DATA SH EET
Product data sheet
Supersedes data of 2004 Jun 11 2004 Nov 08
DISCRETE SEMICONDUCTORS
PBSS4520X
20 V, 5 A
NPN low VCEsat (BISS) transistor
bo
ok, halfpage
M3D109
2004 Nov 08 2
NXP Semiconductors Product data sheet
20 V, 5 A
NPN low VCEsat (BISS) transistor PBSS4520X
FEATURES
High hFE and low VCEsat at high current operation
High collector current capability: IC maximum 5 A
Higher efficiency leading to less heat generation.
APPLICATIONS
Medium power peripheral drivers, e.g. fans and motors
Strobe flash units for DSC an d mobile phones
Inverter applications, e.g. TFT displays
Power switch for LAN and ADSL systems
Medium power DC-to-D C co nversion
Battery chargers.
DESCRIPTION
NPN low VCEsat BISS transistor in a SOT89 (SC-62) plastic
package.
PNP complement: PBSS5520X.
MARKING
Note
1. * = p: made in Hong Kong
* = t: made in Malaysia
* = W: made in China.
TYPE NUMBER MARKING CODE(1)
PBSS4520X *1F
PINNING
PIN DESCRIPTION
1emitter
2collector
3base
321
sym04
2
1
2
3
Fig.1 Simplified outline (SOT89 ) and symbo l .
QUICK REFERENCE DATA
SYMBOL PARAMETER MAX. UNIT
VCEO collector-emitter voltage 20 V
ICcollector current (DC) 5 A
ICM peak collector current 10 A
RCEsat equivalent on-resistance 44 mΩ
ORDERING INFORMATION
TYPE NUMBER PACKAGE
NAME DESCRIPTION VERSION
PBSS4520X SC-62 plastic surface mounted packag e; collector p a d for good heat
transfer; 3 leads SOT89
2004 Nov 08 3
NXP Semiconductors Pr oduct dat a shee t
20 V, 5 A
NPN low VCEsat (BISS) transistor PBSS4520X
LIMITING VALUES
In accordance with th e A b solute Maximum Rating S ystem (IEC 60134).
Notes
1. Operated under pulsed conditions: pulse width tp 10 ms; duty cycle δ 0.2.
2. Device mounted on a pr inted-circuit board, single-s ided copper, tin-plated and st andard footprint.
3. Device mounted on a pr inted-circuit board, single-s ided copper, tin-plated and mounting pad for collector 1 cm2.
4. Device mounted on a pr inted-circuit board, single-s ided copper, tin-plated and mounting pad for collector 6 cm2.
5. Device mounted o n a 7 cm2 ceramic printed-circuit board, 1 cm2 single-sided copper and tin-plated. For other
mounting cond itions, see “Thermal considerations for SOT8 9 in the General Part of associated Ha ndbook”.
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VCBO collector-base volt a ge open emitter 20 V
VCEO collector-emitter voltage open base 20 V
VEBO emitter-base voltage open collector 5 V
ICcollector current (DC) 5 A
ICRM repetitive peak colle ctor current notes 1 and 2 7 A
ICM peak collector current tp 1 ms 10 A
IBbase current (DC) 1 A
IBM peak base current tp 1 ms 2 A
Ptot total power dissipation Tamb 25 °C
notes 1 and 2 2.5 W
note 2 0.55 W
note 3 1 W
note 4 1.4 W
note 5 1.6 W
Tstg storage temperature 65 +150 °C
Tjjunction temperature 150 °C
Tamb ambient temperature 65 +150 °C
2004 Nov 08 4
NXP Semiconductors Pr oduct dat a shee t
20 V, 5 A
NPN low VCEsat (BISS) transistor PBSS4520X
Tamb (°C)
50 20015050 1000
001aaa229
800
400
1200
1600
Ptot
(mW)
0
(1)
(2)
(3)
Fig.2 Power derating curves.
(1) FR4 PCB; 6 cm2 mounting pad for collector.
(2) FR4 PCB; 1 cm2 mounting pad for collector.
(3) FR4 PCB; standard footprint .
2004 Nov 08 5
NXP Semiconductors Pr oduct dat a shee t
20 V, 5 A
NPN low VCEsat (BISS) transistor PBSS4520X
THERMAL CHARACTE RISTICS
Notes
1. Operated under pulsed conditions: pulse width tp 10 ms; duty cycle δ Š 0.2.
2. Device mounted on a pr inted-circuit board, single-s ided copper, tin-plated and st andard footprint.
3. Device mounted on a pr inted-circuit board, single-s ided copper, tin-plated and mounting pad for collector 1 cm2.
4. Device mounted on a pr inted-circuit board, single-s ided copper, tin-plated and mounting pad for collector 6 cm2.
5. Device mounted o n a 7 cm2 ceramic printed-circuit board, 1 cm2 single-sided copper and tin-plated. For other
mounting cond itions, see “Thermal considerations for SOT8 9 in the General Part of associated Ha ndbook”.
