02/13/03
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IRLR2908
IRLU2908
HEXFET® Power MOSFET
Description
Specifically designed for Automotive applications, this HEXFET ® Power MOSFET
utilizes the latest processing techniques to achieve extremely low on-resistance per silicon
area. Additional features of this HEXFET power MOSFET are a 175°C junction operating
temperature, low RθJC, fast switching speed and improved repetitive avalanche rating.
These features combine to make this design an extremely efficient and reliable device for
use in Automotive applications and a wide variety of other applications.\
The D-Pak is designed for surface mounting using vapor phase, infrared, or wave
soldering techniques. The straight lead version (IRFU series) is for through-hole mounting
applications. Power dissipation levels up to 1.5 watts are possible in typical surface mount
applications.
S
D
G
VDSS = 80V
RDS(on) = 28m
ID = 30A
D-Pak
IRLR2908
AUTOMOTIVE MOSFET
Features
lAdvanced Process Technology
lUltra Low On-Resistance
lDynamic dv/dt Rating
l175°C Operating Temperature
lFast Switching
lRepetitive Avalanche Allowed up to Tjmax
PD - 94501
I-Pak
IRLU2908
Absolute Maximum RatingsParameter Units
ID @ TC = 25 °C Co nti n uous D r ai n C ur rent, VGS @ 10V (S i l i con Li m ited) A
ID @ TC = 10 C Co nti n uous D r ai n C ur rent, VGS @ 10V ( See Fig. 9)
ID @ TC = 25 °C Co nti n uous D r ai n C ur rent, VGS @ 10V (Package Limited)
IDM Pulsed D r ain C urrent
c
PD @TC = 25°C Maximum Power D issi pation W
Linear Derating Fact or W/°C
VGS Gat e- to-Source Voltage V
EAS Single Pul s e Avala nche Energy (T her m ally Li m it ed)
d
mJ
EAS (tested) Sin
g
le Pul se Avala nche Ener
gy
Tes ted Va lu e
i
IAR Avalanche Current
c
A
EAR Re petiti v e A v alanc he E n er
gy
h
mJ
dv/dt Pea k Di ode R ec o ver y dv /dt
e
V/ns
TJ Operatin g Juncti on and °C
TSTG St o r ag e Te m per atur e Ra ng e
Soldering Temperature, for 10 seconds
Therma l R esistance Parameter Typ. Max. Units
RθJC Junction-to-Case ––– 1.3 °C/W
RθJA Junc tio n- t o- Ambient (P CB Moun t )
j
––– 40
RθJA Junction-to-Ambient ––– 110
120
0.77
± 16
180
250
See Fig. 12a,12 b,15,1 6
Max.
39
28
150
30
300 ( 1.6mm fr o m ca se )
-5 5 to + 175
2.3
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S
D
G
S
D
G
Notes through are on page 11
HEXFET® is a registered trademark of International Rectifier.
Static @ TJ = 25°C (unless other wis e specified)
Parameter Min. Typ. Max. Units
V(BR)DSS Drain-to-Source Br eakdown Vol tage 80 ––– ––– V
∆ΒVDSS
/
TJ B reakdo w n Vol t age Tem p. Co eff ic i e nt ––– 0. 085 ––– V C
RDS(on) Static Drai n-to-S our ce On-R esistance ––– 22. 5 28 m
––– 25 30
VGS(th) Gate Threshold Vo lt age 1.0 –– 2.5 V
gf s F orw a r d Transc ond uctanc e 35 –– ––– S
IDSS Drain-to- Sou rce Leakage Curren t ––– ––– 20 µA
––– –– 250
IGSS Gate-to-Source Forward Leakage ––– –– 200 nA
Gate-to-Sour ce Reverse Leakage ––– ––– -200
QgTotal Gate Charge ––– 22 33 nC
Qgs Gate-to-Source Charge ––– 6.0 9.1
Qgd Ga t e - to- Dr ain ( " M ille r" ) Ch arge ––– 11 17
td(on) Turn -O n D el ay Time ––– 12 –– ns
trRise Time –95–
td(off) Turn- Of f Delay Tim e –– 36 –––
tfFall Time –55–
LDInte rna l D rai n Indu ctance ––– 4.5 ––– nH Bet ween lead,
6mm (0.25in.)
