PESD12VV1BL
Very low capacitance bidirectional ESD protection diode
14 October 2016 Product data sheet
1. General description
Very low capacitance bidirectional ElectroStatic Discharge (ESD) protection diode designed to
protect one signal line from the damage caused by ESD and other transients. The device is housed
in a leadless ultra small DFN1006-2 (SOD882) Surface-Mounted Device (SMD) plastic package.
2. Features and benefits
Bidirectional ESD protection of one line
Low diode capacitance Cd = 17 pF
Rated peak pulse power: PPPM = 290 W
Ultra low leakage current IRM < 1 nA
ESD protection up to 30 kV
IEC 61000-4-2; level 4 (ESD)
IEC 61000-4-5 (surge); IPPM = 7.8 A
AEC-Q101 qualified
3. Applications
Computers and peripherals
Audio and video equipment
Cellular handsets and accessories
Portable electronics
Communication systems
4. Quick reference data
Table 1. Quick reference data
Symbol Parameter Conditions Min Typ Max Unit
VRWM reverse standoff
voltage
Tamb = 25 °C - - 12 V
Cddiode capacitance f = 1 MHz; VR = 0 V; Tamb = 25 °C - 17 25 pF
NXP Semiconductors PESD12VV1BL
Very low capacitance bidirectional ESD protection diode
PESD12VV1BL All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved
Product data sheet 14 October 2016 2 / 11
5. Pinning information
Table 2. Pinning information
Pin Symbol Description Simplified outline Graphic symbol
1 K cathode
2 K cathode
21
Transparent
top view
DFN1006-2 (SOD882)
sym045
21
6. Ordering information
Table 3. Ordering information
PackageType number
Name Description Version
PESD12VV1BL DFN1006-2 DFN1006-2: leadless ultra small plastic package; 2 terminals SOD882
7. Marking
Table 4. Marking codes
Type number Marking code
PESD12VV1BL MW
8. Limiting values
Table 5. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
PPPM rated peak pulse power [1] - 290 W
IPPM rated peak pulse current tp = 8/20 µs [1] - 7.8 A
Tjjunction temperature - 150 °C
Tamb ambient temperature -55 150 °C
Tstg storage temperature -65 150 °C
ESD maximum ratings
IEC 61000-4-2; contact discharge [2] - 30 kV
machine model - 400 V
VESD electrostatic discharge
voltage
human body model (MIL-STD-883) - 10 kV
[1] Device stressed with non-repetitive current pulses (8/20 µs exponential decay waveform according to IEC 61000-4-5 and IEC
61643-321).
[2] Device stressed with ten non-repetitive ESD pulses.
NXP Semiconductors PESD12VV1BL
Very low capacitance bidirectional ESD protection diode
PESD12VV1BL All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved
Product data sheet 14 October 2016 3 / 11
tp (µs)
0 403010 20
001aaa630
40
80
120
IPP
(%)
0
e-t
100 % IPP; 8 µs
50 % IPP; 20 µs
Fig. 1. 8/20 µs pulse waveform according to
IEC 61000-4-5 and IEC 61643-321
001aaa631
IPP
100 %
90 %
t
30 ns
60 ns
10 %
tr= 0.6 ns to 1 ns
Fig. 2. ESD pulse waveform according to
IEC 61000-4-2
9. Characteristics
Table 6. Characteristics
Symbol Parameter Conditions Min Typ Max Unit
VRWM reverse standoff
voltage
Tamb = 25 °C - - 12 V
VBR breakdown voltage IR = 5 mA; Tamb = 25 °C 14.6 15.7 16.8 V
IRM reverse leakage
current
VRWM = 12 V; Tamb = 25 °C - 1 10 nA
Cddiode capacitance f = 1 MHz; VR = 0 V; Tamb = 25 °C - 17 25 pF
IPP = 1 A; Tamb = 25 °C [1] - - 22 VVCL clamping voltage
IPPM = 7.8 A; Tamb = 25 °C [1] - - 38 V
Rdyn dynamic resistance IR = 10 A; Tamb = 25 °C [2] - 0.7 - Ω
[1] Device stressed with 8/20 μs exponential decay waveform according to IEC 61000-4-5 and IEC 61643-321.
[2] Non-repetitive current pulse, Transmission Line Pulse (TLP) tp = 100 ns; square pulse; ANSI / ESD STM5.5.1-2008.