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth(j-a) thermal resistance from junction to ambient in free air
notes 1 and 2 50 K/W
note 2 225 K/W
note 3 125 K/W
note 4 90 K/W
note 5 80 K/W
Rth(j-s) thermal resistance from junction to soldering point 16 K/W
006aaa232
10
1
102
103
Zth
(K/W)
101
10510102
104102
101tp (s)
103103
1
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
(10)
Fig.3 Transient thermal impeda nc e as a function of pulse time; typical values.
(1) δ = 1.
(2) δ = 0.75. (3) δ = 0.5.
(4) δ = 0.33. (5) δ = 0.2.
(6) δ = 0.1. (7) δ = 0.05.
(8) δ = 0.02. (9) δ = 0.01.
(10) δ = 0.
Mounted on FR4 printed - circuit board; standard footprint.
2004 Nov 08 6
NXP Semiconductors Pr oduct dat a shee t
20 V, 5 A
NPN low VCEsat (BISS) transistor PBSS4520X
006aaa233
10
1
102
103
Zth
(K/W)
101
10510102
104102
101tp (s)
103103
1
(5)
(6)
(7)
(8)
(9)
(10)
(1) (2)
(3) (4)
Fig.4 Transient thermal impeda nc e as a function of pulse time; typical values.
(1) δ = 1.
(2) δ = 0.75. (3) δ = 0.5.
(4) δ = 0.33. (5) δ = 0.2.
(6) δ = 0.1. (7) δ = 0.05.
(8) δ = 0.02. (9) δ = 0.01.
(10) δ = 0.
Mounted on F R4 printed-circuit board; mounting pad for collector 1 cm2.
006aaa234
10
1
102
103
Zth
(K/W)
101
10510102
104102
101tp (s)
103103
1
(6)
(7)
(8)
(9)
(10)
(1)
(5) (4)
(3) (2)
Fig.5 Transient thermal impeda nc e as a function of pulse time; typical values.
(1) δ = 1.
(2) δ = 0.75. (3) δ = 0.5.
(4) δ = 0.33. (5) δ = 0.2.
(6) δ = 0.1. (7) δ = 0.05.
(8) δ = 0.02. (9) δ = 0.01.
(10) δ = 0.
Mounted on F R4 printed-circuit board; mounting pad for collector 6 cm2.
2004 Nov 08 7
NXP Semiconductors Pr oduct dat a shee t
20 V, 5 A
NPN low VCEsat (BISS) transistor PBSS4520X
CHARACTERISTICS
Tamb = 25 °C unless otherwise specified.
Note
1. Pulse test: tp 300 μs; δ 0.02.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
ICBO collector-base cut-off current VCB = 20 V; IE = 0 A −−100 nA
VCB = 20 V; IE = 0 A; Tj = 150 °C−−50 μA
IEBO emitter-base cu t-off current VEB = 5 V; IC = 0 A −−100 nA
ICES collector-emitter cut-off current VCE = 20 V; VBE = 0 V −−100 nA
hFE DC current gain VCE = 2 V
IC = 0.5 A 300 450
IC = 1 A; note 1 300 440
IC = 2 A; note 1 250 420
IC = 5 A; note 1 200 380
VCEsat collector-emitter saturation
voltage IC = 0.5 A; IB = 5 mA 35 50 mV
IC = 1 A; IB = 10 mA 50 70 mV
IC = 2.5 A; IB = 125 mA; note 1 85 120 mV
IC = 4 A; IB = 200 mA; note 1 130 180 mV
IC = 5 A; IB = 500 mA; note 1 160 220 mV
RCEsat equivalent on-resistance IC = 5 A; IB = 500 mA; note 1 32 44 mΩ
VBEsat base-emitt er saturation voltage IC = 4 A; IB = 200 mA; note 1 0.9 1.05 V
IC = 5 A; IB = 500 mA; note 1 0.96 1.1 V
VBEon base-emitter turn-on voltage VCE = 2 V; IC = 2 A 0.74 0.85 V
fTtransition frequen c y IC = 100 mA; VCE = 10 V;
f = 100 MHz 100 125 MHz
Cccollector capacitance VCB = 10 V; IE = ie = 0 A; f = 1 MHz 90 110 pF
2004 Nov 08 8
NXP Semiconductors Pr oduct dat a shee t
20 V, 5 A
NPN low VCEsat (BISS) transistor PBSS4520X
001aaa746
400
600
200
800
1000
hFE
0
IC (mA)
101104
103
110
2
10
(1)
(2)
(3)
Fig.6 DC current gain as a fu nction of collector
current; ty pical values.
VCE = 2 V.
(1) Tamb = 100 °C.
(2) Tamb = 25 °C.
(3) Tamb = 55 °C.
001aaa750
0.4
0.8
1.2
VBE
(V)
0
IC (mA)
101104
103
110
2
10
Fig.7 Base-emitter voltage as a function of
collector current; typical values.
VCE = 2 V.
Tamb = 25 °C.
001aaa747
102
10
103
VCEsat
(mV)
1
IC (mA)
101104
103
110
2
10
(1)
(3)
(2)
Fig.8 Collector-emitter saturation voltage as a
function of collector current; typical values.
IC/IB = 20.