LSInterna l So ur ce Ind uctan ce ––– 7.5 ––– fr om package
and center of die contact
Ciss In put Capaci tance ––– 1890 –– pF
Coss O utput Cap acita nce ––– 260 –––
Crss Reve rse Transfer C apacita nce ––– 35 –––
Coss Output Capacitance ––– 1920 –––
Coss O utput Cap acita nce ––– 170 –––
Coss ef f. Effecti ve Output Cap acitance ––– 310 –––
Diode Characteristics
Par a met e r Min . Typ. M a x . Un its
ISCo nti n uous S o ur c e Cu rr ent ––– –– 39
(Body Diode) A
ISM Pulsed Source Cur ren t ––– ––– 150
(Body Diode)
c
VSD Diode Forward Voltage ––– ––– 1.3 V
trr Reve rse Recovery Ti me ––– 75 110 ns
Qrr Reverse Reco ver y C harge ––– 210 310 nC
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is domina ted by LS+LD)
VDS = 64V
VGS = 4.5V
ƒ = 1. 0M H z , S ee Fig. 5
VGS = 0 V, VDS = 1.0V, ƒ = 1.0MHz
VGS = 4.5V
f
MOSFET symbol
VGS = 0V
VDS = 25V
VGS = 0 V, VDS = 64V , ƒ = 1.0M H z
Conditions
VGS = 0V, VDS = 0V to 64V
TJ = 25°C, IF = 23 A , V DD = 25V
di /dt = 100A s
f
TJ = 25°C, IS = 23A, VGS = 0V
f
showing t he
inte gra l rev e rs e
p-n ju nctio n diode.
VDS = VGS, ID = 250µ A
VDS = 80V , V GS = 0V
VDS = 80V , V GS = 0V , TJ = 12 C
RG = 8.3
ID = 23A
VDS = 25V , I D = 23A
VDD = 40V
ID = 23A
VGS = 16V
VGS = -16V
VGS = 4.5V , ID = 20A
f
Conditions
VGS = 0V, ID = 25 A
Referenc e to 25 °C, ID = 1mA
VGS = 10V, ID = 23A
f
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Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics Fig 4. Typical Forward Transconductance
vs. Drain Current
0.01 0.1 110 100
VDS, Dr ain-to-Source Vol tage (V)
0.01
0.1
1
10
100
1000
ID, Drain-to-Source Current (A)
2.5V
20µs PU LSE WIDT H
Tj = 25°C
VGS
TOP 15V
10V
4.5V
4.0V
3.5V
3.0V
2.7V
BOTTOM 2.5V
0.01 0.1 110 100
VDS, Dr ain-to-Source Vol tage (V)
0.1
1
10
100
1000
ID, Drain-to-Source Current (A)
2.5V
20µs PU LSE WIDT H
Tj = 175°C
VGS
TOP 15V
10V
4.5V
4.0V
3.5V
3.0V
2.7V
BOTTOM 2.5V
010 20 30 40 50 60
ID, Drain-to-Source Current (A)
0
10
20
30
40
50
60
GFS, Forward Transconductance (S)
TJ = 25°C
TJ = 175°C
VDS = 10V
20µs PU LSE WIDT H
2 3 4 5
VGS, Gate-to-Source Voltage ( V)
1
10
100
1000
ID, Drain-to-Source Current (Α)
TJ = 25°C
TJ = 175°C
VDS = 25V
20µs PU LSE WIDT H
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Fig 8. Maximum Safe Operating Area
Fig 6. Typical Gate Charge vs.
Gate-to-Source Voltage
Fig 5. Typical Capacitance vs.
