REVISIONS
LTR DESCRIPTION DATE (YR-MO-DA) APPROVED
A
Add vendor CAGE 69210. Add case outline U. Editorial changes throughout.
91-05-07
M. A. FRYE
B
Changes in accordance with NOR 5962-R088-93.
93-03-15
M. A. FRYE
C
Changes in accordance with NOR 5962-R206-94.
94-06-14
M. A. FRYE
D
Changes in accordance with NOR 5962-R216-96.
96-09-12
R. MONNIN
E
Add radiation hardness requirem ents. Redrawn. – rrp
00-04-19
R. MONNIN
F
Add case outline Y. - ro
02-04-30
R. MONNIN
G
Drawing updated to reflect current requirements. - rrp
05-07-19
R. MONNIN
H
Make correction to Load regulation t est unit column as specified under Table I.
Make a change to IOUT under footnote 3/ as specified under Table I. - ro
05-08-10 R. MONNIN
J
Update drawing as part of the 5 year review. - jt
10-11-17
C. SAFFLE
THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.
REV
SHEET
REV
SHEET
REV STATUS REV J J J J J J J J J J J J
OF SHE ETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12
PMIC N/A PREPARED BY
MARC IA B. KELLEH ER
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
CHECKED BY
CHARLES REUSING
APPRO V ED BY
MICH AEL A. FRYE
MICROCIRCUIT, LINEAR, NEGATIVE
ADJUSTABLE REG ULATOR
MONOLITHIC SILICON
DRAWING APPROVAL DATE
88-01-08
AMSC N/A
REVISION LEVEL
J SIZE
A CAGE CODE
67268
5962-87741
SHEET 1 OF 12
DSCC FORM 2233
APR 97 5962-E084-11
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87741
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
J SHEET 2
DSCC FORM 2234
APR 97
1. SCOPE
1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in
accordance with MIL-PRF-38535, appendix A.
1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:
5962-87741
01
X
A
Drawing number
Device type
(see 1.2.1)
Case outline
(see 1.2.2)
Lead finish
(see 1.2.3)
1.2.1 Dev ice ty pe. The device type identify the circuit function as follows:
Device type Generic number Circuit function
01 1033 3.0 A negative regulator, adjustable
1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Pa cka ge sty l e
T See figure 1 3 TO-257 flange mounted with
non-isolated tab and glass sealed
U See figure 1 3 TO-257 flange mounted with isolated
tab and glass sealed
X MBFM1-P2 2 TO-3 can
Y See figure 1 3 Flange mount, glass sealed with
gull wing leads
1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A.
1.3 Absol ute maximum ratings.
Input to output voltage differential ................................................................... 35 V dc
Power dissipation (PD) ................................................................................... Intern ally lim ited
Lead temperature (soldering, 10 seconds) ..................................................... +300°C
Junction temperature (TJ) ............................................................................... +150°C
Storage temperature range ............................................................................. -65°C to +150°C
Thermal resis tance, junc tion-to-case (θJC):
Case T ........................................................................................................ 2.3°C/W
Cases U and Y ............................................................................................ 3.5°C/W
Case X ........................................................................................................ 3.0°C/W
1.4 Recom mended operating cond itio ns.
Ambient operating temperature range (TA) .................................................... -55°C to +125°C
1.5 Radiation features:
Maximum total dose available (dose rate = 50 – 300 rads(Si) / s) ................... 30 Krads (Si) 1/
______
1/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.
Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,
method 1019, c ondition A.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87741
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
J SHEET 3
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitati on or contr ac t.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Mi c rocircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadel phia, PA 19111-5094.)
2.2 Order of prece den ce. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements . The individual i tem requirements shall be in accordance with MIL-PRF-38535, appendix A for non-
JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer
Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-
PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying
activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan
may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device.
These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MIL-
PRF-38535 is required to identify when the QML flow option is used.
3.2 Design, construction, and physical di mensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535, appendix A and herein.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Radi ation exposure cir c uit. The radiation exposure circuit shall be as specified on figure 3.
3.3 Electr ica l performance characteristic s. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full ambient operating tem perature range.
