ADC/DAC Internal 1.0V reference vs. temperature.
25°C
-0.150
-0.125
-0.100
-0.075
-0.050
-0.025
0
0.025
0.050
0 10203040506070
SCALEFAC
INL [LSB]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
0.986
0.988
0.990
0.992
0.994
0.996
0.998
1.000
1.002
1.004
-40 -25 -10 5 20 35 50 65 80 95 110
Bandgap Voltage [V]
Temperature [°C]
Calibrated at T 85 C
188
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.7 BOD Characteristics
Figure 37-60. BOD thresholds vs. temperature.
BOD level = 1.6V.
Figure 37-61. BOD thresholds vs. temperature.
BOD level = 3.0V.
Rising Vcc
Falling Vcc
1.600
1.605
1.610
1.615
1.620
1.625
1.630
1.635
-40 -25 -10 5 20 35 50 65 80 95 110
V
BOT
[V]
Temperature [°C]
Rising Vcc
Falling Vcc
2.97
2.98
2.99
3.00
3.01
3.02
3.03
3.04
3.05
3.06
-40 -25 -10 5 20 35 50 65 80 95 110
V
BOT
[V]
Temperature [°C]
189
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.8 External Reset Characteristics
Figure 37-62. Minimum Reset pin pulse width vs. VCC.
Figure 37-63. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 1.8V.
105 °C
85 °C
25 °C
-40 °C
80
85
90
95
100
105
110
115
120
125
130
1.61.82.02.22.42.62.83.03.23.43.6
t
RST
[ns]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
0
8
16
24
32
40
48
56
64
72
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
I
RESET
[uA]
V
RESET
[V]
190
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-64. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 3.0V.
Figure 37-65. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 3.3V.
105 °C
85 °C
25 °C
-40 °C
0
15
30
45
60
75
90
105
120
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
I
RESET
[µA]
V
RESET
[V]
105 °C
85 °C
25 °C
-40 °C
0
20
40
60
80
100
120
140
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
I
RESET
[uA]
V
RESET
[V]
191
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-66. Reset pin input threshold voltage vs. VCC.
VIH - Reset pin read as “1”.
Figure 37-67. Reset pin input threshold voltage vs. VCC.
VIL - Reset pin read as “0”.
105 °C
85 °C
25 °C
-40 °C
1.00
1.15
1.30
1.45
1.60
1.75
1.90
2.05
2.20
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
threshold
[V]
V
CC
[V]
105 °C
85 °C
25 °C
-40
°
C
0.40
0.55
0.70
0.85
1.00
1.15
1.30
1.45
1.60
1.75
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
threshold
[V]
V
CC
[V]
192
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.9 Power-on Reset Characteristics
Figure 37-68. Power-on reset current consumption vs. VCC.
BOD level = 3.0V, enabled in continuous mode.
Figure 37-69. Power-on reset current consumption vs. VCC.
BOD level = 3.0V, enabled in sampled mode.
105 °C
85 °C
25 °C
-
40
°C
0
100
200
300
400
500
600
700
0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8
I
CC
[µA]
V
CC
[V]
105
°
°C
85
°
°C
25 °C
-40 °C
0
65
130
195
260
325
390
455
520
585
650
0.4 0.7 1 1.3 1.6 1.9 2.2 2.5 2.8
I
CC
[µA]
V
CC
[V]
193
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.10 Oscillator Characteristics
37.1.10.1 Ultra Low-Power internal oscillator
Figure 37-70. Ultra Low-Power internal oscillator frequency vs. temperature.
37.1.10.2 32.768kHz Internal Oscillator
Figure 37-71. 32.768kHz internal oscillator frequency vs. temperature.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
29.6
30.0
30.4
30.8
31.2
31.6
32.0
32.4
32.8
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [kHz]
Temperature [°C]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
32.650
32.675
32.700
32.725
32.750
32.775
32.800
32.825
32.850
32.875
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [kHz]
Temperature [°C]
194
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-72. 32.768kHz internal oscillator frequency vs. calibration value.
VCC = 3.0V, T = 25°C.
37.1.10.3 2MHz Internal Oscillator
Figure 37-73. 2MHz internal oscillator frequency vs. temperature.
DFLL disabled.
20
25
30
35
40
45
50
55
0 26 52 78 104 130 156 182 208 234 260
Frequency [kHz]
RC32KCAL[7..0]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
1.96
1.98
2.00
2.02
2.04
2.06
2.08
2.10
2.12
2.14
2.16
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [MHz]
Temperature [°C]
195
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-74. 2MHz internal oscillator frequency vs. temperature.
DFLL enabled, from the 32.768kHz internal oscillator .
Figure 37-75. 2MHz internal oscillator CALA calibration step size.
VCC = 3V.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
1.9950
1.9965
1.9980
1.9995
2.0010
2.0025
2.0040
2.0055
2.0070
2.0085
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [MHz]
Temperature [°C]
105 °C
85 °C
25 °C
-40 °C
0.15 %
0.17 %
0.19 %
0.21 %
0.23 %
0.25 %
0.27 %
0.29 %
0.31 %
0 163248648096112128
Frequency Step size [%]
CALA
196
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.10.4 32MHz Internal Oscillator
Figure 37-76. 32MHz internal oscillator frequency vs. temperature.
DFLL disabled.
Figure 37-77. 32MHz internal oscillator frequency vs. temperature.
DFLL enabled, from the 32.768kHz internal oscillator.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
31.0
31.5
32.0
32.5
33.0
33.5
34.0
34.5
35.0
35.5
36.0
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [MHz]
Temperature [°C]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
31.920
31.945
31.970
31.995
32.020
32.045
32.070
32.095
32.120
32.145
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [MHz]
Temperature [°C]
1.6 V
197
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-78. 32MHz internal oscillator CALA calibration step size.
VCC = 3.0V.
Figure 37-79. 32MHz internal oscillator frequency vs. CALB calibration value.
VCC = 3.0V.
105 °C
85 °C
25 °C
-40 °C
0.10 %
0.14 %
0.18 %
0.22 %
0.26 %
0.30 %
0.34 %
0.38 %
0163248648096112128
Frequency Step size [%]
CALA
105°C
85°C
25°C
-40°C
25
30
35
40
45
50
55
60
65
70
75
0 8 16 24 32 40 48 56 64
Frequency [MHz]
CALB
198
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.10.5 32MHz internal oscillator calibrated to 48MHz
Figure 37-80. 48MHz internal oscillator frequency vs. temperature.
DFLL disabled.
Figure 37-81. 48MHz internal oscillator frequency vs. temperature.
DFLL enabled, from the 32.768kHz internal oscillator.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
46
47
48
49
50
51
52
53
54
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [MHz]
Temperature [°C]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
47.80
47.85
47.90
47.95
48.00
48.05
48.10
48.15
48.20
48.25
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [MHz]
Temperature [°C]
199
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-82. 48MHz internal oscillator CALA calibration step size.
VCC = 3.0V.
37.1.11 Two-Wire Interface characteristics
Figure 37-83. SDA hold time vs. supply voltage.
105 °C
85 °C
25 °C
-40 °C
0.10 %
0.13 %
0.16 %
0.19 %
0.22 %
0.25 %
0.28 %
0.31 %
0.34 %
0 16 32 48 64 80 96 112 128
Frequency Step size [%]
CALA
V
CC
3.0 V
105°C
85°C
25°C
-40°C
260
265
270
275
280
285
290
295
300
2.6 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
Holdtime [ns]
Vcc [V]
200
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.1.12 PDI characteristics
Figure 37-84. Maximum PDI frequency vs. VCC.
105 °C
85 °C
25 °C
-40 °C
10
13
16
19
22
25
28
31
34
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
f
MAX
[MHz]
V
CC
[V]
201
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2 ATxmega32A4U
37.2.1 Current consumption
37.2.1.1 Active mode supply current
Figure 37-85.Active supply current vs. frequency.
fSYS = 0 - 1MHz external clock, T = 25°C.
Figure 37-86.Active supply current vs. frequency.
fSYS = 1 - 32MHz external clock, T = 25°C.
3.3V
3.0V
2.7V
2.2V
1.8V
0
60
120
180
240
300
360
420
480
540
600
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency [MHz]
I
CC
[µA]
3.3V
3.0V
2.7V
0
2
4
6
8
10
12
0 4 8 121620242832
Frequency [MHz]
I
CC
[mA]
2.2V
1.8V
202
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-87.Active mode supply current vs. VCC.
fSYS = 32.768kHz internal oscillator.
Figure 37-88.Active mode supply current vs. VCC.
fSYS = 1MHz external clock.
105 °C
85 °C
25 °C
-40 °C
70
90
110
130
150
170
190
210
230
250
270
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
200
300
400
500
600
700
800
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
203
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-89.Active mode supply current vs. VCC.
fSYS = 2MHz internal oscillator.
Figure 37-90.Active mode supply current vs. VCC.
fSYS = 32MHz internal oscillator prescaled to 8MHz.
105 °C
85 °C
25 °C
-40 °C
400
600
800
1000
1200
1400
1600
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
1400
1900
2400
2900
3400
3900
4400
4900
5400
5900
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
204
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-91.Active mode supply current vs. VCC.
fSYS = 32MHz internal oscillator.
37.2.1.2 Idle mode supply current
Figure 37-92.Idle mode supply current vs. frequency.
fSYS = 0 - 1MHz external clock, T = 25°C.
105 °C
85 °C
25 °C
-40 °C
3400
3625
3850
4075
4300
4525
4750
4975
5200
5425
5650
2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
I
CC
[uA]
V
CC
[V]
3.3V
3.0V
2.7V
2.2V
1.8V
0
20
40
60
80
100
120
140
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
Frequency [MHz]
I
CC
[µA]
205
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-93.Idle mode supply current vs. frequency.
fSYS = 1 - 32MHz external clock, T = 25°C.
Figure 37-94. Idle mode supply current vs. VCC.
fSYS = 32.768kHz internal oscillator.
3.3V
3.0V
2.7V
0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
0 4 8 121620242832
Frequency [MHz]
I
CC
[mA]
2.2V
1.8V
105 °C
85 °C
25 °C
-40 °C
27
28
29
30
31
32
33
34
35
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
206
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-95. Idle mode supply current vs. VCC.
fSYS = 1MHz external clock.
Figure 37-96. Idle mode supply current vs. VCC.
fSYS = 2MHz internal oscillator.
105 °C
85 °C
25 °C
-40 °C
50
62
74
86
98
110
122
134
146
158
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
160
185
210
235
260
285
310
335
360
385
410
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
207
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-97. Idle mode supply current vs. VCC.
fSYS = 32MHz internal oscillator prescaled to 8MHz.
Figure 37-98. Idle mode current vs. VCC.
fSYS = 32MHz internal oscillator.
105 °C
85 °C
25 °C
-40 °C
600
800
1000
1200
1400
1600
1800
2000
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
3400
3625
3850
4075
4300
4525
4750
4975
5200
5425
5650
2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
I
CC
[uA]
V
CC
[V]
208
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.1.3 Power-down mode supply current
Figure 37-99. Power-down mode supply current vs. temperature.
All functions disabled.
Figure 37-100. Power-down mode supply current vs. VCC.
All functions disabled.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
0.00
0.50
1.00
1.50
2.00
2.50
3.00
3.50
-40 -25 -10 5 20 35 50 65 80 95 110
I
CC
[uA]
Temperature [°C]
105 °C
85 °C
25 °C
-40 °C
0.0
0.4
0.8
1.2
1.6
2.0
2.4
2.8
3.2
3.6
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
ICC [uA]
VCC [V]
209
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-101. Power-down mode supply current vs. VCC.
Watchdog and sampled BOD enabled.
37.2.1.4 Power-save mode supply current
Figure 37-102. Power-save mode supply current vs.VCC.
Real Time Counter enabled and running from 1.024kHz output of 32.768kHz TOSC.
105 °C
85
°
C
25 °C
-40 °C
1.1
1.6
2.1
2.6
3.1
3.6
4.1
4.6
5.1
1.61.82.02.22.42.62.83.03.23.43.6
I
CC
[µA]
V
CC
[V]
Normal mode
Low-power mode
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
V
CC
[V]
I
CC
[µA]
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
210
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.1.5 Standby mode supply current
Figure 37-103. Standby supply current vs. VCC.
Standby, fSYS =1MHz.
Figure 37-104. Standby supply current vs. VCC.
