SPECIFICATION
• Supplier : Samsung electro-mechanics • Part Number : CL10C102GB8NNNC
• Product : Multi-layer Ceramic Capacitor • Description : CAP, 1㎋, 50V, ±2%, C0G, 0603
CL 10 C 102 G B 8 N N N C
① ②③ ④ ⑤ ⑥ ⑦⑧⑨⑩⑪
①Series Samsung Multi-layer Ceramic Capacitor
②Size 0603 (inch code) L: 1.6 ± 0.1 mm W: ± 0.1 mm
③Dielectric C0G ⑧Inner electrode
④Capacitance 1㎋Termination
⑤Capacitance ± 2 %Plating (Pb Free)
tolerance ⑨Product Normal
⑥Rated Voltage 50 V ⑩Special Reserved for future use
⑦Thickness 0.8 ± 0.1 mm ⑪Packaging Cardboard Type, 7" reel
B. Samsung Reliablility Test and Judgement condition
Capacitance Within specified tolerance 1㎒±10% 0.5~5Vrms
Q1000 min
Insulation 10,000Mohm or 500Mohm⋅㎌Rated Voltage 60~120 sec.
Resistance Whichever is Smaller
Appearance No abnormal exterior appearance Microscope (×10)
Withstanding No dielectric breakdown or of the rated voltage
Voltage mechanical breakdown
Temperature C0G
Characterisitcs (From -55℃ to 125℃, Capacitance change shoud be within ±30PPM/℃)
Adhesive Strength No peeling shall be occur on the 500g⋅F, for 10±1 sec.
of Termination terminal electrode
Bending Strength Capacitance change : Bending to the limit (1mm)
within ±5% or ±0.5㎊ whichever is larger with 1.0mm/sec.
Solderability More than 95% of terminal surface 1) Sn63Pb37 solder
is to be soldered newly 235±5℃, 5±0.5sec.
2) SnAg3.0Cu0.5 solder
245±5℃, 3±0.3sec.
(preheating : 80~120℃ for 10~30sec.)
Resistance to Capacitance change : Solder pot : 270±5℃, 10±1sec.
Soldering heat within ±2.5% or ±0.25㎊ whichever is larger
Tan δ, IR : initial spec.
Performance Test condition
300%
A. Samsung Part Number
Sn 100%
Cu
Ni
0.8
Vibration Test Capacitance change : Amplitude : 1.5mm
within ±2.5% or ±0.25㎊ whichever is lar
g
e
r
From 10Hz to 55Hz (return : 1min.)
Tan δ, IR : initial spec. 2hours
×
3 direction
(
x,
y
, z
)
Humidity Capacitance change : 40±2℃, 90~95%RH, 500+12/-0hrs
within ±5% or ±0.5㎊ whichever is larger
Q: 350 min
IR : 1000Mohm or 50Mohm ⋅ ㎌
Moisture Capacitance change : With rated voltage
Resistance within ±7.5% or ±0.75㎊ whichever is larger 40±2℃, 90~95%RH, 500+12/-0hrs
Q : 200 min
IR : 500Mohm or 25Mohm ⋅ ㎌
High Temperature Capacitance change : Wit
h
of the rated voltage
Resistance within ±3% or ±0.3㎊ whichever is larger Max. operating temperature
Q : 350 min 1000+48/-0hrs
IR : 1000Mohm or 50Mohm ⋅ ㎌
Temperature Capacitance change : 1 cycle condition
Cycling within ±2.5% or ±0.25㎊ whichever is larger Min. operating temperatu
r
→25℃
Tan δ, IR : initial spec. →Max. operating temperature →25℃
5 cycle test
C. Recommended Soldering method :
Reflow
(
Reflow Peak Tem
p
erature : 250+/-5℃, 6sec. Max
)
* For the more detail Specification, Please refer to the Samsung MLCC catalogue.
Whichever is Smaller
Whichever is Smaller
Whichever is Smaller
Performance Test condition
200%