3.4 Electrical test requirements . The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are described in table I.
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN
listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD
PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device.
3.5.1 Certificati on/compliance mark. A compliance indicator “C” shall be marked on all non-J AN devices built in compliance
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in
accordance with MIL-PRF-38535 to identify when the QML flow option is used.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87741
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
J SHEET 4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test Symbol Conditions 1/ 2/ 3/
-55°C ≤ TA ≤ +125°C
unless otherw ise speci fied
Group A
subgroups
Device
type
Limits Unit
Min
Max
Reference voltage 4/
VREF |VIN – VOUT| = 5.0 V,
IOUT = 5.0 mA, TA = +25°C
1 01 -1.238 -1.262 V
M,D,P 1 -1.238 -1.262
|VIN – VOUT| = 3 V,
1,2,3
-1.215
-1.285
IOUT = 5 mA, 3 A M,D,P 1 -1.215 -1.285
|VIN – VOUT| = 10 V,
1,2,3
-1.215
-1.285
IOUT = 5 mA, 3 A M,D,P 1 -1.215 -1.285
|VIN – VOUT| = 20 V,
1,2,3
-1.215
-1.285
IOUT = 5 mA, 1.5 A
M,D,P
1
-1.215
-1.285
|VIN – VOUT| = 30 V,
1,2,3
-1.215
-1.285
IOUT = 5 mA, 0.7 A
M,D,P
1
-1.215
-1.285
|VIN – VOUT| = 35 V,
1,2,3
-1.215
-1.285
IOUT = 5 mA, 0.5 A
M,D,P
1
-1.215
-1.285
Line regulation 5/
∆VOUT/ 3.0 V ≤ |VIN – VOUT| ≤ 35 V 1 01 0.015 %/V
∆VIN
M,D,P
1
0.015
3.0 V ≤ |VIN – VOUT| ≤ 35 V 2,3 0.04
Load regulation 5/
∆VOUT/ 10 mA ≤ IOUT ≤ 3 A,
1
01
50
mV
∆IOUT |VOUT| ≤ 5.0 V
M,D,P
1
50
10 mA ≤ IOUT ≤ 3 A,
|VOUT| ≤ 5.0 V
2,3 75
10 mA ≤ IOUT ≤ 3 A,
1
1.0
%
|VOUT| ≥ 5.0 V
M,D,P
1
1.0
10 mA ≤ IOUT ≤ 3 A,
|VOUT| ≥ 5.0 V
2,3 1.5
Thermal regulation
---
10 ms pulse, TA = +25°C
1
01
0.02
%/W
M,D,P
1
0.02
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87741
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
J SHEET 5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics - Continued.
Test Symbol Conditions 1/ 2/ 3/
-55°C ≤ TA ≤ +125°C
unless otherw ise speci fied
Group A
subgroups
Device
type
Limits Unit
Min
Max
Ripple rejection 6/
∆VIN / VOUT = -10 V, f = 120 Hz, 4 01 56 dB
∆VREF CADJ = 0
M,D,P
4
56
VOUT = -10 V, f = 120 Hz,
CADJ = 0
5, 6 53
VOUT = -10 V, f = 120 Hz, 4 70
CADJ = 10 µF
M,D,P
4
70
VOUT = -10 V, f = 120 Hz,
CADJ = 10 µF
5, 6 60
Adjust pin current
IADJ VDIFF = 35 V, IL = 10 mA 1,2,3 01 100 µA
M,D,P
1
100
Adjust pin current
change
∆IADJ 10 mA ≤ IOUT ≤ 3 A 1,2,3 01 2.0 µA
M,D,P
1
2.0
3.0 V ≤ |VIN – VOUT| ≤ 35 V
1,2,3
5.0
M,D,P
1
5.0
Minimum load curre nt
IMIN |VIN – VOUT| ≤ 35 V 1,2,3 01 5.0 mA
M,D,P
1
5.0
|VIN – VOUT| ≤ 10 V 1,2,3 3.0
M,D,P
1
3.0
Current limit 4/
ICL
|VIN – VOUT| ≤ 10 V
1
01
3.0
6.0
A
M,D,P
1
3.0
6.0
|VIN – VOUT| ≤ 10 V 2,3 3.0
|VIN – VOUT| = 20 V
1,2,3
1.5
M,D,P 1 1.5
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87741
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
J SHEET 6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics - Continued.
