JM38510/13501BGA - Analog Devices

REVISIONS

LTR DESCRIPTION DATE (YR-MO-DA) APPROVED

A Make change to 1.5 and add subgroup 4 to device class V and group E section

as specified in table IIA. – ro 99-07-30 R. MONNIN

B Drawing updated to reflect current requirements. – gt 03-02-20 R. MONNIN

C Add enhanced low dose rate effects (ELDRS) paragraph to 1.5 and

table I. - rrp 05-10-28 R. MONNIN

D Add the words “condition A” after method 1019 as specified under 4.4.4.1.

Delete Accelerated aging test, paragraph 4.4.4.1.1. - ro 07-06-12 R. HEBER

Make change to the VIO test subgroups by deleting 4,5,6 and substituting 1,2,3

under Table I. Make change to the VIO/t test subgroups by deleting 5,6 and

substituting 2,3 under Table I. Make change to the all CMRR, PSRR, and AVS

test subgroups by deleting 4,5,6 and substituting 1,2,3 under Table I.

Delete subgroups 5 and 6 from Tabel IIA. Add subgroups 5 and 6 to

paragraph 4.4.1b. Add two footnotes under Table IIB. Delete paragraph

4.4.4.2. - ro

11-03-28 C. SAFFLE

REV

SHEET

REV

SHEET

REV STATUS REV E E E E E E E E E E E E

OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12

PMIC N/A PREPARED BY

RICK OFFICER

DLA LAND AND MARITIME

COLUMBUS, OHIO 4321 8-3990

http://www.dscc.dla.mil

STANDARD

MICROCIRCUIT

DRAWING

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

CHECKED BY

RAJESH PITHADIA

APPROVED BY

RAYMOND MONNIN

MICROCIRCUIT, LINEAR, RADIATION

HARDENED, ULTRA-LOW OFFSET VOLTAGE

OPERATIONAL AMPLIFIER, MONOLITHIC

SILICON

DRAWING APPROVAL DATE

98-10-08

AMSC N/A

REVISION LEVEL

E SIZE

A CAGE CODE

67268

5962-98639

SHEET 1 OF 12

DSCC FORM 2233

APR 97 5962-E071-11

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-98639

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

E SHEET 2

DSCC FORM 2234

APR 97

1. SCOPE

1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and

M) and space application (de vice class V). A choice of case outlines and lead finishes are available and are reflected in the Part

or Identifying Number (PIN). When availa ble, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

1.2 PIN. The PIN is as shown in the following example:

5962 R 98639 01 V G A

Federal

stock class

designator

RHA

designator

(see 1.2.1)

Device

type

(see 1.2.2)

Device

class

designator

Case

outline

(see 1.2.4)

Lead

finish

(see 1.2.5)

\ / (see 1.2.3)

Drawing number

1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are

marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A

specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a n on-RHA device.

1.2.2 Device type(s). The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function

01 OP07A Radiation hardened, single ultra lo w offset

operational amplifier

1.2.3 Device class designator. The device class designator is a single letter identifying the product assur ance level as

follows:

Device class Device requirements docum entation

M Vendor self-certification to the requireme nts for MIL-STD-883 compliant, non-

JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A

Q or V Certification and qualification to MIL-PRF-38535

1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style

G MACY1-X8 8 Can

H GDFP1-F10 or CDFP2-F10 10 Flat pack

P GDIP1-T8 or CDIP2-T8 8 Dual-in-line

2 CQCC1-N20 20 Square leadless chip carrier

1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,

appendix A for device class M.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-98639

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

E SHEET 3

DSCC FORM 2234

APR 97

1.3 Absolute maximum ratings. 1/

Supply voltage (VS) ......................................................................................... 22.0 V dc

Input voltage (VIN) .......................................................................................... 22.0 V dc 2/

Differential input voltage ................................................................................. 30 V dc

Internal power dissipation (PD) ....................................................................... 500 mW

Output short circuit duration ............................................................................ Indefinite

