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DATA SH EET
Product data sheet
Supersedes data of 2002 Dec 10 2004 Feb 06
DISCRETE SEMICONDUCTORS
PMEG2010EA
Low VF (MEGA) Schottky barrier
diode
2004 Feb 06 2
NXP Semiconductors Product data sheet
Low VF (MEGA) Schottky barrier diode PMEG2010EA
FEATURES
Forward current: 1 A
Reverse voltage: 20 V
Ultra high-speed switching
Very low forward voltage
Very small plastic SMD package.
APPLICATIONS
Ultra high-speed switching
Voltage clamping
Protection circuits.
DESCRIPTION
Planar Maximum Efficiency Ge neral Application (MEGA)
Schottky barrier diode w ith an integrated guard ring for
stress protection, encapsulated in a SOD323 (SC-76) very
small SMD plastic package.
PINNING
PIN DESCRIPTION
1cathode
2anode
col
umns 12
MGU328
Fig.1 Simplified outline (SOD323; SC-76) and
symbol.
Marking code: E1.
The marking bar indicates the cathode.
ORDERING INFORMATION
LIMITING VALUES
In accordance with th e Absolute Maximum Ratin g S ystem (IEC 60134).
TYPE
NUMBER PACKAGE
NAME DESCRIPTION VERSION
PMEG2010EA plastic surface mounted package; 2 leads SOD323
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VRcontinuous revers e voltage 20 V
IFcontinuous forward current 1 A
IFSM non-repetitive peak forward current tp = 8.3 ms half sinewave;
JEDEC method 5 A
Tstg storage temperature 65 +150 °C
Tjjunction temperature 125 °C
Tamb operating ambient temperature 65 +125 °C
2004 Feb 06 3
NXP Semiconductors Pr oduct data shee t
Low VF (MEGA) Schottky barrier diode PMEG2010EA
CHARACTERISTICS
Tamb = 25 °C unless otherwise specified.
Note
1. Pulsed test: tp = 300 μs; δ = 0.02.
THERMAL CHARACTE RISTICS
Notes
1. Device mounted o n an FR4 printed-circuit board with Cu clad 10 x 10 mm.
2. Device mounted o n an FR4 printed-circuit board with Cu clad 40 x 40 mm.
SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
VFcontinuous forward voltage see Fig.2; note 1
IF = 10 mA 240 270 mV
IF = 100 mA 300 350 mV
IF = 1 000 mA 480 550 mV
IRcontinuous reverse current see Fig.3; note 1
VR = 5 V 5 10 μA
VR = 8 V 7 20 μA
VR = 15 V 10 50 μA
Cddiode capacitan ce VR = 5 V; f = 1 MHz; see Fig.4 19 25 pF
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth(j-a) thermal resistance from junction to ambient note 1 220 K/W
note 2 180 K/W
2004 Feb 06 4
NXP Semiconductors Pr oduct data shee t
Low VF (MEGA) Schottky barrier diode PMEG2010EA
GRAPHICAL DATA
handbook, halfpage
0.60.20 0.4 VF (V)
IF
(mA)
103
102
10
1
101
MHC311
(1) (2) (3)
Fig.2 Forward current as a function of forward
voltage; typical values.
(1) Tamb = 125 °C.
(2) Tamb = 85 °C.
(3) Tamb = 25 °C.
handbook, halfpage
250 51015
IR
(μA)
20 VR (V)
105
104
103
102
10
1
MHC312
(1)
(2)
(3)
Fig.3 Reverse current as a fun ction of reverse
voltage; typical values.
(1) Tamb = 125 °C.
(2) Tamb = 85 °C.
(3) Tamb = 25 °C.
handbook, halfpage
05
Cd
(pF)
10 20
80
60
20
0
40
15 VR (V)
MHC313
Fig.4 Diode capacitance as a function of reverse
voltage; typical values.
Tamb = 25 °C; f = 1 MHz.
2004 Feb 06 5
NXP Semiconductors Pr oduct data shee t
Low VF (MEGA) Schottky barrier diode PMEG2010EA
PACKAGE OUTLINE
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
SOD323 SC-76
SOD32
3
03-12-17
06-03-16
Note
1. The marking bar indicates the cathode
UNIT A
mm 0.05
1.1
0.8 0.40
0.25 0.25
0.10 1.8
1.6 1.35
1.15 2.7
2.3 0.45
0.15
A1
max
DIMENSIONS (mm are the original dimensions)
P
lastic surface-mounted package; 2 leads
01
(1)
21
2 mm
scale
bpc D E HDQ
0.25
0.15
Lpv
0.2
A
D
A
E
Lp
bp
detail X
A1c
Q
HDvA
M
X
2004 Feb 06 6
NXP Semiconductors Pr oduct data shee t
Low VF (MEGA) Schottky barrier diode PMEG2010EA
DATA SHEET STATUS
Notes
1. Please consult the mos t recently issued document before initiating or completing a design.
2. The product status of device(s) described in this document may have changed si nce this document was published
and may differ in case of multiple devices. The latest product status information is available on the Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the product specification.
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Applications Applications that are described herein for
any of these products are for illustrative purposes only.
NXP Semiconductors makes no representation or
warranty that such applications will be suitable for the
specified use witho ut fu rth e r testing or modification .
Limiting values Stress abov e on e or more limit ing
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values a re s t ress ratings only and
operation of the device at these or an y other conditions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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Quick refer ence data The Quick reference data is an
extract of th e product data given in the Limiting values an d
Characteristics sections of this docu ment, and as such is
not complete, exhaus tive or legally binding.
NXP Semiconductors
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© NXP B.V. 2009
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
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Customer notification
This data sheet was changed to reflect the new company name NXP Semiconductors, including new legal
definitions and disclaimer s. No changes were made to the technical content, except for package outline
drawings which were updated to the latest version.
Printed in The Netherlands R76/02/pp7 Date of release: 2004 Feb 06 Document orde r number: 9397 750 12626