25°C, running from different crystal oscillators.
105 °C
85 °C
25 °C
-40 °C
2.5
3.5
4.5
5.5
6.5
7.5
8.5
9.5
10.5
11.5
12.5
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
16MHz
12MHz
8MHz
2MHz
0.454MHz
160
200
240
280
320
360
400
440
480
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
CC
[V]
I
CC
[µA]
211
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.2 I/O Pin Characteristics
37.2.2.1 Pull-up
Figure 37-105. I/O pin pull-up resistor current vs. input voltage.
VCC = 1.8V.
Figure 37-106. I/O pin pull-up resistor current vs. input voltage.
VCC = 3.0V.
105 °C
85 °C
25 °C
- 40 °C
0
8
16
24
32
40
48
56
64
72
0.00.20.40.60.81.01.21.41.61.8
I [µA]
V
PIN
[V]
105 °C
85 °C
25 °C
-40 °C
0
15
30
45
60
75
90
105
120
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
I [µA]
V
PIN
[V]
212
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-107. I/O pin pull-up resistor current vs. input voltage.
VCC = 3.3V.
37.2.2.2 Output Voltage vs. Sink/Source Current
Figure 37-108. I/O pin output voltage vs. source current.
VCC = 1.8V.
105 °C
85 °C
25 °C
-40 °C
0
15
30
45
60
75
90
105
120
135
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
I [µA]
V
PIN
[V]
105 °C
85 °C
25 °C-40 °C
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
-10-9-8-7-6-5-4-3-2-1 0
V
PIN
[V]
I
PIN
[mA]
213
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-109. I/O pin output voltage vs. source current.
VCC = 3.0V.
Figure 37-110. I/O pin output voltage vs. source current.
VCC = 3.3V.
105 °C
85 °C
25 °C
-40 °C
0.0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
3.0
-32-28-24-20-16-12 -8 -4 0
V
PIN
[V]
I
PIN
[mA]
105 °C
85 °C
25 °C
-40 °C
0.0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
3.0
3.3
-32-28-24-20-16-12 -8 -4 0
V
PIN
[V]
I
PIN
[mA]
214
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-111. I/O pin output voltage vs. source current.
Figure 37-112. I/O pin output voltage vs. sink current.
VCC = 1.8V.
3.6V
3.3V
3.0V
2.7V
2.3V
1.8V
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
-24 -21 -18 -15 -12 -9 -6 -3 0
I
PIN
[mA]
V
PIN
[V]
105
°
C
85 °C
25 °C
-40 °C
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
0246810121416
V
PIN
[V]
I
PIN
[mA]
215
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-113. I/O pin output voltage vs. sink current.
VCC = 3.0V.
Figure 37-114. I/O pin output voltage vs. sink current.
VCC = 3.3V.
Figure 37-115. I/O pin output voltage vs. sink current.
105 °C
85 °C
25 °C
-40 °C
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
02468101214161820
V
PIN
[V]
I
PIN
[mA]
105 °C
85 °C
25 °C
-40 °C
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
0 4 8 121620242832
V
PIN
[V]
I
PIN
[mA]
0
0.3
0.6
0.9
1.2
1.5
0 5 10 15 20 25 30
I
PIN
[mA]
V
PIN
[V]
1.8V
3.6V
3.3V
3.0V
2.7V
2.3V
216
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.2.3 Thresholds and Hysteresis
Figure 37-116. I/O pin input threshold voltage vs. VCC.
T = 25°C.
Figure 37-117. I/O pin input threshold voltage vs. VCC.
VIH I/O pin read as “1”.
VIL
VIH
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
Vcc [V]
Vthreshold [V]
105 °C
85 °C
25 °C
-40 °C
0.8
0.9
1.0
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.61.82.02.22.42.62.83.03.23.43.6
V
threshold
[V]
V
CC
[V]
217
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-118. I/O pin input threshold voltage vs. VCC.
VIL I/O pin read as “0”.
Figure 37-119. I/O pin input hysteresis vs. VCC.
105 °C
85 °C
25 °C
-40 °C
0.55
0.70
0.85
1.00
1.15
1.30
1.45
1.60
1.75
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
threshold
[V]
V
CC
[V]
105 °C
85 °C
25 °C -40 °C
0.08
0.11
0.14
0.17
0.20
0.23
0.26
0.29
0.32
1.61.82.02.22.42.62.83.03.23.43.6
V
threshold
[V]
V
CC
[V]
218
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.3 ADC Characteristics
Figure 37-120. INL error vs. external VREF.
T = 25
°
C, VCC = 3.6V, external reference.
Figure 37-121. INL error vs. sample rate.
T = 25
°
C, VCC = 3.6V, VREF = 3.0V external.
Single-ended Unsigned
Single-ended Signed
Differential Signed
0.7
0.8
0.9
1
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
V [V]
INL [LSB]
REF
Single-ended Unsigned
Single-ended Signed
Differential Mode
0.9
0.95
1
1.05
1.1
1.15
1.2
1.25
1.3
1.35
1.4
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
ADC Sample Rate [kSPS]
INL [LSB]
219
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-122. INL error vs. input code
Figure 37-123. DNL error vs. external VREF.
T = 25
°
C, VCC = 3.6V, external reference.
-2.0
-1.5
-1.0
-0.5
0
0.5
1.0
1.5
2.0
0 512 1024 1536 2048 2560 3072 3584 4096
ADC input code
INL [LSB]
Single-ended Unsigned
Single-ended Signed
Differential Mode
0.72
0.74
0.76
0.78
0.8
0.82
0.84
0.86
0.88
0.9
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
DNL [LSB]
V [V]
REF
220
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-124. DNL error vs. sample rate.
T = 25
°
C, VCC = 3.6V, VREF = 3.0V external.
Figure 37-125. DNL error vs. input code.
Single-ended Unsigned
Single-ended Signed
Differential Signed
0.79
0.8
0.81
0.82
0.83
0.84
0.85
0.86
0.87
0.88
0.89
0.9
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
ADC Sample Rate [kSPS]
DNL [LSB]
-0.6
-0.4
-0.2
0
0.2
0.4
0.6
0.8
0 512 1024 1536 2048 2560 3072 3584 4096
ADC Input Code
DNL [LSB]
221
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-126. Gain error vs. VREF.
T = 25
°
C, VCC = 3.6V, ADC sampling speed = 500ksps.
Figure 37-127. Gain error vs. VCC.
T = 25
°
C, VREF = external 1.0V, ADC sampling speed = 500ksps.
Single-ended Unsigned
Single-ended Signed
Differential Mode
-4
-3
-2
-1
0
1
2
3
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
V
Gain Error [mV]
REF [V]
Single-ended Unsigned
Single-ended Signed
Differential Mode
-0.5
-0.2
0.1
0.4
0.7
1
1.3
1.6
1.9
2.2
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
Gain Error [mV]
222
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-128. Offset error vs. VREF.
T = 25
°
C, VCC = 3.6V, ADC sampling speed = 500ksps.
Figure 37-129. Gain error vs. temperature.
VCC = 3.0V, VREF = external 2.0V.
Differential Mode
-2
-1.9
-1.8
-1.7
-1.6
-1.5
-1.4
-1.3
-1.2
-1.1
-1
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
Offset Error [mV]
VREF
[V]
Single-ended unsigned mode
Single-ended signed mode
Diff erential mode
-4
-3
-2
-1
0
1
2
3
4
-45-35-25-15-5 5 152535455565758595105
Gain Error [mV]
Temp erature [ºC]
223
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-130. Offset error vs. VCC.
T = 25
°
C, VREF = external 1.0V, ADC sampling speed = 500ksps.
Figure 37-131. Noise vs. VREF.
T = 25
°
C, VCC = 3.6V, ADC sampling speed = 500ksps.
Differential Signed
-1.2
-1.1
-1
-0.9
-0.8
-0.7
-0.6
-0.5
-0.4
-0.3
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
CC
[V]
Offset Error [mV]
Single-ended Unsigned
Single-ended Signed
Differential Signed
0.4
0.55
0.7
0.85
1
1.15
1.3
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
Noise [mV RMS]
224
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-132. Noise vs. VCC.
T = 25
°
C, VREF = external 1.0V, ADC sampling speed = 500ksps.
37.2.4 DAC Characteristics
Figure 37-133. DAC INL error vs. VREF.
VCC = 3.6V.
Single-ended Unsigned
Single-ended Signed
Differential Signed
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
1.1
1.2
1.3
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
Noise [mV RMS]
25°C
105°C
85°C
-40°C
0.0
0.5
1.0
1.5
2.0
2.5
3.0
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
INL [LSB]
Vref [V]
225
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-134. DNL error vs. VREF.
VCC = 3.6V.
Figure 37-135. DAC noise vs. temperature.
VCC = 3.0V, VREF = 2.4V .
25ºC
105°C
85°C
-40°C
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
DNL[LSB]
Vref [V]
0.150
0.155
0.160
0.165
0.170
0.175
0.180
0.185
-45-35-25-15-5 5 152535455565758595105
No ise [mV RMS]
Temp erature [ºC]
226
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.5 Analog Comparator Characteristics
Figure 37-136. Analog comparator hysteresis vs. VCC.
High-speed, small hysteresis.
Figure 37-137. Analog comparator hysteresis vs. VCC.
Low power, small hysteresis.
105 °C
85 °C
25
°C
-40 °
C
7
8
9
10
11
12
13
14
15
16
17
18
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
25
26
27
28
29
30
31
32
33
34
35
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
227
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-138. Analog comparator hysteresis vs. VCC.
High-speed mode, large hysteresis.
Figure 37-139. Analog comparator hysteresis vs. VCC.
Low power, large hysteresis.
105 °C
85 °C
25 °C
-40 °C
20
22
24
26
28
30
32
34
36
38
40
42
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
50
53
56
59
62
65
68
71
74
77
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
228
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-140. Analog comparator current source vs. calibration value.
Temperature = 25°C.
Figure 37-141. Analog comparator current source vs. calibration value.
VCC = 3.0V.
3.3 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
2.0
2.6
3.2
3.8
4.4
5.0
5.6
6.2
6.8
7.4
0 1 2 3 4 5 6 7 8 9 101112131415
I
CURRENTSOURCE
[µA]
CURRCALIBA[3..0]
105 °C
85 °C
25 °C
-40 °C
3
3.5
4
4.5
5
5.5
6
6.5
7
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
I
CURRENTSOURCE
[uA]
CURRCALIBA[3..0]
V
CC
3.0V
229
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-142. Voltage scaler INL vs. SCALEFAC.
T = 25
°
C, VCC = 3.0V.
37.2.6 Internal 1.0V reference Characteristics
Figure 37-143. ADC/DAC Internal 1.0V reference vs. temperature.
25°C
-0.150
-0.125
-0.100
-0.075
-0.050
-0.025
0
0.025
0.050
0 10203040506070
SCALEFAC
INL [LSB]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
0.986
0.988
0.990
0.992
0.994
0.996
0.998
1.000
1.002
1.004
-40 -25 -10 5 20 35 50 65 80 95 110
Bandgap Voltage [V]
Temperature [°C]
Calibrated at T 85 C
230
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.7 BOD Characteristics
Figure 37-144. BOD thresholds vs. temperature.
BOD level = 1.6V.
Figure 37-145. BOD thresholds vs. temperature.
BOD level = 3.0V.
Rising Vcc
Falling Vcc
1.600
1.605
1.610
1.615
1.620
1.625
1.630
1.635
-40 -25 -10 5 20 35 50 65 80 95 110
V
BOT
[V]
Temperature [°C]
Rising Vcc
Falling Vcc
2.97
2.98
2.99
3.00
3.01
3.02
3.03
3.04
3.05
3.06
-40 -25 -10 5 20 35 50 65 80 95 110
V
BOT
[V]
Temperature [°C]
231
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.8 External Reset Characteristics
Figure 37-146. Minimum Reset pin pulse width vs. VCC.
Figure 37-147. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 1.8V.
105 °C
85 °C
25 °C
-40 °C
80
85
90
95
100
105
110
115
120
125
130
1.61.82.02.22.42.62.83.03.23.43.6
t
RST
[ns]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
0
8
16
24
32
40
48
56
64
72
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
I
RESET
[uA]
V
RESET
[V]
232
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-148. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 3.0V.
Figure 37-149. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 3.3V.