NXP Semiconductors PESD12VV1BL
Very low capacitance bidirectional ESD protection diode
PESD12VV1BL All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved
Product data sheet 14 October 2016 4 / 11
aaa-002723
102
10
103
PPP
(W)
1
tp (s)
10-4 10-2
10-3
Tamb = 25 °C
Fig. 3. Rated peak pulse power as a function of square
pulse duration; maximum values
aaa-002724
0 2 4 6 8 10 12
0
5
10
15
20
VR (V)
Cd
(pF)
f = 1 MHz; Tamb = 25 °C
Fig. 4. Diode capacitance as a function of reverse
voltage; typical values
006aab325
-VCL -VBR -VRWM
VCL
VBR
VRWM
-IRM
IRM
-IR
IR
-IPP
IPP
-+
IPPM
-IPPM
Fig. 5. V-I characteristics for a bidirectional ESD protection diode
NXP Semiconductors PESD12VV1BL
Very low capacitance bidirectional ESD protection diode
PESD12VV1BL All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved
Product data sheet 14 October 2016 5 / 11
50 Ω
Rd
Cs
DUT
(DEVICE
UNDER
TEST)
GND
GND
450 Ω
RG 223/U
50 Ω coax
ESD TESTER
IEC 61000-4-2 network
Cs = 150 pF; Rd = 330 Ω
4 GHz DIGITAL
OSCILLOSCOPE
10x
ATTENUATOR
unclamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network)
unclamped -8 kV ESD pulse waveform
(IEC 61000-4-2 network)
GND
clamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network)
aaa-002726
GND
clamped -8 kV ESD pulse waveform
(IEC 61000-4-2 network)
vertical scale = 2 kV/div
horizontal scale = 10 ns/div
vertical scale = 2 kV/div
horizontal scale = 10 ns/div
vertical scale = 20 V/div
horizontal scale = 50 ns/div
vertical scale = 20 V/div
horizontal scale = 50 ns/div
Fig. 6. ESD clamping test setup and waveforms
NXP Semiconductors PESD12VV1BL
Very low capacitance bidirectional ESD protection diode
PESD12VV1BL All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved
Product data sheet 14 October 2016 6 / 11
10. Application information
The device is designed for the protection of one bidirectional data line from surge pulses and ESD
damage. The device is suitable on lines where the signal polarities are both positive and negative
with respect to ground.
aaa-002737
ESD protection diode
GND
line to be protected
Fig. 7. Application diagram
Circuit board layout and protection device placement
Circuit board layout is critical for the suppression of ESD, Electrical Fast Transient (EFT) and surge
transients. The following guidelines are recommended:
1. Place the device as close to the input terminal or connector as possible.
2. Minimize the path length between the device and the protected line.
3. Keep parallel signal paths to a minimum.
4. Avoid running protected conductors in parallel with unprotected conductors.
5. Minimize all Printed-Circuit Board (PCB) conductive loops including power and ground loops.
6. Minimize the length of the transient return path to ground.
7. Avoid using shared transient return paths to a common ground point.
8. Use ground planes whenever possible. For multilayer PCBs, use ground vias.
11. Test information
Quality information
This product has been qualified in accordance with the Automotive Electronics Council (AEC)
standard Q101 - Stress test qualification for discrete semiconductors, and is suitable for use in
automotive applications.
NXP Semiconductors PESD12VV1BL
Very low capacitance bidirectional ESD protection diode
PESD12VV1BL All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved
Product data sheet 14 October 2016 7 / 11
12. Package outline
Fig. 8. Package outline DFN1006-2 (SOD882)
13. Soldering
solder lands
solder resist
occupied area
solder paste
sod882_fr
0.9
0.3
(2×)
R0.05 (8×)
0.6
(2×)
0.7
(2×)
0.4
(2×)
1.3
0.5
(2×)
0.8
(2×)
0.7
Dimensions in mm
Fig. 9. Reflow soldering footprint for DFN1006-2 (SOD882)
NXP Semiconductors PESD12VV1BL
Very low capacitance bidirectional ESD protection diode
PESD12VV1BL All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved
Product data sheet 14 October 2016 8 / 11
14. Revision history
Table 7. Revision history
Data sheet ID Release date Data sheet status Change notice Supersedes
PESD12VV1BL v.3 20161014 Product data sheet - PESD12VV1BL v.2
Modifications: Deleted section "Packing information"
PESD12VV1BL v.2 20130318 Product data sheet - PESD12VV1BL v.1
PESD12VV1BL v.1 20120403 Product data sheet - -
NXP Semiconductors PESD12VV1BL
Very low capacitance bidirectional ESD protection diode
PESD12VV1BL All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved
Product data sheet 14 October 2016 9 / 11
15. Legal information
Data sheet status
Document
status [1][2]
Product
status [3]
Definition
Objective
[short] data
sheet
Development This document contains data from
the objective specification for product
development.
Preliminary
[short] data
sheet
Qualification This document contains data from the
preliminary specification.
Product
[short] data
sheet
Production This document contains the product
specification.
[1] Please consult the most recently issued document before initiating or
completing a design.
[2] The term 'short data sheet' is explained in section "Definitions".
[3] The product status of device(s) described in this document may have
changed since this document was published and may differ in case of
multiple devices. The latest product status information is available on
the Internet at URL http://www.nxp.com.
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NXP Semiconductors PESD12VV1BL
Very low capacitance bidirectional ESD protection diode
PESD12VV1BL All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved
Product data sheet 14 October 2016 10 / 11
Trademarks
Notice: All referenced brands, product names, service names and
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Bitsound, CoolFlux, CoReUse, DESFire, FabKey, GreenChip,
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Semiconductors N.V.
HD Radio and HD Radio logo — are trademarks of iBiquity Digital
Corporation.
NXP Semiconductors PESD12VV1BL
Very low capacitance bidirectional ESD protection diode
PESD12VV1BL All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved
Product data sheet 14 October 2016 11 / 11
16. Contents
1. General description......................................................1
2. Features and benefits.................................................. 1
3. Applications.................................................................. 1
4. Quick reference data....................................................1
5. Pinning information......................................................2
6. Ordering information....................................................2
7. Marking.......................................................................... 2
8. Limiting values............................................................. 2
9. Characteristics.............................................................. 3
10. Application information............................................. 6
11. Test information......................................................... 6
12. Package outline.......................................................... 7
13. Soldering..................................................................... 7
14. Revision history..........................................................8
15. Legal information....................................................... 9
© NXP Semiconductors N.V. 2016. All rights reserved
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Date of release: 14 October 2016