Test Symbol Conditions 1/ 2/ 3/
-55°C ≤ TA ≤ +125°C
unless otherw ise speci fied
Group A
subgroups
Device
type
Limits Unit
Min
Max
Current limit 4/
ICL |VIN – VOUT| = 30 V 1,2,3 01 0.7 A
M,D,P
1
0.7
|VIN – VOUT| = 35 V 1 0.5 2.5
M,D,P
1
0.5
2.5
|VIN – VOUT| = 35 V
2,3
0.5
Temperature 6/
stability ∆VOUT /
∆T -55°C ≤ TJ ≤ +125°C
1,2,3
01
1.5
%
M,D,P
1
1.5
Long term stability 6/
∆VOUT/
∆t TA = +125°C,
t = 1000 hours
2 01 1.0 %
1/ Devices supplied to this drawing will meet all levels M, D, P of irradiation. However, this device is only tested at
the ‘P’ level. Pre and Post irradiation values are identical unless otherwise specified in table I. When performing post
irradiation electrical measurements for any RHA level, TA = +25°C.
2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.
Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,
method 1019, condition A.
3/ Unless otherwise specified, these specifications apply for |VIN – VOUT| = 5.0 V and IOUT = 5 m A.
4/ Current limit is folded back for input to output voltage above 10 V. 30 W power dissipation is guaranteed only for
10 V ≤ VIN – VOUT ≤ 20 V. Below 10 V, the 3 A current limit applies, and above 20 V, guaranteed current limit will
reduce maximum guaranteed power to less than 30 W.
5/ Regulation is measured on the output at a point 1/8 inch below the base of the package using a pulsed low duty cycle
technique.
6/ Guaranteed, if not tested, to the lim i ts specified in table I herein.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87741
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
J SHEET 7
DSCC FORM 2234
APR 97
Case outlines T and U
Letter
Inches
Millimeters
Min
Max
Min
Max
A
.190
.200
4.83
5.08
A1
.035
.045
0.89
1.14
A2
.120 BSC
3.05 BSC
φ
b
.025
.035
0.64
0.89
D
.645
.665
16.38
16.89
D1
.410
.430
10.41
10.92
D3
.000
.065
0.00
1.65
e
.100 BSC
2.54 BSC
E
.410
.422
10.41
10.72
L
.500
.750
12.70
19.05
O
.527
.537
13.39
16.64
φ
P
.140
.150
3.56
3.81
NOTE:
The U.S. government preferred s ystem of measurement is the metric SI system. However, since this item was
origina lly desig ned usi ng inc h-pound units of m easurement, in the event of conflict between the metric and
inch-pound units, the inch-pound unit s shal l take prec ede n ce.
FIGURE 1. Case outline.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87741
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
J SHEET 8
DSCC FORM 2234
APR 97
Case outline Y
Symbol
Inches
Millimeters
Min
Max
Min
Max
A
.190
.210
4.83
5.33
b
---
.030
---
0.76
D
.410
.430
10.41
10.92
D1
.580
.610
14.73
15.49
e
---
.100
---
2.54
e1
---
.200
---
5.08
E
.410
.420
10.41
10.67
L1
.090
.110
2.29
2.79
L
.115
.125
2.92
3.18
N
3
3
NOTE:
The U.S. government preferred s ystem of measurement is the metric SI system. However, since this item was
originally designed using inch-pound units of measurement, in the event of conflict between the metric and
inch-pound units, the inch-pound units shall take precedence.