105 °C
85 °C
25 °C
-40 °C
0
15
30
45
60
75
90
105
120
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
I
RESET
[µA]
V
RESET
[V]
105 °C
85 °C
25 °C
-40 °C
0
20
40
60
80
100
120
140
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
I
RESET
[uA]
V
RESET
[V]
233
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-150. Reset pin input threshold voltage vs. VCC.
VIH - Reset pin read as “1”.
Figure 37-151. Reset pin input threshold voltage vs. VCC.
VIL - Reset pin read as “0”.
105 °C
85 °C
25 °C
-40 °C
1.00
1.15
1.30
1.45
1.60
1.75
1.90
2.05
2.20
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
threshold
[V]
V
CC
[V]
105 °C
85 °C
25 °C
-40
°
C
0.40
0.55
0.70
0.85
1.00
1.15
1.30
1.45
1.60
1.75
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
threshold
[V]
V
CC
[V]
234
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.9 Power-on Reset Characteristics
Figure 37-152. Power-on reset current consumption vs. VCC.
BOD level = 3.0V, enabled in continuous mode.
Figure 37-153. Power-on reset current consumption vs. VCC.
BOD level = 3.0V, enabled in sampled mode.
105 °C
85 °C
25 °C
-
40
°C
0
100
200
300
400
500
600
700
0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8
I
CC
[µA]
V
CC
[V]
105
°
°C
85
°
°C
25 °C
-40 °C
0
65
130
195
260
325
390
455
520
585
650
0.4 0.7 1 1.3 1.6 1.9 2.2 2.5 2.8
I
CC
[µA]
V
CC
[V]
235
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.10 Oscillator Characteristics
37.2.10.1 Ultra Low-Power internal oscillator
Figure 37-154. Ultra Low-Power internal oscillator frequency vs. temperature.
37.2.10.2 32.768kHz Internal Oscillator
Figure 37-155. 32.768kHz internal oscillator frequency vs. temperature.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
29.6
30.0
30.4
30.8
31.2
31.6
32.0
32.4
32.8
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [kHz]
Temperature [°C]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
32.650
32.675
32.700
32.725
32.750
32.775
32.800
32.825
32.850
32.875
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [kHz]
Temperature [°C]
236
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-156. 32.768kHz internal oscillator frequency vs. calibration value.
VCC = 3.0V, T = 25°C.
37.2.10.3 2MHz Internal Oscillator
Figure 37-157. 2MHz internal oscillator frequency vs. temperature.
DFLL disabled.
20
25
30
35
40
45
50
55
0 26 52 78 104 130 156 182 208 234 260
Frequency [kHz]
RC32KCAL[7..0]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
1.96
1.98
2.00
2.02
2.04
2.06
2.08
2.10
2.12
2.14
2.16
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [MHz]
Temperature [°C]
237
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-158. 2MHz internal oscillator frequency vs. temperature.
DFLL enabled, from the 32.768kHz internal oscillator .
Figure 37-159. 2MHz internal oscillator CALA calibration step size.
VCC = 3V.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
1.9950
1.9965
1.9980
1.9995
2.0010
2.0025
2.0040
2.0055
2.0070
2.0085
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [MHz]
Temperature [°C]
105 °C
85 °C
25 °C
-40 °C
0.15 %
0.17 %
0.19 %
0.21 %
0.23 %
0.25 %
0.27 %
0.29 %
0.31 %
0 163248648096112128
Frequency Step size [%]
CALA
238
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.10.4 32MHz Internal Oscillator
Figure 37-160. 32MHz internal oscillator frequency vs. temperature.
DFLL disabled.
Figure 37-161. 32MHz internal oscillator frequency vs. temperature.
DFLL enabled, from the 32.768kHz internal oscillator.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
31.0
31.5
32.0
32.5
33.0
33.5
34.0
34.5
35.0
35.5
36.0
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [MHz]
Temperature [°C]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
31.920
31.945
31.970
31.995
32.020
32.045
32.070
32.095
32.120
32.145
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [MHz]
Temperature [°C]
1.6 V
239
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-162. 32MHz internal oscillator CALA calibration step size.
VCC = 3.0V.
Figure 37-163. 32MHz internal oscillator frequency vs. CALB calibration value.
VCC = 3.0V.
105 °C
85 °C
25 °C
-40 °C
0.10 %
0.14 %
0.18 %
0.22 %
0.26 %
0.30 %
0.34 %
0.38 %
0163248648096112128
Frequency Step size [%]
CALA
105°C
85°C
25°C
-40°C
25
30
35
40
45
50
55
60
65
70
75
0 8 16 24 32 40 48 56 64
Frequency [MHz]
CALB
240
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.10.5 32MHz internal oscillator calibrated to 48MHz
Figure 37-164. 48MHz internal oscillator frequency vs. temperature.
DFLL disabled.
Figure 37-165. 48MHz internal oscillator frequency vs. temperature.
DFLL enabled, from the 32.768kHz internal oscillator.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
46
47
48
49
50
51
52
53
54
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [MHz]
Temperature [°C]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
47.80
47.85
47.90
47.95
48.00
48.05
48.10
48.15
48.20
48.25
-40 -25 -10 5 20 35 50 65 80 95 110
Frequency [MHz]
Temperature [°C]
241
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-166. 48MHz internal oscillator CALA calibration step size.
VCC = 3.0V.
37.2.11 Two-Wire Interface characteristics
Figure 37-167. SDA hold time vs. supply voltage.
105 °C
85 °C
25 °C
-40 °C
0.10 %
0.13 %
0.16 %
0.19 %
0.22 %
0.25 %
0.28 %
0.31 %
0.34 %
0 16 32 48 64 80 96 112 128
Frequency Step size [%]
CALA
105°C
85°C
25°C
-40°C
260
265
270
275
280
285
290
295
300
2.6 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
Holdtime [ns]
Vcc [V]
242
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.2.12 PDI characteristics
Figure 37-168. Maximum PDI frequency vs. VCC.
105 °C
85 °C
25 °C
-40 °C
10
13
16
19
22
25
28
31
34
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
f
MAX
[MHz]
V
CC
[V]
243
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.3 ATxmega64A4U
37.3.1 Current consumption
37.3.1.1 Active mode supply current
Figure 37-169. Active supply current vs. frequency.
fSYS = 0 - 1MHz external clock, T = 25°C.
Figure 37-170. Active supply current vs. frequency.
fSYS = 1 - 32MHz external clock, T = 25°C.
3.6V
3.0V
2.7V
2.2V
1.8V
1.6V
0
100
200
300
400
500
600
700
0 0.10.20.30.40.50.60.70.80.9 1
I
CC
[µA]
Frequency [MHz]
3.6V
3.0V
2.7V
1.8V
1.6V
0
2
4
6
8
10
12
0 4 8 121620242832
I
CC
[mA]
Frequency [MHz]
2.2V
244
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-171. Active mode supply current vs. VCC.
fSYS = 32.768kHz internal oscillator.
Figure 37-172. Active mode supply current vs. VCC.
fSYS = 1MHz external clock.
105°C
85°C
25°C
- 40°C
50
70
90
110
130
150
170
190
210
230
250
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
I
CC
[µA]
VCC [V]
105°C
85°C
25°C
- 40°C
180
230
280
330
380
430
480
530
580
630
680
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
I
CC
[µA]
V
CC
[V]
245
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-173. Active mode supply current vs. VCC.
fSYS = 2MHz internal oscillator.
Figure 37-174. Active mode supply current vs. VCC.
fSYS = 32MHz internal oscillator prescaled to 8MHz.
105°C
85°C
25°C
- 40°C
400
500
600
700
800
900
1000
1100
1200
1300
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
I
CC
[µA]
VCC [V]
105°C
85°C
25°C
- 40°C
1.2
1.6
2.0
2.4
2.8
3.2
3.6
4.0
4.4
4.8
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
I
CC
[mA]
V
CC
[V]
246
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-175. Active mode supply current vs. VCC.
fSYS = 32MHz internal oscillator.
37.3.1.2 Idle mode supply current
Figure 37-176. Idle mode supply current vs. frequency.
fSYS = 0 - 1MHz external clock, T = 25°C.
105°C
85°C
25°C
- 40°C
7.0
7.5
8.0
8.5
9.0
9.5
10.0
10.5
11.0
11.5
12.0
2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
I
CC
[mA]
VCC [V]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
0
15
30
45
60
75
90
105
120
135
150
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
ICC [µA]
Frequency [MHz]
247
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-177. Idle mode supply current vs. frequency.
fSYS = 1 - 32MHz external clock, T = 25°C.
Figure 37-178. Idle mode supply current vs. VCC.
fSYS = 32.768kHz internal oscillator.
3.6 V
3.0 V
2.7 V
1.8 V
1.6 V
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
0 4 8 121620242832
ICC [mA]
F[MH]
2.2 V
105°C
85°C
25°C
- 40°C
28.00
28.75
29.50
30.25
31.00
31.75
32.50
33.25
34.00
34.75
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
I
CC
[µA]
V
CC
[V]
f
SYS
32.768kHz Internal Oscillator
248
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-179. Idle mode supply current vs. VCC.
fSYS = 1MHz external clock.
Figure 37-180. Idle mode supply current vs. VCC.
fSYS = 2MHz internal oscillator.
105°C
85°C
25°C
- 40°C
45
57
69
81
93
105
117
129
141
153
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
I
CC
[µA]
V
CC
[V]
105°C
85°C
25°C
- 40°C
150
175
200
225
250
275
300
325
350
375
400
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
I
CC
[µA]
V
CC
[V]
249
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-181. Idle mode supply current vs. VCC.
fSYS = 32MHz internal oscillator prescaled to 8MHz.
Figure 37-182. Idle mode current vs. VCC.
fSYS = 32MHz internal oscillator.
105°C
85°C
25°C
- 40°C
650
800
950
1100
1250
1400
1550
1700
1850
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
I
CC
[µA]
V
CC
[V]
105°C
85°C
25°C
- 40°C
3.1
3.3
3.5
3.7
3.9
4.1
4.3
4.5
4.7
4.9
5.1
2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
I
CC
[mA]
V
CC
[V]
250
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.3.1.3 Power-down mode supply current
Figure 37-183. Power-down mode supply current vs. temperature.
All functions disabled.
Figure 37-184. Power-down mode supply current vs. VCC.
All functions disabled.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
0.0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
-45 -30 -15 0 15 30 45 60 75 90 105
I
CC
[µA]
Temperature [°C]
105°C
85°C
25°C
- 40°C
0.0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
I
CC
[µA]
V
CC
[V]
251
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-185. Power-down mode supply current vs. VCC.
Watchdog and sampled BOD enabled.
37.3.1.4 Power-save mode supply current
Figure 37-186. Power-save mode supply current vs.VCC.
Real Time Counter enabled and running from 1.024kHz output of 32.768kHz TOSC.
105°C
85°C
25°C
- 40°C
1.10
1.40
1.70
2.00
2.30
2.60
2.90
3.20
3.50
3.80
4.10
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
I
CC
[µA]
V
CC
[V]
Normal mode
Low-power mode
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
V
CC
[V]
I
CC
[µA]
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
252
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.3.1.5 Standby mode supply current
Figure 37-187. Standby supply current vs. VCC.
Standby, fSYS =1MHz.
Figure 37-188. Standby supply current vs. VCC.
25°C, running from different crystal oscillators.
105 °C
85 °C
25 °C
-40 °C
2.5
3.5
4.5
5.5
6.5
7.5
8.5
9.5
10.5
11.5
12.5
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
16MHz
12MHz
8MHz
2MHz
0.454MHz
160
200
240
280
320
360
400
440
480
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
CC [V]
ICC [µA]
253
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.3.2 I/O Pin Characteristics
37.3.2.1 Pull-up
Figure 37-189. I/O pin pull-up resistor current vs. input voltage.
VCC = 1.8V.
Figure 37-190. I/O pin pull-up resistor current vs. input voltage.
VCC = 3.0V.
105°C
85°C
25°C
- 40°C
0
10
20
30
40
50
60
70
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
I
PIN
[uA]
V
PIN
[V]
105°C
85°C
25°C
- 40°C
0
15
30
45
60
75
90
105
120
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
I
PIN
[µA]
V
PIN
[V]
254
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-191. I/O pin pull-up resistor current vs. input voltage.
VCC = 3.3V.
37.3.2.2 Output Voltage vs. Sink/Source Current
Figure 37-192. I/O pin output voltage vs. source current.