Drain-to-Source Voltage
Fig 7. Typical Source-Drain Diode
Forward Voltage
110 100
VDS, Dr ain-to-Source Vol tage (V)
10
100
1000
10000
100000
C, Capacitance(pF)
VGS = 0V, f = 1 MHZ
Ciss = Cgs + Cgd, Cds SHORTED
Crss = Cgd
Co ss = Cds + Cgd
Coss
Crss
Ciss
0 5 10 15 20 25
QG Total Gate Char ge (nC)
0.0
1.0
2.0
3.0
4.0
5.0
VGS, Gate-to-Source Voltage (V)
VDS= 64V
VDS= 40V
VDS= 16V
ID= 23A
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
VSD, Source-to-Drai n Voltage ( V)
0.10
1.00
10.00
100.00
1000.00
ISD, Reverse Drain Current (A)
TJ = 25°C
TJ = 175°C
VGS = 0V
1 10 100 1000
VDS, Drain-to-Source Voltage (V)
0.1
1
10
100
1000
ID, Drain-to-Source Current (A)
1msec
10msec
OPERATION IN THIS AREA
LIMITED BY RDS(on)
100µsec
Tc = 25°C
Tj = 175°C
Single Pulse
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Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig 9. Maximum Drain Current vs.
Case Temperature Fig 10. Normalized On-Resistance
vs. Temperature
25 50 75 100 125 150 175
TC , Case Temperature (° C)
0
5
10
15
20
25
30
35
40
ID, Drain Current (A)
-60 -40 -20 020 40 60 80 100 120 140 160 180
TJ , Junct ion Temperat ure (°C)
0.0
0.5
1.0
1.5
2.0
2.5
3.0
RDS(on) , Drain-to-Source On Resistance
(Normalized)
ID = 38A
VGS = 4.5V
1E-006 1E-005 0.0001 0.001 0.01 0.1 1
t1 , Rectangul ar Pulse Duration (sec)
0.001
0.01
0.1
1
10
Thermal Response ( Z thJC )
0.20
0.10
D = 0. 50
0.02
0.01
0.05
SINGLE PULSE
( THERMAL RESPONSE ) Notes:
1. Duty factor D = t / t
2. Peak T = P x Z + T
1 2
JDM thJC C
P
t
t
DM
1
2
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Q
G
Q
GS
Q
GD
V
G
Charge
D.U.T. V
DS
I
D
I
G
3mA
V
GS
.3µF
50K
.2µF
12V
Current Regulator
Same Type as D.U.T.
Current Sampling Resistors
+
-
10 V
Fig 13b. Gate Charge Test Circuit
Fig 13a. Basic Gate Charge Waveform
Fig 12c. Maximum Avalanche Energy
vs. Drain Current
Fig 12b. Unclamped Inductive Waveforms
Fig 12a. Unclamped Inductive Test Circuit
tp
V
(BR)DSS
I
AS
Fig 14. Threshold Voltage vs. Temperature
R
G
I
AS
0.01
t
p
D.U.T
L
VDS
+
-V
DD
DRIVER
A
15V
20V
VGS
25 50 75 100 125 150 175
Starting TJ , Junction Temperature (°C)
0
100
200
300
400
EAS , Single Pulse Avalanche Energy (mJ)
ID
TOP 9.3A
16A
BOTTOM23A
-75 -50 -25 025 50 75 100 125 150 175 200
TJ , Temper ature ( °C )
0.5
1.0
1.5
2.0
2.5
VGS(th) Gate threshold Voltage (V)
ID = 250µA
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Fig 15. Typical Avalanche Current vs.Pulsewidth
Fig 16. Maximum Avalanche Energy
vs. Temperature
Notes on Repetitive Avalanche Curves , Figures 15, 16:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T jmax. This is validated for
every part type.
2. Safe operation in Avalanche is allowed as long asTjmax is
not exceeded.
3. Equation below based on circuit and waveforms shown in
Figures 12a, 12b.
4. PD (ave) = Average power dissipation per single
avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. Iav = Allowable avalanche current.
