DATA SH EET
Product data sheet
Supersedes data of 1999 Apr 08 2004 Dec 06
DISCRETE SEMICONDUCTORS
BCV29; BCV49
NPN Darlington transistors
db
ook, halfpage
M3D109
2004 Dec 06 2
NXP Semiconductors Product data sheet
NPN Darlington transistors BCV29; BCV49
FEATURES
High current (max. 500 mA)
Low voltage (max. 60 V)
High DC current gain (min. 20 000).
APPLICATIONS
Preamplifier input applications.
DESCRIPTION
NPN small-signal Darlingto n transistor in a su rface mount
SOT89 plastic package. PNP complements: BCV28 and
BCV48.
MARKING
PINNING
TYPE NUMBER MARKING CODE
BCV29 EF
BCV49 EG
PIN DESCRIPTION
1emitter
2collector
3base
321
sym08
7
TR1 TR2
1
23
Fig.1 Simplified outline (SOT89) and sy mbol.
ORDERING INFORMATION
TYPE NUMBER PACKAGE
NAME DESCRIPTION VERSION
BCV29 SC-62 plastic surface mounted package; collector pad for good heat
transfer; 3 leads SOT89
BCV49
2004 Dec 06 3
NXP Semiconductors Pr oduct dat a shee t
NPN Darlington transistors BCV29; BCV49
LIMITING VALUES
In accordance with the A bsolute Maximum Rating System (IEC 60134).
Note
1. Device mounted on a pr inted-circuit board, single-sided copper, tin-plated, mounting pad for collector 1 cm2.
For other mounting conditions, see “Thermal considerations for SOT89 in the General Part of associated Handbook”.
THERMAL CHARACTE RISTICS
Note
1. Device mounted on a pr inted-circuit board, single-sided copper, tin-plated, mounting pad for collector 1 cm2.
For other mounting conditions, see “Thermal considerations for SOT89 in the General Part of associated Handbook”.
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VCBO collector-base volt a ge open emitter
BCV29 40 V
BCV49 80 V
VCES collector-emitter voltage VBE = 0 V
BCV29 30 V
BCV49 60 V
VEBO emitter-base voltage open collector 10 V
ICcollector current (DC) 500 mA
ICM peak collector current 1 A
IBM peak base current 200 mA
Ptot total power dissipation Tamb 25 °C; note 1 1.3 W
Tstg storage temperature 65 +150 °C
Tjjunction temperature 150 °C
Tamb ambient temperature 65 +150 °C
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth(j-a) thermal resistance from junction to ambient note 1 96 K/W
Rth(j-s) thermal resistance from junction to soldering point 16 K/W
2004 Dec 06 4
NXP Semiconductors Pr oduct dat a shee t
NPN Darlington transistors BCV29; BCV49
CHARACTERISTICS
Tamb = 25 °C unless otherwise specified.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
ICBO collector-base cut-off current
BCV29 IE = 0 A; VCB = 30 V 100 nA
BCV49 IE = 0 A; VCB = 60 V 100 nA
IEBO emitter-base cu t-off current IC = 0 A; VEB = 10 V 100 nA
hFE DC current gain VCE = 5 V; see Fig.2
BCV29 IC = 1 mA 4 000
IC = 10 mA 10 000
IC = 100 mA 20 000
IC = 500 mA 4 000
DC current gain VCE = 5 V; see Fig.2
BCV49 IC = 1 mA 2 000
IC = 10 mA 4 000
IC = 100 mA 10 000
IC = 500 mA 2 000
VCEsat collector-emitte r sa turation v oltage IC = 100 mA; IB = 0.1 mA 1 V
VBEsat base-emitt er saturation voltage IC = 100 mA; IB = 0.1 mA 1.5 V
VBEon base-emitter on-state voltage IC = 10 mA; VCE = 5 V 1.4 V
fTtransition freque ncy IC = 30 mA; VCE = 5 V; f = 100 MHz 220 MHz
2004 Dec 06 5
NXP Semiconductors Pr oduct dat a shee t
NPN Darlington transistors BCV29; BCV49
Fig.2 DC current gain; typical values.
handbook, full pagewidth
0
60000
80000
20000
40000
MGD837
1011IC (mA)
hFE
10 102 103
VCE = 2 V.
2004 Dec 06 6
NXP Semiconductors Pr oduct dat a shee t
NPN Darlington transistors BCV29; BCV49
PACKAGE OUTLINE
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
DIMENSIONS (mm are the original dimensions)
SOT89 TO-243 SC-62 04-08-03
06-03-16
wM
e1
e
EHE
B
0 2 4 mm
scale
bp3
bp2
bp1
c
D
Lp
A
Plastic surface-mounted package; collector pad for good heat transfer; 3 leads SOT8
9
123
UNIT A
mm 1.6
1.4 0.48
0.35
c
0.44
0.23
D
4.6
4.4
E
2.6
2.4
HELp
4.25
3.75
e
3.0
w
0.13
e1
1.5 1.2
0.8
bp2
bp1
0.53
0.40
bp3
1.8
1.4
2004 Dec 06 7
NXP Semiconductors Pr oduct dat a shee t
NPN Darlington transistors BCV29; BCV49
DATA SHEET STATUS
Notes
1. Please consult the most rec en tly issued document before initiating or co mpleting a design.
2. The product s tatus of device(s) described in this document may have changed since this document was published
and may differ in case of multiple devices. The latest product status information is available on the Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the product specification.
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Applications Applications that are described herein for
any of these products are for illustrative purposes only.
NXP Semiconductors makes no representation or
warranty that such applications will be suitable for the
specified use witho ut fu rth e r testing or modificat ion.
Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values are stress ratin gs only and
operation of the device at these or any other cond itions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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Quick refer ence data The Quick reference data is an
extract of th e product data given in the Limiting values and
Characteristics sections of this document, and as such is
not complete, exhaus tive or legally binding.
NXP Semiconductors
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Customer notification
This data sheet was changed to reflect the new company name NXP Semiconductors, including new legal
definitions and disclaimer s. No changes were made to the tech nical content, except for package outline
drawings which were updated to the latest version.
Printed in The Netherlands R75/06/pp8 Date of release: 2004 Dec 06 Document orde r number: 9397 750 13863