VCC = 1.8V.
105°C
85°C
25°C
- 40°C
0
15
30
45
60
75
90
105
120
135
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
I
PIN
[µA]
V
PIN
[V]
105°C
85°C
25°C
- 40°C
0.5
0.7
0.9
1.1
1.3
1.5
1.7
1.9
-9 -8 -7 -6 -5 -4 -3 -2 -1 0
V
PIN
[V]
I
PIN
[mA]
255
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-193. I/O pin output voltage vs. source current.
VCC = 3.0V.
Figure 37-194. I/O pin output voltage vs. source current.
VCC = 3.3V.
105°C
85°C25°C
- 40°C
0.0
0.4
0.8
1.2
1.6
2.0
2.4
2.8
3.2
-30 -27 -24 -21 -18 -15 -12 -9 -6 -3 0
V
PIN
[V]
I
PIN
[mA]
105°C
85°C
25°C
- 40°C
0.0
0.4
0.8
1.2
1.6
2.0
2.4
2.8
3.2
3.6
-30 -27 -24 -21 -18 -15 -12 -9 -6 -3 0
V
PIN
[V]
I
PIN
[mA]
256
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-195. I/O pin output voltage vs. source current.
Figure 37-196. I/O pin output voltage vs. sink current.
VCC = 1.8V.
3.6 V
3.3 V
3.0 V
2.7 V
1.8 V
1.6 V
0.5
0.9
1.3
1.7
2.1
2.5
2.9
3.3
3.7
-24 -21 -18 -15 -12 -9 -6 -3 0
V
PIN
[V]
I
PIN
[mA]
- 40°C
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
02468101214161820
V
PIN
[V]
I
PIN
[mA]
25°C
85°C
105°C
257
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-197. I/O pin output voltage vs. sink current.
VCC = 3.0V.
Figure 37-198. I/O pin output voltage vs. sink current.
VCC = 3.3V.
105°C
85°C
25°C
- 40°C
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
0 3 6 9 12 15 18 21 24 27 30
V
PIN
[V]
I
PIN
[mA]
105°C
85°C
25°C
- 40°C
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
0 3 6 9 12 15 18 21 24 27 30
V
PIN
[V]
I
PIN
[mA]
258
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-199. I/O pin output voltage vs. sink current.
37.3.2.3 Thresholds and Hysteresis
Figure 37-200. I/O pin input threshold voltage vs. VCC.
T = 25°C.
3.6 V
3.3 V
3.0 V
2.7 V
0.00
0.15
0.30
0.45
0.60
0.75
0.90
1.05
1.20
1.35
1.50
0 3 6 9 12 15 18 21 24 27 30
V
PIN
[V]
I
PIN
[mA]
1.6 V 1.8 V
VIL
VIH
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
Vcc [V]
Vthreshold [V]
259
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-201. I/O pin input threshold voltage vs. VCC.
VIH I/O pin read as “1”.
Figure 37-202. I/O pin input threshold voltage vs. VCC.
VIL I/O pin read as “0”.
105 °C
85 °C
25 °C
-40 °C
0.8
0.9
1.0
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.61.82.02.22.42.62.83.03.23.43.6
V
threshold
[V]
V
CC
[V]
105 °C
85 °C
25 °C
-40 °C
0.55
0.70
0.85
1.00
1.15
1.30
1.45
1.60
1.75
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
threshold
[V]
V
CC
[V]
260
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-203. I/O pin input hysteresis vs. VCC.
37.3.3 ADC Characteristics
Figure 37-204. INL error vs. external VREF.
T = 25
°
C, VCC = 3.6V, external reference.
105 °C
85 °C
25 °C -40 °C
0.08
0.11
0.14
0.17
0.20
0.23
0.26
0.29
0.32
1.61.82.02.22.42.62.83.03.23.43.6
V
threshold
[V]
V
CC
[V]
Single-ended unsigned mode
Single-ended signed mode
Diff erential mode
0.0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
INL [LSB]
Vref [V]
261
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-205. INL error vs. sample rate.
T = 25
°
C, VCC = 2.7V, VREF = 1.0V external.
Figure 37-206. INL error vs. input code
Single-ended signed mode
Single-ended signed mode
Diff erential mode
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
INL [LSB]
ADC sample rate [kSps]
0 512 1024 1536 2048 2560 3072 3584 4096
2.0
1.5
1.0
0.5
0.0
-0.5
-1.0
-1.5
-2.0
INL [LSB]
ADC input code
262
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-207. DNL error vs. external VREF.
T = 25
°
C, VCC = 3.6V, external reference.
Figure 37-208. DNL error vs. sample rate.
T = 25
°
C, VCC = 2.7V, VREF = 1.0V external.
Single-ended unsigned mode
Single-ended signed mode
Dif f erential mode
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.1
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
DNL [LSB]
Vref [V]
Single-ended unsigned mode
Single-ended signed mode
Dif f erential mode
0.23
0.26
0.28
0.31
0.33
0.36
0.38
0.41
0.43
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
DNL [LSB]
ADC sample rate [kSps]
263
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-209. DNL error vs. input code.
Figure 37-210. Gain error vs. VREF.
T = 25
°
C, VCC = 3.6V, ADC sampling speed = 500ksps.
0 512 1024 1536 2048 2560 3072 3584 4096
1.0
0.8
0.6
0.4
0.2
0.0
-0.2
-0.4
-0.6
-0.8
-1.0
DNL [LSB]
ADC input code
Single-ended unsigned mode
Single-ended signed mode
Diff erential mode
0
2
4
6
8
10
12
1.01.21.41.61.82.02.22.42.62.83.0
Gain Error [mV]
Vref [V]
264
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-211. Gain error vs. VCC.
T = 25
°
C, VREF = external 1.0V, ADC sampling speed = 500ksps.
Figure 37-212. Offset error vs. VREF.
T = 25
°
C, VCC = 3.6V, ADC sampling speed = 500ksps.
Single-ended unsigned mode
Single-ended signed mode
Dif f erential mode
0
1
2
3
4
5
6
7
1.61.82.02.22.42.62.83.03.23.43.6
Gain Error [mV]
Vcc [V]
Differential mode
-1.5
-1.5
-1.4
-1.4
-1.3
-1.3
-1.2
-1.2
-1.1
-1.1
-1.0
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
Offset Error [mV]
Vref [V]
265
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-213. Gain error vs. temperature.
VCC = 2.7V, VREF = external 1.0V.
Figure 37-214. Offset error vs. VCC.
T = 25
°
C, VREF = external 1.0V, ADC sampling speed = 500ksps.
Single-ended unsigned mode
Single-ended signed mode
Dif f erential mode
0
1
2
3
4
5
6
7
8
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105
Gain Error [mV]
Temp erature [oC]
Diff erential mode
-1.1
-1.0
-0.9
-0.8
-0.7
-0.6
-0.5
-0.4
-0.3
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Offset Error [mV]
Vcc [V]
266
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-215. Noise vs. VREF.
T = 25
°
C, VCC = 3.6V, ADC sampling speed = 500ksps.
Figure 37-216. Noise vs. VCC.
T = 25
°
C, VREF = external 1.0V, ADC sampling speed = 500ksps.
Single-ended unsigend mode
Single-ended signed mode
Dif f erential mode
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
Noise [mV RMS]
Vref [V]
Single-ended unsigned mode
Single-ended signed mode
Dif f erential mode
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
No ise [mV RMS]
Vcc [V]
267
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.3.4 DAC Characteristics
Figure 37-217. DAC INL error vs. VREF.
VCC = 3.6V.
Figure 37-218. DNL error vs. VREF.
VCC = 3.6V.
105°C
85°C
25°C
- 40°C
0.0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
DACINL [LSB]
Vref [V]
105°C
85°C
25°C
- 40°C
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
DAC DNL [LSB]
Vref [V]
268
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-219. DAC noise vs. temperature.
VCC = 2.7V, VREF = 1.0V .
37.3.5 Analog Comparator Characteristics
Figure 37-220. Analog comparator hysteresis vs. VCC.
High-speed, small hysteresis.
0.160
0.162
0.164
0.166
0.168
0.170
0.172
0.174
0.176
0.178
-45-35-25-15-5 5 152535455565758595105
Noise[mV RMS]
Temp erature [oC]
105°C
85°C
25°C
- 40°C
15
16
17
18
19
20
21
22
23
24
25
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
269
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-221. Analog comparator hysteresis vs. VCC.
Low power, small hysteresis.
Figure 37-222. Analog comparator hysteresis vs. VCC.
High-speed mode, large hysteresis.
105°C
85°C
25°C
- 40°C
20
22
24
26
28
30
32
34
36
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
105°C
85°C
25°C
- 40°C
27
29
31
33
35
37
39
41
43
45
47
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
270
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-223. Analog comparator hysteresis vs. VCC.
Low power, large hysteresis.
Figure 37-224. Analog comparator current source vs. calibration value.
Temperature = 25°C.
105°C
85°C
25°C
- 40°C
46
49
52
55
58
61
64
67
70
73
76
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
2
3
4
5
6
7
8
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
I
CURRENTSOURCE
[µA]
CURRCALIBA[3..0]
3.6V
3.0V
2.7V
2.2V
1.8V
1.6V
271
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-225. Analog comparator current source vs. calibration value.
VCC = 3.0V.
Figure 37-226. Voltage scaler INL vs. SCALEFAC.
T = 25
°
C, VCC = 3.0V.
105°C
85°C
25°C
- 40°C
3.6
4.0
4.4
4.8
5.2
5.6
6.0
6.4
6.8
7.2
0 1 2 3 4 5 6 7 8 9 101112131415
I
CURRENTSOURCE
[uA]
CURRCALIBA[3..0]
-0.15
-0.12
-0.09
-0.06
-0.03
0.00
0.03
0.06
0.09
0.12
0.15
0 8 16 24 32 40 48 56 64
INL [LSB]
SCALEFAC
272
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.3.6 Internal 1.0V reference Characteristics
Figure 37-227. ADC/DAC Internal 1.0V reference vs. temperature.
37.3.7 BOD Characteristics
Figure 37-228. BOD thresholds vs. temperature.
BOD level = 1.6V.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
0.992
0.994
0.996
0.998
1.000
1.002
1.004
-45 -30 -15 0 15 30 45 60 75 90 105
Bandgap Voltage [V]
Temperature [°C]
Rising Vcc
Falling Vcc
1.617
1.620
1.623
1.626
1.629
1.632
1.635
1.638
1.641
1.644
-45 -30 -15 0 15 30 45 60 75 90 105
V
BOT
[V]
Temperature [°C]
273
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-229. BOD thresholds vs. temperature.
BOD level = 3.0V.
37.3.8 External Reset Characteristics
Figure 37-230. Minimum Reset pin pulse width vs. VCC.
Rising Vcc
Falling Vcc
3.00
3.01
3.02
3.03
3.04
3.05
3.06
3.07
3.08
-45 -30 -15 0 15 30 45 60 75 90 105
V
BOT
[V]
Temperature [°C]
105°C
85°C
25°C
- 40°C
85
90
95
100
105
110
115
120
125
130
135
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
t
RST
[ns]
V
CC
[V]
274
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-231. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 1.8V.
Figure 37-232. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 3.0V.
105°C
85°C
25°C
- 40°C
0
10
20
30
40
50
60
70
80
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
I
RESET
[µA]
V
RESET
[V]
105°C
85°C
25°C
- 40°C
0
15
30
45
60
75
90
105
120
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
I
RESET
[µA]
V
RESET
[V]
275
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-233. Reset pin pull-up resistor current vs. reset pin voltage.
VCC = 3.3V.
Figure 37-234. Reset pin input threshold voltage vs. VCC.
VIH - Reset pin read as “1”.
105°C
85°C
25°C
- 40°C
0
15
30
45
60
75
90
105
120
135
150
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
I
RESET
[µA]
V
RESET
[V]
105°C
85°C
25°C
-
- 40°C
1.0
1.2
1.3
1.5
1.6
1.8
1.9
2.1
2.2
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
THRESHOLD
[V]
V
CC
[V]
276
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-235. Reset pin input threshold voltage vs. VCC.
VIL - Reset pin read as “0”.
37.3.9 Power-on Reset Characteristics
Figure 37-236. Power-on reset current consumption vs. VCC.
BOD level = 3.0V, enabled in continuous mode.