7. T = Allowable rise in junction temperature, not to exceed
Tjmax (assumed as 25°C in Figure 15, 16).
tav = Average time in avalanche.
D = Duty cycle in avalanche = tav ·f
ZthJC(D, tav) = Transient thermal resistance, see figure 11)
PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC
Iav = 2DT/ [1.3·BV· Zth]
EAS (AR) = PD (ave)·tav
1.0E-08 1.0E-07 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01
tav (sec)
0.1
1
10
100
1000
Avalanche Current (A)
0.05
Dut y Cycl e = Single Pulse
0.10
Allowed avalanche Current vs
avalanche pulsewidth, tav
assuming Tj = 25°C due to
avalanche losses
0.01
25 50 75 100 125 150 175
Starting TJ , Junction Temperatur e (° C)
0
50
100
150
200
EAR , Avalanche Energy (mJ)
TOP Single Pulse
BOTTOM 10% Duty Cycle
ID = 23A
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Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
Circuit Layout Considerations
Low Stray Inductance
Ground Plane
Low Leakage Inductance
Current Transformer
P.W. Period
di/dt
Diode Recovery
dv/dt
Ripple 5%
Body Diode Forward Drop
Re-Applied
Voltage
Reverse
Recovery
Current Body Diode Forward
Current
V
GS
=10V
V
DD
I
SD
Driver Gate Drive
D.U.T. I
SD
Waveform
D.U.T. V
DS
Waveform
Inductor Curent
D = P.W.
Period
* VGS = 5V for Logic Level Devices
*
+
-
+
+
+
-
-
-
RGVDD
dv/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by Duty Factor "D"
D.U.T. - Device Under Test
D.U.T
VDS
90%
10%
VGS t
d(on)
t
r
t
d(off)
t
f
VDS
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
RD
VGS
RG
D.U.T.
10V
+
-
VDD
Fig 18a. Switching Time Test Circuit
Fig 18b. Switching Time Waveforms
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TO-252AA (D-Pak) Package Outline
Dimensions are shown in millimeters (inches)
TO-252AA (D-Pak) Part Marking Information
6.73 (.265)
6.35 (.250)
- A -
4
1 2 3
6.22 (.245)
5.97 (.235)
- B -
3X 0.89 (.035)
0.64 (.025)
0.25 (.010) M A M B
4. 57 (.180)
2.28 (.090)
2X 1.14 (.045)
0.76 (.030)
1.52 (.060)
1.15 (.045)
1.02 (.040)
1.64 (.025)
5.46 (.215)
5.21 (.205) 1. 27 (.050 )
0. 88 (.035 )
2.38 (.094)
2.19 (.086) 1.14 (.045)
0.89 (.035)
0.58 (.023)
0.46 (.018)
6.45 (.245)
5.68 (.224)
0.51 (.020)
MIN.
0. 58 (.02 3)
0. 46 (.01 8)
LEAD ASSIGNMENTS
1 - GATE
2 - DRAIN
3 - SOURCE
4 - DRAIN
10. 42 (.410)
9.40 (.370)
NOTES:
1 DIMENSIO NI NG & TOLERANCING PER ANSI Y14.5M, 1982.
2 CONTROLLING DIMENSIO N : INCH.
3 CONFORMS TO JEDEC OUTLINE TO-252AA.
4 DIMENSIONS SHOWN ARE BEFORE SOLDER DIP,
SOLDER DIP MAX. +0.16 (.006).