Lead temperature (soldering, 10 seconds) ...................................................... +300C

Junction temperature (TJ) ............................................................................... +150C

Storage temperature range ............................................................................. -65C to +150C

Thermal resistance, junction-to-case (JC) ..................................................... See MIL-STD-1835

Thermal resistance, junction-to-ambient (JA):

Cases G and H ............................................................................................ +150C/W

Case P ......................................................................................................... +119C/W

Case 2 ......................................................................................................... +110C/W

1.4 Recommended operating conditions.

Supply voltage range (VS) .............................................................................. 4.5 V dc to 20 V dc

Ambient operating temperature range (TA) ..................................................... -55C to +125C

1.5 Radiation features.

Maximum total dose available (dose rate = 50 – 300 rads (Si)/s) ................... 100 krads 3/

______

1/ Stresses abov e the absolute maximum rating may cause permanent dam age to the device. Extended operation at the

maximum levels may degrade performance and affect reliability.

2/ For supply voltage less than 22 V, the absolute maximum input voltage is equal to the su pply voltage.

3/ These parts may be dose rat e sensitive in a space environment and may demonstrate enhanced low dose rate effects.

Radiation en d point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883,

method 1019, condition A.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-98639

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

E SHEET 4

DSCC FORM 2234

APR 97

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and han dbooks. The following specification, standards, and handbooks form a part

of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the

solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATION

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-883 - Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

DEPARTMENT OF DEFENSE HANDBOOKS

MIL-HDBK-103 - List of Standard Microcircuit Drawings.

MIL-HDBK-780 - Standard Microcircuit Drawings.

(Copies of these documents ar e available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization

Document Order Desk, 700 Robbins Avenue , Building 4D, Philadelphia, P A 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicabl e laws and regulations unless a

specific exemption has been obtained.

3. REQUIREMENT S

3.1 Item requir ements. The individual item requirements for device classe s Q and V shall be in accordance with

MIL-PRF-38535 and as specif ied herein or as modified in the device manufacturer's Quality Management (QM) plan. The

modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for

device class M shall be in acc ordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

herein.

3.2 Design, co nstruction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for devic e class M.

3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.

3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be as specified on figure 2.

3.3 Electrical performance characteristics and postirradiation parameter limits. Unless ot herwise specified herein, the

electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall appl y over the full

ambient operating temperature range.

3.4 Electrical t est requirements. The electrical test requirements shall be the s ubgroups specified in table IIA. The electrical

tests for each subgroup are defined in table I.

3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be

marked. For packages where marking of the entire SMD PIN is not feasible due to space limitatio ns, the manufacturer has the

option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be marked.

Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in

accordance with MIL-PRF-38535, appendix A.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-98639

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

E SHEET 5

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristi c s.

Test Symbol Conditions 1/ 2/

-55C  TA  +125C

unless otherwise specified

Group A

subgroups

Device

type

Limits Unit

Min Max

Input offset voltage VIO 3/ 1 01 -25 +25

V

2,3 -60 +60

M,D,P,L,R 4/ 1 -400 +400

Input offset voltage

temperature sensitivity VIO /

t 5/ 2,3 01 -0.6 +0.6

V/C

Input bias current +IIB 1 01 -2 +2 nA

2,3 -4 +4

-IIB 1 -2 +2

2,3 -4 +4

IIB M,D,P,L,R 4/ 1 -125 +125

Input offset current IIO 1 01 -2 +2 nA

2,3 -4 +4

M,D,P,L,R 4/ 1 -25 +25

Power supply 5/

rejection ratio

+PSRR +VS = +20 V to +5 V, 1 01 -10 10

V/V

-VS = -15 V 2,3 -20 20

-PSRR +VS = +15 V, 1 -10 10

-VS = -20 V to -5 V 2,3 -20 20

PSRR VS = 4.5 V to 20 V 1 -10 10

2,3 -20 20

Common mode 5/

rejection ratio

CMRR VCM = 13 V 1 01 110 dB

2,3 106

Adjustment short 5/

circuit current +VIO

ADJ VCM = 0 V 1 01 0.5 mV

-VIO

ADJ -0.5

Output short circuit current +IOS t  25 ms 5/ 6/ 1,2 01 -65 mA

3 -70

-IOS 1,2 65

3 70

See footnotes at end of table.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-98639

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

E SHEET 6

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristi c s - Continued.

