1. General description
The 74AHC30; 74AHCT30 is a high-speed Si-gate CMOS device and is pin compatible
with Low-power Schottky TTL (LSTTL). It is specified in compliance wit h JEDEC st and ard
No. 7-A.
The 74AHC30; 74AHCT30 pr ovides an 8-input NAND function.
2. Features and benefits
Balanced propagation delays
All inputs have Schmitt-trigger actions
Inputs accept voltages high er tha n VCC
Input levels:
For 74AHC30: CMOS level
For 74AHCT30: TTL level
ESD protection:
HBM JESD22-A114E exceeds 2000 V
MM JESD22-A115-A exceeds 200 V
CDM JESD22-C101C exceeds 1000 V
Multiple package options
Specified from 40 C to +85 C and from 40 C to +125 C
3. Ordering information
74AHC30; 74AHCT30
8-input NAND gate
Rev. 4 — 22 July 2015 Product data sheet
Table 1. Ordering information
Type number Package
Temperature
range Name Description Version
74AHC30D 40 C to +125 C SO14 plastic small outline package; 14 leads;
body width 3.9 mm SOT108-1
74AHCT30D
74AHC30PW 40 C to +125 C TSSOP14 plastic thin shrink small outline package; 14 leads;
body width 4.4 mm SOT402-1
74AHCT30PW
74AHC30BQ 40 C to +125 C DHVQFN14 plastic dual in-line compatible thermal enhanced very
thin quad flat package; no leads; 14 terminals;
body 2.5 30.85 mm
SOT762-1
74AHCT30BQ
74AHC30GU12 40 C to +125 C XQFN12 plastic, extremely thin quad flat package; no leads;
12 terminals; body 1.70 2.00 0.50 mm SOT1174-1
74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 2 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
4. Marking
[1] The pin 1 indicator is located on the lo wer left corner of the device, below the marking code.
5. Functional diagram
Table 2. Marking codes
Type number Marking
74AHC30D 74AHC30D
74AHCT30D 74AHCT30D
74AHC30PW AHC30
74AHCT30PW AHCT30
74AHC30BQ AHC30
74AHCT30BQ AHT30
74AHC30GU12 A3[1]
Pin numbers are shown for SO14, TSSOP14 and
DHVQFN14 packages only Pin numbers are shown for SO14, TSSOP14 and
DHVQFN14 packages only
Fig 1. Logic symbol Fig 2. IEC logic symbol
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74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 3 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
6. Pinning information
6.1 Pinning
(1) This is not a supply pin, the substrate is attached to this
pad using conductive die attach material. There is no
electrical or mechanical requirement to solder this pad,
however if it is soldered the solde r land should remain
floating or be connected to GND
Fig 4. Pin configuration SO14 and TSSOP14 Fig 5. Pin configuration DHVQFN14
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Fig 6. Pin configuration XQFN12 (SOT1174-1)
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74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 4 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
6.2 Pin description
7. Functional description
[1] H = HIGH voltage level; L = LOW voltage level; X = don’t care.
Table 3. Pin de scription
Symbol Pin Description
SO14, TSSOP14 and DHVQFN14 XQFN12
A 1 1 dat a i np ut
B 2 2 dat a i np ut
C 3 3 dat a i np ut
D 4 4 dat a i np ut
E 5 5 dat a i np ut
F 6 7 dat a i np ut
GND 7 6 ground (0 V)
Y 8 8 dat a ou tput
n.c. 9 - not connected
n.c. 10 - not connected
G 11 9 data input
H 12 10 dat a i np ut
n.c. 13 11 not connected
VCC 14 12 supply voltage
Table 4. Function table[1]
Input Output
A B C D E F G H Y
LXXXXXXXH
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74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 5 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
8. Limiting values
[1] The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
[2] For SO14 packages: above 70 C, the value of Ptot derates linearly at 8 mW/K.
For TSSOP14 packages: above 60 C, the value of Ptot derates linearly at 5.5 mW/K.
For DHVQFN14 packages: above 60 C, the value of Ptot derates linearly at 4.5 mW/K.
9. Recommended operating conditions
Table 5. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V).
Symbol Parameter Conditions Min Max Unit
VCC supply voltage 0.5 +7.0 V
VIinput voltage 0.5 +7.0 V
IIK input clamping current VI < 0.5 V [1] 20 - mA
IOK output clamping current VO <0.5 V or VO > VCC + 0.5 V [1] 20 +20 mA
IOoutput current VO =0.5 V to (VCC + 0.5 V) 25 +25 mA
ICC supply current - +75 mA
IGND ground current 75 - mA
Tstg storage temperature 65 +150 C
Ptot total power dissipation Tamb =40 Cto+125C
SO14, TSSOP14 and DHVQFN14 [2] - 500 mW
XQFN12 - 250 mW
Table 6. Re commended operating conditions
Voltages are referenced to GND (ground = 0 V).
