SSM3K15FV
2007-11-01
1
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type
SSM3K15FV
High Speed Switching Applications
Analog Switch Applications
Optimum for high-density mounting in small packages
Low on-resistance
: RDS(ON) = 4.0 (max) (@VGS = 4 V)
: RDS(ON) = 7.0 (max) (@VGS = 2.5 V)
Absolute Maximum Ratings (Ta = 25°C)
Characteristics Symbol Rating Unit
Drain-source voltage VDS 30 V
Gate-source voltage VGSS ±20 V
DC ID 100
Drain current Pulse IDP 200 mA
Power dissipation PD (Note 1) 150 mW
Channel temperature Tch 150 °C
Storage temperature Tstg 55 to 150 °C
Note: Using continuously under heavy loads (e.g. the application of
high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the
absolute maximum ratings.
Please design the appropriate reliability upon reviewing the
Toshiba Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and
estimated failure rate, etc).
Note 1: Total rating, mounted on FR4 board (25.4 mm × 25.4 mm × 1.6 mm)
Marking Equivalent Circuit
Handling Precaution
When handling individual devices (which are not yet mounted on a circuit board), be sure that the environment
is protected against electrostatic electricity. Operators should wear anti-static clothing, and containers and other
objects that come into direct contact with devices should be made of anti-static materials.
Unit: mm
JEDEC -
JEITA -
TOSHIBA 2-1L1B
Weight: 1.5 mg (typ.)
1. Gate
2. Source
3. Drain
VESM
1.0.05
0.32±0.05
1
2
3
0.40.4
0.22±0.05
0.0.05
0.0.05
1.0.05
0.0.05
0.13±0.05
0.5mm
0.45mm
0.45mm
0.4mm
D P
1 2
3
1 2
3
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SSM3K15FV
2007-11-01
2
Electrical Characteristics (Ta = 25°C)
Characteristics Symbol Test Condition Min Typ. Max Unit
Gate leakage current IGSS V
GS = ±16 V, VDS = 0 ±1 μA
Drain-source breakdown voltage V (BR) DSS ID = 0.1 mA, VGS = 0 30 V
Drain cut-off current IDSS V
DS = 30 V, VGS = 0 1 μA
Gate threshold voltage Vth V
DS = 3 V, ID = 0.1 mA 0.8 1.5 V
Forward transfer admittance Yfs V
DS = 3 V, ID = 10 mA 25 mS
ID = 10 mA, VGS = 4 V 2.2 4.0
Drain-source on-resistance RDS (ON)
ID = 10 mA, VGS = 2.5 V 4.0 7.0
Ω
Input capacitance Ciss V
DS = 3 V, VGS = 0, f = 1 MHz 7.8 pF
Reverse transfer capacitance Crss V
DS = 3 V, VGS = 0, f = 1 MHz 3.6 pF
Output capacitance Coss V
DS = 3 V, VGS = 0, f = 1 MHz 8.8 pF
Turn-on time ton 50
Switching time
Turn-off time toff
VDD = 5 V, ID = 10 mA,
VGS = 0~5 V 180 ns
Switching Time Test Circuit
(a) Test circuit (b) VIN
Precaution
Vth can be expressed as the voltage between gate and source when the low operating current value is ID = 100 μA for
this product. For normal switching operation, VGS (on) requires a higher voltage than Vth and VGS (off) requires a lower
voltage than Vth.
(The relationship can be established as follows: VGS (off) < Vth < VGS (on) )
Please take this into consideration when using the device.