Test Symbol Conditions 1/ 2/

-55C  TA  +125C

unless otherwise specified

Group A

subgroups

Device

type

Limits Unit

Min Max

Supply current IS V

CM = 0 V 1 01 4 mA

2,3 5

M,D,P,L,R 4/ 1 4

Output voltage swing 5/

(minimum) VOP R

L = 1 k 1,2,3 01 -10 10 V

RL = 2 k -12 12

Open loop voltage gain

(single ended) +AVS V

OUT = 0 V to +10 V, 1 01 300 V / mV

RL = 2 k 2,3 200

-AVS V

OUT = 0 V to -10 V, 1 300

RL = 2 k 2,3 200

AVS V

OUT = 10 V, RL = 2 k 1 100

M,D,P,L,R 4/

Slew rate 5/ +SR,

-SR VIN = 5 V, AV = 1 4 01 .08

V / s

Input noise voltage 5/

density

En fO = 10 Hz 4 01 18

nV /

fO = 100 Hz 14

fO = 1 kHz 12

Low frequency input 5/

noise voltage Enpp fO = 0.1 Hz to 10 Hz 4 01 0.6

VPP

1/ VS = 15 V and VCM = 0 V.

2/ These parts may be dose rat e sensitive in a space environment and may demonstrate enhanced low dose rate effects.

Radiation en d point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883,

method 1019, condition A.

3/ Due to the inherent warm-up drift of device type 01, testing shall occur no sooner than five minutes after application of

power.

4/ Devices supplied to this drawing have been characterized through all levels M, D, P, L, and R of irradiation. However,

this device is onl y tested at the "R" level. Pre and Post irradiation values are identical un less otherwise specified

in table I. When performing post irradiation electric al measurements for any RHA level, TA = +25C.

5/ This parameter is not tested to post irradiation.

6/ Continuous short circuit limits are considerably less than the indicated test limits since maximum power dissipation

cannot be exceeded.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-98639

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

E SHEET 7

DSCC FORM 2234

APR 97

Device type 01

Case outlines G and P H 2

Terminal number Terminal symbol

1 VIO TRIM NC NC

2 -INPUT

VIO TRIM VIO TRIM

3 +INPUT -INPUT NC

4 -VS +INPUT NC

5 NC

-VS -INPUT

6 OUTPUT NC NC

7 +VS OUTPUT +INPUT

8 VIO TRIM +VS NC

9 ---

VIO TRIM NC

10 --- NC

-VS

11 --- --- NC

12 --- --- NC

13 --- --- NC

14 --- --- NC

15 --- --- OUTPUT

16 --- --- NC

17 --- ---

+VS

18 --- --- NC

19 --- --- NC

20 --- ---

VIO TRIM

NC = No connection

FIGURE 1. Terminal connections.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-98639

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

E SHEET 8

DSCC FORM 2234

APR 97

FIGURE 2. Radiation exposure circuit.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-98639

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

E SHEET 9

DSCC FORM 2234

APR 97

3.5.1 Certification/compliance mark. T he certification mark for device classes Q and V shall be a "QML" or "Q" as required in

MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.

3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be requ ired from a QML-38535

listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of

compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see

6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an appr oved source of

supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of

MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appen dix A and herein.

3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for

device class M in MIL-PRF-38 535, appendix A shall be prov ided with each lot of microcircuits delivered to this dra wing.

3.8 Notification of chan ge for device class M. For device class M, notification to DLA Land and Maritime -VA of change of

product (see 6.2 herein) inv olving devices acquired to this drawing is required for any change that affects this drawing.