Symbol Parameter Conditions 74AHC30 74AHCT30 Unit
Min Typ Max Min Typ Max
VCC supply voltage 2.0 5.0 5.5 4.5 5.0 5.5 V
VIinput voltage 0 - 5.5 0 - 5.5 V
VOoutput voltage 0 - VCC 0-V
CC V
Tamb ambient temperature 40 +25 +125 40 +25 +125 C
t/V input transition rise
and fall rate VCC = 3.3 V 0.3 V - - 100 - - - ns/V
VCC = 5.0 V 0.5 V - - 20 - - 20 ns/V
74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 6 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
10. Static characteristics
Table 7. Static characteristics
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
Symbol Parameter Conditions 25 C40 Cto+85C40 Cto+125CUnit
Min Typ Max Min Max Min Max
74AHC30
VIH HIGH-level
input voltage VCC =2.0V 1.5 - - 1.5 - 1.5 - V
VCC =3.0V 2.1 - - 2.1 - 2.1 - V
VCC = 5.5 V 3.85 - - 3.85 - 3.85 - V
VIL LOW-level
input voltage VCC = 2.0 V - - 0.5 - 0.5 - 0.5 V
VCC = 3.0 V - - 0.9 - 0.9 - 0.9 V
VCC = 5.5 V - - 1.65 - 1.65 - 1.65 V
VOH HIGH-level
output voltage VI=V
IH or VIL
IO=50 A; VCC = 2.0 V 1.9 2.0 - 1.9 - 1.9 - V
IO=50 A; VCC = 3.0 V 2.9 3.0 - 2.9 - 2.9 - V
IO=50 A; VCC = 4.5 V 4.4 4.5 - 4.4 - 4.4 - V
IO=4.0 mA; VCC = 3.0 V 2.58 - - 2.48 - 2.40 - V
IO=8.0 mA; VCC = 4.5 V 3.94 - - 3.80 - 3.70 - V
VOL LOW-level
output voltage VI=V
IH or VIL
IO=50A; VCC = 2.0 V - 0 0.1 - 0.1 - 0.1 V
IO=50A; VCC = 3.0 V - 0 0.1 - 0.1 - 0.1 V
IO=50A; VCC = 4.5 V - 0 0.1 - 0.1 - 0.1 V
IO=4.0mA; V
CC = 3.0 V - - 0.36 - 0.44 - 0.55 V
IO=8.0mA; V
CC = 4.5 V - - 0.36 - 0.44 - 0.55 V
IIinput leakage
current VI= 5.5 V or GND;
VCC =0Vto5.5V - - 0.1 - 1.0 - 2.0 A
ICC supply current VI=V
CC or GND; IO=0A;
VCC =5.5V - - 2.0 - 20 - 40 A
CIinput
capacitance VI=V
CC or GND - 3 10 - 10 - 10 pF
COoutput
capacitance -4-----pF
74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 7 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
11. Dynamic characteristics
74AHCT30
VIH HIGH-level
input voltage VCC = 4.5 V to 5.5 V 2.0 - - 2.0 - 2.0 - V
VIL LOW-level
input voltage VCC = 4.5 V to 5.5 V - - 0.8 - 0.8 - 0.8 V
VOH HIGH-level
output voltage VI=V
IH or VIL; VCC =4.5V
IO=50 A 4.4 4.5 - 4.4 - 4.4 - V
IO=8.0 mA 3.94 - - 3.80 - 3.70 - V
VOL LOW-level
output voltage VI=V
IH or VIL; VCC =4.5V
IO=50A - 0 0.1 - 0.1 - 0.1 V
IO= 8.0 mA - - 0.36 - 0.44 - 0.55 V
IIinput leakage
current VI= 5.5 V or GND;
VCC =0Vto5.5V - - 0.1 - 1.0 - 2.0 A
ICC supply current VI=V
CC or GND; IO=0A;
VCC =5.5V - - 2.0 - 20 - 40 A
ICC additional
supply current per input pin;
VI=V
CC 2.1 V; other pins
at VCC or GND; IO=0A;
VCC = 4.5 V to 5.5 V
- - 1.35 - 1.5 - 1.5 mA
CIinput
capacitance VI=V
CC or GND - 3 10 - 10 - 10 pF
COoutput
capacitance -4-----pF
Table 7. Static characteristics …continued
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
Symbol Parameter Conditions 25 C40 Cto+85C40 Cto+125CUnit
Min Typ Max Min Max Min Max
Table 8. Dy namic characteristics
Voltages are referenced to GND (ground = 0 V); for test circuit see Figure 8.