EXAMPLE:
LOT CODE 9U1P
THIS IS AN IRFR120
WITH ASSEMBLY
WE E K = 16
DAT E CODE
YE AR = 0
LOGO
RECTIFIER
INTERNATIONAL
AS S E MB L Y
LOT CODE
016
IRFU120
9U 1P
Notes: This part marking information applies to devices produced before 02/26/2001
INTERNATIONAL
LOGO
RECTIFIER
3412
IRF U 120
916A
LOT CODE
ASSEMBLY
EXAMPLE:
WITH ASSEMBLY
THIS IS AN IRFR120
YEAR 9 = 1999
DAT E CODE
LINE A
WEEK 16
IN THE ASS EMBLY LINE "A"
AS S EMBLED ON WW 16, 1999
LOT CODE 1234
PART NUMBER
Notes : T his part marking information applies to devices produced after 02/26/2001
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I-Pak (TO-251AA) Package Outline
Dimensions are shown in millimeters (inches)
I-Pak (TO-251AA) Part Marking Information
6.73 (.265)
6.35 (.250)
- A -
6.22 (.245)
5.97 (.235)
- B -
3X 0.89 (.035)
0.64 (.025)
0.25 (.010) M A M B
2.28 (.090)
1.14 (.045)
0.76 (.030)
5.46 ( .215)
5.21 ( .205) 1.27 (.050)
0.88 (.035)
2.38 (.094)
2.19 (.086)
1.14 (.045)
0.89 (.035)
0.58 (.023)
0.46 (.018) LEAD ASSIGNMENTS
1 - GATE
2 - DRAIN
3 - SO URCE
4 - DRAIN
NOTES:
1 DI ME NS I O NING & TOLE RA NCING PER ANSI Y14.5M, 1982 .
2 CON TROL L ING DI MENSI ON : I NCH.
3 CONFORMS TO JEDEC OUTLINE TO-252AA.
4 DIMENSIONS SHOWN ARE BEFORE SOLDER DIP,
SOLDER DIP MAX. +0.16 (.006).
9.65 (.380)
8.89 (.350)
2X
3X
2.28 (.090)
1.91 (.075)
1.52 (.060)
1.15 (.045)
4
1 2 3
6.45 ( .245)
5.68 ( .224)
0.58 (.023)
0.46 (.018)
WEEK = 16
DAT E CODE
YEAR = 0
Notes : T his part marking information applies to devices produced before 02/26/2001
EXAMPLE:
LOT CODE 9U1P
THIS IS AN IRFR120
WITH ASSEMBLY
AS S E MB L Y
INTERNATIONAL
RECTIFIER
LOGO
LOT CODE
IRFU120
9U 1P
016
INTERNATIONAL
LOGO
RECTIFIER
LOT CODE
AS S E MB L Y
EXAMPLE:
WIT H AS S E MB L Y
THIS IS AN IRFR120
YE AR 9 = 1999
DAT E CODE
LINE A
WE E K 19
IN THE ASSEMBLY LINE "A"
AS S EMBLED ON WW 19, 1999
LOT CODE 5678
PART NUMBER
Notes : T his part marking information applies to devices produced after 02/26/2001
56
IRFU120
919A
78
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Data and specifications subject to change without notice.
This product has been designed and qualified for the Automotive [Q101] market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 02/03
Notes:
Repetitive rating; pulse width limited by max. junction temperature. (See fig. 11).
Limited by TJmax, starting TJ = 25°C, L = 0.71mH, RG = 25, IAS = 23A, VGS =10V. Part not recommended for use above
this value.
ISD 23A, di/dt 400A/µs, V DD V(BR)DSS, TJ 175°C.
Pulse width 1.0ms; duty cycle 2%.
Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS .
Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive avalanche performance.
This value determined from sample failure population. 100% tested to this value in production.
When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer
to application note #AN-994.
D-Pak (TO-252AA) Tape & Reel Information
Dimensions are shown in millimeters (inches)
TR
16.3 ( .641 )
15.7 ( .619 )
8.1 ( .318 )
7.9 ( .312 )
12.1 ( .476 )
11.9 ( .469 ) FEED DIRECTION FEED DIRECTION
16.3 ( .641 )
15.7 ( .619 )
TRR TRL
NOTES :
1. CONTROLLING DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.
NOTES :
1. OUTLINE CONFORMS TO EIA-481.
16 mm
13 INCH
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Note: For the most current drawings please refer to the IR website at:
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