3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime’s agent,

and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore

documentation shall be mad e available onshore at the option of the revie wer.

3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing sha ll be in

microcircuit group number 49 (see MIL-PRF-38535, appendix A).

4. VERIFICATION

4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accord ance with

MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan

shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in

accordance with MIL-PRF-38535, appendix A.

4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted

on all devices prior to qualific ation and technology confor mance inspection. For device class M, screening shall be in

accordance with method 5004 of MIL-STD-883, and shall b e conducted on all devices prior to qualit y co nformance inspection.

4.2.1 Additional criteria for device class M.

a. Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document re vision

level control and shall be ma de available to the preparing or acquiring activity upon request. T he test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordanc e wit h the inte nt specified in

method 1015 of MIL-STD-883.

(2) TA = +125C, minimum.

b. Interim and final electrical test parameters shall be as specified in table IIA herein.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-98639

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

E SHEET 10

DSCC FORM 2234

APR 97

TABLE IIA. Electrical test requirements.

Test requirements Subgr oups

(in accordance with

MIL-STD-883,

method 5005, table I)

Subgroups

(in accordance with

MIL-PRF-38535, table III)

Device

class M Device

class Q Device

class V

Interim electrical

parameters (see 4.2) 1 1 1

Final electrical

parameters (see 4.2) 1,2,3,4 1/ 1,2,3,4 1/ 1,2,3,4 1/ 2/

Group A test

requirements (see 4.4) 1,2,3,4 1,2,3,4 1,2,3,4

Group C end-point electrical

parameters (see 4.4) 1 1 1 2/

Group D end-point electrical

parameters (see 4.4) 1 1 1

Group E end-point electrical

parameters (see 4.4) 1 1 1

1/ PDA applies to subgroup 1.

2/ Delta limits as specified in table IIB shall be required where specified, and the delta limits

shall be completed with reference to the zero hour electrical parameters (see table I).

TABLE IIB. Burn-in and operating life test delta parameters. TA = +25C. 1/ 2/

Parameter Device type Limits Delta Units

Min Max Min Max

VIO 01 -135 +135 -75 +75

V

+IIB 01 -5 +5 -1 +1 nA

-IIB 01 -5 +5 -1 +1 nA

/ Deltas are performed at room temperature.

/ 240 hour burn-in and 1,000 hour operating group C life test.

4.2.2 Additional criteria for device classes Q and V.

a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the

device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under

document revision level contro l of the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made av ailable to the acquiring or preparing activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordanc e wit h the inte nt specified in

method 1015 of MIL-STD-883.

b. Interim and final electrical test parameters shall be as specified in table IIA herein.

c. Additional screening for devic e class V beyond the requirements of device class Q shall be as specified in

MIL-PRF-385 35, appendix B.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-98639

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

E SHEET 11

DSCC FORM 2234

APR 97

4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shal l be in

accordance with MIL-PRF-38535. Inspectio ns to be performed shall be those specified in MIL-PRF-38535 and herein for groups

A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).

4.4 Conformance inspection. Technology conforma nce inspection for classes Q and V shall be in accor dance with

MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for

device class M shall be in acc ordance with MIL-PRF-38535, appendix A and as specified herein. Inspec tions to be performed

for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspectio ns

(see 4.4.1 through 4.4.4).

4.4.1 Group A inspection.

a. Tests shall be as specified in table IIA herein.

b. Subgroups 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.

4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specifi ed in table IIA herein.

4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:

a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level

control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specifi ed in method 1005 of

MIL-STD-883.

b. TA = +125C, minimum.

c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,

or approved alternativ es shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-385 35. The

test circuit shall be maintained under docum ent revision level control by the device manufac turer' s TRB in accordance with

MIL-PRF-38535 and shall be made available to the acquiri ng or preparing activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specifi ed in method 1005 of

MIL-STD-883.

4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specifi ed in table IIA herein.