Symbol Parameter Conditions 25 C40 C to +85 C40 C to +125 CUnit
Min Typ[1] Max Min Max Min Max
74AHC30
tpd propagation
delay A, B, C, D, E, F, G, H to Y; see Figure 7 and 8 [2]
VCC = 3.0 V to 3.6 V
CL= 15 pF - 5.0 9.5 1.0 11.0 1.0 12.0 ns
CL= 50 pF - 6.7 12.0 1.0 14.5 1.0 15.5 ns
VCC = 4.5 V to 5.5 V
CL= 15 pF - 3.6 6.5 1.0 7.5 1.0 8.0 ns
CL= 50 pF - 4.9 8.0 1.0 9.5 1.0 10.5 ns
CPD power
dissipation
capacitance
fi= 1 MHz;
VI=GNDtoV
CC
[3] -10- - - - -pF
74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 8 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
[1] Typical values are measured at nominal supply voltage (VCC = 3.3 V and VCC =5.0V).
[2] tpd is the same as tPLH and tPHL.
[3] CPD is used to determine the dynamic power dissipation (PD in W).
PD=C
PD VCC2fiN+(CLVCC2fo) where:
fi= input frequency in MHz;
fo= output frequency in MHz;
CL= output load capacitance in pF;
VCC = supply voltage in V;
N = number of inputs switching;
(CLVCC2fo) = sum of the outputs.
12. Waveforms
74AHCT30; VCC = 4.5 V to 5.5 V
tpd propagation
delay A, B, C, D, E, F, G, H to Y; see Figure 7 and 8 [2]
CL= 15 pF - 3.3 6.5 1.0 7.5 1.0 8.0 ns
CL= 50 pF - 4.7 8.5 1.0 9.5 1.0 10.5 ns
CPD power
dissipation
capacitance
fi= 1 MHz;
VI=GNDtoV
CC
[3] -12- - - - -pF
Table 8. Dy namic characteristics …continued
Voltages are referenced to GND (ground = 0 V); for test circuit see Figure 8.
Symbol Parameter Conditions 25 C40 C to +85 C40 C to +125 CUnit
Min Typ[1] Max Min Max Min Max
Measurement points are given in Table 9.
VOL and VOH are typical voltage output levels that occur with the output load.
Fig 7. Input to output propagation delays
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Table 9. Measurement points
Type Input Output
VMVM
74AHC30 0.5 VCC 0.5 VCC
74AHCT30 1.5 V 0.5 VCC
74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 9 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
Test data is given in Table 10.
Definitions for test circuit:
RT= termination resistance should be equal to the output impedance Zo of the pulse generator.
CL= load capacitance including jig and probe capacitance.
Fig 8. Test circuit for measuring switching times
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Table 10 . Test data
Type Input Load Test
VItr, tfCL
74AHC30 VCC 3.0ns 15pF, 50pF t
PLH, tPHL
74AHCT30 3.0 V 3.0ns 15pF, 50pF t
PLH, tPHL
74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 10 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
13. Package outline
Fig 9. Package outline SOT108-1 (SO14)
74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 11 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
Fig 10. Package outline SOT402-1 (TSSOP14)
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74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 12 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
Fig 11. Package outline SOT762-1 (DHVQFN14)
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74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 13 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
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74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 14 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
14. Abbreviations
15. Revision history
Table 11. Abbreviations
Acronym Description
CDM Charged Device Model
CMOS Complementary Metal-Oxide Semiconductor
DUT Device Under Test
ESD ElectroStatic Discharge
HBM Human Body Model
LSTTL Low-power Schottky Transistor-Transistor Logic
MM Machine Model
Table 12. Revision history
Document ID Release date Data sheet status Change notice Supersedes
74AHC_AHCT30 v.4 20150722 Product data sheet - 74AHC_AHCT30 v.3
Modifications: Added type number 74AHC30GU12.
74AHC_AHCT30 v.3 20090626 Product data sheet - 74AHC_AHCT30 v.2
Modifications: Section 3: DHVQFN14 package added.
Section 8: derating values added for DHVQFN14 package.
Section 13: outline drawing added for DHVQF N14 package.