105°C
85°C
25°C
- 40°C
0.40
0.55
0.70
0.85
1.00
1.15
1.30
1.45
1.60
1.75
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
THRESHOLD
[V]
V
CC
[V]
105°C
85°C
25°C
- 40°C
0
50
100
150
200
250
300
0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8
ICC [µA]
VCC [V]
277
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-237. Power-on reset current consumption vs. VCC.
BOD level = 3.0V, enabled in sampled mode.
37.3.10 Oscillator Characteristics
37.3.10.1 Ultra Low-Power internal oscillator
Figure 37-238. Ultra Low-Power internal oscillator frequency vs. temperature.
105°C
85°C
25°C
- 40°C
0
50
100
150
200
250
300
0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8
ICC [µA]
VCC [V]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
31.0
31.3
31.6
31.9
32.2
32.5
32.8
33.1
33.4
33.7
34.0
-45 -30 -15 0 15 30 45 60 75 90 105
Frequency [kHz]
Temperature [°C]
278
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.3.10.2 32.768kHz Internal Oscillator
Figure 37-239. 32.768kHz internal oscillator frequency vs. temperature.
Figure 37-240. 32.768kHz internal oscillator frequency vs. calibration value.
VCC = 3.0V, T = 25°C.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
32.55
32.58
32.61
32.64
32.67
32.70
32.73
32.76
32.79
32.82
32.85
-45 -30 -15 0 15 30 45 60 75 90 105
Frequency [kHz]
Temperature [°C]
23
26
29
32
35
38
41
44
47
50
53
0 30 60 90 120 150 180 210 240 270
Frequency [kHz]
RC32KCAL[7..0]
279
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.3.10.3 2MHz Internal Oscillator
Figure 37-241. 2MHz internal oscillator frequency vs. temperature.
DFLL disabled.
Figure 37-242. 2MHz internal oscillator frequency vs. temperature.
DFLL enabled, from the 32.768kHz internal oscillator .
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
1.94
1.96
1.98
2.00
2.02
2.04
2.06
2.08
2.10
2.12
-45 -30 -15 0 15 30 45 60 75 90 105
Frequency [MHz]
Temperature [°C]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
1.988
1.990
1.992
1.994
1.996
1.998
2.000
2.002
2.004
2.006
2.008
2.010
-45 -30 -15 0 15 30 45 60 75 90 105
Frequency [MHz]
Temperature [°C]
280
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-243. 2MHz internal oscillator CALA calibration step size.
VCC = 3V.
37.3.10.4 32MHz Internal Oscillator
Figure 37-244. 32MHz internal oscillator frequency vs. temperature.
DFLL disabled.
105°C
85°C
25°C
- 40°C
0.12 %
0.14 %
0.16 %
0.18 %
0.20 %
0.22 %
0.24 %
0.26 %
0.28 %
0 163248648096112128
Frequency Step size [%]
CALA
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
31.0
31.5
32.0
32.5
33.0
33.5
34.0
34.5
35.0
35.5
-45 -30 -15 0 15 30 45 60 75 90 105
Frequency [MHz]
Temperature [°C]
281
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-245. 32MHz internal oscillator frequency vs. temperature.
DFLL enabled, from the 32.768kHz internal oscillator.
Figure 37-246. 32MHz internal oscillator CALA calibration step size.
VCC = 3.0V.
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V 1.6 V
31.80
31.84
31.88
31.92
31.96
32.00
32.04
32.08
32.12
-45 -30 -15 0 15 30 45 60 75 90 105
Frequency [MHz]
Temperature [°C]
105°C
85°C
25°C
- 40°C
0.10 %
0.13 %
0.16 %
0.19 %
0.22 %
0.25 %
0.28 %
0.31 %
0.34 %
0 15 30 45 60 75 90 105 120 135
Frequency Step size[%]
CALA
282
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-247. 32MHz internal oscillator CALB calibration step size.
VCC = 3.0V
37.3.10.5 32MHz internal oscillator calibrated to 48MHz
Figure 37-248. 48MHz internal oscillator frequency vs. temperature.
DFLL disabled.
105°C
85°C
25°C
- 40°C
0.80 %
1.00 %
1.20 %
1.40 %
1.60 %
1.80 %
2.00 %
2.20 %
2.40 %
2.60 %
2.80 %
0 8 16 24 32 40 48 56 64
Frequency Step size [%]
CALB
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
46.2
47.0
47.8
48.6
49.4
50.2
51.0
51.8
52.6
53.4
-45 -30 -15 0 15 30 45 60 75 90 105
Frequency[MHz]
Temperature [°C]
283
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-249. 48MHz internal oscillator frequency vs. temperature.
DFLL enabled, from the 32.768kHz internal oscillator.
Figure 37-250. 48MHz internal oscillator CALA calibration step size.
VCC = 3.0V
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
47.70
47.75
47.80
47.85
47.90
47.95
48.00
48.05
48.10
48.15
-45 -30 -15 0 15 30 45 60 75 90 105
Frequency[MHz]
Temperature [°C]
105°C
85°C
25°C
- 40°C
0.10 %
0.12 %
0.14 %
0.16 %
0.18 %
0.20 %
0.22 %
0.24 %
0.26 %
0.28 %
0.30 %
0 16 32 48 64 80 96 112 128
Frequency Step size [%]
CALA
284
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.3.11 Two-Wire Interface characteristics
Figure 37-251. SDA hold time vs. supply voltage.
37.3.12 PDI characteristics
Figure 37-252. Maximum PDI frequency vs. VCC.
105°C
85°C
25°C
-40°C
260
265
270
275
280
285
290
295
300
2.6 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
Holdtime [ns]
Vcc [V]
105°C
85°C
25°C
-
- 40°C
10
12
14
16
18
20
22
24
26
28
30
1.61.82.02.22.42.62.83.03.23.43.6
Maximum Frequency [MHz]
VCC [V]
285
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.4 ATxmega128A4U
37.4.1 Current consumption
37.4.1.1 Active mode supply current
Figure 37-253. Active supply current vs. frequency.
fSYS = 0 - 1MHz external clock, T = 25°C.
Figure 37-254. Active supply current vs. frequency.
fSYS = 1 - 32MHz external clock, T = 25°C.
3.6V
3.0V
2.7V
2.2V
1.8V
1.6V
0
100
200
300
400
500
600
700
800
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency [MHz]
Icc [µA]
3.6V
3.0V
2.7V
0
1.5
3.0
4.5
6.0
7.5
9.0
10.5
12.0
13.5
0 4 8 121620242832
Frequency [MHz]
Icc [mA]
2.2V
1.8V
286
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-255. Active mode supply current vs. VCC.
fSYS = 32.768kHz internal oscillator
Figure 37-256. Active mode supply current vs. VCC.
fSYS = 1MHz external clock.
105 °C
85 °C
25 °C
- 4 0 ° C
0
30
60
90
120
150
180
210
240
270
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
IccVcc [uA]
VCC [V]
105 °C
85 °C
25 °C
-40 °C
0
100
200
300
400
500
600
700
800
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Icc [uA]
Vcc [V]
287
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-257. Active mode supply current vs. VCC.
fSYS = 2MHz internal oscillator
Figure 37-258. Active mode supply current vs. VCC.
fSYS = 32MHz internal oscillator prescaled to 8MHz.
105 °C
85 °C
25 °C
-40 °C
0
175
350
525
700
875
1050
1225
1400
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
Icc [uA]
Vcc [V]
105 °C
85 °C
25 °C
-40 °C
1000
1600
2200
2800
3400
4000
4600
5200
5800
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Icc [uA]
VCC [V]
288
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-259. Active mode supply current vs. VCC.
fSYS = 32MHz internal oscillator.
37.4.1.2 Idle mode supply current
Figure 37-260. Idle mode supply current vs. frequency.
fSYS = 0 - 1MHz external clock, T = 25°C
105 °C
85 °C
25 °C
-40 °C
7.0
7.8
8.6
9.4
10.2
11.0
11.8
12.6
13.4
2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
Icc [mA]
VCC [V]
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
0
20
40
60
80
100
120
140
160
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency [MHz]
Icc [µA]
289
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-261. Idle mode supply current vs. frequency.
fSYS = 1 - 32MHz external clock, T = 25°C
Figure 37-262. Idle mode supply current vs. VCC.
fSYS = 32.768kHz internal oscillator.
3.6V
3.0V
2.7V
0
0.6
1.2
1.8
2.4
3.0
3.6
4.2
4.8
5.4
0 4 8 121620242832
Frenquecy [MHz]
Icc [mA]
2.2V
1.8V
105 °C
85 °C
25 °C
-40 °C
27
28
29
30
31
32
33
34
35
36
37
38
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Icc [uA]
Vcc [V]
290
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-263. Idle mode supply current vs. VCC.
fSYS = 1MHz external clock
Figure 37-264. Idle mode supply current vs. VCC.
fSYS = 2MHz internal oscillator
105 °C
85 °C
25 °C
-40 °C
50
60
70
80
90
100
110
120
130
140
150
160
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Icc[uA]
VCC [V]
105 °C
85
°C
25
°
C
-
40 °C
90
110
130
150
170
190
210
230
250
270
290
310
330
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Icc [uA]
Vcc [V]
291
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-265. Idle mode supply current vs. VCC.
fSYS = 32MHz internal oscillator prescaled to 8MHz
Figure 37-266. Idle mode current vs. VCC.
fSYS = 32MHz internal oscillator
105 °C
85 °C
25
°C
-40 °C
600
800
1000
1200
1400
1600
1800
2000
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Icc [uA]
Vcc [V]
105 °C
85 °C
25 °C
-40 °C
3000
3250
3500
3750
4000
4250
4500
4750
5000
2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
Icc [uA]
Vcc [V]
292
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.4.1.3 Power-down mode supply current
Figure 37-267. Power-down mode supply current vs. temperature.
All functions disabled
Figure 37-268. Power-down mode supply current vs. VCC.
All functions disabled
3.6 V
3.0 V
2.7 V
2.2 V
1.8 V
1.6 V
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
-45-35-25-15-5 5 152535455565758595105
Icc [uA]
Temp erature [°C]
105 °C
85 °C
25 °C
-40 °C
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Icc [uA]
Vcc [V]
293
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-269. Power-down mode supply current vs. VCC.
Watchdog and sampled BOD enabled
37.4.1.4 Power-save mode supply current
Figure 37-270. Power-save mode supply current vs.VCC.
Real Time Counter enabled and running from 1.024kHz output of 32.768kHz TOSC.
105
°
C
85 °C
25 °C
-40 °C
0.8
1.3
1.8
2.3
2.8
3.3
3.8
4.3
4.8
5.3
5.8
6.3
6.8
7.3
1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Icc [uA]
Vcc [V]
Normal mode
Low-power mode
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
V
CC
[V]
I
CC
[µA]
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
294
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.4.1.5 Standby mode supply current
Figure 37-271. Standby supply current vs. VCC.
Standby, fSYS =1MHz
Figure 37-272. Standby supply current vs. VCC.
T = 25°C, running from different crystal oscillators
105 °C
85 °C
25 °C
-40 °C
2.5
3.5
4.5
5.5
6.5
7.5
8.5
9.5
10.5
11.5
12.5
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
I
CC
[uA]
V
CC
[V]
16MHz
12MHz
8MHz
2MHz
0.454MHz
160
200
240
280
320
360
400
440
480
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
CC
[V]
I
CC
[µA]
295
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.4.2 I/O Pin Characteristics
37.4.2.1 Pull-up
Figure 37-273. I/O pin pull-up resistor current vs. input voltage.
VCC = 1.8V
Figure 37-274. I/O pin pull-up resistor current vs. input voltage.
VCC = 3.0V
105 °C
85 °C
25 °C
-40 °C
0
8
16
24
32
40
48
56
64
72
0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7
I [uA]
Vpin [V]
105 °C
85 °C
25 °C
-40 °C
0
15
30
45
60
75
90
105
120
0.1 0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8 3.1
I [uA]
Vpin [V]
296
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-275. I/O pin pull-up resistor current vs. input voltage.
VCC = 3.3V.
37.4.2.2 Output Voltage vs. Sink/Source Current
Figure 37-276. I/O pin output voltage vs. source current.
VCC = 1.8V
105 °C
85 °C
25 °C
-40 °C
0
15
30
45
60
75
90
105
120
135
0.1 0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8 3.1 3.4
I [uA]
Vpin [V]
105 °C
85 °C
25 °C
-40 °C
0.5
0.6
0.7
0.8
0.9
1.0
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.9
-10-9-8-7-6-5-4-3-2-1 0
Vpin [V]
Ipin [mA]
297
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-277. I/O pin output voltage vs. source current.