(1) Tamb = 100 °C.
(2) Tamb = 55 °C.
(3) Tamb = 25 °C.
001aaa748
IC (mA)
101104
103
110
2
10
1
10
102
103
VCEsat
(mV)
101
(1)
(2)
(3)
Fig.9 Collector-emitter saturation voltage as a
function of collector current; typical values.
Tamb = 25 °C.
(1) IC/IB = 100.
(2) IC/IB = 50.
(3) IC/IB = 10.
2004 Nov 08 9
NXP Semiconductors Pr oduct dat a shee t
20 V, 5 A
NPN low VCEsat (BISS) transistor PBSS4520X
001aaa749
0.4
0.8
1.2
VBEsat
(V)
0
IC (mA)
101104
103
110
2
10
(1)
(2)
(3)
Fig.10 Base- emitte r s atur ation v oltag e as a
function of collector current; typical values.
IC/IB = 20.
(1) Tamb = 55 °C.
(2) Tamb = 25 °C.
(3) Tamb = 100 °C.
001aaa878
0.4
0.8
1.2
VBE
(V)
0
IC (mA)
101104
103
110
2
10
(2)
(1)
(3)
Fig.11 Base- emitte r voltage as a function of
collector current; typical values.
VCE = 2 V.
(1) Tamb = 55 °C.
(2) Tamb = 25 °C.
(3) Tamb = 100 °C.
VCE (V)
021.60.8 1.20.4
001aaa745
100
150
50
200
250
IC
(mA)
0
(10)
(9)
(1)(2)(3)(4)(5)(6)
(8)
(7)
Fig.12 Collector current as a function of
collector-emitter voltage; typical values.
Tamb = 25 °C.
(1) IB = 5 mA.
(2) IB = 4.5 mA.
(3) IB = 4 mA.
(4) IB = 3.5 mA.
(5) IB = 3 mA.
(6) IB = 2.5 mA.
(7) IB = 2 mA.
(8) IB = 1.5 mA.
(9) IB = 1 mA.
(10) IB = 0.5 mA.
001aaa879
IC (mA)
101104
103
110
2
10
1
10
102
RCEsat
(Ω)
102
101
(1)
(3)
(2)
Fig.13 Equi valent on-resist ance as a function of
collector current; typical values.
IC/IB = 20.
(1) Tamb = 100 °C.
(2) Tamb = 25 °C.
(3) Tamb = 55 °C.
2004 Nov 08 10
NXP Semiconductors Pr oduct dat a shee t
20 V, 5 A
NPN low VCEsat (BISS) transistor PBSS4520X
Reference mounting conditions
001aaa234
2.5 mm
5 m
m
1.6 mm
0.5 mm
1 mm
3.96 mm
3 mm
2.5 mm
1 mm
40
m
m
32 mm
Fig.14 FR4, standard footprin t.
handbook, halfpage
MLE322
40 mm
32 mm
2.5 mm
10 mm
5 mm
1.6 mm
0.5 mm
1 mm
3.96 mm
10 mm
Fig.15 FR4, mounting pad for collector 1 cm2.
001aaa235
2.5 mm
5 m
m
1.6 mm
0.5 mm
1 mm
3.96 mm
30 mm
20
mm
40
m
m
32 mm
Fig.16 FR4, mounting pad for collector 6 cm2.
2004 Nov 08 11
NXP Semiconductors Pr oduct dat a shee t
20 V, 5 A
NPN low VCEsat (BISS) transistor PBSS4520X
PACKAGE OUTLINE
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
DIMENSIONS (mm are the original dimensions)
SOT89 TO-243 SC-62 04-08-03
06-03-16
wM
e1
e
EHE
B
0 2 4 mm
scale
bp3
bp2
bp1
c
D
Lp
A
Plastic surface-mounted package; collector pad for good heat transfer; 3 leads SOT8
9
123
UNIT A
mm 1.6
1.4 0.48
0.35
c
0.44
0.23
D
4.6
4.4
E
2.6
2.4
HELp
4.25
3.75
e
3.0
w
0.13
e1
1.5 1.2
0.8
bp2
bp1
0.53
0.40
bp3
1.8
1.4
2004 Nov 08 12
NXP Semiconductors Pr oduct dat a shee t
20 V, 5 A
NPN low VCEsat (BISS) transistor PBSS4520X
DATA SHEET STATUS
Notes
1. Please consult the most recently issued document before initiating or completing a design.
2. The product s ta tus of device(s ) described in this document may have ch anged since this document was published
and may differ in case of multiple devices. The latest product status information is available on the Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the produc t specification.
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Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values a re s t ress ratings only and
operation of the device at these or an y other conditions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
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extract of th e product data given in the Limiting values and
Characteristics sections of this docu ment, and as such is
not complete, exhaus tive or legally binding.
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Customer notification
This data sheet was changed to reflect the new company name NXP Semiconductors, including new legal
definitions and disclaimer s. No changes were made to the technical content, except for package outline
drawings which were updated to the latest version.
Printed in The Netherlands R75/03/pp13 Date of release: 2004 Nov 08 Document orde r number: 9397 750 13884