(c) VOUT
ton
90%
10%
0 V
5 V
90%
10%
toff
tr tf
VDD
VDS
(
ON
)
VDD = 5 V
Duty
<
=
1%
Input: tr, tf < 5 ns
(Zout = 50 Ω)
Common Source
Ta = 25°C
VDD
Output
Input
5 V
0
10 μs
50 Ω
RL
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SSM3K15FV
2007-11-01
3
Drain-source on resistance
RDS (ON) (Ω)
Drain-source on resistance
RDS (ON) (Ω)
Drain-source voltage VDS (V)
ID – VDS
Drain current ID (mA)
Gate-source voltage VGS (V)
ID – VGS
Drain current ID (mA)
Drain current ID (mA)
RDS (ON) – ID
Drain-source on resistance
RDS (ON) (Ω)
Gate-source voltage VGS (V)
RDS (ON) – VGS
Ambient temperature Ta (°C)
RDS (ON) – Ta
Ambient temperature Ta (°C)
Vth – Ta
Gate threshold voltage Vth (V)
0
25
0.4
2
50 150125 0
0.2
1.2
1.6
75
1
Common Source
ID = 0.1 mA
VDS = 3 V
0.8
1.8
25 100
0.6
1.4
0
0
100
250
121.5 0.5
50
150
200
VGS = 2.1 V
2.3
2.5
2.7
Common Source
Ta = 25°C
3 4 10
0
0
2
6
4108 2
1
4
5
6
3
25°C
Ta = 100°C
25°C
Common Source
ID = 10 mA
0
25
2
8
50 150125 0
1
5
6
75
4
4 V
VGS = 2.5 V
Common Source
ID = 10 mA
3
7
25 100
0.01
0
1
1000
243 1
0.1
10
100
Ta = 100°C
Common Source
VDS = 3 V
25°C
25°C
4 V
VGS = 2.5 V
0
0
4
10
80 200160 40
2
6
8
120
Common Source
Ta = 25°C
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SSM3K15FV
2007-11-01
4
Capacitance C (pF)
Switching time t (ns)
Drain current ID (mA)
Yfs – ID
Forward transfer admittance
Yfs (mS)
Drain-source voltage VDS (V)
IDR – VDS
Drain reveres current IDR (mA)
Drain current ID (mA)
t – ID
Switching time t (ns)
Drain current ID (mA)
t – ID
Drain-source voltage VDS (V)
C – VDS
Ambient temperature Ta (°C)
PD – Ta
1
1
10
30
1000
100
100010 100
3
5
50
300
500 Common Source
VDS = 3 V
Ta = 25°C
10
0.1
100
300
10000
1000
1001 10
30
50
500
3000
5000
Common Source
VDD = 5 V
VGS = 0~5 V
Ta = 25°C
t
r
ton
tf
toff
10
0.1
100
300
10000
1000
1001 10
30
50
500
3000
5000
Common Source
VDD = 3 V
VGS = 0~2.5 V
Ta = 25°C
t
r
ton
tf
toff
0.1
0.1
1
3
100
10
1001 10
0.3
0.5
5
30
50
Common Source
VGS = 0 V
f = 1 MHz
Ta = 25°C
Crss
Coss
Ciss
0
100
250
50
150
200
01.40.40.2 0.6 0.8 1 1.2
Common Source
VGS = 0 V
Ta = 25°C
G
D
S
IDR
Power dissipation PD (mW)
0
0
100
250
16040
50
150
200
20 60 80 100 140 120
Mounted on FR4 board
(25.4 mm × 25.4 mm × 1.6 mm,
Cu Pad: 0.585 mm2 )
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SSM3K15FV
2007-11-01
5
RESTRICTIONS ON PRODUCT USE
Toshiba Corporation, and its subsidiaries and affiliates (collectively “TOSHIBA”), reserve the right to make changes to the information
in this document, and related hardware, software and systems (collectively “Product”) without notice.
This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with
TOSHIBA’s written permission, reproduction is permissible only if reproduction is without alteration/omission.
Though TOSHIBA works continually to improve Product’s quality and reliability, Product can malfunction or fail. Customers are
responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and
systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily
injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the
Product, or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of
all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes
for Product and the precautions and conditions set forth in the “TOSHIBA Semiconductor Reliability Handbook” and (b) the
instructions for the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their
own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such
design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts,
diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating
parameters for such designs and applications. TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS’ PRODUCT DESIGN OR
APPLICATIONS.
Product is intended for use in general electronics applications (e.g., computers, personal equipment, office equipment, measuring
equipment, industrial robots and home electronics appliances) or for specific applications as expressly stated in this document.
Product is neither intended nor warranted for use in equipment or systems that require extraordinarily high levels of quality and/or
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noncompliance with applicable laws and regulations.
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