VCC = 3.0V
Figure 37-278. I/O pin output voltage vs. source current.
VCC = 3.3V
105 °C
85 °C
25 °C
-40 °C
0.50
0.85
1.20
1.55
1.90
2.25
2.60
2.95
3.30
-30 -27 -24 -21 -18 -15 -12 -9 -6 -3 0
Vpin [V]
Ipin [mA]
105 °C
85 °C
25 °C
-40 °C
0.5
0.8
1.1
1.4
1.7
2.0
2.3
2.6
2.9
3.2
3.5
-30 -27 -24 -21 -18 -15 -12 -9 -6 -3 0
Vpin [V]
Ipin [mA]
298
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-279. I/O pin output voltage vs. source current
Figure 37-280. I/O pin output voltage vs. sink current.
VCC = 1.8V
3.6 V
3.3 V
3.0 V
2.7 V
1.8 V
1.6 V
0.50
0.85
1.20
1.55
1.90
2.25
2.60
2.95
3.30
3.65
-24 -21 -18 -15 -12 -9 -6 -3 0
Vpin [V]
Ipin [mA]
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
0 2 4 6 8 101214161820
Vpin [V]
Ipin [mA]
-40 °C
25 °C
105 °C 85 °C
299
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-281. I/O pin output voltage vs. sink current.
VCC = 3.0V
Figure 37-282. I/O pin output voltage vs. sink current.
VCC = 3.3V
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.1
036912151821242730
Vpin [V]
Ipin [mA]
-40 °C
25 °C
85 °C
105 °C
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
036912151821242730
Vpin [V]
Ipin [mA]
-40 °C
25 °C
85 °C
105 °C
300
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-283. I/O pin output voltage vs. sink current
37.4.2.3 Thresholds and Hysteresis
Figure 37-284. I/O pin input threshold voltage vs. VCC.
T = 25°C
3.6 V
3.3 V
3.0 V
2.7 V
0.00
0.15
0.30
0.45
0.60
0.75
0.90
1.05
1.20
1.35
1.50
036912151821242730
Vpin [V]
Ipin [mA]
1.6 V
1.8 V
VIL
VIH
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
Vcc [V]
Vthreshold [V]
301
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-285. I/O pin input threshold voltage vs. VCC.
VIH I/O pin read as “1”
Figure 37-286. I/O pin input threshold voltage vs. VCC.
VIL I/O pin read as “0”
0.8
0.9
1.0
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vthreshold [V]
Vcc [V]
105 °C
85 °C
25 °C
-40 °C
0.40
0.55
0.70
0.85
1.00
1.15
1.30
1.45
1.60
1.75
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vthreshold [V]
Vcc [V]
105 °C
85 °C
-40 °C
25 °C
302
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-287. I/O pin input hysteresis vs. VCC
37.4.3 ADC Characteristics
Figure 37-288. INL error vs. external VREF
T = 25
°
C, VCC = 3.6V, external reference
0.17
0.19
0.21
0.23
0.25
0.27
0.29
0.31
0.33
0.35
0.37
0.39
0.41
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Vthreshold [V]
Vcc [V]
25 °C
85 °C
105 °C
-40 °C
Single-ended Unsigned
Single-ended Signed
Differential Signed
0.7
0.8
0.9
1
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
V [V]
INL [LSB]
REF
303
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-289. INL error vs. sample rate
T = 25
°
C, VCC = 3.6V, VREF = 3.0V external
Figure 37-290. INL error vs. input code
Single-ended Unsigned
Single-ended Signed
Differential Mode
0.9
0.95
1
1.05
1.1
1.15
1.2
1.25
1.3
1.35
1.4
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
ADC Sample Rate [kSPS]
INL [LSB]
-2.0
-1.5
-1.0
-0.5
0
0.5
1.0
1.5
2.0
0 512 1024 1536 2048 2560 3072 3584 4096
ADC input code
INL [LSB]
304
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-291. DNL error vs. external VREF
T = 25
°
C, VCC = 3.6V, external reference
Figure 37-292. DNL error vs. sample rate
T = 25
°
C, VCC = 3.6V, VREF = 3.0V external
Single-ended Unsigned
Single-ended Signed
Differential Mode
0.72
0.74
0.76
0.78
0.8
0.82
0.84
0.86
0.88
0.9
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
DNL [LSB]
V [V]
REF
Single-ended Unsigned
Single-ended Signed
Differential Signed
0.79
0.8
0.81
0.82
0.83
0.84
0.85
0.86
0.87
0.88
0.89
0.9
500 650 800 950 1100 1250 1400 1550 1700 1850 2000
ADC Sample Rate [kSPS]
DNL [LSB]
305
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-293. DNL error vs. input code
Figure 37-294. Gain error vs. VREF
T = 25
°
C, VCC = 3.6V, ADC sampling speed = 500ksps
-0.6
-0.4
-0.2
0
0.2
0.4
0.6
0.8
0 512 1024 1536 2048 2560 3072 3584 4096
ADC Input Code
DNL [LSB]
Single-ended Unsigned
Single-ended Signed
Differential Mode
-4
-3
-2
-1
0
1
2
3
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
V
Gain Error [mV]
REF [V]
306
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-295. Gain error vs. VCC
T = 25
°
C, VREF = external 1.0V, ADC sampling speed = 500ksps
Figure 37-296. Offset error vs. VREF
T = 25
°
C, VCC = 3.6V, ADC sampling speed = 500ksps
Single-ended Unsigned
Single-ended Signed
Differential Mode
-0.5
-0.2
0.1
0.4
0.7
1
1.3
1.6
1.9
2.2
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
Gain Error [mV]
Differential Mode
-2
-1.9
-1.8
-1.7
-1.6
-1.5
-1.4
-1.3
-1.2
-1.1
-1
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
Offset Error [mV]
VREF
[V]
307
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-297. Gain error vs. temperature
VCC = 3.0V, VREF = external 2.0V
Figure 37-298. Offset error vs. VCC
T = 25
°
C, VREF = external 1.0V, ADC sampling speed = 500ksps
Single-ended Unsigned
Single-ended Signed
Differential Signed
-4
-3
-2
-1
0
1
2
3
-45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85
Temperature [ºC]
Gain Error [mV]
Differential Signed
-1.2
-1.1
-1
-0.9
-0.8
-0.7
-0.6
-0.5
-0.4
-0.3
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
V
CC
[V]
Offset Error [mV]
308
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-299. Noise vs. VREF
T = 25
°
C, VCC = 3.6V, ADC sampling speed = 500ksps
Figure 37-300. Noise vs. VCC
T = 25
°
C, VREF = external 1.0V, ADC sampling speed = 500ksps
Single-ended Unsigned
Single-ended Signed
Differential Signed
0.4
0.55
0.7
0.85
1
1.15
1.3
1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3
VREF [V]
Noise [mV RMS]
Single-ended Unsigned
Single-ended Signed
Differential Signed
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
1.1
1.2
1.3
1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6
VCC [V]
Noise [mV RMS]
309
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.4.4 DAC Characteristics
Figure 37-301. DAC INL error vs. VREF
VCC = 3.6V
Figure 37-302. DNL error vs. VREF.
T = 25
°
C, VCC = 3.6V.
25°C
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.9
V
REF
[V]
INL [LSB]
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0
25ºC
0.6
0.65
0.7
0.75
0.8
0.85
0.9
1.6 1.8 2 2.2 2.4 2.6 2.8 3
DNL [LSB]
V [V]
REF
310
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-303. DAC noise vs. temperature
VCC = 3.0V, VREF = 2.4V
37.4.5 Analog Comparator Characteristics
Figure 37-304. Analog comparator hysteresis vs. VCC.
High-speed, small hysteresis
0.150
0.155
0.160
0.165
0.170
0.175
0.180
0.185
-45-35-25-15-5 5 152535455565758595105
No ise [mV RMS]
Temp erature [ºC]
-40°
25°C
85°C
105°
4
5
6
7
8
9
10
11
12
13
14
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
C
311
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-305. Analog comparator hysteresis vs. VCC.
Low power, small hysteresis
Figure 37-306. Analog comparator hysteresis vs. VCC.
High-speed mode, large hysteresis
-40°C
25°C
85°C
105°C
12
14
16
18
20
22
24
26
28
30
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
-40°C
25°C
85°C
105°C
14
16
18
20
22
24
26
28
30
32
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VHYST [mV]
VCC [V]
312
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-307. Analog comparator hysteresis vs. VCC.
Low power, large hysteresis
Figure 37-308. Analog comparator current source vs. calibration value.
Temperature = 25°C
-40°C
25°C
85°C
105°C
32
36
40
44
48
52
56
60
64
68
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
HYST
[mV]
V
CC
[V]
3.6V
3.0V
2.2V
1.8V
2
2.5
3
3.5
4
4.5
5
5.5
6
6.5
7
7.5
8
0123456789101112131415
CURRCALIBA[3..0]
I
CURRENTSOURCE
[µA]
313
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-309. Analog comparator current source vs. calibration value.
VCC = 3.0V.
Figure 37-310. Voltage scaler INL vs. SCALEFAC.
T = 25
°
C, VCC = 3.0V.
85°C
25°C
-40°C
3
3.5
4
4.5
5
5.5
6
6.5
7
0123456789101112131415
CURRCALIBA[3..0]
I
CURRENTSOURCE
[µA]
25°C
-0.150
-0.125
-0.100
-0.075
-0.050
-0.025
0
0.025
0.050
0 10203040506070
SCALEFAC
INL [LSB]
314
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.4.6 Internal 1.0V reference Characteristics
Figure 37-311. ADC/DAC Internal 1.0V reference vs. temperature
37.4.7 BOD Characteristics
Figure 37-312. BOD thresholds vs. temperature.
BOD level = 1.6V
3.6V
3.0V
2.7V
1.8V
1.6V
0.9988
0.9992
0.9996
1.0000
1.0004
1.0008
1.0012
1.0016
1.0020
1.0024
-40-30-20-100 102030405060708090100
Ban d g ap Vo ltage [V]
Temp erature [°C]
Rising Vcc
Falling Vcc
1.572
1.575
1.578
1.581
1.584
1.587
1.590
1.593
1.596
-45-35-25-15-5 5 152535455565758595105
Vbo t [V]
Temp erature [°C]
315
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-313. BOD thresholds vs. temperature.
BOD level = 3.0V
37.4.8 External Reset Characteristics
Figure 37-314. Minimum Reset pin pulse width vs. VCC
Rising Vcc
Falling Vcc
2.94
2.95
2.96
2.97
2.98
2.99
3.00
3.01
3.02
3.03
-45-35-25-15-5 5 152535455565758595105
Vbo t [V]
Temp erature [°C]
105 °C
85 °C
25 °C
-40 °C
80
85
90
95
100
105
110
115
120
125
130
135
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
Trst [ns]
Vcc [V]
316
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-315. Reset pin pull-up resistor current vs. reset pin voltage
VCC = 1.8V
Figure 37-316. Reset pin pull-up resistor current vs. reset pin voltage
VCC = 3.0V
105 °C
85 °C
25 °C
-40 °C
0
8
16
24
32
40
48
56
64
72
80
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
Ireset [uA]
Vreset [V]
105 °C
85 °C
25 °C
-40 °C
0
15
30
45
60
75
90
105
120
135
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0
Ireset [uA]
Vreset [V]
317
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-317. Reset pin pull-up resistor current vs. reset pin voltage
VCC = 3.3V
Figure 37-318. Reset pin input threshold voltage vs. VCC
VIH - Reset pin read as “1”
105 °C
85 °C
25 °C
-40 °C
0
15
30
45
60
75
90
105
120
135
150
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
Ireset [uA]
Vreset [V]
105 °C
85 °C
25 °C
-40 °C
1.00
1.15
1.30
1.45
1.60
1.75
1.90
2.05
2.20
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
V
threshold
[V]
V
CC
[V]
318
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-319. Reset pin input threshold voltage vs. VCC
VIL - Reset pin read as “0”
37.4.9 Power-on Reset Characteristics
Figure 37-320. Power-on reset current consumption vs. VCC
BOD level = 3.0V, enabled in continuous mode
105 °C
85 °C
25 °C
-40 °C
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
1.6 1.8 2.0 2.2 2.4 2.6 2.8 3.0 3.2 3.4 3.6
VTHRESHOLD [V]
VCC [V]
105 °C
85 °C
25 °C
-
40
°C
0
100
200
300
400
500
600
700
0.4 0.7 1.0 1.3 1.6 1.9 2.2 2.5 2.8
I
CC
[µA]
V
CC
[V]
319
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-321. Power-on reset current consumption vs. VCC
BOD level = 3.0V, enabled in sampled mode
37.4.10 Oscillator Characteristics
37.4.10.1 Ultra Low-Power internal oscillator
Figure 37-322. Ultra Low-Power internal oscillator frequency vs. temperature.