74AHC_AHCT30 v.2 20080530 Product data sheet - 74AHC_AHCT30 v.1
74AHC_AHCT30 v.1 19991130 Product specification - -
74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 15 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
16. Legal information
16.1 Data sheet status
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product status of de vice(s) descr ibed in th is document m ay have cha nged since thi s document w as publish ed and may di ffe r in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
16.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liab ility for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and tit le. A short data sh eet is intended
for quick reference only and shou ld not b e relied u pon to cont ain det ailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semicond uctors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall pre va il.
Product specificat ion The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however ,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to off er functions and qualities beyond those described in the
Product data sheet.
16.3 Disclaimers
Limited warr a nty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warrant ies, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information. NXP Se miconductors takes no
responsibility for the content in this document if provided by an information
source outside of NXP Semiconductors.
In no event shall NXP Semiconductors be liable for any indire ct, incidental,
punitive, special or consequ ential damages (including - wit hout limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconduct ors’ aggregate and cumulat ive liability toward s
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all informa tion supplied prior
to the publication hereof .
Suitability for use NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expect ed
to result in perso nal injury, death or severe property or environmental
damage. NXP Semiconductors and its suppliers accept no liability for
inclusion and/or use of NXP Semiconducto rs products in such equipment or
applications and ther efore such inclu sion and/or use is at the cu stomer’s own
risk.
Applications — Applications that are described herein for an y of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and ope ration of their applications
and products using NXP Semiconductors product s, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suit able and fit for t he customer’s applications and
products planned, as well as fo r the planned application and use of
customer’s third party customer(s). Custo mers should provide appropriate
design and operating safeguards to minimize the risks associa ted with their
applications and products.
NXP Semiconductors does not accept any liabili ty related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party custo mer(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individua l agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
No offer to sell or license — Nothing i n this document may be interpreted or
construed as an of fer t o sell product s that is open for accept ance or the gr ant,
conveyance or implication of any license under any copyrights, patents or
other industrial or inte llectual property rights.
Document status[1][2] Product status[3] Definition
Objective [short] data sheet Development This document contain s data from the objective specification for product development.
Preliminary [short] dat a sheet Qualification This document contains data from the preliminary specification.
Product [short] data sheet Production This document contains the product specification.
74AHC_AHCT30 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 22 July 2015 16 of 17
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
Non-automotive qualified products — Unless this data sheet expressly
states that this specific NXP Semiconductors product is automotive qualified,
the product is not suitable for automotive use. It i s neit her qua lified nor tested
in accordance with automotive testing or application requirements. NXP
Semiconductors accepts no liability for inclusion and/or use of
non-automotive qualified products in automotive equipment or applications.
In the event that customer uses the product for design-in and use in
automotive applications to automot ive specifications and standards, custome r
(a) shall use the product without NXP Semiconductors’ warranty of the
product for such au tomotive applications, use and specifications, and (b)
whenever customer uses the product for automotive applications beyond
NXP Semiconductors’ specifications such use shall be solely at customer’s
own risk, and (c) customer fully indemnifies NXP Semiconduct ors for an y
liability, damages or failed product claims resulting from customer design an d
use of the product for automotive applications beyond NXP Semiconductors’
standard warranty and NXP Semiconductors’ product specifications.
Translations — A non-English (translated) versio n of a document is for
reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
16.4 Trademarks
Notice: All referenced b rands, produc t names, service names and trademarks
are the property of their respective ow ners.
17. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
NXP Semiconductors 74AHC30; 74AHCT30
8-input NAND gate
© NXP Semiconductors N.V. 2015. All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 22 July 2015
Document identifier: 74AHC_AHCT30
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
18. Contents
1 General description. . . . . . . . . . . . . . . . . . . . . . 1
2 Features and benefits . . . . . . . . . . . . . . . . . . . . 1
3 Ordering information. . . . . . . . . . . . . . . . . . . . . 1
4 Marking. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
5 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2
6 Pinning information. . . . . . . . . . . . . . . . . . . . . . 3
6.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
6.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 4
7 Functional description . . . . . . . . . . . . . . . . . . . 4
8 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 5
9 Recommended operating conditions. . . . . . . . 5
10 Static characteristics. . . . . . . . . . . . . . . . . . . . . 6
11 Dynamic characteristics . . . . . . . . . . . . . . . . . . 7
12 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
13 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 10
14 Abbreviations. . . . . . . . . . . . . . . . . . . . . . . . . . 14
15 Revision history. . . . . . . . . . . . . . . . . . . . . . . . 14
16 Legal information. . . . . . . . . . . . . . . . . . . . . . . 15
16.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 15
16.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
16.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 15
16.4 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 16
17 Contact information. . . . . . . . . . . . . . . . . . . . . 16
18 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17