4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured

(see 3.5 herein).

a. End-point electrical parameters shall be as specified in table IIA herein.

b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as

specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to

radiation hardness assured tests as specified in MIL-PRF - 38535, appendix A for the RHA level being tested. All device

classes must meet the postirradiation end-point electrical parameter limits as defined in t able I at TA = +25C 5C,

after exposure, to the subgrou ps specifi ed in table IIA herein.

4.4.4.1 Total dose irradiation testing. Total dose irradi ation testing shall be performed in accordance with MIL-STD-883

method 1019, condition A and as specified herein.

5. PACKAGING

5.1 Packaging requirements. The requirements for packaging sha ll be in accordance with MIL-PRF-38535 for device classes

Q and V or MIL-PRF-38535, appendix A for device class M.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-98639

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

E SHEET 12

DSCC FORM 2234

APR 97

6. NOTES

6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications

(original equipment), desig n applications, and logistics purposes.

6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor

prepared specification or drawing.

6.1.2 Substitutability. Device class Q devices will replace device class M devic es.

6.2 Configurati on control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for

the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Cha nge Proposal.

6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application req uires

configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and

this list will be used for coordinatio n and distribution of changes to the drawings. Users of drawings covering microelectronic

devices (FSC 5962) should c ontact DLA Land and Maritime -VA, telephone (61 4) 692-0544.

6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbu s, Ohio 43218-3990,

or telephone (614) 692-0540.

6.5 Abbreviati ons, symbols, and definitions. The abbrevi ations, symbols, and definitions used h erein are defined in

MIL-PRF-38535 and MIL-HDBK-133 1.

6.6 Sources of supply.

6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.

The vendors listed in QML-38535 h ave submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime -VA and

have agreed to this drawing.

6.6.2 Approv ed sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.

The vendors listed in MIL-HDBK-103 h ave agreed to this drawing and a certificate of compliance (see 3.6 herein) has been

submitted to and accepted by DLA Land and Maritime -VA.

STANDARD MICROCIRCUIT DRAWING BULLETIN

DATE: 11-03-28

Approved sources of suppl y for SMD 5962-98639 are listed below for immediate acquisition information only and

shall be added to MIL-HDBK-103 an d QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be

revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a

certificate of compliance has been subm itted to and accepted by DLA Land and Maritim e -VA. This information

bulletin is superseded by the ne xt dated revision of MIL-HDBK-103 and QML-38535. DL A Land and Maritime

maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/.

Standard

microcircuit drawing

PIN 1/

Vendor

CAGE

number

Vendor

similar

PIN 2/

5962R9863901VGA 24355 OP07AJ/QMLR

5962R9863901VHA 24355 OP07AL/QMLR

5962R9863901VPA 24355 OP07AZ/QMLR

5962R9863901V2A 3/ OP07ARC/QMLR

1/ The lead finish shown for each PIN representing

a hermetic package is the most readily available

from the manufacturer listed for that part. If the

desired lead finish is not listed contact the vendor

to determine its availability.

2/ Caution. Do not use this number for item

acquisition. Items acquired to this number m ay not

satisfy the performance requirements of this drawing.

3/ Not available from an approved source of supply.

Vendor CAGE Vendor name

number and address

24355 Analog Devices

Route 1 Industrial Park

P.O. Box 9106

Norwood, MA 02062

Point of contact: 7910 Triad Center Drive

Greensboro, N C 2740 9-9605

The information contained herein is disseminated for convenience only and the

Government assumes no liability whatsoeve r for any inaccuracies in the

information bulletin.

Mouser Electronics

Authorized Distributor

Click to View Pricing, Inventory, Delivery & Lifecycle Information:

Analog Devices Inc.:

JM38510/13502BGA JM38510/13501BGA JM38510/13501BPA OP070000C JM38510/13501SPA OP07R000C

JM38510/13502SPA 5962R9863901VGA 5962R9863901VHA 5962R9863901VPA JM38510/13501SGA