*ELECTRICAL characteristics (TC =25°c unless otherwise noted.)
ICharacteristic symbol Min IMax IUnit
OFF CHARACTERISTICS I
Collector-Emitter Sustaining Voltage(l) VCEO($”s)
([c= 200mAdc, IB =0) Vdc
2N6576 60 1
I I 2N6577
A., fi---
v-
Collector Cutoff Current
(VCER =Rated VCEO(Sus) Value, RBE =10,kQ, TC =150°C)
I,Lcu I
I
Collector Cutoff Current ICEV —
VCEX =Rated VCEO(Sus) V’alue, VgE(off) =1.5 Vdc) “.” ~~,,,t~~..~~ r,, ,-u-
,,<,,+
,.~l,. ... .:>
Collector Cutoff Current >.,+..
ICBO
(VCB =Rated Value)
—~:~,>;$<$,>~ mAdc
‘\:?i=-
“’i~$~j,,
~.~’~
ON CHARACTERISTICS %*,.,,,
..
.@ie>;,
DC Current Gain hFE ., ~,s;ti~.,.
\~~i<~,,.,.,..
,.,
{Ic =15 Adc, VCE =4.0 Vdc) —
1@’!”z’ ‘% ~’ –
(!C =10 Adc, VCE =3.0 Vdc) ,$%S;>,” 5,000
(1C =4.0 Adc, VCE =3.0 Vdcl 20,000
(IC =0.4 Adc, VCE =3.0 Vdc) ..3$$’ ‘%ti 2–
Collector-Emitter Saturation Voltage ,.i<r .,$
‘C E(sa~~y~$ ~<
+,..!,:!:$.
(IC =15 Adc, IB= 0.15 Adc) Vdc
*::,. .\*>\._
([c= 10 Adc, IB=O.l Adc) 4.0
‘::*,,,,>,::$
,,.:.~~}
~.,.’,-.J —2.8
Base-Emitter Saturation Voltage \,.t. ,$$.
~,:sv;g~wt)
(It= 15 Adc, lg=0.15Adc) Vdc
~.~:>~<h,,
(IC= 10 Adc, IB=O.I Adc) —4.5
~.i.i,
{,~$,,;~
,Y ‘i{, k:. —3.5
Collector-Emitter Diode Voltage Drop \$$\w :
>::..,tJ.,.\,,\\?, VF, —
(i EC=15Adc) 4.5 Vdc
“.’jJ,, ‘
.+~f&&T<~Q,
.,..,,
DYNAMIC CHARACTERISTICS ‘i~,
.\ ‘
Magnitude of Commo,n-Emitter Small-Signal Short-Circuit Curre~# Tra#sfer Ratio Ihfel 10 200
(IC =3.0 Adc, VCE =3.0 Vdc; f,= 1.0 MHz) .S:’Q{+C), —
SWITCHING CHARACTERISTICS .:$” ‘“
~:?>;.\.~?.>,&:*:i?t+
RESISTIVE LOAD (Figure 2) ,a,l, s,
,.,,
***,,*t:.
, , .;,? .,
Delay Time (Vcc =30 Vdc, IC =’10 Ad$;$~~8.1 Adc, td —0.15 ~
Rise Time #s
tp =300 PS, Dutv CVCl$a*3~@~+ tr —1.0
Storage Time (Vcc =30 Vdc, IC ‘i~~~~’YIBl =IB2= 0.1 Adc, Ps
t~
Fall Time
—2.0 Ps
tp =300 ps, DuK$~v’c~&+@ 2.0%)
$i ,i~ tf —7.0 ps
..,&$~&:#::’
*Indicates JEDEC Registered Data $’
(1) Pulse test: Pulse Width <30,Q,4/$~&&& Cvcle <2.0%.
.:?. ~:\t;\:
,,\\ ,
-%?.,;$
,>? l\:)~?
,:.,/ ,.,
FIGURE 1 – ~’~fij@ORWARD BIASED
SA,~@;&’%ATING AREA
I%1.o~-”- B~ndingwirsLimit JUwll !-
There are two limitations on the power handling abilitv of
atransistor: average junction temperature and second breakdown.
Safe operating area curves indicate IC-VCE limits of the transis-
tor that must be’observed for reliable operation; i.e., the transistor
must not be subjected to greater dissipation than the curves
indicate.
The data of Figure 1is based on Tc =25°C; TJ(pk) is variable
depending on power level. Second breakdown pulse Iimits are
valid for duty cycles to 10%.
TJ(pk) may be calculated from the data in Figure 7. At high
case temperatures thermal limitations will reduce the power that
can be handled to values less than the limitations imposed by
second breakdown.
,.
‘L VCE, COLLECTOR-EMITTER VOLTAGE (VOLTS)
~MOTOROLA Semiconductor Products /nc.