105
°
°C
85
°
°C
25 °C
-40 °C
0
65
130
195
260
325
390
455
520
585
650
0.4 0.7 1 1.3 1.6 1.9 2.2 2.5 2.8
I
CC
[µA]
V
CC
[V]
3.6 V
3.3 V
3.0 V
2.7 V
1.8 V
1.6 V
30.75
31.00
31.25
31.50
31.75
32.00
32.25
32.50
32.75
33.00
33.25
33.50
33.75
-40-30-20-10 0 10 20 30 40 50 60 70 80 90100
Freq uen cy [kHz]
Temp erature [°C]
320
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.4.10.2 32.768kHz Internal Oscillator
Figure 37-323. 32.768kHz internal oscillator frequency vs. temperature
Figure 37-324. 32.768kHz internal oscillator frequency vs. calibration value
VCC = 3.0V, T = 25°C
3.6 V
3.3 V
3.0 V
2.7 V
2.2 V
1.8 V
32.46
32.49
32.52
32.55
32.58
32.61
32.64
32.67
32.70
32.73
32.76
32.79
32.82
-40-30-20-100 102030405060708090100
Frequency [kHz]
Temp erature [°C]
3.0 V
22
25
28
31
34
37
40
43
46
49
52
0 24 48 72 96 120 144 168 192 216 240 264
Frequen cy [kHz]
RC32KCA L[7..0]
321
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.4.10.3 2MHz Internal Oscillator
Figure 37-325. 2MHz internal oscillator frequency vs. temperature
DFLL disabled
Figure 37-326. 2MHz internal oscillator frequency vs. temperature
DFLL enabled, from the 32.768kHz internal oscillator
3.6 V
3.3 V
3.0 V
2.7 V
2.2 V
1.8 V
1.96
1.98
2.00
2.02
2.04
2.06
2.08
2.10
2.12
2.14
2.16
-40-30-20-100 102030405060708090100
Freq uen cy [MHz]
Temp erature [°C]
3.6 V
3.3 V
3.0 V
2.7 V
2.2 V
1.8 V
1.980
1.982
1.984
1.986
1.988
1.990
1.992
1.994
1.996
1.998
2.000
2.002
2.004
2.006
-40-30-20-100 102030405060708090100
Frequency [MHz]
Temp erature [°C]
322
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-327. 2MHz internal oscillator CALA calibration step size
VCC = 3V
37.4.10.4 32MHz Internal Oscillator
Figure 37-328. 32MHz internal oscillator frequency vs. temperature
DFLL disabled
105 °C
85 °C
25 °C
-40 °C
0.14
0.16
0.18
0.20
0.22
0.24
0.26
0.28
0.30
0 102030405060708090100110120130
Step Size [%]
CALA
3.6 V
3.3 V
3.0 V
2.7 V
2.2 V
1.8 V
31.05
31.50
31.95
32.40
32.85
33.30
33.75
34.20
34.65
35.10
35.55
36.00
-40-30-20-100 102030405060708090100
Frequency [MHz]
Temp erature [°C]
323
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
Figure 37-329. 32MHz internal oscillator frequency vs. temperature
DFLL enabled, from the 32.768kHz internal oscillator
Figure 37-330. 32MHz internal oscillator CALA calibration step size
VCC = 3.0V
3.6 V
3.3 V
3.0 V
2.7 V
2.2 V
1.8 V
31.66
31.69
31.72
31.75
31.78
31.81
31.84
31.87
31.90
31.93
31.96
31.99
32.02
32.05
-40-30-20-100 102030405060708090100
Frequency [MHz]
Temp erature [°C]
105 °C
85 °C
25 °C
-40 °C
0.14
0.17
0.20
0.23
0.26
0.29
0.32
0 102030405060708090100110120130
Step Size [%]
CALA
324
XMEGA A4U [DATASHEET]
Atmel-8387H-AVR-ATxmega16A4U-34A4U-64A4U-128A4U-Datasheet_09/2014
37.4.10.5 32MHz internal oscillator calibrated to 48MHz
Figure 37-331. 48MHz internal oscillator frequency vs. temperature
DFLL disabled
Figure 37-332. 48MHz internal oscillator frequency vs. temperature
DFLL enabled, from the 32.768kHz internal oscillator
3.6 V
3.3 V
3.0 V
2.7 V
2.2 V
1.8 V
46.2
46.9
47.6
48.3
49.0
49.7
50.4
51.1
51.8
52.5
53.2
53.9
-40-30-20-100 102030405060708090100
Freq uen cy [MHz]
Temp erature [°C]
3.6 V
3.3 V
3.0 V
2.7 V
2.2 V
1.8 V
47.5
47.6
47.7
47.8
47.9
48.0
48.1
48.2
48.3
-40-30-20-100 102030405060708090100
Frequency [MHz]
Temp erature [°C]
325
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Figure 37-333. 48MHz internal oscillator CALA calibration step size
VCC =3V
37.4.11 Two-Wire Interface characteristics
Figure 37-334. SDA hold time vs. supply voltage
105 °C
85 °C
25 °C
-40 °C
0.14
0.16
0.18
0.2
0.22
0.24
0.26
0.28
0 102030405060708090100110120130
Step Size [%]
CALA
105°C
85°C
25°C
-40°C
260
265
270
275
280
285
290
295
300
2.6 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
Holdtime [ns]
Vcc [V]
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37.4.12 PDI characteristics
Figure 37-335. Maximum PDI frequency vs. VCC
105 °C
85 °C
25 °C
-40 °C
10
13
16
19
22
25
28
31
1.61.82.02.22.42.62.83.03.23.43.6
Frequency max [MHz]
Vcc [V]
327
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38. Errata
38.1 ATxmega16A4U
38.1.1 Rev. E
zADC may have missing codes in SE unsigned mode at low temp and low Vcc
zCRC fails for Range CRC when end address is the last word address of a flash section
zAWeX fault protection restore is not done correct in Pattern Generation Mode
1. ADC may have missing codes in SE unsigned mode at low temp and low Vcc
The ADC may have missing codes i single ended (SE) unsigned mode below 0C when Vcc is below 1.8V.
Problem fix/Workaround
Use the ADC in SE signed mode.
2. CRC fails for Range CRC when end address is the last word address of a flash section
If boot read lock is enabled, the range CRC cannot end on the last address of the application section. If applica-
tion table read lock is enabled, the range CRC cannot end on the last address before the application table.
Problem fix/Workaround
Ensure that the end address used in Range CRC does not end at the last address before a section with read lock
enabled. Instead, use the dedicated CRC commands for complete applications sections.
3. AWeX fault protection restore is not done correct in Pattern Generation Mode
When a fault is detected the OUTOVEN register is cleared, and when fault condition is cleared, OUTOVEN
is restored according to the corresponding enabled DTI channels. For Common Waveform Channel Mode
(CWCM), this has no effect as the OUTOVEN is correct after restoring from fault. For Pattern Generation
Mode (PGM), OUTOVEN should instead have been restored according to the DTLSBUF register.
Problem fix/Workaround
For CWCM no workaround is required.
For PGM in latched mode, disable the DTI channels before returning from the fault condition. Then, set cor-
rect OUTOVEN value and enable the DTI channels, before the direction (DIR) register is written to enable
the correct outputs again.
38.1.2 Rev. A - D
Not sampled.
328
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38.2 ATxmega32A4U
38.2.1 Rev. E
zADC may have missing codes in SE unsigned mode at low temp and low Vcc
zCRC fails for Range CRC when end address is the last word address of a flash section
zAWeX fault protection restore is not done correct in Pattern Generation Mode
1. ADC may have missing codes in SE unsigned mode at low temp and low Vcc
The ADC may have missing codes i single ended (SE) unsigned mode below 0C when Vcc is below 1.8V.
Problem fix/Workaround
Use the ADC in SE signed mode.
2. CRC fails for Range CRC when end address is the last word address of a flash section
If boot read lock is enabled, the range CRC cannot end on the last address of the application section. If applica-
tion table read lock is enabled, the range CRC cannot end on the last address before the application table.
Problem fix/Workaround
Ensure that the end address used in Range CRC does not end at the last address before a section with read lock
enabled. Instead, use the dedicated CRC commands for complete applications sections.
3. AWeX fault protection restore is not done correct in Pattern Generation Mode
When a fault is detected the OUTOVEN register is cleared, and when fault condition is cleared, OUTOVEN
is restored according to the corresponding enabled DTI channels. For Common Waveform Channel Mode
(CWCM), this has no effect as the OUTOVEN is correct after restoring from fault. For Pattern Generation
Mode (PGM), OUTOVEN should instead have been restored according to the DTLSBUF register.
Problem fix/Workaround
For CWCM no workaround is required.
For PGM in latched mode, disable the DTI channels before returning from the fault condition. Then, set cor-
rect OUTOVEN value and enable the DTI channels, before the direction (DIR) register is written to enable
the correct outputs again.
38.2.2 Rev. A - D
Not sampled.
329
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38.3 ATxmega64A4U
38.3.1 Rev. D
zADC may have missing codes in SE unsigned mode at low temp and low Vcc
zCRC fails for Range CRC when end address is the last word address of a flash section
1. ADC may have missing codes in SE unsigned mode at low temp and low Vcc
The ADC may have missing codes i single ended (SE) unsigned mode below 0C when Vcc is below 1.8V.
Problem fix/Workaround
Use the ADC in SE signed mode.
2. CRC fails for Range CRC when end address is the last word address of a flash section
If boot read lock is enabled, the range CRC cannot end on the last address of the application section. If applica-
tion table read lock is enabled, the range CRC cannot end on the last address before the application table.
Problem fix/Workaround
Ensure that the end address used in Range CRC does not end at the last address before a section with read lock
enabled. Instead, use the dedicated CRC commands for complete applications sections.
38.3.2 Rev. C
zADC may have missing codes in SE unsigned mode at low temp and low Vcc
zCRC fails for Range CRC when end address is the last word address of a flash section
zAWeX fault protection restore is not done correct in Pattern Generation Mode
1. ADC may have missing codes in SE unsigned mode at low temp and low Vcc
The ADC may have missing codes i single ended (SE) unsigned mode below 0C when Vcc is below 1.8V.
Problem fix/Workaround
Use the ADC in SE signed mode.
2. CRC fails for Range CRC when end address is the last word address of a flash section
If boot read lock is enabled, the range CRC cannot end on the last address of the application section. If applica-
tion table read lock is enabled, the range CRC cannot end on the last address before the application table.
Problem fix/Workaround
Ensure that the end address used in Range CRC does not end at the last address before a section with read lock
enabled. Instead, use the dedicated CRC commands for complete applications sections.
330
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3. AWeX fault protection restore is not done correct in Pattern Generation Mode
When a fault is detected the OUTOVEN register is cleared, and when fault condition is cleared, OUTOVEN
is restored according to the corresponding enabled DTI channels. For Common Waveform Channel Mode
(CWCM), this has no effect as the OUTOVEN is correct after restoring from fault. For Pattern Generation
Mode (PGM), OUTOVEN should instead have been restored according to the DTLSBUF register.
Problem fix/Workaround
For CWCM no workaround is required.
For PGM in latched mode, disable the DTI channels before returning from the fault condition. Then, set cor-
rect OUTOVEN value and enable the DTI channels, before the direction (DIR) register is written to enable
the correct outputs again.
38.3.3 Rev. A - B
Not sampled.
331
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38.4 ATxmega128A4U
38.4.1 rev. A
zADC may have missing codes in SE unsigned mode at low temp and low Vcc
1. ADC may have missing codes in SE unsigned mode at low temp and low Vcc
The ADC may have missing codes i single ended (SE) unsigned mode below 0C when Vcc is below 1.8V.
Problem fix/Workaround
Use the ADC in SE signed mode.