FIGURE 1. Case outline – Continued.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87741
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
J SHEET 9
DSCC FORM 2234
APR 97
Device type
01
Case outlines
X
U
T
Y
Terminal
number
Terminal symbo l
1
ADJUST ADJUST ADJUST ADJUST
2
VOUT VIN VIN VIN
3
VIN
(CASE)
VOUT VOUT VOUT
4
--- NC VIN ---
NC = No connection
FIGURE 2. Terminal connections.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87741
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
J SHEET 10
DSCC FORM 2234
APR 97
Case U
FIGURE 3. Radiation expos ure circuit.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87741
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
J SHEET 11
DSCC FORM 2234
APR 97
3.6 Certif i cate of compli an ce. A certificate of compliance shall be required from a manufacturer in order to be listed as an
approved sour ce of supply in M IL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and
Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturer's produc t meets the
requireme nts of M IL-PRF-38535, appendix A and the requirements herein.
3.7 Certif i cate of conform anc e . A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided
with each lot of microcir cui ts d eliv ered to this draw ing.
3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that
affects this drawing.
3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime's agent, and the acquiring ac tivity retain the
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
4. VERIFICATION
4.1 Sampling an d inspection . Sampling and inspection procedures shall be in accordanc e with MIL-PRF-38535,
appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer unde r document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of M IL-STD-883.
(2) TA = +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical param eter
tests prior to burn-in are optional at the discretion of the manufacturer.
TABLE II. Electrical test requirements.
MIL-STD-883 test requirements Subgroups
(in accordanc e with
MIL-STD-883, method 5005,
table I)
Interim electrical parameters
(method 5004)
1
Final electric al test parameters
(method 5004) 1*, 2, 3, 4, 5, 6
Group A test requirements
(method 5005)
1, 2, 3, 4, 5, 6
Groups C and D end-point
electrical parameters
(method 5005)
1
Group E end-point electri cal
parameters (method 5005)
1, 4
* PDA applies to subgroup 1.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87741
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
J SHEET 12
DSCC FORM 2234
APR 97
4.3 Quality conformance insp ecti on. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Gro up A inspe ctio n.
a. Tests shall be as specif ied in table II herein.
b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
4.3.2 Groups C and D inspections.
a. End-point electric al par a meter s shall be as specified in table I I herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufac turer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
(2) TA = +125°C, minim um.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.3.3 Gro up E inspe ctio n. Group E inspection is required only for parts intended to be marked as radiation hardnes s assured
(see 3.5 herein). RHA levels shall be as specified in MIL-PRF-38535 or MIL-PRF-38535, Appendix A. End-point parameters
shall be as specified in table II herein.
4.3.3.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883
method 1019, c ondition A and as specified herein.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendi x A.
6. NOTES
6.1 Inten ded use. Microcircuits conforming to this drawing are intended for use for Government microcircuit appli cations
(original equ ipm ent), des ign applications, and logisti cs purpo ses.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
prepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the user s of recor d for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.4 Record of user s. Military and industrial users shall inform DLA Land and Maritime when a system application requires
configuration control and the applicable SMD to that system. DLA Land and Maritime will maintain a record of users and thi s
list will be used for coordination and distribution of changes to the drawings . Users of drawings covering microelectronics
devices (FSC 5962) sho uld co ntact DLA Land and Maritime -VA, telephone (614) 692-0547.
6.5 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbus, Ohio 43218-
3990, or telephone (614) 692-0540.
6.6 Approv ed sour ce s of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MI L-
HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been s ubmitted to and ac cepted by
DLA Land and Maritime -VA.
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 10-11-17
Approved sources of supply for SMD 5962-87741 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. Thi s information
bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritim e
maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-8774101TA
3/ OM3914NT/883B
5962-8774101UA
3/
FM1033S7
3/
OM3914ST/883B
60264
MTLT1033QP
5962-8774101XA
3/
OM3914NKM/883B
60264
MTLT1033QK
3/
LT1033MK/883
5962-8774101YA
3/
OM3914SRM/883B
60264
MTLT1033QU
5962P8774101UA
3/ OMR3914STM/883B
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufac turer lis ted f o r that part. If the
desired lead finish is not listed contact the vendor
to determine its availa bil it y .
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
3/ Not available from an approved source of supply.
Vendor CAGE Vendor name
number and address
60264 Minco Technology Labs, Inc.
1805 Rutherford Lane
Austin, TX 78754-5101
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