332
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39. Datasheet Revision History
Please note that the referring page numbers in this section are referred to this document. The referring revision in this
section are referring to the document revision.
39.1 8387H –09/2014
39.2 8387G – 03/2014
39.3 8387F – 01/2014
39.4 8387E – 11/2013
1. Updated “Ordering Information” on page 2. Added ordering information for ATxmega16A4U/32A4U/64A4U/128A4U @
105°C
2. Updated the Application Table Section from 4K/4K/4K/4K to 8K/4K/4K/4K in the Figure 7-1 on page 14
3. Updated Table 36-4 on page 74, Table 36-36 on page 95, Table 36-68 on page 117 and Table 36-100 on page 139. Added
Icc Power-down power consumption for T=105°C for all functions disabled and for WDT and sampled BOD enabled
4. Updated Table 36-20 on page 84, Table 36-52 on page 105, Table 36-84 on page 127 and Table 36-116 on page 149.
Updated all tables to include values for T=85°C and T=105°C. Removed T=55°C
5.
Added 105°C Typical Characterization plots for:
ATxmega16A4U
ATxmega32A4U
ATxmega64A4U
ATxmega128A4U
6. Changed Vcc to AVcc in Figure 28-1 on page 50 and in the text in Section 28. “ADC – 12-bit Analog to Digital Converter” on
page 49 andSection 30. “AC – Analog Comparator” on page 53.
7. Changed values for 128A4U in Table 7-3 on page 17. Page size = 128, FWORD = Z(6:0)
8. Changed unit notation for parameter tSU;DAT to ns in Table 36-32 on page 92, Table 36-64 on page 113, and Table 36-128
on page 157.
1. Removed “Preliminary” from the datasheet
2. Updated “Errata” on page 327: added ERRATA “Rev. D” and “Rev. C” for “ATxmega64A4U” on page 329
1. Removed JTAG references from the datasheet
2. Updated Figure 30-1 on page 54. The positive Mux has two “Input” while the negative Mux has four “Input”
1. Updated Flash size column in “Ordering Information” on page 2 for:
ATxmega128A4U-AU, ATxmega128A4U-AUR, ATxmega128A4U-MH and ATxmega128A4U-MHR
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39.5 8387D – 02/2013
39.6 8387C – 03/2012
1. Updated typos in “Ordering Information” on page 2.
2. Updated PE2 and PE3 pins in “Pinout/Block Diagram” on page 4 to indicate that these can be used as TOSC pins.
3. Renamed pin 19 from VDD to VCC in Figure 2-1 on page 4.
4. Updated page size for ATxmega128A4U in Table 7-3 on page 17.
5. Added column for TWI using external driver interface in Table 32-3 on page 59.
6. Updated ATxmega16A4U leakage current in Table 36-7 on page 77.
7. Added application erase time for ATxmega16A4U in Table 36-21 on page 84.
8.
Updated limits for VIH and VIL:
ATxmega16A4U: Table 36-7 on page 77
ATxmega32A4U: Table 36-39 on page 98
ATxmega64A4U: Table 36-71 on page 120
ATxmega128A4U:Table 36-103 on page 142
9.
Updated DAC clock and timing characteristics:
ATxmega16A4U: Table 36-13 on page 81
ATxmega32A4U: Table 36-45 on page 101
ATxmega64A4U: Table 36-77 on page 123
ATxmega128A4U: Table 36-109 on page 145.
10. Updated ATxmega16A4U “ External clock characteristics” on page 86.
11.
Added ESR parameter to the External 16MHz crystal oscillator and XOSC characteristics:
ATxmega16A4U: Table 36-29 on page 87
ATxmega32A4U: Table 36-61 on page 108
ATxmega64A4U: Table 36-93 on page 130
ATxmega128A4U: Table 36-125 on page 152.
12. Updated ATxmega32A4U leakage current in Table 36-39 on page 98.
13. Added application erase time for ATxmega32A4U in Table 36-53 on page 105.
14. Updated ATxmega32A4U “ External clock characteristics” on page 107.
15. Updated ATxmega32A4U current consumption in electrical characteristics section, see “Current consumption” on
page 117.
16. Updated electrical characteristics for “ATxmega64A4U” on page 115.
17. Updated typical characteristics for “ATxmega64A4U” on page 243.
18. Added application erase time for ATxmega128A4U in Table 36-117 on page 149.
19. Updated ATxmega128A4U “ External clock characteristics” on page 151.
1. Updated “Ordering Information” on page 2. Added a new package PW.
2. Updated “Packaging information” on page 68. A new package PW added.
3. Updated the Table 36-4 on page 74 with new values for ICC active power consumption.
4. Updated all typical characteristics in “ Active mode supply current” on page 159.
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39.7 8387B – 12/2011
39.8 8387A – 07/2011
5. Updated all typical characteristics in “Power-down mode supply current” on page 166.
6. Added electrical characteristics for “ATxmega32A4U” on page 93.
7. Added electrical characteristics for “ATxmega64A4U” on page 115.
8. Added electrical characteristics for “ATxmega128A4U” on page 137.
9. Added typical characteristics for “ATxmega64A4U” on page 243
10. Added typical characteristics for “ATxmega64A4U” on page 243.
12. Added typical characteristics for “ATxmega128A4U” on page 285.
13. Updated “Errata” on page 327.
14. Used Atmel new datasheet template that includes Atmel new addresses on the last page.
1. Updated Figure 2-1 on page 4: “Block Diagram and QFN/TQFP pinout”
2. Updated Figure 3-1 on page 7: “XMEGA A4U Block Diagram”
3. Updated “Overview” on page 13.
4. Updated “ADC – 12-bit Analog to Digital Converter” on page 49.
5. Updated Figure 28-1 on page 50: “ADC overview.”
6. Updated “Instruction Set Summary” on page 63.
7. Updated “Electrical Characteristics” on page 72.
8. Updated “Typical Characteristics” on page 159.
9. The order of several figures in the chapter “Typical Characteristics” has been changed
10. Several new figures have been added to and some figures have been removed from chapter “Typical Characteristics”
11. Several minor changes/corrections in text and figures have been performed
12. Table 32-2 on page 59 has been corrected
13. Table 32-4 on page 60 has been corrected
14. Table 36-29 on page 85 has been corrected
15. Table 36-30 on page 86 has been corrected
16. The heading ”I/O Pin Characteristics” on page 164 has been corrected (the text “and Reset” has been removed)
1. Initial revision.
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Table of Contents
1. Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
2. Pinout/Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
3. Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
3.1 Block Diagram. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
4. Resources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
4.1 Recommended reading. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
5. Capacitive touch sensing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
6. AVR CPU . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
6.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
6.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
6.3 Architectural Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
6.4 ALU - Arithmetic Logic Unit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
6.5 Program Flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
6.6 Status Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
6.7 Stack and Stack Pointer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
6.8 Register File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
7. Memories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
7.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
7.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
7.3 Flash Program Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
7.4 Fuses and Lock bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
7.5 Data Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
7.6 EEPROM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
7.7 I/O Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
7.8 Data Memory and Bus Arbitration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
7.9 Memory Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
7.10 Device ID and Revision. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
7.11 I/O Memory Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
7.12 Flash and EEPROM Page Size . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
8. DMAC – Direct Memory Access Controller . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
8.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
8.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
9. Event System . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
9.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
9.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
10. System Clock and Clock options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
10.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
10.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
10.3 Clock Sources. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
11. Power Management and Sleep Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
11.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
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11.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
11.3 Sleep Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
12. System Control and Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
12.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
12.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
12.3 Reset Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
12.4 Reset Sources . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
13. WDT – Watchdog Timer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
13.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
13.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
14. Interrupts and Programmable Multilevel Interrupt Controller . . . . . . . . . . . . . . . . 29
14.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
14.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
14.3 Interrupt vectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
15. I/O Ports . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
15.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
15.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
15.3 Output Driver. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
15.4 Input sensing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
15.5 Alternate Port Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
16. TC0/1 – 16-bit Timer/Counter Type 0 and 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
16.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
16.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
17. TC2 - Timer/Counter Type 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
17.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
17.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
18. AWeX – Advanced Waveform Extension . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
18.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
18.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
19. Hi-Res – High Resolution Extension . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
19.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
19.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
20. RTC – 16-bit Real-Time Counter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
20.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
20.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
21. USB – Universal Serial Bus Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
21.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
21.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
22. TWI – Two-Wire Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
22.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
22.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
23. SPI – Serial Peripheral Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
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23.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
23.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
24. USART . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
24.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
24.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
25. IRCOM – IR Communication Module . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
25.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
25.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
26. AES and DES Crypto Engine . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
26.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
26.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
27. CRC – Cyclic Redundancy Check Generator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
27.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
27.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
28. ADC – 12-bit Analog to Digital Converter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
28.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
28.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
29. DAC – 12-bit Digital to Analog Converter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
29.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
29.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
30. AC – Analog Comparator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
30.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
30.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
31. Programming and Debugging . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
31.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
31.2 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
32. Pinout and Pin Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
32.1 Alternate Pin Function Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
32.2 Alternate Pin Functions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
33. Peripheral Module Address Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
34. Instruction Set Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
35. Packaging information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
35.1 44A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
35.2 PW . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
35.3 44M1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
35.4 49C2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
36. Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
36.1 ATxmega16A4U . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
36.2 ATxmega32A4U . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
36.3 ATxmega64A4U . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
36.4 ATxmega128A4U . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 137
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37. Typical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 159
37.1 ATxmega16A4U . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 159
37.2 ATxmega32A4U . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 201
37.3 ATxmega64A4U . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 243
37.4 ATxmega128A4U . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 285
38. Errata . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 327
38.1 ATxmega16A4U . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 327
38.2 ATxmega32A4U . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 328
38.3 ATxmega64A4U . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 329
38.4 ATxmega128A4U . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 331
39. Datasheet Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 332
39.1 8387H – 05/2014 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 332
39.2 8387G – 03/2014 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 332
39.3 8387F – 01/2014. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 332
39.4 8387E – 11/2013. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 332
39.5 8387D – 02/2013 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 332
39.6 8387C – 03/2012 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 333
39.7 8387B – 12/2011. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 334
39.8 8387A – 07/2011. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 334
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Atmel Corporation 1600 Technology Drive, San Jose, CA 95110 USA T: (+1)(408) 441.0311 F: (+1)(408) 436.4200 | www.atmel.com
© 2014 Atmel Corporation. / Rev.: Atmel-8387H-AVR-ATxmega16A4U-32A4U-64A4U-128A4U-Datasheet_09/2014.
Atmel®, Atmel logo and combinations thereof, Enabling Unlimited Possibilities®, and others are registered trademarks or trademarks of Atmel Corporation in U.S. and
other countries. Other terms and product names may be trademarks of others.
DISCLAIMER: The information in this document is provided in connection with Atmel products. No license, express or implied, by estoppel or otherwise, to any intellectual property right
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SHALL ATMEL BE LIABLE FOR ANY DIRECT, INDIRECT, CONSEQUENTIAL, PUNITIVE, SPECIAL OR INCIDENTAL DAMAGES (INCLUDING, WITHOUT LIMITATION, DAMAGES
FOR LOSS AND PROFITS, BUSINESS INTERRUPTION, OR LOSS OF INFORMATION) ARISING OUT OF THE USE OR INABILITY TO USE THIS DOCUMENT, EVEN IF ATMEL HAS
BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. Atmel makes no representations or warranties with respect to the accuracy or completeness of the contents of this
document and reserves the right to make changes to specifications and products descriptions at any time without notice. Atmel does not make any commitment to update the information
contained herein. Unless specifically provided otherwise, Atmel products are not suitable for, and shall not be used in, automotive applications. Atmel products are not intended,
authorized, or warranted for use as components in applications intended to support or sustain life.
SAFETY-CRITICAL, MILITARY, AND AUTOMOTIVE APPLICATIONS DISCLAIMER: Atmel products are not designed for and will not be used in connection with any applications where
the failure of such products would reasonably be expected to result in significant personal injury or death (“Safety-Critical Applications”) without an Atmel officer's specific written
consent. Safety-Critical Applications include, without limitation, life support devices and systems, equipment or systems for the operation of nuclear facilities and weapons systems.
Atmel products are not designed nor intended for use in military or aerospace applications or environments unless specifically designated by Atmel as military-grade. Atmel products are
not designed nor intended for use in automotive applications unless specifically designated by Atmel as automotive-grade.
